M24308211 - ADI ELECTRONICS, INC.

AMSC N/A FSC 5935

MIL-DTL-24308H

1 February 2018

SUPERSEDING

MIL-DTL-24308G

w/AMENDMENT 5

10 August 2017

DETAIL SPECIFICATION

CONNECTORS, ELEC TRIC, RECTANGULAR, NONENVIR ONMENTAL,

MINIATURE, POLARIZED SHELL, RACK AND PANEL,

GENERAL SPECIFICATION FOR

This specification is approved for use by all Departments and Agencies of the Department of Defense.

1. SCOPE

1.1 Scope. This specification covers the requirements for nonenvironmen tal, pol ariz ed she l l, minia tur e, rac k and

panel connectors having pin and socket, crimp (removable), solder (nonremovable), or insulation displacement

(nonremovable) contacts with rigid or float mounting, designed for -55°C to +125°C operating temperature range.

1.2 Part or Identifying Number (PIN) . The PIN is to consist of the letter "M", the basic number of the specification

sheet, an assigned dash number and a suffix letter for the finish if applicable (see 3.1):

M 24308/1 -1 F

Military designation Specification Dash number Finish (see note 1)

sheet number

For class G:

A = Pure electrodeposited aluminum.

F = Cadmium (see note 2).

K = Zinc ni c kel.

T = Nickel Fluorocarbon Polymer.

P = Passivated stainless steel.

Z = Zinc (see note 3).

For class N:

A = Pure electrodeposited aluminum.

F = Cadmium (see note 2).

K = Zinc ni c kel

T = Nickel Fluorocarbon Polymer.

P = Passivated stainless steel.

Z = Zinc (s ee note 3).

For class H:

Class H connectors have a tin finish, no suffix required

For class M:

Class M connectors have a gold finish,

no suffix is required.

For clas ses D and K:

Class D and class K connect or s have a nickel.

finish, no suffix is required.

NOTES:

1. Prior to 1 July 1987, a suffix for finish was not included in the PIN.

2. A “F” suffix PIN is to be used for connectors with a cadmium finish and made after 1 July 1987.

3. The blank suffix is superseded by the “Z” suffix for zinc.

INCH-POUND

Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime ,

ATTN: VAI, P.O. Box 3990, Columbus, OH 43218-3990 or email RectangularConnector@dla.mil. Since

contact information can change, you may want to verify the currency of this address information using the

ASSIST Online database at https://assist.dla.mil.

MIL-DTL-24308H

1.3 Classification.

1.3.1 Classes. Connectors covered by this specification are of the following classes.

G - General purpo se connectors, see 3.3.6.1 ( see note).

N - Nonmagnetic connectors, see 3.3.6.1 (see note).

H - Hermetic conn ect ors.

M - Same as N except, these connectors are intended for space missions.

D - Same as G except, these connectors are intended for space missions.

K - Same as H except, these connectors are intended for space missions.

1.3.2 Style of termination. Connectors covered by this specification are of the following terminal styles:

Crimp

Solder

Insulation displacement contact (IDC)

Printed wiring board (PWB)

1.3.3 Types. Connectors covered by this specification are of the following types:

I - Standard density (size 20 contacts).

II - High density (size 22D contacts).

III - Standard density (size 20 IDC contacts)

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 or 4 of this specification. This sect ion

does not include documents cited in other sections of this specification or recommended for additional information or

as examples. While every effort has been made to ensure the completeness of this list, document users are

cautioned that they must meet all specified requirements documents cited in sections 3 or 4 of this specification,

whether or not they are listed.

2.2 Govern ment documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solici tati on or contract.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-C-22520/2 - Crimping tools, Terminal, Hand, Wire Termination for Wire Barrel Sizes 20 Through 28

MIL-DTL-24308/23 - Connectors, Electric, Rectangular, Nonenvironmental, Miniature, Polarized Shell,

Rack and Panel, Socket Contacts, Printed Wiring Board Termination Types

MIL-DTL-24308/24 - Connectors, Electric, Rectangular, Nonenvironmental, Miniature, Polarized Shell,

Rack and Panel, Pin Contacts, Printed Wiring Board Termination Types

MIL-DTL-83488 - Coating, Aluminum, High Purity

MIL-M-24519 - Molding Plastics, Electrical Thermoplastic

MIL-DTL-45204 - Gold Plating, Electrodeposited

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-202 - Test Methods for Electronic and Electrical Component Parts

MIL-STD-202-208 - Test Method Standard Method 208, Solderability

MIL-STD-202-210 - Test Method Standard Method 210, Resistance To Soldering Heat

MIL-STD-790 - Standard Practice for Established Reliability and High Reliability Qualified Products

List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications

MIL-STD-1285 - Marking of Electrical and Electronic Parts

(Copies of these documents are available online at http://quicksearch.dla.mil )

MIL-DTL-24308H

2.2.2 Other Government documents drawings and publications. The following other Government documents,

drawings, and publications form a part of this document to the extent specified herein. Unless otherwise specified,

the issues are those cited in the solicitation or contract.

NATIONAL AERONAUTICS AND SPACE ADMINISTRATION (NASA)

JSC SP-R-0022 - Vacuum Stability Requirements of Polymeric Material for Spacecraft Applications.

(Copies of these documents are available online at www.nasa.gov/centers/johnson/home )

2.3 Non-Government publications. The following documents form a part of this document to the ex t ent specif ied

herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract

(see 6.2).

ASTM INTERNATIONAL

ASTM A342/A342M - Materials, Feebly Magnetic, Permea bil ity of, Test Method for

ASTM B545 - Electrodeposited Coatings of Tin, Standard Specification For

ASTM B633 - Zinc on Iron and Steel, Electrodeposited Coatings of

ASTM B733 - Metal, Autocatalytic Electroless Nickel-Phosphorus Coatings on

ASTM B841 - Electrodeposited Coatings of Zinc Nickel Alloy Deposits, Standard Specification

for

ASTM E595 - Total Mass Loss and Collected Volatile Condensable Material from Outgassing in

a Vacuum Environment, Standard Test Method for

ASTM D4067 - Reinforced and Filled Poly (Phenylene Sulfide) (PPS) Injection Molding and

Extrusion Materials Using ASTM Methods, Standard Classification System for

ASTM D5927 - Thermoplastic Polyester (TPES) Injection and Extrusion Materials Based on ISO

Test Methods

ASTM D5948 - Molding Compounds, Thermosetting, Standard Specification For

(Copies of these documents are available online at http://www.astm.org )

ELECTRONIC INDUSTRI E S A SS OCI A TION

EIA-364 - Electrical Connector/Socket Test Procedures Including Environmental Classifications

EIA-364-02 - Air Leakage Test Procedure for Electrical Connectors

EIA-364-05 - Contact Insertion, Release and Removal Force Test Procedure for Electrical

Connectors

EIA-364-06 - Contact Resistance Test Procedure for Electrical Connectors

EIA-364-09 - Connectors and Contacts, Electrical, Durability Test Procedure for

EIA-364-10 - Fluid Immersion Test Procedure for Electrical Connectors

EIA-364-13 - Mating and Unmating Forces Test Procedure for Electrical Connectors and Sockets

EIA-364-20 - Connectors, Socket s and Coaxial Contacts, Electrical, Withstanding Voltage Test

Procedure for

EIA-364-21 - Insulation Resistance Test Procedure for Electrical Connectors, Sockets, and Coaxial

Contacts

EIA-364-24 - Maintenance Aging Test Procedure for Electrical Connectors

EIA-364-25 - Probe Damage Test Procedure for Electrical Connectors

EIA-364-26 - Salt Spray Test Procedure for Electrical Connectors, Contacts and Sockets

EIA-364-27 - Connectors, Electrical, Mechanical Shock (Specified Pulse) Test Procedure for

EIA-364-28 - Connectors a nd Sockets, Electrical, Vibration Test Procedure for

EIA-364-29 - Contact Retention Test Procedure for Electrical Connectors

EIA-364-31 - Connectors a nd Sockets, Electrical, Humidity Test Procedure for

EIA-364-32 - Connectors and Sockets, Electrical, Thermal Shock (Temperature Cycling) Test

Procedure for

EIA-364-35 - Insert Retention Test Procedure for Electrical Connectors

EIA-364-37 - Contact Engagement and Separation Force Test Procedure for Electrical Connectors

MIL-DTL-24308H

(Copies of these documents are available online at http://www.ecianow.org )

IPC - ASSOCIATION CONNECTING ELECTRONICS INDU S TRIES

J-STD-006 - Electronic Grade Solder Alloys, Fluxed and Non Fluxed Solid Solders for Electronic

Soldering Applications Requirements for

(Copies of these documents are available online at http://www.ipc.org )

INTERNATIONAL ORGANIZ ATION FOR STANDARDS (ISO)

ISO 10012 - Measurement Management Systems – Requirements for Measurement Processes and

Measuring Equipment

(Copies of these documents are available online at http://www.ansi.org )

NCSL INTERNATIONAL

NCSL Z540.3 - Calibration of Measuring and Test Equipment, Requirements for

(Copies of these documents are available online at http://www.ncsli.org )

NATIONAL ELECTRICAL MANUFACTURERS ASSOCIATION (NEMA)

NEMA HP 3 - Electrical and Electronic PTFE (Polytetr af luo r oethy len e) Insulated High Temperature Hook

Up Wire; Types ET (250 Volts), E (600 Volts), and EE (1000 Volts)

(Copies of these documents are available online at http://www.nema.org )

SOCIETY OF AUTOMOTIVE ENGINEERS, INC.

SAE AMS2404 - Plating, Electroless Nickel

SAE AMS2700 - Passivation of Corrosion Resistant Steel

SAE AMS-QQ-N-290 - Nickel Plating (Electrodeposited)

SAE AMS-QQ-P-416 - Plating, Cadmium (Electrodeposited)

SAE AMS-P-81728 - Plating, Tin-Lead (Electrodeposited)

SAE EIA-557 - Statistical Process Control Systems

(Copies of these documents are available online at http://www.sae.org )

2.4 Order of prece den ce. Unless otherwise noted herein or in the contract, in the event of a conflict between the

text of this document and the references cited herein (except for related specification sheets), the text of this

document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

a specific exemption has been obtained.

