5962-9321801Q2A(54ABT373E-QML) - National Semiconductor

Original Creation Date: 08/28/95

Last Update Date: 09/24/98

Last Major Revision Date: 03/19/97

MN54ABT373-X REV 0B0 MICROCIRCUIT DATA SHEET

OCTAL TRANSPARENT LATCH WITH TRI-STATE OUTPUTS

General Description

The ABT373 consists of eight latches with TRI-STATE outputs for bus organized system

applications. The flip-flops appear transparent to the data when Latch Enable (LE) is

HIGH. When LE is LOW, the data that meets the setup times is latched. Data appears on

the bus when the Output Enable (OE) is LOW. When OE is HIGH the bus output is in the high

impedance state.

NS Part Numbers

54ABT373E-QML *

54ABT373J-QML **

54ABT373W-QML ***

Industry Part Number

54ABT373

Prime Die

NB373

Controlling Document

See Features Page

Processing

MIL-STD-883, Method 5004

Quality Conformance Inspection

MIL-STD-883, Method 5005

Subgrp Description Temp ( C)

1 Static tests at +25

2 Static tests at +125

3 Static tests at -55

4 Dynamic tests at +25

5 Dynamic tests at +125

6 Dynamic tests at -55

7 Functional tests at +25

8A Functional tests at +125

8B Functional tests at -55

9 Switching tests at +25

10 Switching tests at +125

11 Switching tests at -55

MICROCIRCUIT DATA SHEET

MN54ABT373-X REV 0B0

Features

- TRI-STATE outputs for bus-oriented applications

- Output sink capability of 48mA, source capability of 24 mA

- Guaranteed latchup protection

- High impedance glitch free bus loading during entire power up and power down cycle.

- Non-Destructive hot insertion capability.

- SMD : 5962-9321801Q2A*, QRA**, QSA***

MICROCIRCUIT DATA SHEET

MN54ABT373-X REV 0B0

(Absolute Maximum Ratings)

(Note 1)

Vcc Pin Potential to Ground Potential -0.5V to +7.0V

Input Voltage

(Note 2) -0.5V to +7.0V

Input Current

(Note 2) -30mA to +5.0mA

Voltage Applies To Any Output -0.5V to 5.5VIn the Disabled or Power-Off State -0.5V to VccIn The High State

Current Applies To Output 96mAIn The Low State (Max)

Junction Temperature (Tj) +175CCeramic

Thermal Resistance See Mil-Std 1835Junction-To-Case (Theta JC)

Storage Temperature -65C to +150C

Lead Temperature +300C(Soldering, 10 seconds)

ESD Classification Class 3

Maximum Power Dissipation 500 mW

Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have

its useful life impaired. Functional operation under these conditions is not

implied.

Note 2: Either voltage limit or current limit is sufficient to protect inputs.

Recommended Operating Conditions

Supply Voltage (Vcc) 4.5V to 5.5V

Operating Temperature -55C to +125C

Minimum Input Edge Rate (dV/dt) 50 mV/nsData Input 20 mV/nsEnable Input

Maximum Output Current -24 mAHigh Level (Ioh) 48 mALow Level (Iol)

MN54ABT373-X REV 0B0 MICROCIRCUIT DATA SHEET

Electrical Characteristics

DC PARAMETERS

(The following conditions apply to all the following parameters, unless otherwise specified.)

DC: 4.5V to 5.5V Temp Range: -55C to 125C

SYMBOL PARAMETER CONDITIONS NOTES PIN-

NAME MIN MAX UNIT SUB-

GROUPS

ICCH Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 250.0 uA 1, 2,

ICCL Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 30.0 mA 1, 2,

ICCZ Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 250.0 uA 1, 2,

ICCT Supply Current VCC=5.5V, OE=0.0V Input under

test=3.4V Other inputs=5.5V or 0.0V 1, 4 VCC 2.5 mA 1, 2,

VCC=5.5V, OE=3.4V Other inputs=5.5V or

0.0V 1, 4 VCC 2.5 mA 1, 2,

IIH High Level Input

Current VCC=5.5V, VINH=5.5V 1, 4 IN 2.0 uA 1, 2,

IIL Low Level Input

Current VCC=5.5V, VINL=0.0V 1, 4 IN -2.0 uA 1, 2,

IOZH Maximum TRI-STATE

Leakage Current

HIGH

VCC=5.5V, VOUT=2.7V VINL=0.0V, VIH

(OE)=2.0V 1, 4 OUT 10.0 uA 1, 2,

IOZL Maximum TRI-STATE

Leakage Current

LOW

VCC=5.5V, VOUT=0.5V VINH=5.5V, VIH

(OE)=2.0V 1, 4 OUT -10.0 uA 1, 2,

ICEX Output High

Leakage Current VCC=5.5V, VOUT=5.5V VINH=5.5V 1, 4 OUT 50.0 uA 1, 2,

IOS Output Short

Circuit Current VCC=5.5V, VOUT=0.0V VINH=5.5V 1,

OUT -100 -275 mA 1, 2,

IOS1 Output Short

Circuit Current VCC=5.5V, VOUT=2.5V VINH=5.5V 1,

OUT -50 -180 mA 1, 2,

IBVI Input High

Current Breakdown

test

VCC=5.5V, VINH=7.0V 1, 4 OUT 7.0 uA 1, 2,

IZZ Bus Drainage test VCC=0.0V, VOUT=4.5V, VINL=0.0V 1, 4 OUT -100 100 uA 1, 2,

VOL Low Level Output

Voltage VCC=4.5V, IOL=48.0mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 0.55 V 1, 2,

