MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Features
MT9F002/D Rev. 9, 1/16 EN 1©Semiconductor Components Industries, LLC 2016,
1/2.3-Inch 14 Mp CMOS Digital Image Sensor
MT9F002 Data Sheet, Rev. 9
For the latest data sheet, please visit: www.onsemi.com
Features
1.4 m pixel with ON Semiconductor A-Pix™
technology
Simple two-wire serial interface
Auto black level calibration
Full HD support at 60 fps for maximum video
performance
20 percent extra image array area in full HD to
enable electronic image stabilization (EIS).
Support for external mechanical shutter
Support for external LED or xenon flash
High frame rate preview mode with arbitrary down-
size scaling from maximum resolution
Programmable controls: gain, horizontal and vertical
blanking, frame size/rate, exposure, left–right and
top–bottom image reversal, window size, and
panning
Data interfaces: parallel or four-lane serial high-
speed pixel interface (HiSPi™) differential signaling
(SLVS)
On-chip phase-locked loop (PLL) oscillator
Bayer pattern downsize scaler
Applications
Digital video cameras
Digital still cameras
General Description
The ON Semiconductor MT9F002 is a 1/2.3-inch
CMOS active-pixel digital imaging sensor with an
active pixel array of 4608H x 3288V (4640H x 3320V
including border pixels). It can support 14-megapixel
(4384H x 3288V) digital still images and a 1080p plus
additional 20 percent pixels for electronic image stabi-
lization (4608H x 2592V) in digital video mode. The
MT9F002 sensor is programmable through a simple
two-wire serial interface, and has low power consump-
tion.
Table 1: Key Performance Parameters
Parameter Value
Optical format 1/2.3-inch (4:3)
Active pixels and imager size
4608H x 3288V: (entire array): 6.451mm (H)
x 4.603mm (V), 7.925mm diagonal
4384H x 3288V (4:3, still mode): 6.138mm
(H) x 4.603mm (V), 7.672mm diagonal
4608H x 2592V (16:9, video mode):
6.451mm (H) x 3.629mm (V), 7.402mm diagonal
Pixel size 1.4 m x 1.4m
Chief ray angle 0°, 11.4°, and 25°
Color filter array RGB Bayer pattern
Shutter type Electronic rolling shutter (ERS) with global reset
release (GRR)
Input clock frequency 2–64 MHz
Maxi-
mum
data
rate
Parallel 96 Mp/s at 96 MHz PIXCLK
HiSPi (4-lane) 700 Mbps/lane
Frame
rate
14M resolution
(4384H x 3288V)
Programmable up to 13.7 fps for HiSPi I/F, 6.3 fps
for parallel I/F
Preview VGA mode 30 fps with binning
60 fps with skip2bin2
1080p mode:
60 fps using HiSPi interface
2304H x 1296V (1080p +20%EIS)
30 fps using parallel interface
2256H x 1268V (1080p +17%EIS)
ADC resolution 12-bit, on-chip
Responsivity 0.724 V/lux-sec (550nm)
Dynamic range 65.3 dB
SNRMAX 35.5 dB
Supply
voltage
I/O Digital 1.7–1.9 V (1.8 V nominal)
or 2.4–3.1 V (2.8 V nominal)
Digital 1.7–1.9 V (1.8 V nominal)
Analog 2.7–3.1 V (2.8 V nominal)
HiSPi PHY
HiSPi I/O (SLVS)
HiSPi I/O (HiVCM)
1.7–1.9 V (1.8 V nominal)
0.3 - 0.9 V (0.4 or 0.8 V nominal)
1.7–1.9 V (1.8 V nominal)
Power
Con-
sump-
tion
Full resolution 13.65
fps (HiSPi serial I/F,
12-bit)
724 mW
1080p60 (HiSPi serial
I/F, 10-bit) XYbin2: 596 mW
1080p30 (HiSPi serial
I/F, 10-bit) XYbin2: 443 mW
Package 48-pin iLCC (10 mm x 10 mm) and bare die
Operating temperature –30°C to +70°C (at junction)
MT9F002/D Rev. 9, 1/16 EN 2©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Ordering Information
Ordering Information
Table 2: Available Part Numbers
Part Number Product Description Orderable Product Attribute Description
MT9F002I12STCV-DP RGB, 0deg CRA, HiSPi, iLCC Package Drypack, Protective Film
MT9F002I12-N4000-DP1 RGB, 12deg CRA, HiSPi, iLCC Package Drypack, Protective Film
MT9F002I12STCVD3-GEVK 0deg CRA, HiSPi, Demo Kit
MT9F002I12STCVH-GEVB 0deg CRA, HiSPi, Head Board
MT9F002I12-N4000D-GEVK 12deg CRA, HiSPi, Demo Kit
MT9F002I12-N4000H-GEVB 12deg CRA, HiSPi, Head Board
MT9F002/D Rev. 9, 1/16 EN 3©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Table of Contents
Table of Contents
Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
Ordering Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
Functional Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
Operating Modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
Signal Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Output Data Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
HiSPi Physical Layer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Comparison of SLVS and HiVCM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14
Two-Wire Serial Register Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Programming Restrictions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
Control of the Signal Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
Features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .37
Sensor Readout Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
Power Mode Contexts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51
Sensor Core Digital Data Path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
Timing Specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68
Spectral Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .72
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75
Package Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
MT9F002/D Rev. 9, 1/16 EN 4©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
General Description
General Description
The MT9F002 digital image sensor features ON Semiconductor’s breakthrough
low-noise CMOS imaging technology that achieves near-CCD image quality (based on
signal-to-noise ratio and low-light sensitivity) while maintaining the inherent size, cost,
and integration advantages of CMOS.
When operated in its default 4:3 still-mode, the sensor generates a full resolution
(4384x3288)image at 13 frames per second (fps) using the HiSPi serial interface. An
on-chip analog-to-digital converter (ADC) generates a 12-bit value for each pixel.
Functional Overview
The MT9F002 is a progressive-scan sensor that generates a stream of pixel data at a
constant frame rate. It uses an on-chip, phase-locked loop (PLL) to generate all internal
clocks from a single master input clock running between 2 and 64 MHz. The maximum
output pixel rate is 220 Mp/s for serial HiSPi I/F and 96 Mp/s for parallel I/F, corre-
sponding to a pixel clock rate of 220 MHz and 96 MHz, respectively. A block diagram of
the sensor is shown in Figure 1.
Figure 1: Block Diagram
The core of the sensor is a 14Mp active-pixel array. The timing and control circuitry
sequences through the rows of the array, resetting and then reading each row in turn. In
the time interval between resetting a row and reading that row, the pixels in the row inte-
grate incident light. The exposure is controlled by varying the time interval between
reset and readout. Once a row has been read, the data from the columns is sequenced
through an analog signal chain (providing offset correction and gain), and then through
an ADC. The output from the ADC is a 12-bit value for each pixel in the array. The ADC
output passes through a digital processing signal chain (which provides further data
path corrections and applies digital gain).
The pixel array contains optically active and light-shielded (“dark”) pixels. The dark
pixels are used to provide data for on-chip offset-correction algorithms (“black level”
control).
PLL
Timing
and
Control
Registers
Pixel
Array
Column
Amplifiers
Column
Amplifiers
Row Drivers
Voltage
Reference
Black
Level
Correction
Scaler
Limiter
Output Buffer/FIFO
Lens Shading Correction
Digital Gain
Data Pedestal
I
2
C
EXTCLK
Analog Core Core Data Path
Test Pattern Generator
Parallel I/O: PIXCLK
FV, LV, DOUT[11:0]
Serial HiSPi:
SLVSC P/N, SLVS[3:0] P/N
Output Data Path
PGA
PGA
ADC
ADC 12 bits
12 bits
12 bits
12 bits
MT9F002/D Rev. 9, 1/16 EN 5©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Functional Overview
The image black level is calibrated to compensate for analog offset and ensure that the
ADC range is utilized well. It also reduces row noise in the image. The black level in the
output image involves Fine Digital Correction and addition of Data Pedestal (42 LSB for
10-bit ADC, 168 LSB for 12-bit ADC)
Figure 2: Data Flow Diagram
The sensor contains a set of control and status registers that can be used to control many
aspects of the sensor behavior including the frame size, exposure, and gain setting.
These registers can be accessed through a two-wire serial interface.
The output from the sensor is a Bayer pattern; alternate rows are a sequence of either
green and red pixels or blue and green pixels. The offset and gain stages of the analog
signal chain provide per-color control of the pixel data.
The control registers, timing and control, and digital processing functions shown in
Figure 1 on page 4 are partitioned into three logical parts:
A sensor core that provides array control and data path corrections. The output of the
sensor core is a 12-bit parallel pixel data stream qualified by an output data clock
(PIXCLK), together with LINE_VALID (LV) and FRAME_VALID (FV) signals or a 4-lane
serial high-speed pixel interface (HiSPi).
A digital shading correction block to compensate for color/brightness shading intro-
duced by the lens or chief ray angle (CRA) curve mismatch.
Additional functionality is provided. This includes a horizontal and vertical image
scaler, a limiter, an output FIFO, and a serializer.
The output FIFO is present to prevent data bursts by keeping the data rate continuous.
Programmable slew rates are also available to reduce the effect of electromagnetic inter-
ference from the output interface.
A flash output signal is provided to allow an external xenon or LED light source to
synchronize with the sensor exposure time. Additional I/O signals support the provision
of an external mechanical shutter.
Pixel Array
The sensor core uses a Bayer color pattern, as shown in Figure 3. The even-numbered
rows contain green and red pixels; odd-numbered rows contain blue and green pixels.
Even-numbered columns contain green and blue pixels; odd-numbered columns
contain red and green pixels.
Lens Shading
Correction
Black Level
Calibration
ADC
Analog Gain
DAC
Analog
Analog
Offset
Calibration
Digital
Gain
Data
Pedestal
Pixel
Output
Digital
12-bit
MT9F002/D Rev. 9, 1/16 EN 6©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Functional Overview
Figure 3: Pixel Color Pattern Detail (Top Right Corner)
Figure 4: High-Resolution Still Image Capture + Full HD Video
Black Pixels
Column Readout Direction
.
.
.
...
Row
Readout
Direction Gr
B
Gr
R
Gb
R
Gr
B
Gr
R
Gb
R
First clear
active pixel
(col 114, row 106)
Gr
B
Gr
MT9F002/D Rev. 9, 1/16 EN 7©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Operating Modes
Operating Modes
By default, the MT9F002 powers up with the serial pixel data interface enabled. The
sensor can operate in serial HiSPi or parallel mode.
For low-noise operation, the MT9F002 requires separate power supplies for analog and
digital power. Incoming digital and analog ground conductors should be placed in such
a way that coupling between the two are minimized. Both power supply rails should also
be routed in such a way that noise coupling between the two supplies and ground is
minimized.
Caution ON Semiconductor does not recommend the use of inductance filters on the power supplies
or output signals.
Figure 5: Typical Configuration: Serial Four-Lane HiSPi Interface
Notes: 1. All power supplies should be adequately decoupled. ON Semiconductor recommends having 1.0F
and 0.1F decoupling capacitors for every power supply.
2. ON Semiconductor recommends a resistor value of 1.5k, but a greater value may be used for
slower two-wire speed.
3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times.
4. The GPI pins can be statically pulled HIGH or LOW and can be programmed to perform special func-
tions (TRIGGER/VD, OE_BAR, SADDR, STANDBY) to be dynamically controlled. GPI pads can be left
floating, when not used.
5. VPP, which is not shown in Figure 5, is left unconnected during normal operation.
VDD_IO VDD_TX VDD_PLLVDD VAA
VDD
VDD_TX
VAA VAA_PIX
Master clock
(2–64 MHz)
SDATA
SCLK
RESET_BAR
TEST
EXTCLK
DGND AGND
Digital
ground
Analog
ground
Digital
Core
power1
HiSPi
PHY I/O
power1, 10
Analog
power1
To
controller
From
controller
VDD_IO
VDD_PLL
PLL
power1
Digital
I/O
power1
1.5kΩ
2
1.5kΩ
2, 3
Analog
power1
VAA_PIX
SLVSC_N
SLVSC_P
SLVS_0P
SLVS_0N
SLVS_1P
SLVS_1N
SLVS_2P
SLVS_2N
SLVS_3P
SLVS_3N
FLASH
SHUTTER
GPI[3:0]4
0.1µF1.0µF0.1µF1.0µF0.1µF1.0µF0.1µF1.0µF0.1µF1.0µF0.1µF1.0µF
VDD_HISPI
MT9F002/D Rev. 9, 1/16 EN 8©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Operating Modes
6. The parallel interface output pads can be left unconnected when the serial output interface is used.
7. ON Semiconductor recommends that 0.1F and 10F decoupling capacitors for each power supply
are mounted as close as possible to the pad. Actual values and results may vary depending on lay-
out and design considerations. Check the MT9F002 demo headboard schematics for circuit recom-
mendations.
8. TEST signals must be tied to DGND for normal sensor operation.
9. ON Semiconductor recommends that analog power planes are placed in a manner such that cou-
pling with the digital power planes is minimized.
10. For serial HiSPi HiVCM mode, set register bit R0x306E[9] = 1 and VDD_TX = VDD_IO = 1.8V.
Figure 6: Typical Configuration: Parallel Pixel Data Interface
Notes: 1. All power supplies should be adequately decoupled. ON Semiconductor recommends having 1.0F
and 0.1F decoupling capacitors for every power supply.
2. ON Semiconductor recommends a resistor value of 1.5k, but a greater value may be used for
slower two-wire speed.
3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times.
4. The GPI pins can be statically pulled HIGH or LOW and can be programmed to perform special func-
tions (TRIGGER/VD, OE_BAR, SADDR, STANDBY) to be dynamically controlled. GPI pads can be left
floating, when not used.
5. VPP, which is not shown in Figure 6, is left unconnected during normal operation.
6. The serial interface output pads can be left unconnected when the parallel output interface is used.
7. ON Semiconductor recommends that 0.1F and 10F decoupling capacitors for each power supply
are mounted as close as possible to the pad. Actual values and results may vary depending on lay-
out and design considerations. Check the MT9F002 demo headboard schematics for circuit recom-
mendations.
8. TEST signals must be tied to DGND for normal sensor operation.
VAA_PIX
VDD
Master clock
(2–64 MHz)
S
DATA
SCLK
RESET_BAR
TEST
FLASH
FRAME_VALID
SHUTTER
DOUT [11:0]EXTCLK
D
GND
A
GND
Digital
ground
Analog
ground
Digital
core
power
1
To
controller
parallel port
From
Controller
LINE_VALID
PIXCLK
VDD_IO
GPI[3:0]
4
Digital
I/O
power
1
1.5kΩ
2
1.5kΩ
2, 3
VDD_IO VDD_PLLVDD VAA
VAA VAA_PIX
Analog
power
1
VDD_PLL
PLL
power
1
Analog
power
1
1.0µF 0.1µF0.1µF1.0µF 0.1µF1.0µF0.1µF1.0µF0.1µF1.0µF
MT9F002/D Rev. 9, 1/16 EN 9©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Operating Modes
9. ON Semiconductor recommends that analog power planes are placed in a manner such that cou-
pling with the digital power planes is minimized.
MT9F002/D Rev. 9, 1/16 EN 10 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Signal Descriptions
Signal Descriptions
Table 3 provides signal descriptions for MT9F002 die. For pad location and aperture
information, refer to the MT9F002 die data sheet.
Table 3: Signal Descriptions
Signal Type Description
EXTCLK Input
Master clock input, 2-64 MHz.
RESET_BAR Input Asynchronous active LOW reset. When asserted, data output stops and all
internal registers are restored to their factory default settings.
SCLK Input
Serial clock for access to control and status registers.
GPI[3:0] Input General purpose inputs. After reset, these pads are powered-down by default;
this means that it is not necessary to bond to these pads. Any of these pads
can be programmed (through register R0x3026) to provide hardware control
of the standby, output enable, SADDR select, shutter trigger or slave mode
trigger (VD) function. Can be left floating if not used.
TEST Input
Enable manufacturing test modes. Tie to DGND for normal sensor operation.
SDATA I/O Serial data from READs and WRITEs to control and status registers.
VPP Supply
Disconnect pad for normal operation.
Power supply used to program one-time programmable (OTP) memory.
Manufacturing use only.
VDD_HiSPi Supply
HiSPi PHY power supply. Digital power supply for the HiSPi serial data
interface. This should be tied to VDD.
VDD_TX Supply
Digital power supply for the HiSPi I/O.
For HiSPi SLVS mode, set register bit R0x306E[9] = 0 (default), and
VDD_TX to 0.4V.
For HiSPi HiVCM mode, set register bit R0x306E[9] = 1, and VDD_TX =
VDD_IO.
VAA Supply
Analog power supply.
VAA_PIX Supply Analog power supply for the pixel array.
AGND Supply
Analog ground.
VDD Supply
Digital power supply.