3. REQUIREMENTS

3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the

applicable specification sheet. In the event of any conflict between the requirements of this spe cifi cat ion and the

specification sheet, the latter shall govern.

3.2 Qualification. Connector assemblies furnished under this specification shall be products that are authorized by

the qualifying activity for listing on the applicable qualified products list before contract award (see 4.3 and 6.3).

MIL-DTL-24308H

3.2.1 Quality.

3.2.1.1 Statistical process control (SPC). The contractor shall implement and use statistical process control

techniques in the manufacturing process for parts covered by this specification. The SPC program shall be

developed and maintained in accordance with SAE EIA-557. Where SPC cannot be utilized because of non-

continuous production requirements, a lot sampling plan for inspection in accordance with table XIII with c = 0 can be

utilized. The SPC and c = 0 programs shall be documented and maintained as part of the overall reliability assurance

program in accordance with SAE EIA-557 and MIL-STD-790. Evidence of such compliance shall be verified by the

qualifying activity of this specification as a prerequisite for qualification.

3.3 Materials. Materials shall be as identified herein. However, when a definite material is not specified, a material

shall be used which will enable the connectors to meet all requirements of this specification. Acceptance or approval

of any constituent material shall not be construed as a guarantee for acceptance of the finished product.

3.3.1 Interface materials, platings and proc es ses. Interface materials, platings, and processes have been

established to provide assurances that connectors manufactured to this specification will properly interface to similar

industry standard or government specified connector systems without problems of electrochemical incompatibility or

excessive interface surface wear. The manufacturers of connectors supplied to this specification may be allowed to

use alternate rec ogniz e d indus try standar d mater ial s, platings, and proces ses fro m those id entif ied in 3.3. Alternate

materials, platings and processes used must be coordinated with the qualifying activity as part of the qualification

process. Use of alternates to those referenced guidance items by the supplier must not result in inferior short or long

term performance or reliability of supplied connectors as compared with connectors manufactured using the

referenced materials, platings, or processes. Short or long term failures or reliability problems due to use of these

alternates shall be the responsibility of the supplier.

3.3.2 Dissimilar metals. When dissimilar metals are employed in intimate contact with each other, protection

against electrolytic corrosio n shall be prov ided (see 3.3.1).

3.3.3 Nonmagnetic materials (classes M and N connectors). All parts used in classes M and N connectors shall be

made from materials which are classed as nonmagnetic (see 3.5.1).

3.3.4 Conta ct materials. Classes D, G, M, and N contact bodies shall be made of suitably conductive copper

based alloys. Classes H and K contacts may be ferrous alloy material. All contacts shall be suitably protected from

corrosio n. When contact s are in-process plated in strip form, the absence of plating in the separation area is

acceptable, provided the area is nonfunctional and any corrosion products formed as a result of salt spray testing

(4.5.19) do not appear in the contact mating or termination areas.

3.3.4.1 Ac ce ssory mem ber s. Contac t accessory members such as hoods, pressure members and retaining

devices shall be made of corrosion resistant material or shall be suitably treated to resist corrosion.

3.3.4.2 Contact finish (solder contact). The finish on contact bodies shall be gold applied either overall or localized

for class G, (see 6.5). The finish on contact bodies for classes D and M shall be gold plated applied overall. The

finish on contact bodies for classes H and K shall be gold plated.

3.3.4.2.1 Overall finish. Contact bodies shall be overall gold plated in accordance with MIL-DTL-45204, or

equivalent as approved by the qualifying and preparing activities, type II, grade C, class 1, over a suitable underplate

(see 6.5). Silver shall not be used as an underplate. Nickel shall not be used as an underplate on classes M and N.

The finish on contact bodies of class H and K connectors shall be gold plated in accordance with

MIL-DTL-45204, or equivalent as approved by the qualifying and preparing activities, ty pe II , grade C, class 1.

Preliminary plating of another metal is permissible.

3.3.4.2.2 Localized finish. Contact bodies shall be overall nickel plated in accordance with SAE AMS-QQ-N-290,

except plating thickness shall be 30 to 150 microinches thick (see 6.5). Mechanical operati ons may be perfor me d

after application of plating.

3.3.4.2.2.1 Contact mating area. The contact mating area as shown on figur e 1 shall be gold plated in accordance

with MIL-DTL-45204, or equivalent as approved by the qualifying and preparing activities, type II, grade C, cla ss 1,

over nickel plating (see 3.3.4.2.2).

3.3.4.2.2.2 Terminations. Terminations shall be plated as follows: (see 6.2.d)

a. Solder cups: 100 microi nch es minimum tin-lead plated in accordance with SAE AMS-P-81728, 50 to 95

percent tin.

MIL-DTL-24308H

b. Insulati on disp la cement : 100 micr oin che s minimum tin-lead plated in accordance with SAE AMS-P-81728,

50 to 95 percent tin.

c. Printed wiring tails: Dimension M in accordance with MIL-DTL-24308/23 and MIL-DTL-24308/24, 100

microinches mini mum tin-lead plated in accordance with SAE AMS-P-81728.

d. Solder dipping is permitted for solder cups and printed wiring tails, providin g it meets proc ed ures and

requireme nts of M IL-STD-202-208.

3.3.5 Diel ectric materials.

3.3.5.1 Insert. Insert material type SDG-F or GDI-30F in accordance with ASTM D5948, or TPES013G30,

TPES023G30 or TPES102G30 in accordance with ASTM D5927, or type GPT-30F, GET-30F, GCT-30F or

GLCP-30F, GST-40F or GLCP-50F in accordance with or MIL-M-24519 or

PPS000G40A63463EA220ED037EE030EF125EG100EH150FL310Y11 in accordance with ASTM D4067, for classes D,

G, M, and N connectors. Insert dielectric materials for classes H and K shall be glass.

3.3.6 Met al co mpon ent s. Metal components shall be of high grade corrosion resistant material or a material

treated to resist corrosion, which will allow the complete connector assembly to meet the requirements of this

specification.

3.3.6.1 Finish. (Class G and N), Shells shall be cadmium plated in accordance with type II, class 2 of

SAE AMS-QQ-P-416 or zinc plated in accordance with type II of ASTM B633. A preliminary plating of another metal

is permissible. The resulting finish shall be electrically conductive, and shall be of a golden color to ensure that the

chromate finish has been properly applied or pure electrodeposited aluminum non-reflective in accordance with

MIL-DTL-83488 Corrosion-resistant steel parts including shells shall be passivated in accordance with

SAE AMS2700, types 2, 6, 7 or 8 and need not be overplated. (Class G only), zinc nickel alloy in accordance with

ASTM B841, non-reflective black an underplate is optional or Nickel Fluorocarbon Polymer non-reflective an

underplate is optional.

3.3.6.2 Finish for class H connectors. Unle ss otherwise specified, all met al parts for class H connect or s shall be

tin plated in accordance with ASTM B545. Preliminary plating of another metal is permissible. Tin shall contain a

minimum of 3% lead to prevent tin whiskers.

3.3.6.3 Finish for classes D, K, and M connectors. All metal par ts for cla sse s D and K connectors shall be

Electroless Nickel in accordance with SAE AMS2404, class 3 or 4, .0005 inch minimum thickness or electrically

conductive nickel-phosphorus conforming to ASTM B733, class 1 or 2, type III, .0005 inch minimum thickness. The

finish shall be dull. Use of a suitable underplate is permissible. For class M, the finish shall be gold in accordance

with MIL-DTL-45204 or equivalent as approved by the qualifying and preparing activities, grade C, class 1 over a

suitable underplate (see 6.5). A silver underplate shall not be used.

3.3.7 Recycled, recovered, environmentally preferable, or biobased materials. Recycled, recovered,

environmentally preferable, or biobased materials should be used to the maximum extent possible, provided that the

material meets or ex ceeds the operat ion al and mai nten anc e r equir eme nts, an d pro mot es e cono mical ly

advantageous life cycle costs.

3.3.8 Pure tin. The use of pure tin is prohibited. Tin content used in connector materials shall not exceed 97

percent, and an alloy material shall be chosen to inhibit the growth of tin whiskers (see 6.7).

MIL-DTL-24308H

(SEE NOTE 6: ALTERNATE DESIGN)

FIGURE 1. Gold thickness areas.

Inches

.0001

0.0025

.020

0.51

.0410

1.041

.100

2.54

.139

3.53

.150

3.81

.188

4.78

MIL-DTL-24308H

NOTES:

1. Overall finish: Measure gold thickness in zone A or B, as applicable.

2. Localized finish: Apply gold to the inside and outside diameter of the contact in area X or Y. Measure gold

thickness on outside diameter of the contact at point B or C, as applicable.

3. On socket contacts with integral pressure members, area X (zone of tangency) extends from the tip of the

contact to .020 inch beyond the point of tangency, (point C) on the inside and outside diameter of the contact.

4. Dimensions are in inches.

5. Metric equivalents are given for information only.

6. Alternate socket design permitted, must be coordinated with qualifying activity as part of the qualification

process.

FIGURE 1. Gold thickness areas – Continued.

3.4 Interfa ce and phy si cal dim ensi ons . Connectors shall be of the physical dimensions specified (see 3.1).

Connectors shall be so designed that neither the pins nor the sockets will be damaged during normal mating of

counterpart connectors.

3.4.1 Conta ct int erf ace desig n . Contacts interface design shall be as specified on individual standards or military

specification sheets (see 3.1).

3.4.1.1 So lder con tact s. Solder contacts shall be nonremovable from the insert, shall have eyelet or solder cup

terminals as specified (see 3.1) and shall be in accordance with MIL-DTL-24308, Appendix B. Solder cups shall be

designed such that during soldering no components will be damaged and no liquid solder shall escape.

