REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
a
AD807
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
Fax: 781/326-8703 © Analog Devices, Inc., 2000
Fiber Optic Receiver with Quantizer and
Clock Recovery and Data Retiming
FEATURES
Meets CCITT G.958 Requirements
for STM-1 Regenerator—Type A
Meets Bellcore TR-NWT-000253 Requirements for OC-3
Output Jitter: 2.0 Degrees RMS
155 Mbps Clock Recovery and Data Retiming
Accepts NRZ Data, No Preamble Required
Phase-Locked Loop Type Clock Recovery—
No Crystal Required
Quantizer Sensitivity: 2 mV
Level Detect Range: 2.0 mV to 30 mV
Single Supply Operation: +5 V or –5.2 V
Low Power: 170 mW
10 KH ECL/PECL Compatible Output
Package: 16-Lead Narrow 150 mil SOIC
reliance on external components such as a crystal or a SAW
filter, to aid frequency acquisition.
The AD807 acquires frequency and phase lock on input data
using two control loops that work without requiring external
control. The frequency acquisition control loop initially acquires
the frequency of the input data, acquiring frequency lock on
random or scrambled data without the need for a preamble. At
frequency lock, the frequency error is zero and the frequency
detector has no further effect. The phase acquisition control
loop then works to ensure that the output phase tracks the input
phase. A patented phase detector has virtually eliminated pattern
jitter throughout the AD807.
The device VCO uses a ring oscillator architecture and patented
low noise design techniques. Jitter is 2.0 degrees rms. This low
jitter results from using a fully differential signal architecture,
Power Supply Rejection Ratio circuitry and a dielectrically
isolated process that provides immunity from extraneous signals
on the IC. The device can withstand hundreds of millivolts of
power supply noise without an effect on jitter performance.
The user sets the jitter peaking and acquisition time of the PLL
by choosing a damping factor capacitor whose value determines
loop damping. CCITT G.958 Type A jitter transfer require-
ments can easily be met with a damping factor of 5 or greater.
Device design guarantees that the clock output frequency will
drift by less than 20% in the absence of input data transitions.
Shorting the damping factor capacitor, C
D
, brings the clock
output frequency to the VCO center frequency.
The AD807 consumes 170 mW and operates from a single
power supply at either +5 V or –5.2 V.
FUNCTIONAL BLOCK DIAGRAM
COMPENSATING
ZERO
LOOP
FILTER
SIGNAL
LEVEL
DETECTOR
VCO
⌽
DET
+
–
+
–
F
DET
⌺
RETIMING
DEVICE
PHASE-LOCKED LOOP
AD807
LEVEL
DETECT
COMPARATOR/
BUFFER
QUANTIZER
PIN
NIN
THRADJ
SDOUT
CLKOUTP
CLKOUTN
DATAOUTP
DATAOUTN
CF1 CF2
PRODUCT DESCRIPTION
The AD807 provides the receiver functions of data quantization,
signal level detect, clock recovery and data retiming for 155 Mbps
NRZ data. The device, together with a PIN diode/preamplifier
combination, can be used for a highly integrated, low cost, low
power SONET OC-3 or SDH STM-1 fiber optic receiver.
The receiver front end signal level detect circuit indicates when
the input signal level has fallen below a user adjustable thresh-
old. The threshold is set with a single external resistor. The
signal level detect circuit 3 dB optical hysteresis prevents chatter
at the signal level detect output.
The PLL has a factory-trimmed VCO center frequency and a
frequency acquisition control loop that combine to guarantee
frequency acquisition without false lock. This eliminates a
REV. B
–2–
AD807–SPECIFICATIONS
Parameter Condition Min Typ Max Unit
QUANTIZER–DC CHARACTERISTICS
Input Voltage Range @ P
IN
or N
IN
2.5 V
CC
V
Input Sensitivity, V
SENSE
P
IN
–N
IN
, Figure 1, BER = ≤ 1 × 10
–10
2mV
Input Overdrive, V
OD
Figure 1, BER = ≤ 1 × 10
–10
0.001 2.5 V
Input Offset Voltage 50 500 µV
Input Current 510µA
Input RMS Noise BER = ≤ 1 × 10
–10
50 µV
Input Peak-to-Peak Noise BER = ≤ 1 × 10
–10
650 µV
QUANTIZER–AC CHARACTERISTICS
Upper –3 dB Bandwidth 180 MHz
Input Resistance 1MΩ
Input Capacitance 2pF
Pulsewidth Distortion 100 ps
LEVEL DETECT
Level Detect Range R
THRESH
