Date Created: 4/28/2003
Date Issued: 1/26/2004
PCN # 20031704
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Please refer to Forecast PCN# 20031203.
This is to inform you that a design and/or process change will be made to the
following product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild
Semiconductor within 30 days of receipt of this notification.
If you have any questions concerning this change, please contact:
Name: KIM, HOHYUN
E-Mail: HOHYUN.KIM@notes.fairchildsemi.com
Phone: 82-32-680-1313
PCN Originator
Name: Pepito, Monaliza B.
E-mail: Monaliza.Pepito@notes.fairchildsemi.com
Phone: (+6332)340-0534
REL Engineer
Name: Uy, Lester O.
E-mail: Lester.Uy@notes.fairchildsemi.com
Phone: 63-32-3415636
PCN Type: Die Shrink
Effectivity
Expected 1st Device Shipment Date: 4/23/2004
Earliest Year/Work Week of Changed Product: 0417
(Note: Package marking may differ from this format)
Product ID (Description):
This change will affect all 6.8 - 20 V zener devices in DO-41 and DO-35 packages.
Description of Change:
Fairchild is in the process of qualifying Torex's shrunk zener die, from 0.45mm x
0.45mm to 0.35mm x 0.35mm, for the voltage range of 6.8V to 20V. The shrunk die will
completely replace the existing large die. There will be no change in Fab and
Assembly sites. Fairchild Semiconductor zeners in DO-35 and DO-41 packages will still
be sourced from Torex International Inc. and assembled in one of its subcontracting
plants, Takcheong Electronics, located in Shanwei, Guandong, China.
Effect of Change:
There is no change in the product performance to the specification limits. Parts
covered in this change are expected to have comparable performance with the current
parts in terms of quality and reliability.
Qualification:
The qualification plan is intended to meet all the requirements outlined for shrunk
die qualification and the overall quality and reliability of our products.
Qual/REL Plan Numbers Qual Results: FCB20030052
02-036 1N4758A HTRB 168hrs 79 0 0
D/R# n/a 500hrs 0 0
Test 01-a (TC) 1Khrs 0 0
55.0Bv ZOPL 168hrs 79 0 0
500hrs 0 0
230187 1N4736A HAST 96hrs 79 0 0
Test 01-b (CB)
6.8Bv
02-037 1N5231B HTRB 168hrs 79 0 0
D/R# n/a 500hrs 0 0
Test 02-a (TC) 1Khrs 0 0
5.1Bv ZOPL 168hrs 79 0 0
500hrs 0 0
230191 1N5250B HAST 96hrs 79 0 0
Test 02-b (CB)
20.0Bv
02-038 1N5242B HTRB 168hrs 79 0 0
D/R# n/a 500hrs 0 0
Test 03-a (TC) 1Khrs 0 0
12.0Bv ZOPL 168hrs 79 0 0
500hrs 0 0
230189 BZX79C6V8 HAST 96hrs 79 0 0
Test 03-b (CB)
6.8Bv
Conclusion
Based on favorable reliability test result, product change is now
qualified for full production.
Affected FSIDs
1N4736A 1N4736ATR 1N4737A
1N4737ATR 1N4738A 1N4738ATR
1N4739A 1N4739ATR 1N4740A
1N4740ATR 1N4741A 1N4741ATR
1N4742A 1N4742ATA 1N4742ATR
1N4743A 1N4743ATR 1N4744A
1N4744ATR 1N4745A 1N4745ATR
1N4746A 1N4746ATR 1N4747A
1N4747ATR 1N5235B 1N5235BTR
1N5236B 1N5236BTR 1N5237B
1N5237BTR 1N5238B 1N5238BTR
1N5239B 1N5239BTR 1N5240B
1N5240BTR 1N5241B 1N5241BTR
1N5242B 1N5242BTR 1N5243B
1N5243BTR 1N5244B 1N5244BTR
1N5245B 1N5245BTR 1N5246B
1N5246BTR 1N5247B 1N5247BTR
1N5248B 1N5248BTR 1N5249B
1N5249BTR 1N5250B 1N5250BTR
1N754A_T50A 1N754A_T50R 1N755A
1N755ATR 1N756A 1N756ATR
1N757A 1N757ATR 1N758A
1N758ATR 1N759A 1N759ATR
1N957B 1N957BTR 1N958B
1N958BTR 1N959B 1N959BTR
1N960B 1N960BTR 1N961B
1N961BTR 1N962B 1N962BTR
1N963B 1N963BTR 1N964B
1N964BTR 1N965B 1N965BTR
1N966B 1N966BTR 1N967B
1N967BTR 1N968B 1N968BTR
BZX55C10 BZX55C11 BZX55C12
BZX55C13 BZX55C15 BZX55C16
BZX55C18 BZX55C20 BZX55C6V8
BZX55C7V5 BZX55C8V2 BZX55C9V1
BZX79C10 BZX79C11 BZX79C12
BZX79C13 BZX79C15 BZX79C16
BZX79C18 BZX79C20 BZX79C6V8
BZX79C7V5 BZX79C8V2 BZX79C9V1
BZX85C10 BZX85C11 BZX85C11TA
BZX85C11TR BZX85C12 BZX85C13
BZX85C15 BZX85C16 BZX85C18
BZX85C20 BZX85C6V8 BZX85C7V5
BZX85C8V2 BZX85C9V1 JZD2_DHJZ005A
JZD4_FZJZ006A LZD2_DHLZ004A LZD2_DHLZ006A
LZD4_FZLZ005A PZD2_DHPZ005A QZD4_FZQZ004A
RZD4_FZRZ004A TZD4_FZTZ005A UZD4_FZUZ003A
WZD4_FZWZ004A XZD4_FZXZ004A ZZD4_FZZZ004A