2SK2595
Silicon N-Channel MOS FET
UHF Power Amplifier
ADE-208-1366 (Z)
1st. Edition
Mar. 2001
Features
High power output, High gain, High efficiency
PG = 7.8dB, Pout = 37.3dBm, ηD = 50 %min. (f = 836.5MHz)
Compact package capable of surface mounting
Outline
1
23
RP8P
1. Gate
2. Source
3. Drain
D
G
S
This Device is sensitive to Elector Static Discharge.
An Adequate handling procedure is requested.
2SK2595
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage VDSS 17 V
Gate to source voltage VGSS ±10 V
Drain current ID1.1 A
Drain peak current ID(pulse)*15A
Channel dissipation Pch*220 W
Channel temperature Tch 150 °C
Storage temperature Tstg –45 to +150 °C
Notes: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
Electrical Characteristics (Ta = 25°C)
Item Symbol Min. Typ Max. Unit Test Conditions
Zero gate voltage drain
current IDSS ——10µAV
DS = 12 V, VGS = 0
Gate to source leak current IGSS ——±5.0 µAV
GS = ±10V, VDS = 0
Gate to source cutoff voltage VGS(off) 0.6 1.3 V ID = 6mA, VDS = 12V
Input capacitance Ciss 68 pF VGS = 5V, VDS = 0
f = 1MHz
Output capacitance Coss 27 pF VDS = 12V, VGS = 0
f = 1MHz
Output Power Pout 37.3 38.45 dBm VDS = 12V,
f = 836.5MHz
Pin = 29.5dBm
Drain Rational ηD5060%V
DS = 12V
Pout = 37.3dBm
f = 836.5MHz
Pin = 29.5dBm
2SK2595
3
Main Characteristics
32
24
16
8
050 100 150 200
10
8
6
4
2
0246810
4 V
3 V
V = 2 V
GS
5 V
6 V
10 V
8 V
5
4
3
2
1
012345
Tc = –25°C
25°C
75°C
0.1
10
2
5
1
0.2
0.5
0.1
Tc = –25°C25°C
75°C
0.2 0.5 12 510
Channel Power Dissipation Pch (W)
Case Temperature Tc (°C)
Maximum Channel Power
Dissipation Curve
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Pulse Test
V = 12 V
Pulse Test
DS
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance
vs. Drain Current
V = 12 V
Pulse Test
DS
2SK2595
4
0.1
10
2
1
5
0.2
0.5
0.1
0.02
0.05
0.01
0.1 0.2 0.5 12 510
Tc = –25°C
25°C75°C
1.2
1.0
0.8
0.6
0.4
0.2
–25
00 25 50 75 100 125
1 mA
10 mA
I = 0.1 mA
D
V = 12 V
DS
70
–10 –6 –2 2 6 10
50
60
V = 0
f = 1 MHz
DS
100
20
10
50
0.1 0.2 0.5 1 2 5 10 20 50
V = 0
f = 1 MHz
GS
Drain to Source Saturation Voltage
vs. Drain Current
Drain Current I (A)
DAmbient Temperature Ta (°C)
Gate to Source Cutoff Voltage
Gate to Source Cutoff Voltage vs.
Ambient Temperature
GS(off)
GS
Input Capacitance vs.
Gate to Source Voltage
Gate to Source Voltage V (V)
Input Capacitance Ciss (pF)
DS
Drain to Source V (V)
Output Capacitance Coss (pF)
Drain to Source Saturation Voltage
DS(sat)
V (V)
V = 10 V
Pulse Test
DS
V (V)
Output Capacitance vs.
Drain to Source Voltage
2SK2595
5
10
2
1
5
0.1 0.2 0.5 1 2 5 10 20 50
V = 0
f = 1 MHz
GS 10
8
6
4
2
0
100
80
60
40
20
0
10.80.60.40.2
V = 28 V
I = 500 mA
f = 836.5MHz
DS
DO
Po
ηD
Output Power, Drain Rational
vs. Input Power
Output Power Po (W)
Input power Pin (W)
Drain Rational (%)
ηD
Reverse Transfer Capacitance vs.
Gate to Source Votage
Gate to Source Voltege VGS (V)
Reverse Transfer Capacitance Crss (pF)
2SK2595
6
Package Dimensions
5.2 ± 0.15
0.5+0.1
–0.05
3.4 ± 0.15
2.54 ± 0.2
0.16+0.1
–0.06
0.6
0.2
1.0
2.0 Max
4.5 Max
1.325 ± 0.15
1.1
5.6 +0.7
–0.5
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
RP8P
0.08 g
As of January, 2001
Unit: mm
2SK2595
7
Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
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5. This product is not designed to be radiation resistant.
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