January 2001
Advance Information
Copyright © Alliance Semiconductor. All rights reserved.
®
AS7C1026A
AS7C31026A
5V/3.3V 64K X 16 CMOS SRAM
2/6/01; V.0.9 Alliance Semiconductor P. 1 of 9
Features
AS7C1026A (5V version)
AS7C31026A (3.3V version)
Industrial and commercial versions
Organization: 65,536 words × 16 bits
Center power and ground pins for low noise
High speed
- 10/12/15/20 ns address access time
- 3/3/4/5 ns output enable access time
Low power consumption: ACTIVE
- 660 mW (AS7C1026A) / max @ 10 ns
- 324 mW (AS7C31026A) / max @ 10 ns
Low power consumption: STANDBY
- 55 mW (AS7C1026A) / max CMOS I/O
- 36 mW (AS7C31026A) / max CMOS I/O
Latest 6T 0.25u CMOS technology
2.0V data retention
Easy memory expansion with CE, OE inputs
TTL-compatible, three-state I/O
JEDEC standard packaging
- 44-pin 400 mil SOJ
- 44-pin 400 mil TSOP II
- 48-ball 6 mm × 8 mm CSP mBGA
ESD protection 2000 volts
Latch-up current 200 mA
Logic block diagram
64K × 16
Array
OE
CE
WE Column decoder
Row decoder
A0
A1
A2
A3
A4
A5
A7
VCC
GND
A8
A9
A10
A11
A12
A13
A14
A15
Control circuit
I/O0–I/O7
I/O8–I/O15
UB
LB
I/O
buffer
A6
Pin arrangement
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
I/O13
I/O12
GND
VCC
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
A0
CE
I/O0
I/O1
I/O2
I/O3
VCC
GND
I/O4
I/O5
I/O6
I/O7
WE
A15
A14
A13
44-Pin SOJ, TSOP II (400 mil)
21
22
A12
NC
UB
LB
I/O15
I/O14
2
A3
3
A2
4
A1
1
A4
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
43
42
41
44
A6
A7
OE
A5
AS7C1026A
AS7C31026A
Selection guide
AS7C1026A-10
AS7C31026A-10
AS7C1026A-12
AS7C31026A-12
AS7C1026A-15
AS7C31026A-15
AS7C1026A-20
AS7C31026A-20 Unit
Maximum address access time 10 12 15 20 ns
Maximum output enable access time 3345ns
Maximum operating current AS7C1026A 120 110 100 100 mA
AS7C31026A 90 80 80 80 mA
Maximum CMOS standby
current
AS7C1026A 10 10 10 15 mA
AS7C31026A 10 10 10 15 mA
48-CSP mini Ball-Grid-Array Package
123456
ALB OE A0A1A2NC
BI/O8 UB A3 A4 CE I/O0
CI/O9
I/O10
A5 A6 I/O1 I/O2
DV
SS
I/O11
NC A7 I/O3 VDD
EV
DD
I/O12
NC NC I/O4 VSS
FI/O14
I/O13
A14 A15 I/O5 I/O6
GI/O15 NC A12 A13 WE I/O7
HNC A8 A9A10A11NC
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 2 of 9
Functional description
The AS7C1026A and AS7C31026A are high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices organized as
65,536 words × 16 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 3/3/4/5 ns are ideal for
high-performance applications.
When CE is high the devices enter standby mode. The AS7C1026A is guaranteed not to exceed 55 mW power consumption in CMOS
standby mode. The devices also offer 2.0V data retention.
A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data on the input pins I/O0–I/O15 is written on the
rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/O pins only after outputs
have been disabled with output enable (OE) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. the chips drive I/O pins
with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, output
drivers stay in high-impedance mode.
The devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be written and
read. LB controls the lower bits, I/O0–I/O7, and UB controls the higher bits, I/O8–I/O15.
All chip inputs and outputs are TTL-compatible, and operation is from a single 5V supply (AS7C1026A) or 3.3V supply (AS7C31026A). the
device is packaged in common industry standard packages. Chip scale BGA packaging, easy to use in manufacturing, provides the smallest
possible footprint. This 48-ball JEDEC-registered package has a ball pitch of 0.75 mm and external dimensions of 8 mm × 6 mm.
Absolute maximum ratings
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Truth table
Key: H = High, L = Low, X = don’t care.