3.4.1.2 Cr i mp cont act s. Crimp contacts shall be as follows:

Connector density Contact size Contact Part or Identifying Number (PIN)

High 22D socket M39029/57-354

High 22D pin M39029/58-360

Standard 20 pin M39029/64-369

Standard 20 socket M39029/63-368

3.4.1.2.1 Contact insertion and removal tools. Crimp removable connectors shall be designed for contact insertion

and removal with the applicable military tools as follow:

Contact

size

Tool PIN

22D

M81969/14-01 with plastic tips

M81969/1-04 with metal tips

M81969/39-01 with plastic tips

M81969/1-02 with metal tips

3.4.1.3 Cla ss es H and K cont acts . Classes H and K contacts are to be permanently fused in place and shall have

eyelet or solder cup terminals, as specified (see 3.1), and shall be in accordance with Appendix B.

3.4.1.4 Insulation displacement contacts. Insulation displacement contacts shall be nonremovable from the insert

and shall be as specified (see 3.1).

MIL-DTL-24308H

3.4.2 Insert design and construction. Inserts shall be designed with suitable sections and radii such that they will

not readily chip, crack, or break in assembly or in normal service. Inserts shall be molded or bonded with a bond

barrier between all adjacent contacts and outside edge and of one-piece construction, except for IDC. Pin entry

openings on socke t insert face s shall be as small as practic able. S oc ket ins erts sh all prov i de adequate protection

against a pin contacting a socket before the mating pair of connectors has been polarized. The inserts shall be so

designed that the inserts cannot be removed from the shells. The contact retaining system shall be free of foreign

material, adhesive, or any obstruction that would prevent smooth contact insertion and positive retention. The

contact retention system for removable crimp contact connectors shall be a metal retention clip or other contact

retention method, which will enable the contacts to meet the contact retention requirements specified in 3.5.5. All

contact retention systems shall utilize a common contact insertion/removal tool, (see 3.3.1).

3.4.2.1 Insert arrangement. The insert arrangement shall be as specified by the connector PIN (see 3.1).

3.4.2.2 Contact alignment and stability. With all contacts in place, the alignment of pin and socket contacts shall

always permit engagement irrespective of buildup of allowable tolerances on hole locations, distortion of contacts due

to crimping, and insert location in the shell.

3.4.3 Shell design. The shell shall be designed to positively retain the insert and shall be constructed so that the

insert cannot be removed.

3.4.3.1 She ll pol ar iz atio n. Polarization shall be accomplished by a keystone shape shell design with polarization

accomplished before engagement of the pins and sockets.

3.4.3.2 Mounting. Connectors shall be provided with means to fasten the shell securely to a mounting surface.

Classes H and K connectors shall be provided with solder mounting provisions, or with provisions for external

mounting hardware (see 3.1).

3.4.4 Interchangeability. All connectors and accessories having the same military PIN shall be completely

interchangeable with each other with respect to installation (physical) and performance (function) as specified herein.

Solder and crimp contact connectors shall be intermatable (see 3.1).

3.4.5 Mat ed spa cin g. Connec tor s sha ll meet app licable performance requirements when mated within the spacing

shown on figure 2.

SOCKET

PLUG

RECEPTACLE

SHELL SIZES

1 & 2 .265 ±.015

SHELL SIZES

3, 4, 5, 6 .256 ±.015

FIGURE 2. Mated spacing.

3.5 Performance. Connectors shall be designed to meet the requirements specified herein.

3.5.1 Magnetic permeability (classes M and N). The relative permeability of classes M and N connectors shall not

exceed 2 µ when measured as specified in 4.5.3.

3.5.2 Maintenance aging (crimp type). All crimp-contact connec tors sh all be capa ble of conforming to the

requireme nts of 3.5.3 and 3.5.4 after maintenance aging of 4.5.4.

MIL-DTL-24308H

3.5.3 Contact insertion and removal forces. The axial forces required to insert and remove removable contacts

shall conform to the applicable requirements in table I when tested as specified in 4.5.5.

TABLE I. Contact insertion and removal forces (pounds maximum).

Contact size

22D

Insertion

Removal

3.5.4 Mating and unmating force. The force for mating and unmating of counter par t conne c t ors sha ll meet the

requirements in table II. The connectors used in this test shall have the complete complement of contacts. Testing

shall be as specified in 4.5.6.

TABLE II. Mating and unmating forces (pounds).

Shell

size

Unmating

Mating

Minimum

Maximum

Class

G, D, M,

H, K

G, D, M,

H, K

G, D, M, N

H, K

0.75

1.50

6.0

7.00

10.0

7.25

1.00

2.00

10.0

13.00

17.0

13.00

1.75

3.25

17.0

21.25

28.0

21.25

2.50

4.50

24.0

31.25

39.0

31.25

3.25

5.50

30.0

42.25

49.0

42.25

4.50

----

39.0

-----

65.0

-----

3.5.5 Contact retention. Contacts for classes G, D, M, and N connectors shall be retained in their inserts by a

9-pound (minimum) force. The axial displacement of contacts shall not exceed .012 inch (0.30 mm) while under load

(see 4.5.7).

3.5.6 Dielectric withstanding voltage. Unmated connectors shall show no evidence of breakdown or flashover

when subjected to the test voltages and altitudes specified in tables III and IV. Corona shall not be considered as

breakdown. Testing shall be as specified in 4.5.8.

TABLE III. Type I and II test voltage (Volts rms, 60 Hz). 1/

Altitude

Humidity conditioned

(see 4.5.15)

All other

Conditions

Classes

G, D, M, N

Classes

H, K

Classes

G, D, M, N

Classes

H, K

Sea level

600

400

1,000

750

70,000 feet

---

325

175

1/ These are not working voltages.

MIL-DTL-24308H

TABLE IV. Type III test voltage (Volts rms, 60 Hz). 1/

Altitude

Humidity

conditioned

(see 4.5.15)

All other

conditions

Class G

Sea level

70,000 feet

500

---

500

200

1/ These are not working voltages.

3.5.7 Cable retention (flat cable only). When connectors are tested as specified in 4.5.9, they shall withstand the

minimum applied force without mechanical damage.

3.5.8 Insulation resistance at ambient temperature. The insulation resistance of unma ted conn ect ors sha ll

conform to the applicable requirements in table V when tested as spe cif ied in 4.5.10.

TABLE V. Insulation resistance (megohms minimum).

Humidity conditioned (see 4.5.15)

After step 6 of test

procedure EIA-364-31

After 24 hours of conditioning

test procedur e EIA-364-31

All other

conditions

Megohms (min)

1,000

Megohms (min)

5,000

3.5.9 Contact resistance. Contact resistance for mated pairs of pin and socket contacts shall be as specified in

table VI when tested as specif ied in 4.5.11.

TABLE VI. Contact resistance (millivolts maximum).

Contacts

Contact

size or

type

AWG

wire

size

Test

current

(amperes)

Classes

G, D, M, N

H, K

After

salt spray

All others

conditions

After

salt spray

All others

conditions

3.0

---

7.5

---

2.0

---

ind 165

5.0

---

avg 90

avg 70

IDC

1.0

---

PWB

3.0

---

MIL-DTL-24308H

3.5.10 Contact engagement and separation forces. Socket contacts shall conform to the forces specified in

table VII when tested as specified in 4.5.12.

TABLE VII. Contact engagement and separation forces (ounces).

Initial

Solder

contact

size

Maximum individual

engagement force

using maxi mum

diameter test pin

Maximum average

engagement force

using maximu m

diameter test pin

Minimum separation

force using

minimum d iam eter

test pin

22D

12.0

9.5

0.7

18.0

12.0

0.7

IDC

18.0

12.0

0.7

After conditioni ng

22D

11.4

0.6

IDC

0.6

3.5.11 Temperature cycling (classes G, H, and N). There shall be no damage detrimental to operation of the

connector after being subjected to the temperature extremes in table VIII as specified in 4.5.13.

TABLE VIII. Tempera ture extremes.

Extremes

°C

Low

-55 +0

-3

High

+125 +3

-0

3.5.11.1 Temperature cycling (classes D, K, and M). There shall be no damage detrimental to connector operation

after being subjected to testing specified in 4.5.13.1. Follow ing the test, the connectors shall withstand the sea level

dielectric withstanding voltage specified in table III.

3.5.12 Air lea kag e (clas se s H and K connect ors). When tested as specified in 4.5.14, the air leakage rate of

classes H and K connectors shall be no greater than one micron cubic foot per hour at a differential of one

atmosphere (1.04 x 10-5 atmosp heres cm3/s). The specified leakage rate shall apply only through the connector and

not through the flange to the mounting surface joint.

3.5.13 Humidity. Connectors shall meet the applicable dielectric withstanding voltage and insulation resistance

requirements (see 3.5.6 and 3.5.8) when tested as specified in 4.5.15.

3.5.14 Vibration. Mated connectors shall not be damaged and there shall be no loosening of parts due to

vibration. Counterpart connectors shall be retained in engagement and there shall be no interruption of electrical

continuity or current flow longer than 1 microsecond when tested as specified in 4.5.16.

3.5.15 Shock. Mated connectors shall not be damaged and there shall be no loosening of parts, nor shall there be

an interruption of electrical continuity or current flow longer than 1 microsecond during the exposure to mechanical

shock, as specified in 4.5.17.

3.5.16 Durability. Counterpart connectors shall show no mechanical or electrical defects detrimental to the

operation of the connector, as specified in 3.5.4 and 3.5.10, after 500 cycles of mating and u nmat ing as spe cif ied in

4.5.18.

3.5.17 Salt spray (corrosion). Mated connectors shall show no exposure of base metal due to corrosion which will

affect performance as specified in 3.5.4, 3.5.5, 3.5.8, and 3.5.9 w hen tested as spe cif ied in 4.5.19.

3.5.18 Oversize pin exclusion. Socket contacts shall exclude the entry of the test pin specified in table IX when

tested as specified in 4.5.20. After testing, the contacts shall meet the contact resistance requirements specified in

3.5.9.

MIL-DTL-24308H

TABLE IX. Oversiz e pin ex clusion .

