CYM1831V33
PRELIMINARY
4
Swi tch i ng C h ara cter i sti cs Over the Operating Range[3](continued)
1831V33-20 1831V33-25 1831V33-35
Parameter Description Min. Max. Min. Max. Min. Max. Unit
READ CYCLE
tRC Read Cycle Ti m e 20 25 35 ns
tAA Address to Data Valid 20 25 35 ns
tOHA Data Hold from Address Change 333ns
tACS CS LOW to Data Valid 20 25 35 ns
tDOE OE LOW to Data Valid 12 15 18 ns
tLZOE OE LOW to Low Z 000ns
tHZOE OE HIGH to High Z 10 12 15 ns
tLZCS CS LOW to Low Z[4] 333ns
tHZCS CS HIGH to High Z[4, 5] 10 12 15 ns
tPD CS HIGH to Power-Down 20 25 35 ns
WRITE CY CLE [6]
tWC Write Cycl e Time 20 25 35 ns
tSCS CS LOW to Write End 17 20 30 ns
tAW Address Set-Up to Write End 17 20 30 ns
tHA Address Hold from Write End 333ns
tSA Address Set-Up to Write Start 222ns
tPWE WE Pulse W idth 15 20 30 ns
tSD Da ta S et -U p to Write E nd 12 15 20 ns
tHD Data Hold from Write End 222ns
tLZWE WE HIGH to Low Z 333ns
tHZWE WE LOW to High Z[5] 012 012 015 ns
Swi tch i ng Waveform s
Notes:
3. Test conditions assume signal transition times of 5 ns or less, timing reference le vels of 1.5V , input pulse lev els of 0 to 3.0V , and output loading of the specified
IOL/IOH and 30-pF load capacitance.
4. At any given temperature and voltage condition, tHZCS is less than tLZCS for any given device. These parameters are guaranteed and not 100% tested.
5. tHZCS and tHZWE are specified with CL = 5 pF as in part (b) of AC Test Loads and Waveforms. Transition is measured ±500 mV from steady-state voltage.
6. The internal write time of the memory is defined by the overlap of CS LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can
terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
7. WE is HIGH for re ad cycle.
8. Device is continuously selected, CS = VIL, and OE= VIL.
Read Cycle No. 1
PREVIOUS DATA VALID DATA VALID
tRC
tAA
tOHA
1831V33–
ADDRESS
DATA OUT
[7,8]