CY74FCT652T
8-BIT REGISTERED TRANSCEIVER
WITH 3-STATE OUTPUTS
SCCS032B – SEPTEMBER 1994 – REVISED OCTOBER 2001
6POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
VIK VCC = 4.75 V, IIN = –18 mA –0.7 –1.2 V
IOH = –32 mA 2
OH
CC =
.
IOH = –15 mA 2.4 3.3
VOL VCC = 4.75 V, IOL = 64 mA 0.3 0.55 V
Vhys All inputs 0.2 V
IIVCC = 5.25 V, VIN = VCC 5µA
IIH VCC = 5.25 V, VIN = 2.7 V ±1µA
IIL VCC = 5.25 V, VIN = 0.5 V ±1µA
IOZH VCC = 5.25 V, VOUT = 2.7 V 10 µA
IOZL VCC = 5.25 V, VOUT = 0.5 V –10 µA
IOS‡VCC = 5.25 V, VOUT = 0 V –60 –120 –225 mA
Ioff VCC = 0 V, VOUT = 4.5 V ±1µA
ICC VCC = 5.25 V, VIN ≤ 0.2 V, VIN ≥VCC – 0.2 V 0.1 0.2 mA
∆ICC VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open 0.5 2 mA
ICCD¶VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,
GAB or GBA = GND, VIN ≤ 0.2 V or VIN ≥VCC – 0.2 V 0.06 0.12 mA/
MHz
VCC = 5.25 V,
One bit switching
at f1 = 5 MHz VIN ≤ 0.2 V or
VIN ≥VCC – 0.2 V 0.7 1.4
,
Outputs open,
at 50% duty cycle VIN = 3.4 V or GND 1.2 3.4
C
GAB = GBA = GND,
SAB = CPAB = GND,
Eight bits switching
at f1 = 5 MHz VIN ≤ 0.2 V or
VIN ≥VCC – 0.2 V 2.8 5.6||
=
CC
at 50% duty cycle VIN = 3.4 V or GND 5.1 14.6||
Ci5 10 pF
Co9 12 pF
†Typical values are at VCC = 5 V, TA = 25°C.
‡Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or
sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence
of parameter tests, IOS tests should be performed last.
§Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
¶This parameter is derived for use in total power-supply calculations.
#IC= ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)
Where:
IC= Total supply current
ICC = Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH= Duty cycle for TTL inputs high
NT= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0= Clock frequency for registered devices, otherwise zero
f1= Input signal frequency
N1= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.