VDD_IO Supply I/O power supply.
DGND Supply
Common ground for digital and I/O.
VDD_PLL Supply
PLL power supply.
SLVS_0P Output Lane 1 differential HiSPi (SLVS) serial data (positive). Qualified by the SLVS
serial clock.
SLVS_0N Output
Lane 1 differential HiSPi (SLVS) serial data (negative). Qualified by the SLVS
serial clock.
SLVS_1P Output Lane 2 differential HiSPi (SLVS) serial data (positive). Qualified by the SLVS
serial clock.
SLVS_1N Output
Lane 2 differential HiSPi (SLVS) serial data (negative). Qualified by the SLVS
serial clock.
SLVS_2P Output
Lane 3 differential HiSPi (SLVS) serial data (positive). Qualified by the SLVS
serial clock.
SLVS_2N Output
Lane 3 differential HiSPi (SLVS) serial data (negative). Qualified by the SLVS
serial clock.
SLVS_3P Output
Lane 4 differential HiSPi (SLVS) serial data (positive). Qualified by the SLVS
serial clock.
MT9F002/D Rev. 9, 1/16 EN 11 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Signal Descriptions
Figure 7: 48-Pin iLCC HiSPi Package Pinout Diagram
SLVS_3N Output
Lane 4 differential HiSPi (SLVS) serial data (negative). Qualified by the SLVS
serial clock.
SLVS_CP Output
Differential HiSPi (SLVS) serial clock (positive). Qualified by the SLVS serial
clock.
SLVS_CN Output
Differential HiSPi (SLVS) serial clock (negative). Qualified by the SLVS serial
clock.
LINE_VALID Output
LINE_VALID (LV) output. Qualified by PIXCLK.
FRAME_VALID Output
FRAME_VALID (FV) output. Qualified by PIXCLK.
DOUT[11:0] Output
Parallel pixel data output. Qualified by PIXCLK.
PIXCLK Output
Pixel clock. Used to qualify the LV, FV, and DOUT[11:0] outputs.
FLASH Output
Flash output. Synchronization pulse for external light source. Can be left
floating if not used.
SHUTTER Output
Control for external mechanical shutter. Can be left floating if not used.
Table 3: Signal Descriptions (continued)
Signal Type Description
123456 48474645
44 43
19 20 21 22 23 24 25 26 27 28 29 30
7
8
9
10
11
12
13
14
15
16
17
18
42
41
40
39
38
37
36
35
34
33
32
31
AGND
VAA
NC
VAA
AGND
VAA_PIX
VAA_PIX
NC
NC
VAA
AGND
VDD_HiSPi
VDD_IO
DGND
VDD
EXTCLK
VDD
DGND
VDD_IO
SDATA
SCLK
TEST
RESET_BAR
VDD
DGND
VDD_IO
GPI0
GPI1
GPI2
GPI3
SHUTTER
FLASH
VDD_PLL
VPP
VDD_TX
SLVS_0N
SLVS_0P
SLVS_1N
SLVS_1P
SLVS_CN
SLVS_CP
SLVS_2N
SLVS_2P
SLVS_3N
SLVS_3P
DGND
NC
DGND
MT9F002/D Rev. 9, 1/16 EN 12 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Output Data Format
Output Data Format
Pixel Data Interface
The MT9F002 reads data out of the pixel array in a progressive scan over a High Speed
serial data interface, or parallel data interface. RAW8, RAW10, and RAW12 image data
formats are supported.
Figure 8: Data Formats
High Speed Serial Pixel Data Interface
The High Speed Serial Pixel (HiSPi)TM interface uses four data and one clock low voltage
differential signaling (SLVS) outputs.
•SLVS_CP
•SLVS_CN
•SLVS_0P
•SLVS_0N
•SLVS_1P
•SLVS_1N
•SLVS_2P
•SLVS_2N
•SLVS_3P
•SLVS_3N
The HiSPi interface supports the following protocols: Streaming-S and Packetized-SP.
The streaming protocol conforms to a standard video application where each line of
active or intra-frame blanking provided by the sensor is transmitted at the same length.
The packetized protocol will transmit only the active data ignoring line-to-line and
frame-to-frame blanking data.
HiSPi Streaming Mode Protocol Layer
The protocol layer is positioned between the output data path of the sensor and the
physical layer. The main functions of the protocol layer are generating sync codes,
formatting pixel data, inserting horizontal/vertical blanking codes, and distributing
pixel data over defined data lanes.
The HiSPi interface can only be configured when the sensor is in standby. This includes
configuring the interface to transmit across 1, 2, or all 4 data lanes.
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
RAW12
D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 X X
RAW10
D7 D6 D5 D4 D3 D2 D1 D0 X X X X
RAW8
Cd
MT9F002/D Rev. 9, 1/16 EN 13 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
HiSPi Physical Layer
Protocol Fundamentals
Referring to Figure 9, it can be seen that a SYNC code is inserted in the serial data stream
prior to each line of image data. The streaming protocol will insert a SYNC code to
transmit each active data line and vertical blanking lines.
The packetized protocol will transmit a SYNC code to note the start and end of each row.
The packetized protocol uses sync a “Start of Frame” (SOF) sync code at the start of a
frame and a “Start of Line” (SOL) sync code at the start of a line within the frame. The
protocol will also transmit an “End of Frame” (EOF) at the end of a frame and an “End of
Line” (EOL) sync code at the end of a row within the frame
Figure 9: Steaming vs. Packetized Transmission
Note: See the High-Speed Serial Pixel (HiSPi)™ Protocol Specification V1.00.00 for HiSPi
details.
HiSPi Physical Layer
The HiSPi physical layer is partitioned into blocks of four data lanes and an associated
clock lane. Any reference to the PHY in the remainder of this document is referring to
this minimum building block.
The HiSPi PHY uses a low voltage serial differential output. The HiSPi PHY drivers use a
simple current steering driver scheme with two outputs that are complementary to each
other (VOA and VOB). It is intended that these drivers be attached to short-length 100
differential interconnect to a receiver with a 100 termination. CL represents the total
parasitic excess capacitance loading of the receiver and the interconnect.
There are two standards:
• Scalable Low Voltage Serial (SLVS) which has low amplitude and common-mode
voltage (VCM) but scalable using an external supply.
• High VCM scalable serial interface (HiVCM), which has larger scalable amplitude and a
high common-mode voltage.
MT9F002/D Rev. 9, 1/16 EN 14 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Comparison of SLVS and HiVCM
Here is a comparison of the differences between SLVS and HiVCM.
Notes: 1. These are nominal values
2. Power from load driving stage, digital/serializer logic (VDD_HiSPi) not included.
The HiSPi interface building block is a unidirectional differential serial interface with
four data and one double data rate (DDR) clock lanes. The four Data lanes are 90 degrees
out of phase with the Clock lanes. One clock for every four serial data lanes is provided
for phase alignment across multiple lanes. Figure 10 shows the configuration between
the HiSPi transmitter and the receiver.
Figure 10: HiSPi Transmitter and Receiver Interface Block Diagram
The PHY will serialize a 10-, 12-, 14- or 16-bit data word and transmit each bit of data
centered on a rising edge of the clock, the second on the falling edge of clock. Figure 11
shows bit transmission. In this example, the word is transmitted in order of MSB to LSB.
The receiver latches data at the rising and falling edge of the clock.
Table 4: SLVS and HiVCM Comparison
Parameter HiVCM SLVS
Typical Differential Amplitude1280mV 200mV
Typical Common Mode10.9V 200mV
Typical Power Consumption245mW 4mW
Transmission Distance Longer distance Short distance
LVDS FPGA Receiver
Compatible Yes No
A camera containing
the HiSPi transmitter
A host (DSP) containing
the HiSPi receiver
DATA_P
DATA_N
DATA2_P
DATA2_N
DATA3_P
DATA3_N
DATA4_P
DATA4_N
CLK_P
CLK_N
Tx
PHY0
Rx
PHY0
DATA_P
DATA_N
DATA2_P
DATA2_N
DATA3_P
DATA3_N
DATA4_P
DATA4_N
CLK_P
CLK_N
MT9F002/D Rev. 9, 1/16 EN 15 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Figure 11: Timing Diagram
DLL Timing Adjustment
The specification includes a DLL to compensate for differences in group delay for each
data lane. The DLL is connected to the clock lane and each data lane, which acts as a
control master for the output delay buffers. Once the DLL has gained phase lock, each
lane can be delayed in 1/8 unit interval (UI) steps. This additional delay allows the user
to increase the setup or hold time at the receiver circuits and can be used to compensate
for skew introduced in PCB design.
If the DLL timing adjustment is not required, the data and clock lane delay settings
should be set to a default code of 0x000 to reduce jitter, skew, and power dissipation.
Figure 12: Block Diagram of DLL Timing Adjustment
c
p
dn
….
….
MSB LSB
TxPost
dp
cn
1 UI
TxPre
delay
del0[2:0]
delay
del1[2:0]
delay delay
del3[2:0]
delay
del2[2:0]
data_lane0 data_lane1 clock _lane0 data_lane2 data_lane3
delclock[2:0]
MT9F002/D Rev. 9, 1/16 EN 16 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Figure 13: Delaying the clock_lane with Respect to data_lane
Figure 14: Delaying data_lane with Respect to the clock_lane
Note: See the High-Speed Serial Pixel (HiSPi)™ Physical Layer Specification V2.00.00 for details.
Parallel Pixel Data Interface
MT9F002 image data is read out in a progressive scan. Valid image data is surrounded by
horizontal blanking and vertical blanking, as shown in Figure 15. The amount of hori-
zontal blanking and vertical blanking is programmable; LV is HIGH during the shaded
region of the figure. FV timing is described in the “Output Data Timing (Parallel Pixel
Data Interface)”.
dataN (delN = 000)
cp (delclock = 000)
cp (delclock = 001)
cp (delclock = 010)
cp (de lclock = 011)
cp (delclock = 100)
cp (d elcloc k = 1 01)
c p (delclock = 110)
cp ( delclo ck =1 11 )
increasing delclock_[2:0] increases clock delay
1 UI
1 UI
tDLLSTEP
cp (delclock = 000)
dataN (delN = 000)
dataN(delN = 001)
dataNdelN = 010)
dataN(delN = 011)
dataN(delN = 100)
dataN(delN = 101)
dataN(delN = 110)
dataN(delN = 111)
increasing delN_[2:0] increases data delay
MT9F002/D Rev. 9, 1/16 EN 17 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Figure 15: Spatial Illustration of Image Readout
P0,0 P0,1 P0,2.....................................P0,n-1 P0,n
P1,0 P1,1 P1,2.....................................P1,n-1 P1,n
00 00 00 .................. 00 00 00
00 00 00 .................. 00 00 00
Pm-1,0 Pm-1,1.....................................Pm-1,n-1 Pm-1,n
Pm,0 Pm,1.....................................Pm,n-1 Pm,n
00 00 00 .................. 00 00 00
00 00 00 .................. 00 00 00
VALID IMAGE HORIZONTAL
BLANKING
00 00 00 .................. 00 00 00
00 00 00 .................. 00 00 00
00 00 00 .................. 00 00 00
00 00 00 .................. 00 00 00
00 00 00 ..................................... 00 00 00
00 00 00 ..................................... 00 00 00
00 00 00 ..................................... 00 00 00
00 00 00 ..................................... 00 00 00
VERTICAL BLANKING VERTICAL/HORIZONTAL
BLANKING
MT9F002/D Rev. 9, 1/16 EN 18 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Output Data Timing (Parallel Pixel Data Interface)
MT9F002 output data is synchronized with the PIXCLK output. When LV is HIGH, one
pixel value is output on the 12-bit DOUT output every PIXCLK period. The pixel clock
frequency can be determined based on the sensor's master input clock and internal PLL
configuration. The rising edges on the PIXCLK signal occurs one-half of a pixel clock
period after transitions on LV, FV, and DOUT (see Figure 16). This allows PIXCLK to be
used as a clock to sample the data. PIXCLK is continuously enabled, even during the
blanking period. The MT9F002 can be programmed to delay the PIXCLK edge relative to
the DOUT transitions. This can be achieved by programming the corresponding bits in
the row_speed register.
Figure 16: Pixel Data Timing Example
Figure 17: Frame Timing and FV/LV Signals
The sensor timing is shown in terms of pixel clock cycles (see Figure 16 on page 18). The
default settings for the on-chip PLL generate a pixel array clock (vt_pix_clk) of 110 MHz
and an output clock (op_pix_clk) of 55 MHz given a 24 MHz input clock to the MT9F002.
Equations for calculating the frame rate are given in “Frame Rate Control” on page 48.
P0 [11:0] P1 [11:0] P2 [11:0] P3 [11:0] P4 [11:0] P5 Pn-2 Pn-1 [11:0] Pn [11:0]
Valid Image DataBlanking Blanking
LV
PIXCLK
DOUT[11:0]
FRAME_VALID
LINE_VALID
PA Q A A PQ
V
MT9F002/D Rev. 9, 1/16 EN 19 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Comparison of SLVS and HiVCM
Table 5: Common Sensor Readout Modes
Key Readout
Modes Output Resolution Aspect
Ratio DFOV: 7.67
mm (%) Subsampling
Mode Frame
Rate ADC Effective
Bit-Depth Data Rate
(Mbps/Lane)
14M Capture 4384H x 3288V (4:3) 100 n/a 13.7 12 660
1080p
+20% EIS (3Mp)
Video
2304H x 1296V (16:9) 96 x: Bin2
y: Bin2
60 10 550
2304H x 1296V (16:9) 96 x: Bin2
y: Bin2
30 10 275
720p
+20%EIS (1.3Mp)
Video
1536H x 864V (16:9) 64 x: Bin2
y: Bin2
60 10 550
1536H x 864V (16:9) 64 x: Bin2
y: Bin2
30 10 275
VGA Video (High
Quality)
1096H x 822V (4:3) 100 x: Skip2Bin2
y: Bin4
60 10 550
EVF1 - Preview
(Low Power)
1096H x 822V (4:3) 100 x: Skip2Bin2
y: Bin4
30 10 275
EVF2 - Preview
(Low Power)
1152H x 648V (16:9) 96 x: Skip2Bin2
y: Bin4
30 10 275
MT9F002/D Rev. 9, 1/16 EN 20 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Two-Wire Serial Register Interface
Two-Wire Serial Register Interface
The two-wire serial interface bus enables read/write access to control and status regis-
ters within the MT9F002. The interface protocol uses a master/slave model in which a
master controls one or more slave devices. The sensor acts as a slave device. The master
generates a clock (SCLK) that is an input to the sensor and is used to synchronize trans-
fers. Data is transferred between the master and the slave on a bidirectional signal
(SDATA). SDATA is pulled up to VDD_IO off-chip by a 1.5k resistor. Either the slave or
master device can drive SDATA LOW—the interface protocol determines which device is
allowed to drive SDATA at any given time.
The protocols described in the two-wire serial interface specification allow the slave
device to drive SCLK LOW; the MT9F002 uses SCLK as an input only and therefore never
drives it LOW.
Protocol
Data transfers on the two-wire serial interface bus are performed by a sequence of low-
level protocol elements:
1. a (repeated) start condition
2. a slave address/data direction byte
3. an (a no-) acknowledge bit
4. a message byte
5. a stop condition
The bus is idle when both SCLK and SDATA are HIGH. Control of the bus is initiated with a
start condition, and the bus is released with a stop condition. Only the master can
generate the start and stop conditions.
Start Condition
A start condition is defined as a HIGH-to-LOW transition on SDATA while SCLK is HIGH.
At the end of a transfer, the master can generate a start condition without previously
generating a stop condition; this is known as a “repeated start” or “restart” condition.
Stop Condition
A stop condition is defined as a LOW-to-HIGH transition on SDATA while SCLK is HIGH.
Data Transfer
Data is transferred serially, 8 bits at a time, with the MSB transmitted first. Each byte of
data is followed by an acknowledge bit or a no-acknowledge bit. This data transfer
mechanism is used for both the slave address/data direction byte and for message bytes.
One data bit is transferred during each SCLK clock period. SDATA can change when SCLK
is LOW and must be stable while SCLK is HIGH.
Slave Address/Data Direction Byte
Bits [7:1] of this byte represent the device slave address and bit [0] indicates the data
transfer direction. A “0” in bit [0] indicates a WRITE, and a “1” indicates a READ. The
default slave addresses used by the MT9F002 sensor are 0x20 (write address) and 0x21
(read address). Alternative slave addresses of 0x30 (write address) and 0x31 (read
address) can be selected by enabling and asserting the SADDR signal through the GPI
pin.
MT9F002/D Rev. 9, 1/16 EN 21 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Two-Wire Serial Register Interface
Alternate slave addresses can also be programmed through the i2c_ids register
(R0x31FC-31FD). Note that this register needs to be unlocked through reset_regis-
ter_lock_reg (R0x301A[3]) before is can be written to..
Message Byte
Message bytes are used for sending register addresses and register write data to the slave
device and for retrieving register read data.
