AMIS-722402: Contact Image Sensor Data Sheet
1.0 General Description
AMI Semiconductor’s AMIS-722402 (PI5002D) contact image sensor (CIS) consists of 1376 active pixels which enables the selection of
2400, 1200, 600, or 300 dots per inch (dpi) resolutions, and employs AMI Semiconductor’s proprietary CMOS image sensing
technology. The sensor contains an on-chip output amplifier, power down circuitry and parallel transfer features that are uniquely
combined with the present-day active-pixel-sensor technology. The image sensors are designed to be cascaded end-to-end on a
printed circuit board (PCB) and packaged in an image sensing module. Applications for the sensor array includes facsimiles, PC
scanners, check readers, and office automation equipment.
Figure 1 is a block diagram of the sensor, showing 1376 active pixels, their associated multiplexing switches, buffers, and an output
amplifier circuit with a power down feature. The sensors pixel-pixel spacing is approximately 10.58µm. The size of each sensor without
the scribe lines is 14560µm by 230µm.
2.0 Key Features
2400, 1200, 600, and 300dpi selectable resolutions
1376 image sensor elements (pixels)
10.58µm (2400dpi) pixel center-to-center spacing
On-chip amplifier
Single 3.3V power supply
3.3V input clocks and control signals
3MHz maximum pixel rate
Parallel / integrate and transfer
Power-down circuit
High sensitivity
Low power
Low noise
SR1CLKSI
Parallel Transfer, Storage Cells and Readout Registers
SO
VOUT
GBST
14560µm
1 2 34
230µm
VSS VDD
1374 1375 1376
Row of 1376 Pixels (2400dpi)
10.58µm
Amplifier, Power-
Down and Offset
Control
Biasing
VBIAS
VREF
7.26µm
SR2
SIC WS
Scan Direction
Figure 1: Sensor Block Diagram
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AMIS-722402: Contact Image Sensor Data Sheet
3.0 Unique Features
There are six unique features incorporated into the AMIS-722402 which improve the sensor’s performance.
3.1 Pixel-to-pixel Offset Cancellation Circuit
The sensor employs a pixel-to-pixel offset cancellation circuit, which reduces the fixed pattern noise (FPN), and amplifier offsets. In
addition, this innovative circuit design greatly improves the optical linearity and low noise sensitivity.
3.2 Parallel Integrate, Transfer and Hold
The sensor has a parallel integrate, transfer and hold feature, which allows the sensor to be read out while photon integration is taking
place. These features are approached through the use of an integrate-and-hold cell, located at each pixel site. Each pixel’s charge is
read from its storage site as the sensor’s shift register sequentially transfers each pixel’s charge onto a common video line.
3.3 Dual Scan Initiation Inputs, GBST and SI
Each sensor has two scan initiation inputs, the global start pulse (GBST) and the start pulse (SI), which are compatible with standard
3.3V CMOS clocks. These clocks help to reduce the sensor-to-sensor transition FPN by initializing and preprocessing all sensors
simultaneously before they start their readout scan. The internal shift register starts the scan after GBST is clocked in on the falling
edge of the clock input (CLK).
During the first 75 clock cycles following a GBST pulse, all the pixels of all the cascaded sensors cycle through their pre-scan
initialization process that reduces FPN and reset noise.
A sequence of cascaded sensors has a unique first sensor and identically behaving subsequent sensors. The start input control (SIC)
defines whether a sensor will be the first sensor that self-starts the readout of its pixels or will be a subsequent sensor that waits for the
SI before starting the readout of its pixels. With its SIC tied high (Vdd), the first sensor self-starts the readout of its pixels after 75 clock
cycles of delay. With their SIC tied low (ground), all of the subsequent sensors delay their readout of their pixels until after they receive
a SI pulse. Furthermore, the first sensor’s SI is left unconnected, while the subsequent sensors all have their SI connected to the end-
of-scan (SO) of their respective preceding sensor. Just prior to finishing its readout of its pixels, each sensor will send a SO pulse to its
respective subsequent sensor so that its respective subsequent sensor will continue the readout of pixels without a pause or gap in
readout. The external module-level start pulse (SP) is connected to all of the sensors' GBST inputs.
