IRF9540NS/L
HEXFET® Power MOSFET
lAdvanced Process Technology
lSurface Mount (IRF9540NS)
lLow-profile through-hole (IRF9540NL)
l175°C Operating Temperature
lFast Switching
lP-Channel
lFully Avalanche Rated
03/11/03
S
D
G
Absolute Maximum Ratings
Fifth Generation HEXFETs from International Rectifier utilize
advanced processing techniques to achieve extremely low
on-resistance per silicon area. This benefit, combined with
the fast switching speed and ruggedized device design that
HEXFET Power MOSFETs are well known for, provides the
designer with an extremely efficient and reliable device for
use in a wide variety of applications.
The D2Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the highest
power capability and the lowest possible on-resistance in
any existing surface mount package. The D2Pak is suitable
for high current applications because of its low internal
connection resistance and can dissipate up to 2.0W in a
typical surface mount application.
The through-hole version (IRF9540L) is available for low-
profile applications.
Description
VDSS = -100V
RDS(on) = 0.117
ID = -23A
2
D Pak
TO-262
Parameter Typ. Max. Units
RθJC Junction-to-Case  1.1
RθJA Junction-to-Ambient ( PCB Mounted,steady-state)** 40
Thermal Resistance
°C/W
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ -10V-23
ID @ TC = 100°C Continuous Drain Current, VGS @ -10V-16 A
IDM Pulsed Drain Current  -76
PD @TA = 25°C Power Dissipation 3.8 W
PD @TC = 25°C Power Dissipation 140 W
Linear Derating Factor 0.91 W/°C
VGS Gate-to-Source Voltage ± 20 V
EAS Single Pulse Avalanche Energy 430 mJ
IAR Avalanche Current-11 A
EAR Repetitive Avalanche Energy14 mJ
dv/dt Peak Diode Recovery dv/dt  -5.0 V/ns
TJOperating Junction and -55 to + 175
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
PD - 91483E
IRF9540NS/L
Starting TJ = 25°C, L = 7.1mH
RG = 25, IAS = -11A. (See Figure 12)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Notes:
** When mounted on 1" square PCB (FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
ISD -11A, di/dt -470A/µs, VDD V(BR)DSS,
TJ 175°C
Pulse width 300µs; duty cycle 2%.
Uses IRF9540N data and test conditions
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -100   V VGS = 0V, ID = -250µA
V(BR)DSS/TJBreakdown Voltage Temp. Coefficient  -0.11  V/°C Reference to 25°C, ID = -1mA
RDS(on) Static Drain-to-Source On-Resistance   0.117 VGS = -10V, ID = -11A
VGS(th) Gate Threshold Voltage -2.0  -4.0 V VDS = VGS, ID = -250µA
gfs Forward Transconductance 5.3   S VDS = -50V, ID = -11A
  -25 µA VDS = -100V, VGS = 0V
  -250 VDS = -80V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage   100 VGS = 20V
Gate-to-Source Reverse Leakage   -100 nA VGS = -20V
QgTotal Gate Charge   97 ID = -11A
Qgs Gate-to-Source Charge   15 nC VDS = -80V
Qgd Gate-to-Drain ("Miller") Charge   51 VGS = -10V, See Fig. 6 and 13 
td(on) Turn-On Delay Time  15  VDD = -50V
trRise Time  67  ID = -11A
td(off) Turn-Off Delay Time  51  RG = 5.1
tfFall Time  51  RD = 4.2Ω, See Fig. 10
Between lead,
  and center of die contact
Ciss Input Capacitance  1300  VGS = 0V
Coss Output Capacitance  400  pF VDS = -25V
Crss Reverse Transfer Capacitance  240   = 1.0MHz, See Fig. 5
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
IGSS
ns
IDSS Drain-to-Source Leakage Current
nH
7.5
LSInternal Source Inductance
Parameter Min. Typ. Max. Units Conditions
I
SContinuous Source Current MOSFET symbol
(Body Diode)   showing the
ISM Pulsed Source Current integral reverse
(Body Diode)   p-n junction diode.