Acknowledge Bit
Each 8-bit data transfer is followed by an acknowledge bit or a no-acknowledge bit in the
SCLK clock period following the data transfer. The transmitter (which is the master when
writing, or the slave when reading) releases SDATA. The receiver indicates an acknowl-
edge bit by driving SDATA LOW. As for data transfers, SDATA can change when SCLK is
LOW and must be stable while SCLK is HIGH.
No-Acknowledge Bit
The no-acknowledge bit is generated when the receiver does not drive SDATA LOW
during the SCLK clock period following a data transfer. A no-acknowledge bit is used to
terminate a read sequence.
Typical Sequence
A typical READ or WRITE sequence begins by the master generating a start condition on
the bus. After the start condition, the master sends the 8-bit slave address/data direction
byte. The last bit indicates whether the request is for a read or a write, where a “0” indi-
cates a write and a “1” indicates a read. If the address matches the address of the slave
device, the slave device acknowledges receipt of the address by generating an acknowl-
edge bit on the bus.
If the request was a WRITE, the master then transfers the 16-bit register address to which
the WRITE should take place. This transfer takes place as two 8-bit sequences and the
slave sends an acknowledge bit after each sequence to indicate that the byte has been
received. The master then transfers the data as an 8-bit sequence; the slave sends an
acknowledge bit at the end of the sequence. The master stops writing by generating a
(re)start or stop condition.
If the request was a READ, the master sends the 8-bit write slave address/data direction
byte and 16-bit register address, the same way as with a WRITE request. The master then
generates a (re)start condition and the 8-bit read slave address/data direction byte, and
clocks out the register data, eight bits at a time. The master generates an acknowledge
bit after each 8-bit transfer. The slave’s internal register address is automatically incre-
mented after every 8 bits are transferred. The data transfer is stopped when the master
sends a no-acknowledge bit.
MT9F002/D Rev. 9, 1/16 EN 22 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Two-Wire Serial Register Interface
Single READ From Random Location
This sequence (Figure 18) starts with a dummy WRITE to the 16-bit address that is to be
used for the READ. The master terminates the WRITE by generating a restart condition.
The master then sends the 8-bit read slave address/data direction byte and clocks out
one byte of register data. The master terminates the READ by generating a no-acknowl-
edge bit followed by a stop condition. Figure 18 shows how the internal register address
maintained by the MT9F002 is loaded and incremented as the sequence proceeds.
Figure 18: Single READ From Random Location
Single READ From Current Location
This sequence (Figure 19) performs a read using the current value of the MT9F002
internal register address. The master terminates the READ by generating a no-acknowl-
edge bit followed by a stop condition. The figure shows two independent READ
sequences.
Figure 19: Single READ From Current Location
S = start condition
P = stop condition
Sr = restart condition
A = acknowledge
A = no-acknowledge
slave to master
master to slave
Slave Address 0
S A Reg Address[15:8] A Reg Address[7:0] Slave Address AA 1Sr Read Data P
Previous Reg Address, N Reg Address, M M+1
A
Slave Address 1S A Read Data Slave Address A1SP Read Data P
Previous Reg Address, N Reg Address, N+1 N+2
AA
MT9F002/D Rev. 9, 1/16 EN 23 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Two-Wire Serial Register Interface
Sequential READ, Start From Random Location
This sequence (Figure 20) starts in the same way as the single READ from random loca-
tion (Figure 18). Instead of generating a no-acknowledge bit after the first byte of data
has been transferred, the master generates an acknowledge bit and continues to
perform byte READs until “L” bytes have been read.
Figure 20: Sequential READ, Start From Random Location
Sequential READ, Start From Current Location
This sequence (Figure 21) starts in the same way as the single READ from current loca-
tion (Figure 19 on page 22). Instead of generating a no-acknowledge bit after the first
byte of data has been transferred, the master generates an acknowledge bit and
continues to perform byte READs until “L” bytes have been read.
Figure 21: Sequential READ, Start From Current Location
Single WRITE to Random Location
This sequence (Figure 22) begins with the master generating a start condition. The slave
address/data direction byte signals a WRITE and is followed by the HIGH then LOW
bytes of the register address that is to be written. The master follows this with the byte of
write data. The WRITE is terminated by the master generating a stop condition.
Figure 22: Single WRITE to Random Location
Slave Address 0
S Sr
AReg Address[15:8]
Read Data Read Data
AReg Address[7:0] ARead DataSlave Address
Previous Reg Address, N Reg Address, M
M+1 M+2
M+1
M+3
A1
Read Data Read Data
M+L-2 M+L-1 M+L
AP
A
AAA
Read Data Read Data
Previous Reg Address, N N+1 N+2 N+L-1 N+L
Read DataSlave Address A1 Read Data A PS A A A
Slave Address 0
SAReg Address[15:8] AReg Address[7:0] AP
Previous Reg Address, N Reg Address, M M+1
A
A
Write Data
MT9F002/D Rev. 9, 1/16 EN 24 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Two-Wire Serial Register Interface
Sequential WRITE, Start at Random Location
This sequence (Figure 23) starts in the same way as the single WRITE to random location
(Figure 22 on page 23). Instead of generating a no-acknowledge bit after the first byte of
data has been transferred, the master generates an acknowledge bit and continues to
perform byte WRITEs until “L” bytes have been written. The WRITE is terminated by the
master generating a stop condition.
Figure 23: Sequential WRITE, Start at Random Location
Slave Address 0
SAReg Address[15:8]
A
AReg Address[7:0] A
Previous Reg Address, N Reg Address, M
M+1 M+2
M+1
M+3
A
AA
M+L-2 M+L-1 M+L
A
AP
Write Data
Write Data Write Data Write DataWrite Data
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Programming Restrictions
MT9F002/D Rev. 9, 1/16 EN 25 ©Semiconductor Components Industries, LLC,2016.
Programming Restrictions
The following sections list programming rules that must be adhered to for correct opera-
tion of the MT9F002. Refer to the MT9F002 Register Reference document for register
programming details.
X Address Restrictions
The minimum column address available for the sensor is 24. The maximum value is
4647.
Effect of Scaler on Legal Range of Output Sizes
When the scaler is enabled, it is necessary to adjust the values of x_output_size and
y_output_size to match the image size generated by the scaler. The MT9F002 will
operate incorrectly if the x_output_size and y_output_size are significantly larger than
the output image. To understand the reason for this, consider the situation where the
sensor is operating at full resolution and the scaler is enabled with a scaling factor of 32
(half the number of pixels in each direction). This situation is shown in Figure 24.
Figure 24: Effect of Limiter on the Data Path
In Figure 24, three different stages in the data path (see “Timing Specifications” on
page 68) are shown. The first stage is the output of the sensor core. The core is running at
full resolution and x_output_size is set to match the active array size. The LV signal is
asserted once per row and remains asserted for N pixel times. The PIXEL_VALID signal
toggles with the same timing as LV, indicating that all pixels in the row are valid.
The second stage is the output of the scaler, when the scaler is set to reduce the image
size by one-half in each dimension. The effect of the scaler is to combine groups of
pixels. Therefore, the row time remains the same, but only half the pixels out of the
scaler are valid. This is signaled by transitions in PIXEL_VALID. Overall, PIXEL_VALID is
asserted for (N/2) pixel times per row.
Table 6: Definitions for Programming Rules
Name Definition
xskip xskip = 1 if x_odd_inc = 1; xskip = 2 if x_odd_inc = 3; xskip = 4 if x_odd_inc = 7
yskip yskip = 1 if y_odd_inc = 1; yskip = 2 if y_odd_inc = 3; yskip = 4 if y_odd_inc = 7;
yskip = 8 if y_odd_inc = 15; yskip = 16 if y_odd_inc = 31; yskip = 32 if y_odd_inc = 63
Core output: full resolution, x_output_size = x_addr_end - x_addr_start + 1
LINE_VALID
Scaler output: scaled to half size
LINE_VALID
PIXEL_VALID
Limiter output: scaled to half size, x_output_size = x_addr_end - x_addr_start + 1
LINE_VALID
PIXEL_VALID
PIXEL_VALID
MT9F002/D Rev. 9, 1/16 EN 26 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Programming Restrictions
The third stage is the output of the limiter when the x_output_size is still set to match the
active array size. Because the scaler has reduced the amount of valid pixel data without
reducing the row time, the limiter attempts to pad the row with (N/2) additional pixels. If
this has the effect of extending LV across the whole of the horizontal blanking time, the
MT9F002 will cease to generate output frames.
A correct configuration is shown in Figure 25, in addition to showing the x_output_size
reduced to match the output size of the scaler. In this configuration, the output of the
limiter does not extend LV.
Figure 25 also shows the effect of the output FIFO, which forms the final stage in the data
path. The output FIFO merges the intermittent pixel data back into a contiguous stream.
Although not shown in this example, the output FIFO is also capable of operating with
an output clock that is at a different frequency from its input clock.
Figure 25: Timing of Data Path
Core output: full resolution, x_output_size = x_addr_end - x_addr_start + 1
LINE_VALID
Scaler output: scaled to half size
LINE_VALID
PIXEL_VALID
Limiter output: scaled to half size, x_output_size = (x_addr_end - x_addr_start + 1)/2
PIXEL_VALID
LINE_VALID
PIXEL_VALID
Output FIFO: scaled to half size, x_output_size = (x_addr_end - x_addr_start + 1)/2
LINE_VALID
PIXEL_VALID
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Programming Restrictions
MT9F002/D Rev. 9, 1/16 EN 27 ©Semiconductor Components Industries, LLC,2016.
Output Data Timing
The output FIFO acts as a boundary between two clock domains. Data is written to the
FIFO in the VT (video timing) clock domain. Data is read out of the FIFO in the OP
(output) clock domain.
When the scaler is disabled, the data rate in the VT clock domain is constant and
uniform during the active period of each pixel array row readout. When the scaler is
enabled, the data rate in the VT clock domain becomes intermittent, corresponding to
the data reduction performed by the scaler.
A key constraint when configuring the clock for the output FIFO is that the frame rate
out of the FIFO must exactly match the frame rate into the FIFO. When the scaler is
disabled, this constraint can be met by imposing the rule that the row time on the serial
data stream must be greater than or equal to the row time at the pixel array. The row time
on the serial data stream is calculated from the x_output_size and the data_format (8, 10,
or 12 bits per pixel), and must include the time taken in the serial data stream for start of
frame/row, end of row/frame and checksum symbols.
Caution If this constraint is not met, the FIFO will either underrun or overrun. FIFO underrun or over-
run is a fatal error condition that is signaled through the data path_status register
(R0x306A).
Changing Registers While Streaming
The following registers should only be reprogrammed while the sensor is in software
standby:
•vt_pix_clk_div
vt_sys_clk_div
pre_pll_clk_div
pll_multiplier
op_pix_clk_div
•op_sys_clk_div
Programming Restrictions When Using Global Reset
Interactions between the registers that control the global reset imposes some program-
ming restrictions on the way in which they are used; these are discussed in "Global
Reset" on page 55.
MT9F002/D Rev. 9, 1/16 EN 28 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
Control of the Signal Interface
This section describes the operation of the signal interface in all functional modes.
Serial Register Interface
The serial register interface uses these signals:
•S
CLK
•SDATA
•SADDR (through the GPI pin)
SCLK is an input-only signal and must always be driven to a valid logic level for correct
operation; if the driving device can place this signal in High-Z, an external pull-up
resistor should be connected on this signal.
SDATA is a bidirectional signal. An external pull-up resistor should be connected on this
signal.
SADDR is a signal that can be optionally enabled and controlled by a GPI pin to select an
alternate slave address. These slave addresses can also be programmed through
R0x31FC.
This interface is described in detail in “Two-Wire Serial Register Interface” on page 20.
Parallel Pixel Data Interface
The parallel pixel data interface uses these output-only signals:
•FV
•LV
•PIXCLK
•D
OUT[11:0]
The parallel pixel data interface is disabled by default at power up and after reset. It can
be enabled by programming R0x301A. Table 8 on page 29 shows the recommended
settings.
When the parallel pixel data interface is in use, the serial data output signals can be left
unconnected. Set reset_register[12] to disable the serializer while in parallel output
mode.
Output Enable Control
When the parallel pixel data interface is enabled, its signals can be switched asynchro-
nously between the driven and High-Z under pin or register control, as shown in Table 7.
Selection of a pin to use for the OE_N function is described in "General Purpose Inputs"
on page 32.
Table 7: Output Enable Control
OE_N Pin Drive Signals R0x301A–B[6] Description
Disabled 0 Interface High-Z
Disabled 1 Interface driven
1 0 Interface High-Z
X 1 Interface driven
0 X Interface driven
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
MT9F002/D Rev. 9, 1/16 EN 29 ©Semiconductor Components Industries, LLC,2016.
Configuration of the Pixel Data Interface
Fields in R0x301A are used to configure the operation of the pixel data interface. The
supported combinations are shown in Table 8.
Table 8: Configuration of the Pixel Data Interface
Serializer
Disable
R0x301
A–B[12]
Parallel
Enable
R0x301A–B[7]
Standby
End-of-Frame
R0x301A–B[4] Description
00 1Power up default.
Serial pixel data interface and its clocks are enabled. Transitions to soft
standby are synchronized to the end of frames on the serial pixel data
interface.
1 1 0 Parallel pixel data interface, sensor core data output. Serial pixel data
interface and its clocks disabled to save power. Transitions to soft standby
are synchronized to the end of the current row readout on the parallel pixel
data interface.
1 1 1 Parallel pixel data interface, sensor core data output. Serial pixel data
interface and its clocks disabled to save power. Transitions to soft standby
are synchronized to the end of frames in the parallel pixel data interface.
MT9F002/D Rev. 9, 1/16 EN 30 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
System States
The system states of the MT9F002 are represented as a state diagram in Figure 26 and
described in subsequent sections. The effect of RESET_BAR on the system state and the
configuration of the PLL in the different states are shown in Table 9 on page 31.
The sensor’s operation is broken down into three separate states: hardware standby,
software standby, and streaming. The transition between these states might take a
certain amount of clock cycles as outlined in Table 9.
Figure 26: MT9F002 System States
Powered Off
Streaming
Powered On
POR =1
RESET _BAR transitions 1 -> 0
(asynchronous from any state )
Initialization Timeout
Two-wire Serial
Interface Write
mode_select = 0
PLL Lock
PLL locked
Software reset initiated
(synchronous from any state)
Wait for Frame
End
Software
Standby
Two-wire Serial
Interface Write
mode_select = 1
Two-wire Serial
Interface Write
software_reset = 1
Internal
Initialization
Hardware
Standby
2700 EXTCLK
Cycles
RESET_BAR = 0
POR = 0
RESET_BAR = 1
PLL not locked
POR active
(only if POR is
on sensor)
Power supplies turned off
(asychronous from any state)
Frame in
progress
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
MT9F002/D Rev. 9, 1/16 EN 31 ©Semiconductor Components Industries, LLC,2016.
Note: VCO = voltage-controlled oscillator.
Power-On Reset Sequence
When power is applied to the MT9F002, it enters a low-power hardware standby state.
Exit from this state is controlled by the later of two events:
1. The negation of the RESET_BAR input.
2. A timeout of the internal power-on reset circuit.
It is possible to hold RESET_BAR permanently de-asserted and rely upon the internal
power-on reset circuit.
When RESET_BAR is asserted it asynchronously resets the sensor, truncating any frame
that is in progress.
When the sensor leaves the hardware standby state it performs an internal initialization
sequence that takes 2700 EXTCLK cycles. After this, it enters a low-power software
standby state. While the initialization sequence is in progress, the MT9F002 will not
respond to READ transactions on its two-wire serial interface. Therefore, a method to
determine when the initialization sequence has completed is to poll a sensor register; for
example, R0x0000. While the initialization sequence is in progress, the sensor will not
respond to its device address and READs from the sensor will result in a NACK on the
two-wire serial interface bus. When the sequence has completed, READs will return the
operational value for the register (0x2800 if R0x0000 is read).
When the sensor leaves software standby mode and enables the VCO, an internal delay
will keep the PLL disconnected for up to 1ms so that the PLL can lock. The VCO lock time
is 1ms (minimum).
Soft Reset Sequence
The MT9F002 can be reset under software control by writing “1” to software_reset
(R0x0103). A software reset asynchronously resets the sensor, truncating any frame that
is in progress. The sensor starts the internal initialization sequence, while the PLL and
analog blocks are turned off. At this point, the behavior is exactly the same as for the
power-on reset sequence.
Table 9: RESET_BAR and PLL in System States
State EXTCLKs PLL
Powered off x
VCO powered down
POR active x
Hardware standby 0
Internal initialization
1
Software standby
PLL Lock VCO powering up and locking, PLL output bypassed
Streaming VCO running, PLL output active
Wait for frame end
MT9F002/D Rev. 9, 1/16 EN 32 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
Signal State During Reset
Table 10 on page 32 shows the state of the signal interface during hardware standby
(RESET_BAR asserted) and the default state during software standby. After exit from
hardware standby and before any registers within the sensor have been changed from
their default power-up values.
