EVKIT THROUGH-REFLECT-LINE (TRL) CALIBRATION
The “Through-Reflect-Line” (TRL) method [1] is used to de-embed the evaluation board losses from the S-parameter measurements of the
F1950. This method requires the use of three standards: a through, a reflection, and a line. The TRL method has the advantage over other
calibration methods in that it requires only one of these three standards to be well defined.
The TRL through which is used for the F1950 TRL calibration was constructed identically to the evaluation board, minus the DUT and its
corresponding length. Therefore, the through corresponds to a precise zero length connection between the input and output reference
planes of the DUT. This through satisfies the requirement of the TRL method that one of the three standards be precisely specified.
The TRL reflection standard used is constructed identically to the input and output lines of the evaluation board, with a short placed at the
reference plane of the DUT. In accordance with the TRL method’s requirements, the actual magnitude and phase were not accurately
specified, but the phase was known to within 90 degrees and the TRL reflection standard has a magnitude close to one.
The TRL line standard is identical to the TRL through, but with an additional length of 0.8 inches (2 cm). This satisfies the TRL method’s
requirement that the TRL be a different length than the TRL through, that it have the same impedance and propagation constant as the
through, and that the phase difference between the through and the line be between 20 degrees and 160 degrees. The difference in length
yields a phase difference of approximately 20 degrees at 500 MHz, and a phase difference of 160 degrees at 4 GHz.
For characterization of performance from 150 to 500 MHz a separate TRL board with different “Line” length is used.
Standards used for F195x TRL calibration
F1950 evaluation circuit
Engen, G.F.; Hoer, C.A.; “Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer,” IEEE
Transactions on Microwave Theory and Techniques, Volume: 27 Issue:12, pp. 987 – 993, Dec 1979