Contact

size

diameter

.046

3.5.19 Resistance to test probe damage. Socket contacts shall meet the engaging and separating force

requirements specified in 3.5.10 and shall show no evidence of visi ble damage w hen test ed as specified in 4.5.21.

3.5.20 Fl uid im mer sion . Connectors shall mate within the forces specified in 3.5.4 after being subjected to the fluid

immersion test as specified in 4.5.22.

3.5.21 Insert retention.

3.5.21.1 Insert retention (classes D, G, M, and N). Inserts shall not be dislocated from their original positions with

an axial load of 60 lb/in2 applied as specified in 4.5.23.

3.5.21.2 Insert retention (classes H and K). Classes H and K inserts shall not be dislocated from their original

positions or damaged when an effective pressure differential of 200 lb/in2 is applied as specified in 4.5.23.

3.5.22 Cont act pin strength. After being subje cted to mec h anic al load ing sp eci fied in 4.5.25 pin contacts shall

exhibit a permanent set no greater than .005 inch.

3.5.23 Solderability. Solderable, nonremovable contact terminations shall withstand the test specified in 4.5.24.

Printed wiring tails shall meet the solderability requirements in accordance with MIL-STD-202-208.

3.5.24 T herma l vacu um outg a ssi ng (classes D, K, and M). The entire connector assembly, when tested as

sp ecified in 4.5.26, shall have maximum total mass loss (TML) of 1.0 percent of the original specimen mass and shall

have a maximum volatile condensable material (VCM) content of 0.1 percent of the original specimen mass.

3.5.25 Resistance to soldering heat. Solderable, nonremovable contact connectors shall withstand the tests

specified in 4.5.27.

3.6 Marking. Connectors shall be marked in accordance with method I of MIL-STD-1285 or an equivalent industry

standard, and shall include the military PIN (see 3.1), the manufacturer's name or code symbol, and date code.

3.6.1 Ins ert mark ing. Rai sed or depres sed char act er s may be used. M arkings are shown on the applicable

military specification sheet or standard. Socket face and pin faces are the opposite. Contact position markings shall

appear on both sides of the insert. On insulation displacement connectors, the first and last pin number of each row

shall be marked clearly on the housing.

3.6.1.1 Contact designations. All contact locatio ns sha ll be desi gnat ed by ident ifi able characters on the front and

rear faces of the insert or insert assembly. Positioning and arrangement of the characters shall be such that the

corresponding contact location may be readily identifiable. Connector shell marking and insert marking shall remain

legible after completion of the tests specified in 4.5.

3.6.2 Connector kit package. Each connector kit package shall contain a removable contact connector (marked

with the complete connector PIN), a full complement of contacts for the connector, and an applicable

insertion/removal tool as required by the detail specification sheet (see 3.1).

3.7 Workmanship. Connectors shall be processed in such a manner as to be uniform in quality and shall be free

from burrs, crazing, cracks, voids, pimples, chips, blisters, pin holes, sharp cutting edges, and other defects that will

adversely affect life, serviceability, or appearance. Sharp cutting edges are acceptable on the terminations of IDC

connectors.

MIL-DTL-24308H

4. VERIFICATION

4.1 Clas sifi cat ion of insp ect io ns. The inspections specified herein are classified as follows:

a. Qualification inspection (see 4.3).

b. Conformance ins pection (see 4.4).

4.2 Insp ect ion con diti on s. Unless otherwise specified herein, all inspections shall be performed in accordance with

the test conditions specified in the "GENERAL REQUIREMENTS" of MIL-STD-202 and EIA-364.

4.2.1 Test equipment and inspection facilities. Test and measuring equipment and inspection facilities of sufficient

accuracy, quality and quantity to permit performance of the required inspection shall be established and maintained

by the contractor. The establishment and maintenance of a calibration program to control the accuracy of the

measuring and test equipment (i.e. NCSL Z540.3, ISO 10012 or comparable standards) shall be required.

4.2.2 Assembly plants. Assembly plants must be listed on or approved for listing on the applicable Qualified

Products List (QPL). The qualified connector manufacturer shall certify that the assembly plant is approved for the

distribution of the manufacturer's parts. The assembly plant shall use only piece parts supplied by the qualified

connector manufacturer. No testing other than visual inspection is required of certified piece parts obtained from the

qualified connector manufacturer, except when there is cause for rejection. All assemblies produce d at the assem bly

plant shall be subjected to inspection of product to assure that the assembly process conforms to establish at the

qualified manufacturing plant. Quality control requirements, including Government inspection surveillance, shall be

the same as required for the qualified connector manufacturer.

4.2.3 Established reliability and high reliability practice. An established reliability and high reliability practice shall

be maintained in accordance with MIL-STD-790. Evidence of such compliance shall be verified by the qualifying

activity of this specification as a prerequisite for initial and continued qualification.

4.3 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to the

Government (see 6.3) on sample units produced with equipment and procedures normally used in production. Use of

alternate materials, platings, and processes shall be identified in the product test documentation (see 3.3.1).

4.3.1 Sam ple size.

4.3.1.1 Connectors. A minimum of 6 completely assembled plugs and receptacles of each class (1.3.1) of each

type (1.3.3), and of each style (1.3.2), with the largest insert arrangement for which qualification is desired shall be

subjected to the examinations and tests, except for thermal vacuum outgassing, in the sequence shown in table XI.

For classes D, K, and M, all the nonmetallic materials, including lubricants, of two additional connectors shall be

subjected to the thermal vacuum outgassing test. If classes G and N or M and D are being qualified at the same

time, a minimum of three completely assembled plugs and receptacles with the insert arrangement of the largest size

connector of the type (1.3.3) with the same style of termination (1.3.2), an d each class (classes G and N, 3 class G, 3

class N; classes D and M, 3 class M, 3 class D) shall be subjected to the examinations and tests, except for thermal

vacuum outgassing, in the sequence shown in table XI. For classes D and M, all the nonmetallic materials, including

lubricants, of one additional connector of each class shall be subjected to the thermal vacuum outgassing test. The

connectors shall have a full complement of contacts. Half of the class H and class K contacts shall have solder cups

and the remainder shall have eyelets. The samples subjected to qualification testing shall be provided with

counterpart connectors for those tests requiring mating assemblies. The co unter par t con n ectors provided for this

purpose shall be new, previously qualified connectors or new connectors submitted for qualification testing. Suppliers

not producing mating connectors shall submit substantiating, certification data that tests were performed with

qualified counterpart connectors. The samples shall be taken from a production run and shall be produced with

equipment and procedures normally used in production.

4.3.1.1.1 Printed wiring board connectors. When qualifying plugs and receptacles of printed wiring board

termination types, both the plug and receptacle shall be mounted to printed wiring boards and test as mated

connectors.

MIL-DTL-24308H

4.3.1.2 Q ua lifi cat ion of additional connector s. For all other connector sizes of the same type, class, and style of

termination for which qualification is desired, two each of the completely assembled plugs and receptacles shall be

subjected to the examinations and tests in the sequence shown in table XI. Mating plugs and receptacles shall be

furnished.

4.3.1.3 Preparation of sample s. Connectors shall be wired with approximately 2 feet of wire in accordance w ith

NEMA HP 3 , type E and table X. Half of the connectors of each type shall be wired with the maximum wire size and

the remainder shall be wired with the minimum wire size specified in table X. Termination of wires to contacts shall

be accomplished as follows: A MIL-C-22520/2 crimping tool (see 3.1), shall be used for removable contacts.

Soldering sha ll be used for no nr emovab le contacts. Insulati on displ ac eme nt conn ect ors s hall use flex ible, flat,

unshielded, round conductor cable (see 3.3.1).

TABLE X. Test wire sizes.

Contact size

Maximum

wire size

Minimum

wire size

22D

IDC

28 stranded

4.3.2 Inspection routine. The sample shall be subjected to the inspections specified in table XI, in the order

shown. All sample units shall be subjected to visual and mechanical inspection before wiring (see 4.3.1.2 and 4.4.1).

4.3.3 Failures. One or more failures shall be cause for refusal to grant qualification approval.

4.3.4 Verification of qualifi cat i on. To retain qualification, the contractor shall verify in coordination with the

qualifying activity the capability of manufacturing products which meet the requirements of this specification. Refer to

the qualifying activity for the guidelines necessary to retain qualification to this specification. The contractor shall

immediately notify the qualifying activity when inspection data indicates failure of the qualified product to meet the

requireme nts of this sp eci fic ati on.

MIL-DTL-24308H

TABLE XI. Qualification inspection.

Inspection

Requirement

paragraph

Test

method

paragraph

Connector

class 1/

Group I

Visual and mechanical inspection

3.1, 3.3, 3.4,

3.6, and 3.7

4.5.2

Magnet ic permeability (classes N and M) 2/

3.5.1

4.5.3

Maintenance agin g (crim p type)

3.5.2

4.5.4

Contact inserti on and removal f orces

3.5.3

4.5.5

Mating and unmating force

3.5.4

4.5.6

Contact retention 3/

3.5.5

4.5.7

Dielectric withstanding vol tage: 2/

At sea level

3.5.6

4.5.8.1

At alt itude

3.5.6

4.5.8.2

Cable retention (f lat cable only) 4/

3.5.7

4.5.9

Insulation resistance at am bient temperature 2/

3.5.8

4.5.10

Contact resistance

3.5.9

4.5.11

Contact engagement and separation forces

3.5.10

4.5.12

Mating and unmatin g force

3.5.4

4.5.6

Temperature cycling (cl asses G, H, and N)

3.5.11

4.5.13

Temperature cycling (cl asses D, K, and M)

3.5.11.1

4.5.13.1

Air leakage (classes H and K)

3.5.12

4.5.14

Humidity

3.5.13

4.5.15

Dielectric wit hstanding voltage

3.5.6

4.5.8

Insulation resi stance

3.5.8

4.5.10

Vibration

3.5.14

4.5.16

Shock

3.5.15

4.5.17

Durability

3.5.16

4.5.18

Contact engagement and separation forces

3.5.10

4.5.12

Mating and unmating force

3.5.4

4.5.6

Salt spray (corrosion) 3/

3.5.17

4.5.19

Contact resistance

3.5.9

4.5.11

Mating and unmating

3.5.4

4.5.6

Contact retenti on

3.5.5

4.5.7

Overs ize pin exclusion

3.5.18

4.5.20

Contact resistance

3.5.9

4.5.11

Resistance to test probe damag e

3.5.19

4.5.21

Contact engagement and separation forces

3.5.10

4.5.12

Fluid i mmersion 2/

3.5.20

4.5.22

Mating and unmating force 2/

3.5.4

4.5.6

Insert retention

3.5.21

4.5.23

Visual and mechani cal inspection

3.1, 3.3, 3.4,

3.6 and 3.7

4.5.2

Thermal vacuum outgassing (classes D , K, and M) 5/

3.5.24

4.5.26

Group II 6/, 7/

Resistance to solder heat

3.5.25

4.5.27

Group III

Solderabilit y 6/

3.5.23

4.5.24

Contact pin strength

3.5.22

4.5.25

See footnotes on next page.