Parameter Symbol Min Max Unit
Volt age on V CC relative to GND AS7C1026A Vt1 –0.50 +7.0 V
AS7C31026A Vt1 –0.50 +5.0 V
Voltage on any pin relative to GND Both Vt2 –0.50 VCC +0.50 V
Power dissipation Both PD–1.0W
Storage temperature (plastic) Both Tstg –65 +150 °C
Ambient temperature with VCC
applied Both Tbias –55 +125 °C
DC current into outputs (low) Both IOUT –20mA
CE WE OE LB UB I/O0–I/O7 I/O8–I/O15 Mode
H X X X X High Z High Z Standby (ISB), ISBI)
LHLLHD
OUT High Z Read I/O0–I/O7 (ICC)
LHLHLHigh ZD
OUT Read I/O8–I/O15 (ICC)
LHLLLD
OUT DOUT Read I/O0–I/O15 (ICC)
LLXLL D
IN DIN Write I/O0–I/O15 (ICC)
LLXLHD
IN High Z Write I/O0–I/O7 (ICC)
LLXHLHigh ZD
IN Write I/O8–I/O15 (ICC)
L
L
H
X
H
X
X
H
X
HHigh Z High Z Output disable (ICC)
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 3 of 9
Recommended operating conditions
VIL min. = –3.0V for pulse width less than tRC/2.
DC operating characteristics (over the operating range)1
Capacitance (f = 1MHz, Ta = 25 °C, VCC = NOMINAL)2
Parameter Device Symbol Min Nominal Max Unit
Supply voltage AS7C1026A VCC 4.5 5.0 5.5 V
AS7C31026A VCC 3.0 3.3 3.6 V
Input voltage
AS7C1026A VIH 2.2 VCC + 0.5 V
AS7C31026A VIH 2.0 VCC + 0.5 V
Both VIL–0.5 0.8 V
Ambient operating temperature commercial TA0– 70 oC
industrial TA–40 85 oC
Parameter Sym Test conditions Device
-10 -12 -15 -20
UnitMin Max Min Max Min Max Min Max
Input leakage
current | ILI | VCC = Max
VIN = GND to VCC
Both 1 1 1 1 µA
Output leakage
current | ILO | VCC = Max
CE = VIH,
VOUT = GND to VCC
Both 1 1 1 1 µA
Operating power
supply current ICC
VCC = Max, CE VIL
outputs open,
f = fMax = 1/tRC
AS7C1026A 120 110 100 100 mA
AS7C31026A 90 80 80 80 mA
Standby
power supply
current
ISB
VCC = Max, CE VIL,
outputs open,
f = fMax = 1/tRC
AS7C1026A 30 25 20 20
mA
AS7C31026A 30 25 20 20
ISB1
VCC = Max, CE VCC–0.2V,
VIN GND + 0.2V or
VIN VCC–0.2V, f = 0
AS7C1026A 10 10 10 15
mA
AS7C31026A 10 10 10 15
Output
voltage
VOL IOL = 8 mA, VCC = Min AS7C1026A 0.4 0.4 0.4 0.4 V
VOH IOH = –4 mA, VCC = Min AS7C31026A 2.4 2.4 2.4 2.4 V
Data retention
current ICCDR
VCC = 2.0V
CE VCC–0.2V
VIN VCC–0.2V or
VIN 0.2V
AS7C1026A 11 1 5mA
AS7C31026A 11 1 5mA
Parameter Symbol Signals Test conditions Max Unit
Input capacitance CIN A, CE, WE, OE, LB, UB VIN = 0V 5 pF
I/O capacitance CI/O I/O VIN = VOUT = 0V 7 pF
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 4 of 9
Read cycle (over the operating range)3,9
Key to switching waveforms
Read waveform 1 (address controlled)3,6,7,9
Read waveform 2 (OE, CE, UB, LB controlled)3,6,8,9
Parameter Symbol
-10 -12 -15 -20
Unit NotesMinMaxMinMaxMinMaxMinMax
Read cycle time tRC 10 12 15 20 ns
Address access time tAA –10–12–15–20ns 3
Chip enable (CE) access time tACE –10–12–15–20ns 3
Output enable (OE) access time tOE –3–3–4–5ns
Output hold from address change tOH 2–3–3–3–ns 5
CE Low to output in low Z tCLZ 0–0–0–0–ns4, 5
CE High to output in high Z tCHZ –3–3–4–5ns4, 5
OE Low to output in low Z tOLZ 0–0–0–0–ns4, 5
Byte select access time tBA –3–3–4–5ns
Byte select Low to low Z tBLZ 0–0–0–0–ns4, 5
Byte select High to high Z tBHZ –5–6–6–8ns4, 5
OE High to output in high Z tOHZ –3–3–4–5ns4, 5
Power up time tPU 0–0–0–0–ns4, 5
Power down time tPD –10–12–15–20ns4, 5
Undefined output/don’t careFalling inputRising input
t
OH
t
AA
t
RC
t
OH
Data
OUT
Address
Data validPrevious data valid
Data valid
t
RC
t
AA
t
BLZ
t
BA
t
OE
t
OLZ
t
OH
t
OHZ
t
HZ
t
BHZ
t
ACE
t
LZ
Address
OE
CE
LB, UB
Data
IN
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 5 of 9
