DG202AK/883B - Maxim Integrated

SCOPE: QUAD SPST CMOS ANALOG SWIT CHES

Device Type Generic Number

01 DG201AA(x)/883B

02 DG202A(x)/883B

Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:

Outline Letter Mil-Std-1835 Case Outline Package Code

L CDFP4-F16 16 LEAD FLATPACK F16

K GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP J16

Z CQCC1-N20 20-Pin Ceramic LCC L20

A bsolute Maximum Ratings

Voltage Referenced to V-

V+ ...................................................................................................................................... 44V

GND ................................................................................................................................... 25V

Digital Inputs, VS, VD (Note 1) ......................................................... -2V to (V+ +2V)or 20mA,

whichever occurs first

Current, Any terminal except S or D ............................................................................... 30mA

Continuous Current, S or D ............................................................................................. 20mA

(Pulsed at 1ms, 10% duty cycle max) ...................................................................... 70mA

Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C

Storage Temperature ........................................................................................... -65°C to +150°C

Continuous Power Dissipation ............................................................................ TA=+70°C

16 lead Flatpack (derate 6.1mW/°C above +70°C) ................................................. 485mW

16 lead CERDIP(derate 10mW/°C above +70°C) ................................................... 800mW

20-Pin LCC (derate 9.1mW/°C above +70°C) ........................................................ 727mW

Junct ion Temperature TJ .................................................................................….. +150°C

Thermal Resista nce, J unction to Case, ΘJC:

Case Outline 16 lead Flatpack ...........................................................…... 65°C/W

Case Outline 16 lead CERDIP.............................................................….. 50°C/W

Case Outline 20-Pin LCC ....................................................................…. 20°C/W

Thermal Resistance, Junction to Ambient, ΘJA:

Case Outline 16 lead Flatpack ...........................................................…. 165°C/W

Case Outline 16 lead CERDIP..........................................................…... 100°C/W

Case Outline 20-Pin LCC .................................................................….. 110°C/W

Recommended Operating Conditions.

Ambient Operating Range (TA) .............................................................. -55°C to +125°C

NOTE 1: Signals on SX, DX, or INX exceeding V+ or V- are clamped by internal diodes, and are

also internally current limited to 25mA.

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maximum

rating conditions for extended periods may affect device reliability.

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TABLE 1. ELECTRICAL TESTS

TEST Symbol CONDITIONS

-55 °C <=TA<= +125°C

V+=+15V, V-=-15V, GND=0V

Unless otherwise specified

Group A

Subgroup Device

type Limits

Min Limits

Max Units

SWITCH

Analog-Signal

Range VANALOG VS=±15V 1,2,3 All -15 15 V

Drain-Source ON

Resistance rDS(ON) IS =1mA, VD=10V, VIN=0.8V 1,3

201 175

250 Ω

Drain-Source ON

Resistance rDS(ON) IS =1mA, VD=-10V, VIN=0.8V 1,3

201 175

250 Ω

Drain-Source ON

Resistance rDS(ON) IS =1mA, VD=10V, VIN=2.4V 1,3

202 175

250 Ω

Drain-Source ON

Resistance rDS(ON) IS =1mA, VD=-10V, VIN=2.4V 1,3

202 175

250 Ω

Source OFF

Leakage Current IS(OFF) VS =+/-14V,

VD=-/+14V, VIN=2.4V 1

2,3 01 -1

-100 1

100 nA

Source OFF

Leakage Current IS(OFF) VS =+/-14V,

VD=-/+14V, VIN=0.8V 1

2,3 02 -1

-100 1

100 nA

Drain OFF

Leakage Current ID(OFF) VS =+/-14V,

VD=-/-14V, VIN=2.4V 1

2,3 01 -1

-100 1

100 nA

Drain OFF

Leakage Current ID(OFF) VS =+/-14V,

VD=-/+14V, VIN=0.8V 1

2,3 02 -1

-100 1

100 nA

Drain ON Leakage

Current ID(ON) VD=VS=±14V, VIN=0.8V 1

2,3 01 -2

-200 2

200 nA

Drain ON Leakage

Current ID(ON) VD=VS=±14V, VIN=2.4V 1

2,3 02 -2

-200 2

200 nA

INPUT

Input

Current/Voltage

High IINH

VIN= 2.4V

VIN=15V

1,2,3

1,3

All

-1

µA

Input

Current/Voltage

Low

IINL VIN=0V 1,3

2All -1

-10 µA

SUPPLY

Positive Supply

Current I+ All channels on or off 1,2

3All 0.5

1.0 mA

Negat ive Supply

Current I- All channels on or off 1,3

2All -10

-100 µA

DYNAMIC

Turn ON time tON Figure 1 9

10,11 All 600

1000 ns

Turn OFF time tOFF Figure 1 9

10,11 All 450

650 ns

---------------------------- Electrical Characteristics of DG201A/DG202/883B 19-0041 Rev. C

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FIGURE 1: SWITCHING TIME TEST CIRCUIT: See Commercial Data Sheet

TRUTH TABLE TERMINAL CONNECTION

Device Type Logic Switc h TERMINAL

NUMBER DG201A &

DG202 DG201A &

DG202

01 0 ON J16 & F16 L20

01 1 OFF 1 IN1NC

02 0 OFF 2 D1IN1

02 1 ON 3 S1D1

4V- S

5 GND V-

4NC

4GND

ORDERING Information 8IN

4S4

01 DG201AAK /883B 9 IN3D4

01 DG201AAL /883B 10 D3IN4

01 DG201AAZ /883B 11 S3NC

02 DG202AK /883B 12 NC IN3

13 V+ D3

14 S2S3

15 D2NC

16 IN2NC

17 V+

18 S2

19 D2

20 IN2

---------------------------- Electrical Characteristics of DG201A/DG202/883B 19-0041 Rev. C

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QUALITY ASSURAN CE

Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-

Std-883.

Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:

1. Test Condition, A, B, C, or D.

2. TA = +125°C minimum.

3. Interim and final electrical test requirements shall be specified in Table 2.

Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,

C, and D inspection.

Group A inspection:

1. Tests as specified in Table 2.

2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.

Group C and D inspections:

a. End-point electrical parameters shall be specified in Table 1.

b. Steady-state life test, Method 1005 of Mil-Std-883:

1. Test condition A, B, C, D.

2. TA = +125°C, minimum.

3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.

TABLE 2. ELECTRICAL TEST R EQUIREMENTS

Mil-Std-883 Test Requirements Subgroups

per Method 5005, Table 1

Interim Electric Parameters

Method 5004 1

Final Electrical Parameters

Method 5005 1*, 2, 3, 9

Group A Test Requirements

Method 5005 1, 2, 3, 9, 10**, 11**

Group C and D End-Point Electrical Parameters

Method 5005 1

* PDA applies to Subgroup 1 only.

** Subgroups 10 and 11, if not tested shall be guaranteed to the limits of Table 1.

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