XCR3032XL-5VQG44I - Xilinx, Inc.

APPL ICATION NOTE

DS012 (v1.1) March 3, 2000 www.xilinx.com 1

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Features

• Fast Zero Power (FZP™) design techniq ue provides

ultra-low power and very high speed

• Innovative XPLA3 architecture combines high speed

with extreme flexibility

• Based on industry's first TotalCMOS™ PLD - both

CMOS design and process technologies

• Advanced 0.35µ five metal layer E2CMOS process

- 1,000 erase/program cycles guaranteed

- 20 years data retention guaranteed

• 3V, In-System Programmable (ISP) using JTAG IEEE

1149.1 interface

- Full Boundary Scan Test (IEEE 1149.1)

• Ultra-low static power of less than 100 µA

• Simple deterministic timing model

• Support for complex asynchronous clocking

- 16 product term clocks and four local control term

clocks per logic block

- Four global clocks and one universal control term

clock per device

• Excellent pin retention during design changes

• 5V tolerant I/O pins

• Input register set up time of 1.7 ns

• Logic expandable to 48 product terms

• High-speed pin-to-pin delays of 5.0 ns

• Slew rate control per macrocell

• 100% routable

• Security bit prevents unauthor ized access

• Supports hot-plugging capability

• Design entry/verification using Xilinx or industry

standard CAE tools

• Innovative Control Term structure provides:

- Asynchronous macrocell clocking

- Asynchronous macrocell register p reset/reset

- Clock enable control per macrocell

• Four output enable controls per logic block

• Foldback NAND for synthesis optimization

• Global 3-state which f acilitates "bed of nails" testing

• Available in Chip-scale BGA, and QFP packages

• Commercial and extended voltage industrial grades

• Pin compatible with existing CoolRunner low-power

family devices

Family Overv iew

The CoolRunner XPLA3 (eXtended Programmable Logic

Array) family of CPLDs is targeted for low power systems

that include portable, handheld, and power sensitive appli-

cations. Each member of the XPLA3 family includes Fast

Zero Power (FZP) design technology that combines low

power and high speed. With this design technique, the

XPLA3 fa mily offer s true pin-to-pin speeds of 5.0 ns, while

simultaneously delivering power that is less than 100 µA at

standby without the need for "turbo bits" or other power

down schemes. By replacing conve ntiona l sense am plifier

methods for implem enting product te rms (a technique that

has been used in PLDs since the bipolar era) with a cas-

caded chain of pure CMOS gates, the dynamic power is

also substantially lower than any competing CPLD. Cool-

Runner devices are the only TotalCMOS PLDs, as they use

both a CMOS process technology and the patented full

CMOS FZP design technique.

To the original XPLA architecture, XPLA3 adds a direct

input register path, multiple clocks (both dedicated and

product term generated), and both reset and preset for

each macrocell, with a full PLA structure. These enhance-

ments deliver high speed coupled with very flexible logic

allocation which results in the ability to make design

changes without changing pinout. The XPLA3 logic block

includes a pool of 48 product terms that can be all ocated to

any macrocell in the logic block. Logic that is common to

multiple macrocells can be placed on a single PLA product

term and shared, effectively increasing design density.

XPLA3 CPLDs are supported by WebPACK from Xilinx and

industry standard CAE tools (Cadence/OrCAD, Exemplar

Logic, Mentor , Synopsys, V iewlogi c, andd Synpl icity), using

text (ABEL, VHD L, Verilog) and schem atic capture design

entry. Design veri fication uses industry s tandard si mulators

for functional and timing simulation. Development is sup-

ported on personal computer, Sparc, and HP platforms.

Device fitting uses Xilinx developed tools including

WebFITTER.