For example in the 2400dpi mode, when the first sensor completes its scan, its SO appears on the rising edge of 1442nd clock cycle
after the entry of GBST and nine pixels before its last pixel, in order to have a continuous pixel readout between sensors in a module.
This SO enters as the SI clock of the second and subsequent sensors; hence all subsequent sensors will start their register scan after
each of the preceding sensors completes its scan.
3.4 Power Saving
Each sensor incorporates a power-saving feature when multiple sensors are cascaded together to form a linear imaging array. When a
particular sensor is selected to be read out, the SIC on each sensor selects a unique feature of powering up that sensor’s output
amplifier and powering it down when not selected.
3.5 Common Reference Voltage between Cascaded Sensors
Each sensor has an input/output bias control (VREF), which serves as an offset voltage reference. Each bias control pad is connected
to an internal bias source and tied to its own amplifier’s reference bias input. In operation, these pads on every sensor are connected
together. Each sensor then “shares” the same bias level to maintain a constant bias among all of the sensors.
3.6 Selectable Resolutions of 2400dpi, 1200dpi, 600dpi, 300dpi
The sensor allows for four selectable resolutions; 2400dpi, 1200dpi, 600dpi, and 300dpi, which are controlled by the select resolution 1
and 2 inputs, (SR1, SR2). The following truth details the conditions of the SR1 and SR2 inputs in order to select each resolution, where
low represents the input is connected to ground and a high represents the input connected to Vdd.
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AMIS-722402: Contact Image Sensor Data Sheet
In the 2400dpi mode, all 1376 pixels are clocked out, whereas in the 1200dpi mode, Pixels 1 and 2 are combined, 3 and 4 are
combined and so on up to Pixels 1375 and 1376 being combined. One half of the pixel amplifiers and one half of the scanning registers
are then disabled. As a result, sensitivity in the 1200dpi mode will be twice that of the 2400dpi mode and the 1200dpi readout time will
be approximately half of the 2400dpi readout time.
Similarly, in the 600dpi mode, Pixels 1-4 are combined, Pixels 5-8 are combined and so on up to Pixels 1373-1376 being combined.
Only one quarter of the pixel amplifiers and shift registers are then used. The 600dpi sensitivity will be four times that of the 2400dpi,
and the readout time will be one quarter of the 2400dpi readout time.
In the 300dpi mode, Pixels 1-8 are combined, Pixels 9-16 are combined and so on up to Pixels 1369-1376 being combined. Only one
eighth of the pixel amplifiers and shift registers are then used. The 300dpi sensitivity will be eight times that of the 2400dpi, and the
readout time will be one eighth of the 2400dpi readout time.
Unlike a CCD array, all of the 2400dpi, 1200dpi, 600dpi, and 300dpi arrays can operate with the same clock frequency.
Table 1: Select Resolution Conditions
Resolution Select Resolution 1 (SR1) Select Resolution 2 (SR2)
2400dpi L L
1200dpi L H
600dpi H L
300dpi H H
4.0 Functional Description
4.1 Input / Output Terminals
The AMIS-722402 image sensor has 13 pads that become inter-connected when they are cascaded end-to-end on a PCB and
packaged in an image sensing module. Their symbols and functions are listed in Table 2.
Table 2: Input and Output Terminals
Signal I/O Description
SI I Start pulse: Input to start a line scan (see discussion of the sensors unique features for further details)
GBST I
Global start pulse:
Globally initializes the start inputs of all sensors and starts the scanning process of the first sensor (see discussion of the
sensors unique features for further details)
CLK I Clock: Clock input for the shift register
SIC I Start input control:
Input to control the Start Pulse to the first sensor (see discussion of the sensors unique features for further details)
WS I
Waveform select:
Selects between two different readout modes, the waveform select input is left unconnected or held high for normal sampling
and held low for CDS sampling
VOUT O Video output voltage: Output video signal from the chip
VREF I/O Reference voltage: Reference input voltage for the amplifier output; sets the output’s reset (dark) level
VSS I Ground
VDD I Power supply
VBIAS O
Internal bias voltage.
