Integrated Silicon Solution, Inc. — www.issi.com 1
Rev. I
12/01/2011
Copyright © 2011 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no
liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on
any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be ex-
pected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications unless Integrated Silicon
Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
IS42S16400F
IS45S16400F
FEATURES
Clock frequency: 200, 166, 143, 133 MHz
Fully synchronous; all signals referenced to a
positive clock edge
Internal bank for hiding row access/precharge
Single 3.3V power supply
LVTTL interface
Programmable burst length
– (1, 2, 4, 8, full page)
Programmable burst sequence:
Sequential/Interleave
Self refresh modes
Auto refresh (CBR)
4096 refresh cycles every 64 ms (Com, Ind, A1
grade) or 16ms (A2 grade)
Random column address every clock cycle
Programmable CAS latency (2, 3 clocks)
Burst read/write and burst read/single write
operations capability
Burst termination by burst stop and precharge
command
OPTIONS
Package:
54-pin TSOP II
54-ball FBGA (8mm x 8mm)
Operating Temperature Range
Commercial (0oC to +70oC)
Industrial (-40oC to +85oC)
Automotive Grade A1 (-40oC to +85oC)
Automotive Grade A2 (-40oC to +105oC)
OVERVIEW
ISSI's 64Mb Synchronous DRAM is organized as 1,048,576
bits x 16-bit x 4-bank for improved performance. The
synchronous DRAMs achieve high-speed data transfer
using pipeline architecture. All inputs and outputs signals
refer to the rising edge of the clock input.
1 Meg Bits x 16 Bits x 4 Banks (64-MBIT)
SYNCHRONOUS DYNAMIC RAM DECEMBER 2011
KEY TIMING PARAMETERS
Parameter -5 -6 -7 Unit
Clk Cycle Time
CAS Latency = 3 5 6 7 ns
CAS Latency = 2 7.5 7.5 7.5 ns
Clk Frequency
CAS Latency = 3 200 166 143 Mhz
CAS Latency = 2 133 133 133 Mhz
Access Time from Clock
CAS Latency = 3 5 5.4 5.4 ns
CAS Latency = 2 6 6 6 ns
Parameter 4M x 16
 








 
 
 
 
ADDRESS TABLE
2 Integrated Silicon Solution, Inc. — www.issi.com
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IS42S16400F
IS45S16400F
GENERAL DESCRIPTION
The 64Mb SDRAM is a high speed CMOS, dynamic
random-access memory designed to operate in 3.3V
memory systems containing 67,108,864 bits. Internally
configured as a quad-bank DRAM with a synchronous
interface. Each 16,777,216-bit bank is organized as 4,096
rows by 256 columns by 16 bits.
The 64Mb SDRAM includes an AUTO REFRESH MODE,
and a power-saving, power-down mode. All signals are
registered on the positive edge of the clock signal, CLK.
All inputs and outputs are LVTTL compatible.
The 64Mb SDRAM has the ability to synchronously burst
data at a high data rate with automatic column-address
generation, the ability to interleave between internal banks
to hide precharge time and the capability to randomly
change column addresses on each clock cycle during
burst access.
A self-timed row precharge initiated at the end of the burst
sequence is available with the AUTO PRECHARGE function
enabled.
Precharge
one bank while accessing one of the
other three banks will hide the
precharge
cycles and provide
seamless, high-speed, random-access operation.
SDRAM
read and write accesses are burst oriented starting
at a selected location and continuing for a programmed
number of locations in a programmed sequence. The
registration of an ACTIVE command begins accesses,
followed by a READ or WRITE command. The ACTIVE
command in conjunction with address bits registered are
used to select the bank and row to be accessed (BA0,
BA1 select the bank; A0-A11 select the row). The READ
or WRITE commands in conjunction with address bits
registered are used to select the starting column location
for the burst access.
Programmable READ or WRITE burst lengths consist of
1, 2, 4 and 8 locations, or full page, with a burst terminate
option.
CLK
CKE
CS
RAS
CAS
WE
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
BA0
BA1
A11
COMMAND
DECODER
&
CLOCK
GENERATOR MODE
REGISTER
REFRESH
CONTROLLER
REFRESH
COUNTER
SELF
REFRESH
CONTROLLER
ROW
ADDRESS
LATCH
MULTIPLEXER
COLUMN
ADDRESS LATCH
BURST COUNTER
COLUMN
ADDRESS BUFFER
COLUMN DECODER
DATA IN
BUFFER
DATA OUT
BUFFER
DQM
DQ 0-15
VDD/VDDQ
GND/GNDQ
12
12
8
12
12
8
16
16 16
16
256K
(x 16)
4096
4096
4096
ROW DECODER
4096 MEMORY CELL
ARRAY
BANK 0
SENSE AMP I/O GATE
BANK CONTROL LOGIC
ROW
ADDRESS
BUFFER
FUNCTIONAL BLOCK DIAGRAM
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IS42S16400F
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PIN CONFIGURATION


1 2 3 4 5 6 7 8 9
A
B
C
D
E
F
G
H
J
DQ15
DQ13
DQ11
DQ9
NC
CLK
A11
A7
A5
GNDQ
VDDQ
GNDQ
VDDQ
GND
CKE
A9
A6
A4
VDDQ
GNDQ
VDDQ
GNDQ
VDD
CAS
BA0
A0
A3
DQ0
DQ2
DQ4
DQ6
DQML
RAS
BA1
A1
A2
GND
DQ14
DQ12
DQ10
DQ8
DQMH
NC
A8
GND
VDD
DQ1
DQ3
DQ5
DQ7
WE
CS
A10
VDD
PIN DESCRIPTIONS
 
 
 
 
 
 
CS 
RAS 
CAS 
WE 
 
dd 
 
ddq 
 
 
4 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
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IS42S16400F
IS45S16400F
PIN CONFIGURATIONS
54 pin TSOP - Type II
PIN DESCRIPTIONS
A0-A11 Row Address Input
A0-A7 Column Address Input
BA0, BA1 Bank Select Address
DQ0 to DQ15 Data I/O
CLK System Clock Input
CKE Clock Enable
CS Chip Select
RAS Row Address Strobe Command
CAS Column Address Strobe Command
V
DD
DQ0
V
DD
Q
DQ1
DQ2
GNDQ
DQ3
DQ4
V
DD
Q
DQ5
DQ6
GNDQ
DQ7
V
DD
LDQM
WE
CAS
RAS
CS
BA0
BA1
A10
A0
A1
A2
A3
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
GND
DQ15
GNDQ
DQ14
DQ13
V
DD
Q
DQ12
DQ11
GNDQ
DQ10
DQ9
V
DD
Q
DQ8
GND
NC
UDQM
CLK
CKE
NC
A11
A9
A8
A7
A6
A5
A4
GND
WE Write Enable
LDQM x16 Lower Byte, Input/Output Mask
UDQM x16 Upper Byte, Input/Output Mask
Vdd Power
GND Ground
Vddq Power Supply for I/O Pin
GNDq Ground for I/O Pin
NC No Connection
Integrated Silicon Solution, Inc. — www.issi.com 5
Rev. I
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PIN FUNCTIONS
Symbol TSOP Pin No. Type Function (In Detail)
A0-A11
23 to 26 Input Pin
Address Inputs: A0-A11 are sampled during the ACTIVE
29 to 34
command (row-address A0-A11) and READ/WRITE command (A0-A7
22, 35
with A10 defining auto precharge) to select one location out of the memory array
in the respective bank. A10 is sampled during a PRECHARGE command to deter-
mine if all banks are to be precharged (A10 HIGH) or bank selected by
BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD
MODE REGISTER command.
BA0, BA1
20, 21 Input Pin
Bank Select Address: BA0 and BA1 defines which bank the ACTIVE, READ, WRITE
or PRECHARGE command is being applied.
CAS
17 Input Pin
CAS, in conjunction with the RAS and WE, forms the device command. See the
"Command Truth Table" for details on device commands.
CKE
37 Input Pin
The CKE input determines whether the CLK input is enabled. The next rising edge
of the CLK signal will be valid when is CKE HIGH and invalid when LOW. When CKE
is LOW, the device will be in either power-down mode, clock suspend mode, or self
refresh mode.
CKE is an
asynchronous i
nput.
CLK
38 Input Pin
CLK is the master clock input for this device. Except for CKE, all inputs to this device
are acquired in synchronization with the rising edge of this pin.
CS
19 Input Pin
The CS input determines whether command input is enabled within the device.
Command input is enabled when CS is LOW, and disabled with CS is HIGH. The
device remains in the previous state when CS is HIGH.
DQ0 to
2, 4, 5, 7, 8, 10, DQ Pin
DQ0 to DQ15 are I/O pins. I/O through these pins can be controlled in byte units
DQ15
11,13, 42, 44, 45,
using the LDQM and UDQM pins.
47, 48, 50, 51, 53
LDQM,
15, 39 Input Pin
LDQM and UDQM control the lower and upper bytes of the I/O buffers. In read
UDQM mode, LDQM and UDQM control the output buffer. When LDQM or UDQM is LOW,
the corresponding buffer byte is enabled, and when HIGH, disabled. The outputs
go to the HIGH impedance state when LDQM/UDQM is HIGH. This function cor-
responds to OE in conventional DRAMs. In write mode, LDQM and UDQM control
the input buffer. When LDQM or UDQM is LOW, the corresponding buffer byte is en-
abled, and data can be written to the device. When LDQM or UDQM is HIGH, input
data is masked and cannot be written to the device.
RAS
18 Input Pin
RAS, in conjunction with CAS and WE, forms the device command. See the "Com-
mand Truth Table" item for details on device commands.
WE
16 Input Pin
WE, in conjunction with RAS and CAS, forms the device command. See the "Com-
mand Truth Table" item for details on device commands.
Vddq
3, 9, 43, 49 Power Supply Pin
Vddq is the output buffer power supply.
Vdd
1, 14, 27 Power Supply Pin
Vdd is the device internal power supply.
GNdq
6, 12, 46, 52 Power Supply Pin
GNdq is the output buffer ground.
GNd
28, 41, 54 Power Supply Pin
GNd is the device internal ground.
