TL/F/5977
CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate
CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate
February 1988
CD4071BM/CD4071BC
Quad 2-Input OR Buffered B Series Gate
CD4081BM/CD4081BC
Quad 2-Input AND Buffered B Series Gate
General Description
These quad gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-chan-
nel enhancement mode transistors. They have equal source
and sink current capabilities and conform to standard B se-
ries output drive. The devices also have buffered outputs
which improve transfer characteristics by providing very
high gain.
All inputs protected against static discharge with diodes to
VDD and VSS.
Features
YLow power TTL Fan out of 2 driving 74L
compatibility or 1 driving 74LS
Y5V–10V–15V parametric ratings
YSymmetrical output characteristics
YMaximum input leakage 1 mA at 15V over full tempera-
ture range
Connection Diagrams
CD4071B Dual-In-Line Package
TL/F/5977–3
Top View
CD4081B Dual-In-Line Package
TL/F/5977– 6
Top View
Order Number CD4071B or CD4081B
C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Voltage at Any Pin b0.5V to VDD a0.5V
Power Dissipation (PD)
Dual-In-Line 700 mW
Small Outline 500 mW
VDD Range b0.5 VDC to a18 VDC
Storage Temperature (TS)b65§Ctoa
150§C
Lead Temperature (TL)
(Soldering, 10 seconds) 260§C
Operating Conditions
Operating Range (VDD)3V
DC to 15 VDC
Operating Temperature Range (TA)
CD4071BM, CD4081BM b55§Ctoa
125§C
CD4071BC, CD4081BC b40§Ctoa
85§C
DC Electrical Characteristics CD4071BM/CD4081BM (Note 2)
Symbol Parameter Conditions b55§Ca25§Ca125§CUnits
Min Max Min Typ Max Min Max
IDD Quiescent Device VDD e5V 0.25 0.004 0.25 7.5 mA
Current VDD e10V 0.50 0.005 0.50 15 mA
VDD e15V 1.0 0.006 1.0 30 mA
VOL Low Level VDD e5V 0.05 0 0.05 0.05 V
Output Voltage VDD e10V
l
IO
l
k1mA 0.05 0 0.05 0.05 V
VDD e15V (0.05 0 0.05 0.05 V
VOH High Level VDD e5V 4.95 4.95 5 4.95 V
Output Voltage VDD e10V
l
IO
l
k1mA 9.95 9.95 10 9.95 V
VDD e15V (14.95 14.95 15 14.95 V
VIL Low Level VDD e5V, VOe0.5V 1.5 2 1.5 1.5 V
Input Voltage VDD e10V, VOe1.0V 3.0 4 3.0 3.0 V
VDD e15V, VOe1.5V 4.0 6 4.0 4.0 V
VIH High Level VDD e5V, VOe4.5V 3.5 3.5 3 3.5 V
Input Voltage VDD e10V, VOe9.0V 7.0 7.0 6 7.0 V
VDD e15V, VOe13.5V 11.0 11.0 9 11.0 V
IOL Low Level Output VDD e5V, VOe0.4V 0.64 0.51 0.88 0.36 mA
Current VDD e10V, VOe0.5V 1.6 1.3 2.25 0.9 mA
(Note 3) VDD e15V, VOe1.5V 4.2 3.4 8.8 2.4 mA
IOH High Level Output VDD e5V, VOe4.6V b0.64 b0.51 b0.88 b0.36 mA
Current VDD e10V, VOe9.5V b1.6 b1.3 b2.25 b0.9 mA
(Note 3) VDD e15V, VOe13.5V b4.2 b3.4 b8.8 b2.4 mA
IIN Input Current VDD e15V, VIN e0V b0.10 b10b5b0.10 b1.0 mA
VDD e15V, VIN e15V 0.10 10b50.10 1.0 mA
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: All voltages measured with respect to VSS unless otherwise specified.
Note 3: IOH and IOL are tested one output at a time.
