INDEX PRELIMINARY MX29L8000T/B FEATURES 8M-BIT [1M x 8] CMOS SINGLE VOLTAGE 3V ONLY FLASH EEPROM * Extended single-supply voltage range 2.7V to 3.6V for read and write * JEDEC-standard EEPROM commands * Endurance : 100,000 cycles * Fast access time: 120ns * Optimized block architecture - One 16 Kbyte protected block(16K-block) - Two 8 Kbyte parameter blocks - One 96 Kbyte main block - Seven 128 Kbyte main blocks * Hardware and software data protection - Hardware Write Protection pin (WP) - Hardware Lockout bit for 16K-block - Software command data protection * Software EEPROM emulation with parameter blocks * Status register - For detection of program or erase cycle completion * Auto Erase operation - Automatically erases any one of the sectors or the whole chip * * * * * * - Erase suspend capability - Fast erase time: 50ms typical for chip erase Auto Page Program operation - Automatically programs and verifies data at specified addresses - Internal address and data latches for 128 bytes per page Low power dissipation - 20mA active current - 20uA standby current - 1uA deep power-down current Hardware Reset pin (RP) - Reset internal state machine, and put the device into deep power-down mode Built-in 128 Bytes Page Buffer - Work as SRAM for temporary data storage - Fast access to temporary data Low Vcc write inhibit < 1.8V Industry standard surface mount packaging - 40-Lead TSOP Type I 1.0 GENERAL DESCRIPTION Programming the MX29L8000T/B is performed on a page basis; 128 bytes of data are loaded into the device and then programmed simultaneously. The typical Page Program time is 5ms.The device can also be reprogrammed in standard EPROM programmers. Reading data out of the device is similar to reading from an EPROM or other flash. The MX29L8000T/B is a 8 Mbit, 3 V-only Flash memory organized as a 1 Mbytes of 8 bits each. For flexible erase and program capability, the 8 Mbits of data is divided into 11 sectors of one 16 Kbyte protected block, two 8 Kbyte parameter blocks, one 96 Kbyte main block, and seven 128 Kbyte main blocks. To allow for simple in-system operation, the device can be operated with a single 2.7 V to 3.6 V supply voltage. Since many designs read from the flash memory a large percentage of the time, significant power saving is achieved with the 2.7 V VCC operation. Manufactured with MXIC's advanced nonvolatile memory technology, the device offers access times of 120 ns, and a low 1uA typical deep power-down current. Erase is accomplished by executing the Erase command sequence. This will invoke the Auto Erase algorithm which is an internal algorithm that automatically times the erase pulse widths and verifies proper cell margin. This device features both chip erase and block erase. Each block can be erased and programmed without affecting other blocks. Using MXIC's advanced design technology, no preprogram is required (internally or externally). As a result, the whole chip can be typically erased and verified in as fast as 50 ms. The MX29L8000T/B command set is compatible with the JEDEC single-power-supply flash standard. Commands are written to the command register using standard microprocessor write timings. MXIC's flash memory augments EPROM functionality with an internal state machine which controls the erase and program circuitry. The device Status Register provides a convenient way to monitor when a program or erase cycle is complete, and the success or failure of that cycle. P/N: PM0446 A combined feature of Write Protection pin (WP), Reset pin (RP), 16K-block lockout bit, and software command sequences provides complete data protection. First, software data protection protects the device from 1 REV.1.4, Jan 12, 1998 INDEX MX29L8000T/B PIN CONFIGURATIONS inadvertent program or erase. Two "unlock" write cycles must be presented to the device before the program or erase command can be accepted by the device. For hardware data protection, the WP pin and RP pin provide protection against unwanted command writes due to invalid system bus condition that may occur during system reset and power-up/down sequence. Finally, with 16K-block lockout bit feature, the device provides complete core security for the kernel code required for system initialization. The device has 128 Bytes built-in page buffer, which can serve as SRAM. This feature provides a convenient way to store temporary data for fast read and write. MXIC's Flash technology reliably stores memory contents after 100,000 erase and program cycles. The MXIC's cell is designed to optimize the erase and program mechanism. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and program operations produce reliable cycling. SYMBOL PIN NAME A0 - A19 Address Input Q0 - Q7 Data Input/Output CE Chip Enable Input OE Output Enable Input WE Write Enable RP Reset/Deep Power-down WP Write Protect VCC Power Supply Pin (2.7V - 3.6V) GND Ground Pin The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC +1V. 1.2 PINOUTS 40TSOP (TPYE 1) 10 x 20mm A16 A15 A14 A13 A12 A11 A9 A8 WE RP NC WP A18 A7 A6 A5 A4 A3 A2 A1 P/N: PM0446 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 MX29L8000T/B 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 A17 GND NC A19 A10 DQ7 DQ6 DQ5 DQ4 VCC VCC NC DQ3 DQ2 DQ1 DQ0 OE GND CE A0 REV.1.4, Jan 12, 1998 2 INDEX MX29L8000T/B 1.1 MX29L8000T/B SECTOR ARCHITECTURE FFFFFH FFFFFH FC00 FBFF FA00 F9FF F800 F7FF 0 F 0 F 0 F H H H H H H 16-Kbyte BLOCK 128-Kbyte MAIN BLOCK E0000H DFFFFH 8 - K b y t e PA R A M E T E R B L O C K 8 - K b y t e PA R A M E T E R B L O C K 128-Kbyte MAIN BLOCK C0000H BFFFFH 96-Kbyte MAIN BLOCK E0000H DFFFFH 128-Kbyte MAIN BLOCK 128-Kbyte MAIN BLOCK A0000H 9FFFFH 128-Kbyte MAIN BLOCK 80000H 7FFFFH 128-Kbyte MAIN BLOCK 60000H 5FFFFH C0000H BFFFFH 128-Kbyte MAIN BLOCK A0000H 9FFFFH 128-Kbyte MAIN BLOCK 80000H 7FFFFH 128-Kbyte MAIN BLOCK 128-Kbyte MAIN BLOCK 40000H 3FFFFH 60000H 5FFFFH 128-Kbyte MAIN BLOCK 20000H 1FFFFH 128-Kbyte MAIN BLOCK 40000H 3FFFFH 96-Kbyte MAIN BLOCK 0800 07FF 0600 05FF 0400 03FF 128-Kbyte MAIN BLOCK 20000H 1FFFFH 128-Kbyte MAIN BLOCK H H H H H H 00000H 00000H 8 - K b y t e PA R A M E T E R B L O C K 8 - K b y t e PA R A M E T E R B L O C K 16-Kbyte BLOCK MX29L8000B Memory Map MX29L8000T Memory Map P/N: PM0446 0 F 0 F 0 F REV.1.4, Jan 12, 1998 3 INDEX MX29L8000T/B BLOCK DIAGRAM RP, WP CE CONTROL OE INPUT WE WRITE PROGRAM/ERASE STATE HIGH VOLTAGE MACHINE LOGIC (WSM) COMMAND INTERFACE LATCH X-DECODER ADDRESS REGISTER MX29L8000T/B FLASH ARRAY A0-A19 BUFFER Y-DECODER AND (CIR) ARRAY SOURCE HV Y-PASS GATE PGM DATA HV SENSE AMPLIFIER COMMAND DATA DECODER COMMAND DATA LATCH PAGE PROGRAM DATA LATCH Q0-Q7 P/N: PM0446 I/O BUFFER REV.1.4, Jan 12, 1998 4 INDEX MX29L8000T/B Table 1 .PIN DESCRIPTIONS SYMBOL A0 - A19 TYPE INPUT NAME AND FUNCTION ADDRESS INPUTS: for memory addresses. Addresses are internally latched during a write cycle. Q0 - Q7 INPUT/OUTPUT INPUTS/OUTPUTS DATA BUS: Input data and commands during Command Interface Register(CIR) write cycles. Outputs array,status ,identifier data, and page buffer in the appropriate read mode. Float to tri-state when the chip is deselected or the outputs are disabled. CE INPUT CHIP ENABLE INPUTS: Activate the device's control logic, input buffers, decoders and sense amplifiers. With CE high, the device is deselected and power consumption reduces to Standby level upon completion of any current program or erase operations. CE must be low to select the device. OE INPUT OUTPUT ENABLES: Gates the device's data through the output buffers during a read cycle. OE is active low. WE INPUT WRITE ENABLE: Controls writes to the Command Interface Register(CIR). WE is active low. RP INPUT RESET/DEEP POWER-DOWN: When RP is low, the device is in reset/deep power-down mode. When RP is high, the device is in standard operation. WP INPUT WRITE PROTECTION: Provides a method for locking the 16K-block, using three voltage levels (VIL, VIH, and VHH). When WP is low, the 16K-block is locked. When WP is high the 16K-block is unlocked, if the 16K-block lockout bit is disabled. When WP is at VHH, the 16K-block is unlocked. This overrides the status of the lockout bit. See Section3 for details of data-protection VCC DEVICE POWER SUPPLY(2.7V - 3.6V) GND GROUND 1.3 BUS OPERATION Flash memory reads, erases and writes in-system via the local CPU . All bus cycles to or from the flash memory conform to standard microprocessor bus cycles. These bus operations are summarized below. Table2 MX29L8000T/B Bus Operations Mode Notes CE OE WE RP A0 A1 A9 Q0-Q7 Read VIL VIL VIH VIH X X X DOUT OutputDisable VIL VIH VIH VIH X X X HighZ Standby VIH X X VIH X X X HighZ X X X VIL X X X HighZ ManufacturerID VIL VIL VIH VIH VIL VIL VHH C2H DeviceID VIL VIL VIH VIH VIH VIL VHH 83H(TopBoot) 82H(BottomBoot) Write VIL VIH VIL VIH X X X DIN Deeppowerdown NOTES :1.X can be VIH or VIL for address or control pins. 2. VHH = 11.5V- 12.5V. P/N: PM0446 REV.1.4, Jan 12, 1998 5 INDEX MX29L8000T/B 1.4 WRITE OPERATIONS The Command Interface Register (CIR) is the interface between the microprocessor and the internal chip controller. Device operations are selected by writing specific address and data sequence into the CIR, using standard microprocessor write timings. Writing incorrect data value or writing them in improper sequence will reset the device to the read mode.(read array or read buffer) Table 3 defines the valid command sequences. Note that the Erase Suspend (B0H) and Erase Resume (30H) are valid only while an erase operation is in progress and will be ignored in other circumstance. There are four read modes: Read Array, Read Silicon ID, Read Status Register, and Read Page Buffer. For Program and Erase inform the internal state machine that a program or erase sequence has been requested. During the execution of program or erase operation, the state machine will control the program /erase sequence. After the state machine has completed its task, it will set bit 7 of the Status Register (SR. 7) to a "1", which indicates that the CIR can respond to the full command set. TABLE 3. COMMAND DEFINITIONS Command Sequence Read/ Reset Bus Write Cycles Required Silicon Page/Byte ID Read Program Chip Erase Block Erase Erase Erase Suspend Resume Sleep Mode 1 4 4 6 6 1 1 3 XXXXH B0H XXXXH 30H 5555H AAH First Bus Write Cycle Addr Data XXXXH F0H 5555H AAH 5555H AAH 5555H AAH 5555H AAH Second Bus Write Cycle Addr Data RA RD 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H Third Bus Write Cycle Addr Data 5555H 90H 5555H A0H 5555H 80H 5555H 80H 5555H C0H 00H/01H C2H/83H PA PD 5555H AAH 5555H AAH Fourth Bus Addr Read/Write Cycle Data Fifth Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H Sixth Bus Write Cycle Addr Data 5555H 10H SA 30H P/N: PM0446 REV.1.4, Jan 12, 1998 6 INDEX MX29L8000T/B COMMAND DEFINITIONS(continue Table 3.) Command Sequence Lock Lock Status Read Write Read Clear 16K-block Read Page Buffer Page Buffer Status Register Status Register . 