Document No. DOC-12814-5 | UltraCMOS® RFIC Solutions
Page 4 of 16
©2012-2016 Peregrine Semiconductor Corp. All rights reserved.
PE42521
Product Specification
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS® device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the rating specified.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS®
devices are immune to latch-up.
Table 5. Control Logic Truth Table
Logic Select (LS)
The Logic Select feature is used to determine the
definition for the CTRL pin.
Switching Frequency
The PE42521 has a maximum 25 kHz switching
rate when the internal negative voltage generator
is used (pin 13 = GND). The rate at which the
PE42521 can be switched is only limited to the
switching time (Table 1) if an external negative
supply is provided (pin 13 = VssEXT).
Switching frequency describes the time duration
between switching events. Switching time is the
time duration between the point the control signal
reaches 50% of the final value and the point the
output signal reaches within 10% or 90% of its
target value.
LS CTRL RFC-RF1 RFC-RF2
0 0 off on
0 1 on off
1 0 on off
1 1 off on
Moisture Sensitivity Level
The Moisture Sensitivity Level rating for the
PE42521 in the 16-lead 3x3 mm QFN package is
MSL3.
Optional External Vss Control (VssEXT)
For proper operation, the VssEXT control pin must
be grounded or tied to the Vss voltage specified in
Table 3. When the VssEXT control pin is grounded,
FETs in the switch are biased with an internal
negative voltage generator. For applications that
require the lowest possible spur performance,
VssEXT can be applied externally to bypass the
internal negative voltage generator.
Spurious Performance
The typical spurious performance of the PE42521
is -135 dBm when VssEXT = 0V (pin 13 = GND). If
further improvement is desired, the internal
negative voltage generator can be disabled by
setting VssEXT = -3.4V.
Table 4. Absolute Maximum Ratings
Parameter/Condition Symbol Min Max Unit
Supply voltage VDD -0.3 5.5 V
Digital input voltage (CTRL) VCTRL -0.3 3.6 V
LS input voltage VLS -0.3 3.6 V
RF input power, CW
(RFC-RFX)1
9 kHz ≤ 600 MHz
600 MHz ≤ 4 GHz
4 GHz ≤ 13 GHz
PIN-CW
Fig. 4
36
Fig. 5
dBm
dBm
dBm
RF input power, pulsed
(RFC-RFX)2
9 kHz ≤ 600 MHz
600 MHz ≤ 13 GHz
PIN-PULSED
Fig. 4
Fig. 5
dBm
dBm
RF input power into terminated
ports, CW (RFX)1
9 kHz ≤ 30 MHz
30 MHz ≤ 13 GHz
PIN,TERM
Fig. 4
26
dBm
dBm
Storage temperature range TST -65 +150 °C
ESD voltage HBM3
RF pins to GND
All pins
VESD,HBM
3000
1500
V
V
ESD voltage MM4, all pins VESD,MM 200 V
ESD voltage CDM5, all pins VESD,CDM 1000 V
Notes: 1. 100% duty cycle, all bands, 50Ω
2. Pulsed, 5% duty cycle of 4620 µs period, 50Ω
3. Human Body Model (MIL-STD 883 Method 3015)
4. Machine Model (JEDEC JESD22-A115)
5. Charged Device Model (JEDEC JESD22-C101)
Exceeding absolute maximum ratings may cause
permanent damage. Operation should be
restricted to the limits in the Operating Ranges
table. Operation between operating range
maximum and absolute maximum for extended
periods may reduce reliability.