The XPLA3 fam ily features also include industry-standard,

IEEE 1149.1, JTAG interface through which In- System Pr o-

gramming (ISP) and reprogramming of the device can

CoolR unner™ X PL A3 CPLD

DS012 (v1.1) March 3, 2000 014*

Advance Product Specification



CoolRunner™ XPLA3 CPLD

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occur. The XPLA3 CPLD is electrically reprogrammable

using industry standard device programm ers from vendors

such as Data I/O, BP Microsystems, and SMS.

XPLA3 Architecture

Figure 1 shows a high-level block diagram of a 128 macro -

cell device implementing the XPLA3 architecture. The

XPLA3 architecture consists of logic blocks that are inter-

connected by a Zero-power Interconnect Array (ZIA). The

ZIA is a vir tual crosspoint switch. Each logic block has 36

inputs from the ZIA and 16 macrocells.

From this point of view, this architecture looks like many

other CPLD architectures. What makes the XPLA3 family

unique is logic allocation inside each logic block and the

design technique used to implement these logic blocks.

Logi c B l ock Arc h itecture

Figure 2 illustrates the logic block architecture. Each logic

block contains a PLA array that generates control terms,

clock terms, and logic cells. There are 36 pairs of true and

complement inputs from the ZIA that feed the 48 product

terms in the array. Within the 48 P-terms there are eight

local control terms (LCT[0:7]) available as con trol inputs to

each macrocell for use as asynchronous clocks, resets,

presets and output enables. The other P-terms serve as

additional single inputs into each macrocell.

There are eight foldback NAND P-terms that are available

for ease of fitting and pin locking. Sixteen product terms are

coupled with the associated programmable OR gate into

the VFM (Variable Function Multiplexer). The VFM

increases logic optimization by implementing any two input

logic funtion before entering the macrocell (see Figure 3).

Each macrocell can support combinatorial or registered

inputs, preset and reset on a per macrocell ba sis and con-

figurable D, T registers, or latch function. If a macrocell

needs more product terms, it simply gets the additional

product terms from the PLA array.

Figure 1: Xilinx XPL A3 CPL D Architecture

LOGIC

BLOCK LOGIC

BLOCK

I/O

MC0

MC1

MC15

I/O

MC0

MC1

MC15

LOGIC

BLOCK LOGIC

BLOCK

I/O

MC0

MC1

MC15

I/O

MC0

MC1

MC15

LOGIC

BLOCK LOGIC

BLOCK

I/O

MC0

MC1

MC15

I/O

MC0

MC1

MC15

LOGIC

BLOCK LOGIC

BLOCK

I/O

MC0

MC1

MC15

I/O

MC0

MC1

MC15

ds012_01_121399

ZIA

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Figure 2: Xilinx XPL A3 Logic B lock Architecture

Foldback NAND

(PT[8:15])

(PT[0:47])

(PT0)

(PT7)

(PT[32:47])

(PT16)

(PT[0:47])

(PT31)

To Local Control Term (LCT0)

To Universal Control Term (UCT) Mux

To Local Control Term (LCT7)

P-term Clocks

Product

Term

Array

36 x 48

ZIA

VFM

Macrocell 0

DQI/O0

ZIA

DQI/O15

ZIA 2

VFM

Macrocell 15

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FoldBack NANDs

XPLA3 utilizes FoldBack NANDs to increase the effective

product term width of a programmable logic device. These

structures effectiv ely provide an i nverted product term to be

used as a logic input by all of the local product terms. Refer

to Figure 4 for an example of this technique. .

As seen in Figure 4, the output signal is determined by the

following equation:

MC logic = PT1 # PT2 # PT3 # (PT4) &(A # B # C)

Macrocell Architecture

Figure 5 shows the architecture of the macrocell used in

the CoolRunner XPLA3. Any macrocell c an be reset or pre-

set on power-up. Each macrocell register can be config-

ured as a D-, T-, or Latch-type flip-flop, or combinatorial

logic function. Each of these flip-flops can be clocked from

any one of eight sources. There are two global synchro-

nous clocks that are derived from the four external clock

pins. There is one universal clock signal. The clock input

signals CT[4:7] (Local Control Terms) can be individually

configured as either a PRODUCT term or SUM term equa-

tion created from the 36 signals available inside the logic

block..

