Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified)
Device
Numbe
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
Zener
Test
Current
(Izt)
Maximum Dynamic
Impedance (Note 3) Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts mA Ohms Ohms A Volts %/C
1N5231B 5.1 20 17 1600 5 2.0 0.030
1N5232B 5.6 20 11 1600 5 3.0 +0.038
1N5233B 6.0 20 7 1600 5 3.5 +0.038
1N5234B 6.2 20 7 1000 5 4.0 0.045
1N5235B 6.8 20 5 750 3 5.0 0.050
1N5236B 7.5 20 6 500 3 6.0 0.058
1N5237B 8.2 20 8 500 3 6.5 0.062
1B5238B 8.7 20 8 600 3 6.5 0.065
1N5239B 9.1 20 10 600 3 7.0 0.068
1N5240B 10 20 17 600 3 8.0 0.075
1N5241B 11 20 22 600 2 8.4 0.076
1N5242B 12 20 30 600 1 9.1 0.077
1N5243B 13 9.5 13 600 0.5 9.9 0.079
1N5244B 14 9.0 15 600 0.1 10 0.082
1N5245B 15 8.5 16 600 0.1 11 0.082
1N5246B 16 7.8 17 600 0.1 12 0.083
1N5247B 17 7.4 19 600 0.1 13 0.084
1N5248B 18 7.0 21 600 0.1 14 0.085
1N5249B 19 6.6 23 600 0.1 14 0.086
1N5250B 20 6.2 25 600 0.1 15 0.086
1N5251B 22 5.6 29 600 0.1 17 0.087
1N5252B 24 5.2 33 600 0.1 18 0.088
1N5253B 25 5.0 35 600 0.1 19 0.089
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.