SN54HC244, SN74HC244
OCTAL BUFFERS AND LINE DRIVERS
WITH 3-STATE OUTPUTS
SCLS130B – DECEMBER 1982 – REVISED MAY 1997
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
D
3-State Outputs Drive Bus Lines or Buffer
Memory Address Registers
D
High-Current Outputs Drive up to 15 LSTTL
Loads
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW), and
Ceramic Flat (W) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These octal buffers and line drivers are designed
specifically to improve both the performance and
density of 3-state memory address drivers, clock
drivers, and bus-oriented receivers and
transmitters. The ’HC244 are organized as two
4-bit buffers/drivers with separate output-enable
(OE) inputs. When OE is low, the device passes
noninverted data from the A inputs to the
Y outputs. When OE is high, the outputs are in the
high-impedance state.
The SN54HC244 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC244 is characterized for
operation from –40°C to 85°C.
FUNCTION TABLE
(each buffer/driver)
INPUTS OUTPUT
OE AY
L H H
LLL
H X Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
VCC
2OE
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
SN54HC244 ...J OR W PACKAGE
SN74HC244 . . . DB, DW, N, OR PW PACKAGE
(TOP VIEW)
3 2 1 20 19
910111213
4
5
6
7
8
18
17
16
15
14
1Y1
2A4
1Y2
2A3
1Y3
1A2
2Y3
1A3
2Y2
1A4
SN54HC244 . . . FK PACKAGE
(TOP VIEW)
2Y4
1A1
1OE
1Y4
2A2 2OE
2Y1
GND
2A1 VCC
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.