= INFINITE 0.8 2 4.0 mV
R
THRESH
= 49.9 kΩ4 5 7.4 mV
R
THRESH
= 3.4 kΩ14 20 25 mV
Response Time DC-Coupled 0.1 1.5 µs
Hysteresis (Electrical) R
THRESH
= INFINITE 2.3 4.0 10.0 dB
R
THRESH
= 49.9 kΩ3.0 5.0 9.0 dB
R
THRESH
= 3.4 kΩ3.0 7.0 10.0 dB
SDOUT Output Logic High Load = +4 mA 3.6 V
SDOUT Output Logic Low Load = –1.2 mA 0.4 V
PHASE-LOCKED LOOP NOMINAL
CENTER FREQUENCY 155.52 MHz
CAPTURE RANGE 155 156 MHz
TRACKING RANGE 155 156 MHz
STATIC PHASE ERROR 2
7
–1 PRN Sequence 4 20 Degrees
SETUP TIME (t
SU
) Figure 2 3.0 3.2 3.5 ns
HOLD TIME (t
H
) Figure 2 3.0 3.1 3.3 ns
PHASE DRIFT 240 Bits, No Transitions 40 Degrees
JITTER 2
7
–1 PRN Sequence 2.0 Degrees RMS
2
23
–1 PRN Sequence 2.0 2.7 Degrees RMS
JITTER TOLERANCE f = 10 Hz 3000 Unit Intervals
f = 6.5 kHz 4.5 7.6 Unit Intervals
f = 65 kHz 0.45 1.0 Unit Intervals
f = 1.3 MHz 0.45 0.67 Unit Intervals
JITTER TRANSFER
Peaking (Figure 11) C
D
= 0.15 µF 0.08 dB
C
D
= 0.33 µF 0.04 dB
Bandwidth 65 92 130 kHz
Acquisition Time
C
D
= 0.1 µF2
23
–1 PRN Sequence, T
A
= 25°C4 × 10
5
2 × 10
6
Bit Periods
C
D
= 0.33 µFV
CC
= 5 V, V
EE
= GND 2 × 10
6
Bit Periods
POWER SUPPLY VOLTAGE V
MIN
to V
MAX
4.5 5.5 Volts
POWER SUPPLY CURRENT V
CC
= 5.0 V, V
EE
= GND, T
A
= 25°C 25 34.5 39.5 mA
PECL OUTPUT VOLTAGE LEVELS
Output Logic High, V
OH
V
CC
= 5.0 V, V
EE
= GND, T
A
= 25°C –1.2 –1.0 –0.7 Volts
Output Logic Low, V
OL
Referenced to V
CC
–2.0 –1.8 –1.7 Volts
SYMMETRY (Duty Cycle) ρ = 1/2, T
A
= 25°C,
Recovered Clock Output, Pin 5 V
CC
= 5 V, V
EE
= GND 50.1 54.1 %
OUTPUT RISE / FALL TIMES
Rise Time (t
R
) 20%–80% 1.1 1.5 ns
Fall Time (t
F
) 80%–20% 1.1 1.5 ns
Specifications subject to change without notice.
(T
A
= T
MIN
to T
MAX
, V
CC
= V
MIN
to V
MAX
, C
D
= 0.1 ␮F, unless otherwise noted.)
REV. B
AD807
–3–
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 V
Input Voltage (Pin 12 or Pin 13) . . . . . . . . . . . . . V
CC
+ 0.6 V
Maximum Junction Temperature . . . . . . . . . . . . . . . . . 165°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature Range (Soldering 10 sec) . . . . . . . . . 300°C
ESD Rating (Human Body Model) . . . . . . . . . . . . . . . . . 500 V
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Thermal Characteristics:
16-Lead Narrow Body SOIC Package: θ
JA
= 110°C/W.
1
0
OUTPUT NOISE
OFFSET
OVERDRIVE
SENSITIVITY
INPUT (V)
Figure 1. Input Sensitivity, Input Overdrive
SETUP
t
SU
HOLD
t
H
DATAOUTP
(PIN 2)
CLKOUTP
(PIN 5)
Figure 2. Setup and Hold Time
PIN FUNCTION DESCRIPTIONS
Pin
No. Mnemonic Description
1 DATAOUTN Differential Retimed Data Output
2 DATAOUTP Differential Retimed Data Output
3V
CC2
Digital V
CC
for ECL Outputs
4 CLKOUTN Differential Recovered Clock Output
5 CLKOUTP Differential Recovered Clock Output
6V
CC1
Digital V
CC
for Internal Logic
7 CF1 Loop Damping Capacitor
8 CF2 Loop Damping Capacitor
9AV
EE
Analog V
EE
10 THRADJ Level Detect Threshold Adjust
11 AV
CC1
Analog V
CC
for PLL
12 NIN Quantizer Differential Input
13 PIN Quantizer Differential Input
14 AV
CC2
Analog V
CC
for Quantizer
15 SDOUT Signal Detect Output
16 V
EE
Digital V
EE
for Internal Logic
PIN CONFIGURATION
TOP VIEW
(Not to Scale)
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
DATAOUTN
DATAOUTP
V
CC2
CLKOUTN
CLKOUTP
V
CC1
CF1
CF2
V
EE
SDOUT
AV
CC2
PIN
NIN
AV
CC1
THRADJ
AV
EE
AD807
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD807A-155BR –40°C to +85°C 16-Lead Narrowbody SOIC R-16A
AD807A-155BRRL7 –40°C to +85°C 750 Pieces, 7" Reel R-16A
AD807A-155BRRL –40°C to +85°C 2500 Pieces, 13" Reel R-16A
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD807 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. B
AD807
–4–
DEFINITION OF TERMS
Maximum, Minimum and Typical Specifications
Specifications for every parameter are derived from statistical
analyses of data taken on multiple devices from multiple wafer
lots. Typical specifications are the mean of the distribution of
the data for that parameter. If a parameter has a maximum (or a
minimum), that value is calculated by adding to (or subtracting
from) the mean six times the standard deviation of the distribution.
