Absolute Maximum Ratings
Parameter Units
ID @ VGS = -10V, TC = 25°C Continuous Drain Current -6.5
ID @ VGS = -10V, TC = 100°C Continuous Drain Current -4.1
IDM Pulsed Drain Current 25
PD @ TC = 25°C Max. Power Dissipation 25 W
Linear Derating Factor 0.20 W/°C
VGS Gate-to-Source Voltage ±20 V
EAS Single Pulse Avalanche Energy 165 mJ
IAR Avalanche Current -A
EAR Repetitive Avalanche Energy -mJ
dv/dt Peak Diode Recovery dv/dt -30 V/ns
TJOperating Junction -55 to 150
TSTG Storage Temperature Range
Pckg. Mounting Surface Temp. 300 (for 5 S)
Weight 0.42(typical) g
PD - 91716B
The leadless chip carrier (LCC) package represents the
logical next step in the continual evolution of surface
mount technology. Desinged to be a close replacement
for the TO-39 package, the LCC will give designers the
extra flexibility they need to increase circuit board den-
sity. International Rectifier has engineered the LCC pack-
age to meet the specific needs of the power market by
increasing the size of the bottom source pad, thereby
enhancing the thermal and electrical performance. The
lid of the package is grounded to the source to reduce
RF interference.
oC
A
01/17/01
www.irf.com 1
LCC-18
Product Summary
Part Number BVDSS RDS(on) ID
IRFE9130 -100V 0.30 -6.5A
Features:
!Surface Mount
!Small Footprint
!Alternative to TO-39 Package
!Hermetically Sealed
!Dynamic dv/dt Rating
!Avalanche Energy Rating
!Simple Drive Requirements
!Light Weight
For footnotes refer to the last page
IRFE9130
REPETITIVE AVALANCHE AND dv/dt RATED JANTX2N6849U
HEXFET
®
TRANSISTOR JANTXV2N6849U
[REF:MIL-PRF-19500/564]
100V, P-CHANNEL
IRFE9130
2www.irf.com
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
RthJC Junction to Case 5.0
RthJ-PCB Junction to PC Board — 19""" Soldered to a copper clad PC board
°C/W
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
ISContinuous Source Current (Body Diode) -6.5
ISM Pulse Source Current (Body Diode) -25
VSD Diode Forward Voltage -4.3 V Tj = 25°C, IS = -6.5A, VGS = 0V
trr Reverse Recovery Time 250 nS Tj = 25°C, IF = -6.5A, di/dt -100A/µs
QRR Reverse Recovery Charge 3.0 µc VDD -50V
ton Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
A
For footnotes refer to the last page
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BVDSS Drain-to-Source Breakdown Voltage -100 V VGS = 0V, ID = -1.0mA
BVDSS/TJTemperature Coefficient of Breakdown -0.10 V/°C Reference to 25°C, ID = -1.0mA
Voltage
RDS(on) Static Drain-to-Source On-State 0.30 VGS = -10V, ID = -4.1A
Resistance 0.345 VGS = -10V, ID = -6.5A
VGS(th) Gate Threshold Voltage -2.0 -4.0 V VDS = VGS, ID = -250µA
gfs Forward Transconductance 1.9 S ( ) V
DS > -15V, IDS = -4.1A
IDSS Zero Gate Voltage Drain Current -25 VDS= -80V, VGS= 0V
-250 VDS = -80V
VGS = 0V, TJ = 125°C
IGSS Gate-to-Source Leakage Forward -100 VGS =-20V
IGSS Gate-to-Source Leakage Reverse 100 VGS =20V
QgTotal Gate Charge 3 5 VGS =-10V, ID= -6.5A
Qgs Gate-to-Source Charge 6.8 nC VDS =-50V
Qgd Gate-to-Drain (‘Miller’) Charge 23
td(on) Turn-On Delay Time 60 VDD =-50V, ID = -6.5A,
trRise Time 140 RG =7.5
td(off) Turn-Off Delay Time 140
tfFall Time 140
LS + LDTotal Inductance
Ciss Input Capacitance 790 VGS = 0V, VDS = -25V
Coss Output Capacitance 340 pF f = 1.0MHz
Crss Reverse Transfer Capacitance 71
nA
nH
ns
