DM74LS10N - Fairchild Semiconductor

August 1986

Revised March 2000

DM74LS10 Triple 3-Inp u t NAND Gate

DM74LS10

Triple 3-Input NAND Gate

General Descript ion

This device contains three independent gates each of

which performs the logic NAND function.

Ordering Code:

Devices also available in Ta pe and R eel. Speci fy by appending the s uffix let t er “X” to the orderin g c ode.

Connection Diagram Function Table

Y = ABC

H = HIGH Logic Lev el

L = LOW Lo gic Level

X = Either LOW or HIGH Logic Level

Order Number Package Number Package Description

DM74LS10M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow

DM74LS10N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Inputs Output

ABCY

XXLH

XLXH

LXXH

HHHL

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DM74LS10

Absolute Maximum Ratings(Note 1) Note 1: The “Abs olute Maxim um Ratings ” are those valu es beyond w hich

the saf ety of the device cannot be guarante ed. The device s hould not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not gua rant eed at the absolute maximum rati n gs.

The “Re comme nded Operat ing Co ndition s” table will define the cond itions

for actu al device operation.

Recommended Operating Conditions

Electrical Characteristics

over recommended operating free air temperature range (unless otherwise noted)

Note 2: All typic als are at VCC = 5V, TA = 25°C.

Note 3: Not more than one output should be shorted at a time, and the duration should not exceed one second.

Switching Characteri stics

at VCC = 5V and TA = 25°C

Supply Voltage 7V

Input Voltage 7V

Operating Free Air Temperature Range 0°C to +70°C

Storage Temperature Range −65°C to +150°C

Symbol Parameter Min Nom Max Units

VCC Supply Voltage 4.75 5 5.25 V

VIH HIGH Level Input Voltage 2 V

VIL LOW Level Input Voltage 0.8 V

IOH HIGH Level Output Current −0.4 mA

IOL LOW Level Output Current 8 mA

TAFree Air Operating Temperature 0 70 °C

Symbol Parameter Conditions Min Typ Max Units

(Note 2)

VIInput Clamp Voltage VCC = Min, II = −18 mA −1.5 V

VOH HIGH Level VCC = Min, I OH = Max, 2.7 3.4 V

Output Voltage VIL = Max

VOL LOW Level VCC = Min, IOL = Max, 0.35 0.5

Output Voltage VIH = Min V

IOL = 4 mA, VCC = Min 0.25 0.4

IIInput Current @ Max Input Voltage VCC = Max, VI = 7V 0.1 mA

IIH HIGH Level Input Curre nt VCC = Max, VI = 2.7V 20 µA

IIL LOW Level Input Current VCC = Max, VI = 0.4V −0.36 mA

IOS Short Circuit Output Current VCC = Max (Note 3) −20 −100 mA

ICCH Supply Current with Outputs High VCC = Max 0.6 1.2 mA

ICCL Supply Current with Outputs Low VCC = Max 1.8 3.3 mA

RL = 2 kΩ

Symbol Parameter CL = 15 pF CL = 50 pF Units

Min Max Min Max

tPLH Propagation Delay Time 310415ns

LOW-to-HIGH Level Output

tPHL Propagation Delay Time 310415ns

HIGH-to-LOW Level Output

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DM74LS10

Physical Dimensions inches (millimeters) unless otherwise noted

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow

Package Number M14A

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DM74LS10 Triple 3-Input NAND Gate

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Package Number N14A

Fairchild does no t assume any responsibility for use of any circuitry describ ed, no circuit patent licenses are implied a nd

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life suppor t de vices o r systems a re devices or syste ms

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical compon ent i n any compon ent of a life su pport

device or system whose failure to perform can be rea-

sonabl y ex pect ed to ca use the fa i lure of the life su pp ort

device or system, or to affect its safety or effectiveness.