iCoupler Digital Isolater ADuM1100 FEATURES GENERAL DESCRIPTION High data rate: dc to 100 Mbps (NRZ) Compatible with 3.3 V and 5.0 V operation/level translation 125C maximum operating temperature Low power operation 5 V operation 1.0 mA maximum @ 1 Mbps 4.5 mA maximum @ 25 Mbps 16.8 mA maximum @ 100 Mbps 3.3 V operation 0.4 mA maximum @ 1 Mbps 3.5 mA maximum @ 25 Mbps 7.1 mA maximum @ 50 Mbps 8-lead SOIC_N package (RoHS compliant version available) High common-mode transient immunity: >25 kV/s Safety and regulatory information UL recognized 2500 V rms for 1 minute per UL 1577 CSA Component Acceptance Notice #5A VDE Certificate of Conformity DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 VIORM = 560 V peak The ADuM1100 1 is a digital isolator based on Analog Devices Inc. iCoupler(R) technology. Combining high speed CMOS and monolithic air core transformer technology, this isolation component provides outstanding performance characteristics superior to alternatives, such as optocoupler devices. Configured as a pin-compatible replacement for existing high speed optocouplers, the ADuM1100 supports data rates as high as 25 Mbps and 100 Mbps. The ADuM1100 operates with a voltage supply ranging from 3.0 V to 5.5 V, boasts a propagation delay of <18 ns and edge asymmetry of <2 ns, and is compatible with temperatures up to 125C. It operates at very low power, less than 0.9 mA of quiescent current (sum of both sides), and a dynamic current of less than 160 A per Mbps of data rate. Unlike other optocoupler alternatives, the ADuM1100 provides dc correctness with a patented refresh feature that continuously updates the output signal. The ADuM1100 is offered in three grades. The ADuM1100AR and ADuM1100BR can operate up to a maximum temperature of 105C and support data rates up to 25 Mbps and 100 Mbps, respectively. The ADuM1100UR can operate up to a maximum temperature of 125C and supports data rates up to 100 Mbps. APPLICATIONS Digital field bus isolation Opto-isolator replacement Computer-peripheral interface Microprocessor system interface General instrumentation and data acquisition applications 1 Protected by U.S. Patents 5,952,849; 6,525,566; 6,922,080; 6,903,578; 6,873,065; 7,075,329; and other pending patents. FUNCTIONAL BLOCK DIAGRAM VDD1 1 VDD1 3 UPDATE GND1 4 8 VDD2 7 GND2 6 VO (DATA OUT) 5 GND2 WATCHDOG ADuM1100 NOTES 1. FOR PRINCIPLES OF OPERATION, SEE METHOD OF OPERATION, DC CORRECTNESS, AND MAGNETIC FIELD IMMUNITY SECTION. 02462-001 VI 2 (DATA IN) D E C O D E E N C O D E Figure 1. Rev. G Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 (c)2001-2007 Analog Devices, Inc. All rights reserved. ADuM1100 TABLE OF CONTENTS Features .............................................................................................. 1 Recommended Operating Conditions .................................... 10 Applications....................................................................................... 1 Absolute Maximum Ratings ......................................................... 11 General Description ......................................................................... 1 ESD Caution................................................................................ 11 Functional Block Diagram .............................................................. 1 Pin Configuration and Function Descriptions........................... 12 Revision History ............................................................................... 2 Typical Performance Characteristics ........................................... 13 Specifications..................................................................................... 3 Application Information................................................................ 15 Electrical Specifications--5 V Operation ................................. 3 PC Board Layout ........................................................................ 15 Electrical Specifications--3.3 V Operation .............................. 5 Propagation Delay-Related Parameters................................... 15 Electrical Specifications--Mixed 5 V/3 V or 3 V/5 V Operation....................................................................................... 7 Method of Operation, DC Correctness, and Magnetic Field Immunity..................................................................................... 16 Package Characteristics ............................................................... 9 Power Consumption .................................................................. 17 Regulatory Information............................................................... 9 Outline Dimensions ....................................................................... 18 Insulation and Safety-Related Specifications............................ 9 Ordering Guide .......................................................................... 18 DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 Insulation Characteristics ............................................................................ 10 REVISION HISTORY 6/07--Rev. F to Rev. G Updated VDE Certification Throughout ...................................... 1 Changes to Features and Endnote 1............................................... 