This document is a general product description and is subject t o change without notice. Hynix Semiconductor do es not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev. 0.3 / Sep. 2008 1
240pin DDR2 VLP Registerd DIMMs based on 1Gb E version
This Hynix DDR2 VLP (Very Low Profile) registered Dual In-Line Memory Module (DIMM) series consists of 1Gb E ver-
sion DDR2 SDRAMs in Fine Ball Grid Array (FBGA) packages on a 240pin glass-epoxy substrate. This Hynix 1Gb E ver-
sion based VLP R egistere d DIMM ser ies pro vide a high performance 8 byte interf ace in 133.3 5mm width f orm f actor of
industry standard. It is suitable for easy interchange and addition.
ORDERING INFORMATION
SPEED GRADE & KEY PARAMETERS
Part Name Density Org. # of
DRAMs # of
Ranks Materials Parity
Support
HMP112V7EFR8C-C4/Y5/S6 1GB 128Mbx72 9 1 Halogen Free O
HMP125V7EFR4C-C4/Y5/S6 2GB 256Mbx72 18 1 Halogen Free O
HMP351V7EMR4C-C4/Y5/S6 4GB 512Mbx72 36 2 Halogen Free O
C4 (DDR2-533) Y5 (DDR2-667) S6 (DDR2-800 ) Unit
Speed@CL3 400 400 -Mbps
Speed@CL4 533 533 400 Mbps
Speed@CL5 - 667 533 Mbps
Speed@CL6 - - 800 Mbps
CL-tRCD-tRP 4-4-4 5-5-5 6-6-6 tCK
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
FEATURES
ADDRESS TABLE
Density Organization Ranks SDRAMs # of
DRAMs # of row/bank/column Address Refresh
Method
1GB 128Mb x 72 1 128Mb x 8 9 14(A0~A13)/3(BA0~BA2)/10(A0~A9) 8K / 64ms
2GB 256Mb x 72 1 256Mb x 4 18 14(A0~A13)/3(BA0~BA2)/11(A0~A9,A11) 8K / 64ms
4GB 512Mb x 72 2 256Mb x 4 36 14(A0~A13)/3(BA0~BA2)/11(A0~A9,A11) 8K / 64m
JEDEC standard 1.8V +/- 0.1V Power Supply
•V
DDQ: 1.8V +/- 0.1V
All inputs and outputs are compatible with SSTL_1.8 interface
•4 Bank architecture
•Posted CAS
Programmable CAS Latency 3, 4, 5
OCD (Off-Chip Driver Impedance Adjustment)
•ODT (On-Die Termination)
Fully differential clock operations (CK & CK)
Programmable Burst Length 4 / 8 with both sequential and interleave mode
Average Auto Refresh Period 7.8us under TCASE 85, 3.9us at 85 < TCASE 95
High Temperature Self-Refresh Entry enable features
PASR (Partial Array Self- Refresh)
8192 refresh cycles / 64ms
Serial presence detect with EEPROM
DDR2 SDRAM Package: 60ball FBGA
133.35 x 18.29 mm form factor
Lead-free Products are RoHS compliant
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
Input/Output Functional Description
Symbol Type Polarity Pin Description
CK0 IN Positive
Edge Positive line of the differential pair of system clock inputs that drives input to the on-DIMM PLL.
CK0IN
Negative
Edge Negative li ne of the dif feren tial pair of s ystem cloc k inputs th at drives i nput to the on -DIMM PLL.
CKE[1:0] IN Active
High Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when low.
By deactivating the clocks, CKE low initiates the Power Down mode or the Self Refresh mode.
S[1:0] IN Active
Low
Enables the associated DDR2 SDRAM command decoder when low and disables the command
decoder when high. When the command decoder is disabled, new commands are ignored but
previous operations continue. Rank 0 is selected by S0; Rank 1 is selected by S1
ODT[1:0] IN Active
High On-Die Termination signals.
RAS, CAS, WE IN Active
Low When sampled at the positive rising edge of the clock. RAS,CAS and WE(ALONG WITH S) define
the command being entered.
Vref Supply Reference voltage for SSTL18 inputs
VDDQ Supply Power supplies for the DDR2 SDRAM output buff ers to pr ovid e impr ov ed no ise immunity. For all
current DDR2 unbuffered DIMM designs, VDDQ shares the same power plane as VDD pins.
BA[1:0] IN - Selects which DDR2 SDRAM internal bank of four is activated.
A[9:0],
A10/AP
A[13:11] IN -
During a Bank Activate comman d cycl e, Ad dress input defines the row address(RA0~RA13)
During a Read or Write command cycle, Address input defines the column address when sam-
pled at the cross po int of the risin g edge of CK and fa lling edge of CK . In addition to the column
address, AP is used to invoke autoprecharge operation at the end of the burst read or write
cycle. If AP is high., autoprecharge is selected and BA0-BAn defines the bank to be pr echarged.
If AP is low, autoprecharge is disabled. During a Precharge command cycle., AP is used in con-
junction with BA0-BAn to control which bank(s) to precharge. If AP is high, all banks will be pre-
charged r egardless of t he state of BA0-BAn inputs. If AP is low , then BA0-BAn ar e used to de fine
which bank to precharge.
DQ[63:0],
CB[7:0] IN - Data and Check Bit Input/Output pi ns.
DM[8:0] IN Active
High
DM is an input mask signal for write data. Input data is masked when DM is samp led High coin-
cident with that input data durin g a write access. DM is sampled on both edges of DQS.
Although DM pins are input only, the DM loading matches the DQ and DQS loading.
VDD,VSS Supply Power and ground for the DDR2 SDRAM input buffers, and core logic. VDD and VDDQ pins are
tied to VDD/VDDQ planes on these modules.
DQS[17:0] I/O Positive
Edge Positive line of the differential data strobe for input and output data
DQS[17:0] I/O Negative
Edge Negative line of the differential data strobe for input and output data
SA[2:0] IN - These signals are tied at the system planar to either VSS or VDDSPD to configure the serial SP D
EEPROM address range.
SDA I/O - This is a bidirectional pin used to transfer data into or out of the SPD EEPROM. A resister may
be connected from the SDA bus line to VDDSPD on the system planar to act as a pull up.
SCL IN - This signal is used to cloc k data into and out of the SPD EEPROM. A resistor may be connected
from SCL to VDDSPD to act as a pull up on the system board.
VDDSPD Supply Power supply for SPD EEPROM. This supply is separate from the VDD/VDDQ power plane.
EEPROM supply is operable from 1.7V to 3.6V.
