TEST AND MEASUREMENT PRODUCTS
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E737
Per-Pin Precision
Measurement Unit
Description Features
Functional Block Diagram
Applications
Revision 6 / February 20, 2007
The E737 is a precision measurement unit designed
for automatic test equipment and instrumentation.
Manufactured in a wide voltage CMOS process, it is a
monolithic solution for a per pin PMU.
The E737 supports two modes of operation: force cur-
rent/measure voltage and force voltage/measure cur-
rent. The E737 can force or measure voltage in the
range of -5V to +7V. In addition, the E737 can force
or measure a current of up to 40 mA over four distinct
ranges: ±40 mA, ±1 mA, ±100 µA and ±10 µA.
The E737 has an on board window comparator that
provides three bits of information: DUT too high, DUT
too low, and DUT fail. There is also a monitor function
which provides a real time analog voltage signal pro-
portional to either the DUT voltage or current.
On board clamps prevent large transient spikes when
changing operating mode or current range. Also, the
PMU will survive a direct short over the legal voltage
range.
The E737 is designed to be a low power, low cost,
small footprint solution to allow high pin count testers
to support a PMU per pin.
• FV / MI Capability
• FI / MV Capability
• 4 Current Ranges (±40 mA, ±1 mA, ±100 µA,
±10 µA)
• -5V/+7V I / O Range
• Short Circuit Protection
• Clamps for limiting mode and range select
transients
• Automatic Test Equipment
- Memory Testers
- VLSI Testers
- Mixed Signal Tester
VINP
IVIN
MODE SEL
I/V MAX
I/V MIN
DISABLE
FORCE / SENSE
SENSE
Comparators
Detector Logic
Voltage Monitor
HiZ
DUT LTH
PASS/FAIL*
DUT GTL
I/V MONITOR
2
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TEST AND MEASUREMENT PRODUCTS
E737
Pin Description
Pin Name
Pin #
Description
VINP 20
Analog voltage input which forces the output voltage at FORCE (FV/MI
mode).
IVIN 21
Analog voltage input which forces the output current at FORCE (FI/MV
mode).
FORCE 3 Analog output pin which forces current or voltage.
SENSE 2 Analog input pin which senses voltage (typically connected to
FORCE).
MODE SEL 10 Digital input which determines whether the PMU is forcing voltage or
forcing current.
RS1, RS2 9, 11 Digital inputs which select one of the four current ranges.
I/V MIN
I/V MAX
24
31
Analog input voltages which establish the lower and upper threshold
level for the measurement comparator.
DUT LTH
DUT GTL
32
26
Digital comparator open drain outputs that indicate the DUT
measurement is less than the upper threshold and greater than the
lower threshold.
PASS/FAIL* 25
Digital output that indicates whether or not the monitored voltage is
between the comparator thresholds. Logic1 corresponds to a
measurement that is between comparator thresholds.
DISABLE 18 Digital input which places the digital comparator outputs a I/V
MONITOR in high impedance.
HiZ 8 Digital input which places the FORCE output into high impedance.
RA, RB
RC, RD
5,16
19,22 External resistors corresponding to ranges A through D.
I/V MONITOR 12 Analog voltage output that provides a real time monitor of either the
measured voltage or measured current level.
COMP1
COMP2
15
14
External compensation pins that require an external capacitor
connected between the two pins.
VCC 27 Positive analog power supply.
VEE 13, 30 Negative analog power supply.
CA
CB
1
23
External compensation pins that require an external capacitor
connected between the two pins.
CAPI 7 External compensation pin that requires an external capacitor
connected to ground.
GND 4 Ground.
3
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TEST AND MEASUREMENT PRODUCTS
E737
Pin Description (continued)
32 Pin LQFP
(7 mm x 7 mm x 1.4 mm)
(Top View)
1
917
25
4
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TEST AND MEASUREMENT PRODUCTS
E737
Circuit Description
Circuit Overview
The E737 is a parametric test and measurement unit
that can :
• Force Voltage / Measure Current
• Force Current / Measure Voltage.