1 Changes to Table 5 and Table 6....................................................... 9 Updated Outline Dimensions ...................................................... 18 Changes to Ordering Guide ......................................................... 18 3/06--Rev. E to Rev. F Updated Format..................................................................Universal Added Note 1 .................................................................................... 1 Changes to Table 1............................................................................ 4 Changes to Table 2............................................................................ 6 Changes to Table 3............................................................................ 8 Add Table 11.................................................................................... 13 Inserted Power Consumption Section......................................... 18 10/03--Rev. D to Rev. E Changes to Product Name, Features, and General Description. 1 Changes to Regulatory Information .............................................. 6 Changes to DIN EN 60747-5-2 (VDE 0884 Part 2) Insulation Characteristics................................................................................... 6 Changes to Absolute Maximum Ratings ....................................... 7 Changes to Recommended Operating Conditions...................... 7 Changes to Ordering Guide ............................................................ 8 6/03--Rev. C to Rev. D Changed DIN EN 60747-5-2 (VDE 0884 Part 2) Insulation Characteristics................................................................................... 6 Updated Ordering Guide................................................................. 8 Updated Outline Dimensions ....................................................... 13 4/03--Rev. B to Rev. C Changes to Features and Patent Note ............................................ 1 Changes to Regulatory Information ...............................................6 Changes to Insulation Characteristics Section ..............................6 Changes to Absolute Maximum Ratings........................................7 Changes to Package Branding..........................................................8 Changes to Method of Operation, DC Correctness, and Magnetic Field Immunity Section................................................ 11 Replaced Figure 9 ........................................................................... 12 1/03--Rev. A to Rev. B Added ADuM1100UR Grade ...........................................Universal Changed ADuM1100AR/ADuM1100BR to ADuM1100..........................................................................Universal Changes to Features and General Description ..............................1 Changes to Specifications.................................................................2 Added Electrical Specifications, Mixed 5 V/3 V or 3 /5 V Operation Table .................................................................................4 Updated Regulatory Information....................................................6 Changes to VDE 0884 Insulation Characteristics.........................6 Changes to Absolute Maximum Ratings........................................7 Changes to Package Branding..........................................................8 Updated TPC 3 to TPC 8..................................................................9 Deleted iCoupler in Field Bus Networks Section....................... 11 Changes to Figure 8........................................................................ 12 Added Figure 9 and Related Text ................................................. 12 11/02--Rev. 0 to Rev. A Edits to Features.................................................................................1 Edits to Regulatory Information .....................................................4 Edits to VDE 0884 Insulation Characteristics...............................5 Added Revision History ................................................................ 12 Updated Outline Dimensions....................................................... 12 Rev. G | Page 2 of 20 ADuM1100 SPECIFICATIONS ELECTRICAL SPECIFICATIONS--5 V OPERATION All voltages are relative to their respective ground. 4.5 V VDD1 5.5 V, 4.5 V VDD2 5.5 V. All minimum/maximum specifications apply over the entire recommended operation range, unless otherwise noted. All typical specifications are at TA = 25C, VDD1 = VDD2 = 5 V. Table 1. Parameter DC SPECIFICATIONS Input Supply Current Output Supply Current Input Supply Current (25 Mbps) (See Figure 5) Output Supply Current1 (25 Mbps) (See Figure 6) Input Supply Current (100 Mbps) (See Figure 5) Output Supply Current1 (100 Mbps) (See Figure 6) Input Current Logic High Output Voltage Logic Low Output Voltage SWITCHING SPECIFICATIONS For ADuM1100AR Minimum Pulse Width2 Maximum Data Rate3 For ADuM1100BR/ADuM1100UR Minimum Pulse Width2 Maximum Data Rate3 For All Grades Propagation Delay Time to Logic Low Output4, 5 (See Figure 7) Propagation Delay Time to Logic High Output4, 5 (See Figure 7) Pulse Width Distortion |tPLH - tPHL|5 Change vs. Temperature6 Propagation Delay Skew (Equal Temperature)5, 7 Propagation Delay Skew (Equal Temperature, Supplies)5, 7 