1. DATE NOTICE OF REVISION (NOR) (YYMMOD) Form Approved THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. 96-03-22 OMB No. 0704-0788 Public reporting burden for this collection is estimated to average 2 hours per response, inciuding the time for reviewing instructions, searchin existing data 2. PROCURING sources, gathenng and maintaining the dala needed, and completing and reviewing the collection of information. Send comments regarding U is burden ACTIVITY NO. estimate of any other aspect of this collection of information, including suggestions for reducing this burden, to Department of Defense, Washingtion Headquarters Semces, Birectorate for Information Operations and Rep 1215 Jefferson Davis Highway, Suite 1204, Anington, VA 22202-4502, and to the Office of Management and Budget, Paperwork Reduction Project (9704-0188) Washington, OC 20503. 3. DODAAC PLEASE DO NOT RETURN YOUR COMPLETED FORM TO EITHER OF THESE ADDRESSED. RETURN COMPLETED FORM TO THE GOVERNMENT ISSUING CONTRACTING OFFICER FOR THE CONTRACT/ PROCURING ACTIVITY NUMBER LISTED IN ITEM 2 OF THIS FORM. b. ADDRESS (Street, City, State, Zip Code) . CAGE CODE 6. NOR NO. 4, ORIGINATOR Defense Electronics Supply Center 67268 962-R081-96 7 Wilmi tk a. TYPED NAME (First, Middle Initial, Dayton, OF vo4e4. 5765 7.CAGE CODE | 8. DOCUMENT NO. Last) 67268 962-85526 9, TITLE OF DOCUMENT 11. ECP NO. 10, REVISION LETTER N/A MICROCIRCUITS, DIGITAL, 2K X 8 BIT BIPOLAR PROM, MONOLITHIC SILICON b. NEW B a. CURRENT A 12. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES All 13, DESCRIPTION OF REVISION Revisions ltr column; add "B". Revisions description column; add "Changes in accordance with NOR 5962-R081-96". Revisions date column; add "96-03-22", Revision level block; add "8", Rev status of pages; for page 1, add "8". Page 1: Page 1: Add "CURRENT CAGE CODE 67268" as shown on the attached sheet. 14. THIS SECTION FOR GOVERNMENT USE ONLY a. (X one) X {| (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master document shall make above revision and furnish revised document. b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT c. TYPED NAME (First. Middle initiai, Last) DESC-ELDS Michael A. Frye d. TITLE e. SIGNATURE f: DATE SIGNED (YYMMDD) Chief, Microelectronics Michael A. Frye 96-03-22 15a. ACTIVITY ACCOMPLISHING REVISION b. REVISION COMPLETED (Signature) c. DATE SIGNED (YYMMDD} $6-03-22 CESC-ELDS Gary L. Gross DO Form 1695, APR 92 Previous editions are obsolete.y REVISIONS LTR DESCRIPTION DATE APPROVED A |Reword paragraph 4.3.1d. 22 June] j Uf | Update vendor's part numbers. 1987 HG Editorial changes throughout. REV PAGE REV STATUS REV A A A OF PAGES PAGES | oie apals cists hol wizhiahe bist 3 Defense Electronics PREPARED BY ROONLUY This drawing is available for use by Supply Center Dayton, Ohio ECK BY all Departments and Agencies of the Ba . Department of Defense - igi h TITLE: MICROCIRCUITS, DIGITAL, Original date AP E Y 2K X 8 BIT BIPOLAR PROM, MONOLITHIC SILICON of drawing: yp 18 September 1986 SIZE CODE IDENT. NO. DWG NO. A 14933 5962 - 85526 AMSC N/A REV A PAGE 1 OF 16 5962-423 7 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. DESC FORM 193 MAY 86v 1. SCOPE 1.1 Scope. This drawing describes device requirements for class 8 microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices . 1.2 Part number. The complete part number shall be as shown in the following example: 5962-85526 dl J X | | | | | | | | | | | | Drawing number Device type Case outline Lead finish per (1.2.1) (1.2.2) MIL-M-38510 1.2.1 Device types. The device types shall identify the circuit function as follows: Device type Generic number Circuit function Access time 01 27PS191 2048 X 8-bit bipolar PRUM { three-state) 75 ns 02 27PS191A 2048 X 8-bit bipolar PROM (three-state) 65 ns 03 27PS291 2048 X 8-bit bipolar PROM (three-state) 75 ns 04 27PS291A 2048 X 8-bit bipolar PROM (three-state) 65 ns 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows: Outline letter Case outline Diego & > J D-3 (24-lead, 1/2" X 1 1/4"), dual-in-line package ( oy K F-6 (24-lead, 3/8" X 5/8"), flat package { tye L D-9 (24-lead, 1/4" X 1 1/4"), dual-in-line package Qo -} x C-12 (32-terminal, .450" X .550"), rectangular chip Lye ge carrier 3 C-4 (28-terminal, .450" X .450"), square chip aa) carrier lu vy|* G , SIZE CODE IDENT. NO. | OWG NO. MILITARY DRAWING | , 14933 5962-86526 DEFENSE ELECTRONICS SUPPLY CENTER . DAYTON, OHIO REV PAGE 2 DESC FORM 193A * FEB 86> 1.3 Absolute maximum ratings. Supply voltage range- - - Input voltage range Storage temperature range Maximum power dissipation Lead temperature (solderin (Pp) 1/ g, 10 seconds) ~-0.5 V dc to +7.0 V dc -0.5 V de to +5.5 V dc -65C to + 150C 1.02 W 300 C Thermal resistance, junction-to-case (8jc): Cases J, K, L See MIL-M-38510, appendix C Case X- --------------------- 80C/W 3/ Case 3- ----+------------------ 80C /W 3/ DC voltage applied to outputs {except during programming)- - ----------------- -0.5 V to +Ve maximum DC voltage applied to outputs during programming- - 21 V Qutput current into outputs during programming (maximum duration of 1 5) - - - - - - 250 mA DC input current- -------+------+---- -30 mA to +5 mA 1.4 Recommended operating conditions. Supply voltage (Vec)- - - - - - ---------- 4.5 V de minimum to 5.5 V de maximum Minimum high-level input voltage (Vjy)- - - - - - - 2.0 V de Maximum low-level input voltage (V a -- eee ee 0.8 V de Case operating temperature range (Tc) - - - - - - - -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification and standard. Unless otherwise specified, the following specification and standard, of the issue Tisted in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 17 Must withstand the added Py due to short circuit test (e.g., Igs). 2/ Heat sinking is recommended to reduce the junction temperature. 3/ When a thermal resistance value for this case is included in MIL-M-38510, appendix C, that value ~ shall supersede the value indicated herein. SIZE CODE IDENT. NO. DWG NO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 3 DESC FORM 193A FEB 86 xv 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall] be in accordance with 1.2.1 of MIL-STD-883, "provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.2.1 Unprogrammed devices. The truth table for unprogrammed devices shall be as specified on figure 2. 3.2.2.2 Programmed device. The requirements for supplying programmed devices are not part of this drawing. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are aS specified in table I and apply over the full recommended case operating temperature range. arked with the part number listed in 1.2 herein. In addition, the manufacturer's part number may also 3.4 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be pre marked as listed in 6.4 herein. 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in 6.4. The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall state that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.7. Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-383 (see 3.1 neretnt. 