TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 1 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
SDRAM
8M x 16 SDRAM
2M x 16bit x 4Banks Synchronous DRAM
FEATURES
3.3V power supply
Four banks operation
LVTTL compatible with multiplexed address
All inputs are sampled at the positive going
edge of system clock
Burst Read Single-bit Write operation
DQM for masking
Auto refresh and self refresh
64ms refresh period (4K cycle)
MRS cycle with address key programs
- CAS Latency ( 2 & 3 )
- Burst Length ( 1 , 2 , 4 , 8 & full page)
- Burst Type (Sequential & Interleave)
Available package type in 54 pin TSOP(II)
Operating temperature : 0 ~ +70 °C
ORDERING INFORMATION
GRNERAL DESCRIPTION
The T4312816A is 134,217,728 bits
synchronous high data rate Dynamic RAM
organized as 4 x 2,097,152 words by 16 bits,
fabricated with high performance CMOS
technology .
Synchronous design allows precise cycle control
with the use of system clock I/O transactions are
possible on every clockcycle . Range of operating
frequencies , programmable burst length and
programmable latencies allow the same device to
be useful for a variety of high bandwidth , high
performance memory system applications.
PIN ARRANGEMENT (Top View)
DQ1
VDD
46
45
44
43
41
42
40
36
35
34
33
32
31
30
29
1
2
3
4
6
5
7
8
9
11
15
16
17
18
19
20
VDDQ
DQ11
DQ1
0
A8
A7
A9
10
21
22
47
48
49
50
VSSQ
DQ2
A0
A1
DQ15
DQ14
Vss
23
24
25
2827
26
DQ3
DQ0
VDDQ
DQ4
DQ5
VSSQ
DQ6
RAS
CS
BA1
A10/AP
A2
A3
VDD
VSSQ
DQ13
DQ12
DQ9
UDQM
N.C
CLK
CKE
Vss
A6
A5
A4
12
13
14
39
38
37
DQ7
VDD
LDQM
DQ8
Vss
N.C/RFU
W E
CAS
54PIN T SO P(II)
(400m il x 875m il)
(0.8 mm PIN PITCH)
51
52
53
54
VDDQ
BA0
VDDQ
VSSQ
A11
PART NO. MAX
FREQUENCY TEMPERATURE
T4312816A-6S 166 MHz 0 ~ +70°C
T4312816A-7S 143 MHz 0 ~ +70°C
T4312816A-7.5S 133 MHz 0 ~ +70°C
T4312816A-8S 125 MHz 0 ~ +70°C
T4312816A-10S 100 MHz 0 ~ +70°C
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 2 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
BLOCK DIAGRAM
D ata Input R egister
I/O Control Output Buffer
2M x 16
2M x 16
Sense AM P
C olum n D ecoder
La te n c y & Burs t L e n gt h
Program m ing Register
Bank Select
Row Buffeer
Refresh Counter
Row Decoder
A dd ress Register
Col. Buffer
Tim ing R egister
DQi
L(U)DQMRASCSCKECLK
LCBR
LRAS
ADD
CLK
CAS WE
2M x 16
2M x 16
TE
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tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 3 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
PIN DESCRIPTION
PIN NAME INPUT FUNCTION
CLK System Clock
Active on the positive going edge to sample all input.
CS Chip Select Disables or enables device operation by masking or enabling all input
except CLK,CKE and L(U)DQM
CKE Clock Enable
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
A0 ~ A11 Address Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11,column address : CA0 ~ CA8
BA0 ~ BA1 Bank Select Address Selects bank to be activated during row address latch time.
Select bank for read/write during column address latch time.
RAS Row Address Strobe
Latches row addresses on the positive going edge of the CLK
with RAS low.
Enables row access & precharge.
CAS Column Address Strobe
Latches column addresses on the positive going edge of the CLK
with CAS low.
Enables column access .
WE Write Enable Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
L(U)DQM Data Input/Output
Mask
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when L(U)DQM active.
DQ0 ~ DQ15 Data Input/Output Data inputs/outputs are multiplexed on the same pins.
VDD/VSS Power Supply/Ground
Power and ground for the input buffers and the core logic.
VDDQ/VSSQ Data Output
Power/Ground
Isolated power supply and ground for the output buffers to provide
improved noise immunity.
