2SJ552(L),2SJ552(S)
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-651B (Z)
3rd. Edition
Jun 1998
Features
Low on-resistance
RDS(on) = 0.042 typ.
Low drive current.
4V gate drive devices.
High speed switching.
Outline
1. Gate
2. Drain
3. Source
4. Drain
123
4
123
4
LDPAK
D
G
S
2SJ552(L),2SJ552(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage VDSS –60 V
Gate to source voltage VGSS ±20 V
Drain current ID–20 A
Drain peak current ID(pulse)Note1 –80 A
Body-drain diode reverse drain current I DR –20 A
Avalanche current I AP Note3 –20 A
Avalanche energy EAR Note3 34 mJ
Channel dissipation Pch Note2 75 W
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg 50
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V(BR)DSS –60 V ID = –10mA, VGS = 0
Gate to source breakdown voltage V(BR)GSS ±20——V I
G = ±100µA, VDS = 0
Zero gate voltege drain current IDSS –10 µAV
DS = –60 V, VGS = 0
Gate to source leak current IGSS ——±10 µAV
GS = ±16V, VDS = 0
Gate to source cutoff voltage VGS(off) –1.0 –2.0 V ID = –1mA, VDS = –10V
Static drain to source on state RDS(on) 0.042 0.055 ID = –10A, VGS = –10V Note4
resistance RDS(on) 0.065 0.095 ID = –10A, VGS = –4V Note4
Forward transfer admittance |yfs| 1016—S I
D = –10A, VDS = –10V Note4
Input capacitance Ciss 1750 pF VDS = –10V
Output capacitance Coss 800 pF VGS = 0
Reverse transfer capacitance Crss 180 pF f = 1MHz
Turn-on delay time td(on) 16 ns VGS = –10V, I D = –10A
Rise time t r 100 ns RL = 3
Turn-off delay time td(off) 230 ns
Fall time tf 140 ns
Body –drain diode forward voltage VDF –1.0 V IF = –20A, VGS = 0
Body –drain diode reverse
recovery time trr 100 ns IF = –20A, VGS = 0
diF/ dt =50A/ µs
Note: 4. Pulse test
2SJ552(L),2SJ552(S)
3
Main Characteristics
80
60
40
20
050 100 150 200
–100
–30
–10
–3
–1
–0.3
–0.1
–0.1 –0.3 –1 –3 –10
–50
–40
–30
–20
–10
0–2 –4 –6 –8 –10
–6 V
–4 V
0 1–2–3–45
–30 –100
–1000
–300
–10 V –4.5 V
–3 V
–50
–40
–30
–20
–10
10 µs
1 ms
Ta = 25 °C
–3.5 V
25 °C
DS
V = –10 V
Pulse Test
Operation in
this area is
limited by R
DS(on)
100 µs
PW = 10 ms (1 shot)
–8 V –5 V
Tc = –25 °C
Channel Dissipation Pch (W)
Case Temperature Tc (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Pulse Test
V = –2.5 V
GS
75 °C
DC Operation
(Tc = 25 °C)
2SJ552(L),2SJ552(S)
4
–2.0
–1.6
–1.2
–0.8
–0.4
0–4 –8 –12 –16 –20
0.2
0.16
0.12
0.08
0.04
–40 0 40 80 120 160
0–10 V
GS
V = –4 V
1
0.5
0.05
0.02
0.01
–1 –2 –10 –20 –100
–50
–5 A
0.2
0.1
Pulse Test
Pulse Test
–0.1 –1 –10 –100
–0.3 –3 –30
100
10
0.1
1
0.3
3
30
25 °C
Tc = –25 °C
75 °C
DS
V = –10 V
Pulse Test
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Static Drain to Source on State Resistance
vs. Temperature
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
–2 A
I = –20 A
D
–10 A
–5
–5 A
I = –20 A
D
–5, –10 A –20 A
–10 A
–10 V
V = –4 V
GS
Pulse Test
2SJ552(L),2SJ552(S)
5
0 –10 –20 –30 –40 –50
10000
3000
1000
300
100
0
–20
–40
–60
–80
0
0
–4
–8
–12
–16
–20–100 16 32 48 64 80
1000
200
500
100
20
50
10
–0.1 –0.3 –1 –10 –30 –100
30
10
DS
V
GS
V
V = –10 V
–25 V
–50 V
DD
V = 0
f = 1 MHz
GS
Ciss
Coss
Crss
V = –10 V
–25 V
–50 V
DD
–0.1 –0.3 –1 –3 –10 –30 –100
1000
500
200
100
50
20
10
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
D
I = –20 A –3
td(on)
td(off)
tr
tf
V = –10 V, V = –30 V
PW = 10 µs, duty < 1 %
GS DD
Pulse Test
2SJ552(L),2SJ552(S)
6
D. U. T
Rg
I
Monitor
AP
V
Monitor
DS
V
DD
50
Vin
–15 V
0
I
D
V
DS
I
AP
V
(BR)DSS
L
V
DD
E = • L • I •
2
1V
V – V
AR AP DSS
DSS DD
2
50
40
30
20
10
25 50 75 100 125 150
0
–50
–40
–30
–20
–10
0–0.4 –0.8 –1.2 –1.6 –2.0
V = 0, 5 V
GS
–10 V
–5 V
Pulse Test
DD
I = –20 A
V = –25 V
duty < 0.1 %
Rg > 50
AP
Repetitive Avalanche Energy E (mJ)
AR
Maximum Avalanche Energy vs.
Channel Temperature Derating
Avalanche Test Circuit Avalanche Waveform
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Channel Temperature Tch (°C)
Source to Drain Voltage V (V)
SD
2SJ552(L),2SJ552(S)
7
Vin Monitor
D.U.T.
Vin
–10 V
R
L
V
= –30 V
DD
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
Vout
Monitor
50
90%
10%
t
f
3
1
0.3
0.1
0.03
0.01
10 µ 100 µ 1 m 10 m 100 m 1 10
DM
P
PW
T
D = PW
T
ch – c(t) = s (t) • ch – c
ch – c = 1.67 °C/W, Tc = 25 °C
θ γ θ
θ
Tc = 25°C
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Switching Time Test Circuit Waveform
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
γ
Normalized Transient Thermal Impedance vs. Pulse Width
2SJ552(L),2SJ552(S)
8
Package Dimensions
Unit: mm
10.2 ± 0.3
(1.4)
8.6 ± 0.3
1.27 ± 0.2
1.2 ± 0.2
2.54 ± 0.5
11.3 ± 0.5
(1.5)
0.86+0.2
–0.1
3.0 +0.3
–0.5
0.76 ± 0.1
10.0+0.3
–0.5
2.54 ± 0.5
4.44 ± 0.2 1.3 ± 0.2
2.59 ± 0.2
0.4 ± 0.1
11.0 ± 0.5
10.2 ± 0.3
(1.4)
8.6 ± 0.3
1.27 ± 0.2
2.54 ± 0.5
(1.5)
0.86+0.2
–0.1
10.0+0.3
–0.5
2.54 ± 0.5
4.44 ± 0.21.3 ± 0.2
2.59 ± 0.2
0.4 ± 0.1
1.2 ± 0.2
(1.5)
0.1+0.2
–0.1
L type S type
Hitachi Code
EIAJ
JEDEC
LDPAK
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