This is an internal bias voltage which should be connected via an external decoupling capacitor to Vdd on the modules’ PCB
for noise reduction. Special care may be required to minimize electro-magnetic interference coupling to this line.
SR1 I
Select resolution 1:
Selects the 2400, 1200, 600, or 300dpi modes in conjunction with SR2 (see discussion of the sensors unique features for
further details)
SR2 I
Select resolution 2:
Selects the 2400, 1200, 600, or 300dpi modes in conjunction with SR1 (see discussion of the sensors unique features for
further details)
SO O End of scan pulse: Output from the shift register at the end of a scan
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AMIS-722402: Contact Image Sensor Data Sheet
4.2 Bonding Pad Layout Diagram
Figure 2 shows the bonding pad locations for the AMIS-722402 sensor.
Y
CLK
GBST
SIC
SI
230µm
SR1
14560µm
Pad Location Table
Location
Global Start Pulse
Start Input Control
Start Pulse
Clock
Select Resolution 1
VOUT
VSS
VDD
VREF
Video Output Voltage
Ground
Power Supply
Reference Voltage
Pad
SI
3. Pad locations are listed in the Pad Location Table
in the above sensor die figure
2. The die length and width are given
1. The drawing is not to scale.
X
4. Each pad is 100 x 70um
5. All dimensions are in um
6. Die size does not include the scribe line
Y
eg.
X
Notes:
GBST
X
VBIAS Chip Bias Voltage
SO End of Scan Pulse
6428
7393
2127
2379
2633
2890
3826
6084
10960
11214
11468
WSCLKSI SIC SO
VOUT
GBST VREF VSS SR2VDD VBIAS
SR2 Select Resolution 2
4077
20
20
20
20
20
20
20
20
20
20
20
20
SR1
WS Waveform Select
12103
20
Figure 2: AMIS-722402 Bonding Pad Layout
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AMIS-722402: Contact Image Sensor Data Sheet
4.3 Wafer Scribe Line
Figure 3 outlines the scribe line dimensions surrounding the sensor die on a wafer.
55µm
55µm
55µm 55µm
230µm
14560µm
Figure 3: Wafer Scribe Line
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AMIS-722402: Contact Image Sensor Data Sheet
5.0 Electro-Optical Specifications
Table 3 lists the electro-optical specifications of the AMIS-722402 sensor at 25°C and Vdd = 3.3V.
Table 3: Electro-Optical Specifications
Parameter Symbol Min. Typ. Max. Units
Number of pixels (1)
@ 2400dpi
@ 1200dpi
@ 600dpi
@ 300dpi
1376
688
344
172
1376
688
344
172
Pixel-to-pixel spacing (1)
@ 2400dpi
@ 1200dpi
@ 600dpi
@ 300dpi
10.58
21.16
42.32
84.64
10.58
21.16
42.32
84.64
µm
µm
µm
µm
Dark output voltage level (2) Vd 0.35 V
Dark output non-uniformity (3) Ud 80 mV
Photo-response non-uniformity (4) Up ±15 %
Adjacent photo-response non-uniformity (5) Upn ±15 %
Sensor-to-sensor photo-response non-uniformity (6) Usensor ±10 %
Saturation voltage (7) VSat 0.9 1.2 Volts
Sensitivity (8)
@ 300dpi
@ 600dpi
@ 1200dpi
@ 2400dpi
Sv
2440
1220
610
305
V/µJ/cm2
V/µJ/cm2
V/µJ/cm2
V/µJ/cm2
Photo response linearity, between lower and upper end of the
linear range (approx range of. 0.1-0.75V) (9) PRL 2 %
Individual pixel noise (rms) (10)
@ 2400dpi
@ 1200dpi
@ 600dpi
@ 300dpi
P_noise
2.5
3.5
4.5
5.5
mV
mV
mV
mV
Average pixel noise (rms) (11)
@ 2400dpi
@ 1200dpi
@ 600dpi
@ 300dpi
Pavg_noise
2.5
3.5
4.5
5.5
3
4
5
6
mV
mV
mV
mV
Row noise, without external sources (rms) (12)
@ 2400dpi
@ 1200dpi
@ 600dpi
@ 300dpi
Row_noise
0.50
0.50
0.75
1.00
mV
mV
mV
mV
Wafer thickness 280 300 320 µm
Notes for Table 3 are listed on the next page under “Definitions of Electro-Optical Specifications”.