The E737 can force or measure voltage over a -5V to
+7V range, and force or measure current over four dis-
tinct ranges:
• ± 40 mA
• ± 1 mA
• ± 100 µA
• ± 10 µA.
An on board window comparator provides three-bit
measurement range classication. Also, a monitor
passes a real time analog signal which tracks either
the DUT’s current or voltage performance.
Control Inputs
MODE SEL is a digital input which determines whether
the PMU forces voltage or current, when it is not placed
in a high impedance state by the HIZ input (see Table
1).
HiZ Mode SEL PMU Operation
1 X High Impedance
0 0 FV/MI
0 1 FI/MV
Table 1.
RS1 and RS2 are digital inputs to an analog MUX
which establishes the full scale current range of the
PMU. One of four current ranges can be selected by
using RS1 and RS2 as shown in Table 2.
Rext Nom RS1 RS2 Current Range
RA = 200KW0 0 A: ±10μA
RB = 20KW0 1 B: ±100μA
RC = 2KW1 1 C: ±1mA
RD = 50W1 0 D: ±40mA
Table 2.
Comparator Outputs
The comparator outputs DUT GTL, DUT LTH, and
PASS/FAIL* are open drain outputs. When active (logi-
cal 0), they will pull to ground. When disabled (logical
1 or DISABLE = 1), they require an external pull up
resistor to a positive voltage to achieve a high state.
Force / Sense
FORCE is an analog output which either forces a cur-
rent or forces a voltage, depending on which operating
mode is selected.
The SENSE pin is a high impedance analog input
which measures the DUT voltage input in the FI / MV
operating mode.
FORCE and SENSE are brought out to separate pins
to allow for remote sensing.
I/V MONITOR
I/V MONITOR is a real time analog output which tracks
the sensed parameter. I/V MONITOR functionality is
described in Table 3.
Disable Mode SEL I/V Monitor
1 X High Impedance
0 0 Measured Current
0 1 Measured Voltage
Table 3.
In the FI / MV mode, the output voltage is a 1:1 map-
ping of the DUT voltage. In the FV / MI mode, I/V
MONITOR follows the equation:
I(measured) = I/V MONITOR / (4.0 * REXT).
Using nominal values for the external resistors, I/V
MONITOR of +8.0V corresponds to Imax and –8.0V
corresponds to Imin of the selected current range.
5
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TEST AND MEASUREMENT PRODUCTS
E737
Circuit Description (continued)
HIZ
HIZ is a digital input which places the FORCE output
into a high impedance state, regardless of the operat-
ing mode (forcing current or voltage.) This function al-
lows the PMU to be connected directly to the pin elec-
tronics without an isolation relay while NOT adding any
leakage current.
DISABLE
DISABLE is a digital input which places DUT LTH, DUT
GTL, I/V MONITOR, and PASS/FAIL* into high imped-
ance states.
Force Voltage / Measure Current Mode
In the FV / MI mode, VINP is a high input impedance,
analog voltage input that maps directly to the voltage
forced at the DUT (see Figure 1), where FORCE =
VINP.
A current monitor is connected in series with the Op
Amp driving the FORCE voltage. This monitor gener-
ates a voltage that is proportional to the current pass-
ing through it, and its output is brought out to I/V MONI-
TOR. The monitor’s voltage may also be evaluated
using the Window Comparator whose operation is in
accordance with the FV/MI functional truth table (Table
6).
I/V MAX and I/V MIN are high impedance analog in-
puts that establish the upper and lower thresholds for
the window comparator (see Table 4). In the FV / MI
mode, a maximum voltage input corresponds to at least
a maximum current output. Positive current is dened
as current owing out of the PMU.
I/V MAX
I/V MIN Comparator Threshold
+8.0V > Imax (full scale)
0V 0
-8.0V < Imin (full scale)
Table 4.