Output Rise/Fall Time Common-Mode Transient Immunity at Logic Low/High Output8 Refresh Rate Input Dynamic Supply Current9 Output Dynamic Supply Current9 Symbol Typ Max Unit Test Conditions IDD1 (Q) IDD2 (Q) IDD1 (25) 0.3 0.01 2.2 0.8 0.06 3.5 mA mA mA VI = 0 V or VDD1 VI = 0 V or VDD1 12.5 MHz logic signal frequency IDD2 (25) 0.5 1.0 mA 12.5 MHz logic signal frequency IDD1 (100) 9.0 14 mA IDD2 (100) 2.0 2.8 mA +0.01 5.0 4.6 0.0 0.03 0.3 +10 A V V V V V 50 MHz logic signal frequency, ADuM1100BR/ADuM1100UR only 50 MHz logic signal frequency, ADuM1100BR/ADuM1100UR only 0 V VIN VDD1 IO = -20 A, VI = VIH IO = -4 mA, VI = VIH IO = 20 A, VI = VIL IO = 400 A, VI = VIL IO = 4 mA, VI = VIL 40 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 6.7 150 10 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels tPHL 10.5 18 ns CL = 15 pF, CMOS signal levels tPLH 10.5 18 ns CL = 15 pF, CMOS signal levels PWD 0.5 3 2 CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels II VOH Min -10 VDD2 - 0.1 VDD2 - 0.8 VOL PW 0.1 0.1 0.8 25 PW 100 tPSK1 8 ns ps/C ns tPSK2 6 ns CL = 15 pF, CMOS signal levels 3 35 ns kV/s CL = 15 pF, CMOS signal levels VI = 0 V or VDD1, VCM = 1000 V, transient magnitude = 800 V 1.2 0.09 0.02 Mbps mA/Mbps mA/Mbps tR, tF |CML|, |CMH| fr IDDI (D) IDDO (D) 25 Rev. G | Page 3 of 20 ADuM1100 1 Output supply current values are with no output load present. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. 2 The minimum pulse width is the shortest pulse width at which the specified pulse width distortion is guaranteed. 3 The maximum data rate is the fastest data rate at which the specified pulse width distortion is guaranteed. 4 tPHL is measured from the 50% level of the falling edge of the VI signal to the 50% level of the falling edge of the VO signal. tPLH is measured from the 50% level of the rising edge of the VI signal to the 50% level of the rising edge of the VO signal. 5 Because the input thresholds of the ADuM1100 are at voltages other than the 50% level of typical input signals, the measured propagation delay and pulse width distortion can be affected by slow input rise/fall times. See the Propagation Delay-Related Parameters section and Figure 14 through Figure 18 for information on the impact of given input rise/fall times on these parameters. 6 Pulse width distortion change vs. temperature is the absolute value of the change in pulse width distortion for a 1C change in operating temperature. 7 tPSK1 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature and output load within the recommended operating conditions. tPSK2 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature, supply voltages, and output load within the recommended operating conditions. 8 CMH is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD2. CML is the maximum common-mode voltage slew rate that can be sustained while maintaining VO < 0.8 V. The common-mode voltage slew rates apply to both rising and falling edges. The transient magnitude is the range over which the common-mode is slewed. 9 Dynamic supply current is the incremental amount of supply current required for a 1 Mbps increase in signal data rate. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. Rev. G | Page 4 of 20 ADuM1100 ELECTRICAL SPECIFICATIONS--3.3 V OPERATION All voltages are relative to their respective ground. 3.0 V VDD1 3.6 V, 3.0 V VDD2 3.6 V. All minimum/maximum specifications apply over the entire recommended operation range, unless otherwise noted. All typical specifications are at TA = 25C, VDD1 = VDD2 = 3.3 V. Table 2. Parameter DC SPECIFICATIONS Input Supply Current Output Supply Current Input Supply Current (25 Mbps) (See Figure 5) Output Supply Current 1 (25 Mbps) (See Figure 6) Input Supply Current (50 Mbps) (See Figure 5) Output Supply Current1 (50 Mbps) (See Figure 6) Input Current Logic High Output Voltage Logic Low Output Voltage SWITCHING SPECIFICATIONS For ADuM1100AR Minimum Pulse Width 2 Maximum Data Rate 3 For ADuM1100BR/ADuM1100UR Minimum Pulse Width2 Maximum Data Rate3 For All Grades Propagation Delay Time to Logic Low Output 4, 5 (See Figure 8) Propagation Delay Time to Logic High Output4, 5 (See Figure 8) Pulse Width Distortion |tPLH - tPHL|5 Change vs. Temperature 6 Propagation Delay Skew (Equal Temperature)5, 7 Propagation Delay Skew (Equal Temperature, Supplies)5, 7 Output Rise/Fall Time Common-Mode Transient Immunity at Logic Low/High Output 8 Refresh Rate Input Dynamic Supply Current 9 Output Dynamic Supply Current9 Symbol Typ Max Unit Test Conditions IDD1 (Q) IDD2 (Q) IDD1 (25) 0.1 0.005 2.0 0.3 0.04 2.8 mA mA mA VI = 0 V or VDD1 VI = 0 V or VDD1 12.5 MHz logic signal frequency IDD2 (25) 0.3 0.7 mA 12.5 MHz logic signal frequency IDD1 (50) 4.0 6.0 mA IDD2 (50) 1.2 1.6 mA +0.01 3.3 3.0 0.0 0.04 0.3 +10 A V V V V V 25 MHz logic signal frequency, ADuM1100BR/ADuM1100UR only 25 MHz logic signal frequency, ADuM1100BR/ADuM1100UR only 0 V VIN VDD1 IO = -20 A, VI = VIH IO = -2.5 mA, VI = VIH IO = 20 A, VI = VIH IO = 400 A, VI = VIH IO = 2.5 mA, VI = VIH 40 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 10 100 20 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels tPHL 14.5 28 ns CL = 15 pF, CMOS signal levels tPLH 15.0 28 ns CL = 15 pF, CMOS signal levels PWD 0.5 10 3 CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels II VOH Min -10 VDD2 - 0.1 VDD2 - 0.5 VOL PW 0.1 0.1 0.4 25 PW 50 tPSK1 15 ns ps/C ns tPSK2 12 ns CL = 15 pF, CMOS signal levels 3 35 ns kV/s CL = 15 pF, CMOS signal levels VI = 0 V or VDD1, VCM = 1000 V, transient magnitude = 800 V 1.1 0.08 0.04 Mbps mA/Mbps mA/Mbps tR, tF |CML|, |CMH| fr IDDI (D) IDDO (D) 25 Rev. G | Page 5 of 20 ADuM1100 1 Output supply current values are with no output load present. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. 2 The minimum pulse width is the shortest pulse width at which the specified pulse width distortion is guaranteed. 3 The maximum data rate is the fastest data rate at which the specified pulse width distortion is guaranteed. 4 tPHL is measured from the 50% level of the falling edge of the VI signal to the 50% level of the falling edge of the VO signal. tPLH is measured from the 50% level of the rising edge of the VI signal to the 50% level of the rising edge of the VO signal. 5 Because the input thresholds of the ADuM1100 are at voltages other than the 50% level of typical input signals, the measured propagation delay and pulse width distortion can be affected by slow input rise/fall times. See the Propagation Delay-Related Parameters section and Figure 14 through Figure 18 for information on the impact of given input rise/fall times on these parameters. 6 Pulse width distortion change vs. temperature is the absolute value of the change in pulse width distortion for a 1C change in operating temperature. 7 tPSK1 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature and output load within the recommended operating conditions. tPSK2 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature, supply voltages, and output load within the recommended operating conditions. 8 CMH is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD2. CML is the maximum common-mode voltage slew rate that can be sustained while maintaining VO < 0.8 V. The common-mode voltage slew rates apply to both rising and falling edges. The transient magnitude is the range over which the common-mode is slewed. 9 Dynamic supply current is the incremental amount of supply current required for a 1 Mbps increase in signal data rate. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. Rev. G | Page 6 of 20 ADuM1100 ELECTRICAL SPECIFICATIONS--MIXED 5 V/3 V OR 3 V/5 V OPERATION All voltages are relative to their respective ground. 5 V/3 V operation: 4.5 V VDD1 5.5 V, 3.0 V VDD2 3.6 V. 3 V/5 V operation: 3.0 V VDD1 3.6 V, 4.5 V VDD2 5.5 V. All minimum/maximum specifications apply over the entire recommended operation range, unless otherwise noted. All typical specifications are at TA = 25C, VDD1 = 3.3 V, VDD2 = 5 V or VDD1 = 5 V, VDD2 = 3.3 V. Table 3. Parameter DC SPECIFICATIONS Input Supply Current, Quiescent 5 V/3 V Operation 3 V/5 V Operation Output Supply Current, Quiescent 5 V/3 V Operation 3 V/5 V Operation Input Supply Current, 25 Mbps 5 V/3 V Operation 3 V/5 V Operation Output Supply Current 1 , 25 Mbps 5 V/3 V Operation 3 V/5 V Operation Input Supply Current, 50 Mbps 5 V/3 V Operation 3 V/5 V Operation Output Supply Current1, 50 Mbps 5 V/3 V Operation 3 V/5 V Operation Input Currents Logic High Output Voltage 5 V/3 V Operation Logic Low Output Voltage 5 V/3 V Operation Logic High Output Voltage 3 V/5 V Operation Logic Low Output Voltage 3 V/5 V Operation SWITCHING SPECIFICATIONS For ADuM1100AR Minimum Pulse Width 2 Maximum Data Rate 3 For ADuM1100BR/ADuM1100UR Minimum Pulse Width2 Maximum Data Rate3 For All Grades Propagation Delay Time to Logic Low/High Output 4, 5 5 V/3 V Operation (See Figure 9) 3 V/5 V Operation (See Figure 10) Symbol Min Typ Max Unit Test Conditions 0.3 0.1 0.8 0.3 mA mA 0.005 0.01 0.04 0.06 mA mA 2.2 2.0 3.5 2.8 mA mA 12.5 MHz logic signal frequency 12.5 MHz logic signal frequency 0.3 0.5 0.7 1.0 mA mA 12.5 MHz logic signal frequency 12.5 MHz logic signal frequency 4.5 4.0 7.0 6.0 mA mA 25 MHz logic signal frequency 25 MHz logic signal frequency 1.2 1.0 +0.01 3.3 3.0 0.0 0.04 0.3 5.0 4.6 0.0 0.03 0.3 1.6 1.5 +10 mA mA A V V V V V V V V V V 25 MHz logic signal frequency 25 MHz logic signal frequency 0 V VIA, VIB, VIC, VID VDD1 or VDD2 IO = -20 A, VI = VIH IO = -2.5 mA, VI = VIH IO = 20 A, VI = VIL IO = 400 A, VI = VIL IO = 2.5 mA, VI = VIL IO = -20 A, VI = VIH IO = -4 mA, VI = VIH IO = 20 A, VI = VIL IO = 400 A, VI = VIL IO = 4 mA, VI = VIL 40 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 20 ns Mbps CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 21 26 ns ns CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels IDDI (Q) IDDO (Q) IDDI (25) IDDO (25) IDDI (50) IDDO (50) IIA VOH -10 VDD2 - 0.1 VDD2 - 0.5 VOL VOH VDD2 - 0.1 VDD2 - 0.8 VOL PW 0.1 0.1 0.4 0.1 0.1 0.8 25 PW 50 tPHL, tPLH 13 16 Rev. G | Page 7 of 20 ADuM1100 Parameter Pulse width Distortion, |tPLH - tPHL|5 5 V/3 V Operation 3 V/5 V Operation Change in Pulse Width Distortion vs. Temperature 6 5 V/3 V Operation 3 V/5 V Operation Propagation Delay Skew (Equal Temperature)5, 7 5 V/3 V Operation 3 V/5 V Operation Propagation Delay Skew (Equal Temperature, Supplies)5, 7 5 V/3 V Operation 3 V/5 V Operation Output Rise/Fall Time (10% to 90%) Common-Mode Transient Immunity at Logic Low/High Output 8 Refresh Rate 5 V/3 V Operation 3 V/5 V Operation Input Dynamic Supply Current 9 5 V/3 V Operation 3 V/5 V Operation Output Dynamic Supply Current9 5 V/3 V Operation 3 V/5 V Operation Symbol PWD Min Typ Max Unit Test Conditions 0.5 0.5 2 3 ns ns CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels ps/C ps/C CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 12 15 ns ns CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels 9 12 3 35 ns ns ns kV/s CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels CL = 15 pF, CMOS signal levels VI = 0 V or VDD1, VCM = 1000 V, transient magnitude = 800 V 1.2 1.1 Mbps Mbps 0.09 0.08 mA/Mbps mA/Mbps 0.04 0.02 mA/Mbps mA/Mbps 3 10 tPSK1 tPSK2 tR, tF |CML|, |CMH| fr 25 CPD1 CPD2 1 Output supply current values are with no output load present. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. The minimum pulse width is the shortest pulse width at which the specified pulse width distortion is guaranteed. 3 The maximum data rate is the fastest data rate at which the specified pulse width distortion is guaranteed. 4 tPHL is measured from the 50% level of the falling edge of the VI signal to the 50% level of the falling edge of the VO signal. tPLH is measured from the 50% level of the rising edge of the VI signal to the 50% level of the rising edge of the VO signal. 5 Because the input thresholds of the ADuM1100 are at voltages other than the 50% level of typical input signals, the measured propagation delay and pulse width distortion can be affected by slow input rise/fall times. See the Propagation Delay-Related Parameters section and Figure 14 through Figure 18 for information on the impact of given input rise/fall times on these parameters. 6 Pulse width distortion change vs. temperature is the absolute value of the change in pulse width distortion for a 1C change in operating temperature. 7 tPSK1 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature and output load within the recommended operating conditions. tPSK2 is the magnitude of the worst-case difference in tPHL and/or tPLH that is measured between units at the same operating temperature, supply voltages, and output load within the recommended operating conditions. 8 CMH is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD2. CML is the maximum common-mode voltage slew rate that can be sustained while maintaining VO < 0.8 V. The common-mode voltage slew rates apply to both rising and falling edges. The transient magnitude is the range over which the common-mode is slewed. 9 Dynamic supply current is the incremental amount of supply current required for a 1 Mbps increase in signal data rate. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load. 2 Rev. G | Page 8 of 20 ADuM1100 PACKAGE CHARACTERISTICS Table 4. Parameter Resistance (Input-to-Output) 1 Capacitance (Input-to-Output)1 Input Capacitance 2 IC Junction-to-Case Thermal Resistance, Side 1 IC Junction-to-Case Thermal Resistance, Side 2 Symbol RI-O CI-O CI JCI JCO Package Power Dissipation PPD 1 2 Min Typ 1012 1.0 4.0 46 41 Max 240 Unit pF pF C/W C/W Test Conditions f = 1 MHz Thermocouple located at center of package underside mW The device is considered a 2-terminal device; Pin 1, Pin 2, Pin 3, and Pin 4 are shorted together, and Pin 5, Pin 6, Pin 7, and Pin 8 are shorted together. Input capacitance is measured at Pin 2 (VI). REGULATORY INFORMATION The ADuM1100 is approved by the following organizations. Table 5. UL Recognized under 1577 component recognition program 1 Single/basic insulation, 2500 V rms isolation voltage File E214100 1 2 CSA Approved under CSA Component Acceptance Notice #5A Basic insulation per CSA 60950-1-03 and IEC 60950-1, 400 V rms (565 V peak) maximum working voltage File 205078 VDE Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 2 Reinforced insulation, 560 V peak File 2471900-4880-0001 In accordance with UL 1577, each ADuM1100 is proof tested by applying an insulation test voltage 3000 V rms for 1 sec (current leakage detection limit = 5 A). In accordance with DIN V VDE V 0884-10, each ADuM1100 is proof tested by applying an insulation test voltage 1050 V peak for 1 sec (partial discharge detection limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10 approval. INSULATION AND SAFETY-RELATED SPECIFICATIONS Table 6. Parameter Minimum External Air Gap (Clearance) Symbol L(I01) Value 4.90 min Unit mm Minimum External Tracking (Creepage) L(I02) 4.01 min mm 0.016 min >175 IIIa 565 mm V Minimum Internal Gap (Internal Clearance) Tracking Resistance (Comparative Tracking Index) Isolation Group Maximum Working Voltage Compatible with 50 Years Service Life CTI VIORM Rev. G | Page 9 of 20 V peak Conditions Measured from input terminals to output terminals, shortest distance through air Measured from input terminals to output terminals, shortest distance path along body Insulation distance through insulation DIN IEC 112/VDE 0303 Part 1 Material Group (DIN VDE 0110, 1/89, Table I) Continuous peak voltage across the isolation barrier ADuM1100 DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 INSULATION CHARACTERISTICS This isolator is suitable for reinforced isolation, only within the safety limit data. Maintenance of the safety data is ensured by means of protective circuits. The * marking on the package denotes DIN V VDE V 0884-10 approval for 560 V peak working voltage. Table 7. Description Installation