MIL-DTL-24308H

TABLE XI. Qualification inspection – Continued.

1/ Connector cla ss:

1. Classes D and G - Removable conta ct conn ect ors.

2. Classes D and G - Nonrem ov able con tac t conne c tors.

3. Classes M and N - Removabl e conta ct conn ectors.

4. Classes M and N - Nonrem ov able con tac t conne c tors.

5. Classes H and K - Nonrem ov able con tac t conne c tors.

2/ Not applicable for periodic inspection.

3/ Not applicable for non-r emov a ble cont act s.

4/ DC Connectors shall meet the test requirements specified for classes G and D nonremovable contact

connectors.

5/ See 4.3.1.1 (nonmetallic materials of two connector assemblies).

6/ Not applicable for crimp, wrappost, and IDC contacts.

7/ Not applicable for hermetic connectors.

4.4 Conformance inspection.

4.4.1 Inspection of product for delivery. Inspection of product for delivery shall consist of group A inspection.

4.4.1.1 In spe cti on lot. An inspection lot shall consist of all connectors or removable crimp contacts, as applicable,

covered by one specification sheet, produced under essentially the same conditions, and offered for inspection at one

time.

4.4.1.2 Group A inspection . Group A insp ect ion sha ll con si st of the inspe ctio ns spe cif ied i n Table XII, in the order

shown.

4.4.1.2.1 Sampling plan (group A). Table XII tests shall be performed on a production lot basis. Samples shall be

selected as specified in table XIII. If one or more defects are found, the lot shall be screened for that particular defect

and the defective parts removed. A new sample of parts shall be selected as specified in table XIII and all group A

tests again performed. If one or more defects are found in the second sample, the lot shall be rejected and shall not

be supplied to this specification. Group A retention reports shall be provided in a format acceptable by the Qualifying

Activity.

TABLE XII. Group A inspection.

Inspection

Requirement

paragraph

Test

method

paragraph

Visual and mechanical inspection 2/

3.1, 3.3, 3.4,

3.6, and 3.7

4.5.2

Contact engagement and separation forces

(nonremovable contacts)

3.5.10

4.5.12

Insulation resistance at ambient temperature 1/

Dielectric withstanding voltage (sea level) 1/

3.5.8

3.5.6

4.5.10

4.5.8

1/ The contractor may use in-pro ce ss con trols for this requ ire ment.

2/ The contractor may use in-pro ce ss con trols when che ck ing in k perma nency .

MIL-DTL-24308H

TABLE XIII. Lot and sample size.

Lot size

Sample size

2 to 12

100%

13 to 150

151 to 280

281 to 500

501 to 1,200

1,201 to 3,200

3,200 to 10,000

10,001 to 35,000

35,001 to 150,000

150,001 to 500,000

500,001 and over

102

4.4.2 Retention of qualification. Retention of qualification inspection on connectors shall consist of the

examinations and tests shown in table XI. Shipment shall not be held up pending the results of this inspection. To

retain qualification, the qualified manufacturer shall periodically forward reports to the Qualifying Activity (see 6.3) as

follows:

a. At 24 month intervals, unless otherwise specified by the Qualifying Activity, the qualified manufact urer sha ll

forward a report with a summary of the results of group A testing (see 4.4). The results of tests for all reworked lots

shall be identified and accounted for.

b. At 36 month intervals, unless otherwise specified by the Qualifying Activity, the qualified manufactur er sha ll

submit requalification, group B test reports (see 4.4.3.1). The report shall include results of all qualification verification

inspection tes ting perf orme d dur ing that peri od.

Reports shall include certification that the qualified source continues to produce qualified product under the same

conditions as originally qualified (i.e., same processes, materials, design, construction, etc., including manufacturing

locations), unless such changes have been authorized by the Qualifying Activity.

Note: The qualified source shall immediately notify the Qualifying Activity at any time during the reporting period when

inspection data indicates failure of the qualified product to meet the requirements of the specification. If the summary

of test results indicates nonconformance with the specification requirements, and corrective action acceptable to the

Qualifying Activity has not been taken, then action may be taken to remove failing product from the QPL. In addition,

failure to submit the report within thirty days after the end of each reporting period may result in loss of qualification

for that product. In the event that no production occurred during the reporting period, the qualified manufacturer shall

submit a report certifying that the company still has the capability and facilities required to produce the qualified

product. If there has been no production during two consecutive reporting periods, the Qualifying Activity, at their

discretion, may req uire the ma nufa ctur er su bmit a representative product of each type, class, etc., to retention testing

in accordance with qualification inspection requirements.

4.4.3 Periodic inspection. Periodic inspection shall consist of group B inspection, except where the results of this

inspection show noncompliance with the applicable requirement (4.4.3.1.4). Delivery of products, which have passed

group A, shall not be delayed pending the results of these periodic inspections.

4.4.3.1 Group B inspection. Group B inspection sha ll con si st of the inspe ctio ns spe cif ied i n table XI, in the order

shown. Group B inspection shall be made on sample units which has been randomly selected from inspection lots,

which have passed the group A inspection.

4.4.3.1.1 Sampling plan.

Group I: Sample connectors con si stin g of tw o mated pairs of each cl a ss, of each ty pe, of each sty le of

termination, with the largest insert arrangement and all the nonmetallic materials, including lubricants,

of one connector of classes D, K, and M for which retention of qualification is desired shall be

selected every 36 months. If production of a particular PIN is not current, the group B tests must take

MIL-DTL-24308H

place at the time production is resumed. The testing shall revert to the original schedule, which is

applied to a newly qualified product. If group B testing on classes G and N, D and M, or G, N, D, M is

desired, one compl etely ass e mble d plug and receptacle of each class shall be subjected to the

examinations and tests in lieu of two of a single class.

Group II: One each of plug and receptacle with the largest insert arrangement being tested shall be submitted.

Group III: Twenty contacts each for pin and socket solder type termination being tested shall be submitted for

solderability requirements, and eight pin contacts of each type being tested shall be submitted for

contact and pin strengt h requirements.

4.4.3.1.2 Failures. If any sample units fail to pass group B inspection, the entire sample shall be considered to

have failed.

4.4.3.1.3 Disposition of sample units. Sample units, which have been subjected to group B inspection, shall not be

delivered on the contract.

4.4.3.1.4 Noncompliance. If a sample fails to pass group B inspection, the manufacturer shall notify the qualifying

activity and the cognizant inspection activity of such failure and take corrective action on the materials or processes,

or both, as warranted, and on all units of product which can be corrected and which were manufactured using

essentially the same materials and processes, and which are considered subject to the same failure. Acceptance

and shipment of the produ ct s hall be discontinued until corrective action, acceptable to the qualifying activity has

been taken. After the corrective action has been taken, group B inspection shall be repeated on additional sample

units (all inspections, or the inspection which the original sample failed, at the option of the qualifying activity). Group

A inspection may be reinstituted; however, final acceptance and shipment shall be withheld until the group B

inspection has shown that the corrective action was successful. In the event of failure after inspection, information

concerning the failure shall be made available to the cognizant inspection activity and the qualifying activity.

4.5 Methods of inspection.

4.5.1 Test methods. The following tests and test procedures assure connector integrity within typical operating

conditions and applications. Alternate commercial industry standard test methods are allowed. However when and

alternate methods are used, the qualifying activity must be notified prior to performance of the test. The test methods

described herein are proven methods and shall be the referee method in cases of dispute.

4.5.2 Vis ual and me cha nic al inspection. Connectors and contacts shall be examined to verify that the dimensions,

materials, design, construction, marking, and workmanship are in accordance with the applicable requirements (see

3.1, 3.3, 3.4, 3.6, and 3.7).

4.5.3 Magnetic permeability (classes M and N) (see 3.5.1). Permeability shall be measured on classes M and N

connectors with an instrument conforming to ASTM A342/A342M. The connectors may be wired or unwired, but shall

not be carrying current. Requirements shall be as specified in 3.5.1.

4.5.4 Maintenance aging (crimp contact connectors only (see 3.5.2)). Connectors shall be tested in accordance

with test procedure EIA-364-24. Installing/removal tools shall be in accordance with the applicable specification

sheet (see 3.1). Twenty percent of the contacts in a plug or receptacle, but not less than three contacts per

connector mating half, shall be tested.

4.5.5 Contact insertion and removal forces (see 3.5.3). Contacts shall be inserted and removed in accordance

with test procedure EIA-364-05. Installing/removal tools shall be in accordance with the applicable specification

sheet (see 3.1).

4.5.6 Mating and unmating force (see 3.5.4). Mated connectors shall be tested in accordance with test procedure

EIA-364-13. The rate of mating and unmating shall be 1 to 10 inches per minute.

4.5.7 Contact retention (see 3.5.5). Connectors shall be tested in accordance with test procedure

EIA-364-29. The following details shall apply:

a. Axial direction: Shall be applied in both directions.

MIL-DTL-24308H

b. Axial load: As specified.

