5962-9220202MEA - Integrated Device Technology, Inc.

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE MILITARY AND INDUSTRIAL TEMPERATURE RANGE

AUGUST 2000

1999 Integrated Device Technology, Inc. DSC-2566/5c

IDT54/74FCT139T/AT/CT

MILITARY AND INDUSTRIAL TEMPERATURE RANGE

FAST CMOS

1-OF-4 DECODER

WITH ENABLE

DESCRIPTION:

The IDT54/74FCT139T is a dual 1-of-4 decoder built using an advanced

dual metal CMOS technology. These devices have two independent

decoders, each of which accept two binary weighted inputs (A0-A1) and

provide four mutually exclusive active low outputs (O0-O3). Each decoder

has an active low enable (E). When E is high, all outputs are forced high.

FUNCTIONAL BLOCK DIAGRAM

EaA0a A1a

O0a O1a O2a O3a

EbA0b A1b

O0b O1b O2b O3b

FEATURES:

− Std., A and C speed grades

− Low input and output leakage ≤1µA (max.)

− CMOS power levels

− True TTL input and output compatibility

• VOH = 3.3V (typ.)

• VOL = 0.3V (typ.)

− High drive outputs (-15mA IOH, 48mA IOL)

− Meets or exceeds JEDEC standard 18 specifica tions

− Military product compliant to MIL-STD-883, Class B and DESC

listed (dual marked)

− Power off disable outputs permit “live insertion”

− Available in the following packages:

• Industrial: SOIC, QSOP

• Military: CERDIP, LCC, CERPACK

MILITARY AND INDUSTRIAL TEMPERATURE RANGE

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE

10 11 12 13

1920

L20-2 NC

A0b

A1b

O0b

O1b

GND

INDEX

A1a

O0a

O2a

O1a

D16-1

SO16-1

SO16-7

E16-1

A0a

GND

O3a

A1a

A0b

A1b

O0b

O1b

O2b

O3b

VCC

O0a

O1a

O2a

LCC

TOP VIEW

CERDIP/ SOIC/ QSOP/ CERPACK

TOP VIEW

PIN DESCRIPTION

Pin Names Description

A0, A1Address Inputs

EEnable Input (Active LOW)

O0 - O3Outputs (Active LOW)

FUNCTION TABLE (1)

Inputs Outputs

HXXH H H H

LLLLHHH

LHLH L H H

LLHHH L H

LHHH H H L

NOTE:

1. H = HIGH Voltage Level

L = LOW Voltage Level

X = Don’t Care

PIN CONFIGURATION

ABSOLUTE MAXIMUM RATINGS(1)

Symbol Rating Max. Unit

VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V

VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V

TSTG Storage Temperature –65 to +150 °C

IOUT DC Output Current –60 to +120 mA

8T-link

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM

RATINGS may cause permanent damage to the device. This is a

stress rating only and functional operation of the device at these or

any other c onditions above t hose indicated in the operational s ections

of this specification is not implied. Exposure to absolute maximum

rating conditions for extended periods may affect reliability. No

terminal voltage may exceed V cc by +0. 5V unless otherwise noted.

2. Input s and Vcc terminals onl y.

3. Output s and I/O t erm i nal s only.

CAPACITANCE (TA = +25OC, f = 1.0MHz)

Symbol Parameter(1) Conditions Typ. Max. Unit

CIN Input Capacitance VIN = 0V 6 10 pF

COUT Output Capacitance VOUT = 0V 8 12 pF

8T-link

NOTE:

1. This paramet er i s measured at characteri zation but not test ed.

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE MILITARY AND INDUSTRIAL TEMPERATURE RANGE

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified:

Industrial: TA = -40°C to +85°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V

VIL Input LOW Level Guaranteed Logic LOW Lev el — — 0.8 V

IIH Input HIGH Current(4) VCC = Max. VI = 2.7V — — ±1 µA

IIL Input LOW Current(4) VCC = Max. VI = 0.5V — — ±1 µA

IIInput HIGH Current(4) VCC = Max., VI = VCC (Max.) — — ±1 µA

VIK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V

IOS Short Circuit Current VCC = Max.(3), VO = GND –60 –120 –225 mA

VOH Output HIGH Voltage VCC = Min.

VIN = VIH or VIL IOH = –6mA MIL

IOH = –8mA IND 2.4 3.3 — V

IOH = –12mA MIL

IOH = –15mA IND 23—V

OL Output LOW Voltage VCC = Min.

VIN = VIH or VIL IOL = 32mA MIL

IOL = 48mA IND —0.30.5V

HInput Hysteresis —— 200 — mV

ICC Quiescent Power Supply Current VCC = Max.

VIN = GND or VCC —0.011 mA

NOTES:

1. For conditi ons shown as Max. or Min., use appropriate value s pecified under E l ectrical Characteristics f or the applicabl e device t ype.

2. Typical values are at VCC = 5.0V, +25° C am bi ent and m aximum l oadi ng.

3. Not more than one out put should be s hort ed at one time. Duration of the short c i rcuit test shoul d not exceed one second.