6 4 4 4 3 3 Bus Write Cycles Required Clear Buffer 3 First Bus Write Cycle Addr Data 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH 5555H AAH Second Bus Write Cycle Addr Data 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H 2AAAH 55H Third Bus Write Cycle Addr Data 5555H 60H 5555H 90H 5555H 75H 5555H E0H 5555H 70H 5555H 50H 5555H 04H Fourth Bus Read/Write Cycle Addr Data 5555H AAH 02H C2H/00H RA RD RA RD Fifth Bus Write Cycle Addr Data 2AAAH 55H Sixth Bus Write Cycle Addr Data SA 20H Notes: 1.Address bit A15 -- A19 = X = Don't care for all address commands except for Program Address(PA) and Sector Address(SA). 5555H and 2AAAH address command codes stand for Hex number starting from A0 to A14. 2. Bus operations are defined in Table 2. 3. RA = Address of the memory location to be read. PA = Address of the memory location to be programmed. Addresses are latched on the falling edge of the WE pulse. SA = Address of the block to be erased. The combination of A13 -- A19 will uniquely select any block. 4. RD = Data read from location RA during a read operation. PD = Data to be programmed at location PA. Data is latched on the rising edge of WE. 5. Erase can be suspended during sector erase with Addr = don't care, Data = B0H 6. Erase can be resumed after suspend with Addr = don't care, Data = 30H. 7. Clear Buffer set all buffer data to 1. 8. In lock status Read, SA02H = 00002H for Bottom Boot SA02H = FFF02H for Top Boot P/N: PM0446 REV.1.4, Jan 12, 1998 7 INDEX MX29L8000T/B 2.0 DEVICE OPERATION 2.1 SILICON ID READ The Silicon ID Read mode allows the reading out of a binary code from the device and will identify its manufacturer and type. This mode is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. This mode is functional over the entire temperature range of the device. MX29L8000T/B is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in Table 3. Following the command write, a read cycle with A0 = VIL retrieves the manufacturer code of C2H. A read cycle with A0 = VIH returns the device code . MX29L8000T Device Code =83H, MX29L8000B Device Code = 82H To activate this mode, the programming equipment must force VHH (11.5V~12.5V) on address pin A9. Two identifier bytes may then be sequenced from the device outputs by toggling address A0 from VIL to VIH. All addresses are don't cares except A0 and A1. To terminate the operation, it is necessary to write the Read/Reset command sequence into the CIR. The manufacturer and device codes may also be read via the command register, for instances when the Table 4. MX29L8000T/B Silion ID Codes and Verify Sector Protect Code A19~A2 A1 A0 Code(HEX) DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0 Manufacturer Code X VIL VIL C2H 1 1 0 0 0 0 1 0 MX29L8000T Device Code X VIL VIH 83H 1 0 0 0 0 0 1 1 MX29L8000B Device Code X VIL VIH 82H 1 0 0 0 0 0 1 0 Verify 16K-Block Protect** SA VIH VIL C2H* 1 1 0 0 0 0 1 0 Type * Outputs C2H if 16K-block is protected (lockout bit is enabled), 00H otherwise. ** Only the 16K-Block has protect-bit feature. P/N: PM0446 REV.1.4, Jan 12, 1998 8 INDEX MX29L8000T/B 2.3.1 PROGRAM 2.2 READ/RESET COMMAND The read or reset operation is initiated by writing the Read/Reset command sequence into the command register. Microprocessor read cycles retrieve array data from the memory. The device remains ready for reads until the CIR contents are altered by a valid command sequence. Any page to be programmed should have the page in the erased state first, i.e. performing sector erase is suggested before page programming can be performed. The device is programmed on a page basis. If a byte of data within a page is to be changed, data for the entire page can be loaded into the device. Any byte that is not loaded during the programming of its page will be still in the erased state (i.e. FFH). Once the bytes of a page are loaded into the device, they are simultaneously programmed during the internal programming period. After the first data byte has been loaded into the device, successive bytes are entered in the same manner. Each new byte to be programmed must have its high to low transition on WE (or CE) within 30us of the low to high transition of WE (or CE) of the preceding byte. A7 to A19 specify the page address, i.e., the device is page-aligned on 128 bytes boundary. The page address must be valid during each high to low transition of WE or CE. A0 to A6 specify the byte address within the page The byte may be loaded in any order; sequential loading is not required. If a high to low transition