4.5.8 Dielectric withstanding voltage (see 3.5.6).

4.5.8.1 Sea level. Unmated connectors shall be tested in accordance with test procedure EIA-364-20, condition I.

The applicable test voltages specified in 3.5.6 s hall be appli ed betw een all adj ace nt cont a cts and between the shell

and each peripheral contact. Requirements shall be as specified in 3.5.6. For group A inspection testing, voltage

may be applied for a minimum of 10 seconds.

4.5.8.2 Altitude. The connectors shall be tested in accordance with test procedure EIA-364-20, condition IV. After

5 minutes at the simulated altitude, the connectors shall be tested as specified in 4.5.8.1.

4.5.9 Cable retention (flat cable only) (see 3.5.7). The unmated wired connector with strain relief, when applicable,

shall be mounted by normal mounting means and aligned with the test fixture. An axial force of 8 ounces per contact

shall be applied. The force shall be applied 6 inches from the mating face of the connector to the cable and shall pull

away from the connector in a direction that will put the maximum stress on the contact-cable interface.

4.5.10 Insulation resistance at ambient temperature (see 3.5.8). Unmated connectors shall be tested in

accordance with test procedure EIA-364-21. The resistance shall be measured between the contact shell and a point

including 50 percent, (but not less than four) of the cont act p airs adja ce nt to the cont ac t shell, or betw een the cont act

shell and a point including 50 percent, (but not less than six) of the contacts adjacent to the contact shell. The

contacts selected shall be those having the closest spacing between measurement points and the measured

resistance sha ll be as specified in 3.5.8.

4.5.11 Contact resistance (nonremovable contacts) (see 3.5.9). Contacts shall be tested in accordance with test

procedure EIA-364-06. A minimum of four mated contacts or 20 percent of the mated conta cts, w hic hev er is greater ,

shall be measured in each connector being tested. The following details apply:

a. Wire size: As specified (see 3.1).

b. Preparation: Connectors mated.

c. Test current: Maximum contact current rating (see 3.5.9).

d. Test circuits for nonremovable and classes H and K connectors shall be as shown in accordance with test

procedure EIA-364-06. Test circuit for IDC connectors shall be as shown on figure 3.

4.5.11.1 Classes H and K pin contacts. Classes H and K pin contacts shall be mated with c ount er par t cop per

based alloy socket contacts for the test specified in 4.5.11.

POWER

SUPPLY

OPTIONAL

FIGURE 3. Contact resistance test circuit for IDC connectors.

4.5.12 Contact engagement and separation forces (see 3.5.10). Contact engagement and separation forces shall

be tested in accordance with test procedure EIA-364-37. Four contacts or 20 percent of the contacts, whichever is

greater, shall be measured in each connector being tested. The following details apply:

a. Insert and separate a maximum diameter pin in and from each socket contact, then insert and remove a

minimum diameter pin in the same sockets. During separation of the minimum diameter test pin, the

minimum separation force shall be 3.5.10.

b. Insert and separate a maximum diameter pin in and from each socket contact three times. During the third

cycle, the engage ment for c e shall be 3.5.10.

MIL-DTL-24308H

4.5.12.1 Optional 100% contact engagement and separation forces inspection (see 3.5.10). 100% contact

engagement and separation forces shall be tested in accordance with test procedure EIA-364-37 (See 6.2.e).

4.5.13 Temperature cycling (classes G, H, and N) (see 3.5.11). Unmated connectors shall be tested in

accordance with test procedure EIA-364-32, condit ion I, 5 cycle s, except that the maximum temperature shall be

table VIII. At the completion of the last cycle, the connectors shall be returned to room temperature for further

examination and shall meet the requirements specified in 3.5.11.

4.5.13.1 Temperature cycling (classes D, K, and M) (see 3.5.11.1). Mated connectors shall be tested in

accordance with test procedure EIA-364-32, condit ion I, 5 cycle s, except that the maximum temperature shall be

table VIII. At the completion of the last cycle, the connectors shall be returned to room temperature for further

examination and shall meet the requirements specified in 3.5.11.1.

4.5.14 Air leakage (classes H and K connectors) (see 3.5.12). Classes H and K connectors shall be mounted in a

manner suitable for application of one atmosphere pressure differential across the connectors, and tested in

accordance with test procedure EIA-364-02. The leakage rate shall be determined while pressurized air or gas,

containing not less than 10 percent helium by volume, is applied to the connector. Requirements shall be 3.5.12.

4.5.15 Humidity (see 3.5.13). The connectors shall be fully wired. The unmated and wired connectors shall be

subjected to a humidity test in accordance with t est pro cedur e EIA-364-31, method IV and with the following

exceptions and details 3.5.13.

a. After the 24 hour conditioning period, the insulation resistance shall be measured.

b. Upon completion of step 6 of the final cycle, connectors shall be removed from the chamber and surface

moisture removed from the insulators. Immediately following removal of surface moisture, the insulation

resistance tests (see 4.5.10) and the sea level dielectric withstanding voltage test (see 4.5.8.1) shall be

conducted.

4.5.16 Vibration (see 3.5.14). The connector assembly shall be mounted as specified herein and vibrated in

accordance with test procedure EIA-364-28, test condition IV. All contacts shall be wired in series with at least 100

milliamperes of current allowed to flow. A suitable instrument shall be employed to monitor the current flow and to

indicate any discontinuity or interruption of current flow. Requirements shall be 3.5.14.

4.5.16.1 Conne ctor mou nt in g. Each receptacle shall be mounted on a suitable fixture, which in turn shall be

attached to a vibration table. A suitable sensor shall monitor the receptacles at a point on or near the receptacle. A

counterpart plug shall be engaged with the receptacle and shall not be held by any locking means. The wire bundles

or cables attached to the receptacle shall be clamped to nonvibrating points at least 8 inches from the rear of the

receptacle. The wire bundles or cables attached to the plug shall be clamped to a vibrating point 4 ±1/2 inches from

the rear of the plug. The clamping length shall be chosen to avoid resonance of the wire bundles or cables. To

eliminate possible wire breakage when testing connectors wired with number 28 AWG wire, a strain relief clamp that

mounts directly to the connector and reduces the clamping length of the wire bundle to a minimum is permitted.

4.5.16.2 Printed wiring board connector mounting. Right angle connect ors sha ll hav e the recep tac le moun t ed on

an epoxy glass printed wiring board, 1/16 inch minimum (plus added tolerances) thick and clamped to a suitable

fixture which in turn shall be firmly mounted on the vibration table. Each plug shall be mounted in the normal manner

at one end of the rectangular epoxy glass laminate board. The board shall be 1/16 inch minimum thick.

4.5.17 Shock (see 3.5.15). Mated connect ors sh all be subjected to test condition E, in acc ordance with test

procedure EIA-364-27. One shock shall be applied in each direction of the three major axes of the connectors.

Receptacl es shall be moun ted similar to the mounting specified in 4.5.16.1. Plugs shall be engaged with the

receptacles and shall not be held by any locking means. All contacts shall be wired in series with a minimum of 100

milliamperes of current allowed to flow. The wire bundles or cables shall be clamped to structures that move. A

minimum of 8 inches of wire or cable shall be unsupported behind the rear of the receptacle and 4 ±1/2 inches of wire

or cable shall be unsupported behind the rear of the plug. A suitable instrument shall be employed to indicate any

discontinuity or interruption of current flow. Requirement shall be 3.5.15.

4.5.17.1 Printed wiring board connector mounting. Mounting method 4.5.16.2.

MIL-DTL-24308H

4.5.18 Durability ( see 3.5.16). Connectors shall be tested in accordance with test procedure EAI-364-09. The

following deta ils apply :

a. Mated and unmated 500 times at a rate of 200 ±100 cycles per hour.

b. After 500 cycles mated connectors shall be subjected to salt spray.

4.5.19 Salt spray (corrosion) (see 3.5.17). Mated connectors shall be subjected to a salt spray test in accordance

with test procedure EIA-364-26, test condition B. After exposure, connectors shall be thoroughly washed with tap

water to remove all salt deposits and then shall be dried in a circulating air oven at temperature of 38°C ±3°C for a

period of 12 hours. They shall then be visually examined for evidence of corrosion and subjected to the contact

resistance test specified in 4.5.11 and the mating and unmating force test 4.5.6.

4.5.20 Oversize pin exclusion (see 3.5.18). A hardened steel oversize pin, 3.5.18, sha ll be plac ed in a position

centered and parallel to the axis of the socket contact. A 12-ounce axial force shall then be applied tending to force

the test pin into the socket contact. After completion of the test, the contacts shall be subjected to the contact

resistance test as specified in 4.5.11. This test shall be performed on 20 percent or a minimum of four, of the socket

contacts in each connector.

4.5.21 Resistance to test probe damage (see 3.5.19). Socket contacts shall be tested in accordance with test

procedure EIA-364-25. The following details shall apply:

a. The test shall be performed on 20 percent of the contacts, or a minimum of four contacts.

b. After testing, the contacts shall meet the requirements specified in 3.5.19 (contact engage m ent and

separation).

c. Type 1 or type 2 contact holding device.

d. Probe damage tool shall be inserted into the contact to the following depths:

Contact

size

Holding fixture

Type 1

Type 2

.202 ±.005, .077 ±.005

.250 ±.005, .125 ±.007

IDC

.202 ±.005, .077 ±.005 .250 ±.005, .125 ±.007

e. The diameter of the handle (.190) is not applicable.

4.5.22 Fl uid im mer sion (see 3.5.20). Connectors shall be tested in accordance with test procedure EIA-364-10.

The following details apply:

a. Test fluid (a).

b. Test fluid (d).

4.5.23 Insert retention (see 3.5.21). Unmated connectors shall be tested in accordance with test procedure

EIA-364-35:

a. Force to be applied: 10 lb/in2 per second until pressure specified in 3.5.21 is reached.

b. For classes D, G, M, and N connectors, the wired contacts may be removed for convenience of testing.