Write cycle (over the operating range) 11
Write waveform 1 (WE controlled)10,11
Write waveform 2 (CE controlled)10,11
Parameter Symbol
-10 -12 -15 -20
Unit NotesMin Max Min Max Min Max Min Max
Write cycle time tWC 10 12 15 20 ns
Chip enable (
CE
) to write end tCW 8 10 12 12 ns
Address setup to write end tAW 8 9 10 12 ns
Address setup time tAS 00–0 0– ns
Write pulse width tWP 7–8912 ns
Address hold from end of write tAH 00–0 0– ns
Data valid to write end tDW 5–6810 ns
Data hold time tDH 00–0 0– ns 5
Write enable to output in high Z tWZ 6 6 6 8 ns 4, 5
Output active from write end tOW 11–1 2– ns 4, 5
Byte select low to end of write tBW 8 10 12 12 ns
Address
CE
LB, UB
WE
Data
IN
Data
OUT
t
WC
t
CW
t
BW
t
AW
t
AS
t
WP
t
DW
t
DH
t
OW
t
WZ
t
WR
Data undefined high Z
Data valid
Address
CE
LB, UB
WE
Data
IN
t
WC
t
CW
t
BW
t
WP
t
DW
t
DH
t
OW
t
WZ
t
WR
Data
OUT
Data undefined
high Z high Z
t
AS
t
AW
Data valid
t
CLZ
AS7C1026A
AS7C31026A
®
2/6/01 Alliance Semiconductor P. 6 of 9
Data retention characteristics (over the operating range)
Data retention waveform
AC test conditions
Notes
1During V
CC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.
2 This parameter is sampled, but not 100% tested.
3 For test conditions, see AC Test Conditions, Figures A, B, and C.
4 These parameters are specified with CL = 5pF, as in Figures B or C. Transition is measured ± 500 mV from steady-state voltage.
5 This parameter is guaranteed, but not tested.
6WE
is High for read cycle.
7CE
and OE are Low for read cycle.
8 Address valid prior to or coincident with CE transition Low.
9 All read cycle timings are referenced from the last valid address to the first transitioning address.
10 CE or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle.
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 Not applicable.
13 C=30pF, except all high Z and low Z parameters where C=5pF.
Parameter Symbol Test conditions Min Max Unit
VCC for data retention VDR
VCC = 2.0V
CE VCC–0.2V
VIN VCC–0.2V or
VIN 0.2V
2.0 V
Data retention current ICCDR –1 ma
Chip deselect to data retention time tCDR 0–ns
Operation recovery time tRtRC –ns
Input leakage current |ILI|–1µA
V
CC
CE
t
R
t
CDR
Data retention mode
V
CC
V
CC
V
DR
2.0V
V
IH
V
IH
V
DR
255W C(14)
320W
GND
+3.3V
Figure C: 3.3V Output load
168W
Thevenin Equivalent:
D
OUT
+1.728V (5V and 3.3V)
255W C(14)
480W
GND
+5V
Figure B: 5V Output load
10%
90%
10%
90%
GND
+3.0V
Figure A: Input pulse
2 ns
D
OUT
D
OUT
Output load: see Figure B or Figure C.
Input pulse level: GND to 3.0V. See Figure A.
Input rise and fall times: 2 ns. See Figure A.
Input and output timing reference levels: 1.5V.
®
AS7C1026A
AS7C31026A
2/6/01; V.0.9 Alliance Semiconductor P. 7 of 9
Package dimensions
44-pin TSOP II
Min
(mm)
Max
(mm)
A1.2
A1 0.05
A2 0.95 1.05
b0.30 0.45
c 0.127 (typical)
D 18.28 18.54
E10.03 10.29
He 11.56 11.96
e 0.80 (typical)
l0.400.60
D
He
1234567891011121314
44 43 42 41 40 39 38 37 36 35 34 33 32 31
15 16
30 29
17 18 19 20
28 27 26 25
c
l
A1
A2
e
44-pin TSOP II
0–5
°
21
24
22
23
E
A
b
Seating
Plane
44-pin SOJ
44-pin SOJ
400 mil
Min (in) Max (in)
A 0.128 0.148
A10.025
A20.105 1.115
B 0.026 0.032
b 0.015 0.020
c 0.007 0.013
D 1.120 1.130
E 0.370 NOM
E10.395 0.405
E20.435 0.445
e 0.050 NOM
e
Pin 1
A1
b
B
A
A2
E2
E1
E2
D
c
AS7C1026A
AS7C31026A
®
2/6/01 Alliance Semiconductor P. 8 of 9
Notes
1 Bump counts: 48 (8 row x 6 column).
2 Pitch: (x,y) = 0.75 mm x 0.75 mm (typ).
3 Units: millimeters.
4 All tolerance are +/- 0.050 unless otherwise
specified.