General Purpose Inputs
The MT9F002 provides four general purpose inputs. After reset, the input pads associ-
ated with these signals are powered down by default, allowing the pads to be left discon-
nected/floating.
The general purpose inputs are enabled by setting reset_register[8] (R0x301A). Once
enabled, all four inputs must be driven to valid logic levels by external signals. The state
of the general purpose inputs can be read through gpi_status[3:0] (R0x3026).
In addition, each of the following functions can be associated with none, one, or more of
the general purpose inputs so that the function can be directly controlled by a hardware
input:
Output enable (see “Output Enable Control” on page 28)
Trigger/VD (slave mode) - see the sections below
•Standby functions
•S
ADDR selection (see “Serial Register Interface” on page 28)
Table 10: Signal State During Reset
Pad Name Pad Type Hardware Standby Software Standby
EXTCLK
Input
Enabled. Must be driven to a valid logic level.
RESET_BAR
(XSHUTDOWN)
GPI[3:0] Powered down. Can be left disconnected/floating.
TEST Enabled. Must be driven to a logic 0.
SCLK Enabled. Must be pulled up or driven to a valid logic level.
SDATA I/O Enabled as an input. Must be pulled up or driven to a valid logic level.
LINE_VALID
Output
High-Z. Can be left disconnected or floating.
FRAME_VALID
DOUT[11:0]
PIXCLK
SLVS_0P
SLVS_0N
SLVS_1P
SLVS_1N
SLVS_2P
SLVS_2N
SLVS_3P
SLVS_3N
SLVS_CP
SLVS_CN
FLASH High-Z. Logic 0.
SHUTTER
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
MT9F002/D Rev. 9, 1/16 EN 33 ©Semiconductor Components Industries, LLC,2016.
The gpi_status register is used to associate a function with a general purpose input.
Streaming/Standby Control
The MT9F002 can be switched between its soft standby and streaming states under pin
or register control, as shown in Table 11. Selection of a pin to use for the STANDBY func-
tion is described in “General Purpose Inputs” on page 32. The state diagram for transi-
tions between soft standby and streaming states is shown in Figure 26 on page 30.
Trigger Control
When the global reset feature is in use, the trigger for the sequence can be initiated
either under pin or register control, as shown in Table 12. Selection of a pin to use for the
TRIGGER function is described in “General Purpose Inputs” on page 32. In slave mode,
the GPI pin also serves as VD signal input.
Table 11: Streaming/STANDBY
STANDBY Streaming R0x301A–B[2] Description
Disabled 0 Soft standby
Disabled 1 Streaming
X0 Soft standby
0 1 Streaming
1X Soft standby
Table 12: Trigger Control
Trigger Global Trigger R0x3160–1[0] Description
Disabled 0 Idle
Disabled 1 Trigger
00 Idle
X 1 Trigger
1 X Trigger
MT9F002/D Rev. 9, 1/16 EN 34 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
Clocking
The sensor contains a phase-locked loop (PLL) for timing generation and control. The
PLL contains a prescaler to divide the input clock applied on EXTCLK, a VCO to multiply
the prescaler output, and a set of dividers to generate the output clocks. The PLL struc-
ture is shown in Figure 27
Figure 27: Clocking Configuration
f PFD = f in / (n + 1), 2 MHz f PFD 24 MHz (EQ 1)
f VCO = f in *m/ ( n + 1), 384 MHz f VCO768 MHz (EQ 2)
Figure 27 shows the different clocks and (in courier font) the names of the registers that
contain or are used to control their values. Figure 27 also shows the default setting for
each divider/multiplier control register and the range of legal values for each divider/
multiplier control register. Default setup gives a physical 110 MHz internal clock for an
input clock of 24 MHz. The maximum is 120 MHz.
Table 13: PLL Parameter Range
Parameter Symbol Min Max Unit
External Input Frequency fin 2 64 MHz
PLL Input (PFD) Frequency 2 24 MHz
VCO Clock Frequency fvco 384 768 MHz
pre _ pll _clk _div
(n)
2 ( 1 - 64 )
pll_ multiplier
(m)
64 (Even Values: 32-384 )
( Odd Values: 17-191 )
EXTCLK Pre PLL
Divider
PLL
Multiplier
(m) op sys clk
Divider
clk_pixel
Divider
External input clock
ext_clk_freq_mhz
op pix
clk
Divider
op _pix _clk _div
12 (8, 10, 12)
row _ speed [2 : 0 ]
1 ( 1 , 2 , 4 )
PLL output clock
vt sys clk
Divider
1(1, 2, 4, 6, 8)
vt pix
clk
Divider
clk _op
Divider
3 (2, 3, 4, 5, 6,7, 8)
row _speed [10 :8 ]
1 ( 1 , 2 , 4 )
PLL input clock
pll_ip_clk_freq PLL internal VCO
frequency
vt_pix_clk_div
clk_pixel
vt_pix_clk
vt_sys_clk
op_sys_clk
op_pix_clk
clk_op
1(1, 2, 4, 6, 8)
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
MT9F002/D Rev. 9, 1/16 EN 35 ©Semiconductor Components Industries, LLC,2016.
From the diagram, the clock frequencies can be calculated as follows:
Note: Virtual pixel clock is used as the basis for frame timing equations.
(EQ 3)
Internal pixel clock used to readout the pixel array:
(EQ 4)
External pixel clock used to output the data:
(EQ 5)
Serial output clock:
(EQ 6)
The parameter limit register space contains registers that declare the minimum and
maximum allowable values for:
The frequency allowable on each clock
The divisors that are used to control each clock.
The following factors determine what are valid values, or combinations of valid values,
for the divider/multiplier control registers:
The minimum/maximum frequency limits for the associated clock must be met:
pll_ip_clk_freq must be in the range 2-24 MHz. Lower frequencies are preferred.
PLL internal VCO frequency must be in the range 384-768 MHz.
The minimum/maximum value for the divider/multiplier must be met:
Range for pre_pll_clk_div: 1-64.
clk_op must never run faster than clk_pixel to ensure that the output data stream is
contiguous.
When the serial interface is used the clk_op divider cannot be used; row_speed[10:8]
must equal 1.
The value of op_sys_clk_div must match the bit-depth of the image when using serial
interface. R0x0112-3 controls whether the pixel data interface will generate 12, 10, or 8
bits per pixel. When the pixel data interface is generating 8 bits per-pixel, op_pix_-
clk_div must be programmed with the value 8. When the pixel data interface is gener-
ating 10 bits per pixel, op_pix_clk_div must be programmed with the value 10. And
when the pixel data interface is generating 12 bits per pixel, op_pix_clk_div must be
programmed with the value 12. This is not required when using the parallel interface.
Although the PLL VCO input frequency range is advertised as 2-24 MHz, superior
performance (better PLL stability) is obtained by keeping the VCO input frequency as
high as possible.
The usage of the output clocks is shown below:
vt_pix_clk ext_clk_freq_mhz pll_multiplier 1 shift_vt_pix_clk_div+
pre_pll_clk_div vt_sys_clk_divvt_pix_clk_div
--------------------------------------------------------------------------------------------------------------------------------------------------------- 24 MHz 165 2
616
--------------------------------------------220 MHz===
clk_pixel ext_clk_freq_mhz pll_multiplier 1 shift_vt_pix_clk_div+
pre_pll_clk_div vt_sys_clk_divvt_pix_clk_div2row_speed[2:0]
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- 24 MHz 165 2
61621
--------------------------------------------110 MHz===
clk_op ext_clk_freq_mhz pll_multiplier
pre_pll_clk_div op_sys_clk_divop_pix_clk_divrow_speed[10:8]
-----------------------------------------------------------------------------------------------------------------------------------------------------------------------------24 MHz 165
61121
-----------------------------------55 MHz===
op_sys_clk_freq_mhz ext_clk_freq_mhz pll_multiplier
pre_pll_clk_div op_sys_clk_div
-----------------------------------------------------------------------------------24 MHx 165
61
-----------------------------------660 MHz===
MT9F002/D Rev. 9, 1/16 EN 36 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Control of the Signal Interface
clk_pixel is used by the sensor core to control the timing of the pixel array. The sensor
core produces two 10-bit pixels each clk_pixel period. The line length
(line_length_pck) and fine integration time (fine_integration_time) are controlled in
increments of half of the clk_pixel period.
clk_op is used to load parallel pixel data from the output FIFO. The output FIFO
generates one pixel each clk_op period. This clock also equals the output PIXCLK.
Master clock frequency corresponds to vt_pix_clk/2.
Serial clock (op_sys_clk) used for the serial output interface.
Programming the PLL Divisors
The PLL divisors must be programmed while the MT9F002 is in the software standby
state. After programming the divisors, wait for the VCO lock time before enabling the
PLL. The PLL is enabled by entering the streaming state.
An external timer will need to delay the entrance of the streaming mode by 1 millisecond
so that the PLL can lock.
The effect of programming the PLL divisors while the MT9F002 is in the streaming state
is undefined.
Clock Control
The MT9F002 uses an aggressive clock-gating methodology to reduce power consump-
tion. The clocked logic is divided into a number of separate domains, each of which is
only clocked when required.
When the MT9F002 enters a low-power state, almost all of the internal clocks are
stopped. The only exception is that a small amount of logic is clocked so that the two-
wire serial interface continues to respond to READ and WRITE requests.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Features
MT9F002/D Rev. 9, 1/16 EN 37 ©Semiconductor Components Industries, LLC,2016.
Features
Scaler
The MT9F002 supports scaling capability. Scaling is a “zoom out” operation to reduce
the size of the output image while covering the same extent as the original image. That
is, low resolution images can be generated with full field-of-view. Each scaled output
pixel is calculated by taking a weighted average of a group input pixels which is
composed of neighboring pixels. The input and output of the scaler is in Bayer format.
When compared to skipping, scaling is advantageous because it uses all pixel values to
calculate the output image which helps avoid aliasing. Also, it is also more convenient
than binning because the scale factor varies smoothly and the user is not limited to
certain ratios of size reduction.
The MT9F002 sensor is capable of horizontal scaling and full (horizontal and vertical)
scaling.
The scaling factor is programmable in 1/16 steps and is determined by.
(EQ 7)
scale_n is fixed at 16.
scale_m is adjustable with R0x0404
Legal values for m are 16 through 128. The user has the ability to scale from
1:1 (m = 16) to 1:8 (m = 128).
Scaler Example
When horizontal and vertical scaling is enabled for a 1:2 scale factor, an image is
reduced by half in both the horizontal and vertical directions. This results in an
output image that is one-fourth of the original image size. This can be achieved with
the following register settings:
R0x0400 = 0x0002 // horizontal and vertical scaling mode
R0x0402 = 0x0020 // scale factor m = 32
Shading Correction
Lenses tend to produce images whose brightness is significantly attenuated near the
edges. There are also other factors causing color plane nonuniformity in images
captured by image sensors. The cumulative result of all these factors is known as image
shading. The MT9F002 has an embedded shading correction module that can be
programmed to counter the shading effects on each individual Red, GreenB, GreenR,
and Blue color signal.
ScaleFactor = scale_n
scale_m
--------------------- = 16
scale_m
---------------------
MT9F002/D Rev. 9, 1/16 EN 38 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Features
The Correction Function
Color-dependent solutions are calibrated using the sensor, lens system and an image of
an evenly illuminated, featureless gray calibration field. From the resulting image,
register values for the color correction function (coefficients) can be derived.
The correction functions can then be applied to each pixel value to equalize the
response across the image as follows:
(EQ 8)
where P are the pixel values and f is the color dependent correction functions for each
color channel.
Each function includes a set of color-dependent coefficients defined by registers
R0x3600–3726. The function's origin is the center point of the function used in the calcu-
lation of the coefficients. Using an origin near the central point of symmetry of the
sensor response provides the best results. The center point of the function is determined
by ORIGIN_C (R0x3782) and ORIGIN_R (R0x3784) and can be used to counter an offset
in the system lens from the center of the sensor array.
Pcorrected row, col= Psensor(row,col) * f(row,col)
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 39 ©Semiconductor Components Industries, LLC,2016.
Sensor Readout Configuration
Image Acquisition Modes
The MT9F002 supports two image acquisition modes:
1. Electronic rolling shutter (ERS) mode
This is the normal mode of operation. When the MT9F002 is streaming; it generates
frames at a fixed rate, and each frame is integrated (exposed) using the ERS. When the
ERS is in use, timing and control logic within the sensor sequences through the rows
of the array, resetting and then reading each row in turn. In the time interval between
resetting a row and subsequently reading that row, the pixels in the row integrate inci-
dent light. The integration (exposure) time is controlled by varying the time between
row reset and row readout. For each row in a frame, the time between row reset and
row readout is fixed, leading to a uniform integration time across the frame. When the
integration time is changed (by using the two-wire serial interface to change register
settings), the timing and control logic controls the transition from old to new integra-
tion time in such a way that the stream of output frames from the MT9F002 switches
cleanly from the old integration time to the new while only generating frames with
uniform integration. See “Changes to Integration Time” in the MT9F002 Register Ref-
erence.
2. Global reset mode
This mode can be used to acquire a single image at the current resolution. In this
mode, the end point of the pixel integration time is controlled by an external electro-
mechanical shutter, and the MT9F002 provides control signals to interface to that
shutter. The operation of this mode is described in detail in "Global Reset" on page 55.
The benefit of using an external electromechanical shutter is that it eliminates the visual
artifacts associated with ERS operation. Visual artifacts arise in ERS operation, particu-
larly at low frame rates, because an ERS image effectively integrates each row of the pixel
array at a different point in time.
Window Control
The sequencing of the pixel array is controlled by the x_addr_start, y_addr_start, x_ad-
dr_end, and y_addr_end registers. For both parallel and serial HiSPi interfaces, the
output image size is controlled by the x_output_size and y_output_size registers.
Pixel Border
The default settings of the sensor provide a 4608H x3288V image. A border of up to
8 pixels (4 in binning) on each edge can be enabled by reprogramming the x_addr_start,
y_addr_start, x_addr_end, y_addr_end, x_output_size, and y_output_size registers
accordingly. This provides a total active pixel array of 4640H x 3320V including border
pixels.
MT9F002/D Rev. 9, 1/16 EN 40 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
Readout Modes
Horizontal Mirror
When the horizontal_mirror bit is set in the image_orientation register, the order of pixel
readout within a row is reversed, so that readout starts from x_addr_end and ends at
x_addr_start. Figure 28 shows a sequence of 6 pixels being read out with horizon-
tal_mirror = 0 and horizontal_mirror = 1. Changing horizontal_mirror causes the Bayer
order of the output image to change; the new Bayer order is reflected in the value of the
pixel_order register.
Figure 28: Effect of Horizontal Mirror on Readout Order
To enable image horizontal mirror mode, set register bit R0x3040[14]=1.
0 = Normal readout
1 = Readout is mirrored horizontally so that the column specified by x_addr_end_ is
read out of the sensor first.
Vertical Flip
When the vertical_flip bit is set in the image_orientation register, the order in which
pixel rows are read out is reversed, so that row readout starts from y_addr_end and ends
at y_addr_start. Figure 29 shows a sequence of 6 rows being read out with
vertical_flip = 0 and vertical_flip = 1. Changing vertical_flip causes the Bayer order of the
output image to change; the new Bayer order is reflected in the value of the pixel_order
register.
Figure 29: Effect of Vertical Flip on Readout Order
To enable image vertical flip mode, set register bit R0x3040[15]=1.
0 = Normal readout
1 = Readout is flipped vertically so that the row specified by y_addr_end_ is read out of
the sensor first.
G0[11:0] R0[11:0] G1[11:0] R1[11:0] G2[11:0] R2[11:0]
R2[11:0] G2[11:0] R1[11:0] G1[11:0] R0[11:0] G0[11:0]
LINE_VALID
horizontal_mirror = 0
DOUT[11:0]
horizontal_mirror = 1
DOUT[11:0]
Row0[11:0] Row1[11:0] Row2[11:0] Row3[11:0] Row4[11:0] Row5[11:0]
Row5[11:0] Row4[11:0] Row3[11:0] Row2[11:0] Row0[11:0]
FRAME_VALID
vertical_flip = 0
DOUT[11:0]
vertical_flip = 1
DOUT[11:0]
Row1[11:0]
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 41 ©Semiconductor Components Industries, LLC,2016.
Subsampling
The MT9F002 supports subsampling. subsampling reduces the amount of data
processed by the analogue signal chain in the sensor and thereby allows the frame rate
to be increased. subsampling is enabled by changing x_odd_inc and/or y_odd_inc.
Values of 1, 3 and 7 can be supported for x_odd_inc, while values 1, 3, 7, 15 and 31 can be
supported for y_odd_inc.