The voltage at I/V MONITOR follows the equation:
I(measured) = I/V MONITOR / (4.0 * REXT).
Nominally, the external resistors (RA, RB, RC, and RD)
should be chosen such that Imax * REXT = 2.0V.
Force Current / Measure Voltage Mode
In the FI / MV mode, IVIN is a high input impedance,
analog voltage input that is converted into a current
(see Table 5) using the following relationship:
FORCE = IVIN / (4.0 * REXT)
where positive current is dened as current owing out
of the PMU.
IVIN Forced Current
+8.0V Imax (full scale)
0V 0
-8.0V Imin (full scale)
Table 5.
The resulting DUT voltage is then tested via the SENSE
input by a window comparator, whose functional truth
table is shown in Table 7.
I/V MAX and I/V MIN are high impedance analog in-
puts that establish the upper and lower thresholds for
the window comparator. In the FI / MV mode, the refer-
ence inputs translate 1:1 to SENSE level thresholds.
6
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TEST AND MEASUREMENT PRODUCTS
E737
Circuit Description (continued)
Figure 1. E737 Functional Schematic
DRIVER
+
–
INST.
+
–
4X
+
–
CAPI
COMP2
COMP1
CB CA
VINP
IVIN HiZ
SENSE
Cext
Cext
Cext
FV*
FV*
FV
FV*
FV*
FV*
FV
FV
FV
FV
40KW
40KW
D*
D*
D
D
C*
C
B*
B
A*
A
C* C
B* B
A* A
RD
RC
RB
RA
FV*
FV*
FV
FV
Edge737 Functional Schematic
FV ⇒ FV/FI* = 1
FV* ⇒ FV/FI* = 0
Cext
COMP1, COMP2: Force amplifier compensation
Cext
CB, CA: Current sense resistor compensation
Cext
CAPI: Input noise filter capacitor (low pass)
5 KW
15 KW
70 W typ.
5KW
15KW
+
–
+
–
IV_MAX
DISABLE
IV_MIN
+
–
10
10
10
10
DUT_LTH
PASS/FAIL*
I/V MONITOR
FORCE
DUT_GTL
7
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TEST AND MEASUREMENT PRODUCTS
E737
Circuit Description (continued)
Table 6. FV / MI Truth Table
Table 7. FI / MV Truth Table
TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS/FAIL*
X 1 HiZ HiZ HiZ
I/V MONITOR > I/V MAX
I/V MONITOR < I/V MAX
0
0
0
1
N/A
N/A
I/V MONITOR = Iout * 4.0 * REXT
I/V MONITOR = Iout * 4.0 * REXT
0
N/A
I/V MONITOR > I/V MAX
I/V MONITOR < I/V MAX
0
0
N/A
N/A
1
0
I/V MONITOR = Iout * 4.0 * REXT
I/V MONITOR = Iout * 4.0 * REXT
N/A
0
I/V MONITOR < I/V MAX
and
I/V MONITOR > I/V MAX
0 1 1 I/V MONITOR = Iout * 4.0 * REXT 1
TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS/FAIL*
X 1 HiZ HiZ HiZ
SENSE > I/V MAX
SENSE < I/V MAX
0
0
0
1
N/A
N/A
I/V MONITOR = SENSE
I/V MONITOR = SENSE
0
N/A
SENSE > I/V MIN
SENSE < I/V MIN
0
0
N/A
N/A
1
0
I/V MONITOR = SENSE
I/V MONITOR = SENSE
N/A
0
DUT < I/V MAX
and
DUT > I/V MAX
0 1 1 I/V MONITOR = SENSE 1
8
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TEST AND MEASUREMENT PRODUCTS
E737
Circuit Description (continued)
REXT Selection
The E737 is designed for the voltage drop across RA,
RB, RC, and RD to be ≤2V with the maximum current
passing through them. However, these resistor values
can be changed to support different applications.