This procedure is intended to tolerate production variations: if the
mean shifts by 1.5 standard deviations, the remaining 4.5 standard
deviations still provide a failure rate of only 3.4 parts per million.
For all tested parameters, the test limits are guardbanded to
account for tester variation to thus guarantee that no device is
shipped outside of data sheet specifications.
Input Sensitivity and Input Overdrive
Sensitivity and Overdrive specifications for the Quantizer involve
offset voltage, gain and noise. The relationship between the logic
output of the quantizer and the analog voltage input is shown in
Figure 1.
For sufficiently large positive input voltage the output is always
Logic 1 and similarly, for negative inputs, the output is always
Logic 0. However, the transitions between output Logic Levels 1
and 0 are not at precisely defined input voltage levels, but occur
over a range of input voltages. Within this Zone of Confusion,
the output may be either 1 or 0, or it may even fail to attain
a valid logic state. The width of this zone is determined by the
input voltage noise of the quantizer (650 µV at the 1 × 10
–10
confidence level). The center of the Zone of Confusion is the
quantizer input offset voltage (±500 µV maximum). Input Over-
drive is the magnitude of signal required to guarantee correct
logic level with 1 × 10
–10
confidence level.
With a single-ended PIN-TIA (Figure 3), ac coupling is used and
the inputs to the Quantizer are dc biased at some common-mode
potential. Observing the Quantizer input with an oscilloscope
probe at the point indicated shows a binary signal with average
value equal to the common-mode potential and instantaneous
values both above and below the average value. It is convenient
to measure the peak-to-peak amplitude of this signal and call the
minimum required value the Quantizer Sensitivity. Referring to
Figure 1, since both positive and negative offsets need to be
accommodated, the Sensitivity is twice the Overdrive. The AD807
Quantizer has 2 mV Sensitivity.
With a differential TIA (Figure 3), Sensitivity seems to improve
from observing the Quantizer input with an oscilloscope probe.
This is an illusion caused by the use of a single-ended probe. A
1 mV peak-to-peak signal appears to drive the AD807 Quantizer.
However, the single-ended probe measures only half the signal.
The true Quantizer input signal is twice this value since the
other Quantizer input is a complementary signal to the sig-
nal being observed.
Response Time
Response time is the delay between removal of the input signal
and indication of Loss of Signal (LOS) at SDOUT. The response
time of the AD807 (1.5 µs maximum) is much faster than the
SONET/SDH requirement (3 µs
≤
response time ≤ 100 µs). In
practice, the time constant of the ac coupling at the Quantizer
input determines the LOS response time.
Nominal Center Frequency
This is the frequency at which the VCO will oscillate with the
loop damping capacitor, C
D
, shorted.
Tracking Range
This is the range of input data rates over which the AD807 will
remain in lock.
Capture Range
This is the range of input data rates over which the AD807 will
acquire lock.
Static Phase Error
This is the steady-state phase difference, in degrees, between the
recovered clock sampling edge and the optimum sampling instant,
which is assumed to be halfway between the rising and falling
edges of a data bit. Gate delays between the signals that define
static phase error, and IC input and output signals prohibit
direct measurement of static phase error.
Data Transition Density, ρ
This is a measure of the number of data transitions, from “0” to
“1” and from “1” to “0,” over many clock periods. ρ is the ratio
(0 ≤ ρ ≤ 1) of data transitions to bit periods.
Jitter
This is the dynamic displacement of digital signal edges from
their long term average positions, measured in degrees rms or
Unit Intervals (UI). Jitter on the input data can cause dynamic
phase errors on the recovered clock sampling edge. Jitter on the
recovered clock causes jitter on the retimed data.
Output Jitter
This is the jitter on the retimed data, in degrees rms, due to a
specific pattern or some pseudorandom input data sequence
(PRN Sequence).
Jitter Tolerance
Jitter Tolerance is a measure of the AD807’s ability to track a
jittery input data signal. Jitter on the input data is best thought
of as phase modulation, and is usually specified in unit intervals.
The PLL must provide a clock signal that tracks the phase
modulation in order to accurately retime jittered data. In order
for the VCO output to have a phase modulation that tracks the
input jitter, some modulation signal must be generated at the
output of the phase detector. The modulation output from the
phase detector can only be produced by a phase error between
its data input and its clock input. Hence, the PLL can never
perfectly track jittered data. However, the magnitude of the
phase error depends on the gain around the loop. At low fre-
quencies, the integrator of the AD807 PLL provides very high
gain, and thus very large jitter can be tracked with small phase
errors between input data and recovered clock. At frequencies
closer to the loop bandwidth, the gain of the integrator is much
smaller, and thus less input jitter can be tolerated. The AD807
output will have a bit error rate less than 1 × 10
–10
when in lock
and retiming input data that has the CCITT G.958 specified
jitter applied to it.
Jitter Transfer (Refer to Figure 11)
The AD807 exhibits a low-pass filter response to jitter applied to
its input data.
REV. B
AD807
–5–
Bandwidth
This describes the frequency at which the AD807 attenuates
sinusoidal input jitter by 3 dB.
Peaking
This describes the maximum jitter gain of the AD807 in dB.
Damping Factor, ζ
Damping factor, ζ describes the compensation of the second
order PLL. A larger value of ζ corresponds to more damping
and less peaking in the jitter transfer function.