Setting both of these variables to 3 reduces the amount of row and column data
processed and is equivalent to the skip2 readout mode provided by earlier Micron
Imaging sensors. Figure 3 shows a sequence of 8 columns being read out with x_od-
d_inc=3 and y_odd_inc=1.
Figure 30: Effect of x_odd_inc=3 on readout sequence
A 1/16 reduction in resolution is achieved by setting both x_odd_inc and y_odd_inc to 7.
This is equivalent to 4 x 4 skipping readout mode. Figure 4 shows a sequence of 16
columns being read out with x_odd_inc=7 and y_odd_inc=1.
Figure 31: Effect of x_odd_inc=7 on readout sequence
The effect of the different subsampling settings on the pixel array readout is shown in
Figure 32through Figure 38.
LINE_VALID
DOUT G0
x_odd_inc=1
R0 G1 R1 G2 R2 G3 R3
LINE_VALID
DOUT G0
x_odd_inc=3
R0 G2 R2
LINE_VALID
DOUT G0
x_odd_inc=1
R0 G1 R1 G2 ... G7 R7
LINE_VALID
DOUT G0
x_odd_inc=7
R0 G4 R4
MT9F002/D Rev. 9, 1/16 EN 42 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
Figure 32: Pixel Readout (no subsampling)
Figure 33: Pixel Readout (x_odd_inc=3, y_odd_inc=1)
X incrementing
Y incrementing
X incrementing
Y incrementing
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 43 ©Semiconductor Components Industries, LLC,2016.
Figure 34: Pixel Readout (x_odd_inc=1, y_odd_inc=3)
Figure 35: Pixel Readout (x_odd_inc=3, y_odd_inc=3)
X incrementing
Y incrementing
X incrementing
Y incrementing
MT9F002/D Rev. 9, 1/16 EN 44 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
Figure 36: Pixel Readout (x_odd_inc=7, y_odd_inc=7)
Figure 37: Pixel Readout (x_odd_inc=7, y_odd_inc=15)
X incrementing
Y incrementing
X incrementing
Y incrementing
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 45 ©Semiconductor Components Industries, LLC,2016.
Figure 38: Pixel Readout (x_odd_inc=7, y_odd_inc=31)
Programming Restrictions When Subsampling
When subsampling is enabled as a viewfinder mode and the sensor is switched back and
forth between full resolution and subsampling, it is recommended that line_length_pck
be kept constant between the two modes. This allows the same integration times to be
used in each mode.
X incrementing
Y incrementing
MT9F002/D Rev. 9, 1/16 EN 46 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
When subsampling is enabled, it may be necessary to adjust the x_addr_end, x_ad-
dr_start and y_addr_end settings: the values for these registers are required to corre-
spond with rows/columns that form part of the subsampling sequence. The adjustment
should be made in accordance with the following rules:
x_skip_factor = (x_odd_inc + 1) / 2
y_skip_factor = (y_odd_inc + 1) / 2
x_addr_start should be a multiple of x_skip_factor*8
(x_addr_end - x_addr_start + x_odd_inc) should be a multiple of x_skip_factor*8
The number of columns/rows read out with subsampling can be found from the equa-
tion below:
columns/rows = (addr_end - addr_start + odd_inc) / skip_factor
Summing Mode
Summing can be enabled with binning. Unlike binning mode where the values of adja-
cent same color pixels are averaged together, summing adds the pixel values together,
resulting in better sensor sensitivity. Summing normally provides two times the sensi-
tivity compared to the binning only mode.
The 2x2 summing mode can be enabled by programming the following register bit fields:
R0x3178[5:4] = 3
R0x3178[7:6] = 1
To disable summing, program register bit fields above to 0.
Figure 39: Pixel Binning and Summing
2x2 Binning or Summing
Σ
v
Σv
avg
Summing
avg
avg
avg
avg
Binning
avg
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 47 ©Semiconductor Components Industries, LLC,2016.
Bayer Resampler
The imaging artifacts found from a 2 x 2 binning will show image artifacts from aliasing.
These can be corrected by resampling the sampled pixels in order to filter these artifacts.
Figure 40 shows the pixel location resulting from 2 x 2 binning located in the middle
diagram, and the resulting pixel locations after the Bayer resampling function has been
applied.
Figure 40: Bayer Resampling
The improvements from using the Bayer resampling feature can be seen in Figure 41. In
this example, image edges seen on a diagonal have smoother edges when the Bayer re-
sampling feature is applied. This feature is designed to be used only with modes config-
ured with 2 x 2 binning. The feature will not remove aliasing artifacts that are caused
skipping pixels.
Figure 41: Results of Resampling
To enable the Bayer resampling feature:
1. Set 0x0400 to 0x02 // Enable the on-chip scalar.
2. Set 0x306E to 0x90B0 // Configure the on-chip scalar to resample Bayer data.
To disable the Bayer resampling feature:
1. Set 0x0400 to 0x00 // Disable the on-chip scalar.
2. Set 0x306E to 0x9080 // Configure the on-chip scalar to resample Bayer data.
Original Bayer 2 x 2 Binning Output Resampled (Proper) Bayer Output
2 x 2 Binned Image Bayer Resampled Image
MT9F002/D Rev. 9, 1/16 EN 48 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
Frame Rate Control
The formulas for calculating the frame rate of the sensor are shown below.
The line length is programmed directly in pixel clock periods through register
line_length_pck. For a specific window size, the minimum line length can be found from
the following equation:
(EQ 9)
Note that line_length_pck also needs to meet the minimum line length requirement set
in register min_line_length_pck. The row time can either be limited by the time it takes
to sample and reset the pixel array for each row, or by the time it takes to sample and
read out a row. Values for min_line_blanking_pck are provided in Table 14 on page 49.
The frame length is programmed directly in number of lines in the register
frame_line_length. For a specific window size, the minimum frame length is shown in
Equation 10:
(EQ 10)
The frame rate can be calculated from these variables and the pixel clock speed as
shown in Equation 11:
(EQ 11)
If coarse_integration_time is set larger than frame_length_lines the frame size will be
expanded to coarse_integration_time + 1.
minimum_line_length x_addr_end x_addr_start1+
subsampling factor
--------------------------------------------------------------------------- min_line_blanking_pck+=
minimum frame_length_lines y_addr_end - y_addr_start 1+
subsampling factor
----------------------------------------------------------------------------min_frame_blanking_lines+


=
frame rate vt pixel clock mhz 1
106
line_length_pck frame_length_lines
-------------------------------------------------------------------------------------------
=
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
MT9F002/D Rev. 9, 1/16 EN 49 ©Semiconductor Components Industries, LLC,2016.
Minimum Row Time
The minimum row time and blanking values with default register settings are shown in
Table 14.
In addition, enough time must be given to the output FIFO so it can output all data at the
set frequency within one row time.
There are therefore three checks that must all be met when programming
line_length_pck:
1. line_length_pck> min_line_length_pck
2. line_length_pck > 0.5*(x_addr_end - x_addr_start + x_odd_inc)/((1+x_odd_inc)/2) +
min_line_blanking_pck
3. The row time must allow the FIFO to output all data during each row. That is,
For parallel interface:
line_length_pck > (x_output_size) * “vt_pix_clk period” / “op_pix_clk period” +
0x005E
•For HiSPi (4-lane):
line_length_pck > (1/4)*(x_output_size) * “vt_pix_clk period” / “op_pix_clk period” +
0x005E
Minimum Frame Time
The minimum number of rows in the image is 2, so min_frame_length_lines will always
equal (min_frame_blanking_lines + 2).
Table 14: Minimum Row Time and Blanking Numbers
Register No Row Binning Row Binning
row_speed[2:0] 1 2 4 1 2 4
min_line_blanking_pck 0x0138 0x0138 0x0138 0x00E8 0x00E8 0x00E8
min_line_length_pck 0x04C8 0x0278 0x0278 0x0968 0x04B8 0x0260
Table 15: Minimum Frame Time and Blanking Numbers
Register
min_frame_blanking_lines 0x0092
min_frame_length_lines 0x0094
MT9F002/D Rev. 9, 1/16 EN 50 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Readout Configuration
Integration Time
The integration (exposure) time of the MT9F002 is controlled by the fine_integration_-
time and coarse_integration_time registers.
The limits for the fine integration time are defined by:
fine_integration_time_min < fine_integration_time < (line_length_pck – (EQ 12)
fine_integration_time_max_margin
The limits for the coarse integration time are defined by:
coarse_integration_time_min < coarse_integration_time (EQ 13)
The actual integration time is given by:
(EQ 14)
It is required that:
coarse_integration_time < = (frame_length_lines - coarse_integration_time_max_margin) (EQ 15)
If this limit is exceeded, the frame time will automatically be extended to (coarse_inte-
gration_time + coarse_integartion_time_max_margin) to accommodate the larger inte-
gration time.
Fine Integration Time Limits
The limits for the fine_integration_time can be found from fine_integration_time_min
and fine_integration_time_max_margin. It is necessary to change fine_correction
(R0x3010) when binning is enabled or the pixel clock divider (row_speed[2:0]) is used.
The corresponding fine_correction values are shown in Table 16.
Fine Correction
For the fine_integration_time limits, the fine_correction constant will change with the
pixel clock speed and binning mode.
Table 16: Fine_Integration_Time Limits
Register No Row Binning Row Binning
row_speed[2:0] 1 2 4 1 2 4
fine_integration_time_min 0x02B0 0x0158 0x0AC 0x05F2 0x02FA 0x017E
fine_integration_time_max_margin 0x0212 0x0109 0x0086 0x0376 0x01BA 0x00DC
Table 17: Fine_Correction Values
Register No Row Binning Row Binning
row_speed[2:0] 1 2 4 1 2 4
fine_correction 0x094 0x044 0x01C 0x0183 0x0BB 0x057
integration_time coarse_integration_time* line_length_pckfine_integration_time+
vt_pix_clk_freq_mhz*106

----------------------------------------------------------------------------------------------------------------------------------------------------------------------------
=
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 51 ©Semiconductor Components Industries, LLC,2016.
Power Mode Contexts
The MT9F002 sensor supports power consumption optimization through the power
mode contexts. Depending on the sensor operating mode, the appropriate power
context can be programmed through register R0x30E8 as shown in Table 18 below.
Programming register R0x30E8 will internally set the analog bias current reserved regis-
ters to predetermined values which result in optimized bias currents in the analog
domain. Register R0x30E8 is not “Frame Sync'd,” and should be programmed when
FRAME_VALID is not active, in order to avoid a “Bad Frame.”
Table 18: Power Mode Contexts
Power Mode
Context Register
Address Recommended Value Description
1 R0x30E8 0x8001 Reserved
2 R0x30E8 0x8002 Reserved
3 R0x30E8 0x8003 Reserved
4 Rr0x30E8 0x8004 Reserved
5 R0x30E8 0x8005 Reserved
6 R0x30E8 0x8006 Reserved
7 R0x30E8 0x8007 Reserved
MT9F002/D Rev. 9, 1/16 EN 52 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
ON Semiconductor Gain Model
The ON Semiconductor gain model uses color-specific registers to control both analog
and digital gain to the sensor. These registers are:
global_gain
greenR_gain
•red_gain
blue_gain
greenB_gain
The registers provide three analog gain stages. The analog_gain_2 analog gain stage has
a granularity of 64 steps over 2x gain. A digital gain (GAIN<15:12>) from 1-15x can also be
applied.
analog gain = 2^GAIN<11:10> x 2^GAIN<9:7> x GAIN<6:0>/64 (EQ 16)
digital_gain = GAIN<15:12> (EQ 17)
Total gain = digital_gain x analog_gain (EQ 18)
Analog Gain Stages
The analog gain stages of the MT9F002 sensor are shown in Figure 1. The recommended
gain settings enable gain increases very early in the signal chain (such as in the colamp),
so the signal can be effectively boosted while amplifying as few noise sources as
possible.
Figure 42: Analog Gain Stages
As a result of the different gain stages, analog gain levels can be achieved in different
ways. The recommended gain settings are shown in Table 19 on page 53.
colamp_gain ASC1 analog_gain_2
(ASC2_fine_gain)
analog_gain_3
1x, 2x, 4x and 8x 1x 1x to 1.984375x 1x, 2x
Gain = 2^gain[11:10] Gain= gain [6:0]/64 Gain = 2^gain[9:7]
Pixel
Offset Cancellation
digital_gain
Gain = gain[15:12]
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 53 ©Semiconductor Components Industries, LLC,2016.
Note: These gain settings reflects maximizing the front-end Colamp_gain, while meeting the minimum
requirement of 0.75 for the Analog_gain_2 stage.
In order to ensure ADC saturation, the recommended minimum gain (minimum ISO
speed equivalent gain) setting for the MT9F002 sensor (Rev3) is 1.50.
Also, the recommended maximum analog gain is 15.875. For total gain values greater
than 15.875, use or increase digital gain.
Flash Control
The MT9F002 supports both xenon and LED flash through the FLASH output signal. The
timing of the FLASH signal with the default settings is shown in Figure 43, and in
Figure 44 and Figure 45 on page 54. The flash and flash_count registers allow the timing
of the flash to be changed. The flash can be programmed to fire only once, delayed by a
few frames when asserted, and (for xenon flash) the flash duration can be programmed.
Enabling the LED flash will cause one bad frame, where several of the rows only have the
flash on for part of their integration time. This can be avoided either by first enabling
mask bad frames (write reset_register[9] = 1) before the enabling the flash or by forcing a
restart (write reset_register[1] = 1) immediately after enabling the flash; the first bad
frame will then be masked out, as shown in Figure 45 on page 54. Read-only bit flash[14]
is set during frames that are correctly integrated; the state of this bit is shown in
Figures 43, 44, and 45.
Figure 43: Xenon Flash Enabled
Table 19: Recommended Register Settings
Gain Range Register Setting Colamp_gain Analog_gain 3 Analog_gain_2 Digital Gain
1.50 - 2.969 0x1430 - 0x145F 2x 1x 0.75 - 1.484 1x
3.00 - 5.938 0x1830 - 0x185F 4x 1x 0.75 - 1.484 1x
6.00 - 15.875 0x1C30 - 0x1C7F 8x 1x 0.75 - 1.984 1x
16.00 - 31.75 0x2C40 - 0x2C7F 8x 1x 1.00 - 1.984 2x
32.00 - 63.50 0x4C40 - 0x4C7F 8x 1x 1.00 - 1.984 4x
FRAME_VALID
Flash STROBE
State of triggered bit
(R0x3046-7[14])
MT9F002/D Rev. 9, 1/16 EN 54 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
Figure 44: LED Flash Enabled
Notes: 1. Integration time = number of rows in a frame.
2. Bad frames will be masked during LED flash operation when mask bad frames bit field is set
(R0x301A[9] = 1).
3. An option to invert the flash output signal through R0x3046[7] is also available.
Figure 45: LED Flash Enabled Following Forced Restart
Bad frame
FRAME_VALID
Flash STROBE
State of triggered bit
(R0x3046-7[14])
Flash enabled Bad frame Good frame Good frame Flash disabled
during this frame during this frame
Flash enabled Masked out Good frame Good frame Flash disabled
and a restart frame
and a restart
triggered
triggered
FRAME_VALID
Flash STROBE
State of triggered bit
(R0x3046-7[14])
Masked out
frame
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 55 ©Semiconductor Components Industries, LLC,2016.
Global Reset
Global reset mode allows the integration time of the MT9F002 to be controlled by an
external electromechanical shutter. Global reset mode is generally used in conjunction
with ERS mode. The ERS mode is used to provide viewfinder information, the sensor is
switched into global reset mode to capture a single frame, and the sensor is then
returned to ERS mode to restore viewfinder operation.
Overview of Global Reset Sequence
The basic elements of the global reset sequence are:
1. By default, the sensor operates in ERS mode and the SHUTTER output signal is LOW.
The electromechanical shutter must be open to allow light to fall on the pixel array.
Integration time is controlled by the coarse_integration_time and fine_integration_-
time registers.
2. A global reset sequence is triggered.
3. All of the rows of the pixel array are placed in reset.
4. All of the rows of the pixel array are taken out of reset simultaneously. All rows start to
integrate incident light. The electromechanical shutter may be open or closed at this
time.
5. If the electromechanical shutter has been closed, it is opened.
6. After the desired integration time (controlled internally or externally to the MT9F002),
the electromechanical shutter is closed.
7. A single output frame is generated by the sensor with the usual LV, FV, PIXCLK, and
DOUT timing. As soon as the output frame has completed (FV de-asserts), the electro-
mechanical shutter may be opened again.
8. The sensor automatically resumes operation in ERS mode.
This sequence is shown in Figure 46. The following sections expand to show how the
timing of this sequence is controlled.
Figure 46: Overview of Global Reset Sequence
Entering and Leaving the Global Reset Sequence
A global reset sequence can be triggered by a register write to global_seq_trigger[0]
(global trigger, to transition this bit from a 0 to a 1) or by a rising edge on a suit-
ably-configured GPI input (see “Trigger Control” on page 33).