N.C/RFU
No
Connection/Reserved
for Future Use
This pin is recommended to be left No Connection on the device.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 4 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Value Unit
Voltage on Any Pin Relative To Vss VIN,VOUT -1.0 to 4.6 V
Supply Voltage Relative To Vss VDD,VDDQ -1.0 to 4.6 V
Short circuit Output Current Iout 50 mA
Power Dissipation PD 1 W
Operating Temperature TOPR 0 to +70 °C
Storage Temperature Tstg -55 to +150 °C
Note : Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
RECOMMENDED DC OPERATING CONDITIONS
(TA = 0 to +70°
°°
°C, Voltage referenced to VSS=0V)
Parameter Symbol Min. Typ Max. Unit Notes
Supply Voltage VDD,VDDQ 3.0 3.3 3.6 V
Input High Voltage VIH 2.0 3.0 VDD+0.3V V
Input Low Voltage VIL -0.3 0 0.8 V
Output logic high voltage VOH 2.4 - - V IOH=-4mA
Output logic low voltage VOL - - 0.4 V IOL=4mA
Input leakage current IIL -1 - 1 uA 1
Output leakage current IOL -1.5 - 1.5 uA 2
Note : 1. Any input 0V VIN VDD+ 0.3V , all other pin are not under test = 0V.
2. Dout = disable, 0V VOUT VDD .
CAPACITANCE
(TA =25°C,VDD=3.3V, f = 1MHz)
Pin Symbol Min Max Unit
CLOCK CCLK 2.5 4.0 pF
ADDRESS CADD 2.5 5.0 pF
DQ0 ~ DQ15 COUT 4.0 6.5 pF
RAS,CAS,WE,CS,CKE,LDQM,
UDQM
CIN 2.5 5.0 pF
TE
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tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 5 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
DC CHARACTERISTICS
TA = 0 to 70°C , VIH(min)/VIL(max)=2.0V/0.8V
Speed version
Parameter Symbol
-6 -7 -7.5 -8 -10
Unit Test Condition Note
Operating Current
( One Bank Active) ICC1 140 120 115 110 100 mA
Burst Length = 1
tRCtRC(min) ,tCCtCC(min),IOL= 0 mA
1,3
ICC2P 2 CKE VIL(max),tCC=15ns
Precharge Standby
Current in power-
down mode ICC2PS 2
mA
CKE VIL(max),CLK VIL(max), tCC =
3
ICC2N 20 CKE VIH(min), CS VIH(min),tCC=15ns
Input signals are changed one time during 30ns
Precharge Standby
Current in non
power-down mode
ICC2NS 8
mA
CKEVIH(min),CLK VIL(min),tCC=
Input signals are stable
3
ICC3P 5 CKE VIL(max),tCC=15ns
Active Standby
Current in power-
down mode ICC3PS 4
mA
CKE VIL(max),CLK VIL(max),tCC=
3
ICC3N 30 CKEVIH(min), CS VIH(min),tCC=15ns
Input signals are changed one time during 30ns
Active Standby
Current in non
power-down mode
(One Bank Active) ICC3NS 20
mA
CKEVIH(min),CLK VIL(min),tCC=
Input signals are stable
3
150 130 125 120 110 CAS Latency 3
Operating Current
(Burst Mode) ICC4
150 130 125 120 110
mA
CAS Latency 2
IOL=0 mA,Page Burst
All Band Activated
tCCD= tCCD(min)
1,3
Refresh Current ICC5 150 130 125 120 110 mA
tRC tRC(min) 2,3
Self refresh
Current ICC6 2 mA
CKE 0.2V
Note: 1. Measured with output open. Addresses are changed only one time during tCC(min) .
2. Refresh period is 64ms. Addresses are changed only one time during tCC(min) .
3. tCC : Clock cycle time.
tRC : Row cycle time.
