STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-92180
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
A
SHEET 15
DSCC FORM 2234
APR 97
For CIN and COUT, a device manufacturer may qualify devices by functional groups. A specific functional group shall
be composed of function types, that by design, will yield the same capacitance values when tested in accordance with
table I, herein. The device manufacturer shall set a function group limit for the CIN and COUT tests. The device
manufacturer may then test one device function from a functional group to the limits and conditions specified herein.
All other device functions in that particular functional group shall be guaranteed, if not tested, to the limits and
conditions specified in table I, herein. The device manufacturer shall submit to DSCC-VA the device functions listed in
each functional group and the test results for each device tested.
d. Ground and VCC bounce tests are required for all device classes. These tests shall be performed only for initial
qualification, after process or design changes which may affect the performance of the device, and any changes to the
test fixture. VOLP, VOLV, VOHP, and VOHV shall be measured for the worst case outputs of the device. All other outputs
shall be guaranteed, if not tested, to the limits established for the worst case outputs. The worst case outputs tested
are to be determined by the manufacturer. Test 5 devices assembled in the worst case package type supplied to this
document. All other package types shall be guaranteed, if not tested, to the limits established for the worst case
package. The package type to be tested shall be determined by the manufacturer. The device manufacturer will
submit to DSCC-VA data that shall include all measured peak values for each device tested and detailed oscilloscope
plots for each VOLP, VOLV, VOHP, and VOHV from one sample part per function. The plot shall contain the waveforms of
both a switching output and the output under test.
Each device manufacturer shall test product on the fixtures they currently use. When a new fixture is used, the device
manufacturer shall inform DSCC-VA of this change and test the 5 devices on both the new and old test fixtures. The
device manufacturer shall then submit to DSCC-VA data from testing on both fixtures that shall include all measured
peak values for each device tested and detailed oscilloscope plots for each VOLP, VOLV, VOHP, and VOHV from one
sample part per function. The plot shall contain the waveforms of both a switching output and the output under test.
For VOHP, VOHV, VOLP, and VOLV, a device manufacturer may qualify devices by functional groups. A specific functional
group shall be composed of function types, that by design, will yield the same test values when tested in accordance
with table I, herein. The device manufacturer shall set a functional group limit for the VOHP, VOHV, VOLP, and VOLV tests.
The device manufacturer may then test one device function from a functional group to the limits and conditions
specified herein. All other device functions in that particular functional group shall be guaranteed, if not tested, to the
limits and conditions specified in table I, herein. The device manufacturer shall submit to DSCC-VA the device
functions listed in each functional group and the test results, along with the oscilloscope plots, for each device tested.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test
temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with
MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test
circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.