4.5.24 Solderability (see 3.5.23). Solderability, nonremovable contact terminations except wrappost, IDC, and

crimp, shall be tested in accordance with MIL-STD-202-208 (type R or RMA flux may be used). Solder cup

terminations shall be tested in the following manner:

a. Test samples shall not be cleaned prior to soldering.

MIL-DTL-24308H

b. Test sample connectors shall have the solder cups dipped in, or brushed with, flux type RMA just prior to

the application of solder .

c. A pencil type soldering iron shall be used, with temperature regulated to 360°C ±10°C to heat the test

solder cups.

d. After heating the test solder cups to a solder melt temperature, 63/37 tin-lead type solder s hall be appl ied to

fill the solder cup to a capacity which will result in solder wetting the entire cup surface and forming a solder

fill meniscus across the open portion of the solder cup.

e. The finished solder fill shall be smooth and slightly concave with clear wetting and adhesion to all internal

surfaces of the solder cup. Inspection shall be aided by a 10X optical aid.

f. Twenty percent but not less than seven contacts of test specimen shall be tested.

4.5.25 Contact pin strength (nonremovable contacts) (see 3.5.22). Contacts shall be mounted in a suitable fixture

and a gradual load applied to the pin as shown on figure 4. The rate of travel of the testing machine shall not exceed

1 inch per minute, and the load shall be maintained for one minute +15, -0 seconds. The permanent set shall be the

difference between the initial and final position of the load application after load removal.

0.8L

MIN

PERMANENT

SET

Mating

end

size

moment

(lb-in.)

(unless otherwise

specified see 3.1)

.53

.22

.16

.13

FIGURE 4. Contact pin streng th.

4.5.26 Thermal vacuum outgassing (classes D, K, and M) (see 3.5.24). All nonmetallic materials, including

lubricants, used in the manufacture of these connectors shall be tested in accordance with JSC SP-R-0022 or

ASTM E595 to determine the maximum TML of the original specimen mass and the VCM content of the original

specimen mass. For the purpose of determining TML and VCM of connectors, the original specimen mass shall be

the assembled connector mass excluding metallic parts. The TMC and VCM for the connectors may be determined

by testing the specific materials of the connector and calculating the loss for the connector.

4.5.27 Resistance to solder heat (solderable, nonremovable contacts only) (see 3.5.25). Unmated connectors with

printed wiring board terminations shall be tested in accordance with MIL-STD-202-210, condition C. Unmated

connectors with solder terminations shall be tested as follows:

a. Where applicable (not for printed circuit board type connectors) the appropriate copper wire size, 2 to 4

inches in length, properly prepared for the applicable solder cup size shall be inserted into the contact

termination. Seven contacts or twenty percent of the contacts, whichever is greater, shall be tested.

MIL-DTL-24308H

b. The test specimens shall be fluxed accordingly with flux liquid or other techniques (see 3.3.1).

c. The solder iron shall be heated to a temperature of 360°C ±10°C. It shall be applied to the termination for a

period necessary to hold the solder in a liquid state for 4 to 5 seconds. Solder type to be used is SN-63 in

accordance w ith J-STD-006.

d. After application, the soldering iron shall be removed and a visual and mechanical inspection performed.

The visual inspection shall be at 10X.

e. The connector shall show no evidence of distortion or damage to any area of the connector housing. The

contact shall meet the contact retention requirement (see 3.5.5).

5. PACKAGING

5.1 Packaging. For acquisition purposes, the packaging requirement shall be the contract or order (see 6.2).

When packaging of materiel is to be performed by DoD or in-house contra ctor per sonn el, t h ese pers onne l need to

contact the responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements

are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or

within the military service's system commands. Packaging data retrieval is available from the managing Military

Department or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible

packaging activity.

6. NO TES

(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)

6.1 Inten ded use. These connectors are intended for general military use. Connector installations should be

designed to assure that connectors are mated within the li mit s spe cif ied in 3.4.5. The class and types of connectors

are intended for application as follows:

a. Classes G and N connectors are intended for use in applications where the operating temperature range

-55° to +125°C is experienced. Crimp contact connectors have the additional advantage of possessing

removable crimp-type contact s .

b. Class N connectors are intended for use in applications where the presence of residual magnetism must be

held to very low levels to avoid interference with nearby sensitive instrumentation.

c. Class H receptacles are intended for use in applications where atmospheric pressures must be contained

by the connectors across the wall or panels on which they are mounted. If air leakage requirements are

critical, a class H connector should be used.

d. Crimp contact co nne ctor s should have contacts present in all positions when the connector is installed.

e. Classes D, K, and M connectors are for high reliability space applications.

f. Connector inst all ations should be designed to assure that co nnec t ors are mate d w ithin the l imit s specified

in 3.4.5.

6.2 Acqui sit ion requ ir e ment s. Acquisition documents must specify the following:

a. Title, number, and date of the specification.

b. Title, number, and date of the applicable specification sheet and the complete PIN (see 3.1).

c. Packaging requirement (see 5.1).

d. Contact finish for class G connectors should be overall finish in accordance with 3.3.4.2.1, unless localized

finish in accordance with 3.3.4.2.2 as specified by OEM on acquisition document.

MIL-DTL-24308H

e. Optional 100% contact engagement and separation forces (see 4.5.12.1) at the request of the OEM.

6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are,

at the time of award of contract, qualified for inclusion in Qualified Products List QPL No. 24308 whether or not such

products have actu ally been so listed by that date. The attention of the contractors is called to these requirements,

and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government

tested for qualification in order that they may be eligible to be awarded contracts or orders for the products covered

by this specification. Information pertaining to qualification of products may be obtained from Defense Supply Center

Columbus, DLA Land and Maritime-VQ), Document Control Unit, Columbus, OH 43218-3990 or e mail

vqchief@dla.mil. An online listing of products qualified to this specification may be found in the Qualified Products

Database (QPD) at https://assist.dla.mil.

6.4 Copyright notice. All information disclosed in this specification and related specification sheets and military

standards which are or may be copyrighted by ITT Cannon Electric are reproduced herein with the express

permission of the copyright owner.

6.5 Definitions.

6.5.1 Overall finish. A finish having a specified minimum thickness applied over the entire surface area, such as

barrel plating technique or other nonselective plating techniques, etc.

6.5.2 Localized finish. A finish having a specified minimum thickness applied to a definite area, such as, clad,

inlay, welded dot, selective plating technique, etc.

6.5.3 Gold finish. A finish having an unspecified thickness of gold not requiring a specific thickness.

6.6 Specification sheet selection. Use table XIV to determine desired connector specification sheet from the

features listed.

6.7 Tin whisker growth. The use of alloys with tin content greater than 97 percent may exhibit tin whisker growth

problems after manufacture. Tin whiskers may occur anytime from a day to years after, and can develop under

typical operation conditions on products that use such materials. Conformal coatings applied over top of a whisker-

prone surface will not prevent t he formation of tin whiskers. Alloys of 3 percent lead have shown to inhibit the growth

of tin whiskers.

MIL-DTL-24308H

TABLE XIV. Specifi cati on she et selection.

Specification

sheet

Class

Mounting

method

Contact

type

Termination

type

Contact

size

Positions available

M24308/1 D, G Panel Socket Solder cup 2/

22D

9,15, 25, 37, 50

none

M24308/2 D, G Panel Socket Crimp

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78,

104

M24308/3 D, G Panel Pin Solder cup 2/

22D

9,15, 25, 37, 50

none

M24308/4 D, G Panel Pin Crimp

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78,

104

M24308/5 M, N Panel Socket Solder cup 2/

22D

9,15, 25, 37, 50

none

M24308/6 M, N Panel Socket Crimp

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78,

104

M24308/7 M, N Panel Pin Solder cup 2/

22D

9,15, 25, 37, 50

none

M24308/8 M, N Panel Pin Crimp

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78,

104

M24308/9 H, K Panel Pin Solder cup, eyelet

22D

9,15, 25, 37, 50

none

M24308/23 G PCB Socket Straight, right angle

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78

M24308/24 G PCB Pin Straight, right angle

22D

9,15, 25, 37, 50

15, 26, 44, 62, 78

M24308/25

Male screw lock

M24308/26

Female screw lock

M24308/27 G Panel Socket IDC

22D

9,15, 25, 37

M24308/28 G Panel Pin IDC

22D

9,15, 25, 37

1/ See Appendix A.

2/ See Appendix B.

MIL-DTL-24308H

6.8 Subject term (ke y word) listi ng.

Contacts

Crimp

Current

Finish

Heat

Humidity

Inspection

Insulation displacement

Magnetic permeability

Materials

Mating force

Military standards

Plug

Printed wiring board

Qualification

Sampling

Socket

Solder

Solderability

Temperature

Voltage

6.9 Changes from previous issue. The margins of this specification are marked with vertical lines to indicate where

changes from the previous issue were made. This was done as a convenience only and the Government assumes no

liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the

requireme nts of this document based on the entire content irrespective of the marginal notations and relationship to

the previous issue.

MIL-DTL-24308H

APPENDIX A

INSERT ARRANGEMENTS, ELECTRICAL CONNECTOR,

SHELL SIZES 1 THROUGH 6

A.1 SCOPE

A.1.1 Scope. This appendix covers insert arrangements for use with MIL-DTL-24308 rectangular

nonenvironmental, polarized shell, miniature, rack and panel connectors. This Appendix is a mandatory part of the

specification. The information contained herein is intended for compliance.

A.2 APPLICABLE DOCUMENTS

(This section not applicable to this appendix.)

A.3 GENERAL REQUIREMENTS

(This section not applicable to this appendix)

A.4 DETAIL REQUIREMENTS

A.4.1 Insert arrangements. See table A-I below and figures A-1 through A-6.

TABLE A-I. Insert arrangements.

