Original Creation Date: 07/12/95
Last Update Date: 07/12/95
Last Major Revision Date: 07/12/95
MDLM137K REV 0AL MICROCIRCUIT DATA SHEET
NEGATIVE ADJUSTABLE VOLTAGE REGULATOR
NS Part Numbers
LM137K/883
Industry Part Number
LM137
Prime Die
LM137
Controlling Document
DESC.# 77034
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o
1 Static tests at +25
2 Static tests at +125
3 Static tests at -55
4 Dynamic tests at +25
5 Dynamic tests at +125
6 Dynamic tests at -55
7 Functional tests at +25
8A Functional tests at +125
8B Functional tests at -55
9 Switching tests at +25
10 Switching tests at +125
11 Switching tests at -55
1
MDLM137K REV 0AL MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC/AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: Il = 8mA
AC: Il = 8mA
SYMBOL PARAMETER CONDITIONS NOTES PIN-
NAME MIN MAX UNIT SUB-
GROUPS
Vref Reference Voltage Vdiff = 3V -1.275 -1.225 V 1
-1.3 -1.2 V 2, 3
Vdiff = 40V -1.275 -1.225 V 1
-1.3 -1.2 V 2, 3
Rline Line Regulation 3V < Vdiff < 40V -9 9 mV 1
3V < Vdiff < 40V -23 23 mV 2, 3
Rload Load Regulation Vdiff = 5V, 8mA < Il < 1.5A -25 25 mV 1, 2,
3
Vdiff = 12V, 8mA < Il < 1.5A -25 25 mV 1
Vdiff = 40V, 8mA < Il < 200mA -25 25 mV 1
Vdiff = 40V, 8mA < Il < 100mA -25 25 mV 2, 3
Vrth Thermal
Regulation Vin = -14.6V, Il = 1.5A, Pd = 20W,
t = 10mS -5 5 mV 1
Iadj Adjustment Pin
Current Vdiff = 3V 100 uA 1, 2,
3
Vdiff = 40V 100 uA 1, 2,
3
Delta
Iadj(line) Adjustment Pin
Current Change 3V < Vdiff < 40V -5 5 uA 1, 2,
3
Delta
Iadj(load) Adjustment Pin
Current Change Vdiff = 5V, 8mA < Il < 1.5A -5 5 uA 1, 2,
3
Ilmin Minimum Load Vdiff = 3V, Vout = -1.4V (forced) 3 mA 1, 2,
3
Vdiff = 10V, Vout = -1.4V (forced) 3 mA 1, 2,
3
Vdiff = 40V, Vout = -1.4V (forced) 5 mA 1, 2,
3
Icl Current Limit Vdiff < 5V 1.5 3.5 A 1, 2,
3
Vdiff < 40V .24 1.2 A 1
Rn Ripple Rejection f = 120Hz, Cadj = 10uF, Vout = Vref 1, 2 66 dB 4, 5,
6
Note 1: Group "A" sample only, test at all temps.
Note 2: Bench test, refer to (SG)RPI-3-362.
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