Acquisition Time
This is the transient time, measured in bit periods, required for
the AD807 to lock onto input data from its free-running state.
Symmetry—Recovered Clock Duty Cycle
Symmetry is calculated as (100 × on time)/period, where on
time equals the time that the clock signal is greater than the
midpoint between its “0” level and its “1” level.
Bit Error Rate vs. Signal-to-Noise Ratio
AD807 Bit Error Rate vs. Signal-to-Noise Ratio performance is
shown in TPC 6. Wideband amplitude noise is summed with
the input data signal as shown in Figure 4. Performance is
shown for input data levels of 5 mV and 10 mV.
VCM 2mV p-p
SCOPE
PROBE AD807 QUANTIZER
EPITAXX ERM504
VCM
BINARY
OUTPUT
a. Single-Ended Input Application
VCM 1mV p-p
SCOPE
PROBE AD807 QUANTIZER
AD8015
DIFFERENTIAL
OUTPUT TIA
VCM
BINARY
OUTPUT
+OUT
–OUT
b. Differential Input Application
Figure 3. (a–b) Single-Ended and Differential Input
Applications
⌺
+
+
⌺
50⍀
50⍀
0.47␮F
0.47␮F
75⍀1.0␮F100⍀
GND
5V
+
–
POWER
COMBINER
POWER
COMBINER
PIN
NIN
DIFFERENTIAL
SIGNAL
SOURCE
POWER
SPLITTER
NOISE
SOURCE
FILTER100MHz
D.U.T.
AD807
Figure 4. Bit Error Rate vs. Signal-to-Noise Ratio
Test: Block Diagram
V
BE
0.8V
AV
CC2
DIFFERENTIAL
INPUT
CURRENT SOURCES
HEADROOM 0.7V
0.5mA 1mA 0.5mA
AV
EE
400⍀400⍀
a. Quantizer Differential Input Stage
5.9k⍀
1.2V +V
BE
AV
EE
THRADJ
94.6k⍀
b. Threshold Adjust
150⍀
VEE
SDOUT
150⍀
VCC1
IOH
IOL
c. Signal Detect Output (SDOUT)
450⍀450⍀
V
CC2
DIFFERENTIAL
INPUT
2.5mA
V
EE
d. PLL Differential Output Stage—DATAOUT(N),
CLKOUT(N)
Figure 5. (a–d) Simplified Schematics
REV. B
AD807
–6–
–Typical Performance Characteristics
SIGNAL DETECT LEVEL – mV
200.0E+3
0.0E+0
0.0 30.05.0
RTHRESH – ⍀
10.0 15.0 20.0 25.0
160.0E+3
140.0E+3
100.0E+3
80.0E+3
120.0E+3
180.0E+3
60.0E+3
40.0E+3
20.0E+3
35.0
TPC 1. Signal Detect Level vs. R
THRESH
TEMPERATURE – ⴗC
35.0E–3
0.0E+0
–40 80–20
SIGNAL DETECT LEVEL – Volts
0204060
25.0E–3
15.0E–3
20.0E–3
30.0E–3
10.0E–3
5.0E–3
100
R
THRESH
= OPEN
R
THRESH
= 49.9k⍀
R
THRESH
= 0⍀
TPC 2. Signal Detect Level vs. Temperature
TEMPERATURE – ⴗC
9.00
3.00
–40 80–20
ELECTRICAL HYSTERESIS – dB
0204060
7.00
5.00
6.00
8.00
4.00
100
RTHRESH = OPEN
RTHRESH = 49.9k⍀
RTHRESH = 0⍀
TPC 3. Signal Detect Hysteresis vs. Temperature
SUPPLY VOLTAGE – Volts
35.000E–3
0.000E+0
4.4 5.64.6
SIGNAL DETECT LEVEL – Volts
4.8 5.0 5.2 5.4
25.000E–3
20.000E–3
10.000E–3
5.000E–3
15.000E–3
30.000E–3
RTHRESH = OPEN
RTHRESH = 49.9k⍀
RTHRESH = 0⍀
TPC 4. Signal Detect Level vs. Supply Voltage
POWER SUPPLY – V
8.00
0.00
4.4 5.64.6
ELECTRICAL HYSTERESIS – dB
4.8 5.0 5.2 5.4
6.00
5.00
2.00
1.00
4.00
7.00
3.00
R
THRESH
= OPEN
R
THRESH
= 49.9k⍀
R
THRESH
= 0⍀
TPC 5. Signal Detect Hysteresis vs. Power Supply
1
2
1
2 2
S
N
)
(
erfc
10 12 14 16 18 20 22 24
S/N – dB
1E–1
5E–2
3E–2
2E–2
1E–2
1E–3
1E–4
1E–5
1E–6
1E–8
1E–10
1E–12
BIT ERROR RATE
1278
NSN
1276
1279
1277
TPC 6. Bit Error Rate vs. Signal-to-Noise Ratio
REV. B
AD807
–7–
RMS JITTER – Degrees
30
0
1.4 2.31.5
PERCENTAGE – %
1.6 1.7 1.8 2.2
20
5
15
25
10
1.9 2.0 2.1
TEST CONDITIONS
WORST-CASE:
–40ⴗC, 4.5V
TPC 7. Output Jitter Histogram
FREQUENCY – Hz
1E+3
100E–3
10E+0 10E+6
JITTER TOLERANCE – UI
10E+0
100E+0 1E+3 10E+3 100E+3
100E+0
1E+0
1E+6
AD807
SONET MASK
TPC 8. Jitter Tolerance
NOISE – V p-p @ 311MHz
3.0
0
0 0.60.1
JITTER – ns p-p
0.2 0.3 0.4 0.5
2.0
1.0
1.00.7 0.8 0.9
PSR – NO FILTER
CMR
PSR – WITH FILTER
TPC 9. Output Jitter vs. Supply Noise and
Output Jitter vs. Common Mode Noise
THEORY OF OPERATION
Quantizer
The quantizer (comparator) has three gain stages, providing a
net gain of 350. The quantizer takes full advantage of the Extra
Fast Complementary Bipolar (XFCB) process. The input stage
uses a folded cascode architecture to virtually eliminate pulse
width distortion, and to handle input signals with common-
mode voltage as high as the positive supply. The input offset
voltage is factory trimmed and guaranteed to be less than 500 µV.