of CE or WE is not detected whithin 100us of the last low to high transition, the load period will end and the internal programming period will start. The load period will also end if the same address is consecutively loaded twice. The first data and address will be treated as normal data to be programmed. The second data needs to be '00' to terminate the load cycle. Other numbers besides '00' are reserved for future use. The device will automatically power-up in the read/reset state. In this case, a command sequence is not required to read data. Standard microprocessor read cycles will retrieve array data. This default value ensures that no spurious alteration of the memory content occurs during the power transition. Refer to the AC Read Characteristics and Waveforms for the specific timing parameters. The MX29L8000T/B is accessed like an EPROM. When CE and OE are low and WE is high the data stored at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state whenever CE or OE is high. This dual line control gives designers flexibility in preventing bus contention. Note that the Read/Reset command is not valid when program or erase is in progress. 2.3 PAGE PROGRAM The status of program can be determined by checking the Status Register. While the program operation is in progress, bit 7 of the Status Register (SR. 7) is "0". When the Status Register indicates that program is complete (when SR. 7 = 1), the Program Status bit should be checked to verify that the program operation was successful. If the program operation was unsuccessful, SR. 4 of the Status Register will be set to "1" to indicate a program failure. The Status Register should be cleared before attempting the next operation. To initiate Page program mode, a three-cycle command sequence is required. There are two " unlock" write cycles. These are followed by writing the page program command A0H. Any attempt to write to the device without the three-cycle command sequence will not start the internal Write State Machine(WSM), no data will be written to the device. After three-cycle command sequence is given, a byte load is performed by applying a low pulse on the WE or CE input with CE or WE low (respectively) and OE high. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. Maximum of 128 bytes of data may be loaded into each page. P/N: PM0446 REV.1.4, Jan 12, 1998 9 INDEX MX29L8000T/B 2.4 CHIP ERASE 2.6 ERASE SUSPEND AND RESUME Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command-80H. Two more "unlock" write cycles are then followed by the Chip Erase command 10H. Chip erase does not require the user to program the device prior to erase. The 16K-Block will not be erased if it is protected (16K-Block Lockout bit enabled). The Erase Suspend command is provided to allow the user to interrupt an erase sequence and then read data from a block other than that which is being erased. This command is applicable only during the erase operation. During the erase operation, writing the Erase Suspend command to the CIR will cause the internal state machine to pause the erase sequence at a predetermined point. The Status Register will indicate when the erase operation has been suspended. The Auto Chip Erase begins on the rising edge of the last WE pulse in the command sequence and terminates when the status on SR.7 is "1". While the erase sequence is in progress, SR.7 of the Status Register is "0". When erase is complete, the Erase Status bit should be checked. If the erase operation was unsuccessful, SR.5 of the Status Register is set to a "1" to indicate an erase failure. Clear the Status Register before attempting the next operation. Once in erase suspend, a Read Array command can be written to the CIR in order to read data from blocks not being erase suspended. The only other valid commands during erase suspend are Erase Resume and Read Status Register commands. Read Page Buffer command, however, is not applicable during erase suspend. To resume the erase operation, the Erase Resume command 30H should be written to the CIR. Another Erase Suspend command can be written after the chip has resumed erasing. 2.5 BLOCK ERASE Sector erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command 80H. Two more "unlock" write cycles are then followed by the sector erase command-30H. The sector address is latched on the falling edge of WE, while the command (data) is latched on the rising edge of WE. Only one sector can be erased at a time. Sector erase does not require the user to program the device prior to erase. The system is not required to provide any controls or timings during these operations. The AutomaticBlock Erase begins on the rising edge of the last WE pulse in the command sequence and terminates when the data on SR.7 is "1". When erasing a block, the remaining unselected blocks are unaffected.During the execution of the Block Erase command, only the Erase Suspend and Erase Resume commands are allowed. The Erase Suspend/Resume command may be issued as many time as required. Similar to the Chip Erase mode, the Status Register should be checked when erase is complete. P/N: PM0446 REV.1.4, Jan 12, 1998 10 