tCCD : Column address to column address delay time.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 6 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
AC OPERATING CONDITIONS
(VDD=3.3V ±0.3V ,TA= 0 to 70°C)
Parameter Value Unit
Input levels (VIH/VIL) 2.4 / 0.4 V
Input timing measurement reference level 1.4 V
Input rise and fall time tr / tf = 1 / 1 ns
Output timing measurement reference level 1.4 V
Output load condition See Fig.2
3.3V
1200 ohm
Output
870 ohm
30pf
VOH(DC)=2.4,IOH=-4mA
VOL(DC)=0.4,IOL=4mA
ZO=50 ohmOutput
50 ohm
Vtt=1.4v
30pf
(Fig.1) DC Output Load Circuit (Fig.2)AC Output Load Circuit
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P. 7 Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
OPERATING AC PARAMETER
(AC opterating conditions unless otherwise noted) Speed Version
Parameter Symbol
-6 -7 -7.5 -8 -10
Unit Note
Row active to row active delay tRRD(min) 12 14 15 16 20 ns 1
RAS to CAS delay tRCD(min) 15 15 18 20 20 ns 1
Row precharge time tRP(min) 15 15 20 20 20 ns 1
tRAS(min) 42 42 45 48 50 ns 1
Row active time tRAS(max) 120K ns
Row cycle time tRC(min) 60 63 65 68 70 ns 1
Last data in to new col. Address delay tCDL(min) 1 CLK 2
Last data in to row precharge tRDL(min) 2 CLK 2
Last data in to burst stop tBDL(min) 1 CLK 2
Col. Address to col. Address delay tCCD(min) 1 CLK 3
CAS latency=3 1
Number of valid output data CAS latency=2 1 ea 4
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required
with clock cycle time and then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
The earliest a precharge command can be issued after a Read command without the loss of data is
CL + BL-2 clocks.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.8
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
AC CHARACTERISTICS
(AC opterating conditions unless otherwise noted)
-6 -7 -7.5 -8 -10
Parameter Symbol Min Max Min Max Min Max Min Max Min Max Unit Note
CAS Latency = 3 6 1K 7 1K 7.5 1K 8 1K 10 1K
CLK cycle time CAS Latency = 2 tCC 8 9 9 10 10 ns 1
CAS Latency = 3 - 5.5 - 6 6 - 6 - 7 ns
CLK to valid
Output delay CAS Latency = 2 tSAC - 6 - 6 6 - 7 - 9 ns 1
Output data hold time tOH 2 2.5 2.5 2.5 2.5 ns 2
CLK high pulse width tCH 2 2.5 2.5 3 3 ns 3
CLK low pulse width tCL 2 2.5 2.5 3 3 ns 3
Input setup time tSS 1.5 1.75 1.75 2 2.5 ns 3
Input hold time tSH 1 1 1 1 1 ns 3
CLK to output in Low-Z tSLZ 1 1 1 1 1 ns 2
CAS Latency = 3 - 5.5 - 6 6 - 6 - 7 ns
CLK to output in
Hi-Z CAS Latency = 2 tSHZ - 6 - 6 6 - 7 - 9 ns
Note: 1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns,(tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf)=1ns.
If tr & tf is longer than 1ns,transient time compensation should be considered,
i.e.,[(tr+tf)/2-1]ns should be added to the parameter.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.9
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
FREQUENCY vs. AC PARAMETER RELATIONAHIP TABLE
T4312816A-6S (Unit : number of clock)
tRC tRAS tRP tRRD tRCD tCCD tCDL tRDL
Frequency CAS
Latency 60ns 42ns 15ns 12ns 15ns 6ns 6ns 12ns
166MHz(6.0ns) 3 10 7 3 2 3 1 1 2
143MHz(7.0ns) 3 9 6 3 2 3 1 1 2
125MHz
(
8.0ns
)
2 9 6 2 2 2 1 1 2
111MHz(9.0ns) 2 7 5 2 2 2 1 1 2
100MHz
(
10.0ns
)
2 7 5 2 2 2 1 1 2
T4312816A-7S (Unit : number of clock)
tRC tRAS tRP tRRD tRCD tCCD tCDL tRDL
Frequency CAS
Latency 63ns 42ns 15ns 14ns 15ns 7ns 7ns 14ns
143MHz(7.0ns) 3 9 6 3 2 3 1 1 2
125MHz(8.0ns) 3 9 6 2 2 2 1 1 2
111MHz
(
9.0ns
)
2 8 5 2 2 2 1 1 2
100MHz(10.0ns) 2 7 5 2 2 2 1 1 2
83MHz
(
12.0ns
)
2 6 4 2 2 2 1 1 2
T4312816A-7.5S (Unit : number of clock)
tRC tRAS tRP tRRD tRCD tCCD tCDL tRDL
Frequency CAS
Latency 65ns 45ns 20ns 15ns 18ns 7.5ns 7.5ns 15ns
133MHz(7.5ns) 3 9 6 3 2 3 1 1 2
125MHz(8.0ns) 3 9 6 3 2 3 1 1 2
111MHz
(
9.0ns
)
2 8 5 3 2 2 1 1 2
100MHz(10.0ns) 2 7 5 2 2 2 1 1 2
83MHz
(
12.0ns
)
2 6 4 2 2 2 1 1 2
T4312816A-8S (Unit : number of clock)
tRC tRAS tRP tRRD tRCD tCCD tCDL tRDL
Frequency CAS
Latency 68ns 48ns 20ns 16ns 20ns 8ns 8ns 16ns
125MHz(8.0ns) 3 9 6 3 2 3 1 1 2
111MHz(9.0ns) 3 9 6 3 2 3 1 1 2
100MHz
(
10.0ns
)
2 7 5 2 2 2 1 1 2
83MHz(12.0ns) 2 6 4 2 2 2 1 1 2
75MHz
(
13.0ns
)
2 6 4 2 2 2 1 1 2
T4312816A-10S (Unit : number of clock)
tRC tRAS tRP tRRD tRCD tCCD tCDL tRDL
Frequency CAS
Latency 70ns 50ns 20ns 20ns 20ns 10ns 10ns 20ns
100MHz(10.0ns) 2 7 5 2 2 2 1 1 2
83MHz(12.0ns) 2 7 5 2 2 2 1 1 2
75MHz
(
13.0ns
)
2 6 4 2 2 2 1 1 2
66MHz(15.0ns) 2 6 4 2 2 2 1 1 2
60MHz
(
16.7ns
)
2 5 3 2 2 2 1 1 Note 1
Note : 1. tRDL 16.7ns is recommended for T4312816A
2. Clock count formula : clock periodclock
valuebase (round off whole number).