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AMIS-722402: Contact Image Sensor Data Sheet
5.1 Definitions of Electro-optical Specifications
All electrical specifications will be measured at a pixel rate of 3.0MHz, a temperature of 25°C, Vdd = 3.3V, Vref = 0.35V and at an
integration time of 0.9ms for 300dpi, 1.8ms for 600dpi, 3.76ms for 1200dpi, and 7.2ms for 2400dpi. The average output voltage Vpavg,
which is defined as the voltage difference between the average pixel level in the light and the average pixel level in the dark, will be
adjusted to approximately 1.0V, unless stated otherwise. A linear array of uniform green LED’s will be used as the light source for
measurements requiring illumination, unless stated otherwise. As a guideline, the recommended load on the output should be
1K<RL<10k. All measurements will be taken with a 2k load on the output.
1. Selectable resolutions.
The sensor allows for four selectable resolutions; 2400dpi, 1200dpi, 600dpi, and 300dpi, which are controlled by the SR1 and SR2 inputs. Table 1 details how
each resolution mode is selected. In the 2400dpi mode, all 1376 pixels are clocked out, whereas in the 1200dpi mode, Pixels 1 and 2 are combined, 3 and 4 are
combined and so on up to Pixels 1375 and 1376 being combined. One half of the pixel amplifiers and one half of the scanning register are then disabled. As a
result, sensitivity in the 1200dpi mode will be twice that of the 2400dpi mode and the 1200dpi readout time will be approximately half of the 2400dpi readout time.
Similarly, in the 600dpi mode, Pixels 1-4 are combined, Pixels 5-8 are combined and so on up to Pixels 1373-1376 being combined. Only one quarter of the pixel
amplifiers and shift registers are then used. The 600dpi sensitivity will be four times that of the 2400dpi, and the readout time will be one quarter of the 2400dpi
readout time. In the 300dpi mode, Pixels 1-8 are combined, Pixels 9-16 are combined and so on up to Pixels 1369-1376 being combined. Only one eighth of the
pixel amplifiers and shift registers are then used. The 300dpi sensitivity will be eight times that of the 2400dpi, and the readout time will be one eighth of the
2400dpi readout time.
2. Dark output voltage (Vd).
Vd is the average dark output level and is essentially the offset level of the video output in the dark. The dark level is set by the voltage on VREF and is
recommended to be set externally to a voltage of 0.35V for optimal module operation.
3. Dark output non-uniformity (Ud).
Ud = Vdmax-Vdmin, where Vdmax is the maximum pixel output voltage in the dark and Vdmin is the minimum pixel output voltage in the dark.
4. Photo-response non-uniformity (Up).
Up = ((Vpmax-Vpavg)/Vpavg) x 100% or ((Vpavg-Vpmin)/Vpavg) x 100%, whichever is the greater, where Vpmax is the maximum pixel output voltage in the light,
Vpmin is the minimum pixel output voltage in the light and Vpavg is average output voltage of all pixels in the light.
5. Adjacent photo-response non-uniformity (Upn).
Upn = Max ((Vpn, Vpn+1) / Min (Vpn, Vpn+1)) x 100%, where Vpn is the pixel output voltage of pixel n in the light.
6. Sensor-to-sensor photo-response non-uniformity (Usensor).
Usensor = (Vpavg - Wavg) / Wavg), where Wavg is the average output of all sensors on the same wafer that pass all other specifications.
7. Saturation voltage (VSat) is defined as the maximum video output voltage swing measured from the dark level to the saturation level. It is measured by using the
module LED light source with the module imaging a uniform white target. The LED light level is increased until the output voltage no longer increases with an
increase in the LED brightness. The dark level is set by the voltage on VREF and is recommended to be set externally to a voltage of 0.35V for optimal module
operation.