There are two feedback paths to the ZIA: one from the

macrocell, and one from the I/O pin. When the I/O pin is

used as an output, the output buffer is enabled, and the

macrocell feedback path can be used to feed back the logic

implemented in the macrocell. When an I/O pin is used as

an input, the output buffer will be 3-stated and the input s ig-

nal will be fed into the ZIA via the I/O feedback path. The

logic implemented in th e buried macrocell can be fed back

to the ZIA via the macrocell feedback path.

If the macrocell is configured as an input, ther e is a path to

the register to provide a fast input setup time.

Figure 3: Variable Function M ultiplexer

From PLA OR Term

To Combinatorial Path

and Register Input

From P-term

ds012_03_121699

Figure 4: Basic FoldBack NAND Structure

A # B # C

!A & !B & !C

PT3

PT2

PT1

PT4

To MC

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I/O Cell

The OE (Output Enable) multiplexer has eight possible

modes (Figure 6), including a programmable w eak pull- up

(WPU) eliminating the need for external termination on

unused I/Os.

The I/O Cell is 5V tolerant, and has a single-bit slew-rate

control for reducing EMI generation.

Outputs are 3.3V PCI electrical specification compatible

(no internal clamp diode).

Figure 5: XPLA3 Macrocell Ar chitecture

Global CLK

Universal CLK

P-term CLK

CT [4:7]

ds012_05_122299

Universal PST

CT [0:5]

Universal RST

CT [0:5]

To ZIA

To I/O

PAD

Note: Global CLK signals come from pins.

To ZIA

VFM

RST

PST

D/T/L

CLKEn

CT4

P-term

PLA OR Term

From PT Array

Figure 6: I/O Cell

GND (Weak P.U.)

VCC

Universal OE

GND

OE [2:0]

To Macrocell / ZIA

From Macrocell I/O Pin

Slew

Control

Decode

I/O Pin

State

3-State

Function CT0

Function CT1

Function CT2

Function CT6

Universal OE

Enable

Weak P.U.

ds012_06_121699

Weak Pull-up

OE = 7

VCC

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Simple Timing Model

Figure 7 shows the XPLA3 timing model which has three

main timing parameters, including TPD, TSU, and TCO. In

other architectures, the user may be able to fit the design

into the CPLD, but may not be sure whether system timing

requirements can be met until after the design has been fit

into the device. This is because the timing models of othe r

architectures are very complex and include such things as

timing dependencies on the number of parallel expanders

borrowed, sharable expanders, varying num ber of X and Y

routing channels used, etc. In the XPLA3 architecture, the

user knows up front whether the design will meet system

timing requirements. This is due to the simplicity of the tim-

ing model.

Slew Rate Control

XPLA3 devices have slew rate control for each macrocell

output pin. The user has the option to enable the slew rate

control to reduce EMI. The nominal delay for using this

option is 2.0 ns.

Figure 7: XP LA3 Timing Model

Clock Pin

Output Pin

Feedback to ZIA

ds012_07_030300

Input Pin

or Feedback

Input Pin

Using Combinatorial Logic:

Using Register Logic:

Clock Pin

Using Macrocell Register

as Input Register:

TPD

TSUF T

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JTA G Testing Capability

JTAG is the commonly used acronym for the Boundary

Scan Test (BST) feature defined for integrated circuits by

IEEE Standard 1149.1. This standard defines input/output

pins, logic control functions, and commands that facilitate

both board and device level testing without the use of spe-

cialized test equipment. XPLA3 devices use the JTAG

Interface for In-System Programming/Reprogramming.

The full JTAG com mand set is implemented ( see Table 1),

including the use of a port enable signal.