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Preliminary T4312816A
TM Technology Inc. reserves the right P.10
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MODE REGISTER
11 10 9 8 7 6 5 4 3 2 1 0
0 0 0 0 1
JEDEC Standa rd Test Set (refresh counter test)
11 10 9 8 7 6 5 4 3 2 1 0
x x 1 0 0 LTMODE WT BL Burst Read and Single Write (for Write Through Cache)
11 10 9 8 7 6 5 4 3 2 1 0
1 0 Use in future
11 10 9 8 7 6 5 4 3 2 1 0
x x x 1 1 v v v v v v v
Vender Specific
11 10 9 8 7 6 5 4 3 2 1 0 v = Valid
0 0 0 0 0 LTMODE WT BL Mode Register Set x = Don’t care
Bit2-0 WT=0 WT=1
000 1 1
001 2 2
010 4 4
011 8 8
100 R R
101 R R
110 R R
Burst length
111 Full page R
0 Sequential
Wrap type 1 Interleave
Bit6-4 CAS Latency
000 R
001 R
010 2
011 3
100 R
101 R
110 R
Latency mode
111 R
Remark R : Reserved
Mode Register Write Timing
CLOCK
CKE
CS
RAS
CAS
WE
A0-A11
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Preliminary T4312816A
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Burst Length and Sequence
(Burst of Two)
Starting Address
(column address A0 binary) Sequential Addressing
Sequence (decimal) Interleave Addressing
Sequence (Decimal)
0 0,1 0,1
1 1,0 1,0
(Burst of Four)
Starting Address
(column address A1-A0 binary) Sequential Addressing
Sequence (decimal) Interleave Addressing
Sequence (Decimal)
00 0,1,2,3 0,1,2,3
01 1,2,3,0 1,0,3,2
10 2,3,0,1 2,3,0,1
11 3,0,1,2 3,2,1,0
(Burst of Eight)
Starting Address
(column address A2-A0 binary) Sequential Addressing
Sequence (decimal) Interleave Addressing
Sequence (Decimal)
000 0,1,2,3,4,5,6,7 0,1,2,3,4,5,6,7
001 1,2,3,4,5,6,7,0 1,0,3,2,5,4,7,6
010 2,3,4,5,6,7,0,1 2,3,0,1,6,7,4,5
011 3,4,5,6,7,0,1,2 3,2,1,0,7,6,5,4
100 4,5,6,7,0,1,2,3 4,5,6,7,0,1,2,3
101 5,6,7,0,1,2,3,4 5,4,7,6,1,0,3,2
110 6,7,0,1,2,3,4,5 6,7,4,5,2,3,0,1
111 7,0,1,2,3,4,5,6 7,6,5,4,3,2,1,0
Full page burst is an extension of the above tables of Sequential Addressing, with the length being 512 for
8Mx16 divice.
POWER UP SEQUENCE
1. Apply power and start clock, attempt to maintain CKE = ‘H’ , L(U)DQM = ‘H’ and the other pin are NOP
condition at the inputs.
2. Maintain stable power, stable clock and NOP input condition for a minimum of 200us.
3. Issue precharge commands for all banks of the devices.
4. Issue 2 or more auto-refresh commands.
5. Issue mode register set command to initalize the mode register.
Cf.) Sequence of 4 & 5 is regardless of the order.