3.8 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall] be made available onshore at the option of the reviewer. S SIZE CODE IDENT. NO. |] DOWG NO. MILITARY DRAWING A 14933 . 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PaGe 4 DESC FORM 193A # FEB 86v c~ TABLE I. Electrical performance characteristics. | T T T T Limits | Test | Symbol | Conditions IGroup A |Device | Unit -55C < Tc 125C {subgroups {type ! Tn jax 3 All lz 4 V Output high voltage V Vcc = MIN, 1,2, . PUR ee Vin = or | jie Tt | ot | ] T T T | | | Output low voltage Lor lVcc = MIN, | 1,2,3 1 All| 10.501 V mia Bs perme PS Vin = Vey or V l jo et | i i | | ! T I | | I Input high level Wi |Guaranteed input logical | 1,2,3 [All 12.0 1 1 Vv thigh voltage for all inputs 1/ | | | | | y | T I | Input low level VoL |Guaranteed input logical 1 1,2,3 1 All | jo.8 | V low voltage for all inputs 1/ | | | l | | \ | | | | | ] 1 [ | T T Input low current Nb Voc = MAX, 1 1,2,3 1 All I 1-250] uA Vin = 0.45 V | | l | | | | \ | | | I t T ! I | | | Input high current \IrH \Voc = MAX, | 1,2,3 1aAll | } 40] pA 1 Wry = Yoo | | | | | i | | I l | { > T T T T TTT o~ Output short circuit [Igs Voc = MAX, 1 1,2,3 | AIT 1-15 | -901 mA current {Your = 0.0 V 2/ | | | | \ I | | i | I I | | T T T | T ] i Power supply current | cc lanl inputs = GND 1,2,3 All ! 165 mA \ | | | I | \ I | l | | | i T - I TTT Power down supply lIccp 1CSy = 2.7 V | 1,2,3 ; All I 1 801 mA current | IA1] other inputs = GND | \ I | | \ | | | | | | T I I | | i Input clamp voltage [Vy Voc = MIN, | 1,2,3 {All| |-1.21 V I lIty = -18 mA | \ | | | I i | | | | | | ! | I I | | | Output leakage | Icex lVoc = MAX | Vo = Voc | 1,2,3 1 All | 40] yA current | | { | | | \ Wee = 24 V1 VW = UF Vv ] TOT a8 | j oS! | | | i | See footnotes at end of table. SIZE CODE IDENT. NO. | DWG NO. MILITARY DRAWING | , 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV A PAGE 5 DESC FORM 193A FEB 86 av TABLE I. Electrical performance characteristics - Continued. { | | | { | i | time I I | T T timits T Test | Symbol | conditions Group A |Device | | Unit | | -55C < Tre < #125C |subgroups {type n jax I | | [ I Input capacitance \Crn \Vin = 2.0 Vat f = 1 MHz \ 4 {| All| | 8 | pF | | 3/ | { | | \ | | | | | | \ | | | } | I Output capacitance {Cour |Your = 2.0 V at = 1 MHz 4 | All | 14 F \ | - | | | ln i | I | I I I Address access time Ita, |See figures 4 and 5 | 9,10,11 {O1, 03 | 75140 | | 4/ | (02, 04 | 65 | ds | \ | | \ | | | | box Enable access time Ite \See figures 4 and 5 1 9,10,11 |01, 03 | ns | \ 5/ \ 02, 04 | ns | | | | \ { | I | | | | | Enable recovery time Iter {See figures 4 and 5 1 9,10,11 [01, 03 | | 45 | ns | | 5/ | 02, 04 | | 30 | ns l | \ | | \ \ I I T T I l I Power switched Itaaps |See figures 4 and 5 9,10,11 |01, 03 | | 90 | ns address access | 02, 04 | 75 | ns \ | | | | 1/ These are absolute voltages with respect to device ground pin and include all overshoots due to system and/or tester noise. Do not attempt to test these values without suitable equipment. 2/ Not more than one output should be shorted at a time. Duration of the short circuit should not be more than 1 second. 3/. These parameters are not 100 percent tested, but are tested initially and after any design or process change affecting Czy or Coyt- . 