5 Typ: typical.
6 Y is coplanarity: 0.08 (max).
Minimum Typical Maximum
A–0.75
B 5.90 8.00 8.10
B1 3.75
C 7.90 8.00 8.10
C1 5.25
D–0.35
E––1.20
E1 0.68
E2 0.22 0.25 0.27
Y–0.08
48-ball FBGA
Bottom View
6543 2 1 Ball A1
C1
A
B
C
D
F
G
H
J
A
B1
Side View
Top View
Ball #A1 index
C
SRAM DIE
Elastomer
B
Detail View
A
Y
Die
0.3/T
µ
p
E2
E
Die
D
E1
E2
E
*pin 1 indicator will show as
engraved circle and/or Inc. trade mark
*
®
AS7C1026A
AS7C31026A
© Copyright Alliance S em iconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are tra dem a rks o r reg istered tr ademar ks o f A llianc e. All o the r bra nd and
product names may be the trademarks of their respective companies. Alliance reserv es th e rig ht to m ak e ch an ges t o this d ocu m e nt and its pr odu cts at a ny time with out no tice. A llian ce assum e s no
responsibility fo r any erro r s that m ay app ea r in this do cume nt. T h e d ata con tain ed h ere in re pr esent s Allian ce ’s best data an d /or e stim ates a t the ti me of is suan ce. A l liance r eser ves th e righ t to
change or correct this data at any time, without notice. If the product described herein is under development, significant changes to th ese sp ecif ication s are possible . T h e in form a tio n in th is
product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or
customer . A llian ce d oe s not a ssum e any respo ns ibility or liability arisi ng o ut o f th e ap plic ation or u se o f any product described herein, and disclaims any express or implied warranties related to
the sale an d/o r u se of Allianc e pr o ducts i nclu din g liab ility o r w arra ntie s related to fitn ess fo r a p articula r p urp ose, m erc han tabi lity, or in frin ge me nt o f a ny intelle ctua l pro p erty righ ts, ex cep t as
expr ess ag reed to in Allianc e’s T erm s an d C on ditio ns of S ale (wh ich are av ailab le fro m A llianc e) . Al l sales o f A llianc e pr odu cts are m ade ex clusive ly a ccord ing to A llian ce’s T erm s and
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of A llia nce o r th ird p artie s. A llianc e do es no t au th orize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result
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against all claims arising from such use.
2/6/01; V.0.9 Alliance Semiconductor P. 9 of 9
Ordering codes
Part numbering system
Package \ Access time Volt/Temp 10 ns 12 ns 15 ns 20 ns
Plastic SOJ, 400 mil
5V commercial AS7C1026A-10JC AS7C1026A-12JC AS7C1026A-15JC AS7C1026A-20JC
5V industrial AS7C1026A-10JI AS7C1026A-12JI AS7C1026A-15JI AS7C1026A-20JI
3.3V commercial AS7C31026A-10JC AS7C31026A-12JC AS7C31026A-15JC AS7C31026A-20JC
TSOP II, 18.4×10.2
mm
5V commercial AS7C1026A-10TC AS7C1026A-12TC AS7C1026A-15TC AS7C1026A-20TC
3.3V commercial AS7C31026A-10TC AS7C31026A-12TC AS7C31026A-15TC AS7C31026A-20TC
3.3V industrial AS7C31026A-10TI AS7C31026A-12TI AS7C31026A-15TI AS7C31026A-20TI
CSP BGA, 8×6 mm
5V commercial AS7C1026A-10BC AS7C1026A-12BC AS7C1026A-15BC AS7C1026A-20BC
3.3V commercial AS7C31026A-10BC AS7C31026A-12BC AS7C31026A-15BC AS7C31026A-20BC
3.3V industrial AS7C31026A-10BI AS7C31026A-12BI AS7C31026A-15BI AS7C31026A-20BI
AS7C X 1026 –XX X C
SRAM
prefix
Blank=5V CMOS
3=3.3V CMOS
Device
number
Access
time
Package: J=SOJ 400 mil
T=TSOP type 2, 18.4 × 10.2 mm
B=CSP BGA, 8 × 6 mm
Temperature range,
C= Commercial: 0° C to 70° C
I= Industrial: -40° C to 85° C