VSD Diode Forward Voltage   -1.6 V TJ = 25°C, IS = -11A, VGS = 0V
trr Reverse Recovery Time  150 220 ns TJ = 25°C, IF = -11A
Qrr Reverse Recovery Charge  830 1200 nC di/dt = -100A/µs 
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
A
S
D
G
-23
-76
IRF9540NS/L
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
0.1 1 10 100
D
DS
20µs PU LSE WIDTH
T = 25°C
c
A
-I , Drain-to-Source Current (A )
-V , Drain-to-Source Voltage (V)
VGS
TOP - 15V
- 1 0 V
- 8 .0 V
- 7 .0 V
- 6 .0 V
- 5 .5 V
- 5 .0 V
BOTTOM - 4.5V
-4.5V
1
10
100
0.1 1 10 100
D
DS
A
-I , Drain-to-Source Cu rrent (A)
-V , Drain-to-Source Voltage (V)
VGS
TOP - 15V
- 1 0 V
- 8 .0 V
- 7 .0 V
- 6 .0 V
- 5 .5 V
- 5 .0 V
BOTTOM - 4.5V
-4.5V
20µs PULS E WIDT H
T = 175°C
C
0.1
1
10
100
45678910
T = 25°C
J
GS
D
A
-I , Drain-to-Sou rce Current (A)
-V , Gate-to-Sour ce Vol tage (V)
V = -25V
20µs PULSE WIDTH
DS
T = 175° C
J
0.0
0.5
1.0
1.5
2.0
2.5
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
J
T , Junction Temperature (°C)
R , Drain-to-Source On Resi stance
DS(on)
(Normalized)
A
V = -10V
GS
I = -19A
D
IRF9540NS/L
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
0
500
1000
1500
2000
2500
3000
1 10 100
C , Capac it ance (pF)
A
DS
-V , Drain-to-Sou rce Vo ltag e (V)
V = 0V, f = 1MHz
C = C + C , C SHORTED
C = C
C = C + C
GS
iss gs gd ds
rss gd
oss ds gd
C
iss
C
oss
C
rss
0
4
8
12
16
20
0 20406080100
G
GS
A
-V , Gate-to-S ource Voltage (V)
Q , Total Gate Cha rge (nC)
V = -80V
V = -50 V
V = -20 V
DS
DS
DS
FOR TEST CIRCUIT
SEE FIGURE 13
I = - 1 1A
D
0.1
1
10
100
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
T = 25°C
J
V = 0V
GS
SD
SD
A
-I , Re verse Dr ain Cu rrent (A)
-V , Source-to-Drain Voltag e (V)
T = 17 C
J
1
10
100
1000
1 10 100 1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
10ms
A
-I , Drain Current (A )
-V , Drain-to-Source Voltage (V)
DS
D
100µs
1ms
T = 25°C
T = 175°C
Single Pulse
C
J
IRF9540NS/L
Fig 10a. Switching Time Test Circuit
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current Vs.
Case Temperature
VDS
-10V
Pulse Width 1 µs
Duty Factor ≤ 0.1 %
RD
VGS
VDD
RG
D.U.T.
+
-
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f
25 50 75 100 125 150 175
0
5
10
15
20
25
T , Case Temperature ( C)
I , Drain Current (A)
°
C
D
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1
Notes:
1. D u ty fa c to r D = t / t
2. Peak T =P x Z + T
1 2
JDM thJC C
P
t
t
DM
1
2
t , R ectangular Pulse Dura t ion (sec)
Thermal Response (Z )
1
thJC
0.01
0.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE
(THERMAL RESPONSE)
IRF9540NS/L
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
QG
QGS QGD
VG
Charge
-10V
D.U.T. VDS
ID
IG
-3mA
VGS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tpV
BR
DSS
I
AS
R
G
I
AS
0.01
t
p
D.U.T
L
V
DS
V
DD
DRIVER
A
15V
-20V
0
200
400
600
800
1000
1200
25 50 75 100 125 150 175
J
E , Single Puls e Avalanche Energy (mJ)
AS
A
Starting T , Junction Temperature (°C)
I
TOP -4.7A
-8.1A
BOTTOM -11A
D
IRF9540NS/L
Peak Diode Recovery dv/dt Test Circuit
P.W. Period
di/dt
Diode Recovery
dv/dt
Ripple 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D = P.W.
Period
+
-
+
+
+
-
-
-
RG
VDD
dv/dt controlled by RG
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
D.U.T*Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
* Reverse Polarity of D.U.T for P-Channel
VGS
[ ]
[ ]
*** VGS = 5.0V for Logic Level and 3V Drive Devices
[ ] ***
Fig 14. For P-Channel HEXFETS
IRF9540NS/L
D2Pak Package Outline
D2Pak Part Marking Information
F530S
THIS IS A
N IRF530S WITH
LO
T C
ODE 8024
A
SSEM
BLED O
N WW
02, 2000
IN THE A
SSEMBLY LINE "L"
A
SSEM
BLY
LO
T C
ODE
INTERNA
TIO
NA
L
REC
TIFIER
LO
G
O
PA
RT NUM
BER
DA
TE C
O
DE
YEA
R 0 = 2000
W
EEK 02
LINE L
IRF9540NS/L
TO-262 Part Marking Information
TO-262 Package Outline
EXA
M
PLE:THIS IS A
N IRL3103L
LOT C
O
DE 1789
A
SSEM
BLY
PA
RT NUMBER
DA
TE C
ODE
W
EEK 19
LINE C
LO
T C
ODE
YEA
R 7 = 1997
A
SSEM
BLED O
N WW
19, 1997
IN THE A
SSEM
BLY LINE "C
"LOG
O
REC
TIFIER
INTERNA
TIONA
L
IRF9540NS/L
D2Pak Tape & Reel Information
3
4
4
TRR
FEE D DIRECTION
1.85 (.073)
1.65 (.065)
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
TRL
FEE D DIRECTION
10. 90 ( .429)
10. 70 ( .421) 16.10 (.634)
15.90 (.626)
1.75 (.069)
1.25 (.049)
11.60 (.457)
11.40 (.449) 15.42 (.609)
15.22 (.601)
4.72 (.136)
4.52 (.178)
24.30 (.957)
23.90 (.941)
0.368 (.0145)
0.342 (.0135)
1.60 (. 063 )
1.50 (. 059 )
13.50 (.532)
12.80 (.504)
330.00
(14.173)
MAX.
27.40 (1.079)
23.90 (.941)
60.00 ( 2.3 62)
MIN.
30.40 (1.197)
MAX.
26.4 0 (1 .0 39 )
24.40 (.961)
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENS IO N: MILLIMET ER .
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE D ISTOR TION @ OUTER EDGE.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.03/03
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/