TE
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tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.12
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
SIMPLIFIED TRUTH TABLE
COMMAND CKEn-1 CKEn
CS RAS CAS WE DQM BA
0,1 A10/AP A9~A0,
A11 Note
Register Mode Register Set H X L L L L X X 1,2
Auto Refresh H
Entry H L L L L H X X 3
L H H H
Refresh Self
Refresh Exit L H
H X X X X X 3
Bank Active & Row Address H X L L H H X V Row Address
Auto Precharge Disab le L
Read Column
Address Auto Precharge Enable H X L H L H X V
H
Column
Address
(A0~A8) 4,5
Auto Precharge Disab le L
Write & Column
Address Auto Precharge Enable H X L H L L X V H
Column
Address
(A0~A8) 4,5
Burst Stop H X L H H L X X 6
Bank Selection V L
Precharge Both Banks H X L L H L X
X H 4
H X X X Entry H L
L V V V X
Clock Suspend or
Active Power Down Exit L H X X X X X X
H X X X Entry H L
L H H H X
H X X X
Precharge Power Down
Mode Exit L H
L V V V X X
DQM H X V
X 7
H H X X X
No Operation Command H X L H H H X X
(V=Valid , X=Don’t Care , H=Logic High , L=logic Low)
Notes :
1. OP Code : Operation Code. A0~A11 , BA0~BA1 : Program keys.(@MRS)
2. MRS can be issued only at both banks precharge state. A new command can be issued after 2 clock cycle of MRS.
3. Auto refresh functions are as same as CBR refresh of DRAM. The automatical precharge without row
precharge command is meant by ‘Auto’. Auto / self refresh can be issued only at both banks precharge state.
4. BA0~BA1 : Bank select address.
If both BA0 and BA1 are ’Low’ : at read , write , row active and precharge , bank A is selected.
If both BA0 is ‘Low’ and BA1 is ‘High’ : at read , write , row active and precharge , bank B is selected.
If both BA0 is ‘High’ and BA1 is ‘Low’ : at read , write , row active and precharge , bank C is selected.
If both BA0 and BA1 are ’High’ : at read , write , row active and precharge , bank D is selected
If A10/AP is ‘High’ : at row precharge , BA0 and BA1 ignored and all banks are selected.
5. During burst read or write with auto precharge , new read/write command cannotbeissued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK masks the data-in at the very CLK (Write DQM latency is 0),
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)
TE
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Preliminary T4312816A
TM Technology Inc. reserves the right P.13
Publication Date: APR. 2003
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Single Bit READ - Write Cycle (Same Page) @CAS Latency=3,Burst Length=1
CLOCK
CK E
CS
RA S
CA S
ADDR
BA
A10/AP
DQ
WE
DQ M
012345678910111213141516171819
tCH
tCC
tCL
HIGH
tRAS
tRC
*Note1 tSH
tSS tRP
tRCD
tSH
tSS tCCD
*Note2 *Note2.
3*Note2.
3*Note2.
3*Note4 *Note2
tSH
tSS
tSS
tSH tSS
tSH
*Note3 *Note3 *Note3 *Note4
tRAC
tSRC
tSLZ tOH tSS
tSH
tSH
tSS
tSH
tSS
Row A ctive Read W rite Read Precharge Row Active
Ra Ca Cb Cc Rb
Bs Bs Bs Bs Bs Bs
RbRa
Qa Db Qc
:Do n 't care
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Preliminary T4312816A
TMemory Technology Inc. reserves the right P.14
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*note : 1. All input expect CKE & DQM can be don’t care when CS is high at the CLK high going edge.
2. Bank active & read/write are controlled by BA0 – BA1.
BA0 BA1 Active & Read/Write
0 0 Bank A
1 0 Bnak B
0 1 Bank C
1 1 Bnak D
3. Enable and disable auto precharge function are controlled by A10/AP in read/wirte command.
A10 Auto-Precharge
0 Disable (End of burst)
1 Enable (End of burst)
BA0 BA1 Operation
0 0 Enable read/write command for bank A .
1 0 Enable read/write command for bank B .
0 1 Enable read/write command for bank C .
1 1 Enable read/write command for bank D .