XFCB’s dielectric isolation allows the different blocks within
this mixed-signal IC to be isolated from each other, hence the
2 mV Sensitivity is achieved. Traditionally, high speed compara-
tors are plagued by crosstalk between outputs and inputs, often
resulting in oscillations when the input signal approaches 10 mV.
The AD807 quantizer toggles at ±650 µV (1.3 mV sensitivity) at
the input without making bit errors. When the input signal is
lowered below ±650 µV, circuit performance is dominated by
input noise, and not crosstalk.
0.1␮F
0.1␮F
0.1␮F
0.1␮F0.1␮F
FERRITE BEAD
OPTIONAL FILTER
0.1␮F
50⍀
309⍀
50⍀50⍀
3.65k⍀
+5V
10␮F
CHOKE
“BIAS TEE”
311MHz
NOISE
INPUT
0.1␮F
0.1␮F500⍀
500⍀
13
12
14
11
6
3
PIN
NIN
AV
CC2
AV
CC1
V
CC1
V
CC2
AD807
0.1␮F
QUANTIZER
INPUT
Figure 6. Power Supply Noise Sensitivity Test Circuit
0.1␮F
0.1␮F
0.1␮F
0.1␮F
0.1␮F
50⍀
309⍀
50⍀50⍀
3.65k⍀
+5V
10␮F
CHOKE
“BIAS TEE”
311MHz
NOISE
INPUT
0.1␮F
0.1␮F500⍀
500⍀
13
12
14
11
6
3
PIN
NIN
AVCC2
AVCC1
VCC1
VCC2
AD807
0.1␮F
QUANTIZER
INPUT
Figure 7. Common-Mode Rejection Test Circuit
Signal Detect
The input to the signal detect circuit is taken from the first stage
of the quantizer. The input signal is first processed through a gain
stage. The output from the gain stage is fed to both a positive
and a negative peak detector. The threshold value is subtracted
from the positive peak signal and added to the negative peak signal.
The positive and negative peak signals are then compared. If the
positive peak, POS, is more positive than the negative peak,
NEG, the signal amplitude is greater than the threshold, and the
output, SDOUT, will indicate the presence of signal by remain-
ing low. When POS becomes more negative than NEG, the
signal amplitude has fallen below the threshold, and SDOUT
will indicate a loss of signal (LOS) by going high. The circuit
provides hysteresis by adjusting the threshold level higher by a
factor of two when the low signal level is detected. This means
that the input data amplitude needs to reach twice the set LOS
threshold before SDOUT will signal that the data is again valid.
This corresponds to a 3 dB optical hysteresis.
REV. B
AD807
–8–
AD807
COMPARATOR
STAGES AND
CLOCK RECOVERY
PLL
PIN
NIN
THRESHOLD
BIAS
⌺
++
IHYS
ITHR
SDOUT
POSITIVE
PEAK
DETECTOR
NEGATIVE
PEAK
DETECTOR
LEVEL-
SHIFT
UP
LEVEL-
SHIFT
DOWN
Figure 8. Signal Level Detect Circuit Block Diagram
Phase-Locked Loop
The phase-locked loop recovers clock and retimes data from
NRZ data. The architecture uses a frequency detector to aid
initial frequency acquisition; refer to Figure 9 for a block diagram.
Note the frequency detector is always in the circuit. When the
PLL is locked, the frequency error is zero and the frequency
detector has no further effect. Since the frequency detector is
always in the circuit, no control functions are needed to initiate
acquisition or change mode after acquisition.
⌺
⌽DET
FDET
DATA
INPUT
S + 1
RETIMING
DEVICE
1
S
VCO
RECOVERED CLOCK
OUTPUT
RETIMED DATA
OUTPUT
Figure 9. PLL Block Diagram
The frequency detector delivers pulses of current to the charge
pump to either raise or lower the frequency of the VCO. During
the frequency acquisition process the frequency detector output
is a series of pulses of width equal to the period of the VCO.
These pulses occur on the cycle slips between the data frequency
and the VCO frequency. With a maximum density data pattern
(1010 . . . ), every cycle slip will produce a pulse at the frequency
detector output. However, with random data, not every cycle
slip produces a pulse. The density of pulses at the frequency
detector output increases with the density of data transitions. The
probability that a cycle slip will produce a pulse increases as the
frequency error approaches zero. After the frequency error has
been reduced to zero, the frequency detector output will have
no further pulses. At this point the PLL begins the process of phase
acquisition, with a settling time of roughly 2000 bit periods.