8. Sensitivity (Sv) is defined as the slope of the Vpavg vs. Exposure curve.
9. Photo-response linearity (PRL).
Photo-response linearity is defined as the max. deviation of response compared to a best fit line as a percentage of full scale, where full scale is the maximum
value of the linearity range of operation; approx 0.75V. Photo-response linearity is specified within the linearity range of operation, approx 0.1-0.75V.
10. Individual pixel noise in rms (P_noise).
The individual pixel noise in rms is defined as the standard deviation of each pixel in the dark. The maximum of all pixel standard deviations is the maximum
individual pixel noise in rms. This can also be thought of as output referred noise as it is measured at the sensor output.
11. Average pixel noise in rms (Pavg_noise).
The average pixel noise in rms is defined as the average of all pixel standard deviations in the dark. A 2.5mV rms value has a peak-peak equivalent of 15mV. This
can also be thought of as output referred noise as it is measured at the sensor output.
12. Row noise in rms (Row_noise)
Each chip is binned into four equal bins and the row noise in rms is defined as the standard deviation of each bin. The row noise specification does not include any
noise due to external sources.
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AMIS-722402: Contact Image Sensor Data Sheet
6.0 Recommended Operating Conditions
Table 4 lists the recommended operating conditions @ 25°C.
Table 4: Recommended Operating Conditions @ 25°C
Parameter Symbol Min. Typ. Max. Units
Power supply Vdd 3.0 3.3 3.6 V
Clock input voltage high level (1) 2.4 3.3 3.6 V
Clock input voltage low level (1) 0 0 0.8 V
Power supply current
IDD (sensor during readout)
IDD (sensor between readouts)
IDD (15 chip module)
8
3.0
50
12
4.5
75
mA
mA
mA
Reference voltage (2) VREF 0 0.35 0.8 V
Clock frequency (3) 0.5 2.5 3.0 MHz
Pixel rate (4) 0.5 2.5 3.0 MHz
Integration time @ 2400dpi
(line scan rate) (5)
First die
Subsequent die
Tint
477
459
µs
µs / die
Clock pulse duty cycle (6) 50 %
Notes:
1. Applies to all clocks; GBST, SI and CLK.
2. The dark level is set by the voltage on VREF and is recommended to be set externally to a voltage of 0.35V for optimal module operation.
3. Although the device will operate with a pixel rate of less than 500kHz, it is recommended that the device be operated above 500kHz to maintain performance
characteristics. Operating below 500kHz may result in leakage current degradation.
4. One pixel is clocked out for every clock cycle.
5. Tint is the integration time of a single sensor and is the time between two SIs. The minimum integration time is the time it takes to clock out 75 inactive pixels and
1376 active pixels for the 2400dpi mode, 75 inactive pixels and 688 active pixels for the 1200dpi mode, 75 inactive pixels and 344 active pixels for 600dpi mode,
75 inactive pixels and 172 active pixels for 300dpi mode, at a given frequency.
However, if several sensors are cascaded together in a module then the minimum integration time for the 2400dpi mode is the time it takes to clock out 75 inactive
pixels and 1376 active pixels from the first sensor and 1376 pixels from each of all subsequent sensors, at a given frequency.
For cascaded sensors in the 1200dpi mode, the minimum integration time is the time it takes to clock out 75 inactive pixels and 688 active pixels from the sensor
and 688 pixels from each of all subsequent sensors, at a given frequency.
Similarly, for cascaded sensors in the 300dpi mode, the minimum integration time is the time it takes to clock out 75 inactive pixels and 172 active pixels from the
first sensor and 172 pixels from each of all subsequent sensors, at a given frequency.
6. The clock duty cycle is defined as the ration of the positive duration of the clock to its period.
7.0 Absolute Maximum Ratings
Table 5 lists the absolute maximum ratings.