RESET IN The RESET pin is connected to the RST pin on the register and to the OE pin on the PLL. When
low, all register outputs will be driven low and the PLL clocks to the DRAMs and register(s) will
be set to low level (the PLL will remain synchronized with the input clock)
Par_In IN Parity bit for the Address and Control bus(“1”. Odd, “0”.Even)
Err_Out OUT Parity error found in the Address and Control bus
TEST Used by memory bus analysis tools (unused on memory DIMMs)
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PIN DESCRIPTION
PIN LOCATION
Pin Pin Description Pin Pin Description
CK0 Clock Input, positive line ODT[1:0] On Die Termination Inputs
CK0 Clock input, negative line VDDQ DQs Power Supply
CKE0~CKE1 Clock Enable Input DQ0~DQ63 Data Input/Output
RAS Row Address Strobe CB0~CB7 Data check bits Input/Output
CAS Column Address Strobe DQS(0~8) Data strobes
WE Write Enable DQS(0~8) Data strobes, negative line
S0,S1 Chip Select Input DM(0~8),
DQS(9~17) Data Maskes/Data strobes
A0~A9,
A11~A13 Address input DQS(9~17) Data strobes, negative line
A10/AP Address input/Autoprecharge RFU Reserved for Future Use
BA0,BA1 SDRAM Bank Address NC No Connect
SCL Serial Presence Detec t (SPD) Clock Input TEST Memory bus test tool
(Not Connected and Not Usable on DIMMs)
SDA S PD Data Input/Output VDD Core Power
SA0~SA2 E2PROM Address Inputs VDDQ I/O Power
Par_In Parity bit for the Address and Control bus VSS Ground
Err_Out Parity error found on the Address VREF Input/Output Reference
RESET Reset Enable VDDSPD SPD Power
CB0~CB7 Data Check bit Inputs/Outputs
1 pin 64 pin 65 pin 120 pin
121 pin 184 pin 185 pin 240 pin
Front Side
Back Side
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PIN ASSIGNMENT
NC= No Connect, RFU= Reserved for Future Use.
Note:
1. RESET (Pin 18) is connected to both OE of PLL and Reset of register.
2. NC/Err_out (Pin 55) and NC/Par_In(Pin68) are for optional function to check address and command parity.
3. The Test pin (Pin 102) is reserved for bus analysis probes and is not connected on normal memory modules
(DIMMs)
Pin Name Pin Name Pin Name Pin Name Pin Name Pin Name
1 VREF 41 VSS 81 DQ33 121 VSS 161 CB4 201 VSS
2 VSS 42 CB0 82 VSS 122 DQ4 162 CB5 202 DM4/DQS13
3DQ043CB183DQS
4 123 DQ5 163 VSS 203 DQS13
4 DQ1 44 VSS 84 DQS4 124 VSS 164 DM8,DQS17 204 VSS
5VSS45DQS
8 85 VSS 125 DM0/DQS9 165 DQS17 205 DQ38
6DQS
046DQS886DQ34126DQS9 166 VSS 206 DQ39
7 DQS0 47 VSS 87 DQ35 127 VSS 167 CB6 207 VSS
8 VSS 48 CB2 88 VSS 128 DQ6 168 CB7 208 DQ44
9 DQ2 49 CB3 89 DQ40 129 DQ7 169 VSS 209 DQ45
10 DQ3 50 VSS 90 DQ41 130 VSS 170 VDDQ 210 VSS
11 VSS 51 VDDQ 91 VSS 131 DQ12 171 NC,CKE1 211 DM5/DQS14
12 DQ8 52 CKE0 92 DQS5 132 DQ13 172 VDD 212 DQS14
13 DQ9 53 VDD 93 DQS5 133 VSS 173 A15,NC 213 VSS
14 VSS 54 BA2,NC 94 VSS 134 DM1/DQS10 174 A14,NC 214 DQ46
15 DQS155NC, Err_Out95 DQ42 135 DQS10 175 VDDQ 215 DQ47
16 DQS1 56 VDDQ 96 DQ43 136 VSS 176 A12 216 VSS
17 VSS 57 A11 97 VSS 137 RFU 177 A9 217 DQ52
18 RESET 58 A7 98 DQ48 138 RFU 178 VDD 218 DQ53
19 NC 59 VDD 99 DQ49 139 VSS 179 A8 219 VSS
20 VSS 60 A5 100 VSS 140 DQ14 180 A6 220 RFU
21 DQ10 61 A4 101 SA2 141 DQ15 181 VDDQ 221 RFU
22 DQ11 62 VDDQ 102 NC(TEST) 142 VSS 182 A3 222 VSS
23 VSS 63 A2 103 VSS 143 DQ20 183 A1 223 DM6/DQS15
24 DQ16 64 VDD 104 DQS6 144 DQ21 184 VDD 224 NC,DQS15
25 DQ17 Key 105 DQS6 145 VSS Key 225 VSS
26 VSS 65 VSS 106 VSS 146 DM2/DQS11 185 CK0 226 DQ54
27 DQS266 VSS107DQ50147DQS11 186 CK0 227 DQ55
28 DQS2 67 VDD 108 DQ51 148 VSS 187 VDD 228 VSS
29 VSS 68 NC, Err_Out 109 VSS 149 DQ22 188 A0 229 DQ60
30 DQ18 69 VDD 110 DQ56 150 DQ23 189 VDD 230 DQ61
31 DQ19 70 A10/AP 111 DQ57 151 VSS 190 BA1 231 VSS
32 VSS 71 BA0 112 VSS 152 DQ28 191 VDDQ 232 DM7/DQS16
33 DQ24 72 VDDQ 113 DQS7 153 DQ29 192 RAS 233 NC,DQS16
34 DQ25 73 WE 114 DQS7 154 VSS 193 S0 234 VSS
35 VSS 74 CAS 115 VSS 155 DM3/DQS12 194 VDDQ 235 DQ62
36 DQS3 75 VDDQ 116 DQ58 156 DQS12 195 ODT0 236 DQ63
37 DQS3 76 NC, S1 117 DQ59 157 VSS 196 A13,NC 237 VSS
38 VSS 77 NC, ODT1 118 VSS 158 DQ30 197 VDD 238 VDDSPD
39 DQ26 78 VDDQ 119 SDA 159 DQ31 198 VSS 239 SA0
40 DQ27 79 VSS 120 SCL 160 VSS 199 DQ36 240 SA1
80 DQ32 200 DQ37
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
FUNCTIONAL BLOCK DIAGRAM
1GB(128Mbx72): HMP112V7EFR8C
DQ1
DQ2
DQS0
DQS0
DM0,DQS9
DQS9
DQ3
DQ4
DQ5
DQ6
DQ7
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ0
DQ33
DQ34
DQS4
DQS4