Jitter caused by variations of density of data transitions (pattern
jitter) is virtually eliminated by use of a new phase detector
(patented). Briefly, the measurement of zero phase error does
not cause the VCO phase to increase to above the average run
rate set by the data frequency. The jitter created by a 2
7
–1
pseudorandom code is 1/2 degree, and this is small compared to
random jitter.
The jitter bandwidth for the PLL is 0.06% of the center fre-
quency. This figure is chosen so that sinusoidal input jitter at
92 kHz will be attenuated by 3 dB.
The damping ratio of the PLL is user programmable with a
single external capacitor. At 155 MHz, a damping ratio of 5
is obtained with a 0.15 µF capacitor. More generally, the damp-
ing ratio scales as (f
DATA
× C
D
)
1/2
.
A lower damping ratio allows a faster frequency acquisition;
generally the acquisition time scales directly with the capacitor
value. However, at damping ratios approaching one, the acquisi-
tion time no longer scales directly with capacitor value. The
acquisition time has two components: frequency acquisition and
phase acquisition. The frequency acquisition always scales with
capacitance, but the phase acquisition is set by the loop band-
width of the PLL and is independent of the damping ratio.
Thus, the 0.06% fractional loop bandwidth sets a minimum
acquisition time of 2000 bit periods. Note the acquisition time
for a damping factor of one is 15,000 bit periods. This comprises
13,000 bit periods for frequency acquisition and 2,000 bit peri-
ods for phase acquisition. Compare this to the 400,000 bit
periods acquisition time specified for a damping ratio of 5; this
consists entirely of frequency acquisition, and the 2,000 bit
periods of phase acquisition is negligible.
While a lower damping ratio affords faster acquisition, it also
allows more peaking in the jitter transfer response (jitter peaking).
For example, with a damping ratio of 10, the jitter peaking is
0.02 dB, but with a damping ratio of 1, the peaking is 2 dB.
Center Frequency Clamp (Figure 10)
An N-channel FET circuit can be used to bring the AD807 VCO
center frequency to within ±10% of 155 MHz when SDOUT
indicates a Loss of Signal (LOS). This effectively reduces the
frequency acquisition time by reducing the frequency error
between the VCO frequency and the input data frequency at
clamp release. The N-FET can have “on” resistance as high as
1 kΩ and still attain effective clamping. However, the chosen
N-FET should have greater than 10 MΩ “off” resistance and
less than 100 nA leakage current (source and drain) so as not to
alter normal PLL performance.
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
AD807
DATAOUTN
DATAOUTP
V
CC2
CLKOUTN
CLKOUTP
V
CC1
CF1
CF2
V
EE
SDOUT
AV
CC2
PIN
NIN
AV
CC1
THRADJ
AV
EE
N_FET
C
D
Figure 10. Center Frequency Clamp Schematic
FREQUENCY – Hz
10 20k
0.02dB/DIV
100 1k 10k
CD PEAK
0.1
0.15
0.22
0.33
0.12
0.08
0.06
0.04
Figure 11. Jitter Transfer vs. C
D
REV. B
AD807
–9–
AD807
DATAOUTN
DATAOUTP
V
CC2
CLKOUTN
CF1
CF2
V
EE
SDOUT
PIN
NIN
AV
CC1
THRADJ
AV
EE
50⍀ STRIP LINE
EQUAL LENGTH
C7–C10 ARE 0.1␮F BYPASS
CAPACITORS
RIGHT ANGLE SMA CONNECTOR
OUTER SHELL TO GND PLANE
ALL RESISTORS ARE 1% 1/8 WATT
SURFACE MOUNT
TPx
O
TEST POINTS ARE VECTORBOARD
K24A/M PINS
NOTES:
TP7 TP8 J5
SDOUT
C9
R13
301⍀R14
49.9⍀
R15
49.9⍀
C13
0.1␮F
C14
0.1␮F
R16
3.65k⍀
C12
0.1␮F
J6
J7
PIN
NIN
VECTOR PINS SPACED FOR RN55C
TYPE RESISTOR; COMPONENT
SHOWN FOR REFERENCE ONLY
V
CC1
CLKOUTP
AV
CC2
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
NOTE:
INTERCONNECTION
RUN UNDER DUT
C10
R
THRESH
TP5
TP6
TP1
TP2
CD
VECTOR PINS SPACED THROUGH-HOLE
CAPACITOR ON VECTOR CUPS; COMPONENT
SHOWN FOR REFERENCE ONLY
R5 100⍀
R6 100⍀
50⍀ STRIP LINE
EQUAL LENGTH
R10
154⍀
R9
154⍀
C7
R7 100⍀
R8 100⍀
C8
R12
154⍀
R11
154⍀
C11
10␮F
TP3 TP4
5V GND
R2
100⍀
R1
100⍀
C3 0.1␮F
C4 0.1␮F
C5 0.1␮F
C6 0.1␮F
R4
100⍀
R3
100⍀
C2
0.1␮F
DATAOUTN
DATAOUTP
CLKOUTN
CLKOUTP
C1 0.1␮F
J1
J2
J3
J4
Figure 12. Evaluation Board Schematic
Figure 13. Evaluation Board Pictorials
CIRCUIT SIDE
08-002901-02
REV A
SILKSCREEN TOP
08-002901-03
REV A
INT2
08-002901-08
REV A
COMPONENT SIDE
08-002901-01
REV A
INT1
08-002901-07
REV A
SOLDERMASK TOP
08-002901-04
REV A
REV. B
AD807
–10–
AD807
DATAOUTN
DATAOUTP
VCC2
CLKOUTN
CF1
CF2
VEE
SDOUT
PIN
NIN
AVCC1
THRADJ
AVEE
SDOUT
TP7
R14
50⍀
R15
50⍀
VCC1
CLKOUTP
AVCC2
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
TP5
TP1
TP2
CD
R5 100⍀
R6 100⍀
R10
154⍀
R9
154⍀
C7
R7 100⍀
R8 100⍀
C8
R12
154⍀
R11
154⍀
TP4
R2
100⍀
R1
100⍀
C2 0.1␮F
C3 0.1␮F
C4 0.1␮F
C5 0.1␮F
R4
100⍀
R3
100⍀
C2
0.1␮F
DATAOUTN
DATAOUTP
CLKOUTN
CLKOUTP
NOTES:
1. ALL CAPACITORS ARE CHIP,
15pF ARE MICA.