4. The test limit for this parameter is ±5µA at TA = -55°C.

MILITARY AND INDUSTRIAL TEMPERATURE RANGE

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE

POWER SUPPLY CHARACTERISTICS

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

∆ICC Quiescent Power Supply Current

TTL Inputs HIGH VCC = Max.

VIN = 3.4V(3) —0.52mA

CCD Dynamic Power Supply Current(4) VCC = Max.

Outputs Open

One Bit Toggling

50% Duty Cycle

VIN = VCC

VIN = GND — 0.15 0.3 mA/

MHz

ICTotal Power Supply Current(6) VCC = Max.

Outputs Open

fo = 10MHz

VIN = VCC

VIN = GND —1.54mA

50% Duty Cycle

One Input and

One Output Toggling

VIN = 3.4V

VIN = GND —1.85

CC = Max.

Outputs Open

fo = 10MHz

VIN = VCC

VIN = GND —37

(5)

50% Duty Cycle

One Input Toggling

on Each Decoder

Two Outputs Toggling

VIN = 3.4V

VIN = GND —3.59

(5)

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC + ∆ICC DHNT + ICCD (fONO)

ICC = Quiescent Current

∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)

fO = Output Frequency

NO = Number of Outputs at fO

All currents are in milliamps and all frequencies are in megahertz.

SWITCHING CHARACTERISTICS OVER OPERATING RANGE

FCT139T FCT139AT FCT139CT

Ind. Mil. Ind. Mil. Ind. Mil.

Parameter Description Condition(1) Min. (2) Max.Min. (2) Max.Min. (2) Max.Min. (2) Max.Min. (2) Max.Min. (2) Max.Unit

tPLH

tPHL Propagation Delay

A0 or A1 to OnCL = 50pF

RL = 500Ω1.5 9 1.5 12 1.5 5.9 1.5 7.8 1.5 5 1.5 6.2 ns

tPLH

tPHL Propagation Delay

E to On1.5 8 1.5 9 1.5 5.5 1.5 7.2 1.5 4.8 1.5 5.8 ns

NOTES:

1. See test circuit and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE MILITARY AND INDUSTRIAL TEMPERATURE RANGE

Pulse

Generator

D.U.T.

VCC

VIN

VOUT

50pF 500Ω

500Ω

7.0V

1.5V

DATA

INPUT

TI MI NG

INPUT

ASYNCHRONOUS C ONTROL

PRESET

CLEAR

ETC.

SYNCHRO NOU S CONTRO L

tSU tH

tREM

tSU tH

HIGH-LOW-HIGH

PULSE

LOW-HIGH-LOW

PULSE

1.5V

SAME PHASE

IN PUT TR ANSITION

1.5V

VOH

tPLH

OUTPUT

OPPOSITE PHASE

IN PUT TR ANSITION

1.5V

tPLH tPHL

tPHL

VOL

CONTROL

INPUT

1.5V

3.5V

OUTPUT

NORMALLY

LOW

OUTPUT

NORMALLY

HIGH

SWITCH

CLOSED

SWITCH

OPEN

VOL

0.3V

tPLZ

tPZL

tPZH tPHZ

3.5V

1.5V

ENABLE DISABLE

VOH

PRESET

CLEAR

CLOCK ENABLE

ETC.

Octal link

TEST CIRCUITS AND WAVEFORMS

PROPAGATION DELAY

TEST CIRCUITS FOR ALL OUTPUTS

ENABLE AND DISABLE TIMES

SET-UP, HOLD, AND RELEASE TIMES PULSE WIDTH

SWITCH POSITION

Test Switch

Open Drain

Disable Low Closed

Enable Low

All Other Tests Open

8-link

DEFINITIONS:

CL = Load capacitance: includes jig and probe capacitance.

RT = Termination resistance: should be equal to ZOUT of the Pulse

Generator.

NOTES:

1. Diagram shown for input Control Enable-LOW and input Control Disable-

HIGH

2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns

MILITARY AND INDUSTRIAL TEMPERATURE RANGE

IDT54/74FCT139T/AT/CT

FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE

CORPORATE HEADQUARTERS for SALES:

2975 Stender Way 800-345-7015 or 408-727-6116

Santa Clara, CA 95054 fax: 408-492-8674

www.idt.com*

*To search for sales office near you, please click the sales button found on our home page or dial the 800# above and press 2.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

ORDERING INFORMATION

ID T X X

Tem p. R ange XXXX

D evice T ype XX

Package X

Process

Dual 1-of-4 Decoder

139T

139AT

139CT

Indu strial Options

S mall Ou tlin e IC (3 00 mil) (S O1 6 -1 )

Q u arte r -siz e S ma ll O u tline Pac k a g e (S O1 6 -7 )

74 – 55 °C to +125°C

– 40 °C to +85°C

M ilita r y Optio ns

CERDIP (D16-1)

CERPACK (E16-1)

Leadless Chip Carrier (L20-2)

Blank

BIndustrial

MIL-S TD-883, Class B

FCT