Table 5: Absolute Maximum Ratings
Parameter Max. Units
Power supply voltage (Vdd) 5 V
Clock input voltage high level (1) Vdd + 0.2 V
Clock input voltage low level (1) -0.5 V
Operating temperature -10 to +50 °C
Operating humidity +10 to +85 RH%
Storage temperature -25 to +75 °C
Storage humidity +10 to +90 RH%
Note:
1. Applies to all clocks; GBST, SI and CLK.
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8.0 Timing Requirements
Table 6 lists the timing requirements for all four resolution modes, and their associated timing diagrams are shown in Figures 4-9.
Table 6: Timing Requirements
Parameter Symbol Min. Typ. Max. Units
Clock (CLK) period CLKp 330 400 2000 ns
Clock (CLK) pulse width CLKpw 200 ns
Clock (CLK) duty cycle 50 %
Data setup time (1) Tset 20 ns
Data hold time (1) Thold 25 ns
Clock (CLK) rise time (2) CLKrt 70 ns
Clock (CLK) fall time (2) CLKft 70 ns
End-of-scan (SO) rise time (2) SOrt 50 ns
End-of-scan (SO) fall time (2) SOft 50 ns
Global start (GBST) rise time (3) GBSTrt 70 ns
Global start (GBST) fall time (3) GBSTft 70 ns
Pixel rise time (4,5) Prt 100 ns
Pixel fall time (4,5) Pft 30 ns
Notes:
1. The shift register will load on all falling CLK edges, so setup and hold times (Tset, Thold) are needed to prevent the loading of multiple start pulses. This would
occur if the GBST remains high during two fallings edges of the CLK signal. See Figure 8.
2. SI starts the register scanning and the first active pixel is read out on the 76th clock of the CLK signal. However, when multiple sensors are sequentially scanned,
as in CIS modules, the SO from the predecessor sensor becomes the SI to the subsequent sensor, hence the SI clock = the SO clock.
3. As discussed under the third unique feature, the GBST starts the initialization process and preprocesses all sensors simultaneously in the first 75 clock cycles
before the first pixel is scanned onto the video line from the first sensor.
4. The transition between pixels does not always reach the dark offset level as shown in the timing diagrams, see Vout. The timing diagrams show the transition
doing so for illustration purposes; however a stable pixel sampling point does exist for every pixel.
5. The pixel rise time is defined as the time from when the CLK’s rising edge has reached 50 percent of its maximum amplitude to the point when a pixel has reached
90 percent of its maximum amplitude. The pixel fall time is defined as the time from when the CLK’s falling edge has reached 50 percent of its maximum amplitude
to the point when a pixel has reached 10 percent of its maximum amplitude.
Figures 4, 5, 6, and 7 show the initialization of the first sensor in relation to its subsequent cascaded sensors for all four resolution
modes. The SIC selects the first sensor to operate with 75 clock cycles of delay by connecting it to Vdd on the first sensor and to
Ground for all of the subsequent sensors. Hence the first sensor will operate with 75 inactive pixels being clocked out before its first
active pixel is clocked out.
1376 Active Pixels (1376 Clocks)
VOUT
75 Inactive Pixels (75 Clocks)
SO
CLK
21
G
B
S
T
7237473 7675 7877 144279 1444
1443 1451
1448
1447 14501449
11374
1373
1372
2 3 41367 1368 1369 1376
1375
Figure 4: Overall Timing Diagram for the 2400dpi Mode
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688 Active Pixels (688 Clocks)
VOUT
75 Inactive Pixels (75 Clocks)
SO
CLK
21
G
B
S
T
7237473 7675 78
77
75479 756755 763
760
759 762761
1686
685684
2 3 4679 680 681 688
687
Figure 5: Overall Timing Diagram for the 1200dpi Mode
344 Active Pixels (344 Clocks)
VOUT
75 Inactive Pixels (75 Clocks)
SO
CLK
21
G
B
ST
7237473 7675 7877 41079 412411 419
416
415 418417
1342
341340
2 3 4335 336 337 344
343
Figure 6: Overall Timing Diagram for the 600dpi Mode
172 Active Pixels (172 Clocks)
VOUT
75 Inactive Pixels (75 Clocks)
SO
CLK
21
G
B
S
T
7237473 7675 7877 23879 240239 247
244
243 246245
1170
169168
2 3 4163 164 165 172
171
Figure 7: Overall Timing Diagram for the 300dpi Mode
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Figures 8 and 9 detail the timing of the CLK, GBST, Vout, and SI/SO signals in further detail, which have the same timing requirements
for the 2400, 1200, 600, and 300dpi modes. The rise and fall times are listed in Table 6. In Figure 8, note that Pixel 76 is the first active
pixel, as the first 75 pixels are dummy pixels.
