MA4L Series
5
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is considering for development. Performance is based on target specifications, simulated results,
and/or prototype measurements. Commitment to develop is not guaranteed.
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Silicon PIN Limiter Diodes V16
Notes for Specification and Nominal High Signal Performance Tables:
1) Maximum Series Resistance: RS, is measured at 500 MHz in the ODS-30 package and is equivalent to the
total diode resistance: RS = Rj (Chip Junction Resistance) + RO (Package Ohmic Resistance)
2) Nominal C.W. Thermal Resistance: ӨTH is measured in a ceramic pill package, ODS-30, mounted to a
metal (infinite) heatsink. Chip only thermal resistance values are approximately 2°C/W less than the ODS-30
listed package values in the specifications table.
3) Maximum High Signal Performance: Measured with a single shunt diode (die) attached directly to the gold
plated RF housing ground with 2 mil thick conductive silver epoxy in a 50Ω, SMA, connectorized test fixture.
Chip anode contact is thermo-compression wire bonded using a 1 mil. diameter gold wire onto a 7.2 mil thick
Rogers 5880 Duroid microstrip trace. A shunt coil provides the D.C. return. Test frequency = 9.4 GHz,
RF pulse width = 1.0 µS, Duty Cycle = 0.001%.
4) Maximum C.W. Incident Power: Measured in a 50Ω, SMA, connectorized housing @ 4GHz utilizing a TWT
amplifier and the same single diode assembly configuration as stated in Note 3 above.
Die Handling and Mounting Information
Handling: All semiconductor chips should be handled with care in order to avoid damage or contamination
from perspiration, salts, and skin oils. For individual die, the use of plastic tipped tweezers or vacuum pick up
tools is strongly recommended. Bulk handling should ensure that abrasion and mechanical shock are minimized.
Die Attach: The die have Ti-Pt-Au back and anode metal, with a final gold thickness of 1.0µm. Die can be
mounted with a gold-tin, eutectic solder perform or conductive silver epoxy. The metal RF and D.C. ground plane
mounting surface must be free of contamination and should have a surface flatness or < ± 0.002”.
• Eutectic Die Attachment Using Hot Gas Die Bonder: An 80/20, gold / tin eutectic solder perform is
recommended with a work surface temperature of 255°C and a tool tip temperature of 220°C. When the hot
gas is applied, the temperature at the tool tip should be approximately 290°C. The chip should not be
exposed to a temperatures in excess of 320°C for more than 10 seconds.
• Eutectic Die Attachment Using Reflow Oven: Refer to Application Note M538, “Surface Mounting
Instructions”.
• Epoxy Die Attachment: A thin, controlled amount of electrically conductive silver epoxy should be applied,
approximately 1-2 mils thick to minimize ohmic and thermal resistances. A small epoxy fillet should be visible
around the outer perimeter of the chip after placement to ensure full area coverage. Cure the conductive
silver epoxy per the manufacturer’s schedule, typically 150˚C for 1 hour.
Wire Bonding: The chip’s anode metallization stack is comprised of Ti/Pt/Au with a final gold thickness of
1.0µm. Thermo-compression wedge bonding using a .7 to 1 mil diameter gold wire is recommended, depending
on the contact diameter. The heat stage temperature should be set to approximately 200°C with a bonding tip
temperature of 125˚C and a force of 18 to 40 grams. Use of ultrasonic energy is not advised but if necessary it
should be adjusted to the minimum required to achieve a good bond. Excessive energy or force applied to the top
contact will cause the metallization to dislodge and lift off. Automatic ball bonding may also be used.
See Application Note M541, “Bonding and Handling Procedures for Chip Diode Devices” for more detailed handling and
assembly information.