Classification per DIN VDE 0110 For Rated Mains Voltage 150 V rms For Rated Mains Voltage 300 V rms For Rated Mains Voltage 400 V rms Climatic Classification Pollution Degree per DIN VDE 0110, Table 1 Maximum Working Insulation Voltage Input-to-Output Test Voltage, Method B1 Input-to-Output Test Voltage, Method A After Environmental Tests Subgroup 1 After Input and/or Safety Test Subgroup 2 and Subgroup 3 Highest Allowable Overvoltage Safety-Limiting Values Case Temperature Side 1 Current Side 2 Current Insulation Resistance at TS Conditions VIORM x 1.875 = VPR, 100% production test, tm = 1 sec, partial discharge < 5 pC VIORM x 1.6 = VPR, tm = 60 sec, partial discharge < 5 pC VIORM x 1.2 = VPR, tm = 60 sec, partial discharge < 5 pC Transient overvoltage, tTR = 10 seconds Maximum value allowed in the event of a failure (see Figure 2) VIO = 500 V 180 Symbol Characteristic Unit VIORM VPR I to IV I to III I to II 40/105/21 2 560 1050 V peak V peak 896 672 V peak V peak VTR 4000 V peak TS IS1 IS2 RS 150 160 170 >109 C mA mA VPR RECOMMENDED OPERATING CONDITIONS SAFETY-LIMITING CURRENT (mA) 160 Table 8. 140 Parameter Operating Temperature ADuM1100AR/ADuM1100BR ADuM1100UR Supply Voltages 1 OUTPUT CURRENT 120 100 INPUT CURRENT 80 60 40 02462-002 20 0 0 50 100 150 CASE TEMPERATURE (C) 200 Figure 2. Thermal Derating Curve, Dependence of Safety-Limiting Value with Case Temperature per DIN V VDE V 0884-10 Logic High Input Voltage, 5 V Operation1, 2 (See Figure 11 and Figure 12) Logic Low Input Voltage, 5 V Operation1, 2 (See Figure 11 and Figure 12) Logic High Input Voltage, 3.3 V Operation1, 2 (See Figure 11 and Figure 12) Logic Low Input Voltage, 3.3 V Operation1, 2 (See Figure 11 and Figure 12) Input Signal Rise and Fall Times 1 2 Symbol Min Max Unit TA TA VDD1, VDD2 VIH -40 -40 3.0 +105 +125 5.5 C C V 2.0 VDD1 V VIL 0.0 0.8 V VIH 1.5 VDD1 V VIL 0.0 0.5 V 1.0 ms All voltages are relative to their respective ground. Input switching thresholds have 300 mV of hysteresis. See the Method of Operation, DC Correctness, and Magnetic Field Immunity section, Figure 19, and Figure 20 for information on immunity to external magnetic fields. Rev. G | Page 10 of 20 ADuM1100 ABSOLUTE MAXIMUM RATINGS Table 9. Parameter Storage Temperature Ambient Operating Temperature Supply Voltages1 Input Voltage1 Output Voltage1 Average Current, per Pin2 Temperature 105C Temperature 125C Input Current Output Current Common-Mode Transients3 Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Symbol TST TA Min -55 -40 Max +150 +125 Unit C C VDD1, VDD2 VI VO -0.5 -0.5 -0.5 +6.5 VDD1 + 0.5 VDD2 + 0.5 V V V -25 +25 mA -7 -20 -100 +7 +20 +100 mA mA kV/s ESD CAUTION 1 All voltages are relative to their respective ground. See Figure 2 for information on maximum allowable current for various temperatures. 3 Refers to common-mode transients across the insulation barrier. Common-mode transients exceeding the Absolute Maximum Rating may cause latch-up or permanent damage. 2 Table 10. Truth Table (Positive Logic) VI Input H L X X 1 VDD1 State Powered Powered Unpowered Powered VDD2 State Powered Powered Powered Unpowered VO Output H L H1 X1 VO returns to VI state within 1 s of power restoration. Figure 3 shows the package branding. * is the DIN EN 60747-5-2 mark, R is the package designator (R denotes SOIC_N), YYWW is the date code, and XXXXXX is the lot code. 8 ADuM1100BR, ADuM1100BR-RL7 8 AD1100A R YYWW* XXXXXX 1 ADuM1100UR, ADuM1100UR-RL7 8 AD1100B R YYWW* XXXXXX 1 Figure 3. Package Branding Rev. G | Page 11 of 20 AD1100U R YYWW* XXXXXX 1 02462-003 ADuM1100AR, ADuM1100AR-RL7 ADuM1100 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS VDD1 1 1 VI 2 VDD1 1 3 GND1 4 8 ADuM1100 VDD2 7 TOP VIEW (Not to Scale) GND22 6 VO 5 GND22 1 AND PIN 3 ARE INTERNALLY CONNECTED. EITHER OR BOTH MAY BE USED FOR VDD1 . 5 AND PIN 7 ARE INTERNALLY CONNECTED. EITHER OR BOTH MAY BE USED FOR GND2. 2 PIN Figure 4. Pin Configuration Table 11. Pin Function Descriptions Pin No. 1 2 3 4 5 6 7 8 Mnemonic VDD1 VI VDD1 GND1 GND2 VO GND2 VDD2 Description Input Supply Voltage, 3.0 V to 5.5 V. Logic Input. Input Supply Voltage, 3.0 V to 5.5 V. Input Ground Reference. Output Ground Reference. Logic Output. Output Ground Reference. Output Supply Voltage, 3.0 V to 5.5 V. Rev. G | Page 12 of 20 02462-004 1 PIN ADuM1100 TYPICAL PERFORMANCE CHARACTERISTICS 20 18 18 17 PROPAGATION DELAY (ns) 16 12 10 8 5V 6 3.3V 4 tPHL 15 tPLH 14 0 25 0 50 75 100 DATA RATE (Mbps) 125 12 -50 150 Figure 5. Typical Input Supply Current vs. Logic Signal Frequency for 5 V and 3.3 V Operation 4 13 PROPAGATION DELAY (ns) 14 3 5V 2 3.3V 02462-006 0 25 0 50 75 100 DATA RATE (Mbps) 125 -25 0 25 50 75 TEMPERATURE (C) 100 125 Figure 8. Typical Propagation Delays vs. Temperature, 3.3 V Operation 5 1 02462-008 02462-005 13 2 CURRENT (mA) 16 tPLH 12 tPHL 11 10 9 -50 150 Figure 6. Typical Output Supply Current vs. Logic Signal Frequency for 5 V and 3.3 V Operation 02462-009 CURRENT (mA) 14 -25 0 75 25 50 TEMPERATURE (C) 100 125 Figure 9. Typical Propagation Delays vs. Temperature, 5 V/3 V Operation 18 13 PROPAGATION DELAY (ns) PROPAGATION DELAY (ns) 17 12 11 tPHL tPLH 10 16 tPHL 15 tPLH 14 -25 0 50 75 25 TEMPERATURE (C) 100 12 -50 125 Figure 7. Typical Propagation Delays vs. Temperature, 5 V Operation 02462-010 9 -50 02462-007 13 -25 0 25 50 75 TEMPERATURE (C) 100 125 Figure 10. Typical Propagation Delays vs. Temperature, 3 V/5 V Operation Rev. G | Page 13 of 20 ADuM1100 1.4 1.7 1.3 INPUT THRESHOLD, VITH (V) 1.6 -40C 1.5 +25C 1.4 1.3 +125C 1.2 +125C 1.1 1.0 1.1 3.0 3.5 4.0 4.5 5.0 INPUT SUPPLY VOLTAGE, VDD1 (V) 0.8 3.0 5.5 02462-012 0.9 1.2 02462-011 INPUT THRESHOLD, VITH (V) -40C +25C 3.5 4.0 4.5 5.0 INPUT SUPPLY VOLTAGE, VDD1 (V) Figure 12. Typical Input Voltage Switching Threshold, High-to-Low Transition Figure 11. Typical Input Voltage Switching Threshold, Low-to-High Transition Rev. G | Page 14 of 20 5.5 ADuM1100 APPLICATION INFORMATION Pulse width distortion is the maximum difference between tPLH and tPHL and provides an indication of how accurately the input signal's timing is preserved in the component's output signal. Propagation delay skew is the difference between the minimum and maximum propagation delay values among multiple ADuM1100 components operated at the same operating temperature and having the same output load. PC BOARD LAYOUT The ADuM1100 digital isolator requires no external interface circuitry for the logic interfaces. A bypass capacitor is recommended at the input and output supply pins. The input bypass capacitor can conveniently be connected between Pin 3 and Pin 4 (see Figure 13). Alternatively, the bypass capacitor can be located between Pin 1 and Pin 4. The output bypass capacitor can be connected between Pin 7 and Pin 8 or Pin 5 and Pin 8. The capacitor value should be between 0.01 F and 0.1 F. The total lead length between both ends of the capacitor and the power supply pins should not exceed 20 mm. VDD1 Depending on the input signal rise/fall time, the measured propagation delay based on the input 50% level can vary from the true propagation delay of the component (as measured from its input switching threshold). This is because the input threshold, as is the case with commonly used optocouplers, is at a different voltage level than the 50% point of typical input signals. This propagation delay difference is given by VDD2 V1 (DATA) VO (DATA OUT) GND1 GND2 02462-013 (OPTIONAL) LH = tPLH - tPLH = (tR/0.8 VI)(0.5 V1 - VITH (L-H)) Figure 13. Recommended Printed Circuit Board Layout HL = tPHL - tPHL = (tF/0.8 VI)(0.5 V1 - VITH (H-L)) PROPAGATION DELAY-RELATED PARAMETERS where: tPLH and tPHL are the propagation delays as measured from the input 50% level. tPLH and tPHL are the propagation delays as measured from the input switching thresholds. tR and tF are the input 10% to 90% rise/fall times. VI is the amplitude of the input signal (0 to VI levels assumed). VITH (L-H and, VITH (H-L) are the input switching thresholds. Propagation delay time describes the length of time it takes for a logic signal to propagate through a component. Propagation delay time to logic low output and propagation delay time to logic high output refer to the duration between an input signal transition and the respective output signal transition (see Figure 14). INPUT (VI) 50% tPHL OUTPUT (VO) 02462-014 tPLH 50% Figure 14. Propagation Delay Parameters HL LH VITH(L-H) 50% VITH(H-L) tPLH INPUT (VI) tPHL t'PLH 50% OUTPUT (VO) Figure 15. Impact of Input Rise/Fall Time on Propagation Delay Rev. G | Page 15 of 20 t'PHL 02462-015 VI ADuM1100 3 5V INPUT SIGNAL 2 1 3.3V INPUT SIGNAL 0 1 2 3 4 8 5 6 7 INPUT RISE TIME (10%-90%, ns) 9 4 5V INPUT SIGNAL 3 3.3V INPUT SIGNAL 2 1 0 10 1 Figure 16. Typical Propagation Delay Change due to Input Rise Time Variation (for VDD1 = 3.3 V and 5 V) 2 3 4 5 6 7 8 INPUT RISE/FALL TIME (10%-90%, ns) 9 10 Figure 18. Typical Pulse Width Distortion Adjustment due to Input Rise/Fall Time Variation (at VDD1 = 3.3 V and 5 V) METHOD OF OPERATION, DC CORRECTNESS, AND MAGNETIC FIELD IMMUNITY 0 The two coils in Figure 1 act as a pulse transformer. Positive and negative logic transitions at the isolator input cause narrow (2 ns) pulses to be sent via the transformer to the decoder. The decoder is bistable and therefore either set or reset by the pulses indicating input logic transitions. In the absence of logic transitions at the input for more than ~1 s, a periodic update pulse of the appropriate polarity is sent to ensure dc correctness at the output. If the decoder receives none of these update pulses for more than about 5 s, the input side is assumed to be unpowered or nonfunctional, in which case the isolator output is forced to a logic high state by the watchdog timer circuit. -1 5V INPUT SIGNAL -2 3.3V INPUT SIGNAL -3 02462-017 PROPAGATION DELAY CHANGE, HL (ns) 5 02462-018 PULSE-WIDTH DISTORTION ADJUSTMENT, PWD (ns) 6 02462-016 PROPAGATION DELAY CHANGE, LH (ns) 4 -4 1 2 3 4 5 6 7 8 INPUT RISE TIME (10%-90%, ns) 9 10 Figure 17. Typical Propagation Delay Change due to Input Fall Time Variation (for VDD1 = 3.3 V and 5 V) The impact of the slower input edge rates can also affect the measured pulse width distortion as based on the input 50% level. This impact can either increase or decrease the apparent pulse width distortion depending on the relative magnitudes of tPHL, tPLH, and PWD. The case of interest here is the condition that leads to the largest increase in pulse width distortion. The change in this case is given by PWD = PWD - PWD = LH - HL = (t/0.8 V1)(V - VITH (L-H) - VITH (H-L)), (for t = tr = tf) where: PWD = |tPLH - tPHL| PWD = |tPLH - tPHL|. This adjustment in pulse width distortion is plotted as a function of input rise/fall time in Figure 18. The limitation on the magnetic field immunity of the ADuM1100 is set by the condition in which induced voltage in the transformer's receiving coil is sufficiently large to either falsely set or reset the decoder. The analysis that follows defines the conditions under which this can occur. The 3.3 V operating condition of the ADuM1100 is examined because it represents the most susceptible mode of operation. The pulses at the transformer output are greater than 1.0 V in amplitude. The decoder has sensing thresholds at about 0.5 V, therefore establishing a 0.5 V margin in which induced voltages can be tolerated. The induced voltage induced across the receiving coil is given by V = (-d/dt) rn2, n = 1, 2, . . . , N where: is the magnetic flux density (gauss). N is the number of turns in receiving coil. rn is the radius of nth turn in receiving coil (cm). Rev. G | Page 16 of 20 ADuM1100 1 0.1 DISTANCE = 1m 100 10 DISTANCE = 100mm 1 DISTANCE = 5mm 0.1 02462-020 10 0.01 1k 10k 100k 1M 10M 100M MAGNETIC FIELD FREQUENCY (Hz) 0.01 0.001 1k Figure 20. Maximum Allowable Current for Various Current-to-ADuM1100 Spacings 02462-019 MAXIMUM ALLOWABLE MAGNETIC FLUX DENSITY (kgauss) 100 1000 MAXIMUM ALLOWABLE CURRENT (kA) Given the geometry of the receiving coil in the ADuM1100 and an imposed requirement that the induced voltage be at most 50% of the 0.5 V margin at the decoder, a maximum allowable magnetic field is calculated, as shown in Figure 19. 10k 100k 1M 10M 100M MAGNETIC FIELD FREQUENCY (Hz) Figure 19. Maximum Allowable External Magnetic Field For example, at a magnetic field frequency of 1 MHz, the maximum allowable magnetic field of 0.2 kgauss induces a voltage of 0.25 V at the receiving coil. This is about 50% of the sensing threshold and does not cause a faulty output transition. Similarly, if such an event were to occur during a transmitted pulse (and was of the worst-case polarity), it would reduce the received pulse from >1.0 V to 0.75 V, still well above the 0.5 V sensing threshold of the decoder. The preceding magnetic flux density values correspond to specific current magnitudes at given distances away from the ADuM1100 transformers. Figure 20 expresses these allowable current magnitudes as a function of frequency for selected distances. As can be seen, the ADuM1100 is extremely immune and can be affected only by extremely large currents operated at high frequency and very close to the component. For the 1 MHz example noted, one would have to place a current of 0.5 kA 5 mm away from the ADuM1100 to affect the component's operation. Note that at combinations of strong magnetic field and high frequency, any loops formed by printed circuit board traces could induce sufficiently large error voltages to trigger the thresholds of succeeding circuitry. Care should be taken in the layout of such traces to avoid this possibility. POWER CONSUMPTION The supply current of the ADuM1100 isolator is a function of the supply voltage, the input data rate, and the output load. The input supply current is given by IDDI = IDDI (Q) f 0.5fr IDDI = IDDI (D) x (2f - fr) + IDDI (Q) f > 0.5fr The output supply current is given by IDDO = IDDO (Q) f 0.5fr -3 IDDO = (IDDO (D) + (0.5 x 10 ) x CLVDDO) x (2f - fr) + IDDO (Q) f > 0.5fr where: IDDI (D), IDDO (D) are the input and output dynamic supply currents per channel (mA/Mbps). CL is output load capacitance (pF). VDDO is the output supply voltage (V). f is the input logic signal frequency (MHz, half of the input data rate, NRZ signaling). fr is the input stage refresh rate (Mbps). IDDI (Q), IDDO (Q) are the specified input and output quiescent supply currents (mA). Rev. G | Page 17 of 20 ADuM1100 OUTLINE DIMENSIONS 5.00 (0.1968) 4.80 (0.1890) 8 1 5 4 1.27 (0.0500) BSC 0.25 (0.0098) 0.10 (0.0040) COPLANARITY 0.10 SEATING PLANE 6.20 (0.2441) 5.80 (0.2284) 1.75 (0.0688) 1.35 (0.0532) 0.51 (0.0201) 0.31 (0.0122) 0.50 (0.0196) 0.25 (0.0099) 45 8 0 0.25 (0.0098) 0.17 (0.0067) 1.27 (0.0500) 0.40 (0.0157) COMPLIANT TO JEDEC STANDARDS MS-012-A A CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. 012407-A 4.00 (0.1574) 3.80 (0.1497) Figure 21. 8-Lead Standard Small Outline Package [SOIC_N] Narrow Body (R-8) Dimensions shown in millimeters and (inches) ORDERING GUIDE Model ADuM1100AR ADuM1100AR-RL7 ADuM1100ARZ 1 ADuM1100ARZ-RL71 ADuM1100BR ADuM1100BR-RL7 ADuM1100BRZ1 ADuM1100BRZ-RL71 ADuM1100UR ADuM1100UR-RL7 ADuM1100URZ1 ADuM1100URZ-RL71 ADuM1100EVAL 1 Temperature Range -40C to +105C -40C to +105C -40C to +105C -40C to +105C -40C to +105C -40C to +105C -40C to +105C -40C to +105C -40C to +125C -40C to +125C -40C to +125C -40C to +125C Maximum Data Rate (Mbps) 25 25 25 25 100 100 100 100 100 100 100 100 Minimum Pulse Width (ns) 40 40 40 40 10 10 10 10 10 10 10 10 Z = RoHS Compliant Part. Rev. G | Page 18 of 20 Package Description 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel 8-Lead SOIC_N 8-Lead SOIC_N, 1,000 Piece Reel Evaluation Board Package Option R-8 R-8 R-8 R-8 R-8 R-8 R-8 R-8 R-8 R-8 R-8 R-8 ADuM1100 NOTES Rev. G | Page 19 of 20 ADuM1100 NOTES (c)2001-2007 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. C02462-0-6/07(G) Rev. G | Page 20 of 20