2. 150nH ARE SMT
3. C7, C8, C10, C11 ARE 0.1␮F
BYPASS CAPACITORS
C1 0.1␮F
J1
J2
J3
J4
TP6
R13
THRADJ
C10
C11
C15
0.1␮F
C14
0.1␮F
R16
301⍀
C12
2.2␮F
R17
3.65k⍀
C13
0.1␮F
NC
IIN
NC
VBYP
+VS
+OUT
–VS
–OUT
AD8015
1
2
3
4
8
7
6
5
ABB HAFO 1A227
FC HOUSING
0.8A/W, 0.7pF
2.5GHz
0.01␮F0.1␮F
NC = NO CONNECT
0.1␮F
10␮F
15pF
150nH
150nH
15pF
TP3
5V
C9
10␮F
50⍀
LINE
50⍀
LINE
Figure 14. Low Cost 155 Mbps Fiber Optic Receiver Schematic
Table I. AD807—AD8015 Fiber Optic Receiver Circuit:
Output Bit Error Rate and Output Jitter vs. Input Power
Average Optical
Input Power Output Bit Output Jitter
(dBm) Error Rate (ps rms)
–6.4 Loses Lock
–6.5 7.5 × 10
–3
–6.6 9.4 × 10
–4
–6.7 0 × 10
–14
–7.0 to –35.5 0 × 10
–14
<40
–36.0 3 × 10
–12
<40
–36.5 4.8 × 10
–10
–37.0 2.8 × 10
–8
–38.0 1.3 × 10
–5
–39.0 1.0 × 10
–3
–39.2 1.9 × 10
–3
–39.3 Loses Lock
APPLICATIONS
Low Cost 155 Mbps Fiber Optic Receiver
The AD807 and AD8015 can be used together for a complete
155 Mbps Fiber Optic Receiver (Quantizer and Clock Recovery,
and Transimpedance Amplifier) as shown in Figure 14.
The PIN diode front end is connected to a single mode 1300 nm
laser source. The PIN diode has 3.3 V reverse bias, 0.8 A/W
responsively, 0.7 pF capacitance, and 2.5 GHz bandwidth.
The AD8015 outputs (P
OUT
and N
OUT
) drive a differential,
constant impedance (50 Ω) low-pass filter with a 3 dB cutoff
of 100 MHz. The outputs of the low-pass filter are ac coupled
to the AD807 inputs (PIN and NIN). The AD807 PLL damp-
ing factor is set at 7 using a 0.22 µF capacitor.
503mV
100mV/
DIV
–497mV
48.12ns 1ns/DIV 58.12ns
Figure 15. Receiver Output (Data) Eye Diagram,
–7.0 dBm Optical Input
503mV
100mV/
DIV
–497mV
49.12ns 1ns/DIV 59.12ns
Figure 16. Receiver Output (Data) Eye Diagram,
–36.0 dBm Optical Input
REV. B
AD807
–11–
AD807
DATAOUTN
DATAOUTP
V
CC2
CLKOUTN
CF1
CF2
V
EE
SDOUT
PIN
NIN
AV
CC1
THRADJ
AV
EE
SDOUT
V
CC1
CLKOUTP
AV
CC2
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
CD
R5 100⍀
R6 100⍀
R10
154⍀
R9
154⍀
C7 0.1␮F
R7 100⍀
R8 100⍀
C8
0.1␮F
R12
150⍀
R11
150⍀
R2
100⍀
R1
100⍀
C2 0.1␮F
C3 0.1␮F
C4 0.1␮F
C5 0.1␮F
R4
100⍀
R3
100⍀
C6
0.1␮F
C1 0.1␮F
J1
J2
J3
J4
R13
THRADJ
C11 0.1␮F
C10 0.1␮F
R14
47⍀R15
47⍀
R16
330⍀
C9
10␮F
5V
C13
0.1␮F
C14
0.1␮F30pF 30pF
NOISE FILTER
120nH
R17
3.9k⍀
C12
0.1␮F
EPITAXX
ERM504
1
2PIN TIA 1␮F
NOTE:
PIN TIA PIN 4 (CASE)
IS CONNECTED TO
GROUND
Figure 17. AD807 Application with Epitaxx PIN—Transimpedance Amplifier Module
The entire circuit was enclosed in a shielded box. Table I sum-
marizes results of tests performed using a 2
23
-1 PRN Sequence,
and varying the average power at the PIN diode.