Figure

number

Arrangement

number

Shell

size

Contacts

Superseded

MS Number

No. 22D

No. 20

A-1

- 9 MS18273-1

15 - MS18273-2

A-2 1

- 15 MS18274-1

26 - MS18274-2

A-3

- 25 MS18275-1

44 - MS18275-2

A-4

- 37 MS18276-1

62 - MS18276-2

A-5

- 50 MS18277-1

78 - MS18277-2

A-6 1 6 104 - MS14004-1

MIL-DTL-24308H

APPENDIX A

A.4.1.1 Dimensions. Dimensions shall be as specified in the applicable section of this appendix and the following:

a. Dimensions are in inches.

b. Metric equivalents are given for information only.

c. All dimensions are TP (true position).

d. Contact holes in insert shall be located on TP within a .005 (0.13 mm) diameter circle. Maximum material

condition applies.

e. Markings are shown for the pin insert front. Socket inserts are opposite.

f. In the event of a conflict between the text of this appendix and the references cited herein, the text of this

appendix shall take precedence.

MIL-DTL-24308H

APPENDIX A

FIGURE A-1. Shell size 1.

Inches

.010

0.25

.035

0.89

.054

1.37

.055

1.40

.056

1.42

.078

1.98

.080

2.03

.100

2.54

.108

2.74

.112

2.84

.125

3.18

.145

3.68

.162

4.11

.170

4.32

.190

4.83

.215

5.46

.216

5.49

MIL-DTL-24308H

APPENDIX A

ARRANGEMENT 2

26 size 22D contacts.

Inches

.020

0.51

.200

5.08

.025

0.64

.205

5.21

.054

1.37

.216

5.49

.056

1.42

.245

6.22

.065

1.65

.250

6.35

.070

1.78

.270

6.86

.078

1.98

.290

7.37

.108

2.74

.295

7.49

.110

2.79

.324

8.23

.112

2.84

.335

8.51

.115

2.92

.340

8.64

.155

3.94

.378

9.60

.160

4.06

.380

9.65

.162

4.11

.385

9.78

NOTES:

1. Dimensions are in inches.

2. Metric equivalents are given for information only.

FIGURE A-2. Shell size 2.

MIL-DTL-24308H

APPENDIX A

Inches

.020

0.51

.155

3.94

.326

8.28

.489

12.42

.025

0.64

.160

4.06

.335

8.51

.515

13.08

.055

1.40

.163

4.14

.340

8.64

.520

13.21

.056

1.42

.200

5.08

.380

9.65

.544

13.82

.065

1.65

.205

5.21

.381

9.68

.560

14.22

.070

1.78

.218

5.54

.385

9.78

.565

14.35

.078

1.98

.245

6.22

.425

10.80

.598

15.19

.109

2.77

.250

6.35

.430

10.92

.605

15.37

.110

2.79

.272

6.91

.435

11.05

.610

15.49

.112

2.84

.290

7.37

.470

11.94

.650

16.51

.115

2.92

.295

7.49

.475

12.06

.652

16.56

.655

16.64

NOTES:

1. Dimensions are in inches.

2. Metric equivalents are given for information only.

FIGURE A-3. Shell size 3.

MIL-DTL-24308H

APPENDIX A

ARRANGEMENT 1

37 size 20 contacts

FIGURE A-4. Shell size 4.

MIL-DTL-24308H

APPENDIX A

.213

.2605

.023

.0705

.118

.1165

.0245

.072

.1195

.167

.2145

.262

.927

.8795

.832

.7845

.737

.6895

.642

.5945

.547

.4995

.452

.4045

.357

.3095

.878

.9255

.8305

.783

.7355

.688

.6405

.593

.5455

.498

.4505

.403

.3555

.308

.9745

.973

ARRANGE ME NT 2

62 size 22D cont acts

Inches

.023

0.58

.218

5.54

.498

12.65

.761

19.33

.0245

0.622

.2605

6.617

.4995

12.687

.783

19.89

.055

1.40

.262

6.65

.544

13.82

.7845

19.926

.056

1.42

.272

6.91

.5455

13.856

.815

20.70

.0705

1.791

.308

7.82

.547

13.89

.8305

21.095

.072

1.83

.3095

7.861

.593

15.06

.832

21.13

.078

1.98

.326

8.28

.5945

15.100

.870

22.10

.109

2.77

.3555

9.030

.598

15.19

.878

22.30

.112

2.84

.357

9.07

.6405

16.269

.8795

22.339

.118

3.00

.381

9.68

.642

16.31

.924

23.47

.1195

3.035

.403

10.24

.652

16.56

.9255

23.508

.163

4.14

.4045

10.27

.688

17.48

.927

23.55

.1655

4.204

.435

11.05

.6895

17.513

.973

24.71

.167

4.24

.4505

11.443

.707

17.96

.9745

24.752

.213

5.41

.452

11.48

.7355

18.682

.978

24.84

.2145

5.448

.489

12.42

.737

18.72

NOTES:

1. Dimensions are in inches.

2. Metric equivalents are given for information only.

FIGURE A-4. Shell size 4 - Continued.

MIL-DTL-24308H

APPENDIX A

ARRANG E ME NT 1

50 size 20 c ont acts

FIGURE A-5. Shell size 5.

MIL-DTL-24308H

APPENDIX A

ARRANGEMENT 2

78 size 22D cont acts

Inches

.041

1.04

.218

5.54

.435

11.05

.707

17.96

.0475

1.206

.224

5.69

.475

12.07

.7125

18.098

.055

1.40

.2375

6.033

.489

12.42

.760

19.30

.095

2.41

.272

6.91

.5225

13.272

.761

19.33

.109

2.77

.285

7.24

.544

13.82

.8075

20.511

.112

2.84

.326

8.28

.570

14.48

.815

20.70

.123

3.12

.3325

8.446

.598

15.19

.855

21.72

.1425

3.620

.380

9.65

.6175

15.685

.870

22.10

.163

4.14

.381

9.68

.652

16.56

.9025

22.924

.190

4.83

.4275

10.859

.665

16.89

NOTES:

1. Dimensions are in inches.

2. Metric equivalents are given for information only.

FIGURE A-5. Shell size 5 - Continued.

MIL-DTL-24308H

APPENDIX A

Inches

.0165

0.419

.221

5.61

.4915

12.484

.7435

18.885

.031

0.79

.254

6.45

.506

12.85

.7765

19.723

.064

1.63

.2685

6.820

.539

13.69

.791

20.09

.0785

1.994

.3015

7.658

.5535

14.059

.824

20.93

.082

2.08

.316

8.03

.5865

14.897

.8385

21.298

.1115

2.832

.349

8.86

.601

15.27

.8715

22.136

.126

3.20

.3635

9.233

.634

16.10

.886

22.50

.159

4.04

.3965

10.071

.6485

16.472

.919

23.34

.164

4.17

.411

10.44

.6815

17.310

.9335

23.711

.1735

4.407

.444

11.28

.696

17.68

.9665

24.549

.2065

5.245

.4585

11.646

.729

18.52

.981

24.92

NOTES:

1. Dimensions are in inches.

2. Metric equivalents are given for information only.

FIGURE A-6. Shell size 6.

MIL-DTL-24308H

APPENDIX B

CONTACT PIN AND SOCKET

CLASSES G, N, AND H SOLDERTYPE,

NON-REMOVABLE

B.1 SCOPE

B1.1 Scope. This appendix covers contacts, pin and socket, classes G, N and H solder type, non-removable for

use with MIL-DTL-24308 rectangular, nonenvironmental, polarized shell, miniature, rack and panel connectors. This

Appendix is a mandatory part of the specification. The information contained herein is intended for compliance.

B.2 APPLICABLE DOCUMENTS

(This section not applicable to this appendix.)

B.3 GENERAL REQUIREMENTS

(This section not applicable to this appendix.)

B.4 DETAIL REQUIREMENTS

B.4.1 Dimensions and configurations. See table B-I and figures B-1 through B-6. The following details apply:

a. Dimensions are in inches.

b. Metric equivalents (to the nearest .01 mm) are given for information only.

c. Dimensions are after plating.

d. Reference documents shall be of the issue in effect on the date of invitation for bids.

e. For design feature purposes, this appendix takes precedence over procurement documents referenced

herein.

f. Lock ring optional - alternate retention for classes G and N connectors, figures B-1 and B-2.

TABLE B-I. Contact configurations.

Figure

number

Size

Contact

Type

Termination

Class

Superseded

MS number

B-1

Socket

Solder cup

G, N

MS18281-1

B-2

Solder cup

G, N

MS18281-2

B-3

Eyelet

MS18281-3

B-4

Solder cup

MS18281-4

B-5

22D

Socket

Solder cup

G,N

MS18281-5

B-6

22D

Solder cup

G,N

MS18281-6

FIGURE B -2. Pin, size 20 (solder cup) for

connector c l asses G,M ,N, and D.

FIGURE B -1. Socket, si ze 20 (s ol der cup) for

connector c l asses G, M, N, and D.

LOCKRING

Optional

(See B.4.1f )

.041DIA

.039

MIL-DTL-24308H

APPENDIX B

FIGURE B-5. Socket, size 22D (solder cup)

for connect or classes G and N.

FIGURE B-6. Pin, size 22D (s older cup) for

connector classes G and N.

FIGURE B-3. Pin, size 20 eyelet for connector

class H

FIGURE B-4. Pin, size 20 s ol der cup for

connector class H.

DIA

.0305

.0295

DIA

Inches

.012

.30

.050

1.27

.078

1.98

.0295

.749

.055

1.40

.085

2.16

.0305

.775

.057

1.45

.090

2.29

.0345

.876

.060

1.52

.093

2.36

.039

.99

.061

1.55

.098

2.49

.041

1.04

.066

1.68

.103

2.62

.042

1.07

.070

1.78

.110

2.79

.047

1.19

.072

1.83

.133

3.38

.049

1.24

MIL-DTL-24308H

CONCLUDING MATERIAL

Custodians: Preparing activity:

Army - CR DLA - CC

Navy - EC

Air Force - 85 (Project 5935-2018-010)

NASA - NA

DLA - CC

Review activities:

Army - AT, CR4, MI

Navy - AS, CG, MC, SH

Air Force - 99

MISC - MDA

NOTE: The activities listed above were interested in this document as of the date of this document. Since

organizations and responsibilities can change, you should verify the currency of the information above using the

ASSIST Online database at https://assist.dla.mil.