DM4,DQS13
DQS13
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ32
RS0
DQ9
DQ10
DQS1
DQS1
DM1,DQS10
DQS10
DQ11
DQ12
DQ13
DQ14
DQ15
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ8
DQ41
DQ42
DQS5
DQS5
DM5,DQS14
DQS14
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ40
D0 D4
D1 D5
DQ17
DQ18
DQS2
DQS2
DM2,DQS11
DQS11
DQ19
DQ20
DQ21
DQ22
DQ23
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ16
DQ49
DQ50
DQS6
DQS6
DM6,DQS15
DQS15
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ48
D2 D6
DQ25
DQ26
DQS3
DQS3
DM3,DQS12
DQS12
DQ27
DQ28
DQ29
DQ30
DQ31
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ24
DQ57
DQ58
DQS7
/DQS7
DM7,DQS16
DQS16
DQ59
DQ60
DQ61
DQ62
DQ63
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
DQ56
D3 D7
CB1
CB2
DQS8
DQS8
DM8,DQS17
DQS17
CB3
CB4
CB5
CB6
CB7
I/O 5
I/O 6
I/O 4
I/O 3
I/O 2
I/O 1
/DQS
RDQS RDQS
I/O 0
DM/ NU/ /CS DQS
I/O 7
CB0
D8
S0*
BA0- BA2**
A0- A15**
RAS
CAS
WE
CKE0
ODT0
/RS0 to /CS-> /CS: SDRAMs D0-D8
RBA0 to RBA2->BA0-BA2: SDRAMs D0-D8***
/RA0-RA15->A0- A15: SDRAMs D0- D8***
/RRAS-> /RAS: SDRAMs D0-D8
/RCAS ->/CAS: SDRAMs D0-D8
/RWE ->/WE: SDRAMs D0-D8
RCKE0-> CKE0: SDRAMs D0-D8
RODT0-> ODT0: SDRAMs D0-D8
/RESET RST
R
E
G
I
S
T
E
R
PCK7 /PCK7
CK0
CK0
RESET
P
L
L
OE
PCK0-PCK6, PCK8, PKC9
CK: SDRAMs
D0-D8
PCK0-PCK6, PCK8, PCK9
CK: SDRAM s
D0-D8
PCK7
CK: Register
PCK7
CK: Reg is t e r
SDA
SCL
WP A0 A1 A2
SA0SA1SA2
Serial PD
Register
PAR_IN
PAR_IN C1
C0
PRO
QERR
Vss
Vss
Err_Out
100K ohms
Signals for Address and Command Parity Function (Raw Card F, F and AC)
Note:
1.DQ-to-I/O wiring may be changed within a byte.
2.Unless otherwise noted, resistor values are 22 Ohms +/-5%.
The resistors on Par_In, A13, A14, A15, BA2 and the
signal line of Err_Out refer to the section:
“Register Options for unused Address inputs”
* S0 connects to DCS and VDD connects to CSR o n the register. S1, CKE1 and ODT1 are NC
** A13-15, BA2 have the optional pull down resistors(100K ohms), which is not indicated here.
*** For Raw Card R and A Co, post register A14, A15 and BA2 are not connected to the SDRAMs.
And for Raw Card AC1, post register A14 and A15 are not connected to the SDRAMs.
1:1
V
DD
/V
DDQ
V
REF
V
DD
SPD Serial PD
V
SS
D0–D8
D0–D8
D0-D8
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
FUNCTIONAL BLOCK DIAGRAM
2GB(256Mbx72): HMP125V7EFR4C
DQ1
DQ2
RS0
DQS0
DQ3
I/O 3
I/O 2
I/O 1
I/O 0
DM CS DQS DQS
DQ0
D0
DQS0
DQ5
DQ6
DQS9
DQ7
I/O 3
I/O 2
I/O 1
I/O 0
DQ4
D9
DQS9
DQ9
DQ10
DQS1
DQ11
I/O 3
I/O 2
I/O 1
I/O 0
DQ8
D1
DQ13
DQ14
DQS10
DQ15
I/O 3
I/O 2
I/O 1
I/O 0
DQ12
D10
DQ17
DQ18
DQS2
DQ19
I/O 3
I/O 2
I/O 1
I/O 0
DQ16
D2
DQ21
DQ22
DQS11
DQ23
I/O 3
I/O 2
I/O 1
I/O 0
DQ20
D11
DQ25
DQ26
DQS3
DQ27
I/O 3
I/O 2
I/O 1
I/O 0
DQ24
D3
DQ29
DQ30
DQS12
DQ31
I/O 3
I/O 2
I/O 1
I/O 0
DQ28
D12
DQ33
DQ34
DQS4
DQ35
I/O 3
I/O 2
I/O 1
I/O 0
DQ32
D4
DQ37
DQ38
DQS13
DQ39
I/O 3
I/O 2
I/O 1
I/O 0
DQ36
D13
DQ41
DQ42
DQS5
DQ43
I/O 3
I/O 2
I/O 1
I/O 0
DQ40
D5
DQ45
DQ46
DQS14
DQ47
I/O 3
I/O 2
I/O 1
I/O 0
DQ44
D14
DQ49
DQ50
DQS6
DQ51
I/O 3
I/O 2
I/O 1
I/O 0
DQ48
D6
DQ53
DQ54
DQS15
DQ55
I/O 3
I/O 2
I/O 1
I/O 0
DQ52
D15
DQ57
DQ58
DQS7
DQ59
I/O 3
I/O 2
I/O 1
I/O 0
DQ56
D7
DQ61
DQ62
DQS16
DQ63
I/O 3
I/O 2
I/O 1
I/O 0
DQ60
D16
CB1
CB2
DQS8
CB3
I/O 3
I/O 2
I/O 1
I/O 0
CB0
D8
CB5
CB6
DQS17
CB7
I/O 3
I/O 2
I/O 1
I/O 0
CB4
D17
VSS
DQS1 DQS10
DQS2 DQS11
DQS3 DQS12
DQS13DQS4
DQS5 DQS14
DQS15
DQS6
DQS7 DQS16
DQS17DQS8
S0*
BA0-BA2***
A0-A15***
RAS
CAS
WE
CKE0
ODT0
RS0 -> CS: SDRAMs D0-D17
RBA0-RBA2->BA0-BA2: SDRAMs D0-D17****
RA0- RA15->A0-A15: SDRAMs D0-D17****
RRAS-> RAS: SDRAMs D0-D177
RCAS ->CAS: SDRAMs D0-D17
RWE-> WE: SDRAMs D0-D17
ROKE0-> CKE: SDRAMs D0-D17
RODT0-> ODT0: SDRAMs D0-D17
RESET**
RST
R
E
G
I
S
T
E
R
PCK7**
PCK7**
SDA
SCL
WP A0 A1 A2
SA0SA1SA2
Serial PD
SCL SDA
V
DD
/V
DDQ
V
REF
V
DD
SPD Serial PD
V
SS
D0–D17
D0–D17
D0–D17
CK0
CK0
RESET
P
L
L
OE
PCK0 - PCK6, PCK8, PKC9
CK: SDRAMs D0-D17
PCK0 - PCK6, PCK8, PCK9
CK: SDRAM s D 0-D17
PCK7
CK: Register
PCK7
CK: Register
The resisto rs on Par_In, A13, A14, A15, BA2 and the sign al line of Err_Out
refer to the section:
“Register Options for unused Address inputs”
DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM /CS DQS /DQS DM /CS DQS /DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
For R/C U, 0 ohm resistor is placed at the end of Err_Out just before the edge connector and is
not populated for the non-parity card.