When a global reset sequence is triggered, the sensor waits for the end of the current row.
When LV de-asserts for that row, FV is de-asserted 6 PIXCLK periods later, potentially
truncating the frame that was in progress.
The global reset sequence completes with a frame readout. At the end of this readout
phase, the sensor automatically resumes operation in ERS mode. The first frame inte-
grated with ERS will be generated after a delay of approximately:
((13 + coarse_integration_time) * line_length_pck).
This sequence is shown in Figure 47.
ERS ERSRow Reset Integration Readout
MT9F002/D Rev. 9, 1/16 EN 56 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
While operating in ERS mode, double-buffered registers are updated at the start of each
frame in the usual way. During the global reset sequence, double-buffered registers are
updated just before the start of the readout phase.
Figure 47: Entering and Leaving a Global Reset Sequence
Programmable Settings
The registers global_rst_end and global_read_start allow the duration of the row reset
phase and the integration phase to be controlled, as shown in Figure 48. The duration of
the readout phase is determined by the active image size.
As soon as the global_rst_end count has expired, all rows in the pixel array are simulta-
neously taken out of reset and the pixel array begins to integrate incident light.
Figure 48: Controlling the Reset and Integration Phases of the Global Reset Sequence
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
global_rst_end
global_read_start
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 57 ©Semiconductor Components Industries, LLC,2016.
Control of the Electromechanical Shutter
Figure 49 shows two different ways in which a shutter can be controlled during the
global reset sequence. In both cases, the maximum integration time is set by the differ-
ence between global_read_start and global_rst_end. In shutter example 1, the shutter is
open during the initial ERS sequence and during the row reset phase. The shutter closes
during the integration phase. The pixel array is integrating incident light from the start
of the integration phase to the point at which the shutter closes. Finally, the shutter
opens again after the end of the readout phase. In shutter example 2, the shutter is open
during the initial ERS sequence and closes sometime during the row reset phase. The
shutter both opens and closes during the integration phase. The pixel array is integrating
incident light for the part of the integration phase during which the shutter is open. As
for the previous example, the shutter opens again after the end of the readout phase.
Figure 49: Control of the Electromechanical Shutter
It is essential that the shutter remains closed during the entire row readout phase (that
is, until FV has de-asserted for the frame readout); otherwise, some rows of data will be
corrupted (over-integrated).
It is essential that the shutter closes before the end of the integration phase. If the row
readout phase is allowed to start before the shutter closes, each row in turn will be inte-
grated for one row-time longer than the previous row.
After FV de-asserts to signal the completion of the readout phase, there is a time delay of
approximately 10 * line_length_pck before the sensor starts to integrate light-sensitive
rows for the next ERS frame. It is essential that the shutter be opened at some point in
this time window; otherwise, the first ERS frame will not be uniformly integrated.
The MT9F002 provides a SHUTTER output signal to control (or help the host system
control) the electromechanical shutter. The timing of the SHUTTER output is shown in
Figure 50 on page 58. SHUTTER is de-asserted by default. The point at which it asserts is
controlled by the programming of global_shutter_start. At the end of the global reset
readout phase, SHUTTER de-asserts approximately 2 * line_length_pck after the de-
assertion of FV.
This programming restriction must be met for correct operation:
global_read_start > global_shutter_start
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
global_rst_end
global_read_start
maximum integration time
shutter open shutter open
shutter closed
actual integration time
shutter open shutter open
shutter closed
closed shutter open
actual integration time
SHUTTER Example 1
SHUTTER Example 2
MT9F002/D Rev. 9, 1/16 EN 58 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
Figure 50: Controlling the SHUTTER Output
Using FLASH with Global Reset
If global_seq_trigger[2] = 1 (global flash enabled) when a global reset sequence is trig-
gered, the FLASH output signal will be pulsed during the integration phase of the global
reset sequence. The FLASH output will assert a fixed number of cycles after the start of
the integration phase and will remain asserted for a time that is controlled by the value
of the flash_count register, as shown in Figure 51.
Figure 51: Using FLASH With Global Reset
External Control of Integration Time
If global_seq_trigger[1] = 1 (global bulb enabled) when a global reset sequence is trig-
gered, the end of the integration phase is controlled by the level of trigger (global_se-
q_trigger[0] or the associated GPI input). This allows the integration time to be
controlled directly by an input to the sensor.
This operation corresponds to the shutter “B” setting on a traditional camera, where “B”
originally stood for “Bulb” (the shutter setting used for synchronization with a magne-
sium foil flash bulb) and was later considered to stand for “Brief” (an exposure that was
longer than the shutter could automatically accommodate).
When the trigger is de-asserted to end integration, the integration phase is extended by a
further time given by global_read_start – global_shutter_start. Usually this means that
global_read_start should be set to global_shutter_start + 1.
The operation of this mode is shown in Figure 52 on page 59. The figure shows the global
reset sequence being triggered by the GPI2 input, but it could be triggered by any of the
GPI inputs or by the setting and subsequence clearing of the global_seq_trigger[0] under
software control.
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
global_rst_end
global_read_start
SHUTTER
global_shutter_start
~2*line_length_pck
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
global_rst_end
FLASH
flash_count
(fixed)
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 59 ©Semiconductor Components Industries, LLC,2016.
The integration time of the GRR sequence is defined as:
(EQ 19)
Where:
(EQ 20)
(EQ 21)
The integration equation allows for 24-bit precision when calculating both the shutter
and readout of the image. The global_rst_end has only 16-bit as the array reset function
and requires a short amount of time.
The integration time can also be scaled using global_scale. The variable can be set to
0–512, 1–2048, 2–128, and 3–32.
These programming restrictions must be met for correct operation of bulb exposures:
•global_read_start > global_shutter_start
global_shutter_start > global_rst_end
global_shutter_start must be smaller than the exposure time (that is, this counter
must expire before the trigger is de-asserted)
Figure 52: Global Reset Bulb
Retriggering the Global Reset Sequence
The trigger for the global reset sequence is edge-sensitive; the global reset sequence
cannot be retriggered until the global trigger bit (in the global_seq_trigger register) has
been returned to “0,” and the GPI (if any) associated with the trigger function has been
de-asserted.
The earliest time that the global reset sequence can be retriggered is the point at which
the SHUTTER output de-asserts; this occurs approximately 2 * line_length_pck after the
negation of FV for the global reset readout phase.
The frame that is read out of the sensor during the global reset readout phase has exactly
the same format as any other frame out of the serial pixel data interface, including the
addition of two lines of embedded data. The values of the coarse_integration_time and
fine_integration_time registers within the embedded data match the programmed
values of those registers and do not reflect the integration time used during the global
reset sequence.
Integration Time global_scale [global_read_start global_shutter_startglobal_rst_end]
vt_pix_clk_freq_mhz
-----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
=
global_read_start 2
16 global_read_start27:0global_read_start115:0+=
global_shutter_start 2
16 global_shutter_start27:0global_shutter_start115:0+=
ERS ERSRow Reset Integration Readout
Trigger
Wait for end of current row Automatic at end of frame readout
global_rst_end
GPI2
global_read_start - global_shutter_start
MT9F002/D Rev. 9, 1/16 EN 60 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
Global Reset and Soft Standby
If the mode_select[stream] bit is cleared while a global reset sequence is in progress, the
MT9F002 will remain in streaming state until the global reset sequence (including frame
readout) has completed, as shown in Figure 53.
Figure 53: Entering Soft Standby During a Global Reset Sequence
Slave Mode
The MT9F002 sensor supports Slave mode to sync the frame rate more precisely, and
simply by the VD signal from external ASIC. The VD signal also allows for precise control
of frame rate and register change updates.
The VD signal for slave GRR mode is synchronized to ERS frame time, so that sensor can
complete the current frame readout in ERS mode before moving to GRR mode, and
avoid ERS broken frame before moving into GRR mode. Control bit vd_trigger_new_-
frame bit allows VD triggering every new frame.
A GPI pin on the sensor can be programmed to act as VD input pin signal whose rising
edge can be used to start every new frame (see Figure 55 for details).
An optional functionality to limit the duration counters are halted is given by setting
vd_timer bit to 1. When this bit is set the counters will not wait indefinitely for VD rising
edge & resume normal counting after halting for a limited time. Otherwise when
vd_timer is set to 0, internal row and column counters are halted until the arrival of VD's
positive edge.
Slave Mode GRR
Global reset sequence is triggered by programming the global_seq_trigger bit. After this
register bit is written the sensor will wait for rising edge of VD signal at the end of the
current frame to go into GRR mode. The control bit needed to be set to enable this func-
tionality is vd_trigger_grst. Once in the GRR integration phase, the sensor will wait for
the next VD rising edge to begin the readout.
At the end of the readout phase, the sensor automatically resumes operation in ERS
mode with readout of successive frames starting with rising edge of VD. Figure 54: “Slave
Mode GRR Timing,” on page 61 and Figure 55: “Slave Mode HiSPi Output (ERS to GRR
Transition),” on page 61 are related timing diagrams:
ERS ERSRow Reset Integration Readout
mode_select[streaming]
system state Software
Standby
Streaming
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Power Mode Contexts
MT9F002/D Rev. 9, 1/16 EN 61 ©Semiconductor Components Industries, LLC,2016.
Slave Mode GRR Timing
For example, to switch between ERS and GRR (and back to ERS), see Figure 54:
Figure 54: Slave Mode GRR Timing
Figure 55: Slave Mode HiSPi Output (ERS to GRR Transition)
When GRR is triggered (by the rising edge of VD signal), the MT9F002 sensor starts GRR
sequence and also send a start-of-blanking (SOB) SYNC code at the end of current ERS
frame. It continues to send SOB sync codes during the entire GRR sequence.
Sensor Internal
Frame-Valid Signal
Sensor
Internal
Line-Valid
Signal
GRR Integration GRR Frame Readout
Global Reset
Sequence
Internal Sensor
“Start of Frame”
& register sync
point
Vertical Blanking
(144 rows likely)
Change in
row-time using
group_parame
ter_hold is
implemented
at the internal
“SOF”
“Start of Active”
SYNC Code
“Start of Blanking”
SYNC Code
Active Image data
transmitted on HiSPi
Blanking words
transmitted on HiSPi
GRR Trigger
(global_read_start – global_shutter_start)
VD
Internal Sensor
“Start of Frame”
& register sync
point
MT9F002/D Rev. 9, 1/16 EN 62 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
Sensor Core Digital Data Path
Test Patterns
The MT9F002 supports a number of test patterns to facilitate system debug. Test
patterns are enabled using test_pattern_mode (R0x0600–1). The test patterns are listed
in Table 20.
Test patterns 0–3 replace pixel data in the output image (the embedded data rows are
still present). Test pattern 4 replaces all data in the output image (the embedded data
rows are omitted and test pattern data replaces the pixel data).
HiSPi Test Patterns
Test patterns specific to the HiSPi are also generated. The test patterns are enabled by
using test_enable (R0x31C6 - 7) and controlled by test_mode (R0x31C6[6:4]).
For all of the test patterns, the MT9F002 registers must be set appropriately to control
the frame rate and output timing. This includes:
•All clock divisors
x_addr_start
x_addr_end
y_addr_start
y_addr_end
frame_length_lines
•line_length_pck
•x_output_size
y_output_size
Table 20: Test Patterns
test_pattern_mode Description
0 Normal operation: no test pattern
1 Solid color
2 100% color bars
3 Fade-to-gray color bars
4 PN9 link integrity pattern (only on sensors with serial
interface)
256 Walking 1s (12-bit value)
257 Walking 1s (10-bit value)
258 Walking 1s (8-bit value)
Table 21: HiSPi Test Patterns
test_mode Description
0 Transmit a constant 0 on all enabled data lanes.
1 Transmit a constant 1 on all enabled data lanes.
2 Transmit a square wave at half the serial data rate on all enabled data lanes.
3 Transmit a square wave at the pixel rate on all enabled data lanes.
4 Transmit a continuous sequence of pseudo random data, with no SAV code, copied on all enabled data
lanes.
5 Replace data from the sensor with a known sequence copied on all enabled data lanes.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
MT9F002/D Rev. 9, 1/16 EN 63 ©Semiconductor Components Industries, LLC,2016.
Effect of Data Path Processing on Test Patterns
Test patterns are introduced early in the pixel data path. As a result, they can be affected
by pixel processing that occurs within the data path. This includes:
Noise cancellation
Black pedestal adjustment
Lens and color shading correction
These effects can be eliminated by the following register settings:
R0x3044-5[10] = 0
R0x30CA-B[0] = 1
R0x30D4-5[15] = 0
R0x31E0-1[0] = 0
R0x3180-1[15] = 0
R0x301A-B[3] = 0 (enable writes to data pedestal)
R0x301E-F = 0x0000 (set data pedestal to 0)
R0x3780[15] = 0 (turn off lens/color shading correction)
Solid Color Test Pattern
In this mode, all pixel data is replaced by fixed Bayer pattern test data. The intensity of
each pixel is set by its associated test data register (test_data_red, test_data_greenR,
test_data_blue, test_data_greenB).
100% Color Bars Test Pattern
In this test pattern, shown in Figure 41 on page 127, all pixel data is replaced by a Bayer
version of an 8-color, color-bar chart (white, yellow, cyan, green, magenta, red, blue,
black). Each bar is 1/8 of the width of the pixel array. The pattern repeats after eight bars.
Each color component of each bar is set to either 0 (fully off) or 0x3FF (fully on for 10-bit
data). The pattern occupies the full height of the output image.
The image size is set by x_addr_start, x_addr_end, y_addr_start, y_addr_end and may be
affected by the setting of x_output_size, y_output_size. The color-bar pattern is discon-
nected from the addressing of the pixel array, and will therefore always start on the first
visible pixel, regardless of the value of x_addr_start. The number of colors that are visible
in the output is dependent upon x_addr_end - x_addr_start and the setting of x_out-
put_size: the width of each color bar is fixed.
The effect of setting horizontal_mirror in conjunction with this test pattern is that the
order in which the colors are generated is reversed: the black bar appears at the left side
of the output image. Any pattern repeat occurs at the right side of the output image
regardless of the setting of horizontal_mirror. The state of vertical_flip has no effect on
this test pattern.
The effect of subsampling, binning, and scaling of this test pattern is undefined.
MT9F002/D Rev. 9, 1/16 EN 64 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
Figure 56: 100% Color Bars Test Pattern
Fade-to-gray Color Bars Test Pattern
In this test pattern, shown in Figure 42 on page 128, all pixel data is replaced by a Bayer
version of an 8-color, color-bar chart (white, yellow, cyan, green, magenta, red, blue,
black). Each bar is 1/8 of the width of the pixel array (2592/8 = 324 pixels). The test
pattern repeats after 2592 pixels. Each color bar fades vertically from zero or full inten-
sity at the top of the image to 50 percent intensity (mid-gray) on the last (968th) row of
the pattern.
Each color bar is divided into a left and a right half, in which the left half fades smoothly
and the right half fades in quantized steps. The speed at which each color fades is
dependent on the sensor's data width and the height of the pixel array. We want half of
the data range (from 100 or 0 to 50 percent) difference between the top and bottom of
the pattern. Because of the Bayer pattern, each state must be held for two rows.
The rate-of-fade of the Bayer pattern is set so that there is at least one full pattern within
a full-sized image for the sensor. Factors that affect this are the resolution of the ADC
(10-bit or 12-bit) and the image height. For example, the MT9P013 fades the pixels by 2
LSB for each two rows. With 12-bit data, the pattern is 2048 pixels high and repeats after
that, if the window is higher.
The image size is set by x_addr_start, x_addr_end, y_addr_start, y_addr_end and may be
affected by the setting of x_output_size, y_output_size. The color-bar pattern starts at
the first column in the image, regardless of the value of x_addr_start. The number of
colors that are visible in the output is dependent upon x_addr_end - x_addr_start and
the setting of x_output_size: the width of each color bar is fixed at 324 pixels.
The effect of setting horizontal_mirror or vertical_flip in conjunction with this test
pattern is that the order in which the colors are generated is reversed: the black bar
appears at the left side of the output image. Any pattern repeat occurs at the right side of
the output image regardless of the setting of horizontal_mirror.
The effect of subsampling, binning, and scaling of this test pattern is undefined.
Horizontal mirror = 0 Horizontal mirror = 1
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
MT9F002/D Rev. 9, 1/16 EN 65 ©Semiconductor Components Industries, LLC,2016.
Figure 57: Fade-to-Gray Color Bar Test Pattern
PN9 Link Integrity Pattern
The PN9 link integrity pattern is intended to allow testing of a serial pixel data interface.
Unlike the other test patterns, the position of this test pattern at the end of the data path
means that it is not affected by other data path corrections (row noise, pixel defect
correction and so on).