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READ
The READ command selects the bank from BA0, BA1 inputs
and starts a burst read access to an active row. Inputs
A0-A7 provides the starting column location. When A10 is
HIGH, this command functions as an AUTO PRECHARGE
command. When the auto precharge is selected, the row
being accessed will be precharged at the end of the READ
burst. The row will remain open for subsequent accesses
when AUTO PRECHARGE is not selected. DQ’s read
data is subject to the logic level on the DQM inputs two
clocks earlier. When a given DQM signal was registered
HIGH, the corresponding DQ’s will be High-Z two clocks
later. DQ’s will provide valid data when the DQM signal
was registered LOW.
WRITE
A burst write access to an active row is initiated with the
WRITE command. BA0, BA1 inputs selects the bank,
and the starting column location is provided by inputs
A0-A7. Whether or not AUTO-PRECHARGE is used is
determined by A10.
The row being accessed will be precharged at the end of
the WRITE burst, if AUTO PRECHARGE is selected. If
AUTO PRECHARGE is not selected, the row will remain
open for subsequent accesses.
A memory array is written with corresponding input data
on DQ’s and DQM input logic level appearing at the same
time. Data will be written to memory when DQM signal is
LOW. When DQM is HIGH, the corresponding data inputs
will be ignored, and a WRITE will not be executed to that
byte/column location.
PRECHARGE
The PRECHARGE command is used to deactivate the
open row in a particular bank or the open row in all banks.
BA0, BA1 can be used to select which bank is precharged
or they are treated as “Don’t Care”. A10 determines
whether one or all banks are precharged. After execut-
ing this command, the next command for the selected
bank(s) is executed after passage of the period tRP
, which
is the period required for bank precharging. Once a bank
has been precharged, it is in the idle state and must be
activated prior to any READ or WRITE commands being
issued to that bank.
AUTO PRECHARGE
The AUTO PRECHARGE function ensures that the
precharge is initiated at the earliest valid stage within a
burst. This function allows for individual-bank precharge
without requiring an explicit command. A10 can be used
to enable the AUTO PRECHARGE function in conjunc-
tion with a specific READ or WRITE command. For each
individual READ or WRITE command, auto precharge is
either enabled or disabled. AUTO PRECHARGE does not
apply except in full-page burst mode. Upon completion of
the READ or WRITE burst, a precharge of the bank/row
that is addressed is automatically performed.
AUTO REFRESH COMMAND
This command executes the AUTO REFRESH operation.
The row address and bank to be refreshed are automatically
generated during this operation. The stipulated period (trc) is
required for a single refresh operation, and no other com-
mands can be executed during this period. This command
is executed at least 4096 times every Tref. During an AUTO
REFRESH command, address bits are “Don’t Care”. This
command corresponds to CBR Auto-refresh.
SELF REFRESH
During the SELF REFRESH operation, the row address to
be refreshed, the bank, and the refresh interval are gen-
erated automatically internally. SELF REFRESH can be
used to retain data in the SDRAM without external clocking,
even if the rest of the system is powered down. The SELF
REFRESH operation is started by dropping the CKE pin
from HIGH to LOW. During the SELF REFRESH operation
all other inputs to the SDRAM become “Don’t Care”. The
device must remain in self refresh mode for a minimum
period equal to tras or may remain in self refresh mode
for an indefinite period beyond that. The SELF-REFRESH
operation continues as long as the CKE pin remains LOW
and there is no need for external control of any other pins.
The next command cannot be executed until the device
internal recovery period (trc) has elapsed. Once CKE
goes HIGH, the NOP command must be issued
(minimum
of two clocks)
to provide time for the completion of any
internal refresh in progress. After the self-refresh, since it
is impossible to determine the address of the last row to
be refreshed, an AUTO-REFRESH should immediately be
performed for all addresses.
BURST TERMINATE
The BURST TERMINATE command forcibly terminates
the burst read and write operations by truncating either
fixed-length or full-page bursts and the most recently
registered READ or WRITE command prior to the BURST
TERMINATE.
COMMAND INHIBIT
COMMAND INHIBIT prevents new commands from being
executed. Operations in progress are not affected, apart
from whether the CLK signal is enabled
NO OPERATION
When CS is low, the NOP command prevents unwanted
commands from being registered during idle or wait
states.
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LOAD MODE REGISTER
During the LOAD MODE REGISTER command the mode
register is loaded from A0-A11. This command can only
be issued when all banks are idle.
ACTIVE COMMAND
When the ACTIVE COMMAND is activated, BA0, BA1
inputs selects a bank to be accessed, and the address
inputs on A0-A11 selects the row. Until a PRECHARGE
command is issued to the bank, the row remains open
for accesses.
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TRUTH TABLE – COMMANDS AND DQM OPERATION(1)
FUNCTION CS RAS CAS WE DQM ADDR DQs
COMMAND INHIBIT (NOP) H X X X X X X
NO OPERATION (NOP) L H H H X X X
ACTIVE (Select bank and activate row)(3) L L H H X Bank/Row X
READ (Select bank/column, start READ burst)
(4) L H L H L/H(8) Bank/Col X
WRITE (Select bank/column, start WRITE burst)
(4) L H L L L/H(8) Bank/Col Valid
BURST TERMINATE L H H L X X Active
PRECHARGE (Deactivate row in bank or banks)
(5) L L H L X Code X
AUTO REFRESH or SELF REFRESH(6,7) L L L H X X X
(Enter self refresh mode)
LOAD MODE REGISTER(2) L L L L X Op-Code X
Write Enable/Output Enable(8) L Active
Write Inhibit/Output High-Z(8) H High-Z
NOTES:
1. CKE is HIGH for all commands except SELF REFRESH.
2. A0-A11 define the op-code written to the mode register.
3. A0-A11 provide row address, and BA0, BA1 determine which bank is made active.
4. A0-A7 (x16) provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables
auto precharge; BA0, BA1 determine which bank is being read from or written to.
5. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.
6. AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
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IS42S16400F
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TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK n (1-6)
CURRENT STATE
COMMAND (ACTION) CS RAS CAS WE
Any COMMAND INHIBIT
(NOP/Continue previous operation)
H X X X
NO OPERATION
(NOP/Continue previous operation)
L H H H
Idle ACTIVE (Select and activate row) L L H H
AUTO REFRESH(7) L L L H
LOAD MODE REGISTER(7) L L L L
PRECHARGE(11) L L H L
Row Active READ (Select column and start READ burst)(10) L H L H
WRITE (Select column and start WRITE burst)(10) L H L L
PRECHARGE (Deactivate row in bank or banks)(8) L L H L
Read READ (Select column and start new READ burst)(10) L H L H
(Auto WRITE (Select column and start WRITE burst)(10) L H L L
Precharge PRECHARGE (Truncate READ burst, start PRECHARGE)(8) L L H L
Disabled) BURST TERMINATE(9) L H H L
Write READ (Select column and start READ burst)(10) L H L H
(Auto WRITE (Select column and start new WRITE burst)(10) L H L L
Precharge PRECHARGE (Truncate WRITE burst, start PRECHARGE)(8) L L H L
Disabled) BURST TERMINATE(9) L H H L
NOTE:
1. This table applies when CKE n-1 was HIGH and CKE n is HIGH (see Truth Table - CKE) and after txsr has been met (if the
previous state was SELF REFRESH).
2. This table is bank-specific, except where noted; i.e., the current state is for a specific bank and the commands shown are those
allowed to be issued to that bank when in that state. Exceptions are covered in the notes below.
TRUTH TABLE – CKE (1-4)
CURRENT STATE COMMANDn ACTIONn CKEn-1 CKEn
Power-Down X Maintain Power-Down L L
Self Refresh X Maintain Self Refresh L L
Clock Suspend X Maintain Clock Suspend L L
Power-Down(5) COMMAND INHIBIT or NOP Exit Power-Down L H
Self Refresh(6) COMMAND INHIBIT or NOP Exit Self Refresh L H
Clock Suspend(7) X Exit Clock Suspend L H
All Banks Idle COMMAND INHIBIT or NOP Power-Down Entry H L
All Banks Idle AUTO REFRESH Self Refresh Entry H L
Reading or Writing VALID Clock Suspend Entry H L
See TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK n
H H
NOTES:
1. CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previous clock edge.
2. Current state is the state of the SDRAM immediately prior to clock edge n.
3. COMMANDn is the command registered at clock edge n, and ACTONn is a result of COMMANDn.
4. All states and sequences not shown are illegal or reserved.
5. Exiting power-down at clock edge n will put the device in the all banks idle state in time for clock edge n+1
(provided that tcks is
met)
.
6. Exiting self refresh at clock edge n will put the device in all banks idle state once txsr is met. COMMAND INHIBIT or NOP
commands should be issued on clock edges occurring during the txsr period. A minimum of two NOP commands must be sent
during txsr period.
7. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge
n+1.
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3. Current state definitions:
Idle: The bank has been precharged, and trp has been met.
Row Active: A row in the bank has been activated, and trcd has been met. No data bursts/accesses and no register
accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been termi-
nated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been termi-
nated.
4. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands,
or allowable commands to the other bank should be issued on any clock edge occurring during these states. Allowable com-
mands to the other bank are determined by its current state and CURRENT STATE BANK n truth tables.
Precharging: Starts with registration of a PRECHARGE command and ends when trp is met. Once trp is met, the bank
will be in the idle state.
Row Activating: Starts with registration of an ACTIVE command and ends when trcd is met. Once trcd is met, the bank will
be in the row active state.
Read w/Auto
Precharge Enabled:
Starts with registration of a READ command with auto precharge enabled and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
Write w/Auto
Precharge Enabled:
Starts with registration of a WRITE command with auto precharge enabled and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
5. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be
applied on each positive clock edge during these states.
Refreshing: Starts with registration of an AUTO REFRESH command and ends when trc is met. Once trc is met, the
SDRAM will be in the all banks idle state.
Accessing Mode
Register: Starts with registration of a LOAD MODE REGISTER command and ends when tmrd has been met. Once
tmrd is met, the SDRAM will be in the all banks idle state.
Precharging All:
Starts with registration of a PRECHARGE ALL command and ends when trp is met. Once trp is met, all
banks will be in the idle state.
6. All states and sequences not shown are illegal or reserved.
7. Not bank-specific; requires that all banks are idle.
8. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.
9. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.
10. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and
READs or WRITEs with auto precharge disabled.
11. Does not affect the state of the bank and acts as a NOP to that bank.
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TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK m (1-6)
CURRENT STATE
COMMAND (ACTION) CS RAS CAS WE
Any COMMAND INHIBIT (NOP/Continue previous operation) H X X X
NO OPERATION (NOP/Continue previous operation) L H H H
Idle Any Command Otherwise Allowed to Bank m X X X X
Row ACTIVE (Select and activate row) L L H H
Activating, READ (Select column and start READ burst)(7) L H L H
Active, or WRITE (Select column and start WRITE burst)(7) L H L L
Precharging PRECHARGE L L H L
Read ACTIVE (Select and activate row) L L H H
(Auto READ (Select column and start new READ burst)(7,10) L H L H
Precharge WRITE (Select column and start WRITE burst)(7,11) L H L L
Disabled) PRECHARGE(9) L L H L
Write ACTIVE (Select and activate row) L L H H
(Auto READ (Select column and start READ burst)(7,12) L H L H
Precharge WRITE (Select column and start new WRITE burst)(7,13) L H L L
Disabled) PRECHARGE(9) L L H L
Read ACTIVE (Select and activate row) L L H H
(With Auto READ (Select column and start new READ burst)(7,8,14) L H L H
Precharge) WRITE (Select column and start WRITE burst)(7,8,15) L H L L
PRECHARGE(9) L L H L
Write ACTIVE (Select and activate row) L L H H
(With Auto READ (Select column and start READ burst)(7,8,16) L H L H
Precharge) WRITE (Select column and start new WRITE burst)(7,8,17) L H L L
PRECHARGE(9) L L H L
NOTE:
1. This table applies when CKE n-1 was HIGH and CKE n is HIGH (Truth Table - CKE) and after txsr has been met (if the previ-
ous state was self refresh).
2. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands
shown are those allowed to be issued to bank m
(assuming that bank m is in such a state that the given command is allowable)
. Excep-
tions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and trp has been met.
Row Active: A row in the bank has been activated, and trcd has been met. No data bursts/accesses and no register
accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been termi-
nated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been termi-
nated.
Read w/Auto
Precharge Enabled:
Starts with registration of a READ command with auto precharge enabled, and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
Write w/Auto
Precharge Enabled:
Starts with registration of a WRITE command with auto precharge enabled, and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
4. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
5. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state
only.
6. All states and sequences not shown are illegal or reserved.
7. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled
and READs or WRITEs with auto precharge disabled.
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8. CONCURRENT AUTO PRECHARGE: Bank n will initiate the AUTO PRECHARGE command when its burst has been inter-
rupted by bank m’s burst.
9. Burst in bank n continues as initiated.
10. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the READ on bank n, CAS latency later (Consecutive READ Bursts).
11. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will inter-
rupt the READ on bank n when registered (READ to WRITE). DQM should be used one clock prior to the WRITE command to
prevent bus contention.
12. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the WRITE on bank n when registered (WRITE to READ), with the data-out appearing CAS latency later. The last valid WRITE
to bank n will be data-in registered one clock prior to the READ to bank m.
13. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will inter-
rupt the WRITE on bank n when registered (WRITE to WRITE). The last valid WRITE to bank n will be data-in registered one
clock prior to the READ to bank m.
14. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the
READ on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is registered (Fig CAP
1).
15. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt
the READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention.
The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Fig CAP 2).
16. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the WRITE on bank n when registered, with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin
after tWR is met, where twr begins when the READ to bank m is registered. The last valid WRITE to bank n will be data-in regis-
tered one clock prior to the READ to bank m (Fig CAP 3).
17. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt
the WRITE on bank n when registered. The PRECHARGE to bank n will begin after twr is met, where t WR begins when the
WRITE to bank m is registered. The last valid WRITE to bank n will be data registered one clock prior to the WRITE to bank m
(Fig CAP 4).
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ABSOLUTE MAXIMUM RATINGS(1)
Symbol Parameters Rating Unit
Vdd max Maximum Supply Voltage –1.0 to +4.6 V
Vddq max Maximum Supply Voltage for Output Buffer –1.0 to +4.6 V
ViN Input Voltage –1.0 to Vddq + 0.5 V
Vout Output Voltage –1.0 to Vddq + 0.5 V
Pd max Allowable Power Dissipation 1 W
Ics output Shorted Current 50 mA
Topr operating Temperature Com. 0 to +70 °C
Ind. -40 to +85 °C
A1 -40 to +85 °C
A2 -40 to +105 °C
Tstg Storage Temperature –65 to +150 °C
DC RECOMMENDED OPERATING CONDITIONS(2)
(At Ta = 0 to +70°C for commercial grade. Ta = -40 to +85°C for industrial and A1 grade. Ta = -40 to +105°C for A2 grade)
Symbol Parameter Min. Typ. Max. Unit
Vdd, Vddq Supply Voltage 3.0 3.3 3.6 V
Vih Input High Voltage(3) 2.0 Vdd + 0.3 V
Vil Input Low Voltage(4) -0.3 +0.8 V
CAPACITANCE CHARACTERISTICS(1,2) (At Ta = 0 to +25°C, Vdd = Vddq = 3.3 ± 0.3V, f = 1 MHz)
Symbol Parameter Typ. Max. Unit
CiN Input Capacitance: Address and Control 3.8 pF
Cclk Input Capacitance: (CLK) 3.5 pF
CI/O Data Input/Output Capacitance: I/O0-I/O15 6.5 pF
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
2. All voltages are referenced to GND.
3. Vih(max) = Vddq + 1.2V with a pulse width < 3ns.
4. Vil(min) = GND - 1.2V with a pulse width < 3ns.
5. This parameter is characterized.
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DC ELECTRICAL CHARACTERISTICS (Recommended Operation Conditions unless otherwise noted.)
Symbol Parameter Test Condition Speed Min. Max. Unit
iil Input Leakage Current 0V ViN Vdd, with pins other than –5 5 µA
the tested pin at 0V
iol Output Leakage Current Output is disabled, 0V Vout Vdd –5 5 µA
Voh Output High Voltage Level iout = –2 mA 2.4 V
Vol Output Low Voltage Level iout = +2 mA 0.4 V
icc1 Operating Current(1,2) One Bank Operation, CAS latency = 3 Com. -5 110 mA
Burst Length=1 Com. -6 95 mA
trc trc (min.) Com. -7 85 mA
Iout = 0mA A1, Ind. -5/-6 155 mA
A1, A2, Ind. -7 145 mA
icc2p Precharge Standby Current CKE Vil (max) tck = 15ns Com. 2 mA
A1, A2, Ind. 4 mA
Icc2ps (In Power-Down Mode) tck = Com. 2 mA
A1, A2, Ind. 3 mA
icc2N(3) Precharge Standby Current CKE Vih (miN) tck = 15ns 20 mA
Icc2Ns (In Non Power-Down Mode) tck = ∞ Com. 15 mA
A1, A2, Ind. 15 mA
icc3p Active Standby Current CKE Vil (max) tck = 15ns Com. 7 mA
A1, A2, Ind. 7 mA
icc3ps (In Power-Down Mode) tck = ∞ Com. 5 mA
A1, A2, Ind. 5 mA
icc3N(3) Active Standby Current CKE Vih (miN) tck = 15ns 30 mA
Icc3Ns (In Non Power-Down Mode) tck = ∞ Com. 25 mA
A1, A2, Ind. 25 mA
icc4 Operating Current tck = tck (miN) CAS latency = 3 Com. -5 140 mA
(In Burst Mode)(1) Iout = 0mA Com. -6 130 mA
BL = 4; 4 banks activated Com. -7 100 mA
A1, Ind. -5/-6 140 mA
A1, A2, Ind. -7 110 mA
icc5 Auto-Refresh Current trc = trc (miN) CAS latency = 3 Com. -5 160 mA
tclk = tclk (miN) Com. -6 150 mA
Com. -7 130 mA
A1, Ind. -5/-6 170 mA
A1, A2, Ind. -7 150 mA
icc6 Self-Refresh Current CKE 0.2V 2 mA
Notes:
1. These are the values at the minimum cycle time. Since the currents are transient, these values decrease as the cycle time in-
creases. Also note that a bypass capacitor of at least 0.01 µF should be inserted between Vdd and GND for each memory chip
to suppress power supply voltage noise (voltage drops) due to these transient currents.
2. Icc1 and Icc4 depend on the output load. The maximum values for Icc1 and Icc4 are obtained with the output open state.
3. Input signal chnage once per 30ns.
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AC ELECTRICAL CHARACTERISTICS (1,2,3)
-5 -6 -7
Symbol Parameter Min. Max. Min. Max. Min. Max. Units
tck3 Clock Cycle Time CAS Latency = 3 5 6 7 ns
tck2 CAS Latency = 2 7.5 7.5 7.5 ns
tac3 Access Time From CLK(4,6) CAS Latency = 3 5 5.4 5.4 ns
tac2 CAS Latency = 2 6 6 6 ns
tch CLK HIGH Level Width 2 2 2.5 ns
tcl CLK LOW Level Width 2 2 2.5 ns
toh3 Output Data Hold Time(6) CAS Latency = 3 2.5 2.5 2.7 ns
toh2 CAS Latency = 2 2.5 2.5 2.7 ns
tlz Output LOW Impedance Time 0 0 0 ns
thz3 Output HIGH Impedance Time(5) CAS Latency = 3 5 5.4 5.4 ns
thz2 CAS Latency = 2 6 6 6 ns
tds Input Data Setup Time 1.5 1.5 1.5 ns
tdh Input Data Hold Time 0.8 0.8 0.8 ns
tas Address Setup Time 1.5 1.5 1.5 ns
tah Address Hold Time 0.8 0.8 0.8 ns
tcks CKE Setup Time 1.5 1.5 1.5 ns
tckh CKE Hold Time 0.8 0.8 0.8 ns
tcka CKE to CLK Recovery Delay Time
1CLK+3
1CLK+3
1CLK+3
ns
tcms Command Setup Time (CS, RAS, CAS, WE, DQM) 1.5 1.5 1.5 ns
tcmh Command Hold Time (CS, RAS, CAS, WE, DQM) 0.8 0.8 0.8 ns
trc Command Period (REF to REF / ACT to ACT) 55 60 63 ns
tras Command Period (ACT to PRE) 40
100,000
42
100,000
42
100,000
ns
trp Command Period (PRE to ACT) 15 18 20 ns
trcd Active Command To Read / Write Command Delay Time 15 18 20 ns
trrd Command Period (ACT [0] to ACT[1]) 10 12 14 ns
tdpl or Input Data To Precharge CAS Latency = 3 2CLK 2CLK 2CLK ns
twr Command Delay time
CAS Latency = 2 2CLK 2CLK 2CLK ns
tdal Input Data To Active / Refresh CAS Latency = 3
2CLK+trp
2CLK+trp
2CLK+trp
ns
Command Delay time
(During Auto-Precharge) CAS Latency = 2
2CLK+trp
2CLK+trp
2CLK+trp
ns
tt Transition Time 0.3 1.2 0.3 1.2 0.3 1.2 ns
txsr Exit to Self-Refresh to Active Time 60 66 70 ns
tref Refresh Cycle Time (4096)
Ta 70oC Com., Ind., A1, A2 64 64 64 ms
Ta 85oC Ind., A1, A2 64 64 64 ms
Ta > 85oC A2 16 ms
Notes:
1. When power is first applied, memory operation should be started 200 µs after Vdd and Vddq reach their stipulated voltages. Also
note that the power-on sequence must be executed before starting memory operation.