GBST
CLK
GBSTft
GBSTrt
Tset
Thold
CLKpw CLKpw
CLKrt
50%
CLKp
CLKft
VOUT
SI/SO
SI/SOrt
Prt
90%
SI/SOft
Pft 10%
50% 50% 50%
Figure 8: Rise and Fall Times for both the 2400, 1200, 600, 300dpi Modes
7877
2
175 76
2
1
Thold
Thold
Tset
Tset
CLK
GBST
Video Signal (Vout) 56
55 57 58
Figure 9: Timing of GBST-to-first Pixel of the F irst Sensor for 2400, 1200, 600, 300 dpi Modes
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Figures 10 to 13 show the timing of the SI/SO. At 2400dpi the SI/SO comes out in line with the 1367th pixel, at 1200dpi it comes out in
line with the 679th pixel, at 600dpi it comes out in line with the 335th pixel, and at 300dpi it comes out in line with the 163rd pixel.
The SO from the first sensor enters as the SI clock of the second and subsequent sensors; hence all subsequent sensors will start their
register scan after each of the preceding sensors completes its scan.
The last active pixel of each sensor is the 1376th pixel for the 2400dpi mode, the 688th pixel for the 1200dpi mode, 344th pixel for the
600dpi mode, and 172nd pixel for the 300dpi mode.
1367 1368 1369 1370 1375
CLK
CLK numbers include timing for 75 inactive pixels and 1376 active pixels
1st CLK of second sensor
1441 1442 1443 1444 1445 1450 1451 12
SI / SO
Vout
Pixel 1 of second sensor
Last active pixel = pixel 1376
1376 1 2
Figure 10: Timing of SI/SO Clock for the 2400dpi Mode
679 680 681 682 687
CLK
CLK numbers include timing for 75 inactive pixels and 688 active pixels
1st
C
LK o
f
second senso
r
753 754 755 756 757 762 763 12
SI / SO
Vout
Pixel 1 of second sensor
Last active pixel = pixel 688
688 1 2
Figure 11: Timing of SI/SO Clock for the 1200dpi Mode
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335 336 337 338 343
CLK
CLK numbers include timing for 75 inactive pixels and 344 active pixels
1st CLK of second senso
r
409 410 411 412 413 418 419 12
SI / SO
Vout
Pixel 1 of second sensor
Last active pixel = pixel 344
344 1 2
Figure 12: Timing of SI/SO Clock for the 600dpi Mode
163 164 165 166 171
CLK
CLK numbers include timing for 75 inactive pixels and 172 active pixels
1st CLK of second senso
r
237 238 239 240 241 246 247 12
SI / SO
Vout
Pixel 1 of second sensor
Last active pixel = pixel 172
172 1 2
Figure 13: Timing of SI/SO Clock for the 300dpi Mode
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AMIS-722402: Contact Image Sensor Data Sheet
9.0 Example of a CIS Module Using Cascaded AMIS-722402 Image Sensors
Figure 14 shows the proposed PCB schematic of the 15 chip CIS module.
Figure 14: CIS Module with AMIS-722402 Image Sensors
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AMIS-722402: Contact Image Sensor Data Sheet
10.0 Company or Product Inquiries
For more information about AMI Semiconductor, our technology and our product, visit our Web site at: http://www.amis.com
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Tel: +1.208.233.4690
Fax: +1.208.234.6795
Europe
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Production Technical Data - The information contained in this document applies to a product in production. AMI Semiconductor and its subsidiaries (“AMIS”) have made every effort to ensure
that the information is accurate and reliable. However, the characteristics and specifications of the product are subject to change without notice and the information is provided “AS IS” without
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not recommended without additional processing by AMIS for such applications. Copyright © 2006 AMI Semiconductor, Inc.
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