Increasing the maximum current beyond the nominal
range is not recommended. However, decreasing the
maximum current is allowed.
Short Circuit Protection
The E737 is designed to survive a direct short circuit to
any voltage within the supply rails at the FORCE and
SENSE pins.
Transient Clamps
The E737 has on-board clamps to limit the voltage and
current spikes that might result from either changing
the current range or changing the operating mode.
Common Mode Error/Calibration
In order to attain a high degree of accuracy in a typical
ATE application, offset and gain errors are accounted
for through software calibration. When forcing or mea-
suring a current with the E737, an additional source of
error, common mode error, should be accounted for.
Common mode error is a measure of how the common
mode voltage, VCM, at the input of the current sense
amplier affects the forced or measured current values
(see Figure 2). Since this error is created by internal
resistors in the current sense amplier, it is very linear
in nature.
Using the common mode error and common mode
linearity specications, one can see that with a small
number of calibration steps (see Applications note
PMU-A1), the effect of this error can be signicantly
reduced.
Compensation Capacitors
COMP1 and COMP2 are internal op amp compensa-
tion pins that require a 120 pF capacitor connected be-
tween the two pins.
CAPI is an external noise compensation pin that can
be used as a low pass lter to eliminate noise from the
IVIN and VINP input pins through the connection of an
external capacitor from CAPI to GND. The relation-
ship between the roll-off frequency of noise ltered (in
Hz) to the external capacitance (in farads) can be seen
below:
Filter Frequency =
CA and CB are internal compensation pins that require
a 120 pF capacitor connected between them.
Power Supply Sequencing
In order to help protect the E737 from a latch-up condi-
tion, it is important that VCC All Input Voltages ≥ VEE,
and VCC ≥ GND ≥ VEE at all times.
1
80,000 π X CCAPI
Figure 2. Graphical Representation of
Common Mode Error
9
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TEST AND MEASUREMENT PRODUCTS
E737
Application Information
FORCE Pin Output Voltage (Positive Headroom
Requirement)
The maximum positive voltage that can be forced at the
FORCE pin by the Edge 737 in the force voltage/mea-
sure current (FV/MI) mode and the maximum compli-
ance voltage that can appear at the FORCE pin in the
force current/measure voltage mode (FI/MV) is a func-
tion of the positive power supply (VCC), device case
temperature (Tc), and selected current range. The plot
in Figure 3 depicts the typical positive voltage that can
appear at the FORCE pin for various power supply
combinations across the specied case temperature
range of the device. All plots represent the Edge 737
being used with a ± 2V full-scale swing across the ex-
ternal current sense resistors for each range.
Figure 3. Typical E737 FORCE Pin Voltage vs. Case Temperature
E737 FORCE Voltage Positive Headroom
6.6
6.8
7.0
7.2
7.4
7.6
7.8
8.0
8.2
8.4
8.6
25 30 35 40 45 50 55 60 65 70 75
TEMPERATURE (C)
VFORCE (V)
VCC = 11.5V, VEE = -9.5V, Ranges A, B, C
VCC = 11.5V, VEE = -9.5V, Range D
VCC = 12V, VEE = 10V, Ranges A, B, C
VCC = 12V, VEE = 10V, Range D
VCC = 13V, VEE = -9.5V, Ranges A, B, C
VCC = 13V, VEE = -9.5V, Range D
10
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TEST AND MEASUREMENT PRODUCTS
E737
Required External Components
Application Information (continued)
RPU
COMP1
DUT GTL
DUT LTH
CA
RA
200KW
20KW
2KW
50W
RB
RC
RD
FORCE
CB
PASS/FAIL*
120pF
120pF
120pF *
COMP2 CAPI
RPU
RPU
.1µF .1µF
VCC
VCC
VEE
VEE
Typical Values
* Optional (see Compensation Capacitors Section)
Actual decoupling capacitor values depend
on the actual system environment.