As implemented in XPLA3, the JTAG Por t includes four of

the five pins (refer to Table 2) described in the JTAG speci-

fication: TCK , TM S, TDI, and TDO. The fifth signal defined

by the JTAG specification is TRST (Test Reset). TRST is

considered an optional signal, since it is not actually

required to perform BST or ISP. The XPLA3 saves an I/O

pin for general purpose use by not implementing the

optional TRST signal in the JTAG interface. Instead, the

XPLA3 supports the test reset functionality through the use

of its power-up reset circuit, which is included in all Cool-

Runner CPLDs. It should be noted that the pins associated

with the JTAG Port should connect to an external pull-up

resistor (typical 10K) to keep the JT A G signals from floating

when they are not being used.

The Port Enable pin is used to reclaim TMS, TDO, TDI, and

TCK for JTAG ISP programming if the user has defined

these pins as ge neral pur pose I/O during d evice program-

ming. For ease of use, XPLA3 devices are shipped with

the JTAG port pins enabled. Please note that the Port

Enable pin must be low logic level during the power-up

sequence for the device to operate properly.

During device programming, the JTAG ISP pins can be left

as is or reconfigured as user specific I/O pins. If the JTA G

ISP pins have been used for I/O pins, simply applying high

logic level to the Port Enable pin converts the JTAG ISP

pins back to their respective programming function and the

device can be reprogrammed. After completing the desired

JTAG ISP programming function, simply r eturn Port Enable

to Ground. This w ill re-establish the JTAG ISP pins to their

respective I/O function. Note that reconfiguring the JTAG

port pins as I/Os makes these pins non-JTAG ISP func-

tional.

The XPLA3 family allows the macrocells associated with

these pins to be used as buried logic when the JTAG/ISP

function is enabled.

Table 1: XPLA3 Low-level JTAG Boundary-scan Commands

Instruction

(Instruction Code )

Sample/Preload

(00010)

Boundary-scan Register

The mandatory Sample/Preload inst ruction allows a snapshot of the normal operation

of the component to be taken and examined. It also allows data values to be loaded

into the latched parallel outputs of the Boundary-scan Shift Register prior to selection

of the other boundary-scan test instructions.

Extest

(00000)

Boundary-scan Register

The mandatory Extest instruction allows testing of off-chip circuitry and board level

interconnections. Data would typically be loaded onto the latched parallel outputs of

Boundary-scan Shift Register using the Sample/Preload instruction prior to selection

of the Extest in struction.

Bypass

(11111)

Bypass Register

Places the 1-bit bypass regis ter between the TDI and TDO pins, which allows the BST

data to pass synchronously through the selected device to adjacent devices during

normal device operation. The Bypass instruction can be entered by holding TDI at a

constant high value and completing an Instruction-scan cycle.

Idcode

(00001)

Boundary-scan Register

Selects the Idcode register and places it between TDI and TD O, allowing the Idcode

to be serially shifted out of TDO . The Idcode instruction permits blind interrogation of

the components assembled onto a printed circuit board. Thus, in circumstances where

the component population may vary, it is possible to determine what components exist

in a product.

High-Z

(00101)

Bypass Register

The High-Z instruction places the component in a state which all of its system logic

outputs are placed in an inactive drive state (e.g., high impedance). In this state, an

in-circuit test system may dr ive signals onto the connections normally driven by a

component output without incurring the risk of damage to the component. The High-Z

instruction also forces the Bypass Register between TDI and TDO

Intest

(00011)

Boundary-scan Register

The Intest instructi on selects the boundary sc an r egister pr eparatory to applyi ng tests

to the logic core of the device. This permits testing of on-chip system logic while the

component is already on the board

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3V, In-System Programming (ISP)

ISP is the ability to reconfigure the logic and functionality of

a device, printed cir cuit boar d, or complete electronic sys-

tem before, during, and after its manufacture and shipment

to the end customer. ISP provides substantial benefits in

each of the following areas:

•Design

- Faster time-to-ma rket

- Debug partitioning and simplified prototyping

- Printed circuit board reconfiguration during debug

- Better device and board level testing

•Manufacturing

- Multi-functional hardware

- Reconfigurability for Test

- Eliminates handling of "fine lead-pitch" components

for programming

•Field Support

- Easy remote upgrades and repair

- Support for field configuration, reconfiguration, and

customization

XPLA3 allows for 3V, in-system programming/reprogram-

ming of its EEPR OM cells via a JTAG interface. An on-chip

charge pump eliminates the need for externally provided

super-voltages. This allows programming on the circuit

board using only the 3V supply required by the device for

normal operation. The ISP commands implemented in

XPLA3 are specified in Table 3.

Table 2: JTAG Pin Description

Pin Name Description

TCK Test Clock Input Clock pin to shift th e serial data and instructions in and out of the

TDI and TDO pins, respectively.

TMS Test Mode Select Serial input pin selects the JTAG instr uction mode. TMS should be

driven high during user mode operation.

TDI Test Data Input Serial input pin for instructions and test data. Data is shifted in on

the rising edge of TCK.

TDO Test Data Output Serial output pin for instructions and test data. Data is shifted out on

the falling edge of TCK. The signal is 3-stated if data is not being

shifted out of the device.

Table 3: Low -level ISP Commands

Instruction

(Register Used) Instructio n Code Description

Enable

(ISP Shift Register) 01001 Enables the Erase, Program, and Verify commands. Using the

Enable instruction before the Erase, Program, and Ver ify

instructions allows the user to specify the outputs of the devi ce

using the JTAG Boundary-Scan Sample/Preload command.

Erase

(ISP Shift Register) 01010 Erases the entire EEPROM array. User can define the outputs

during this operation by using the JTAG Sample/Preload

command.

Program

(ISP Shift Register) 01011 Programs the data in the ISP Shift Register into the addressed

EEP ROM row. The outputs can be defined by using the JTAG

Sample/Preload command.

Disable

(ISP Shift Register) 10000 Disable instruction all ows the us er to leave ISP mode. It selects

the ISP register to be di rectly connected between TDO and TDI.

Verify

(ISP Shift Register) 01100 Transfers the data from the addressed row to the ISP Shift

the JEDE C file. The user can define the outputs during this

operation.

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Terminations

The CoolRunner XPLA3 CPLDs are TotalCMOS devices.

As with other CMOS devices, it is important to consider

how to properly termi nate unused inputs and I/O pins when

fabricating a PC board. Allowing unused inputs and I/O

pins to float can cause the voltage to be in the linear region

of the CMOS input structures, which can increase the

power consumption of the dev ice. The XPLA3 C PLDs have

programmable on-chip weak pull-up resistors on each I/O

pin. These resistors are automatically activated by fitter

software for all unused I/O pins. Note that an I/O macrocell

used as buried logic that does not have the I/O pi n used for

input is considered to be unused, and the weak pull-up

resistors will be turned on. It is recommended that any

unused I/O pins on the XPLA3 family of CPLDs be left

unconnected. As with all CMOS devices, do not allow

inputs to float.

JTAG and ISP Interfacing

A number of industry-established methods exist for

JTAG/ISP interfacing with CPLDs and other integrated

circuits. The XPLA3 family supports the following methods:

•Xilinx HW 130

•PC Pa rallel Port

•Wor kstation or PC Serial Port

•Embedded Processor

•Automated Test Equipment

•Third Party Programmers

•Xilinx ISP P rogramming Tools

For more details on JTAG and ISP, refer to the related

application note: JTAG and ISP in Xilinx CPLDs. see also

Table 4 below:

Table 4: P rogramming Specifications

Symbol Parameter Min. Max. Unit

DC Parameters

VCCP VCC supply program/verify 3.0 (com) 3.6 V

2.7 (ind)