Note:
1.DQ-to-I/O wiring may be changed within a byte.
2.Unless otherwise noted, resistor values are 22 Ohms +/-5%.
* S0 connects to DCS or Register A and CSR of Register B.
CSR of Register A and DCS of Register B connects to VDD.
** RESET, PCK7 and PCK7 connects to both Registers.
Other signals connects to one of two Registers.
Raw Card V has only one register.
*** A13-A15, BA2 have the optional pull down resistors
(100K ohms), which is not indicated here.
**** For /raw /card U0 and V, post register A14, A15 and BA2
are not connected to the SDRAMs.
And for Raw Care U1, post register A14 and A15 are not
connected to the SDRAMs.
1:2
Register A
PAR_IN
PAR_IN C1
C0
PRO
QERR
Vss
V
DD
100K ohms
Signals for Address and Command Parity Function (Raw Card H, U)
Register B
PAR_IN
C1
C0
PRO
QERR
V
DD
V
DD
Err_Out
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
FUNCTIONAL BLOCK DIAGRAM
4GB(256Mbx72): HMP351V7EMR4C
DQ1
DQ2
DQS0
DQ3 I/O 3
I/O 2
I/O 1
I/O 0
DM CS DQS DQS
DQ0
D0
DQS0
I/O 3
I/O 2
I/O 1
I/O 0
D18
DQ9
DQ10
DQS1
DQ11 I/O 3
I/O 2
I/O 1
I/O 0
DQ8
D1
DQS1
I/O 3
I/O 2
I/O 1
I/O 0
D19
DQ5
DQ6
DQS9
DQ7 I/O 3
I/O 2
I/O 1
I/O 0
DQ4
D9
DQS9
I/O 3
I/O 2
I/O 1
I/O 0
D27
DQ13
DQ14
DQS10
DQ15 I/O 3
I/O 2
I/O 1
I/O 0
DQ12
D10
DQS10
I/O 3
I/O 2
I/O 1
I/O 0
D28
DQ17
DQ18
DQS2
DQ19 I/O 3
I/O 2
I/O 1
I/O 0
DQ16
D2
I/O 3
I/O 2
I/O 1
I/O 0
D20
DQ25
DQ26
DQS3
DQ27 I/O 3
I/O 2
I/O 1
I/O 0
DQ24
D3
DQS3
I/O 3
I/O 2
I/O 1
I/O 0
D21
DQ21
DQ22
DQS11
DQ23 I/O 3
I/O 2
I/O 1
I/O 0
DQ20
D11
I/O 3
I/O 2
I/O 1
I/O 0
D29
DQ29
DQ30
DQS12
DQ31 I/O 3
I/O 2
I/O 1
I/O 0
DQ28
D12
DQS12
I/O 3
I/O 2
I/O 1
I/O 0
D30
CB1
CB2
DQS8
CB3 I/O 3
I/O 2
I/O 1
I/O 0
CB0
D8
I/O 3
I/O 2
I/O 1
I/O 0
D26
CB5
CB6
DQS17
CB7 I/O 3
I/O 2
I/O 1
I/O 0
CB4
D17
I/O 3
I/O 2
I/O 1
I/O 0
D35
DQS2 DQS11
DQS8 DQS17
VSS
RS0
RS1
DQ33
DQ34
DQS4
DQ35 I/O 3
I/O 2
I/O 1
I/O 0
DQ32
D4
DQS4
I/O 3
I/O 2
I/O 1
I/O 0
D22
DQ41
DQ42
DQS5
DQ43 I/O 3
I/O 2
I/O 1
I/O 0
DQ40
D5
DQS5
I/O 3
I/O 2
I/O 1
I/O 0
D23
DQ37
DQ38
DQS13
DQ39 I/O 3
I/O 2
I/O 1
I/O 0
DQ36
D13
DQS13
I/O 3
I/O 2
I/O 1
I/O 0
D31
DQ45
DQ46
DQS14
DQ47 I/O 3
I/O 2
I/O 1
I/O 0
DQ44
D14
DQS14
I/O 3
I/O 2
I/O 1
I/O 0
D32
RS0
RS1
DQ49
DQ50
DQS6
DQ51 I/O 3
I/O 2
I/O 1
I/O 0
DQ48
D6
DQS6
I/O 3
I/O 2
I/O 1
I/O 0
D24
DQ57
DQ58
DQS7
DQ59 I/O 3
I/O 2
I/O 1
I/O 0
DQ56
D7
DQS7
I/O 3
I/O 2
I/O 1
I/O 0
D25
DQ53
DQ54
DQS15
DQ55 I/O 3
I/O 2
I/O 1
I/O 0
DQ52
D15
DQS15
I/O 3
I/O 2
I/O 1
I/O 0
D33
DQ61
DQ62
DQS16
DQ63 I/O 3
I/O 2
I/O 1
I/O 0
DQ60
D16
DQS16
I/O 3
I/O 2
I/O 1
I/O 0
D34
S0*
BA0-BA2***
A0-A15***
RAS
CAS
CKE0
WE
ODT0
RS0 -> CS: SDRAMs D0-D 17
RS1 -> CS: SDRAMs D18-D35
RBA0-RBA2
->
BA0-BA2: SDRAMs D0-D35
RA0-RA15 -> A0-A15: SDRAMs D0-D35** **
RRAS -> RAS: SDRAM s D0-D 3 5
RCAS -> CAS: SDRAMs D0 -D35
RWE -> W E: SD RAM s D0-D 35
RCKE0 -> CKE: SDRAMs D0-D17
RESET**
RST
1:2
R
E
G
I
S
T
E
R
PCK7**
PCK7**
RCKE1 -> CKE: SDRAMs D18-D35
RODT0 -> ODT0: SDRAMs D0-D17
RODT1 -> ODT1: SDRAMs D 18-D35
ODT1
CKE
S1*
Notes:
1. DQ-to-I/O wiring may be changed within a nibble.
2. Unless otherwise noted, resistor values are 22 ohms +/-5%.
3. RS0 and RS1 altemate between the bottom and surface sides of the DIMM.
SDA
SCL
WP A0 A1 A2
SA0 SA1 SA2
Serial PD
SCL SDA
V
DD
/V
DDQ
V
REF
V
DD
SPD Serial PD
V
SS
D0–D35
D0–D35
D0–D35
CK0
CK0
RESET
P
L
L
OE
PCK0 to PCK6, PCK8, PKC9
PCK0 to PCK6, PCK8, PCK9
PCK7
CK: Register
PCK7
CK: Register
The resistor s on Par_I n, A13, A14, A15, BA2
and signal line of Err_Out refer to the section:
“Register Options for Unused Address inputs”
Signals for Addres s and Command Parity Function
* S0 connects to DCS and S1 connects to CSR on Register1. S1 connects to DCS and S0 connects to CSR on Register 2.