Choose Rext such that:
Iout (low) = V+ / RPU < 1mA, V+ < VCC
V+
11
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TEST AND MEASUREMENT PRODUCTS
E737
Package Information
32 Pin LQFP Package
7 mm x 7 mm x 1.4 mm
1
N
0.25
(L1)
L
GAGE
PLANE
c
0
H
DETAIL A
1. CONTROLLING DIMENSIONS ARE IN MILLIMETERS (ANGLES IN DEGREES).
3. DIMENSIONS "E1" AND "D1" DO NOT INCLUDE MOLD FLASH, PROTRUSIONS
4. REFERENCE JEDEC MS-026, VARIATION BBA.
2. DATUMS -A- , -B- AND -C- TO BE DETERMINED AT DATUM PLANE -H- .
OR GATE BURRS.
NOTES:
e/2
D
A B
aaa C A-B D
ccc C
SEATING
PLANE
C
bbb C A-B D
SEE DETAIL A
4X N/4 TIPS
D/2
D
E/2
E
e
bxN
A1
A2
A
D1
E1
DIMENSIONS
DIM. INCHES MILLIMETERS
MIN NOM MAX MIN NOM MAX
A .055 - .063 1.40 - 1.60
A1 .002 - .006 0.05 - 0.15
A2 .053 .055 .057 1.35 1.40 1.45
b .012 - .018 0.30 - 0.45
c .004 - .008 0.09 - 0.20
D .354 BSC 9.00 BSC
D1 .272 .276 .280 6.90 7.00 7.10
E .354 BSC 9.00 BSC
E1 .272 .276 .280 6.90 7.00 7.10
e .031 BSC 0.80 BSC
L .018 .024 .030 0.45 0.60 0.75
L1 (.039) (1.00)
N 32 32
q0-7° 0-7°
aaa .008 0.20
bbb .003 0.08
ccc .003 0.08
12
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TEST AND MEASUREMENT PRODUCTS
E737
Recommended Operating Conditions
Absolute Maximum Ratings
Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at these or any other conditions above those listed
in the operational sections of this specication is not implied. Exposure to absolute maximum rating conditions
for an extended period may affect device reliability.
Production tested @ +12V, –10V for linearity and min/max parametric testing.
Parameter Symbol Min Typ Max Units
Positive Power Supply VCC 0 14 V
Negative Power Supply VEE -13 0 V
Total Power Supply VCC – VEE 0 23 V
Digital Inputs -0.5 7 V
Storage Temperature TS -55 150 °C
Junction Temperature TJ -65 150 °C
Soldering Temperature 260 °C
Parameter Symbol Min Typ Max Units
Positive Analog Power Supply (Relative to GND) VCC 11.5 12 13 V
Negative Analog Power Supply (Relative to GND) VEE -11 -10 -9.5 V
Total Analog Power Supply VCC – VEE 21 22 22.5 V
Case Temperature TC 25 75 °C
Junction Temperature TJ 125 °C
Thermal Resistance of Package (Junction to Case) θJC 14.1 °C/W
13
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TEST AND MEASUREMENT PRODUCTS
E737
DC Characteristics
Description Symbol Min Typ Max Units
Power Supplies
Power Supply Consumption
Positive Supply (no-load) ICC 3 5 11 mA
Negative Supply (no-load) IEE -11 -5 -3 mA
Positive Supply Breakdown (Note 1) ICCB 3 11 mA
Positive Supply Rejection (Note 1)
∆
ICC
0 3 mA
Negative Supply Breakdown (Note 1) IEEB -55 -42 mA
Negative Supply Rejection (Note 1) ∆IEE -3 0 mA
Power Supply Rejection Ratio (Note 2)
VCC/VEE to FORCE PSRR
0.1 kHz 65 dB
1.0 kHz 60 dB
10 kHz 50 dB
100 kHz 20 dB