ICCP ICC limit program/verify 80 mA

VIH Input voltage (High) 2.0 V

VIL Input voltage (Low) 0.8 V

VOL Output voltage (Low) 0.4 V

VOH Output voltage (High) 2.4 V

AC Parameters

FMAX TCK maximum frequency 10 MHz

PWE Pulse width erase 100 ms

PWP Pulse width program 10 ms

PWV Pulse width verify 10 µs

TINIT Initialization time 50 µs

TMS_SU TMS setup time before TCK ↑10 ns

TDI_SU TDI setup time b e fore TCK ↑10 ns

TMS_H TMS hold time after TCK ↑20 ns

TDI_H TDI hold time after TCK ↑20 ns

TDO_CO TDO v a lid after TCK ↓30 ns

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Absolute Maximum Ratings(1)

Recommended Operation Conditions

Quality and Reliability Characteristics

Device Families

Symbol Parameter Min. Max. Unit

VCC Supply voltage(2) relative to GN D –0.5 3.6 V

VIInput voltage(3) relative to GND –0.5 5.5 V

IOUT O utput current –100 100 mA

TJMaximum junction temp erature –40 150 °C

TSTR Storage temperature –65 150 °C

Notes:

1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation

at these or any othe r con dition above those ind icat ed i n the oper ational and pr ogr ammin g specificati on is not impl ie d.

2. The chi p suppl y volt age m ust rise mon oto nical l y.

3. Maximum DC undershoot below GND must be limited to either 0.5V or 10 mA, whichever is ea sier to achieve. During trans itions, the

de vice pins may unde rsh oot to –2.0V or over shoot t o 7.0V, p rov id ed th is over- or under shoot last s le ss th an 10 ns a nd w i t h t he forc ing

curr ent bei ng limited t o 200 m A.

4. External I/O voltage may not be applied for more than 100 milliseconds without the presence of VCC.

Symbol Parameter Test Conditions Min. Max. Unit

VCC Supply voltage f Commercial TA = 0°C to 70°C3.03.6V

Industrial TA = –40°C to +85°C2.73.6V

VIL Low-level input voltage 0 0.8 V

VIH High-level input voltage 2.0 5.5 V

VOOutput voltage 0 VCC V

TRInput rise time 20 ns

TFInput fall time 20 ns

Symbol Parameter Min Max Units

TDR Data retention 20 - Years

NPE Program/Erase Cycles (Endurance) 1,000 - Cycles

VESD Electrostatic Discharge (ES D) 2,000 - Volts

Parameter XCR3032XL XCR3064XL XCR3128XL XCR3256XL XCR3384XL

Macrocells 32 64 128 256 384

Usable gates 750 1,500 3,000 6,000 9,000

Registers 32 64 128 256 384

I/Os 32 64 104 160 216

TPD (ns) 5.0 6.0 6.0 7.5 7.5

TSUF (ns) TBD T BD TBD 2.0 TBD

TCO (ns) 4.0 4.0 4.5 4.5 5.0

FSYS TEM (MHz) 200 167 167 140 TBD

Preliminary Inform ation

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Avai lable Packages

Revision Table

http://www.xilinx.com/legal.htm. All oth er trad em ar ks and registered trademarks are th e pro perty of thei r respectiv e ow ner s.

Package Type XCR3032XL XCR3064XL XCR3128XL XCR3256XL XCR3384XL

CS280 160 I/O 216 I/O

PQ208 160 I/O

TQ144 104 I/O 116 I/O

CS144 104 I/O

VQ 100 64 I/O 80 I/O

CP56 44 I/O

CS48 32 I/O 32 I/O(1)

VQ 44 32 I/O 32 I/O Preliminary Information

Note:

1. Future package.

Date Version # Revision

01/20/2000 1.0 Initial Xilinx release.

03/03/00 1.1 Minor update.