4. A10/AP and BA control bank precharge when precharge command is asserted.
A10/AP BA0 BA1 precharge
0 0 0 Bank A
0 1 0 Bank B
0 0 1 Bank C
0 1 1 Bank D
1 X X All Bamks
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Preliminary T4312816A
TM Technology Inc. reserves the right P.15
Publication Date: APR. 2003
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Power Up Sequence
CLOCK
C KE
C S
R AS
C AS
ADDR
B A
A10/AP
DQ
WE
DQM
012345678910111213141516171819
tCCD
H igh level is necessary
tRP tRC tRC
Key RAa
Key
Key RAa
H igh level is necessary
High-Z
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
Precharge
A ll Ban k s Auto
Refresh A uto Refresh M ode R egister Set (A-Bank)
Row
Active
:D on't care
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Preliminary T4312816A
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Read & Write Cycle at Same Bank @Burst Length = 4
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
CL = 2
CL = 3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
tRC
D Q M
D Q
:D on't care
*Note1
tRCD
*Note2
*Note4
*Note3
*Note3 *Note4
Ra Ca0 Rb Cb0
RbRa
Qa0 Qa1 Qa2 Qa3
Qa0 Qa1 Qa2 Qa3
Db0
Db0
Db1
Db1
Db2
Db2
Db3
Db3
tRAC
tSAC
tOH
tOH
tSAC
tSHZ
tSHZ
tRDL
tRDL
Row
A c tive (A -
Bank)
R ead (A -
Bank) Precharg
e (A -
Bank)
Row Active
(A-Bnak) W rite ( A-
Bnak) Precharge
(a-Bnak)
*Note : 1. Minimum row cycle times is requiqed to complete internal DRAM operation.
2. Row precharge can interrupt burst on any cycle. [CAS Latency-1] number of valid output data is
available after Row precharge. Last valid output will be Hi-Z(tSHZ) after the clock.
3. Access time from Row active command. tCC*(tRCD+CAS latency-1)+tSAC
4. Output will be Hi-Z after the end of burst.(1,2,4,8 bit burst)
Burst can’t end in Full Page Mode.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.17
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Page Read & Write Cycle at Same Bank @ Burst Length = 4
CLOCK
C K E
C S
R A S
C A S
ADDR
B A
A10/AP
C L =2
C L =3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
tCCD
D Q M
D Q
:D on't care
Row Active
(A-Bnak) R ead (A -
Bnak) R ead (A -
Bnak) W rite (A -
Bnak) W rite (A -
Bnak) Precharge
(A-Bnak)
*Note1
*Note3
*Note2
tRCD
tRDL
tCDL
Ra Ca0 Cb0 Cc0 Cd0
Qa0 Qa1
Qa0 Qa1
Qb0
Qb0
Qb1 Qb2
Qb1
Dc0 Dc1
Dc0 Dc1
Dd0 Dd1
Dd0 Dd2
*Note : 1. To write data before burst read ends, DQM should be asserted three cycle prior to write command to
avoid bus contention.
2. Row precharge will interrupt writing. Last data input, tRDL before Row precharge, will be written.
3. DQM should mask invalid input data on precharge command cycle when asserting precharge before
end of burst. Input data after Row precharge cycle will be masked internally.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.18
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Page Read Cycle at Different Bank @ Burst Length = 4
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
CL = 2
CL = 3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
D Q M
D Q
:D on't care
*Note1
*Note2
RAa CAa RBb CBb CAc CBd CAe
RAa RBb
QAa0 QAa1 QAa2 QAa3
QAa0 QAa1 QAa2 QAa3
QBb0
QBb0
QBb1 QBb2 QBb3
QBb1 QBb2 QBb3
QAc0 QAc1
QAc0 QAc1
QBd0
QBd0
QBd1
QBd1
QAe0
QAe0
QAe1
QAe1
Row Active
(A-Bank) Read (A -
Bank)
Row Active
(B-B ank)
R ead (B -
Bank) Read (A -
Bank) Read (B -
Bank) Read (A -
Bank) Precharge
(A-Bank)
*Note : 1. CS can be don’t cared when RAS,CAS and WE are high at the clock high going edge.
2. To interrupt a burst resd by row precharge, both the read and the precharge banks must be the same.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.19
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Page Write cycle at Different Bank @ Burst Length = 4
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
DQ
W E
DQM
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
:D on't care
Row Active
(A-Bank)
Write (A-
Bank)
Row Active
(B-Bank) Write (B-
Bank) Write (A-
Bank) Write (B-
Bank) Precharge
(A-Bank)
*Note1
*Note2
tCDL tRDL
RAa CAa RBb CBb CAc CBd
RAa RBb
DAa0 DAa1 DAa2 DAa3 DBb0 DBb1 DBb2 DBb3 DAc0 DAc1 DBd0 DBd1
*Note : 1. To interrupt burst write by row precharge, DQM should be asserted to mask invalid input data.