4/ tag is tested with switch S; closed and C, = 30 pF. 5/ tea is tested with C, = 30 pF to the 1.5 V level; Sj is open for high impedance to high tests and closed for high impedance to low tests. tr, is tested with C, = 5 pF. High to high impedance tests are made with Sq open to an output voltage of Vqy -9.5 V with S; open; low-to-high impedance tests are made to the Vg, +0.5 V level with Sy closed. SIZE CODE IDENT. NO} OWG NO. MILITARY DRAWING A 14933 mS 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV | PAGE 6 DESC FORM 193A FEB 86 av Voc Ag Ag Aro CS; CSo CSz Cases J, K, and L 07 0 Og Oy Og 15 16 17 18 19 20 DOI Fifi pif Pid PI) 24 23 22 21 20 19 18 17 16 15 14 13 @:1 2 3 45 6 7 8 9 10 11 12 LWW UUW OUU Do A7 Ag As Aq Az Ad Ay Ag OQ 01 OD GND Case X Ag A? No Ne Veo Ne Ag Case 3 A5 Ae A7 we Veco Ag Ag we | L ! 28 27 26 35 1 catoqwrm O56 !ofdieft ol : ne 47 ng LILI RI EI AW Wa NC Ox Og 05 Oo NC GND 03 NC 04 O5 NOTE: Pin 1 is marked for orientation FIGURE 1. Terminal connections. SIZE CODE IDENT. NO. | DWGNO. MILITARY DRAWING A 14933 s DEFENSE ELECTRONICS SUPPLY CENTER 2362-85526 DAYTON. OHIO REV PAGE 7 DESC FORM 193A FEB 86 a<- 9 ~~ ~ 3 Qa un vo s 3 9 ex |__ wo - 2 3 uw os Lo or = es ee peo lL to |, eS Te so 2 o [s) o o 5S 3 3 uy _ yo oO a o 5 ro] 3 st a Q o o S S 3 3 * - y oe o 3 3 3 fi i re fs cere cee foe ee ere ee er cee Fer ne mm a o e 2 2 o 2 o a eee ee eee - 4 o Oo go o eo So 3} S a o oO oO oS o o Lf S < >< >< ~< <x L_ = } fp fs a os < < >< J Pp -} - F- + - ay ~< < < ~< ~- Ps < > >< = > pe a ao wn <= << os ~< ~< a =e ~ < >< _ Se TT Pat =< ~< >< pep oD >< ~< =< ~ << nn >t > od <x Oo aa rad ~ << =< <t ~m Ww a= -I = x= oO N w = x I x oOo Po ca wn | A i x= oO J .f -_- } - -_ }+- | - _ < = EL =p bp NOTES: ). 1, low level, or open circuit. (high resistance output high leve Not applicable. Input may be Open circuit NA = XY = oc = FIGURE 2. Truth table. wo eC fan] uw uw 9? SS} w a 8 wor a 6 Z o z O O z Po w | > oc wu ST o= 0 uw N q 0 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO DESC FORM 193A ~> FEB 8&6ton. 128 X 128 DECODER PROGRAMMABLE ARRAY 1 OF 16 COLUMN 8X 1 OF 16 MULTIPLEXER DECODER FIGURE 3. Logic diagram. Voc 007 OUTPUT FIGURE 4. Switching test circuit. SIZE CODE IDENT. NO. | DWGNO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 9g DESC FORM 193A FEB 86Ag~ Ato : YW iby x XX . as I | f Nov es af tne al Ey, 05-05 a Wy LU sv Mw HILT vy, 105 SSX, NOTE: Level on output while cS, 5 is high or CS, or rc CS, are low is determined externally. KEY TO SWITCHING WAVEFORMS Waveform WL MIT JK FIGURE 5. Inputs Outputs Must be Will be steady steady May change Will be from H to L changing from H to L May change Will be from L to H changing from L to H Don't care: Changing: any change state permitted unknown Center Does not line is high apply impedance of f-state Switching waveform. MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE CODE IDENT. NO. | OWG NO. A 14933 5962-85526 REV PAGE 10 9 DESC FORM 193A FEB 86 av 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test (method 1015 of MIL-STD-883). (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) Ta = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (Cyy/Coyy measurement) shall be measured only for the initial test and after process or design changes which may affect input capacitance. d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of group A, subgroups 9, 10, and 11. Either of two techniques is acceptable: (1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programnability and ac performance without programming the user array. If this is done, the resulting test pattern shall be verified on all devices during subgroups 9, 10, and 11, group A testing in accordance with the sampling plan specified in MIL-STD-883, method 5005. (2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming (see 3.2.2.1). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's option, the sample may be increased to 24 total devices with no more than four total device failures allowable. Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroup 9, 10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be increased to 20 total devices with no more than four total device failures allowable. SIZE CODE IDENT. NO. DWG NO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO rev A pace it DESC FORM 193A FEB 864.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test (method 1005 of MIL-STD-883) conditions: (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) Ta = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by appendix B of MIL-M-38510 and method 1005 of MIL-STD-883. c. The group C, subgroup sample shall include devices tested in accordance with paragraph 4.3.1d. TABLE II. Electrical test requirements. Subgroups (per method T | MIL-STD-883 test requirements | 5005, table 1) IL/ 4 Tinterfm electrical parameters | (method 5004) TFinal electrical test parameters | I 27, 2, 3, 7 27 3/, | (method 5004) for unprogrammed 8 3/, 9, 10, 11 devices TFinal electrical test parameters | 127, 2, 3, 7 @/ 3/, [{method 5004) for programmed 8 3/, 9, 10, 11 ldevices TGroup A test requirements T, 2, 3, 7 3/, 8 3/, (method 5005) 9, 10, 11 ~ ~ | [Groups C and D end-point lelectrical parameters | (method 5005) 1,2, 3,737, 83 TAddittonal electrical subgroups |for group C periodic inspections | ~~ eS 1/ Any or all subgroups may be combined when using high speed memory testers. 2/ PDA applies to subgroups 1 and 7. 3/ Subgroups 7 and 8 shall consist of verifying the pattern - 4 specified. SIZE CODE IDENT. NO. | DWG NO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO . REV PAGE 12 DESC FORM 193A FEB 86v oN 4.4 Programming procedures for method A. a. Connect the device in the electrical configuration for programming. The waveforms on figure 6 and the programming characteristics of table III shall apply to these procedures. b. Terminate all outputs to Voyp through a pull-up resistor R. c. Apply Vccp to Vcc. d. Connect CS, to Vi_p; connect CS9 and CS3 to Vyyp- e. Address the PROM with the binary address of the selected word to be programmed. f. After a delay of ty, apply Vgp for a duration of tp + rise time of CS, input + tg to the output selected for programming. After a delay of tg + rise time of programmed output, apply Vcsyp for a duration of tp + rise time of programmed output + t3 to the CSq input; CS, is then reduced to Vy ,p. After a delay of tq, opening of the fuse is verified. During verification, Vcc remains unchanged at Vccp. wa . h. The outputs should be programmed one at a time, since the internal decoding circuitry is capable of sinking only one unit of programming current at a time. Note that the PRUM is supplied with fuses generating a low-level logic output. Programming a fuse will cause the output to go to a high level logic in the verify mode. i. Repeat steps 4.4a through 4.4g for all bits to be programmed. j. If any unit does not verify as programmed, it shall be considered a programming reject. TABLE III. Programaing characteristics for method A. | | Conditions | Limits | Test 1 Symbol | Te = +25C | | Unit | { L/ 2/ 3/ 4/ Min ax | | | _ | \ | I I T [ T Vcc during programming | Vecp | 5.0 ! 