VCC/VEE to I/V MONITOR
0.1 kHz 65 dB
1.0 kHz 60 dB
10 kHz 50 dB
100 kHz (MI Mode) 1.5 dB
100 kHz (MV Mode) 15 dB
Force Voltage/Measure Current Mode
Input Voltage Range @ VINP VINP VEE + 4 VCC - 4 V
Input Bias Current @ VINP IBIAS -0.4 0.4 A
Capacitive Loading Range @ FORCE for Stability C
FORCE
0 12 nA
Output Forcing Voltage Range V
FORCE
VEE + 4.5 VCC - 5.0 V
Forcing Voltage Accuracy (@ FORCE)
Offset (VINP = 0V, no load) VOS -100 100 mV
Linearity FV INL -0.025 0.025 % FSVR
Gain FV Gain -0.985 1 1.015 V/V
FORCE/SENSE Combined Leakage Current in
HiZ Mode
I
LEAK
-20 20 nA
Compliance Current Measurement Range
Range A -10 10 A
Range B -100 100 A
Range C -1 1 mA
Range D -40 40 mA
Current Measurement Accuracy (@ I/V MONITOR)
Offset VOS -400 400 mV
Linearity (Note 3) MI INL -0.122 0.122 % FSCR
Gain (Note 4) MI Gain 3.94 4 4.06 V/V
Common Mode Error CM Error -10 10 mV/V
Common Mode Linearity ∆CM Error -10.5 10.5 mV
I/V MONITOR Output Leakage Current in
Disable Mode
I
LEAK
-150 150 nA
Capacitive Loading Range @ I/V MONITOR C
I/V MONITOR
12 nF
14
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TEST AND MEASUREMENT PRODUCTS
E737
DC Characteristics (continued)
Description Symbol Min Typ Max Units
Force Current/Measure Voltage Mode
Input Voltage Range @ IVIN IVIN -9.0 +9.0 V
Input Bias Current @ IVIN IBIAS -0.4 0.4 A
Capacitive Loading Range @ FORCE for Stability C
FORCE
12 nF
Output Forcing Current I
FORCE
Range A -10 10 A
Range B -100 100 A
Range C -1 1 mA
Range D -40 40 mA
Forcing Current Accuracy (@ FORCE)
Offset IOS -4 4 % FSCR
Gain (Note 5) FI Gain 0.24 0.25 0.26 V/V
Linearity @ FORCE = -5V to 7V FI INL -0.35 0.35 % FSCR
Common Mode Error
ICM Error
-0.075
0.075
% FSCR/V
Common Mode Linearity ∆CM Error -0.1 0.1 % FSCR
FORCE/SENSE Combined Leakage Current in
HiZ Mode
I
LEAK
-20 20 nA
Compliance Voltage Range V
COMPLIANCE
VEE + 4.5 VCC - 5.0 V
Voltage Measurement Accuracy (@ I/V MONITOR)
Offset VOS -100 100 mV
Gain MV Gain 0.985 1 1.015 V/V
Linearity (Note 3) MV INL -0.025 0.025 % FSVR
I/V MONITOR Output Leakage Current in Disable Mode I
LEAK
-150 150 nA
Capacitive Loading Range @ I/V MONITOR C
I/V MONITOR
12 nF
Comparator
Input Voltage Range (I/V MIN, I/V MAX) VIN VEE + 1 VCC - 3 V
Input Offset Voltage VOS -100 100 mV
Input Bias Current (I/V MIN, I/V MAX) IIN -0.4 0.4 A
Output Low Level @ IOL = 1mA (DUT LTH, DUT GTL,
PASS/FAIL*)
VOL 400 mV
Output Leakage in DISABLED Mode IOH -1 1 A
Output Leakage in DISABLED Mode I
LEAK
-0.2 0.2 A
DISABLE Input Bias Current IIN -0.2 0.2 A
15
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TEST AND MEASUREMENT PRODUCTS
E737
DC Characteristics (continued)
DC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF,
TA = 25°C unless otherwise noted.