** RESET, PCK7 and PCK7 connect to both Registers. Other signals connect to one of two Registers.
*** A13-15, BA2 have th e opt ional pull down resistors(100K ohms), which is not indicated here.
**** For Raw Card AJ, post register A14, A15 are not connected to the SDRAMs.
DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
DM CS DQS DQS DM CS DQS DQS
CK: SDRAMs D0-D35
CK: SDRAMs D0-D 35
Register 1
PARIN1
PAR_IN
C2
C1
PRO1
PRO2
Vss
V
SS
100K ohms
Reg ister 2
PARIN1
C2
C1
PTYERR1
PTYERR2
V
DD
V
DD
Err_Out
PARIN2 PARIN2
0 ohm
Register 1 share a part of Addr/Cmd input signal set.
Register 2 share the other part of Addr/Cmd input signal set.
0 Ohm resistor on Err_Out is not popula ted for non-p ar it y card .
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
ABSOLUTE MAXIMUM RATINGS
Note:
1. Stress greater than those listed may cause permanent dama ge to the device. This is a stress r ating only, and device
functional operation at or above the conditions indicated is not implied. Expousure to absolute maximum rating con
ditions for extended periods may affect reliablility.
OPERATING CONDITIONS
Note:
1. Up to 9850 ft.
2. If the DRAM case temperature is Above 85oC, the Auto-Refresh command interval has to be reduced to
tREFI=3.9us. For Measurement conditions of TCASE, please refer to the JEDEC document JESD51-2.
DC OPERATING CONDITIONS (SSTL_1.8)
Note:
1. VDDQ must be less than or equal to VDD.
2. Peak to peak ac noise on VREF may not exceed +/-2% VREF(dc)
3. VTT of transmitting device must track VREF of receiving device.
Parameter Symbol Value Unit Note
Voltage on VDD pin relative to Vss VDD - 1.0 V ~ 2.3 V V 1
Voltage on VDDL pin relative to Vss VDDL -0.5V ~ 2.3 V V 1
Voltage on VDDQ pin relative to Vss VDDQ - 0.5 V ~ 2.3 V V 1
Voltage on any pin relative to Vss VIN, VOUT - 0.5 V ~ 2.3 V V 1
Storage Temperature TSTG -50 ~ +100 oC1
Storage Humidity (without condensation) HSTG 5 to 95 %1
Parameter Symbol Rating Units Notes
DIMM Operating temperature (ambient) TOPR 0 ~ +55 oC
DIMM Barometric Pressure (operating & storage) PBAR 105 to 69 K Pascal 1
DRAM Component Case Temperature Range TCASE 0 ~+95 oC2
Parameter Symbol Min Max Unit Note
Power Supply Voltage
VDD 1.7 1.9 V
VDDL 1.7 1.9 V
VDDQ 1.7 1.9 V 1
Input Reference Voltage VREF 0.49 x VDDQ 0.51 x VDDQ V2
EEPROM Supply Voltage VDDSPD 1.7 3.6 V
Termination Voltage VTT VREF-0.04 VREF+0.04 V 3
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
INPUT DC LOGIC LEVEL
INPUT AC LOGIC LEVEL
AC INPUT TEST CONDITIONS
Notes:
1. Input waveform timing is referenced to the input signal crossing through the VREF level applied to the device
under test.
2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH(ac) min for rising edges
and the range from VREF to VIL(ac) max for falling edges as shown in the below figure.
3. AC timings are referenced with input waveforms switching from VIL (ac) to VIH (ac) on the positive transitions
and VIH (ac) to VIL (ac) on the negative transitions.
Parameter Symbol Min Max Unit Notes
Input High Voltage VIH(DC) VREF + 0.125 VDDQ + 0.3 V
Input Low Voltage VIL(DC) -0.30 VREF - 0.125 V
Parameter Symbol DDR2 400/533 DDR2 667/800 Unit Notes
Min Max Min Max
AC Input logic High VIH(AC) VREF + 0.250 - VREF + 0.200 - V
AC Input logic Low VIL(AC) -V
REF - 0.250 - VREF - 0.200 V
Symbol Condition Value Units Notes
VREF Input reference voltage 0.5 * V DDQ V1
VSWING(MAX) Input signal maximum peak to peak swing 1.0 V 1
SLEW Input signal minimum slew rate 1.0 V/ns 2, 3
VDDQ
VIH(ac) min
VIH(dc) min
VREF
VIL(dc) max
VIL(ac) max
VSS
V
SWING(MAX)
delta TRdelta TF
VREF
-
VIL
(ac)
max
delta TF
Falling Slew = Rising Slew =
VIH
(ac)
min
- V
REF
delta TR
< Figure: AC Input Test Signal Waveform>
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
Differential Input AC logic Level
1. VIN(DC) specifies the allowable DC execution of each input of differential pair such as CK DQS, DQS, LDQS,
LDQS, UDQS and UDQS.
2. VID(DC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input (such as
CK, DQS, LDQS or UDQS) level and VCP is the complementary input (such as CK, DQS, L DQS or UDQS) level. The mini-
mum value is equal to VIH(DC) - VIL(DC).
Notes:
1. VID(AC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input signal
(such as CK, DQS, LDQS or UDQS) and VCP is the complementary input signal (such as CK, DQS, LDQS or UDQS).
The minimum value is equal to V IH(AC) - VIL(AC).
2. The typical value of VIX(AC) is expected to be about 0.5 * VDDQ of the transmitting device and VIX(AC) is expected to
track variations in VDDQ. VIX(AC) indicates the voltage at which differential input signals must cross.
DIFFERENTIAL AC OUTPUT PARAMETERS
Note:
1. The typical v a lue of V OX(AC) is expected to be about 0.5 * VDDQ of the transmit ting device and VOX(AC) is expected to
track variations in VDDQ. VOX(AC) indicates the voltage at which differential output signals must cross.
Symbol Parameter Min. Max. Units Note
VID (ac) ac differential input voltage 0.5 VDDQ + 0.6 V 1
VIX (ac) ac differential cross point voltage 0.5 * VDDQ - 0.175 0.5 * VDDQ + 0.175 V 2
Symbol Parameter Min. Max. Units Note
VOX (ac) ac differential cross point voltage 0.5 * VDDQ - 0.125 0.5 * VDDQ + 0.125 V 1
VDDQ
Crossing point
VSSQ
VTR
VCP
VID VIX or VOX
< Differential signal levels >
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Notes:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Notes:
1. VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and
VDDQ - 280 mV.
2. VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV.
3. The dc value of VREF applied to the receiving device is set to VTT
4. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an
SSTL_18 receiver.