VOH High Level Output

Voltage VCC=4.5V, IOH=-24.0mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.0 V 1, 2,

VCC=4.5V, IOH=-3mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.5 V 1, 2,

VCC=5.0V, IOH=-3mA, VINH=5.0V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 3.0 V 1, 2,

MN54ABT373-X REV 0B0 MICROCIRCUIT DATA SHEET

Electrical Characteristics

DC PARAMETERS(Continued)

(The following conditions apply to all the following parameters, unless otherwise specified.)

DC: 4.5V to 5.5V Temp Range: -55C to 125C

SYMBOL PARAMETER CONDITIONS NOTES PIN-

NAME MIN MAX UNIT SUB-

GROUPS

VID Input Leakage

test VCC=0.0V, IID=1.9uA, VINL=0.0V 1, 4 IN 4.75 V 1, 2,

VCD Input Clamp Diode

Voltage VCC=4.5V, IKL=-18mA, VINH=4.5V,

VINL=0.0V 1, 4 IN -1.2 V 1, 2,

VOLP Low Level Ground

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 0.8 V 4

VOLV Low Level Ground

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -1.5 V 4

VOHP High Level VCC

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 1.6 V 4

VOHV High Level VCC

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -0.8 V 4

CIN Input Capacitance VCC=0.0V 7 IN 10.5 pF 4

COUT Output

Capacitance VCC=5.5V 7 OUT 17.0 pF 4

MN54ABT373-X REV 0B0 MICROCIRCUIT DATA SHEET

Electrical Characteristics

AC PARAMETERS

(The following conditions apply to all the following parameters, unless otherwise specified.)

AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS

SYMBOL PARAMETER CONDITIONS NOTES PIN-

NAME MIN MAX UNIT SUB-

GROUPS

tpLH (1) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 Dn to

On 1.2 5.4 ns 9

2, 5 Dn to

On 1.0 6.8 ns 10, 11

tpHL (1) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 Dn to

On 1.5 5.7 ns 9

2, 5 Dn to

On 1.0 7.0 ns 10, 11

tpLH (2) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 LE to

On 1.5 6.1 ns 9

2, 5 LE to

On 1.0 7.7 ns 10, 11

tpHL (2) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 LE to

On 1.5 6.7 ns 9

2, 5 LE to

On 1.5 7.7 ns 10, 11

tpZL Output Enable

Time VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 OE to

On 1.5 6.2 ns 9

2, 5 OE to

On 1.5 7.2 ns 10, 11

tpZH Output Enable

Time VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 OE to

On 1.2 5.5 ns 9

2, 5 OE to

On 1.0 6.7 ns 10, 11

tpHZ Output Disable

Time VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 OE to

On 2.0 6.4 ns 9

2, 5 OE to

On 1.7 8.0 ns 10, 11

tpLZ Output Disable

Time VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 OE to

On 1.5 6.0 ns 9

2, 5 OE to

On 1.0 7.0 ns 10, 11

ts(H/L) Setup Time HIGH

or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 Dn - LE 2.2 ns 9

7 Dn - LE 2.5 ns 10, 11

th(H/L) Hold Time HIGH or

LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 Dn - LE 2.2 ns 9

7 Dn - LE 2.5 ns 10, 11

tw(H) Pulse Width VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 LE HIGH 3.3 ns 9, 10,

Note 1: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8.

MN54ABT373-X REV 0B0 MICROCIRCUIT DATA SHEET

(Continued)

Note 2: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS A9, A10 &

A11.

Note 3: SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMP. ONLY, SUBGROUP 9.

Note 4: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,

SUBGROUPS A1, 2, 3, 7 & 8.

Note 5: SAMPLE TESTED (METHOD 5005, TABLE 1) ON MFG. LOT AT +25C, +125C & -55C TEMP.,

SUBGROUPS A9, 10 & 11.

Note 6: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C TEMP. ONLY, SUBGROUP

A9.

Note 7: NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA).

Note 8: MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE

OUTPUT @ VOL OR @ VOH.

Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V.

INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), OV TO THRESHOLD (VIHD), FREQ.= 1

MHZ.

Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT

ONE TIME.

MICROCIRCUIT DATA SHEET

MN54ABT373-X REV 0B0

Graphics and Diagrams

GRAPHICS# DESCRIPTION

E20ARE LCC (E), TYPE C, 20 TERMINAL(P/P DWG)

J20ARM CERDIP (J), 20 LEAD (P/P DWG)

P000068A (new)

P000069A (new)

W20ARF CERPACK (W), 20 LEAD (P/P DWG)

See attached graphics following this page.

MICROCIRCUIT DATA SHEET

MN54ABT373-X REV 0B0

Revision History

Rev ECN # Rel Date Originator Changes

0B0 M0001567 09/24/98 Bill Petcher Changed MDS MN54ABT373-X REV 0A0 to MN54ABT373-X REV

0B0