INDUSTRIAL TEMPERATURE RANGE
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
1FEBRUARY 2003
IDT74AUC16373
INDUSTRIAL TEMPERATURE RANGE
1.8V CMOS 16-BIT TRANSPARENT
D-TYPE LATCH WITH
3-STATE OUTPUTS
DESCRIPTION:
This 16-bit transparent D-type latch is built using advanced CMOS technol-
ogy. The device can be used as a single 16-bit latch or as two 8-bit latches. When
the latch enable (LE) input is high, the Q outputs follow the data (D) inputs. When
LE is taken low, the Q outputs are latched at the levels set up at the D inputs.
A buffered output enable (OE) input can be used to place the eight outputs
in either a normal logic state (high or low logic levels) or a high-impedance state.
In the high-impedance state, the outputs neither load nor drive the bus lines
significantly. The OE input does not affect the internal operation of the latch.
This device is fully specified for partial power-down applications using IOFF.
The IOFF circuitry disables the outputs, preventing damaging current backflow
through the device when it is powered down.
To ensure the high-impedance state during power up or power down, OE
should be tied to VDD through a pull-up resistor; the minimum value of the resistor
is determined by the current-sinking capability of the driver.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2003 Integrated Device Technology, Inc. DSC-6169/9
FEATURES:
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
1.8V Optimized
0.8V to 2.7V Operating Range
Inputs/outputs tolerant up to 3.6V
Output drivers: ±9mA @ 2.3V
Supports hot insertion
Available in TSSOP, TVSOP, and VFBGA packages
FUNCTIONAL BLOCK DIAGRAM
APPLICATIONS:
high performance, low voltage communications systems
high performance, low voltage computing systems
1Q1
1LE
1D1
1OE
1D
C1
TO SEVEN O THER CHANNELS
2Q1
2LE
2D1
2OE
TO SEVEN OTHER CHANNELS
1D
C1
INDUSTRIAL TEMPERATURE RANGE
2
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
PINOUT CONFIGURATION
6
5
4
3
2
1
ABCDEFGHJK
A
1LE
NC
NC
NC
NC
1OE
B
1D2
1D1
GND
GND
1Q1 1Q3 1Q7 2Q2 2Q4 2Q6 2Q81Q5
C
1D4
1D3
VDD
VDD
E
1D8
1D7
F
2D1
2D2
G
2D3
2D4
GND
GND
H
2D5
2D6
VDD
VDD
J
2D7
2D8
GND
GND
K
2LE
2OE
NC
NC
NC
NC
D
1D6
1D5
GND
GND
6
5
4
3
2
11Q2 1Q4 1Q8 2Q1 2Q3 2Q5 2Q71Q6
56 BALL VFBGA P ACKAGE LAYOUT
VFBGA
TOP VIEW
NOTE:
NC = No Internal Connection
INDUSTRIAL TEMPERATURE RANGE
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
3
TSSOP/ TVSOP
TOP VIEW
PIN CONFIGURATION Symbol Description Max Unit
VTERM Terminal Voltage with Respect to GND –0.5 to +3.6 V
(all input and VDD terminals)
VTERM Terminal Voltage with Respect to GND –0.5 to +3.6 V
(any I/O or Output terminals in high-
impedance or power-off state)
TSTG Storage Temperature –65 to +150 °C
IOUT Continuous DC Output Current ±20 mA
IIK Continuous Clamp Current, ±50 mA
VI < 0, or VI > VDD
IOK Continuous Clamp Current, VO < 0 50 mA
IDD Continuous Current through ±100 mA
ISS each VDD or GND
ABSOLUTE MAXIMUM RA TINGS(1)(1)
(1)(1)
(1)
NOTE:
1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
FUNCTION TABLE (EACH 8-BIT LATCH)(1)
NOTES:
1 . H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High-Impedance
2. Level of Q before the indicated steady-state conditions were established.
Inputs Output
xOE xLE xDx xQx
LHH H
LHL L
LLX Q
(2)
HXX Z
PIN DESCRIPTION
Pin Names Description
xDx Data Inputs
xLE Latch Enable Inputs
xQx 3-State Outputs
xOE 3-State Output Enable Inputs (Active LOW)
1OE
1Q1
1Q2
GND
1Q3
1Q4
VDD
1Q5
1Q6
GND
1Q7
1Q8
2Q1
2Q2
2Q4
2OE
GND
VDD
2Q5
2Q6
GND
2Q7
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
40
41
42
43
44
45
46
47
48
11LE
1D1
1D2
GND
1D3
1D4
VDD
1D5
1D6
1D7
1D8
2D1
GND
2D3
2D4
2D5
2D6
GND
2D7
2D8
2LE
2Q3
2Q8
VDD
2D2
GND
Symbol Parameter Conditions Typ. Max. Unit
CIN(1) Input Capacitance VIN = 0V 3 4 pF
COUT(2) Output Capacitance VOUT = 0 V 5.5 6.5 pF
CI(3) Input Port Capacitance VIN = 0V 3 4 pF
CAPACITANCE (TA = +25°C, f = 1.0MHz, VDD = 2.5V)
NOTES:
1. Applies to Control Inputs.
2. Applies to Data Outputs.
3 . Applies to Data Inputs.