INDEX MX29L8000T/B Table5. Status Register Bit Definition WSMS ESS ES PS SLP SLK 7 6 5 4 2 1 NOTE : State machine bit must first be checked to determine Program or Erase completion, before the Program or Erase Status bits are checked for success. SR.7 = WRITE STATE MACHINE STATUS(WSMS) 1 = Ready 0 = Busy SR.6 = ERASE-SUSPEND STATUS (ESS) 1 = Erase Suspended 0 = Erase in Progress/Completed When Erase Suspend is issued, state machine halts execution and sets both WSMS and ESS bits to "1," ESS bit remains set to "1" until an Erase Resume command is issued. SR.5 = ERASE STATUS 1 = Error in Erase 0 = Successful Erasure When this bit set to "1," state machine has applied the maximum number of erase pulses to the device and is still unable to successfully verify erasure. SR.4 = PROGRAM STATUS 1 = Error in Page/Byte Program 0 = Successful Page/Byte Program When this bit is set to "1," state machine has attempted but failed to program page data. SR.2 = SLEEP STATUS 1 = Device in sleep mode 0 = Device not in sleep mode When this bit is set to "1", the device is in sleep mode(deep power-down). Writing the Read Array command will wake up the device, and the device will return to standby. SR.3 = 0 SR.1 = Boot sector lock status 1: lock, 0: unlock Others = Reserved for future enhancements must be toggled with each subsequent status read, or the completion of a Program or Erase operation will not be evident from the Status Register. 2.7 STATUS REGISTER The device contains a Status Register which may be read to determine when a Program or Erase operation is complete, and whether that operation completed successfully. The Status Register may be read at any time by writing the Read Status command to the command interface. After writing this command, all subsequent Read operations output data from the Status Register until another command is written to the command interface. A Read Array command must be written to the command interface to return to the read array mode. The Status Register bits are output on DQ[0:7]. When the state machine is active, this register will indicate the status of the state machine, and will also hold the bits indicating whether or not the state machine was successful in performing the desired operation. 2.7.1 CLEARING THE STATUS REGISTER The state machine sets status bits 4 through 7 to "1", and clears bits 6 and 7 to "0", but cannot clear status bits 4 and 5 to "0". Bits 4 and 5 can only be cleared by the controlling CPU through the use of the Clear Status Register command. These bits can indicate various error conditions. By allowing the system software to control the resetting of these bits, several operations The contents of the Status Register are latched on the falling edge of OE or CE, whichever occurs last in the read cycle. This prevents possible bus errors which might occur if the contents of the Status Register change while reading the Status Register. CE or OE P/N: PM0446 REV.1.4, Jan 12, 1998 11 INDEX MX29L8000T/B Program. Sequential loading is not required. A0 to A6 must be valid to specify byte address within the page buffers during each high-to-low transition of WE or CE. Each new byte to be stored must have its high-to-low transition of WE or CE within 30 us of the low-to-high transition of WE or CE of the preceding byte. Otherwise, the Write Page Buffer mode is terminated automatically. may be performed (such as cumulatively programming several bytes or erasing multiple blocks in sequence). The Status Register may then be read to determine if an error occurred during that programming or erasure series. This adds flexibility to the way the device may be programmed or erased. Once an error occurred, the command Interface only responds to clear Status Register, Read Status Register and Read Array. To clear the Status Register, the Clear Status Register command is written to the command interface. Then, any other command may be issued to the command interface. Note, again, that before read cycle can be initiated, a Read Array command must be written to the command interface to specify whether the read data is to come from the Memory Array, Status Register, Page Buffer, or silicon ID. To read data from the page buffer, the Read Page Buffer command is written to the CIR. There are two "unlock" write cycles, which are followed by the command 75H. Each subsequent toggle of address (or OE, CE) will read data from the specified byte address of the page buffer (A0 to A6). To terminate the operation, it is necessary to write the Read/Reset command sequence into the CIR. 3.0 DATA PROTECTION 2.8 SLEEP MODE The MX29L8000T/B is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transitions. During power up the device automatically resets the internal state machine in the Read Array mode. Also, with its control register architecture, alteration of the memory contents only occurs after successful completion of specific multi-bus cycle command sequences. The MX29L8000T/B features a sofware controlled low power modes: Sleep modes. Sleep mode is allowed during any current operations except that once Suspend command is issued, Sleep command is ignored. To activate Sleep mode, a three-bus cycle operation is required. The C0H command (Refer to Table 3) puts the device in the Sleep mode. Once in the Sleep mode and with CMOS input level applied, the power of the device is reduced to deep power-down current levels. The only power consumed is diffusion leakage, transistor subthreshold conduction, input leakage, and output leakage. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up The Sleep command allows the device to complete its current operations before going into Sleep mode. During Sleep mode, Silicon ID codes remain valid and can still be read. The Device Sleep Status bit SR.2 will indicate that the device in the sleep mode. The device is in read SR. mode during sleep mode. 3.1 16K-BLOCK LOCKING The MX29L8000T/B features hardware 16K-Block protection. This feature will disable both program and erase operations in the 16K-Block. The block protection feature is enabled using system software by the user(Refer to Table 3). The device is shipped with 16KBlock unprotected. Alternatively, MXIC may protect 16K-Block in the factory prior to shipping the device. Writing the Read Array command wakes up the device out of sleep mode. SR.2 is reset to "0" and device returns to standby current level. 2.9 PAGE BUFFER READ AND WRITE Execute lock bit protection operation three additional times after protect bit is verified successfully to guarantee lock bit status under all conditions. The MX29L8000T/B has 128 Bytes of page buffers, which can work as SRAM to store temporary data for fast access purpose. To write data into page buffers, the Write Page Buffer command is written to the CIR. There are two "unlock"write cycles, followed by the command E0H. Loading data to page buffer is similar to that in Page 3.1.1 LOCK BLOCK P/N: PM0446 To activate this mode, a six-bus cycle operation is REV.1.4, Jan 12, 1998 12 INDEX MX29L8000T/B UNLOCKING required. There are two 'unlock' write cycles. These are followed by writing the 'set-up' command. Two more 'unlock' write cycles are then followed by the Lock Sector command 20H. The automatic Lock operation begins on the rising edge of the last WE pulse in the command sequence and terminates when the status on SR.7 is '1' at which time the device stays at the read mode. If WP = VIH and RP = VIH, all the regular blocks (parameter blocks and main blocks) are unlocked and can be programmed or erased. In this condition, whether the 16K-Block is locked is dependent on the 16K-Block Lock bit. If the 16K-Block Lock bit is enabled, then the 16K-Block is still protected; otherwise, it is unlocked. The following truth table clearly defines the write protection methods. 3.1.2 LOCK STATUS READ Table 5. WRITE PROTECTION TRUTH TABLE FOR MX29L8000T/B To verify the Protect status of the 16K-Block, operation is initiated by writing Silicon ID read command into the command register. Following the command write, a read cycle from address SA02H(see Table 3) retrieves the Manufacturer code of C2H if the 16K-Block is protected. If the 16K-Block is unprotected, 00H will be read instead. To terminate the operation, it is necessary to write the Read/Reset command sequence into the CIR. RP The lock status information can also be retrieved by reading SR. . The SR.1 ="1" if 16K-Block is locked. The SR.1 ="0" if 16K-Block is unlocked. A few retries are required if Protect status can not be verified successfully after each operation. WP 16K-Block Write Protection Provided Lockout bit 16K-Block Regular Block VIH VHH X unlocked unlocked VIL X X locked locked VIH VIL X locked unlocked VIH VIH 1 locked unlocked VIH VIH 0 unlocked unlocked 3.3 LOW VCC WRITE INHIBIT To avoid initiation of a write cycle during VCC power-up and power-down, a write cycle is locked out for VCC less than VLKO( typically 1.8V). If VCC < VLKO, the command register is disabled and all internal program/erase circuits are disabled. Under this condition the device will reset to the read mode. Subsequent writes will be ignored until the VCC level is greater than VLKO. It is the user's responsibility to ensure that the control pins are logically correct to prevent unintentional write when VCC is above VLKO. 3.2 HARDWARE PROTECTION Protection for parameter blocks and main blocks can be achieved using combinations of RP and WP pins. 3.2.1 RP = VIL FOR COMPLETE PROTECTION For complete data protection of all blocks, the RP can be held low. 3.2.2 WP = VIL FOR 16K-BLOCK LOCKING 3.4 WRITE PULSE "GLITCH" PROTECTION When WP = VIL, the 16K-block is locked, while all other blocks remain unlocked in this condition and can be programmed or erased normally. Noise pulses of less than 5ns (typical) on CE or WE will not initiate a write cycle. 3.2.3 WP = VHH FOR 16K-BLOCK UNLOCKING 3.5 LOGICAL INHIBIT If WP = VHH, the 16K-Block is unlocked and can be programmed or erased. Note that this feature will override the 16K-Block Lock bit protection. 