2. measured with tt = 1 ns.
3. The reference level is 1.4 V when measuring input signal timing. Rise and fall times are measured between Vih (min.) and Vil
(max.).
4. Access time is measured at 1.4V with the load shown in the figure below.
5. The time thz (max.) is defined as the time required for the output voltage to transition by ± 200 mV from Voh (min.) or Vol (max.)
when the output is in the high impedance state.
6. If clock rising time is longer than 1ns, tt/2 - 0.5ns should be added to the parameter.
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AC TEST CONDITIONS (Input/Output Reference Level: 1.4V)
I/O
50
+1.4V
50 pF
Input Load Output Load
3.0V
1.4V
0V
CLK
INPUT
OUTPUT
t
CH
t
CMH
t
AC
t
OH
t
CMS
t
CK
t
CL
3.0V
1.4V
1.4V 1.4V
0V
OPERATING FREQUENCY / LATENCY RELATIONSHIPS
SYMBOL PARAMETER -5 -6 -7 UNITS
Clock Cycle Time CL=3 5 6 7 ns
CL=2 7.5 7.5 7.5 ns
Operating Frequency CL=3 200 166 143 MHz
CL=2 133 133 133 MH
tccd READ/WRITE command to READ/WRITE command 1 1 1 cycle
tcked CKE to clock disable or power-down entry mode 1 1 1 cycle
tped CKE to clock enable or power-down exit setup mode 1 1 1 cycle
tdqd DQM to input data delay 0 0 0 cycle
tdqm DQM to data mask during WRITEs 0 0 0 cycle
tdqz DQM to data high-impedance during READs 2 2 2 cycle
tdwd WRITE command to input data delay 0 0 0 cycle
tdal Data-in to ACTIVE command CL=3 5 5 5 cycle
CL=2 4 5 5 cycle
tdpl Data-in to PRECHARGE command 2 2 2 cycle
tbdl Last data-in to burst STOP command 1 1 1 cycle
tcdl Last data-in to new READ/WRITE command 1 1 1 cycle
trdl Last data-in to PRECHARGE command 2 2 2 cycle
tmrd LOAD MODE REGISTER command 2 2 2 cycle
to ACTIVE or REFRESH command
troh Data-out to high-impedance from CL=3 3 3 3 cycle
PRECHARGE command CL=2 2 2 2 cycle
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FUNCTIONAL DESCRIPTION
The 64Mb SDRAMs (1 Meg x 16 x 4 banks) are quad-bank
DRAMs which operate at 3.3V and include a synchronous
interface (all signals are registered on the positive edge of
the clock signal, CLK). Each of the 16,777,216-bit banks is
organized as 4,096 rows by 256 columns by 16 bits.
Read and write accesses to the SDRAM are burst oriented;
accesses start at a selected location and continue for
a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an AC-
TIVE command which is then followed by a READ or WRITE
command. The address bits registered coincident with the
ACTIVE command are used to select the bank and row to
be accessed
(BA0 and BA1 select the bank, A0-A11 select the
row)
. The address bits
(A0-A7)
registered coincident with the
READ or WRITE command are used to select the starting
column location for the burst access.
Prior to normal operation, the SDRAM must be initial-
ized. The following sections provide detailed information
covering device initialization, register definition, command
descriptions and device operation.
Initialization
SDRAMs must be powered up and initialized in a
predefined manner.
The 64Mb SDRAM is initialized after the power is applied
to Vdd and Vddq (simultaneously), and the clock is stable
with DQM High and CKE High.
A 100µs delay is required prior to issuing any command
other than a
COMMAND INHIBIT
or a
NOP
. The COMMAND
INHIBIT or NOP may be applied during the 100µs period and
continue should at least through the end of the period.
With at least one COMMAND INHIBIT or NOP command
having been applied, a PRECHARGE command should
be applied once the 100µs delay has been satisfied. All
banks must be precharged. This will leave all banks in
an idle state,
after which at least two AUTO REFRESH
cycles
must be performed. After the
AUTO REFRESH
cycles are
complete, the SDRAM is then ready for mode register
programming.
The mode register should be loaded prior to applying
any operational command because it will power up in an
unknown state. After the Load Mode Register command,
at least one NOP command must be asserted prior to
any command.
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REGISTER DEFINITION
Mode Register
The mode register is used to define the specific mode
of operation of the SDRAM. This definition includes the
selection of a burst length, a burst type, a CAS latency,
an operating mode and a write burst mode, as shown in
MODE REGISTER DEFINITION.
The mode register is programmed via the LOAD MODE
REGISTER command and will retain the stored information
until it is programmed again or the device loses power.
Mode register bits M0-M2 specify the burst length, M3
specifies the type of burst
(sequential or interleaved)
, M4- M6
specify the CAS latency, M7 and M8 specify the operating
mode, M9 specifies the WRITE burst mode, and M10 and
M11 are reserved for future use.
The mode register must be loaded when all banks are
idle, and the controller must wait the specified time before
initiating the subsequent operation. Violating either of these
requirements will result in unspecified operation.
MODE REGISTER DEFINITION
Latency Mode
M6 M5 M4 CAS Latency
0 0 0 Reserved
0 0 1 Reserved
0 1 0 2
0 1 1 3
1 0 0 Reserved
1 0 1 Reserved
1 1 0 Reserved
1 1 1 Reserved
1. To ensure compatibility with future devices,
should program M11, M10 = "0, 0"
Write Burst Mode
M9 Mode
0 Programmed Burst Length
1 Single Location Access
Operating Mode
M8 M7 M6-M0 Mode
0 0 Defined Standard Operation
All Other States Reserved
Burst Type
M3 Type
0 Sequential
1 Interleaved
Burst Length
M2 M1 M0 M3=0 M3=1
0 0 0 1 1
0 0 1 2 2
0 1 0 4 4
0 1 1 8 8
1 0 0 Reserved Reserved
1 0 1 Reserved Reserved
1 1 0 Reserved Reserved
1 1 1 Full Page Reserved
Reserved
Address Bus
Mode Register (Mx)
A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
(1)
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BURST DEFINITION
Burst Starting Column Order of Accesses Within a Burst
Length Address Type = Sequential Type = Interleaved
A0
2 0 0-1 0-1
1 1-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3
4 0 1 1-2-3-0 1-0-3-2
1 0 2-3-0-1 2-3-0-1
1 1 3-0-1-2 3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
8 0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full n = A0-A7 Cn, Cn + 1, Cn + 2 Not Supported
Page Cn + 3, Cn + 4...
(y) (location 0-y) …Cn - 1,
Cn…
Burst Length
Read and write accesses to the SDRAM are burst oriented,
with the burst length being programmable, as shown in
MODE REGISTER DEFINITION. The burst length deter-
mines the maximum number of column locations that can
be accessed for a given READ or WRITE command. Burst
lengths of 1, 2, 4 or 8 locations are available for both the
sequential and the interleaved burst types, and a full-page
burst is available for the sequential type. The full-page
burst is used in conjunction with the BURST TERMINATE
command to generate arbitrary burst lengths.
Reserved states should not be used, as unknown operation
or incompatibility with future versions may result.
When a READ or WRITE command is issued, a block of
columns equal to the burst length is effectively selected. All
accesses for that burst take place within this block, mean-
ing that the burst will wrap within the block if a boundary
is reached. The block is uniquely selected by A1-A7 (x16)
when the burst length is set to two; by A2-A7 (x16) when
the burst length is set to four; and by A3-A7 (x16) when the
burst length is set to eight. The remaining (least significant)
address bit(s) is (are) used to select the starting location
within the block. Full-page bursts wrap within the page if
the boundary is reached.
Burst Type
Accesses within a given burst may be programmed to be
either sequential or interleaved; this is referred to as the
burst type and is selected via bit M3.
The ordering of accesses within a burst is determined by
the burst length, the burst type and the starting column
address, as shown in BURST DEFINITION table.
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DON'T CARE
UNDEFINED
CLK
COMMAND
DQ
READ NOP NOP NOP
CAS Latency - 3
t
AC
t
OH
D
OUT
T0 T1 T2 T3 T4
tLZ
CLK
COMMAND
DQ
READ NOP NOP
CAS Latency - 2
t
AC
t
OH
D
OUT
T0 T1 T2 T3
tLZ
CAS Latency
CAS Latency
The CAS latency is the delay, in clock cycles, between
the
registration of a READ command and the availability of
the first piece of output data. The latency can be set to two or
three clocks.
If a READ command is registered at clock edge n, and
the latency is m clocks, the data will be available by clock
edge n + m. The DQs will start driving as a result of the
clock edge one cycle earlier (n + m - 1), and provided that
the relevant access times are met, the data will be valid by
clock edge n + m. For example, assuming that the clock
cycle time is such that all relevant access times are met,
if a READ command is registered at T0 and the latency
is programmed to two clocks, the DQs will start driving
after T1 and the data will be valid by T2, as shown in CAS
Latency diagrams. The Allowable Operating Frequency
table indicates the operating frequencies at which each
CAS latency setting can be used.
