DICE/DWF SPECIFICATION
1
RH1185MK
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However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
PAD FUNCTION
1.
2.
3.
4.
5.
REF
VIN
VOUT
GND
FB
110mils × 116mils
Backside metal: Alloyed Gold Layer
Backside Potential: VIN Pads 2
DIE CROSS REFERENCE
LTC Finished
Part Number
Order
Part Number
RH1185MK
RH1185MK
RH1185MK DICE
RH1185MK DWF*
Please refer to LTC standard product data sheet for
other applicable product information.
*DWF = DICE in wafer form.
Negative Regulator with
Adjustable Current Limit
DICE/DWF ELECTRICAL TEST LIMITS
V
IN = 7.4V, VOUT = 5V, IOUT = 1mA, RLIM = 4.02k,
unless otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNITS
Reference Voltage (at FB Pin, Note 2) VIN – VOUT = 5V, VOUT = VREF –2.344 –2.37 –2.396 V
Feedback Pin Bias Current VOUT = VREF 2μA
Dropout Voltage (Note 3) IOUT = 0.5A, VOUT = 5V
IOUT = 3A, VOUT = 5V
0.4
1.05
V
V
Line Regulation (Note 6) VIN – VOUT = 1V to 20V, VOUT = 5V 0.01 %/V
Minimum Input Voltage (Note 4) IOUT = 1A, VOUT = VREF 4.5 V
Internal Current Limit (Note 8) VIN – VOUT = 1.5V
VIN – VOUT = 20V
VIN – VOUT = 30V
3.3
1
0.2
4.2
2.6
1
A
A
A
External Current Limit (Note 7) RLIM = 5k, VOUT = 1V
RLIM = 15k, VOUT = 1V
2.7
0.9
3.3
1.1
A
A
Quiescent Supply Current (Note 5) IOUT = 5mA, VOUT = VREF
, 4V ≤ VIN ≤ 25V 3.5 mA
REF Pin Shutoff Current 11 19 μA
1
232
4
4
5
Note 1: Dice are probe tested at 25°C to the limits shown except for high
current tests. Dice are tested under low current conditions which assure
full load current specifi cations when assembled in packaging systems
approved by Linear Technology. For absolute maximum ratings, typical
specifi cations, performance curves and fi nished product specifi cations,
please refer to the standard product RH data sheet.
Note 2: Testing is done using a pulsed low duty cycle technique. See
thermal regulation specifi cations in the LT1185 data sheet for output
changes due to heating effects.
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