2 of 12 DS100917
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CXE-1089Z
Parameter Specification Unit Condition
Min. Typ. Max.
Small Signal Gain 12.9 dB 500MHz
Gain Flatness +/-0.4 dB 50MHz to 1000MHz
Output Power at 1dB Compression 17.2 dBm 500MHz
Output Third Order Intercept Point 37.8 dBm 500MHz
CSO -61 dBc 55.25MHz to 547.25MHz, 79Ch, NTSC, Flat Tilt,
+15.5dBmV Input
CTB -79 dBc 55.25MHz to 547.25MHz, 79Ch, NTSC, Flat Tilt,
+15.5dBmV Input
Input Return Loss, Worst Case 16.4 dB 50MHz to 1000MHz, -40°C to +85°C
Output Return Loss, Worst Case 17.5 dB 50MHz to 1000MHz, -40°C to +85°C
Noise Figure 2.9 dB 500MHz
Device Operating Voltage 4.75 4.9 VDC
Device Operating Current 106 mA Quiescent
Test Conditions: VD=+4.75VDC, ID=106mA, Typ. OIP3 Tone Spacing=1MHz, POUT per tone=+8dBm
T=+25°C, ZS=ZI=75, Tested with +5VDC Applications Circuit
Parameter Specification Unit Condition
Min. Typ. Max.
Small Signal Gain 12.7 dB 500MHz
Gain Flatness +/-0.4 dB 50MHz to 1000MHz
Output Power at 1dB Compression 14.2 dBm 500MHz
Output Third Order Intercept Point 35.4 dBm 500MHz
CSO -56 dBc 55.25MHz to 547.25MHz, 79Ch, NTSC, Flat Tilt,
+15.5dBmV Input
CTB -78 dBc 55.25MHz to 547.25MHz, 79Ch, NTSC, Flat Tilt,
+15.5dBmV Input
Input Return Loss, Worst Case 16.4 dB 50MHz to 1000MHz, -40°C to +85°C
Output Return Loss, Worst Case 17.5 dB 50MHz to 1000MHz, -40°C to +85°C
Noise Figure 2.8 dB 500MHz
Device Operating Voltage 3.3 3.5 VDC
Device Operating Current 75 mA Quiescent
Test Conditions: VD=+3.3VDC, ID=75mA, Typ. OIP3 Tone Spacing=1MHz, POUT per tone=+8dBm
T=+25°C, ZS=ZI=75, Tested with +5VDC Applications Circuit
Absolute Maximum Ratings
Parameter Rating Unit
Device Current (ID) 125 mA
Device Voltage (VD)5.5V
Power Dissipation 690 mW
RF Input Power* (See Note) 23 dBm
Junction Temperature (TJ)+150°C
Operating Temperature Range (TL) -40 to +85 °C
Storage Temperature Range -65 to +150 °C
ESD Rating - Human Body Model
(HBM) Class 1A
Moisture Sensitivity Level MSL 2
*Note: Load condition, 10:1 VSWR
Operation of this device beyond any one of these limits may cause permanent dam-
age. For reliable continuous operation, the device voltage and current must not
exceed the maximum operating values specified in the table on page one.
Bias conditions should also satisfy the following expression:
IDVD<(T
J-TL)/RTH, j-l
TL=TLEAD
Caution! ESD sensitive device.
Exceeding any one or a combination of the Absolute Maximum Rating conditions may
cause permanent damage to the device. Extended application of Absolute Maximum
Rating conditions to the device may reduce device reliability. Specified typical perfor-
mance or functional operation of the device under Absolute Maximum Rating condi-
tions is not implied.
RoHS status based on EUDirective2002/95/EC (at time of this document revision).
The information in this publication is believed to be accurate and reliable. However, no
responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any
infringement of patents, or other rights of third parties, resulting from its use. No
license is granted by implication or otherwise under any patent or patent rights of
RFMD. RFMD reserves the right to change component circuitry, recommended appli-
cation circuitry and specifications at any time without prior notice.