INDUSTRIAL TEMPERATURE RANGE
4
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
Symbol Parameter Test Conditions Min. Max. Unit
VDD Supply Voltage 0.8 2.7 V
VDD = 0.8V VDD
VDD = 1.1V to 1.3V 0.65 x VDD
VIH Input HIGH Voltage Level VDD = 1.4V to 1.6V 0.65 x VDD —V
VDD = 1.65V to 1.95V 0.65 x VDD
VDD = 2.3V to 2.7V 1 . 7
VDD = 0.8V 0
VDD = 1.1V to 1.3V 0.35 x VDD
VIL Input LOW Voltage Level VDD = 1.4V to 1.6V 0.35 x VDD V
VDD = 1.65V to 1.95V 0.35 x VDD
VDD = 2.3V to 2.7V 0 . 7
VIInput Voltage 0 2.7 V
VOOutput Voltage Active State 0 VDD V
3-State 0 2.7
VDD = 0.8V 0.7
VDD = 1.1V 3
IOH HIGH Level Output Current VDD = 1.4V 5 mA
VDD = 1.65V 8
VDD = 2.3V 9
VDD = 0.8V 0 .7
VDD = 1.1V 3
IOL LOW Level Output Current VDD = 1.4V 5 mA
VDD = 1.65V 8
VDD = 2.3V 9
t/v Input Transition Rise or Fall Time 20 ns/V
TAOperating Free-Air Temperature 40 +85 °C
RECOMMENDED OPERATING CHARACTERISTICS(1)
NOTE:
1. All unused inputs of the device must be held at VDD or GND to ensure proper operation.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
IIH Input HIGH or LOW Current VDD = 2.7V, VI = VDD or GND ±5 µ A
IIL All Inputs
IOFF Input/Output Power Off Leakage VDD = 0V, VIN or VO 2.7V ± 10 µA
IOZH High Impedance Output Current VDD = 2.7V VO = VDD ±10 µA
IOZL (3-State Output Pins) VO = GND ±10
IDDL Quiescent Power Supply Current VDD = 0.8V to 2.7V 20 µA
IDDH VIN = GND or VDD
IDDZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(1)
Following Conditions Apply Unless Otherwise Specified:
Operating Conditions: TA = –40°C to +85°C
NOTE:
1. All unused inputs of the device must be held at VDD or GND to ensure proper operation.
INDUSTRIAL TEMPERATURE RANGE
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
5
Symbol Parameter Test Conditions(1) Min. Typ. Max. Unit
VOH Output HIGH Voltage VDD = 0.8V - 2.7V IOH = –100µAVDD - 0.1
VDD = 0.8V IOH = –0.7mA 0.55
VDD = 1.1V(2) IOH = –3mA 0 .8 V
VDD = 1.4V(3) IOH = –5mA 1
VDD = 1.65V(4) IOH = –8mA 1 .2
VDD = 2.3V(5) IOH = –9mA 1 .8
VOL Output LOW Voltage VDD = 0.8V - 2.7V IOH = 100µA 0.2
VDD = 0.8V IOL = 0.7mA 0.25
VDD = 1.1V(2) IOL = 3mA 0.3 V
VDD = 1.4V(3) IOL = 5mA 0.4
VDD = 1.65V(4) IOL = 8 mA 0.45
VDD = 2.3V(5) IOH = 9mA 0.6
OUTPUT DRIVE CHARACTERISTICS
NOTES:
1. VIL and VIH must be within the min. or max. range shown in the DC ELECTRICAL CHARACTERISTICS table for the appropriate VDD range. TA = -40°C to +85°C.