Reserved states should not be used as unknown operation
or incompatibility with future versions may result.
CAS Latency
Allowable Operating Frequency (MHz)
Speed CAS Latency = 2 CAS Latency = 3
5 133 200
6 133 166
7 133 143
Operating Mode
The normal operating mode is selected by setting M7 and M8
to zero; the other combinations of values for M7 and M8 are
reserved for future use and/or test modes. The programmed
burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used be-
cause unknown operation or incompatibility with future
versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2
applies to both READ and WRITE bursts; when M9 = 1,
the programmed burst length applies to READ bursts, but
write accesses are single-location (nonburst) accesses.
Integrated Silicon Solution, Inc. — www.issi.com 21
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CLK
CKE HIGH
ROW ADDRESS
BANK ADDRESS
CS
RAS
CAS
WE
A0-A11
BA0, BA1
Activating Specific Row Within Specific Bank
OPERATION
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be issued
to a bank within the SDRAM, a row in that bank must be
“opened.
This is accomplished via the ACTIVE command,
which selects both the bank and the row to be activated
(see
Activating Specific Row Within Specific Bank
).
After opening a row
(issuing an ACTIVE command)
, a READ
or WRITE command may be issued to that row, subject to
the trcd specification. Minimum trcd should be divided by
the clock period and rounded up to the next whole number
to determine the earliest clock edge after the ACTIVE
command on which a READ or WRITE command can be
entered. For example, a trcd specification of 20ns with a
125 MHz clock (8ns period) results in 2.5 clocks, rounded
to 3. This is reflected in the following example, which cov-
ers any case where 2 < [trcd (MIN)/tck] 3. (The same
procedure is used to convert other specification limits from
time units to clock cycles).
A subsequent ACTIVE command to a different row in the
same bank can only be issued after the previous active
row has been “closed” (precharged). The minimum time
interval between successive ACTIVE commands to the
same bank is defined by trc.
A subsequent ACTIVE command to another bank can be
issued while the first bank is being accessed, which results
in a reduction of total row-access overhead. The minimum
time interval between successive ACTIVE commands to
different banks is defined by trrd.
Example: Meeting tRCD (MIN) when 2 < [tRCD (min)/tCK] 3
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CLK
CKE HIGH
COLUMN ADDRESS
AUTO PRECHARGE
NO PRECHARGE
CS
RAS
CAS
WE
A0-A7
A10
BA0, BA1 BANK ADDRESS
A8, A9, A11
READ COMMANDREADS
READ bursts are initiated with a READ command, as
shown in the READ COMMAND diagram.
The starting column and bank addresses are provided with
the READ command, and auto precharge is either enabled or
disabled for that burst access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic READ commands used in the fol-
lowing illustrations, auto precharge is disabled.
During READ bursts, the valid data-out element from the
starting column address will be available following the
CAS latency after the READ command. Each subsequent
data-out element will be valid by the next positive clock
edge. The CAS Latency diagram shows general timing
for each possible CAS latency setting.
Upon completion of a burst, assuming no other commands
have been initiated, the DQs will go High-Z. A full-page burst
will continue until terminated. (At the end of the page, it will
wrap to column 0 and continue.)
Data from any READ burst may be truncated with a sub-
sequent READ command, and data from a fixed-length
READ burst may be immediately followed by data from a
READ command. In either case, a continuous flow of data
can be maintained. The first data element from the new
burst follows either the last element of a completed burst
or the last desired data element of a longer burst which
is being truncated.
The new READ command should be issued x cycles before
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in Consecutive READ Bursts for CAS latencies of
two and three; data element n + 3 is either the last of a
burst of four or the last desired of a longer burst. The 64Mb
SDRAM uses a pipelined architecture and therefore does
not require the 2n rule associated with a prefetch architec-
ture. A READ command can be initiated on any clock cycle
following a previous READ command. Full-speed random
read accesses can be performed to the same bank, as
shown in Random READ Accesses, or each subsequent
READ may be performed to a different bank.
Data from any READ burst may be truncated with a sub-
sequent WRITE command, and data from a fixed-length
READ burst may be immediately followed by data from a
WRITE command (subject to bus turnaround limitations).
The WRITE burst may be initiated on the clock edge im-
mediately following the last (or last desired) data element
from the READ burst, provided that I/O contention can be
avoided. In a given system design, there may be a pos-
sibility that the device driving the input data will go Low-Z
before the SDRAM DQs go High-Z. In this case, at least
a single-cycle delay should occur between the last read
data and the WRITE command.
The DQM input is used to avoid I/O contention, as shown
in Figures RW1 and RW2. The DQM signal must be as-
serted (HIGH) at least three clocks prior to the WRITE
command (DQM latency is two clocks for output buffers)
to suppress data-out from the READ. Once the WRITE
command is registered, the DQs will go High-Z (or remain
High-Z), regardless of the state of the DQM signal, provided
the DQM was active on the clock just prior to the WRITE
command that truncated the READ command. If not, the
second WRITE will be an invalid WRITE. For example, if
DQM was LOW during T4 in Figure RW2, then the WRITEs
at T5 and T7 would be valid, while the WRITE at T6 would
be invalid.
The DQM signal must be de-asserted prior to the WRITE
command (DQM latency is zero clocks for input buffers)
to ensure that the written data is not masked.
A fixed-length READ burst may be followed by, or truncated
with, a
PRECHARGE
command to the same bank
(provided
that auto precharge was not activated)
, and a full-page burst
may be truncated with a PRECHARGE command to the
same bank. The PRECHARGE command should be issued
x cycles before the clock edge at which the last desired
data element is valid, where x equals the CAS latency
minus one. This is shown in the READ to PRECHARGE
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DON'T CARE
UNDEFINED
CLK
COMMAND
DQ
READ NOP NOP NOP
CAS Latency - 3
t
AC
t
OH
D
OUT
T0 T1 T2 T3 T4
tLZ
CLK
COMMAND
DQ
READ NOP NOP
CAS Latency - 2
t
AC
t
OH
D
OUT
T0 T1 T2 T3
tLZ
CAS Latency
diagram for each possible CAS latency; data element n +
3 is either the last of a burst of four or the last desired of
a longer burst. Following the PRECHARGE command, a
subsequent command to the same bank cannot be issued
until trp is met. Note that part of the row precharge time is
hidden during the access of the last data element(s).
In the case of a fixed-length burst being executed to
completion, a PRECHARGE command issued at the
optimum time (as described above) provides the same
operation that would result from the same fixed-length
burst with auto precharge. The disadvantage of the PRE-
CHARGE command is that it requires that the command
and address buses be available at the appropriate time to
issue the command; the advantage of the PRECHARGE
command is that it can be used to truncate fixed-length
or full-page bursts.
Full-page READ bursts can be truncated with the BURST
TERMINATE command, and fixed-length READ bursts
may be truncated with a BURST TERMINATE command,
provided that auto precharge was not activated. The BURST
TERMINATE command should be issued x cycles before
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in the READ Burst Termination diagram for each
possible CAS latency; data element n + 3 is the last desired
data element of a longer burst.
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DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
READ
NOP NOP NOP READ NOP NOP
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
D
OUT
b
BANK,
COL n BANK,
COL b
CAS Latency - 2
x = 1 cycle
DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
READ
NOP NOP NOP READ NOP NOP NOP
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
D
OUT
b
BANK,
COL n BANK,
COL b
CAS Latency - 3
x = 2 cycles
Consecutive READ Bursts
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DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5
READ
READ
READ
READ
NOP NOP
D
OUT
n
D
OUT
b
D
OUT
m
D
OUT
x
BANK,
COL n BANK,
COL b
CAS Latency - 2
BANK,
COL m BANK,
COL x
DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
READ
READ
READ
READ
NOP NOP NOP
D
OUT
n
D
OUT
b
D
OUT
m
D
OUT
x
BANK,
COL n BANK,
COL b
CAS Latency - 3
BANK,
COL m BANK,
COL x
Random READ Accesses
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DON'T CARE
CLK
DQM
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5
READ
NOP NOP NOP NOP WRITE
BANK,
COL n BANK,
COL b
D
OUT
n
D
IN
b
t
DS
t
HZ
CAS Latency - 3
RW1 - READ to WRITE
RW2 - READ to WRITE
DON'T CARE
CLK
DQM
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
READ
NOP NOP NOP NOP NOP WRITE
BANK,
COL n
DIN b
tDS
tHZ
BANK,
COL b
CAS Latency - 2
DOUT n
D
OUT
n+1 D
OUT
n+2
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DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
READ
NOP NOP NOP NOP NOP ACTIVE
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
BANK a,
COL n BANK a,
ROW
BANK
(a or all)
CAS Latency - 2
x = 1 cycle
t
RP
PRECHARGE
DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
READ
NOP NOP NOP NOP NOP ACTIVE
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
BANK,
COL n BANK,
COL b
CAS Latency - 3
x = 2 cycles
t
RP
BANK a,
ROW
PRECHARGE
READ to PRECHARGE
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DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
READ
NOP NOP NOP NOP NOP
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
BANK a,
COL n
CAS Latency - 2
x = 1 cycle
BURST
TERMINATE
DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
READ
NOP NOP NOP NOP NOP NOP
D
OUT
n
D
OUT
n+1
D
OUT
n+2
D
OUT
n+3
BANK,
COL n
CAS Latency - 3
x = 2 cycles
BURST
TERMINATE
READ Burst Termination
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CLK
CKE
HIGH
COLUMN ADDRESS
AUTO PRECHARGE
BANK ADDRESS
CS
RAS
CAS
WE
A0-A7
A10
BA0, BA1
NO PRECHARGE
A8, A9, A11
WRITE Command
The starting column and bank addresses are provided with
the WRITE command, and auto precharge is either enabled
or disabled for that access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic WRITE commands used in the
following illustrations, auto precharge is disabled.
During WRITE bursts, the first valid
data-in
element will be
registered coincident
with the
WRITE
command.