The actual current values are derived by shifting the desired driver operating point along a 21 ohm load line to define
a convenient driver current for measurement.
Symbol Parameter SSTL_18 Units Notes
VOTR Output Timing Measurement Reference Level 0.5 * VDDQ V1
Symbol Parameter SSTl_18 Units Notes
IOH(dc) Output Minimum Source DC Current - 13.4 mA 1, 3, 4
IOL(dc) Output Minimum Sink DC Current 13.4 mA 2, 3, 4
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PIN Capacitance (VDD=1.8V,VDDQ=1.8V, TA=25℃. f=1MHz)
1GB: HMP112V7EFR8C
2GB: HMP125V7EFR4C
4GB: HMP351V7EMR4C
Note:
1. Pins not under test are tied to GND.
2. These value are guaranteed by design and tested on a sample basis only.
Pin Symbol Min Max Unit
CK0, CK0 CCK 7 11 pF
CKE, ODT CI1 8 12 pF
CS CI2 8 12 pF
Address, RAS, CAS, WE CI3 8 12 pF
DQ, DM, DQS, DQS CIO 6 9 pF
Pin Symbol Min Max Unit
CK0, CK0 CCK 711pF
CKE, ODT CI1 812pF
CS CI2 10 15 pF
Address, RAS, CAS, WE CI3 812pF
DQ, DM, DQS, DQS CIO 69pF
Pin Symbol Min Max Unit
CK0, CK0CCK 9.5 10.5 pF
CKE, ODT CI1 10.5 16 pF
CS CI2 10.5 16 pF
Address, RAS, CAS, WE CI3 10.5 16 pF
DQ, DM, DQS, DQS CIO 17 21 pF
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
IDD SPECIFICATIONS (TCASE: 0 to 95oC)
1GB, 128M x 72 VLP Registered DIMM: HMP112V7EFR8C
2GB, 256M x 72 VLP Registered DIMM: HMP125V7EFR4C
Notes:
1. IDD6 current values are guaranteed up to Tcase of 85oC max.
Symbol C4 (533@CL4) Y5 (667@CL5) S6 (800@CL6) Unit Notes
IDD0 1235 1280 1325 mA
IDD1 1325 1370 1415 mA
IDD2P 740 740 740 mA
IDD2Q 893 920 938 mA
IDD2N 965 1010 1055 mA
IDD3P-F 875 875 875 mA
IDD3P-S 758 758 758 mA
IDD3N 1055 1100 1145 mA
IDD4W 1730 1955 2180 mA
IDD4R 1730 1910 2090 mA
IDD5 2090 2135 2180 mA
IDD6 540 540 540 mA 1
IDD7 2225 2405 2720 mA
Symbol C4 (533@CL4) Y5 (667@CL5) S6 (800@CL6) Unit Notes
IDD0 1820 1910 2000 mA
IDD1 2000 2090 2180 mA
IDD2P 830 830 830 mA
IDD2Q 1136 1190 1226 mA
IDD2N 1280 1370 1460 mA
IDD3P-F 1100 1100 1100 mA
IDD3P-S 866 866 866 mA
IDD3N 1460 1550 1640 mA
IDD4W 2810 3260 3710 mA
IDD4R 2810 3170 3530 mA
IDD5 3330 3420 3510 mA
IDD6 630 630 630 mA 1
IDD7 3800 4160 4790 mA
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
4GB, 256M x 72 VLP Registered DIMM: HMP351V7EMR4C
Notes:
1. IDD6 current values are guaranteed up to Tcase of 85oC max.
Symbol C4 (533@CL4) Y5 (667@CL5) S6 (800@CL6) Unit Notes
IDD0 2450 2630 2810 mA
IDD1 2630 2810 2990 mA
IDD2P 1010 1010 1010 mA
IDD2Q 1622 1730 1802 mA
IDD2N 1910 2090 2270 mA
IDD3P-F 1550 1550 1550 mA
IDD3P-S 1082 1082 1082 mA
IDD3N 2270 2450 2630 mA
IDD4W 3440 3980 4520 mA
IDD4R 3440 3890 4340 mA
IDD5 3960 4140 4320 mA
IDD6 810 810 810 mA 1
IDD7 4430 4880 5600 mA
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
IDD Measurement Conditions
Notes:
1. IDD specifications are tested after the device is properly initialized
2. Input slew rate is specified by AC Parametric Test Condition
3. IDD parameters are specified with ODT disabled.
4. Data bus consists of DQ, DM, DQS, DQS, RDQS, RDQS, LDQS, LDQS, UDQS, and UDQS. IDD values must be met with
all combinations of EMRS bits 10 and 11.
5. Definiti ons for IDD
LOW is defined as Vin VILAC (max)
HIGH is defined as Vin VIHAC (min)
STABLE is defined as inputs stable at a HIGH or LOW level
FLOATING is defined as inputs at VREF = VDDQ/2
SWITCHING is defined as: inputs changing between HIGH and LOW every other clock cycle (once per two clocks) for address and
control signals, and inputs changing between HIGH and LOW every other data transfer (once per clock)
for DQ signals not including masks or strobes.