Note 1: Test Conditions are as follows: VCC = 12 to 13V, VEE = –10V, 40 mA is externally forced into
FORCE pin.
Note 2: Guaranteed by design and characterization. Not production tested.
Note 3: Characterized with a ±10 µA current load at I/V MONITOR.
Note 4: V/V units derived as follows:
MI Gain =
Note 5: V/V units derived as follows:
FI Gain =
Unit Denitions:
FSCR = Full Scale Current Range
Range A, FSCR = 20 µA
Range B, FSCR = 200 µA
Range C, FSCR = 2 mA
Range D, FSCR = 80 mA
FSVR = Full Scale Voltage Range = 12V nominal (–5V to 7V)
VIVMON
(IMEASURED x REXT)
IFORCE x REXT
VIVIN
Description Symbol Min Typ Max Units
Analog MUX (RS1, RS2)
Input High Level VIH 2.4 V
Input Low Level VIL 0.8 V
Input Bias Current IIN -0.2 0.2 A
Other Digital Inputs
Input High Level (MODE SEL, HiZ) VIH 2.4 V
Input Low Level (MODE SEL, HiZ) VIL 0.8 V
MODE SEL Input Bias Current IIN -0.2 0.2 A
HiZ Input Bias Current IIN -1 50 A
16
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TEST AND MEASUREMENT PRODUCTS
E737
Description Symbol Min Typ Max Units
Force Voltage/Measure Current Mode
FORCE Voltage Settling Time
(100pF load @ FORCE) t
settle
To 0.1% of 10V Step
Range A 150 s
Ranges B, C, D 120 s
To 0.025% of 10V Step
All Ranges 300 s
FORCE Amp Saturation Recovery Time T
sat
35 s
Measure Current Settling Time
(100pF load @ I/V MONITOR) t
settle
To 0.1% of FSCR
Range A 400 s
Ranges B, C, D 125 s
To 0.025% of FSCR
Range A 1.5 ms
Ranges B, C, D 300 s
Disable Time, HiZ Low to High t
Z
1s
Enable Time, HiZ High to Low t
oe
450 ns
Force Current/Measure Voltage Mode
FORCE Output Current Settling Time
(100pF load @ FORCE) t
settle
To 0.1% of FSCR
Range A 700 s
Ranges B, C, D 250 s
To 0.025% of FSCR
Range A 2 ms
Ranges B, C, D 300 s
FORCE Amp Saturation Recovery Time T
sat
35 s
Measure Voltage Settling Time
(100pF load @ I/V MONITOR) t
settle
To 0.1% of 10V Step
Range A 700 s
Ranges B, C, D 250 s
To 0.025% of 10V Step
Range A 2 ms
Ranges B, C, D 350 s
Disable Time, HiZ Low to High t
Z
1s
Enable Time, HiZ High to Low t
oe
0.45 s
DC Characteristics (continued)
17
© 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com
TEST AND MEASUREMENT PRODUCTS
E737
AC Characteristics
AC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF,
TA = 25°C unless otherwise noted.
Settling times guaranteed by design and characterization (not production tested).
Description Symbol Min Typ Max Units
Comparator
Propagation Delay tpd 30 s
Disable Time, DISABLE Low to High t
Z
300 ns
Enable Time, DISABLE High to Low t
oe
5.5 s
I/V MONITOR s
Disable Time, DISABLE Low to High t
Z
350 ns
Enable Time, DISABLE High to Low t
oe
40 s
I/V MONITOR
MODE SEL Propagation Delay tpd 10 s
RS0/RS1 Propagation Delay tpd 1 s
18
© 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com
TEST AND MEASUREMENT PRODUCTS
E737
Ordering Information
Contact Information
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
This device is ESD sensitive. Care should be taken when handling
and installing this device to avoid damaging it.
Model Number Package
E737ATF 32-Pin LQFP
7mm x 7mm
E737ATFT
32-Pin LQFP
7mm x 7mm
Lead Free
EVM737ATF E737H Evaluation Module