2. Demonstrates operation for nominal VDD = 1.2V.
3. Demonstrates operation for nominal VDD = 1.5V.
4. Demonstrates operation for nominal VDD = 1.8V.
5. Demonstrates operation for nominal VDD = 2.5V.
SWITCHING CHARACTERISTICS(1)
NOTE:
1. See TEST CIRCUITS AND WAVEFORMS. TA = -40°C to +85°C.
VDD = 0.8V VDD = 1.2V±0.1V VDD = 1.5V±0.1V VDD = 1.8V±0.15V VDD = 2.5V±0.2V
Symbol Parameter Typ. Min. Max. Min. Max. Min. Typ. Max. Min. Max. Unit
tPLH Propagation Delay xDx to xQx 8 1.1 3.8 0.6 2.4 0.7 1.5 2.4 0.6 1.9 ns
tPHL xLE to xQx 10.6 1.4 4.9 0.7 3.2 0.7 1.6 2.8 0.6 2.1
tPZH Output Enable Time 9 1.3 4.5 0.6 2.9 0.8 1.7 2.9 0.7 2.2 ns
tPZL xOE to xQx
tPHZ Output Disable Time 13 2.4 7 2.4 4.8 1.1 2.7 4.6 0.4 2.5 ns
tPLZ xOE to xQx
tSU Set-up Time, Data before LE1.7 0.7 0.5 0.4 0.4 ns
tHHold Time, Data after LE 1.2 0.8 0.7 0.6 ns
tWPulse Duration, LE HIGH 4. 2 2 .9 2.3 2.1 1 .7 ns
OPERATING CHARACTERISTICS, TA = 25°C
Symbol Parameter Test Conditions VDD = 0.8V VDD = 1.2V VDD = 1.5V VDD = 1.8V VDD = 2.5V Unit
CPD Power Dissipation Capacitance CL = 0pF 21 22 23 25 29 pF
Outputs Enabled f = 10MHz
CPD Power Dissipation Capacitance 5 5 6 7 10 pF
Outputs Disabled
INDUSTRIAL TEMPERATURE RANGE
6
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
Open
VLOAD
GND
VDD
Pulse
Generator D.U.T.
RL
CL
RT
VIN VOUT
(1)
SAME PHASE
INPUT TRANSITION
OPPOSITE PHASE
INPUT TRANSITION
0V
0V
VOH
VOL
tPLH tPHL
tPHL
tPLH
OUTPUT
VDD
VT
VT
VDD
VT
CONTROL
INPUT tPLZ 0V
OUTPUT
NORMALLY
LOW tPZH
0V
SWITCH
CLOSED
OUTPUT
NORMALLY
HIGH
ENABLE DISABLE
SWITCH
OPEN
tPHZ
0V
VOL + VLZ
VOH
VT
VT
tPZL
VLOAD/2 VLOAD/2
VDD
VT
VOL
VOH - VHZ
RL
TIMING
INPUT
DATA
INPUT
tSU tH
VT
VDD
0V
0V
VDD
VT
VT
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
0V
VDD
VT
VT
tW
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuits for All Outputs
Enable and Disable Times
NOTE:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
NOTE:
1. Pulse Generator for All Pulses: Rate 10MHz; Slew Rate 1V/ns.
Test Switch
Open Drain
Disable Low VLOAD
Enable Low
Disable High GND
Enable High
All Other Tests Open
SWITCH POSITION
Setup and Hold Times
TEST CONDITIONS(1)
Symbol VDD = 0.8V VDD = 1.2V±0.1V VDD = 1.5V±0.1V VDD = 1.8V±0.15V VDD = 2.5V±0.2V Unit
VLOAD 2xVDD 2xVDD 2xVDD 2xVDD 2xVDD V
VTVDD/2 VDD/2 VDD/2 VDD/2 VDD/2 V
VLZ 100 100 100 150 150 mV
VHZ 100 100 100 150 150 mV
RL2 2 2 1 0.5 K
CL15 15 15 30 30 pF
Pulse Width
INDUSTRIAL TEMPERATURE RANGE
IDT74AUC16373
1.8V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
7
ORDERING INFORMATION
CORPORATE HEADQUARTERS for SALES: for Tech Support:
2975 Stender Way 800-345-7015 or 408-727-6116 logichelp@idt.com
Santa Clara, CA 95054 fax: 408-492-8674 (408) 654-6459
www.idt.com
IDT XX AUC XXX XX
Package
Device Type
Temp. R ange
BV
PA
PF
16
74
Very Fine Pitch Ball Gr id Array
Thin Shrink Small Outline Package
Thin Very Small O utlin e Pa ckage
16-Bit Trans pare nt D- Type Latch
with 3-State Outputs
– 40°C to +85°C
XX
Family
373
Double-Density
X
Bus- Hold
Blank No bus-hold
X
Temp.
IIndustrial Temperature Range