Subsequent
data elements will be registered on each successive posi-
tive clock edge. Upon completion of a fixed-length burst,
assuming no other commands have been initiated, the
DQs will remain High-Z and any additional input data will
be ignored (see WRITE Burst). A full-page burst will con-
tinue until terminated. (At the end of the page, it will wrap
to column 0 and continue.)
Data for any WRITE burst may be truncated with a subse-
quent WRITE command, and data for a xed-length WRITE
burst may be immediately followed by data for a WRITE
command. The new WRITE command can be issued on
any clock following the previous WRITE command, and the
data provided coincident with the new command applies to
the new command.
An example is shown in WRITE to WRITE diagram. Data
n + 1 is either the last of a burst of two or the last desired
of a longer burst. The 64Mb SDRAM uses a pipelined
architecture and therefore does not require the 2n rule as-
sociated with a prefetch architecture. A WRITE command
can be initiated on any clock cycle following a previous
WRITE command. Full-speed random write accesses within
a page can be performed to the same bank, as shown in
Random WRITE Cycles, or each subsequent WRITE may
be performed to a different bank.
Data for any WRITE burst may be truncated with a subse-
quent READ command, and data for a fixed-length WRITE
burst may be immediately followed by a subsequent READ
command. Once the READ command is registered, the
data inputs will be ignored, and WRITEs will not be ex-
ecuted. An example is shown in WRITE to READ. Data n
+ 1 is either the last of a burst of two or the last desired
of a longer burst.
Data for a fixed-length WRITE burst may be followed
by, or truncated with, a PRECHARGE command to the
same bank (provided that auto precharge was not acti-
vated), and a full-page WRITE burst may be truncated
with a PRECHARGE command to the same bank. The
PRECHARGE command should be issued twr after the
clock edge at which the last desired input data element
is registered. The auto precharge mode requires a twr of
at least one clock plus time, regardless of frequency. In
addition, when truncating a WRITE burst, the DQM signal
must be used to mask input data for the clock edge prior
to, and the clock edge coincident with, the PRECHARGE
command. An example is shown in the WRITE to PRE-
CHARGE diagram. Data n+1 is either the last of a burst
of two or the last desired of a longer burst. Following the
PRECHARGE command, a subsequent command to the
same bank cannot be issued until trp is met.
In the case of a fixed-length burst being executed to comple-
tion, a PRECHARGE command issued at the optimum
time
(as described above)
provides the same operation that
would result from the same fixed-length burst with auto
precharge. The disadvantage of the
PRECHARGE
command
is that it requires that the command and address buses be
available at the appropriate time to issue the command; the
advantage of the PRECHARGE command is that it can be
used to truncate fixed-length or full-page bursts.
Fixed-length or full-page WRITE bursts can be truncated
with the BURST TERMINATE command. When truncat-
ing a WRITE burst, the input data applied coincident with
the BURST TERMINATE command will be ignored. The
last data written (provided that DQM is LOW at that time)
will be the input data applied one clock previous to the
BURST TERMINATE command. This is shown in WRITE
Burst Termination, where data n is the last desired data
element of a longer burst.
WRITEs
WRITE bursts are initiated with a WRITE command, as
shown in WRITE Command diagram.
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CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3
WRITE
NOP
NOP
NOP
D
IN
n
D
IN
n+1
BANK,
COL n
DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2
WRITE
NOP
WRITE
D
IN
n
D
IN
n+1
D
IN
b
BANK,
COL n BANK,
COL b
DON'T CARE
WRITE Burst
WRITE to WRITE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3
WRITE
WRITE
WRITE
WRITE
DIN n
DIN b
DIN m
DIN x
BANK,
COL n BANK,
COL b BANK,
COL m BANK,
COL x
Random WRITE Cycles
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DON'T CARE
CLK
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5
WRITE
NOP
READ
NOP
NOP NOP
D
IN
n
D
IN
n+1
D
OUT
b
D
OUT
b+1
BANK,
COL n BANK,
COL b
CAS Latency - 2
WRITE to READ
WP1 - WRITE to PRECHARGE
DON'T CARE
CLK
DQM
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
WRITE
NOP NOP ACTIVE NOP NOP
BANK a,
COL n BANK a,
ROW
BANK
(a or all)
t
WR
t
RP
PRECHARGE
D
IN
n
D
IN
n+1
CAS Latency - 2
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CLK
COMMAND
ADDRESS
DQ
T0 T1 T2
WRITE
DIN n
(DATA)
BANK,
COL n
DON'T CARE
(ADDRESS)
BURST
TERMINATE
NEXT
COMMAND
WRITE Burst Termination
DON'T CARE
CLK
DQM
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
WRITE
NOP NOP NOP ACTIVE NOP
BANK a,
COL n BANK a,
ROW
BANK
(a or all)
t
WR
t
RP
PRECHARGE
D
IN
n
D
IN
n+1
CAS Latency - 3
WP2 - WRITE to PRECHARGE
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CLK
CKE
HIGH
ALL BANKS
BANK SELECT
BANK ADDRESS
CS
RAS
CAS
WE
A0-A9, A11
A10
BA0, BA1
DON'T CARE
CLK
CKE
COMMAND NOP NOP
ACTIVE
t
CKS
t
CKS
All banks idle
Enter
power-down mode
Exit power-down mode
t
RCD
t
RAS
t
RC
Input buffers gated
off
PRECHARGE Command
POWER-DOWN
POWER-DOWN
Power-down occurs if CKE is registered LOW coincident
with a NOP or COMMAND INHIBIT when no accesses
are in progress. If power-down occurs when all banks are
idle, this mode is referred to as precharge power-down;
if power-down occurs when there is a row active in either
bank, this mode is referred to as active power-down.
Entering power-down deactivates the input and output
buffers, excluding CKE, for maximum power savings while
in standby. The device may not remain in the power-down
state longer than the refresh period (64ms) since no refresh
operations are performed in this mode.
The power-down state is exited by registering a NOP or
COMMAND INHIBIT and CKE HIGH at the desired clock
edge (meeting tcks). See figure below.
PRECHARGE
The PRECHARGE command (see figure) is used to deac-
tivate the open row in a particular bank or the open row in
all banks. The bank(s) will be available for a subsequent row
access some specified time (trp) after the PRECHARGE
command is issued. Input A10 determines whether one or
all banks are to be precharged, and in the case where only
one bank is to be precharged, inputs BA0, BA1 select the
bank. When all banks are to be precharged, inputs BA0,
BA1 are treated as “Don’t Care.” Once a bank has been
precharged, it is in the idle state and must be activated
prior to any READ or WRITE commands being issued to
that bank.
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DON'T CARE
CLK
CKE
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5
NOP
WRITE
NOP NOP
BANK a,
COL n
D
IN
n
DIN n+1 DIN n+2
INTERNAL
CLOCK
DON'T CARE
CLK
CKE
COMMAND
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6
READ
NOP NOP NOP NOP NOP
BANK a,
COL n
DOUT n
DOUT n+1
D
OUT
n+2
D
OUT
n+3
INTERNAL
CLOCK
CLOCK SUSPEND
Clock suspend mode occurs when a column access/burst
is in progress and CKE is registered LOW. In the clock
suspend mode, the internal clock is deactivated, “freezing”
the synchronous logic.
For each positive clock edge on which CKE is sampled
LOW, the next internal positive clock edge is suspended.
Any command or data present on the input pins at the time
of a suspended internal clock edge is ignored; any data
present on the DQ pins remains driven; and burst counters
are not incremented, as long as the clock is suspended.
(See following examples.)
Clock suspend mode is exited by registering CKE HIGH;
the internal clock and related operation will resume on the
subsequent positive clock edge.
Clock Suspend During WRITE Burst
Clock Suspend During READ Burst
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DON'T CARE
CLK
COMMAND
BANK n
BANK m
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
NOP NOP NOP NOP NOP NOP
D
OUT
a
D
OUT
a+1
D
OUT
b
D
OUT
b+1
BANK n,
COL a BANK m,
COL b
CAS Latency - 3 (BANK n)
CAS Latency - 3 (BANK m)
t
RP - BANK n
t
RP - BANK m
READ - AP
BANK n
READ - AP
BANK m
Page Active READ with Burst of 4 Interrupt Burst, Precharge Idle
Page Active READ with Burst of 4 Precharge
Internal States
DON'T CARE
CLK
COMMAND
BANK n
BANK m
ADDRESS
DQM
DQ
T0 T1 T2 T3 T4 T5 T6 T7
NOP NOP NOP NOP NOP NOP
DOUT a
DIN b
DIN b+1
DIN b+2
DIN b+3
BANK n,
COL a BANK m,
COL b
CAS Latency - 3 (BANK n)
t
RP - BANK n tRP - BANK m
WRITE - AP
BANK n
WRITE - AP
BANK m
READ with Burst of 4 Interrupt Burst, Precharge Idle
Page Active WRITE with Burst of 4 Write-Back
Internal States
Page Active
BURST READ/SINGLE WRITE
The burst read/single write mode is entered by programming
the write burst mode bit
(M9)
in the mode register to a logic
1. In this mode, all
WRITE
commands result in the access
of a single column location (burst of one), regardless of
the programmed burst length. READ commands access
columns according to the programmed burst length and
sequence, just as in the normal mode of operation (M9
= 0).
CONCURRENT AUTO PRECHARGE
An access command (READ or WRITE) to another bank
while an access command with auto precharge enabled is
executing is not allowed by SDRAMs, unless the SDRAM
supports CONCURRENT AUTO PRECHARGE. ISSI
SDRAMs support CONCURRENT AUTO PRECHARGE.
Four cases where CONCURRENT AUTO PRECHARGE
occurs are defined below.
READ with Auto Precharge
1. Interrupted by a READ (with or without auto precharge):
A READ to bank m will interrupt a READ on bank n,
CAS latency later. The PRECHARGE to bank n will
begin when the READ to bank m is registered.
2. Interrupted by a WRITE (with or without auto precharge):
A WRITE to bank m will interrupt a READ on bank n
when registered. DQM should be used two clocks prior
to the WRITE command to prevent bus contention. The
PRECHARGE to bank n will begin when the WRITE to
bank m is registered.