This test pattern provides a 512-bit pseudo-random test sequence to test the integrity of
the serial pixel data output stream. The polynomial x9 + x5 + 1 is used. The polynomial is
initialized to 0x1FF at the start of each frame. When this test pattern is enabled:
The embedded data rows are disabled and the value of frame_format_decriptor_1
changes from 0x1002 to 0x1000 to indicate that no rows of embedded data are
present.
The whole output frame, bounded by the limits programmed in x_output_size and
y_output_size, is filled with data from the PN9 sequence.
The output data format is (effectively) forced into RAW10 mode regardless of the state
of the ccp_data_format register.
Before enabling this test pattern the clock divisors must be configured for RAW10 opera-
tion (op_pix_clk_div = 10).
This polynomial generates this sequence of 10-bit values: 0x1FF, 0x378, 0x1A1, 0x336,
0x385... On the parallel pixel data output, these values are presented 10-bits per PIXCLK.
On the serial pixel data output, these values are streamed out sequentially without
performing the RAW10 packing to bytes that normally occurs on this interface.
Horizontal mirror = 0, Vertical flip = 0 Horizontal mirror = 1, Vertical flip = 0
Horizontal mirror = 0, Vertical flip = 1 Horizontal mirror = 1, Vertical flip = 1
MT9F002/D Rev. 9, 1/16 EN 66 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
Walking 1s
When selected, a walking 1s pattern will be sent through the digital pipeline. The first
value in each row is 0. Each value will be valid for two pixels.
Figure 58: Walking 1s 12-Bit Pattern
Figure 59: Walking 1s 10-Bit Pattern
Figure 60: Walking 1s 8-Bit Pattern
The walking 1s pattern was implemented to facilitate assembly testing of modules with a
parallel interface. The walking 1 test pattern is not active during the blanking periods;
hence the output would reset to a value of 0x0. When the active period starts again, the
pattern would restart from the beginning. The behavior of this test pattern is the same
between full resolution and subsampling mode. RAW10 and RAW8 walking 1 modes are
enabled by different test pattern codes.
Test Cursors
The MT9F002 supports one horizontal and one vertical cursor, allowing a crosshair to be
superimposed on the image or on test patterns 1–3. The position and width of each
cursor are programmable in R0x31E8–R0x31EE. Both even and odd cursor positions and
widths are supported.
Each cursor can be inhibited by setting its width to “0.” The programmed cursor position
corresponds to the x and y addresses of the pixel array. For example, setting horizon-
tal_cursor_position to the same value as y_addr_start would result in a horizontal cursor
LINE_VALID
DOUT (hex) 000
PIXCLK
000 001 001 002 002 004 004 008 008 010 010 020 020 040 040 800 800 FFF FFF 000080 080 100 100 200 200 400 400
LINE_VALID
DOUT (hex) 000
PIXCLK
000 001 001 002 002 004 004 008 008 010 010 020 020 040 040 000 000 001 001 002080 080 100 100 200 200 FFF FFF
LINE_VALID
DOUT (hex) 00
PIXCLK
00 01 01 02 02 04 04 08 08 10 10 20 20 40 40 02 02 04 04 0880 80 FF FF 00 00 01 01
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Sensor Core Digital Data Path
MT9F002/D Rev. 9, 1/16 EN 67 ©Semiconductor Components Industries, LLC,2016.
being drawn starting on the first row of the image. The cursors are opaque (they replace
data from the imaged scene or test pattern). The color of each cursor is set by the values
of the Bayer components in the test_data_red, test_data_greenR, test_data_blue and
test_data_greenB registers. As a consequence, the cursors are the same color as test
pattern 1 and are therefore invisible when test pattern 1 is selected.
When vertical_cursor_position = 0x0FFF, the vertical cursor operates in an automatic
mode in which its position advances every frame. In this mode the cursor starts at the
column associated with x_addr_start = 0 and advances by a step-size of 8 columns each
frame, until it reaches the column associated with x_addr_start = 2040, after which it
wraps (256 steps). The width and color of the cursor in this automatic mode are
controlled in the usual way.
The effect of enabling the test cursors when the image_orientation register is non-zero is
not defined by the design specification. The behavior of the MT9F002 is shown in
Figure 61 on page 67 and the test cursors are shown as translucent, for clarity. In prac-
tice, they are opaque (they overlay the imaged scene). The manner in which the test
cursors are affected by the value of image_orientation can be understood from these
implementation details:
The test cursors are inserted last in the data path, the cursor is applied with out any
sensor corrections.
The drawing of a cursor starts when the pixel array row or column address is within
the address range of cursor start to cursor start + width.
The cursor is independent of image orientation.
Figure 61: Test Cursor Behavior With Image Orientation
Readout
Direction Vertical cursor start
Horizontal cursor start
Horizontal mirror = 0, Vertical flip = 0
Vertical cursor start
Horizontal cursor start
Horizontal mirror = 0, Vertical flip = 1
Vertical cursor start
Horizontal cursor start
Horizontal mirror = 1, Vertical flip = 0
Vertical cursor start
Horizontal cursor start
Horizontal mirror = 1, Vertical flip = 1
Readout
Direction
Readout
Direction
Readout
Direction
MT9F002/D Rev. 9, 1/16 EN 68 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Timing Specifications
Timing Specifications
Power-Up Sequence
The recommended power-up sequence for the MT9F002 is shown in Figure 62. The
available power supplies—VDD_IO, VDD, VDD_PLL, VAA, VAA_PIX, VDD_HISPI, VDD_TX
can be turned on at the same time or have the separation specified below.
1. Turn on VDD_IO power supply.
2. After 1–500ms, turn on VDD and VDD_ HiSPi power supplies.
3. After 1–500ms, turn on VDD_PLL and VAA/VAA_PIX power supplies.
4. After 1–500ms, turn on VDD_TX power supply
5. After the last power supply is stable, enable EXTCLK.
6. Assert RESET_BAR for at least 1ms.
7. Wait 2700 EXTCLKs for internal initialization into software standby.
8. Configure PLL, output, and image settings to desired values
9. Set mode_select = 1 (R0x0100).
10. Wait 1ms for the PLL to lock before streaming state is reached.
Figure 62: Power-Up Sequence
Note: Digital supplies must be turned on before analog supplies.
Table 22: Power-Up Sequence
Definition Symbol Min Typ Max Unit
VDD_IO to VDD, VDD_HiSPi time t10500ms
VDD, VDD_HiSPi to VDD_PLL time t20500ms
VDD_PLL to VAA/VAA_PIX time t30500ms
VAA, VAA_PIX to VDD_TX t4–500ms
Active hard reset t5 1–– ms
Internal initialization t6 2700 EXTCLKs
PLL lock time t7 1–– ms
Internal
INIT
Hard
Reset Software
Standby PLL
Lock Streaming
t1
t2
t3
t5
t6t7
V
DD_
TX
t4
V
AA
, VAA_PIX
EXTCLK
V
DD
_PLL
V
DD,
V
DD_
HiSPi
V
DD_
IO
RESET_BAR
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Timing Specifications
MT9F002/D Rev. 9, 1/16 EN 69 ©Semiconductor Components Industries, LLC,2016.
Power-Down Sequence
The recommended power-down sequence for the MT9F002 is shown in Figure 63. The
available power supplies—VDD_IO, VDD, VDD_PLL, VAA, VAA_PIX, VDD_HiSPi, and
VDD_TX—can be turned off at the same time or have the separation specified below.
1. Disable streaming if output is active by setting mode_select = 0 (R0x0100).
2. The soft standby state is reached after the current row or frame, depending on config-
uration, has ended.
3. Assert hard reset by setting RESET_BAR to a logic “0.”
4. Turn off the VDD_TX, VAA/VAA_PIX, and VDD_PLL power supplies.
5. After 1500ms, turn off VDD and VDD_HiSPi power supply.
6. After 1500ms, turn off VDD_IO power supply.
Figure 63: Power-Down Sequence
Table 23: Power-Down Sequence
Definition Symbol Min Typ Max Unit
Hard reset t1 1–– ms
VDD_TX to VDD time t20500ms
VDD/VAA/VAA_PIX to VDD time t30500ms
VDD_PLL to VDD time t40500ms
VDD to VDD_IO time t50500ms
t
5
t
4
t
3
V
DD
_
IO
V
DD
,
V
DD
_H
I
SP
I
V
DD
_PLL
V
AA
, VAA_PIX
V
DD
_TX
EXTCLK
RESET_BAR
Turning Off Power Supplies
Hard
Reset
Software
StandbyStreaming
t
1
t
2
MT9F002/D Rev. 9, 1/16 EN 70 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Timing Specifications
Hard Standby and Hard Reset
The hard standby state is reached by the assertion of the RESET_BAR pad (hard reset).
Register values are not retained by this action, and will be returned to their default
values once hard reset is completed. The minimum power consumption is achieved by
the hard standby state. The details of the sequence are described below and shown in
Figure 64 on page 70.
1. Disable streaming if output is active by setting mode_select = 0 (R0x0100).
2. The soft standby state is reached after the current row or frame, depending on config-
uration, has ended.
3. Assert RESET_BAR (active LOW) to reset the sensor.
4. The sensor remains in hard standby state if RESET_BAR remains in the logic “0” state.
Figure 64: Hard Standby and Hard Reset
EXTCLK
mode_select
R0x0100
RESET_BAR
Logic “1” Logic “0”
Streaming Soft Standby Hard Standby from Hard Reset
next row/frame
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Timing Specifications
MT9F002/D Rev. 9, 1/16 EN 71 ©Semiconductor Components Industries, LLC,2016.
Soft Standby and Soft Reset
The MT9F002 can reduce power consumption by switching to the soft standby state
when the output is not needed. Register values are retained in the soft standby state.
Once this state is reached, soft reset can be enabled optionally to return all register
values back to the default. The details of the sequence are described below and shown in
Figure 65.
Soft Standby
1. Disable streaming if output is active by setting mode_select = 0 (R0x0100).
2. The soft standby state is reached after the current row or frame, depending on config-
uration, has ended.
Soft Reset
1. Follow the soft standby sequence listed above.
2. Set software_reset = 1 (R0x0103) to start the internal initialization sequence.
3. After 2700 EXTCLKs, the internal initialization sequence is completed and the current
state returns to soft standby automatically. All registers, including software_reset,
return to their default values.
Figure 65: Soft Standby and Soft Reset
EXTCLK
mode_select
R0x0100
software_reset
R0x0103
Logic “1” Logic “0”
Streaming Soft Standby Soft Reset Soft Standby
next row/frame
Logic “0” Logic “1” Logic “0”
2700 EXTCLKs
Logic “0” Logic “0”
Logic “0”
MT9F002/D Rev. 9, 1/16 EN 72 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Spectral Characteristics
Spectral Characteristics
Figure 66: Quantum Efficiency
0
10
20
30
40
50
60
350 400 450 500 550 600 650 700 750
Quantum Efficiency (%)
Wavelength (nm)
R
G
B
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Spectral Characteristics
MT9F002/D Rev. 9, 1/16 EN 73 ©Semiconductor Components Industries, LLC,2016.
Table 24: 11.4° Chief Ray Angle
Image Height CRA
(%) (mm) (deg)
000
5 0.192 0.57
10 0.384 1.14
15 0.575 1.71
20 0.767 2.28
25 0.959 2.85
30 1.151 3.42
35 1.343 3.99
40 1.534 4.56
45 1.726 5.13
50 1.918 5.70
55 2.110 6.27
60 2.302 6.84
65 2.493 7.41
70 2.685 7.98
75 2.877 8.55
80 3.069 9.14
85 3.261 9.69
90 3.452 10.26
95 3.644 10.83
100 3.836 11.40
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
0 102030405060708090100110
CRA (deg)
Image Height (%)
MT9F002/D Rev. 9, 1/16 EN 74 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Spectral Characteristics
Reading the Sensor CRA
Follow the steps below to obtain the CRA value of the image sensor:
1. Set the register bit field R0x301A[5] = 1.
2. Read the register bit fields R0x31FA[11:9].
3. Determine the CRA value according to Table 26.
Table 25: 25° Chief Ray Angle
Image Height CRA
(%) (mm) (deg)
00
0
5 0.192 2.16
10 0.384 4.27
15 0.575 6.35
20 0.767 8.41
25 0.959 10.45
30 1.151 12.44
35 1.343 14.37
40 1.534 16.21
45 1.726 17.93
50 1.918 19.49
55 2.110 20.89
60 2.302 22.10
65 2.493 23.10
70 2.685 23.88
75 2.877 24.46
80 3.069 24.83
85 3.261 25.00
90 3.452 25.00
95 3.644 24.84
100 3.836 24.56
Table 26: CRA Value
Binary Value of R0x31FA[11:9] CRA Value
000 0
001 25
010 11.4
0
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
0 102030405060708090100
CRA (deg)
Image Height (%)
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
MT9F002/D Rev. 9, 1/16 EN 75 ©Semiconductor Components Industries, LLC,2016.
Electrical Characteristics
Caution Stresses greater than those listed in Table 28 may cause permanent damage to the device.
This is a stress rating only, and functional operation of the device at these or any other con-
ditions above those indicated in the operational sections of this specification is not implied.
Notes: 1. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Table 27: DC Electrical Definitions and Characteristics
fEXTCLK = 24 MHz; VDD = 1.8V; VDD_IO = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; VDD_HiSPI = 1.8V, VDD_TX =
0.4V; Output load = 68.5pF; TJ = 60°C; Data Rate = 660 Mbps; DLL set to 0, 14Mp frame-rate at 13.65 fps
Definition Condition Symbol Min Typ Max Unit
Core digital voltage VDD 1.7 1.8 1.9 V
I/O digital voltage VDD_IO 1.7 1.8 1.9 V
Analog voltage VAA 2.7 2.8 3.1 V
Pixel supply voltage VAA_PIX 2.7 2.8 3.1 V
PLL supply voltage VDD_PLL 2.4 2.8 3.1 V
HiSPi digital voltage VDD_HiSPi 1.7 1.8 1.9 V
HiSPi I/O digital voltage
SLVS
HiVCM
VDD_TX
0.3
1.7
0.4
1.8
0.9
1.9
V
V
Digital operating current Serial HiSPi SLVS @ 13.65fps 75.0 mA
I/O digital operating current Serial HiSPi SLVS @ 13.65fps 1.2 mA
Analog operating current Serial HiSPi SLVS @ 13.65fps 172 mA
Pixel supply current Serial HiSPi SLVS @ 13.65fps 5.6 mA
PLL supply current Serial HiSPi SLVS @ 13.65fps 12.3 mA
HiSPi digital operating current Serial HiSPi SLVS @ 13.65fps 28.6 mA
HiSPi I/O digital operating current Serial HiSPi SLVS @ 13.65fps 10.5 mA
Digital operating current Parallel interface @ 6.3fps 65.0 mA
I/O digital operating current Parallel interface @ 6.3fps 41.5 mA
Analog operating current Parallel interface @ 6.3fps 101.0 mA
Pixel supply current Parallel interface @ 6.3fps 2.5 mA
PLL supply current Parallel interface @ 6.3fps 13.7 mA
Soft standby (clock on) mW
Table 28: Absolute Maximum Ratings
Symbol Definition Condition Min Max Unit
VDD_MAX Core digital voltage –0.3 1.9 V
VDD_IO_MAX I/O digital voltage –0.3 3.1 V
VAA_MAX Analog voltage –0.3 3.5 V
VAA_PIX Pixel supply voltage –0.3 3.5 V
VDD_PLL PLL supply voltage –0.3 3.5 V
VDD_HiSPi_MAX HiSPi digital voltage –0.3 1.9 V
VDD_TX_MAX HiSPi I/O digital voltage –0.3 1.9 V
tST Storage temperature –40 125 °C
MT9F002/D Rev. 9, 1/16 EN 76 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Figure 67: Two-Wire Serial Bus Timing Parameters
Note: Read sequence: For an 8-bit READ, read waveforms start after WRITE command and register
address are issued.
Table 29: Two-Wire Serial Register Interface Electrical Characteristics
fEXTCLK = 24 MHz; VDD = 1.8V; VDD_IO = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; VDD_HiSPi = 1.8V,
VDD_TX = 0.4V; Output load = 68.5pF; TJ = 60°C; Data Rate =660 Mbps; DLL set to 0
Symbol Parameter Condition Min Typ Max Unit
VIL Input LOW voltage –0.5 0.73 0.3 x VDD_IO V
IIN Input leakage current No pull up resistor;
VIN = VDD_IO or DGND
–2 2 A
VOL Output LOW voltage At specified 2mA 0.031 0.032 0.035 V
IOL Output LOW current At specified VOL 0.1V 3 mA
CIN Input pad capacitance 6 pF
CLOAD Load capacitance pF
S
DATA
S
CLK
Write Start ACK Stop
S
DATA
S
CLK
Read Start ACK
tr_clk tf_clk
90%
10%
tr_sdat tf_sdat
90%
10%
tSDH tSDS tSHAW tAHSW tSTPS tSTPH
Register Address
Bit 7
Write Address
Bit 0
Register Value
Bit 0
Register Value
Bit 7
Read Address
Bit 0
Register Value
Bit 0
Write Address
Bit 7
Read Address
Bit 7
tSHAR tSDSR
tSDHR
tAHSR
tSRTH tSCLK
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
MT9F002/D Rev. 9, 1/16 EN 77 ©Semiconductor Components Industries, LLC,2016.