2. To interrupt burst write by row precharge, both the write and the precharge banks must be the same.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.20
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Read & Write Cycle at Different Bank @ Burst Length = 4
CLOCK
CK E
CS
RA S
CA S
ADDR
BA
A10/AP
CL =2
CL =3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
D Q M
D Q
:D on't care
QAa0
RAa CAa RBb CBb RAc CAc
RAa RBb RAc
QAa1 QAa2 QAa3
QAa0 QAa1 QAa2 QAa3
DBb0 DBb1 DBb2 DBb3
DBb0 DBb1 DBb2 DBb3
QAc0
QAc0
QAc1 QAc2
QAc1
*Note1
tCDL
Row Active
(A-Bank) Read (A -
Bank) Row Active
(B-B ank) Precharge
(A-Bank) W rite ( B-
Bank)
Row Active
(A-Bank)
R ead (A -
Bank)
*Note : 1. tCDL should be met to complete write.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.21
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Read & Write Cycle with Auto Precharge @ Burst Length = 4
CLOCK
C K E
C S
R A S
C A S
ADDR
B A
A10/AP
C L =2
C L =3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
D Q M
D Q
:D on't care
Row Active
(A-Bank) Row Active
(B-Bank)
R e ad w ith A u to
precharge (A-
Bank)
CL=2 Auto
Precharge S tart
P o in t ( A -B a n k )
CL=3 Auto
Precharge S tart
P o in t ( A -B a n k )
W rite w ith Au to
Precharge (B -
Bank)
Auto Precharge
S tart P o in t (A -
Bank)
Ra Rb Ca Cb
Ra Rb
Qa0 Qa1 Qa2 Qa3
Qa0 Qa1 Qa2 Qa3
Db0
Db0
Db1
Db1
Db2
Db2
Db3
Db3
*Note : 1. tCDL should be controlled to meet minimum tRAS before internal precharge start.
(In the case of Burst Length = 1 & 2 and BRSW mode)
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.22
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Clock suspension & DQM Operation Cycle @ CAS Latency = 2 ,Burst Length = 4
CLOCK
CKE
C S
RAS
CAS
ADDR
B A
A10/AP
D Q
W E
DQM
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
:Don't care
Row Active Read Clock
Suspension Read Read QDM Write
Write QDMClock
Suspension
Write QDM
*Note3
Ra Ca Cb Cc
Ra
Qa0 Qa1 Qa2 Qa3 Qb0 Qb1 Dc0 Dc2
tSHZ
tSHZ
*Note 1. DQM is needed to prevent bus contention.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.23
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Read Interrupted by Precharge Command & Read Burst Stop Cycle @ Burst Length=Full Page
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
CL = 2
CL = 3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
D Q M
D Q
:D on't care
RAa CAa CAb
RAa
QAa0 QAa1 QAa2 QAa3 QAa4
QAa0 QAa1 QAa2 QAa3 QAa4
QAb0
QAb0 QAb1
QAb1 QAb2 QAb3
QAb2
QAb4
QAb3
QAb5
QAb4 QAb5
*Note2 1
2 2
1
Row Active
(A-Bank) Read (A -
Bank) Read (A -
Bank)
Burst Stop Precharge
(A-Bank)
*Note : 1. Burst can’t end in full page mode, so auto precharge can’t issue.
2. About the valid DQs after burst stop, it is same as the case of RAS interrupt.
Both cases are illustrated above timing diagram. See the lable 1,2 on them.
But at burst write, burst stop and RAS interrupt should be compared carefully.
Refer the timing diagram of ‘Full Page write burst stop cycle’.
3. Burst stop is valid at every burst length.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.24
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Write Interrupted by Prechareg Command & Write Burst Stop Cycle @ Burst Length=Full Page
CLOCK
CKE
C S
RAS
CAS
ADDR
B A
A10/AP
D Q
W E
DQM
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
:Don't care
Row Active
(A-Bank) Write (A-
Bank) Burst Stop W rite (A-
Bank) Precharge
(A-Bank)
RAa CAa CAb
RAa
DAa0 DAa1 DAa2 DAa3 DAa4 DAb0 DAb1 DAb2 DAb3 DAb4 DAb5
*Note3
tBDL tRDL
*Note : 1. Burst can’t end in full page mode, so auto precharge can’t issue.
2. Data-in at the cycle of interrupted by precharge can not be written into the corresponding memory cell.
It is defined by AC parameter of tRDL.
DQM at write interrupted by precharge command is needed to prevent invalid write.
Input data after Row precharge cycle will be masked internally.