3.2.4 Writing is inhibited by holding any one of OE = VIL,CE = VIH or WE = VIH. To initiate a write cycle CE and WE must be a logical zero while OE is a logical one. WP = VIH FOR REGULAR BLOCK P/N: PM0446 REV.1.4, Jan 12, 1998 13 INDEX MX29L8000T/B Figure 1. AUTO PAGE PROGRAM FLOW CHART START Write Program Cmd Sequence Write Program Data/Address NO Loading End? YES Read Status Register NO SR.7 = 1 ? YES YES SR.4 = 1 ? Program Fail NO Page Program Completed P/N: PM0446 REV.1.4, Jan 12, 1998 14 INDEX MX29L8000T/B Figure 2. AUTO ERASE FLOW CHART START Write Erase Cmd Sequence Read Status Register NO NO SR.7 = 1 ? To Execute Suspend Mode ? YES Erase Suspend Flow (Figure 3.) YES YES SR.5 = 1 ? Erase Fail NO Erase Completed P/N: PM0446 REV.1.4, Jan 12, 1998 15 INDEX MX29L8000T/B Figure 3. ERASE SUSPEND/ERASE RESUME FLOW CHART START Write B0H Read Status Register NO SR.7 = 1 ? YES NO SR.6 = 1 ? Erase Completed Erase Suspended Write F0H Read Array NO Done Reading YES Write 30H Erase Resumed P/N: PM0446 REV.1.4, Jan 12, 1998 16 INDEX MX29L8000T/B Figure 4. 16K-BLOCK PROTECTION FLOW CHART START Write 16K-Block Protect Cmd Sequence Read Status Register SR.7 = 1 ? NO YES Sector Protect Completed Figure 5. VERIFY 16K-BLOCK PROTECT FLOW CHART START Write Verify-Protection and Sequence Read Protect Status Note: 1. Protect Status: Data Outputs (C2H in byte mode, 00C2H in word mode) if block is protected(lockout bit is enabled). Data Outputs (00H in byte mode, 0000H in word mode) otherwise. 2. Silicon ID can be read via this Flow Chart. Refer to Table 4. 3. SR1 also contains the lock bit information Refer to Table 5. 4.Execute lock bit protection operation three additional times after protect bit is verified successfully to guarantee lock bit status under all conditions. P/N: PM0446 REV.1.4, Jan 12, 1998 17 INDEX MX29L8000T/B OPERATING RANGES 5.0 ELECTRICAL SPECIFICATIONS RATING Ambient Temperature ABSOLUTE MAXIMUM RATINGS RATING Ambient Temperature VALUE -40C to 85C Storage Temperature -65C to 125C Applied Input Voltage -0.5V to VCC + 4.5 Applied Output Voltage -0.5V to VCC + 0.6 VCC to Ground Potential -0.5V to 5.5V A9, WP -0.5V to 13.0V Vcc Supply Voltage NOTICE: 1.This document contains information on product in the dsign phase of development. Revised information will be published when the product is available. 2.Specifications contained within the following tables are subject to change. WARNING: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is stress rating only and functional operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability. CAPACITANCE TA = 25C, f = 1.0 MHz SYMBOL PARAMETER CIN COUT VALUE 0C to 70C(Comm.) -40C to 85C(Ind.) 2.7V to 3.6V MIN. TYP. MAX. UNIT CONDITIONS Input Capacitance 14 pF VIN = 0V Output Capacitance 16 pF VOUT = 0V SWITCHING TEST CIRCUITS 2.7K ohm DEVICE UNDER TEST 3.3V CL 6.2K ohm DIODES = IN3064 OR EQUIVALENT CL = 100 pF Including jig capacitance for 150/200ns CL = 50 pF for 120ns SWITCHING TEST WAVEFORMS 2.4V 2.0V 1.5V TEST POINTS 0.8V 0.45V OUTPUT INPUT AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0". Input pulse rise and fall times are 5ns. P/N: PM0446 REV.1.4, Jan 12, 1998 18 INDEX MX29L8000T/B 5.1 DC CHARACTERISTICS Vcc = 2.7V to 3.6V SYMBOL PARAMETER NOTES MIN. IIL Input Load Current ILO TYP. MAX. UNITS TEST CONDITIONS 1 1 uA VCC = VCC Max VIN = VCC or GND Output Leakage Current 1 10 uA VCC = VCC Max VIN = VCC or GND ISB1 VCC Standby Current(CMOS) 1 20 30 uA VCC = VCC Max CE = VIH ISB2 VCC Standby Current(TTL) 1 2 mA VCC = VCC Max CE = VIH ICC1 VCC Read Current 1 20 35 mA VCC = VCC Max f = 10MHz, IOUT = 0 mA ICC2 VCC Erase Suspend Current 1,2 5 mA CE = VIH Block Erase Suspended ICC3 VCC Program Current 1 15 30 mA Program in Progress ICC4 VCC Erase Current 1 15 30 mA Erase in Progress IPPD VCC Deep Power-down Current 1 8 uA VCC = VCC Max RP = VIL VIL Input Low Voltage 3 -0.3 0.6 V VIH Input High Voltage 4 2.0 VCC+0.3 V VOL Output Low Voltage 0.45 V IOL = 2.1mA, Vcc = Vcc Min VOH Output High Voltage V IOH = -100uA, Vcc = Vcc Min 2.4 NOTES: 1. All currents are in RMS unless otherwise noted. Typical values at VCC = 3.0V, T = 25C. These currents are valid for all product versions (package and speeds). 2. ICC2 is specified with the device de-selected. If the device is read while in erase suspend mode, current draw is the sum of ICC2 and ICC1. 3. VIL min. = -1.0V for pulse width < 50ns. VIL min. = -2.0V for pulse width < 20ns. 4. VIH max. = VCC + 1.5V for pulse width < 20ns. If VIH is over the specified maximum value, read operation cannot be guaranteed. P/N: PM0446 REV.1.4, Jan 12, 1998 19 INDEX MX29L8000T/B 5.2 AC CHARACTERISTICS READ OPERATIONS 29L8000T/B-12 29L8000T/B-15 MIN. MAX. MIN. MAX. 29L8000T/B-20 MIN. MAX. UNIT SYMBOL DESCRIPTIONS tACC Address to Output Delay 120(1) 150 200 ns CE=OE=VIL tCE CE to Output Delay 120(1) 150 200 ns OE=VIL tOE OE to Output Delay 60 75 100 ns CE=VIL tDF(2) OE High to Output Delay 0 55 ns CE=VIL tOH Address to Output hold 0 ns CE=OE=VIL 55 0 0 0 0 NOTE: TEST CONDITIONS: * Input pulse levels: 0.45V/2.4V * Input rise and fall times: 5ns * Output load: 1TTL gate+100pF(Including scope and jig) (100pF loading for 150ns, 200ns read speed.) ( 50pF loading for 120ns read speed.) * Reference levels for measuring timing: 1.5V P/N: PM0446 55 CONDITIONS 1. 