Symbol Conditions Units
IDD0 Operating one bank active-precharge current; tCK = tCK(IDD), tRC = tRC(IDD), tRAS = tRASmin (IDD);
CKE is HIGH , CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data bus inputs are
SWITCHING mA
IDD1 Operating one bank active-read-precharge current; IOUT = 0mA;BL = 4, CL = CL(IDD), AL = 0; tCK =
tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin (IDD), tRCD = tRCD(IDD); CKE is HIGH, CS is HIGH between valid
commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W mA
IDD2P Precharge power-down current; All banks idl e; tCK = tCK(IDD); CKE is LOW; Other control and address bus
inputs are STABLE; Data bus inpu ts are FLOATING mA
IDD2Q Precharge quiet standby current; All bank s idle; tCK = tCK(IDD);CKE is HIGH, CS is HIGH; Other control and
address bus inputs are STABLE; Data bus inputs are FLOATING mA
IDD2N Precharge standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS is HIGH; Other control and
address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA
IDD3P Active power-down current; All bank s open; tCK = tCK(IDD); CKE is LOW;
Other control and address bus inputs are STABLE; Data bus inputs are FLOAT-
ING
Fast PDN Exit MRS(12) = 0 mA
Slow PDN Exit MRS(12) = 1 mA
IDD3N Active standby current; All banks open; tCK = tCK(IDD), tRAS = tRASmax (IDD), tRP =tRP(IDD); CKE is
HIGH, CS is HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus
inputs are SWITCHING mA
IDD4W Operating burst write current; All banks open, Continuous burst writes; BL = 4, CL = CL(IDD), AL = 0; tCK
= tCK(IDD), tRAS = tRASmax (IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands;
Address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA
IDD4R Operating burst read current; All banks open, Continuous burst reads, IOUT = 0mA; BL = 4, CL = CL(IDD),
AL = 0; tCK = tCK(IDD), tRAS = tRA Smax (IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid com-
mands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W mA
IDD5B Burst refresh current; tCK = tCK(IDD); Refresh command at every tRFC(IDD) interval; CKE is HIGH, CS is
HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus inputs are
SWITCHING mA
IDD6 Self refresh current; CK and CK at 0V; CKE 0.2 V; Other control and address bus inputs are FL OATING; Data
bus inputs are FLOATING. IDD 6 current values are guaranted up to Tcase of 85 max. mA
IDD7
Operating bank interleave read current; All bank interleaving reads, IOUT = 0mA; BL = 4, CL = CL(IDD),
AL = tRCD(IDD)-1*tCK(IDD); tCK = tCK(IDD), tRC = tRC(IDD), tRRD = tRRD(IDD), tRCD = 1* tCK(IDD); CKE is
HIGH, CS is HIGH between v alid commands; Addr ess bus inputs are STABLE during DESELECTs; Data pattern is
same as IDD4R; - Refer to the following page for detailed timing conditions
mA
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
Electrical Characteristics & AC Timings
Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
AC Timing Parameters by Speed Grade
Speed DDR2-800(S6) DDR2-667(Y5) DDR2-533 (C4) DDR2-400 (E3) Unit
Bin (CL-tRCD-tRP) 6-6-6 5-5-5 4-4-4 3-3-3
Parameter min min min min
CAS Latency 65 43ns
tRCD 15 15 15 15 ns
tRP 15 15 15 15 ns
tRC 60 60 60 55 ns
tRAS 45 45 45 40 ns
Parameter Symbol DDR2-400 DDR2-533 Unit Note
Min Max Min Max
Data-Out edge to Cl ock edge Skew tAC -600 600 -500 500 ps
DQS-Out edge to Clock edge Skew tDQSCK -500 500 -500 450 ns
Clock High Level Width tCH 0.45 0.55 0.45 0.55 CK
Clock Low Level Width tCL 0.45 0.55 0.45 0.55 CK
Clock Half Period tHP min
(tCL, tCH) -min
(tCL, tCH) -ns
System Clock Cycle Time tCK 5000 8000 3750 8000 ps
DQ and DM input setup time tDS 150 - 100 - ps 1
DQ and DM input hold time tDH 275 - 225 - ps 1
Control & Address input Pulse Width for each input tIPW 0.6 - 0.6 - tCK
DQ and DM input pulse width for each input pulse width
for each input tDIPW 0.35 - 0.35 - tCK
Data-out high-impedance window from CK, /CK tHZ - tAC max - tAC max ps
DQS low-impedance time from CK/CK tLZ(DQS) tAC min tAC max tAC min tAC max ps
DQ low-impedance time from CK/CK tLZ(DQ) 2*tAC min tAC max 2*tAC min tAC max ps
DQS-DQ skew for DQS and associated DQ signals tDQSQ - 350 -300ps
DQ hold skew factor tQHS - 450 -400ps
DQ/DQS output hold time from DQS tQH tHP - tQHS -tHP - tQHS -ps
Write command to first DQS latching transition tDQSS WL - 0.25 WL + 0.25 WL - 0.25 WL + 0.25 tCK
DQS input high pulse width tDQSH 0.35 -0.35 -tCK
DQS input low pulse width tDQSL 0.35 -0.35 -tCK
DQS falling edge to CK setup time tDSS 0.2 -0.2 -tCK
DQS falling edge hold time from CK tDSH 0.2 -0.2 -tCK
Mode register set command cycle time tMRD 2 - 2 - tCK
Write preamble tWPRE 0.35 -0.35 -tCK
Write postamble tWPST 0.4 0.6 0.4 0.6 tCK
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
- continued -
Note:
1. For details and notes, please refer to the relevant HYNIX component datasheet (H5PS1G[4,8]3EFR).
2. C TCASE 85°C
3. 85°C TCASE95°C
Parameter Symbol DDR2-400 DDR2-533 Unit Note
Min Max Min Max
Address and control input setup time tIS 350 - 250 -ps
Address and control input hold time tIH 475 - 375 -ps
Read preamble tRPRE 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 tCK
Auto-Refresh to Active/Auto-Refresh command period tRFC 127.5 -127.5 -ns
Row Active to Row Active Delay for 1KB page size tRRD 7.5 - 7.5 - ns
Row Active to Row Active Delay for 2KB page size tRRD 10 - 10 - ns
Four Activate Window for 1KB page size tFAW 37.5 - 37.5 - ns
Four Activate Window for 2KB page size tFAW 50 - 50 - ns
CAS to CAS command delay tCCD 2 2 tCK
Write recovery time tWR 15 -15-ns
Auto Precharge Write Recovery + Precharge Time tDAL tWR + tRP - tWR + tRP - tCK
Write to Read Command Delay tWTR 10 - 7.5 -ns
Internal read to precharge command delay tRTP 7.5 7.5 ns
Exit self refresh to a non-read command tXSNR tRFC + 10 tRFC + 10 ns
Exit self refresh to a read command tXSRD 200 -200 - tCK
Exit precharge power down to any non-read command tXP 2 - 2 - tCK
Exit active power down to read command tXARD 2 2 tCK
Exit active power down to read command
(Slow exit, Lower power) tXARDS 6 - AL 6 - AL tCK