Fig CAP 1 - READ With Auto Precharge interrupted by a READ
Fig CAP 2 - READ With Auto Precharge interrupted by a WRITE
36 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
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IS42S16400F
IS45S16400F
DON'T CARE
CLK
COMMAND
BANK n
BANK m
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
NOP NOP NOP NOP NOP NOP
D
IN
a
D
IN
a+1
D
OUT
b
D
OUT
b+1
BANK n,
COL a BANK m,
COL b
CAS Latency - 3 (BANK m)
t
RP - BANK n
t
RP - BANK m
WRITE - AP
BANK n
READ - AP
BANK m
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active READ with Burst of 4 Precharge
Internal States
t
WR
- BANK n
DON'T CARE
CLK
COMMAND
BANK n
BANK m
ADDRESS
DQ
T0 T1 T2 T3 T4 T5 T6 T7
NOP NOP NOP NOP NOP NOP
BANK n,
COL a BANK m,
COL b
t
RP - BANK n
t
RP - BANK m
WRITE - AP
BANK n
WRITE - AP
BANK m
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active WRITE with Burst of 4 Write-Back
Internal States
t
WR
- BANK n
D
IN
a
D
IN
a+1 D
IN
a+2
D
IN
b
D
IN
b+1 D
IN
b+2 D
IN
b+3
WRITE with Auto Precharge
3. Interrupted by a READ (with or without auto precharge):
A READ to bank m will interrupt a WRITE on bank n
when registered, with the data-out appearing
CAS latency
later. The PRECHARGE to bank n will begin after twr
is met, where twr begins when the READ to bank m is
registered. The last valid
WRITE
to bank n will be data-in
registered one clock prior to the READ to bank m.
4. Interrupted by a WRITE (with or without auto precharge):
A
WRITE
to bank m will interrupt a
WRITE
on bank n when
registered. The PRECHARGE to bank n will begin after
twr is met, where twr begins when the WRITE to bank
m is registered. The last valid data WRITE to bank n
will be data registered one clock prior to a WRITE to
bank m.
Fig CAP 3 - WRITE With Auto Precharge interrupted by a READ
Fig CAP 4 - WRITE With Auto Precharge interrupted by a WRITE
Integrated Silicon Solution, Inc. — www.issi.com 37
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IS42S16400F
IS45S16400F
INITIALIZE AND LOAD MODE REGISTER(1)
Notes:
1. If CS is High at clock High time, all commands applied are NOP.
2. The Mode register may be loaded prior to the Auto-Refresh cycles if desired.
3. JEDEC and PC100 specify three clocks.
4. Outputs are guaranteed High-Z after the command is issued.
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCH tCLtCK
tCMS tCMH tCMS tCMH tCMS tCMH
tCKS tCKH
T0 T1 Tn+1 To+1 Tp+1 Tp+2 Tp+3
tMRDtRCtRCtRP
ROW
ROW
BANK
tAS tAH
tAS tAH
CODE
CODE
ALL BANKS
SINGLE BANK
ALL BANKS
AUTO
REFRESH AUTO
REFRESH Load MODE
REGISTER
T = 100µs Min.
Power-up: VCC
and CLK stable
Precharge
all banks
AUTO REFRESH Program MODE REGISTER
NOP
PRECHARGE
NOP NOP NOP ACTIVE
T
(2, 3, 4)
AUTO REFRESH
At least 2 Auto-Refresh Commands
38 Integrated Silicon Solution, Inc. — www.issi.com
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IS45S16400F
POWER-DOWN MODE CYCLE
CAS latency = 2, 3
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
AS
t
AH
BANK
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
PRECHARGE
NOP NOP NOP
ACTIVE
ALL BANKS
SINGLE BANK
ROW
ROW
BANK
t
CKS
t
CKS
Precharge all
active banks
All banks idle
Two clock cycles
Input buffers gated
off while in
power-down mode
All banks idle, enter
power-down mode
Exit
p
ower-down mode
T0 T1 T2 Tn+1 Tn+2
High-Z
Integrated Silicon Solution, Inc. — www.issi.com 39
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IS42S16400F
IS45S16400F
CLOCK SUSPEND MODE
Notes:
1. CAS latency = 3, burst length = 2
2. A8, A9, and A11 = "Don't Care"
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCMS tCMH
tAS tAH
tAS tAH
tAS tAH
tCH
tCLtCK
tCMS tCMH
tCKS tCKH
COLUMN m
(2)
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
READ NOP NOP NOP NOP NOP WRITE NOP
tCKS tCKH
BANK BANK
COLUMN n
(2)
tAC tAC
tOH
tHZ
D
OUT
m D
OUT
m+1
t
LZ
UNDEFINED
D
OUT
e+1
tDS tDH
D
OUT
e
40 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
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IS42S16400F
IS45S16400F
AUTO-REFRESH CYCLE
CAS latency = 2, 3
tRP tRC tRC
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tAS tAH
tCH
tCL
tCK
tCMS tCMH
tCKS tCKH
T0 T1 T2 Tn+1 To+1
ALL BANKS
SINGLE BANK
BANK
(s)
ROW
ROW
BANK
High-Z
PRECHARGE
NOP NOP NOP ACTIVE
Auto
Refresh
Auto
Refresh
Integrated Silicon Solution, Inc. — www.issi.com 41
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IS42S16400F
IS45S16400F
SELF-REFRESH CYCLE
Note:
1. Self-Refresh Mode is not supported for A2 grade with T
a > 85oC.
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tAS tAH
BANK
tCL
tCHtCK
tCMS tCMH
tCKS tCKH
ALL BANKS
SINGLE BANK
tCKS
Precharge all
active banks
CLK stable prior to exiting
self refresh mode
Enter self
refresh
mode
Exit
self refresh
mode
(Restart refresh time base)
T0 T1 T2 Tn+1 To+1 To+2
High-Z
Auto
Refresh Auto
Refresh
PRECHARGE
NOP NOP NOP
tCKS
tRAS
tRP tXSR
DON'T CARE
42 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
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IS42S16400F
IS45S16400F
READ WITHOUT AUTO PRECHARGE
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP READ NOP NOP NOP
PRECHARGE
NOP ACTIVE
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ROW
ROW
BANK
COLUMN m(2)
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
BANK
t
RCD
CAS Latency
t
AC
t
AC
t
AC
t
AC
tOH
t
HZ
tOH
DOUT m
tOH
DOUT m+1
tOH
DOUT m+2 DOUT m+3
T0 T1 T2 T3 T4 T5 T6 T7 T8
DISABLE AUTO PRECHARGE
ROW
ROW
BANK
t
LZ
t
RAS
t
RC
t
RP
ALL BANKS
SINGLE BANK
BANK
Notes:
1. CAS latency = 2, burst length = 4
2. A8, A9, and A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com 43
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IS42S16400F
IS45S16400F
READ WITH AUTO PRECHARGE
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP READ NOP NOP NOP NOP NOP ACTIVE
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ROW
ROW
BANK
COLUMN m
(2)
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
BANK
t
RCD
t
RAS
t
RC
CAS Latency
t
AC
t
AC
t
AC
t
AC
t
OH
t
HZ
t
OH
D
OUT
m
t
OH
D
OUT
m+1
t
OH
D
OUT
m+2 D
OUT
m+3
T0 T1 T2 T3 T4 T5 T6 T7 T8
t
RP
ENABLE AUTO PRECHARGE
ROW
ROW
BANK
tLZ
Notes:
1. CAS latency = 2, burst length = 4
2. A8, A9, and A11 = "Don't Care"
44 Integrated Silicon Solution, Inc. — www.issi.com
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IS45S16400F
SINGLE READ WITHOUT AUTO PRECHARGE
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP READ NOP NOP
PRECHARGE
NOP ACTIVE NOP
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ROW
ROW
BANK
COLUMN m(2)
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
BANK
t
RCD
t
RAS
t
RC
CAS Latency
t
AC
t
HZ
t
OH
DOUT m
T0 T1 T2 T3 T4 T5 T6 T7 T8
t
RP
DISABLE AUTO PRECHARGE
ROW
ROW
BANK
tLZ
ALL BANKS
SINGLE BANK
BANK
Notes:
1. CAS latency = 2, burst length = 1
2. A8, A9, and A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com 45
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IS42S16400F
IS45S16400F
SINGLE READ WITH AUTO PRECHARGE
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP NOP NOP READ NOP NOP ACTIVE NOP
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ROW
ROW
BANK
COLUMN m(2)
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
BANK
t
RCD
t
RAS
t
RC
CAS Latency
t
AC
t
HZ
t
OH
DOUT m
T0 T1 T2 T3 T4 T5 T6 T7 T8
t
RP
ENABLE AUTO PRECHARGE
ROW
ROW
BANK
Notes:
1. CAS latency = 2, burst length = 1
2. A8, A9, and A11 = "Don't Care"
46 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
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IS42S16400F
IS45S16400F
ALTERNATING BANK READ ACCESSES
BANK 0 BANK 3 BANK 3 BANK 0
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCMS tCMH
tAS tAH
tAS tAH
tAS tAH
tRCD - BANK 0
CAS Latency - BANK 0
tRCD
- BANK 0
tRAS - BANK 0
tRC - BANK 0
tCH
tCLtCK
tCMS tCMH
tCKS tCKH
ACTIVE
NOP READ NOP
ACTIVE
NOP READ NOP
ACTIVE
ROW
ROW
BANK 0
ROW ROW
tRRD tRCD - BANK 3
tRP - BANK 0
COLUMN m(2)
ROW
COLUMN b(2)
ROW
ENABLE AUTO PRECHARGE ENABLE AUTO PRECHARGE
T0 T1 T2 T3 T4 T5 T6 T7 T8
tAC
tOH tOH tOH tOH tOH
DOUT m DOUT m+1 DOUT m+2 DOUT m+3 DOUT b
tAC tAC tAC tAC tAC
tLZ
CAS Latency - BANK 3
Notes:
1. CAS latency = 2, burst length = 4
2. A8, A9, and A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com 47
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IS45S16400F
READ - FULL-PAGE BURST
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP READ NOP NOP NOP NOP NOP
BURST TERM NOP NOP
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ROW
ROW
BANK
COLUMN m
(2)
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
BANK
t
RCD
CAS Latency
t
AC
t
AC
t
AC
t
AC
t
AC
t
HZ
t
LZ
t
AC
t
OH
t
OH
t
OH
t
OH
t
OH
t
OH
D
OUT
m D
OUT
m+1 D
OUT
m+2 D
OUT
m-1 D
OUT
m D
OUT
m+1
each row (x4) has
1,024 locations Full page
completion
Full-page burst not self-terminating.
