
2SD300C17Ax
Preliminary Data Sheet
www.IGBT-Driver.com Page 5
6) This specification guarantees that the drive information will be transferred reliably even at a high DC-
link voltage and with ultra-fast switching operations.
7) Undervoltage monitoring of the primary-side supply voltage (VDD to GND). If the voltage drops below
this limit, a fault is transmitted to both outputs SOA and SOB and the IGBTs are switched off.
8) Undervoltage monitoring of the secondary-side supply voltage (Vx+ to COMx and COMx to Vx- which
correspond with the approximate turn-on and turn-off gate-emitter voltages). If the corresponding
voltage drops below this limit, the IGBT is switched off and a fault is transmitted to the corresponding
SOx output on the primary side.
9) The delay time is measured between 50% of the input signal and 10% (turn-on) or 90% (turn-off) of
the corresponding output.
10) Transmission delay of fault state from the secondary side to the primary status output.
11) The test voltage of 4000VAC(eff)/50Hz may be applied only once during one minute. It should be noted
that with this (strictly speaking obsolete) test method, some (minor) damage occurs to the insulation
layers due to the partial discharge. Consequently, this test is not performed at CONCEPT as a series
test. In the case of repeated isolation tests (e.g. module test, equipment test, system test), the
subsequent tests should be performed with a lower test voltage: the test voltage is reduced by 400V
for each additional test. The more modern if more elaborate partial-discharge measurement is
preferable to such test methods as it is almost entirely non-destructive.
12) The blocking time sets a minimum time span between the end of any fault state and the start of
normal operation (remove fault from pin SOx). The value of the blocking time is programmed on the
driver and cannot be modified externally.
13) HiPot testing (= dielectric testing) must generally be restricted to suitable components. This gate
driver is suited for HiPot testing. Nevertheless, it is strongly recommended to limit the testing time to
1s slots as stipulated by EN 50178. Excessive HiPot testing at voltages much higher than 1200VAC(eff)
may lead to insulation degradation. No degradation has been observed over 1min. testing at
5000VAC(eff). Every production sample shipped to customers has undergone 100% testing at the given
value for 1s.
14) Partial discharge measurement is performed in accordance with IEC 60270 and isolation coordination
specified in EN 50178. The partial discharge extinction voltage between primary and either secondary
side is coordinated for safe isolation to EN 50178.
15) The dead time is measured between 50% voltage swing of the gate-emitter voltage which is turned
off and 50% voltage swing of the gate-emitter voltage which is turned-on.
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