3. Burst stop is valid at every burst length.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.25
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Burst Read Single bit Write Cycle @ Burst Length = 2
CLOCK
CK E
CS
RA S
CA S
ADDR
BA
A10/AP
CL =2
CL =3
W E
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
HIGH
D Q M
D Q
:D on't care
*Note2
RAa CAa RBb CAb RAc CBc CAd
RAa RBb RAc
DAa0
DAa0
DAb0
DAb0
DAb1
DAb1 DBc0
DBc0 DAd0 DAd1
DAd0 DAd1
Row Active
(A-Bank)
W rite (A -
Bank)
Row Active
(A-Bank)
R ea d w ith Au to
Prech arge (A -
Bank)
Row Active
(A-Bank) W rite w ith Au to
Prech arge (A -
Bank)
R ead (A -
Bank) Precharge
(A-Bank)
*Note : 1. BRSW modes is enabled by setting A9 ‘High’ at MRS (Mode Register Set).
At the BRSW Mode, the burst length at write is fixed to ‘1’ regardless of programmed burst length.
2. When BRSW write command with auto precharge is executed, keep it in mind that tRAS should not
be violated.
Auto precharge is executed at the next cycle of burst-end, so in the case of BRSW write command,
the precharge command will be issued after two clock cycle.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.26
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Active/ Precharge Power Down Mode @ CAS latency = 2, Butsr length = 4
CLOCK
C KE
C S
R AS
C AS
ADDR
B A
A10/AP
D Q
WE
DQM
0 1 2 3 4 5 6 7 8 9 10111213141516171819
:Do n't c ar e
Precharge
Power-
Down Entry
Precharge
Power-
Down Exit
Row Active
Active
Power-
Down Entry
Active
Power-
Down Exit
Read Precharge
Qa0 Qa1 Qa2
Ra Ca
Ra
tSHZ
SS
tsstsstss
*Note1
*Note3
*Note2
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
*Note : 1. Both banks should be in idle state prior to entering precharge power down mode.
2. CKE should be set high at least 1CLK+tSS prior to Row active command.
3. Can not violate minimum refresh specification.(64ms)
TE
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Preliminary T4312816A
TM Technology Inc. reserves the right P.27
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Self Refresh Entry & Exit Cycle
CLOCK
CKE
C S
RAS
CAS
ADDR
B A
A10/AP
D Q
W E
DQM
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
:D on't care
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
*Note2
*Note1
*Note3
*Note4
*Note6
*Note7
*Note5
tSS
tRCmin
Hi-z
S e lf R e fr es h E n try S e lf R e fr es h E x it A u to R e fresh
Hi-z
*Note : TO ENTER SELF REFRESH MODE
1. CS ,RAS & CAS with CKE should be low at the same clock cycle.
2. After 1 clock cycle, all the inputs inculding the system clock can be don’t care except for CKE.
3. The device remains in self refresh mode as long as CKE stays ‘Low’.
Cf.) Once the device enters self refresh mode, minimum tRAS is required before exit from self refresh.
TO EXIT SELF REFRESH MODE
4. System clock restart and be stable before returning CKE high.
5. CS starts from high.
6. Minimum tRC is required after CKE going high to complete self refresh exit.
7. 2K cycle of burst auto refresh is required before self refresh entry and after self refresh exit if the
system uses burst refresh.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.28
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
Mode Register Set Cycle Auto Refresh Cycle
CLOCK
CKE
CS
RAS
CAS
ADDR
DQ
W E
DQM
0123456 012345678910
:D on't care
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
SS
*Note2
*Note1
*Note3
tRPC
Auto Refresh New CommandMRS New Command
Hi-z
Key Key
Hi-z
HIGH
HIGH
*Both banks precharge should be completed before Mode Register Set cycle and auto refresh cycle.
MODE REGISTER SET CYCLE
*Note : 1. CS ,RAS,CAS & WE activation at the same clock cycle with address key will set internal
mode register.
2. Minimum 2 clock cycles should be met before new RAS activation.
3. Please refer to Mode Register Set table.
TE
CH
tm
Preliminary T4312816A
TM Technology Inc. reserves the right P.29
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
PACKAGE DIMENSIONS
54 LEAD TSOP -II (400 mil)
D
2854
127
E1 E
A
A2
B
A1
C
B1
θ
Dimension in mm Dimension in inch
Symbol Min Nom Max Min Nom Max
A - - 1.2 - - 0.047
A1 0.4 0.5 0.6 0.016 0.020 0.024
A2 - 0.15 - 0.006
B 0.24 0.32 0.40 0.009 0.012 0.016
B1 - 0.8 - 0.0315
C 0.05 0.10 0.15 0.002 0.004 0.006
D 22.12 22.22 22.62 0.871 0.875 0.905
E 11.56 11.76 11.96 0.455 0.463 0.471
E1 10.06 10.16 10.26 0.396 0.400 0.404
θ 0 - 8 0 - 8