2
DC Electrical Characteristics CD4071BC/CD4081BC (Note 2)
Symbol Parameter Conditions b40§Ca25§Ca85§CUnits
Min Max Min Typ Max Min Max
IDD Quiescent Device VDD e5V 1 0.004 1 7.5 mA
Current VDD e10V 2 0.005 2 15 mA
VDD e15V 4 0.006 4 30 mA
VOL Low Level VDD e5V 0.05 0 0.05 0.05 V
Output Voltage VDD e10V
l
IO
l
k1mA 0.05 0 0.05 0.05 V
VDD e15V (0.05 0 0.05 0.05 V
VOH High Level VDD e5V 4.95 4.95 5 4.95 V
Output Voltage VDD e10V
l
IO
l
k1mA 9.95 9.95 10 9.95 V
VDD e15V (14.95 14.95 15 14.95 V
VIL Low Level VDD e5V, VOe0.5V 1.5 2 1.5 1.5 V
Input Voltage VDD e10V, VOe1.0V 3.0 4 3.0 3.0 V
VDD e15V, VOe1.5V 4.0 6 4.0 4.0 V
VIH High Level VDD e5V, VOe4.5V 3.5 3.5 3 3.5 V
Input Voltage VDD e10V, VOe9.0V 7.0 7.0 6 7.0 V
VDD e15V, VOe13.5V 11.0 11.0 9 11.0 V
IOL Low Level Output VDD e5V, VOe0.4V 0.52 0.44 0.88 0.36 mA
Current VDD e10V, VOe0.5V 1.3 1.1 2.25 0.9 mA
(Note 3) VDD e15V, VOe1.5V 3.6 3.0 8.8 2.4 mA
IOH High Level Output VDD e5V, VOe4.6V b0.52 b0.44 b0.88 b0.36 mA
Current VDD e10V, VOe9.5V b1.3 b1.1 b2.25 b0.9 mA
(Note 3) VDD e15V, VOe13.5V b3.6 b3.0 b8.8 b2.4 mA
IIN Input Current VDD e15V, VIN e0V b0.30 b10b5b0.30 b1.0 mA
VDD e15V, VIN e15V 0.30 10b50.30 1.0 mA
AC Electrical Characteristics*CD4071BC/CD4071BM
TAe25§C, Input tr;t
fe20 ns, CLe50 pF, RLe200 kX, Typical temperature coefficient is 0.3%/§C
Symbol Parameter Conditions Typ Max Units
tPHL Propagation Delay Time, VDD e5V 100 250 ns
High-to-Low Level VDD e10V 40 100 ns
VDD e15V 30 70 ns
tPLH Propagation Delay Time, VDD e5V 90 250 ns
Low-to-High Level VDD e10V 40 100 ns
VDD e15V 30 70 ns
tTHL,t
TLH Transition Time VDD e5V 90 200 ns
VDD e10V 50 100 ns
VDD e15V 40 80 ns
CIN Average Input Capacitance Any Input 5 7.5 pF
CPD Power Dissipation Capacity Any Gate 18 pF
*AC Parameters are guaranteed by DC correlated testing.
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: All voltages measured with respect to VSS unless otherwise specified.
Note 3: IOH and IOL are tested one output at a time.
3
AC Electrical Characteristics*CD4081BC/CD4081BM
TAe25§C, Input tr;t
fe20 ns, CLe50 pF, RLe200 kX, Typical temperature coefficient is 0.3%/§C
Symbol Parameter Conditions Typ Max Units
tPHL Propagation Delay Time, VDD e5V 100 250 ns
High-to-Low Level VDD e10V 40 100 ns
VDD e15V 30 70 ns
tPLH Propagation Delay Time, VDD e5V 120 250 ns
Low-to-High Level VDD e10V 50 100 ns
VDD e15V 35 70 ns
tTHL,t
TLH Transition Time VDD e5V 90 200 ns
VDD e10V 50 100 ns
VDD e15V 40 80 ns
CIN Average Input Capacitance Any Input 5 7.5 pF
CPD Power Dissipation Capacity Any Gate 18 pF
*AC Parameters are guaranteed by DC correlated testing.
Typical Performance Characteristics
TL/F/5977– 7
FIGURE 1. Typical Transfer
Characteristics
TL/F/5977– 8
FIGURE 2. Typical Transfer
Characteristics
TL/F/5977– 9
FIGURE 3. Typical Transfer
Characteristics
TL/F/5977– 10
FIGURE 4. Typical Transfer
Characteristics
TL/F/5977– 11
FIGURE 5
TL/F/5977– 12
FIGURE 6
4
Typical Performance Characteristics (Continued)
TL/F/5977– 13
FIGURE 7
TL/F/5977– 14
FIGURE 8
TL/F/5977– 15
FIGURE 9
TL/F/5977– 16
FIGURE 10 TL/F/5977– 17
FIGURE 11
TL/F/5977– 18
FIGURE 12
TL/F/5977– 19
FIGURE 13
TL/F/5977– 20
FIGURE 14
5
Schematic Diagrams
CD4071B
TL/F/5977– 1
TL/F/5977– 2
(/4 of device shown
JeAaB
Logical ‘‘1’’ eHigh
Logical ‘‘0’’ eLow
*All inputs protected by standard
CMOS protection circuit.
CD4081B
TL/F/5977– 4
TL/F/5977– 5
(/4 of device shown
JeA#B
Logical ‘‘1’’ eHigh
Logical ‘‘0’’ eLow
*All inputs protected by standard
CMOS protection circuit.
6
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number CD4071BMJ, CD4071BCJ
CD4081BMJ or CD4081BCJ
NS Package Number J14A
7
CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate
CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package (N)
Order Number CD4071BMN, CD4071BCN
CD4081BMN or CD4081BCN
NS Package Number N14A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant support device or system whose failure to perform can
into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life
failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.
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