5.5 | Vv | | | | | | | TT T ] Input high level during | Viyp | |} 2.4 | 5.5 | V programming | | | | | | | | | | | | | | I I T I t Input low level during | Vip | } 0.0 | 0.45 | Vv programming | | | i | | | | \ | | | | I I CS; voltage during | VOS1P | 114.5 | 15.5 | Vv programming | | | | | See footnotes at end of table. SIZE CODE IDENT. NO. | DWG NO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 13 o~ DESC FORM 193A FEB 86v TABLE III. Programming characteristics for method A - Continued. \ | Conditions T Lintts | Test | Symbol | Tc = +25C | | Unit | If 2/ 3/ 4/ Min | Max | | | | I T Output voltage during | Yop | 119.5 | 20.51 programming | | { | | | \ | | { | | | | { I I 1 7 T Voltage on outputs not | Yonp | | O \Vecp IY to be programmed | | | 1+0.3 | { | | | { I ] | I I Current into outputs not | IJonp \ | | 20] mA to be programmed ! | { ! | \ I | | I Rate of output voltage | d(Vop) | | 20 | 250 | VW/us change ) /dt | \ | | | | | | \ | | | I | Rate of TS, voltage | d(Vs,)_ | | 100 =|: 1000 | V/us change | /dt | | | | | | | | | Programming period | tp ! 50 ! 100 | us py All delays between edges are specified from completion of the first edge to beginning of the second edge: i.e., not to the midpoints. 2/ Delays ty, tg, tz, and tq must be greater than 100 ns, maximum delays of 1 us are recommended to minimize heating during programming. 3/ During ty, the output being programmed is switched to the load R and read to determine if the fuse is open. 4/ Outputs not being programmed are connected to Yoyp through resistor R which provides output current limiting. SIZE CODE IDENT. NO. | OWGNO. MILITARY DRAWING |. | 14933 DEFENSE ELECTRONICS SUPPLY CENTER 5962-85526 DAYTON, OHIO REV PAGE 14 DESC FORM 193A FEB 86ENABLE 1 ADDRESS THe INPUTS SELECTED ADDRESS STABLE X Vitp VCS, cs, dt "5, VIHP ILP OUT PUT PROGRAMMED ie ae \ OUTPUT 777 You \WERIEY 4 _ Vor pag--_____- PROGRAMMING CYCLE - FIGURE 6. Programming waveform. SIZE CODE IDENT. NO. | OWG NO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO REV PAGE 15 DESC FORM 193A FEB 86 av 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application. When a military specification exists and the product covered by this drawing has been qualified for listing on QPL~38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be the preferred item for all applications. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Comments. Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telephone 513-296-5375, 6.4 Approved source of supply. An approved source of supply is listed herein. Additional sources Will be added as they become available. The vendor listed herein has agreed to this drawing and a certificate of compliance (see 3.5 herein) has been submitted to DESC-ECS. T T Vendor | Vendor I Replacement l | Military drawing | CAGE | similar part (military specification| part number ! number number 1/ ! part number | | | | y | | 5962-8552601UX - | 34335 {| AM27PS191/BJA | eee | | 5962-8552601KX | 34335 | AM27PS191/8KA | --- | 1 5962-8552601XX | 34335 | AM27PS191/BUA | --- \ | 5962-85526013X | 34335 | AM27PS191/33A | --- | | 5962-8552602JX 1 34335 | AM27PS191A/BJA | --- | | 5962-8552602KX 1 34335 | AM27PS191A/BKA | --- | | 5962-8552602XX | 34335 | AM27PS191A/BUA | 7-7 | | 5962-8552602 3X | 34335 | AM27PS191A/B3A | --- | | 5962-8552603LX | 34335 | AM27PS291/BLA | --- | i 5962-8552604LX ! 34335 | AM27PS291A/BLA ! ---+ ! | | lf Caution: Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE Vendor name Programming Fusable number and address procedure link 34335 Advanced Micro Devices, Incorporated A Platinum 901 Thompson Place silicide P.0. Box 3453 fuse Sunnyvale, CA 94088 SIZE | CODE IDENT. NO. | DWGNO. MILITARY DRAWING A 14933 5962-85526 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO rev A pace 16 DESC FORM 193A a FEB 86