Table 30: Two-Wire Serial Register Interface Timing Specification
fEXTCLK = 24 MHz; VDD = 1.8V; VDD_IO = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; VDD_HiSPi = 1.8V,
VDD_TX = 0.4V; Output load = 68.5pF; TJ = 60°C; Data Rate = 660 Mbps,; DLL set to 0
Figure 68: I/O Timing Diagram
Symbol Parameter Condition Min Typ Max Unit
fSCLK Serial interface input clock 0 100 400 kHz
SCLK duty cycle VOD 45 50 60 %
tRSCLK/SDATA rise time 300 s
tSRTS Start setup time Master WRITE to slave 0.6 s
tSRTH Start hold time Master WRITE to slave 0.4 s
tSDH SDATA hold Master WRITE to slave 0.3 0.65 s
tSDS SDATA setup Master WRITE to slave 0.3 s
tSHAW SDATA hold to ACK Master READ to slave 0.15 0.65 s
tAHSW ACK hold to SDATA Master WRITE to slave 0.15 0.70 s
tSTPS Stop setup time Master WRITE to slave 0.3 s
tSTPH Stop hold time Master WRITE to slave 0.6 s
tSHAR SDATA hold to ACK Master WRITE to slave 0.3 1.65 s
tAHSR ACK hold to SDATA Master WRITE to slave 0.3 0.65 s
tSDHR SDATA hold Master READ from slave .012 0.70 s
tSDSR SDATA setup Master READ from slave 0.3 s
Data[11:0]
FRAME_VALID/
LINE_VALID FRAME_VALID leads LINE_VALID by 6 PIXCLKs.
FRAME_VALID trails
LINE_VALID by 6 PIXCLKs.
PIXCLK
EXTCLK
tCP
tR
tEXTCLK
tFtRP tFP
tPD
tPD
tPFH
tPLH
tPFL
tPLL
Pxl_0 Pxl _1 Pxl_2 Pxl_n
90%
10%
90%
10%
MT9F002/D Rev. 9, 1/16 EN 78 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
SLVS Electrical Specifications
Notes: 1. Where 'n' is the number of PHYs
2. Temperature of 25°C
Table 31: I/O Parameters
fEXTCLK = 24 MHz; VDD = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; VDD_HiSPi = 1.8V, VDD_TX = 0.4V; Output
load = 68.5pF; TJ = 60°C; Data Rate = 660 Mbps,; DLL set to 0
Symbol Definition Conditions Min Max Units
VIH Input HIGH voltage VDD_IO = 1.8V 1.4 VDD_IO + 0.3
V
VDD_IO = 2.8V 2.4
VIL Input LOW voltage VDD_IO = 1.8V GND – 0.3 0.4
VDD_IO = 2.8V GND – 0.3 0.8
IIN Input leakage current No pull-up resistor; VIN = VDD OR
DGND
– 20 20 A
VOH Output HIGH voltage At specified IOH VDD_IO - 0.4V V
VOL Output LOW voltage At specified IOL –0.4V
IOH Output HIGH current At specified VOH ––12mA
IOL Output LOW current At specified VOL –9mA
IOZ Tri-state output leakage
current
–10A
Table 32: I/O Timing
fEXTCLK = 24 MHz; VDD = 1.8V; VDD_IO = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V; VDD_PLL = 2.8V; VDD_HiSPi = 1.8V, VDD_TX =
0.4V; Output load = 68.5pF; TJ = 60°C; Data Rate = 660 Mbps,; DLL set to 0
Symbol Definition Conditions Min Typ Max Units
fEXTCLK Input clock frequency PLL enabled 2 24 64 MHz
tEXTCLK Input clock period PLL enabled 200 41.7 15.6 ns
tR Input clock rise time 0.1 1 V/ns
tF Input clock fall time 0.1 1 V/ns
Clock duty cycle 455055%
tJITTER Input clock jitter 0.3 ns
Output pin slew Fastest CLOAD = 15pF 0.7 V/ns
fPIXCLK PIXCLK frequency Default 96 MHz
tPD PIXCLK to data valid Default 3 ns
tPFH PIXCLK to FRAME_VALID HIGH Default 3 ns
tPLH PIXCLK to LINE_VALID HIGH Default 3 ns
tPFL PIXCLK to FRAME_VALID LOW Default 3 ns
tPLL PIXCLK to LINE_VALID LOW Default 3 ns
Table 33: Power Supply and Operating Temperature
Parameter Symbol Min Typ Max Unit Notes
SLVS Current Consumption IDD_TX n*18 mA 1, 2
HiSPi PHY Current Consumption IDD_HiSPi n*45 mA 1, 2, 3
Operating temperature TJ-30 70 °C 4
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
MT9F002/D Rev. 9, 1/16 EN 79 ©Semiconductor Components Industries, LLC,2016.
3. Up to 700 Mbps
4. Specification values may be exceeded when outside this temperature range.
Table 34: SLVS Electrical DC Specification
Tj = 25°C
Parameter Symbol Min Typ Max Unit
SLVS DC mean common mode voltage VCM 0.45*VDD_T
X
0.5*VDD_TX 0.55*VDD_TX V
SLVS DC mean differential output voltage |VOD|0.36*VDD_T
X
0.5*VDD_TX 0.64*VDD_TX V
Change in VCM between logic 1 and 0 VCM 25 mV
Change in |VOD| between logic 1 and 0 | VOD|25mV
VOD noise margin NM ±30 %
Difference in VCM between any two channels |VCM|50mV
Difference in VOD between any two channels |VOD|100mV
Common-mode AC Voltage (pk) without VCM cap
termination
VCM_AC 50 mV
Common-mode AC Voltage (pk) with VCM cap
termination
VCM_AC 30 mV
Maximum overshoot peak |VOD|V
OD_AC 1.3*|VOD|V
Maximum overshoot Vdiff pk-pk Vdiff_pkpk 2.6*VOD V
Single-ended Output impedance RO35 50 70
Output Impedance Mismatch RO20 %
MT9F002/D Rev. 9, 1/16 EN 80 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Notes: 1. One UI is defined as the normalized mean time between one edge and the following edge of the
clock.
2. Taken from the 0V crossing point with the DLL off.
3. Also defined with a maximum loading capacitance of 10 pF on any pin. The loading capacitance
may also need to be less for higher bitrates so the rise and fall times do not exceed the maximum
0.3 UI.
4. The absolute mean skew between the Clock lane and any Data Lane in the same PHY between any
edges.
5. The absolute skew between any Clock in one PHY and any Data lane in any other PHY between any
edges.
Differential skew is defined as the skew between complementary outputs. It is measured as the abso-
lute time between the two complementary edges at mean VCM point. Note that differential skew also
is related to the VCM_AC spec which also must not be exceeded.
HiVCM Electrical Specifications
The HiSPi 2.0 specification also defines an alternative signaling level mode called
HiVCM. Both VOD and VCM are still scalable with VDD_TX, but with VDD_TX nominal set
to 1.8V the common-mode is elevated to around 0.9V.
Notes: 1. Where 'n' is the number of PHYs
2. Temperature of 25°C
3. Up to 700 Mbps
4. Specification values may be exceeded when outside this temperature range.
Table 35: SLVS Electrical Timing Specification
Parameter Symbol Min Max Unit Notes
Data Rate 1/UI 280 700 Mbps 1
Bitrate Period tPW 1.43 3.57 ns 1
Max setup time from transmitter tPRE 0.3 UI 1, 2
Max hold time from transmitter tPOST 0.3 UI 1, 2
Eye Width tEYE 0.6 UI 1, 2
Data Total Jitter (pk-pk) @1e-9 tTOTALJIT 0.2 UI 1, 2
Clock Period Jitter (RMS) tCKJIT 50 ps 2
Clock Cycle-to-Cycle Jitter (RMS) tCYCJIT 100 ps 2
Rise time (20% - 80%) tR 150ps 0.25 UI 3
Fall time (20% - 80%) tF 150ps 0.25 UI 3
Clock duty cycle DCYC 45 55 % 2
Mean Clock to Data Skew tCHSKEW -0.1 0.1 UI 1, 4
PHY-to-PHY Skew tPHYSKEW 2.1 UI 1, 5
Mean differential skew tDIFFSKEW -100 100 ps 6
Table 36: HiVCM Power Supply and Operating Temperatures
Parameter Symbol Min Typ Max Unit Notes
HiVCM Current Consumption IDD_TX n*34 mA 1, 2
HiSPi PHY Current Consumption IDD_HiSPi n*45 mA 1, 2, 3
Operating temperature TJ-30 70 °C 4
MT9F002/D Rev. 9, 1/16 EN 81 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Table 37: HiVCM Electrical Voltage and Impedance Specification
Tj = 25° C
Parameter Symbol Min Typ Max Unit
HiVCM DC mean common mode voltage VCM 0.76 0.90 1.07 V
HiVCM DC mean differential output voltage |VOD| 200 280 350 mV
Change in VCM between logic 1 and 0 VCM 25 mV
Change in |VOD| between logic 1 and 0 | VOD|25mV
VOD noise margin NM ±30 %
Difference in VCM between any two channels |VCM|50mV
Difference in VOD between any two channels |VOD|100mV
Common-mode AC Voltage (pk) without VCM
cap termination
VCM_AC 50 mV
Common-mode AC Voltage (pk) with VCM cap
termination
VCM_AC 30 mV
Maximum overshoot peak |VOD|V
OD_AC 1.3*|VOD|V
Maximum overshoot Vdiff pk-pk Vdiff_pkpk 2.6*VOD V
Single-ended Output impedance RO40 70 100
Output Impedance Mismatch RO20 %
MT9F002/D Rev. 9, 1/16 EN 82 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Notes: 1. One UI is defined as the normalized mean time between one edge and the following edge of the
clock.
2. Taken from the 0 V crossing point with the DLL off.
3. Also defined with a maximum loading capacitance of 10pF on any pin. The loading capacitance
may also need to be less for higher bitrates so the rise and fall times do not exceed the maximum
0.3 UI.
4. The absolute mean skew between the Clock lane and any Data Lane in the same PHY between any
edges.
5. The absolute mean skew between any Clock in one PHY and any Data lane in any other PHY
between any edges.
6. Differential skew is defined as the skew between complementary outputs. It is measured as the
absolute time between the two complementary edges at mean VCM point. Note that differential
skew also is related to the VCM_AC spec which also must not be exceeded.
Electrical Definitions
Figure 69 is the diagram defining differential amplitude VOD, VCM, and rise and fall
times. To measure VOD and VCM use the DC test circuit shown in Figure 70 on page 83
and set the HiSPi PHY to constant Logic 1 and Logic 0. Measure Voa, Vob and VCM with
voltmeters for both Logic 1 and Logic 0.
Table 38: HiVCM Electrical AC Specification
Parameter Symbol Min Max Unit Notes
Data Rate 1/UI 280 700 Mbps 1
Bitrate Period tPW 1.43 3.57 ns 1
Max setup time from transmitter tPRE 0.3 UI 1, 2
Max hold time from transmitter tPOST 0.3 UI 1, 2
Eye Width tEYE 0.6 UI 1, 2
Data Total Jitter (pk-pk) @1e-9 tTOTALJIT 0.2 UI 1, 2
Clock Period Jitter (RMS) tCKJIT 50 ps 2
Clock Cycle-to-Cycle Jitter (RMS) tCYCJIT 100 ps 2
Rise time (20% - 80%) tR150ps 0.3 UI 3
Fall time (20% - 80%) tF150ps 0.3 UI 3
Clock duty cycle DCYC 45 55 % 2
Clock to Data Skew tCHSKEW -0.1 0.1 UI 1, 4
PHY-to-PHY Skew tPHYSKEW 2.1 UI 1, 5
Mean differential skew tDIFFSKEW -100 100 ps 6
MT9F002/D Rev. 9, 1/16 EN 83 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Figure 69: Single-Ended and Differential Signals
Figure 70: DC Test Circuit
VOD (m)= |Voa (m)-Vob (m) | where 'm' is either “1” for logic 1 or “0” for logic 0 (EQ 22)
(EQ 23)
(EQ 24)
VOD = |VOD (1)-VOD (0) | (EQ 25)
(EQ 26)
Voa
Vob
Single--
ended signals
Differential signal
VOD =
|Voa –V
ob
|
VOD =
|Vob –V
oa
|
VCM = (Voa + Vob
)/2
VOD
0V
80%
20%
t
R
t
F
VOD_AC
Vdiff_pkpk
Vdiff
V
V
50
Ω
50
Ω
V
oa
Vob
VCM
VOD
VOD 1 VOD 0+
2
--------------------------------------------
=
Vdiff VOD 1 VOD 0+=
VCM
VCM 1 VCM 0+
2
--------------------------------------------
=
MT9F002/D Rev. 9, 1/16 EN 84 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
VCM = |VCM (1)-VCM (0) | (EQ 27)
Both VOD and VCM are measured for all output channels. The worst case VOD is defined
as the largest difference in VOD between all channels regardless of logic level. And the
worst case VCM is similarly defined as the largest difference in VCM between all chan-
nels regardless of logic level.
Timing Definitions
1. Timing measurements are to be taken using the Square Wave test mode.
2. Rise and fall times are measured between 20% to 80% positions on the differential
waveform, as shown in Figure 69: “Single-Ended and Differential Signals,” on page 83.
3. Mean Clock-to-Data skew should be measured from the 0V crossing point on Clock to
the 0V crossing point on any Data channel regardless of edge, as shown in Figure 71
on page 84. This time is compared with the ideal Data transition point of 0.5UI with
the difference being the Clock-to-Data Skew (see Equation 28 on page 84).
Figure 71: Clock-to-Data Skew Timing Diagram
(EQ 28)
(EQ 29)
4. The differential skew is measured on the two single-ended signals for any channel.
The time is taken from a transition on Voa signal to corresponding transition on Vob
signal at VCM crossing point.
tCHSKEW ps ttpw
2
-------
=
tCHSKEW UI t
tpw
-------0.5=
MT9F002/D Rev. 9, 1/16 EN 85 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Figure 72: Differential Skew
Figure 72 on page 85 also shows the corresponding AC VCM common-mode signal.
Differential skew between the Voa and Vob signals can cause spikes in the common-
mode, which the receiver needs to be able to reject. VCM_AC is measured as the absolute
peak deviation from the mean DC VCM common-mode.
Transmitter Eye Mask
Figure 73: Transmitter Eye Mask
Figure 73 defines the eye mask for the transmitter. 0.5 UI point is the instantaneous
crossing point of the Clock. The area in white shows the area Data is prohibited from
crossing into. The eye mask also defines the minimum eye height, the data tpre and tpost
times, and the total jitter pk-pk +mean skew (tTJSKEW) for Data.
tDIFFSKEW
VCM
VCM
Common-mode AC Signal
VCM_AC
VCM_AC
MT9F002/D Rev. 9, 1/16 EN 86 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Clock Signal
tHCLK is defined as the high clock period, and tLCLK is defined as the low clock period as
shown in Figure 74. The clock duty cycle DCYC is defined as the percentage time the clock
is either high (tHCLK) or low (tLCLK) compared with the clock period T.
Figure 74: Clock Duty Cycle
(EQ 30)
(EQ 31)
(i.e, 1 UI) (EQ 32)
(EQ 33)
Figure 75 shows the definition of clock jitter for both the period and the cycle-to-cycle
jitter.
Figure 75: Clock Jitter
Period Jitter (tCKJIT) is defined as the deviation of the instantaneous clock tPW from an
ideal 1UI. This should be measured for both the clock high period variation tHCLK, and
the clock low period variation tLCLK taking the RMS or 1-sigma standard deviation and
quoting the worse case jitter between tHCLK and tLCLK.
DCYC 1 tHCLK
T
--------------
=
DCYC 0 tLCLK
T
-------------
=
tpw
T
2
---
=
Bitrate 1
tpw
-------
=
MT9F002/D Rev. 9, 1/16 EN 87 ©Semiconductor Components Industries, LLC,2016.
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Electrical Characteristics
Cycle-to-cycle jitter (tCYCJIT) is defined as the difference in time between consecutive
clock high and clock low periods tHCLK and tLCLK, quoting the RMS value of the variation
(tHCLK - tLCLK).
If pk-pk jitter is also measured, this should be limited to ±3-sigma.
MT9F002/D Rev. 9, 1/16 EN 88 ©Semiconductor Components Industries, LLC,2016
MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
Package Dimensions
Package Dimensions
Figure 76: 48-Pin iLCC Package Outline Drawing
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MT9F002: 1/2.3-Inch 14 Mp CMOS Digital Image Sensor
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