120ns is the data while Vcc = 3.3V 0.3V. When Vcc goes down to 2.7V, the value will be 150ns. 2. tDF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. REV.1.4, Jan 12, 1998 20 INDEX MX29L8000T/B Figure 6. READ TIMING WAVEFORMS Standby Device and Outputs Enabled address selection Standby Data valid VIH ADDRESSES STABLE ADDRESSES VIL VIH CE VIL VIH OE VIL tDF VIH WE tOE VIL tCE tOH VOH DATA OUT HIGH Z Data out valid HIGH Z VOL tACC P/N: PM0446 REV.1.4, Jan 12, 1998 21 INDEX MX29L8000T/B 5.3 AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS SYMBOL DESCRIPTION 29L8000T/B-12 MIN. MAX. 29L8000-T/B15 MIN. MAX. 29L8000-T/B20 MIN. MAX. UNIT tWC Write Cycle Time 120 150 200 ns tAS Address Setup Time 0 0 0 ns tAH Address Hold Time 60 60 60 ns tDS Data Setup Time 50 50 50 ns tDH Data Hold Time 10 10 10 ns tOES Output Enable Setup Time 0 0 0 ns tCES CE Setup Time 0 0 0 ns tGHWL Read Recover Time Before Write 0 0 0 ns tCS CE Setup Time 0 0 0 ns tCH CE Hold Time 0 0 0 ns tWP Write Pulse Width 60 60 60 ns tWPH Write Pulse Width High 40 40 40 ns tBALC Byte Address Load Cycle 0.2 tBAL Byte Address Load Time 100 100 100 us tSRA Status Register Access Time 120 150 200 ns tCESR CE Setup before S.R. Read 100 100 100 ns tPHWL RP High Recovery to WE Going Low 1 1 1 us tVCS VCC Setup Time 2 2 2 us P/N: PM0446 30 0.2 30 0.2 30 us REV.1.4, Jan 12, 1998 22 INDEX MX29L8000T/B Figure 7. COMMAND WRITE TIMING WAVEFORMS tCH CE tOES tCS OE tWC WE tGHWL tWPH tWP tAS ADDRESSES tAH VALID tDH tDS HIGH Z DATA VCC P/N: PM0446 DIN tVCS REV.1.4, Jan 12, 1998 23 INDEX MX29L8000T/B Figure 8. AUTOMATIC PAGE PROGRAM/WRITE PAGE BUFFER TIMING WAVEFORMS A0~A6 55H AAH 55H A7~A14 55H 2AH 55H tAS Byte offset Address Last Byte offset Address Page Address 2** tAH Page Address 2** A15~A19 tWC tBAL tBALC CE tWP tWPH WE tCES OE tDS tDH tSRA AAH DATA 55H A0H/E0H Write Last Write Data Data SRD tPHWL RP NOTE: 1.Please refer to SECTION 2.3 for detail page program operation. **2.Page address is not required for Write Page Buffer P/N: PM0446 REV.1.4, Jan 12, 1998 24 INDEX MX29L8000T/B Figure 9. AUTOMATIC BLOCK/CHIP ERASE TIMING WAVEFORMS 5555H A0~A14 tAS 2AAAH 5555H 5555H 2AAAH *1 5555H tAH SA 2** A13~A19 tCESR CE tWP tWPH WE tWC tCES OE tDS tDH tSRA AAH DATA 55H 80H AAH 55H 30H/10H SRD tPHWL RP NOTES: *1. "X" means "don't care" in this diagram **2."SA" means "Block Address"(required for Block Erase only) P/N: PM0446 REV.1.4, Jan 12, 1998 25 INDEX MX29L8000T/B 5.4 AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS (Alternate CE Controlled) SYMBOL DESCRIPTION 29L8000T/B-12 MIN. MAX. 29L8000T/B-15 MIN. MAX. 29L8000T/B-20 MIN. MAX. UNIT tWC Write Cycle Time 120 150 200 ns tAS Address Setup Time 10 10 10 ns tAH Address Hold Time 60 60 60 ns tDS Data Setup Time 50 50 50 ns tDH Data Hold Time 10 10 10 ns tOES Output Enable Setup Time 0 0 0 ns tCES CE Setup Time 0 0 0 ns tGHWL Read Recover TimeBefore Write 0 0 0 ns tWS WE Setup Time 0 0 0 ns tWH WE Hold Time 0 0 0 ns tCP CE Pulse Width 60 60 60 ns tCPH CE Pulse Width High 40 40 40 ns tVCS VCC Setup Time 2 2 2 us P/N: PM0446 REV.1.4, Jan 12, 1998 26 INDEX MX29L8000T/B Figure 10. COMMAND WRITE TIMING WAVEFORMS(Alternate CE Controlled) tWH WE tOES tWS OE tWC CE tGHWL tCPH tCP tAS ADDRESSES tAH VALID tDH tDS HIGH Z DATA VCC P/N: PM0446 DIN tVCS REV.1.4, Jan 12, 1998 27 INDEX MX29L8000T/B Figure 11. AUTOMATIC PAGE PROGRAM TIMING WAVEFORM(Alternate CE Controlled) A0~A6 55H AAH 55H A7~A14 55H 2AH 55H tAS Byte offset Address Last Byte Offset Address Page Address tAH Page Address A15~A19 tWC tBALC WE tCP tCPH tBAL CE tCES OE tDS tDH tSRA DATA P/N: PM0446 AAH 55H A0H Write Last Write Data Data SRD REV.1.4, Jan 12, 1998 28 INDEX MX29L8000T/B 5.5 ERASE AND PROGRAMMING PERFORMANCE PARAMETER MIN. LIMITS TYP. MAX. UNITS Chip/Sector Erase Time 50 ms Page Programming Time 5 ms Chip Programming Time 40 sec Byte Program Time(average) 40 us Erase/Program Cycles 100,000 Cycles 5.6 LATCHUP CHARACTERISTICS MIN. MAX. Input Voltage with respect to GND on all pins except I/O pins -1.0V 13.5V Input Voltage with respect to GND on all I/O pins -1.0V Vcc + 1.0V -100mA +100mA Current Includes all pins except Vcc. Test conditions: Vcc = 3.0V, one pin at a time. P/N: PM0446 REV.1.4, Jan 12, 1998 29 INDEX MX29L8000T/B Revision History Revision # 1.1 1.2 1.3 1.4 P/N: PM0446 Description Change from "Advance Information" to "Preliminary". Changes Program/Erase cycles from 1,000 to 1,000/10,000. Page 8: Table 4 "Verify 16K-block protect" : A18~A2 X--->SA. Write-Erase cycles change from 1,000/10,000 to 100,000. Adding Notes Item 8 on Page 7 to make the table more clear Date 4/14/1997 8/22/1997 10/29/1997 01/12/1998 REV.1.4, Jan 12, 1998 30 INDEX MX29L8000T/B MACRONIX INTERNATIONAL CO., LTD. HEADQUARTERS: TEL:+886-3-578-8888 FAX:+886-3-578-8887 EUROPE OFFICE: TEL:+32-2-456-8020 FAX:+32-2-456-8021 JAPAN OFFICE: TEL:+81-44-246-9100 FAX:+81-44-246-9105 SINGAPORE OFFICE: TEL:+65-747-2309 FAX:+65-748-4090 TAIPEI OFFICE: TEL:+886-3-509-3300 FAX:+886-3-509-2200 MACRONIX AMERICA, INC. TEL:+1-408-453-8088 FAX:+1-408-453-8488 CHICAGO OFFICE: TEL:+1-847-963-1900 FAX:+1-847-963-1909 http : //www.macronix.com MACRONIX INTERNATIONAL CO., LTD. reserves the rignt to change product and specifications without notice. 31