© 1999 Fairchild Semiconductor Corporation DS010960 www.fairchildsemi.com
September 1991
Revised November 1999
100315 Low Skew Quad Clock Driver
100315
Low Skew Quad Clock Driver
General Description
The 100315 contains four low skew differential drivers,
designed for generation of multiple, minimum skew differ-
ential clocks from a single differential input. This device
also has the capability to select a secondary single-ended
clock source for use in lower frequency system level test-
ing. The 100315 is a 300 Series redesign of the 100115
clock driver .
Features
Low output-to-output skew (50 ps)
Differential inputs and outputs
Secondary clock available for system level testing
2000V ESD protection
Voltage compensated operating range: 4.2V to 5.7V
Ordering Code:
Devices also available in Tape and Reel. Specify by appending th e s uffix let t er “X” to the o rdering code.
Logic Diagram
Pin Descriptions
Note 1: TCLK and CLKSEL are single-ended inputs, with internal 50 k
pull-down resistors.
Connection Diagram
Truth Table
L = LOW Voltage Level
H = HIGH Voltage Level
X = Don't Care
Order Number Package Number Package Descriptions
100315SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Pin Names Description
CLKIN, CLKIN Differential Clock Inputs
CLK14, CLK14Differential Clock Outputs
TCLK Test C lock Input (Note 1)
CLKSEL Clock Input Select (Not e 1)
CLKSEL CLKIN CLKIN TCLK CLKnCLKn
LLHXLH
LHLXHL
H X XLLH
HXXHHL
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100315
Absolute Maximum Ratings(Note 2) Recommended Operating
Conditions
Note 2: The Absolute Maximum Ratings are thos e values bey ond which
the saf ety of the device cannot be gu aranteed. Th e device shoul d not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The R ecomm ended Oper ating Co ndition s table will def ine the condit ions
for actu al device operation.
Note 3: ESD te s ti ng c onforms t o M I L-STD-8 83, Meth od 3015.
DC Electrical Characteristi cs (Note 4)
VEE = 4.2V to 5.7V, VCC = VCCA = GND, TC = 0°C to +85°C
Note 4: The specified limits represent the worst case value for the parameter. Since these wor st ca se value s normally occur at th e temperature extr emes,
additional noise immunity and guard banding can be achieved by decreasing the allowable system operating ranges.
AC Electrical Characteristi cs
VEE = 4.2V to 4.8, VCC = VCCA = GND
Note 5: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same pack-
aged d evice . The sp ecificatio ns appl y to an y output s swit ching in th e sam e direc tion eithe r HIGH- to-LOW (tOSHL), or LOW-to-H IGH (tOSLH), or in opp osite
direc ti ons both H L and LH (tOST). Parameters tOST and tPS guaranteed by design.
Storage Temperature 65°C to +150°C
Maximum Junction Temperature (TJ)+150°C
Case Temperature under Bias (TC)0°C to +85°C
VEE Pin Potential to Ground Pin 7.0V to +0.5V
Input Voltage (DC) VCC to +0.5V
Output Curren t (DC Output HIGH) 50 mA
Operating Range (Note 2) 5.7V to 4.2V
ESD (Not e 3) 2000V
Case Temperature (TC)0°C to +85°C
Supply Voltage ( VEE)5.7V to 4.2V
Symbol Parameter Min Typ Max Units Conditions
VOH Output HIGH Voltage 1025 955 870 mV VIN = VIH(Max) Loading with
VOL Output LOW Voltage 1830 1705 1620 or VIL(Min) 50 to 2.0V
VOHC Output HIGH Voltage 1035 mV VIN = VIH(Min) Loading with
VOLC Output LOW Voltage 1610 or VIL(Max) 50 to 2.0V
VIH Single-Ended Input HIGH Voltage 1165 870 mV Guaranteed HIGH Signal for All Inputs
VIL Single-Ended Input LOW Voltage 1830 1475 mV Guaranteed LOW Signal for All Inputs
IIL Input LOW Current 0.50 µAV
IN = VIL(Min)
IIH Input HIGH Current
VIN = VIH(Max)
CLKIN, CLKIN 150 µA
TCLK 250 µA
CLKSEL 250 µA
VDIFF Input Voltage Differential 150 mV Required for Full Output Swing
VCM Common Mode Voltage VCC 2V VCC 0.5V V
ICBO Input Leakage Current 10 µAV
IN = VEE
IEE Power Supply Current 67 35 mA
Symbol Parameter TC = 0°CT
C = +25°CT
C = +85°CUnits Conditions
Min Max Min Max Min Max
fMAX Maximum Clock Frequency 750 750 750 MHz
tPLH Propagation Delay CLKIN,
ns Figures 1, 3
tPHL CLKIN to CLK(14), CLK(14)
Differential 0.59 0.79 0.62 0.82 0.67 0.87
Single-Ended 0.59 0.99 0.62 1.02 0.67 1.07
tPLH Propagation Delay, TCLK 0.50 1.20 0.50 1.20 0.50 1.20 ns Figures 1, 2
tPHL to CLK(14), CLK(14)
tPLH Propagation Delay, CLKSEL 0.80 1.60 0.80 1.60 0.80 1.60 ns Figures 1, 2
tPHL to CLK(14), CLK(14)
tTLH Transition Time 0.30 0.80 0.30 0.80 0.30 0.80 ns Figures 1, 4
tTHL 20% to 80%, 80% to 20%
tOST Maximum Skew Opposite Edge
DIFF Output-to-Output Variation 50 50 50 ps (Note 5)
Data to Output Path
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100315
Test Circuit
Note:
Shown for testing CLKIN to CLK1 in the differ enti al mode.
L1, L2, L3 and L4 = equal leng th 50 impedance lines.
All unuse d inputs and outputs are loa ded with 50 in paralle l wi th 3 pF to GND.
Scope should have 50 input terminator internally. FIGURE 1. AC Test Circuit
Switching Waveforms
FIGURE 2. Propagation Delay, TCLK, CLKSEL to Outputs
FIGURE 3. Propagation Delay, CLKIN/CLKIN to Outputs
FIGU RE 4. Transiti on Times
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100315 Low Skew Quad Clock Driver
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
Fairchild does not assu me any responsibility for use of any circuitry de scribed, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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SEMICONDUCTOR CORPORATION. As used herein:
1. Life supp or t devices o r syste ms a re devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A cr itical compon ent in any com ponen t of a life su pport
device or system whose failure to perform can be rea-
sonabl y ex pect ed to ca use the fa ilu re of the li fe su pp ort
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