CKE minimum pulse width
(high and low pulse width) tCKE 3 3 tCK
ODT turn-on delay tAOND 2 2 2 2 tCK
ODT turn-on tAON tAC (min) tAC(max)+1 tAC (min) tAC(max)+1 ns
ODT turn-on (Power-Down mode) tAONPD tAC(min)+2 2tCK+tAC(m
ax)+1 tAC(min)+2 2tCK+tAC(m
ax)+1 ns
ODT turn-off delay tAOFD 2 .5 2.5 2.5 2. 5 tCK
ODT turn-off tAOF tAC (min) tAC (max)+
0.6 tAC (min) tAC (max)+
0.6 ns
ODT turn-off (Power-Down mode) tAOFPD tAC (min)+2 2.5tCK+tAC(
max)+1 tAC(min)+2 2.5tCK+tAC(
max)+1 ns
ODT to power down entry latency tANPD 33
tCK
ODT power down exit latency tAXPD 88
tCK
OCD drive mode output delay tOIT 012012
ns
Minimum time clocks remains ON after CKE
asynchronously drops LOW tDelay tIS + tCK + tIH tIS + tCK + tIH ns
Average periodic Refresh Interval tREFI -7.8-7.8us2
tREFI -3.9 -3.9 us 3
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
Parameter Symbol DDR2-667 DDR2-800 Unit Note
min max min max
DQ output access time from CK/CK tAC -450 +450 -400 +400 ps
DQS output access time from CK/CK tDQSCK -400 +400 -350 +350 ps
CK high-level width tCH 0.45 0.55 0.45 0.55 tCK
CK low-level width tCL 0.45 0.55 0.45 0.55 tCK
CK half period tHP min(tCL,
tCH) -min(tCL,
tCH) -ps
Clock cycle time, CL=x tCK 3000 8000 2500 ps
DQ and DM inpu t setup time
(differen t ial strobe ) tDS 100 - 50 -ps 1
DQ and DM input hold time
(differen t ial strobe ) tDH 175 - 125 -ps 1
Control & Address input pulse width for each
input tIPW 0.6 - 0.6 -tCK
DQ and DM input pulse width for each input tDIPW 0.35 - 0.35 -tCK
Data-out high-impe dan ce time from CK/CK tHZ - tAC max - tAC m a x ps
DQS low-impedance time from CK/C K tLZ(DQS) tAC min tAC max tAC min tAC max ps
DQ low-impedance time from CK/CK tLZ(DQ) 2*tAC min tAC max 2*tAC min tAC max ps
DQS-DQ skew for DQS and associated DQ
signals tDQSQ - 240 -200ps
DQ hold skew factor tQHS - 340 -300ps
DQ/DQS output hold time from DQS tQH tHP - tQHS -tHP - tQHS -ps
First DQS latching transition to associated clock
edge tDQSS - 0.25 + 0.25 - 0.25 + 0.25 tCK
DQS input high pulse width tDQSH 0.35 -0.35 -tCK
DQS input low pulse width tDQSL 0.35 -0.35 -tCK
DQS falling edge to CK setup time tDSS 0.2 -0.2 -tCK
DQS falling edge hold time from CK tDSH 0.2 -0.2 -tCK
Mode register set com mand cycle time tMRD 2 - 2 - tCK
Write preamble tWPRE 0.35 -0.35 -tCK
Write postamble tWPST 0.4 0.6 0.4 0.6 tCK
Address and control input setup time tIS 200 -175-ps
Address and control input hold time tIH 275 -250-ps
Read pr eambl e tRPRE 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 tCK
Auto-Refresh to Acti ve/Auto-Refresh command period tRFC 127.5 -127.5 -ns
Active to active command period for 1KB page
size products tRRD 7.5 -7.5-ns
Active to active command period for 2KB page
size products tRRD 10 -10-ns
Four Active Window for 1KB page size products tFAW 37.5 -35 -ns
Four Active Window for 2KB page size products tFAW 50 -45 -ns
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
- continued -
Note:
1. For details and notes, please refer to the relevant HYNIX component datasheet (H5PS1G[4,8]3EFR).
2. C TCASE 85°C
3. 85°C TCASE95°C
Parameter Symbol DDR2-667 DDR2-800 Unit Note
min max min max
CAS to CAS command delay tCCD 2 2 tCK
Write recovery time tWR 15 -15-ns
Auto precharge write recovery + precharge time tDAL WR+tRP -WR+tRP -tCK
Internal write to read command delay tWTR 7.5 -7.5-ns
Internal read to precharge command delay tRTP 7.5 7.5 ns
Exit self refresh to a non-read command tXSNR tRFC + 10 tRFC +
10 ns
Exit self refresh to a read command tXSRD 200 -200 -tCK
Exit precharge power down to any non-read
command tXP 2 - 2 - tCK
Exit active power down to read command tXARD 2 2 tCK
Exit active power down to read command
(Slow exit, Lower power) tXARDS 7 - AL 8 - AL tCK
CKE minimum pulse width
(high and low pulse width) tCKE 3 3tCK
ODT turn-on delay tAOND 2 2 2 2 tCK
ODT turn-on tAON tAC (min) tAC (max)
+0.7 tAC (min) tAC (max)
+0.7 ns
ODT turn-on (Power-Down mode) tAONPD tAC(min)+2 2tCK+
tAC(max)+1 tAC (min)
+2 2tCK+
tAC(max)+1 ns
ODT turn-off delay tAOFD 2.5 2.5 2.5 2.5 tCK
ODT turn-off tAOF tAC (min) tAC (max)+
0.6 tAC (min) tAC (max)
+0.6 ns
ODT turn-off (Power-Down mode) tAOFPD tAC (min)
+2 2.5tCK+
tAC(max)+1 tAC (min)
+2 2.5tCK+
tAC(max)+1 ns
ODT to power down entry latency tANPD 3 3 tCK
ODT power down exit latency tAXPD 8 8 tCK
OCD drive mode output delay tOIT 0 12 0 12 ns
Minimum time clocks remains ON after CKE
asynchronously drops LOW tDelay tIS + tCK +
tIH tIS + tCK
+ tIH ns
Average periodic Refresh Interval tREFI - 7.8 - 7.8 us 2
tREFI -3.9 -3.9 us 3
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PACKAGE OUTLINE
128Mx72 (1 rank) - HMP112V7EFR8C
PLL
Front
4.0
±
0.1
5.175 63.0
Detail A Detail B
133.35
5.0 55.0 5.175
18.29
10.0
Back
0.20
2.50
±
0.20
1.00
0.8
±
0.05
Detail of Contacts A
1.50
±
0.10
Detail of Contacts B
5.00
3.80
2.50
2.50
±
0.20
Note) All dimens ions are in millimeters unles s o therwi s e s t ated.
1.27
±
0.10
Side
max
4.00 max
Register Register
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PACKAGE OUTLINE
256Mx72 (1 rank) - HMP125V7EFR4C
PLL
Front
4.0
±
0.1
5.175 63.0
Detail A Detail B
133.35
5.0 55.0 5.175
18.29
Register
10.0
Back
Register
Note) A ll dimen sions are in millime ters unless other w is e stated.
0.20
2.50
±
0.20
1.00
0.8
±
0.05
Detail of Contacts A
1.50
±
0.10
Detail of Contacts B
5.00
3.80
2.50
2.50
±
0.20
1.27
±
0.10
Side
max
4.00 max
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
PACKAGE OUTLINE
256Mx72 (2 rank) - HMP351V7EMR4C
PLL
Front
4.0
±
0.1
5.175 63.0
Detail A Detail B
133.35
5.0 55.0 5.175
18.29
Register
Register
10.0
Back
Note) All dimensions are in millimeters unless otherwise stated.
0.20
2.50
±
0.20
1.00
0.8
±
0.05
Detail of Contacts A
1.50
±
0.10
Detail of Contacts B
5.00
3.80
2.50
2.50
±
0.20
1.27
±
0.10
Side
max
7.55 max
Rev. 0.3 / Sep. 2008
1
240pin DDR2 VLP Registered DIMMs
REVISION HISTORY
Revision History Date Remark
0.1 Initial Release Jul. 2008
0.2 Corrected typos and adjusted DIMM line-up Aug. 2008
0.3 Editorial Correction Sep. 2008