µA
Measured from the center of
drain pad to center of source
pad
www.irf.com 3
IRFE9130
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
0.1 1 10 100
20µs PULSE WIDTH
T = 25 C
J°
TOP
BOTTOM
VGS
-15V
-10V
-8.0V
-7.0V
-6.0V
-5.5V
-5.0V
-4.5V
-V , Drain-to-Source Voltage (V)
-I , Drain-to-Source Current (A)
DS
D
-4.5V
1
10
100
0.1 1 10 100
20µs PULSE WIDTH
T = 150 C
J°
TOP
BOTTOM
VGS
-15V
-10V
-8.0V
-7.0V
-6.0V
-5.5V
-5.0V
-4.5V
-V , Drain-to-Source Voltage (V)
-I , Drain-to-Source Current (A)
DS
D
-4.5V
-60 -40 -20 0 20 40 60 80 100 120 140 160
0.0
0.5
1.0
1.5
2.0
T , Junction Temperature( C)
R , Drain-to-Source On Resistance
(Normalized)
J
DS(on)
°
V =
I =
GS
D
-10V
-6.5A
1
10
100
456789
V = -50V
20µs PULSE WIDTH
DS
-V , Gate-to-Source Voltage (V)
-I , Drain-to-Source Current (A)
GS
D
T = 25 C
J°
T = 150 C
J°
-
-25V
IRFE9130
4www.irf.com
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
1 10 100
0
200
400
600
800
1000
1200
1400
-V , Drain-to-Source Voltage (V)
C, Capacitance (pF)
DS
V
C
C
C
=
=
=
=
0V,
C
C
C
f = 1MHz
+ C
+ C
C SHORTED
GS
iss gs gd , ds
rss gd
oss ds gd
Ciss
Coss
Crss
0 10 20 30 40
0
4
8
12
16
20
Q , Total Gate Charge (nC)
-V , Gate-to-Source Voltage (V)
G
GS
FOR TEST CIRCUIT
SEE FIGURE
I =
D
13
-6.5A
V = -20V
DS
V = -50V
DS
V = -80V
DS
0.1
1
10
100
1 10 100 1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
Single Pulse
T
T
= 150 C
= 25 C
°
°
J
C
-V , Drain-to-Source Voltage (V)
-I , Drain Current (A)I , Drain Current (A)
DS
D
100us
1ms
10ms
0.1
1
10
0.5 1.0 1.5 2.0 2.5 3.0
-V ,Source-to-Drain Voltage (V)
-I , Reverse Drain Current (A)
SD
SD
V = 0 V
GS
T = 25 C
J°
T = 150 C
J°
www.irf.com 5
IRFE9130
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10a. Switching Time Test Circuit
Fig 10b. Switching Time Waveforms
VDS
-12V
Pulse Width 1 µs
Duty Factor 0.1 %
RD
VGS
VDD
RG
D.U.T.
+
-
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f
25 50 75 100 125 150
0.0
1.0
2.0
3.0
4.0
5.0
6.0
7.0
T , Case Temperature ( C)
-I , Drain Current (A)
°
C
D
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1 10
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
1 2
J DM thJC C
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
Thermal Response (Z )
1
thJC
0.01
0.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE
(THERMAL RESPONSE)
-10V
IRFE9130
6www.irf.com
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V
(
BR
)
DSS
I
AS
R
G
I
AS
0.01
t
p
D.U.T
L
V
DS
V
DD
DRIVER
A
15V
-20V
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Q
G
Q
GS
Q
GD
V
G
Charge
-12V
D.U.T. VDS
ID
IG
-3mA
VGS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
-12V
-12V
25 50 75 100 125 150
0
100
200
300
400
Starting T , Junction Temperature( C)
E , Single Pulse Avalanche Energy (mJ)
J
AS
°
ID
TOP
BOTTOM
-2.9A
-4.1A
-6.5A
10V
10V
-10V
-10V
www.irf.com 7
IRFE9130
Foot Notes:
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111
IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936
Data and specifications subject to change without notice. 1/01
ISD -6.5A, di/dt -390A/µs,
VDD -100V, TJ 150°C
Suggested RG =7.5
Repetitive Rating; Pulse width limited by
maximum junction temperature.
VDD = -25V, starting TJ = 25°C,
Peak IL = -6.5A, Pulse width 300 µs; Duty Cycle 2%
Case Outline and Dimensions — LCC-18