The circuit acquires and maintains lock with an average input
power as low as –39.25 dBm.
Table II. AD807—Epitaxx ERM504 PIN TIA 155 Mbps
Fiber Optic Receiver Circuit: Output Bit Error Rate and
Output Jitter vs. Average Input Power
Average Optical
Input Power Output Bit Output Jitter
(dBm) Error Rate (ps rms)
0 0.0 × 10
–10
29
–3 0.0 × 10
–10
35
–10 0.0 × 10
–10
40
–20 0.0 × 10
–10
37
–30 0.0 × 10
–10
33
–32 0.0 × 10
–10
35
–34 0.0 × 10
–10
36
–35 0.0 × 10
–10
39
–35.5 0.0 × 10
–10
40
–36 0.0 × 10
–10
41
–37.0 0.0 × 10
–10
42
–37.6 0.5 × 10
–10
43
–38.0 4 × 10
–6
50
SONET (OC-3)/SDH (STM-1) Fiber Optic Receiver Circuit
A light wave receiver circuit for SONET/SDH application at
155 Mbps is shown in Figure 17, with test results given in Table
II. The circuit operates from a single 5 V supply, and uses two
major components: an Epitaxx ERM504 PIN-TIA module with
AGC, and the AD807 IC.
A 120 MHz, third order, low-pass Butterworth filter at the
output of the PIN-TIA module provides adequate bandwidth
(70% of the bit rate), and attenuates high frequency (out of
band) noise.
250mV
50mV/
DIV
–250mV
38.12ns 1ns/DIV 48.12ns
Figure 18. Receiver Output (Data) Eye Diagram,
0 dBm Optical Input
250mV
50mV/
DIV
–250mV
38.12ns 1ns/DIV 48.12ns
Figure 19. Receiver Output (Data) Eye Diagram,
–38 dBm Optical Input
REV. B
–12–
C00862–0–12/00 (rev. B)
PRINTED IN U.S.A.
AD807
USING THE AD807
Ground Planes
Use of one ground plane for connections to both analog and
digital grounds is recommended.
Power Supply Connections
Use of a 10 µF capacitor between V
CC
and ground is recom-
mended. Care should be taken to isolate the 5 V power trace to
V
CC2
(Pin 3). The V
CC2
pin is used inside the device to provide
the CLKOUT and DATAOUT signals.
Use of 0.1 µF capacitors between IC power supply and ground
is recommended. Power supply decoupling should take place as
close to the IC as possible. Refer to the schematic, Figure 12,
for recommended connections.
Transmission Lines
Use of 50 Ω transmission lines are recommended for PIN, NIN,
CLKOUT, and DATAOUT signals.
Terminations
Termination resistors should be used for PIN, NIN, CLKOUT,
and DATAOUT signals. Metal, thick film, 1% tolerance resistors
are recommended. Termination resistors for the PIN, NIN signals
should be placed as close as possible to the PIN, NIN pins.
Connections from 5 V to load resistors for PIN, NIN, CLKOUT,
and DATAOUT signals should be individual, not daisy chained.
This will avoid crosstalk on these signals.
Loop Damping Capacitor, C
D
A ceramic capacitor may be used for the loop damping capaci-
tor. Using a 0.15 µF, +20% capacitor for a damping factor of
five provides < 0.1 dB jitter peaking.
AD807 Output Squelch Circuit
A simple P-channel FET circuit can be used in series with the
Output Signal ECL Supply (V
CC2
, Pin 3) to squelch clock and
data outputs when SDOUT indicates a loss of signal (Figure 20).
The V
CC2
supply pin draws roughly 61 mA (14 mA for each of 4
ECL loads, plus 5 mA for all 4 ECL output stages). This means
that selection of a FET with ON RESISTANCE of 0.5 Ω will
affect the common mode of the ECL outputs by only 31 mV.
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
AD807
DATAOUTN
DATAOUTP
V
CC2
CLKOUTN
CLKOUTP
V
CC1
CF1
CF2
V
EE
SDOUT
AV
CC2
PIN
NIN
AV
CC1
THRADJ
AV
EE
P_FET
5V
BYPASS
CAP
TO V
CC1
, AV
CC
, AV
CC2
Figure 20. Squelch Circuit Schematic
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
16-Lead Small Outline IC Package
(R-16A)
16 9
81
0.1574 (4.00)
0.1497 (3.80)
0.3937 (10.00)
0.3859 (9.80)
0.050 (1.27)
BSC
PIN 1
0.2440 (6.20)
0.2284 (5.80)
SEATING
PLANE
0.0098 (0.25)
0.0040 (0.10)
0.0192 (0.49)
0.0138 (0.35)
0.0688 (1.75)
0.0532 (1.35)
8ⴗ
0ⴗ
0.0196 (0.50)
0.0099 (0.25)ⴛ 45ⴗ
0.0500 (1.27)
0.0160 (0.41)
0.0099 (0.25)
0.0075 (0.19)