Use BURST TERMINATE command.
T0 T1 T2 T3 T4 T5 T6 Tn+1 Tn+2 Tn+3 Tn+4
Notes:
1. CAS latency = 2, burst length = full page
2. A8, A9, and A11 = "Don't Care"
48 Integrated Silicon Solution, Inc. — www.issi.com
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IS45S16400F
READ - DQM OPERATION
DON'T CARE
UNDEFINED
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP READ NOP NOP NOP NOP NOP NOP
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
ROW
ROW
BANK
t
RCD
CAS Latency
D
OUT
m
D
OUT
m+2
D
OUT
m+3
COLUMN m
(2)
BANK
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
t
OH
t
OH
t
OH
t
AC
t
AC
t
AC
t
HZ
t
HZ
t
LZ
t
LZ
T0 T1 T2 T3 T4 T5 T6 T7 T8
Notes:
1. CAS latency = 2, burst length = 4
2. A8, A9, and A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com 49
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WRITE - WITHOUT AUTO PRECHARGE
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCMS tCMH
tAS tAH
tAS tAH
tAS tAH
tRCD
tRAS
tRC
tCH
tCLtCK
tCMS tCMH
tCKS tCKH
ACTIVE
NOP WRITE NOP NOP NOP
PRECHARGE
NOP
ACTIVE
tWR
(3)
tRP
COLUMN m
(2)
ROW
DISABLE AUTO PRECHARGE
ROW
ROW
ROW
BANK
tDS tDH tDS tDH tDS tDHtDS tDH
DIN m DIN m+
1
DIN m+
2
DIN m+
3
BANK BANK BANK
ALL BANKS
SINGLE BANK
T0 T1 T2 T3 T4 T5 T6 T7 T8
Notes:
1. burst length = 4
2. A8, A9, and A11 = "Don't Care"
3. tras must not be violated
50 Integrated Silicon Solution, Inc. — www.issi.com
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IS45S16400F
WRITE - WITH AUTO PRECHARGE
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
t
RCD
t
RAS
t
RC
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
ACTIVE
NOP WRITE NOP NOP NOP NOP NOP NOP
ACTIVE
t
WR
t
RP
COLUMN m
(2)
ROW
BANK BANK
ENABLE AUTO PRECHARGE
ROW
ROW
ROW
BANK
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
D
IN
m D
IN
m+
1
D
IN
m+
2
D
IN
m+
3
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
Notes:
1. burst length = 4
2. A8, A9, and A11 = "Don't Care"
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SINGLE WRITE - WITHOUT AUTO PRECHARGE
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
t
DS
t
DH
t
RCD
t
RAS
t
RC
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
ACTIVE NOP WRITE NOP
(4)
NOP
(4)
PRECHARGE
NOP
ACTIVE
NOP
t
WR
(3)
t
RP
DISABLE AUTO PRECHARGE
ROW
ROW
ROW
BANK
D
IN
m
COLUMN m
(2)
ROW
BANK BANK BANK
ALL BANKS
SINGLE BANK
T0 T1 T2 T3 T4 T5 T6 T7 T8
Notes:
1. burst length = 1
2. A8, A9, and A11 = "Don't Care"
3. tras must not be violated
52 Integrated Silicon Solution, Inc. — www.issi.com
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SINGLE WRITE - WITH AUTO PRECHARGE
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
t
DS
t
DH
t
RCD
t
RAS
t
RC
t
CH
t
CL
t
CK
t
CMS
t
CMH
t
CKS
t
CKH
ACTIVE NOP
(3)
NOP
(3)
NOP
(3)
WRITE NOP NOP NOP ACTIVE NOP
t
WR
t
RP
COLUMN m
(2)
ROW
BANK BANK
ENABLE AUTO PRECHARGE
ROW
ROW
ROW
BANK
D
IN
m
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
Notes:
1. burst length = 1
2. A8, A9, and A11 = "Don't Care"
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ALTERNATING BANK WRITE ACCESS
BANK 0 BANK 1 BANK 1 BANK 0
DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCMS tCMH
tAS tAH
tAS tAH
tAS tAH
tDS tDH tDS tDH tDS tDH
tRCD - BANK 0
tRCD
- BANK 0
tWR
- BANK 1
tRAS - BANK 0
tRC - BANK 0
tCH
tCLtCK
tDS tDH tDS tDH tDS tDH tDS tDH tDS tDH
tCMS tCMH
tCKS tCKH
ACTIVE NOP WRITE NOP ACTIVE NOP WRITE NOP NOP ACTIVE
DIN m DIN m+
1
DIN m+
2
DIN m+
3
DIN b DIN b+
1
DIN b+
2
DIN b+
3
ROW
ROW
BANK 0
ROW ROW
tRRD tRCD - BANK 1
tWR - BANK 0 tRP - BANK 0
COLUMN m(2)
ROW
COLUMN b(2)
ROW
ENABLE AUTO PRECHARGE ENABLE AUTO PRECHARGE
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
Notes:
1. burst length = 4
2. A8, A9, and A11 = "Don't Care"
54 Integrated Silicon Solution, Inc. — www.issi.com
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DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
t
CMS
t
CMH
ACTIVE NOP WRITE NOP NOP NOP NOP
BURST TERM NOP
t
AS
t
AH
t
AS
t
AH
t
AS
t
AH
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
ROW
ROW
BANK
t
RCD
D
IN
m D
IN
m+
1
D
IN
m+
2
D
IN
m+
3
D
IN
m-
1
COLUMN m(2)
t
CH
t
CL
t
CK
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
t
CMS
t
CMH
t
CKS
t
CKH
BANK
Full page completed
T0 T1 T2 T3 T4 T5 Tn+1 Tn+2
WRITE - FULL PAGE BURST
Notes:
1. burst length = full page
2. A8, A9, and A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com 55
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DON'T CARE
CLK
CKE
COMMAND
DQM/
DQML, DQMH
A0-A9, A11
A10
BA0, BA1
DQ
tCMS tCMH
ACTIVE NOP WRITE NOP NOP NOP NOP NOP
tAS tAH
tAS tAH
tAS tAH
tDS tDH tDS tDH tDS tDH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
ROW
ROW
BANK
tRCD
DIN m DIN m+
2
DIN m+
3
COLUMN m
(2)
BANK
tCH
tCLtCK
tCMS tCMH
tCKS tCKH
T0 T1 T2 T3 T4 T5 T6 T7
WRITE - DQM OPERATION
Notes:
1. burst length = 4
2. A8, A9, and A11 = "Don't Care"
56 Integrated Silicon Solution, Inc. — www.issi.com
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IS45S16400F
ORDERING INFORMATION
Commercial Range: 0°C to 70°C
Frequency Speed (ns) Order Part No. Package
200 MHz 5 IS42S16400F-5TL 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
200 MHz 5 IS42S16400F-5BL 54-ball BGA, SnAgCu balls
166 MHz 6 IS42S16400F-6TL 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
166 MHz 6 IS42S16400F-6BL 54-ball BGA, SnAgCu balls
143 MHz 7 IS42S16400F-7TL 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
143 MHz 7 IS42S16400F-7BL 54-ball BGA, SnAgCu balls
Industrial Range: -40°C to 85°C
Frequency Speed (ns) Order Part No. Package
200 MHz 5 IS42S16400F-5TLI 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
200 MHz 5 IS42S16400F-5BLI 54-ball BGA, SnAgCu balls
166 MHz 6 IS42S16400F-6TLI 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
166 MHz 6 IS42S16400F-6BLI 54-ball BGA, SnAgCu balls
143 MHz 7 IS42S16400F-7TLI 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
143 MHz 7 IS42S16400F-7BLI 54-ball BGA, SnAgCu balls
Automotive Range (A1): -40°C to 85°C
Frequency Speed (ns) Order Part No. Package
200 MHz 5 IS45S16400F-5TLA1 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
200 MHz 5 IS45S16400F-5BLA1 54-ball BGA, SnAgCu balls
166 MHz 6 IS45S16400F-6TLA1 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
166 MHz 6 IS45S16400F-6CTLA1 54-Pin TSOPII, Cu leadframe plated with matte Sn
166 MHz 6 IS45S16400F-6CTNA1 54-Pin TSOPII, Cu leadframe plated with NiPdAu
166 MHz 6 IS45S16400F-6BLA1 54-ball BGA, SnAgCu balls
143 MHz 7 IS45S16400F-7TLA1 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
143 MHz 7 IS45S16400F-7CTLA1 54-Pin TSOPII, Cu leadframe plated with matte Sn
143 MHz 7 IS45S16400F-7CTNA1 54-Pin TSOPII, Cu leadframe plated with NiPdAu
143 MHz 7 IS45S16400F-7BLA1 54-ball BGA, SnAgCu balls
Automotive Range (A2): -40°C to 105°C
Frequency Speed (ns) Order Part No. Package
143 MHz 7 IS45S16400F-7BLA2 54-ball BGA, SnAgCu balls
143 MHz 7 IS45S16400F-7TLA2 54-Pin TSOPII, Alloy42 leadframe plated with matte Sn
143 MHz 7 IS45S16400F-7CTLA2 54-Pin TSOPII, Cu leadframe plated with matte Sn
143 MHz 7 IS45S16400F-7CTNA2 54-Pin TSOPII, Cu leadframe plated with NiPdAu
Notes:
1. Contact ISSI for leaded and copper leadframe parts support.
2. Part numbers with "L" or "N" are leadfree, and RoHS compliant.
Integrated Silicon Solution, Inc. — www.issi.com 57
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IS42S16400F
IS45S16400F
For Alloy42 and Cu lead-frames with matte Sn plating
58 Integrated Silicon Solution, Inc. — www.issi.com
Rev. I
12/01/2011
IS42S16400F
IS45S16400F
Integrated Silicon Solution, Inc. — www.issi.com 59
Rev. I
12/01/2011
IS42S16400F
IS45S16400F
Package Outline 10/17/2007