Description
The A5303 is a low-current BiCMOS photoelectric smoke
detector circuit with ultra-low standby current and can operate
for 10 years powered by inexpensive batteries. This device can
be used with an infrared optical chamber to sense light scattered
from smoke particles. A networking capability allows units to
be interconnected so that if any unit senses smoke all units will
sound an alarm. Special features are incorporated in the design
to facilitate calibration and testing of the finished detector.
A variable-gain photoamplifier can be directly interfaced to
an infrared emitter-detector pair. The amplifier gain levels
are determined by two external capacitors and are internally
selected depending on the operating mode. Low gain is selected
during standby and timer modes. During a local alarm, this low
gain is increased (internally) by approximately 45% to provide
hysteresis. High gain is used during pushbutton test and to
periodically monitor the chamber sensitivity during standby.
The internal oscillator and timing circuitry minimize standby
power by sensing for smoke for only 100 μs once every 10 s.
A special three-stage-speedup sensing scheme is incorporated
to minimize the time to an audible alarm and also to reduce
false triggering. Chamber sensitivity is periodically monitored
and two consecutive cycles of degraded sensitivity are required
for a warning signal to occur.
The A5303 is supplied in a thin profile (<1.2 mm overall
height) 20-pin TSSOP package (0.65 mm nominal lead pitch).
The package is lead (Pb) free with 100% matte tin leadframe
plating.
5303-DS
Features and Benefits
Low average standby current allows 10-year battery life
2.3 to 5.5 V operating range
Interconnect option
Logic outputs to control an external sound IC
Low battery detection and warning
Chamber sensitivity test and warning
Triple horn-chirp to distinguish chamber warning
Power-on reset (POR)
Digital filter on I/O provides significant noise immunity
Timer (hush) mode for enabling reduced sensitivity period
Built-in circuits to reduce false triggering
ESD protection circuitry on all pins
Temporal Horn Pattern, per UL217, NFPA72, ISO8201
Latching alarm indicator identifies alarm-initiating devices
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
Package: 20-pin TSSOP (suffix LE)
Not to scale
A5303
Typical Application Diagram
Control
Logic
SOUT0
VDD
TEST
C1
56 nF
C2
5.6 nF
DETECT
Gain
Select
STROBE
IRED
V
DD
OSC
Timing
Low Batt
1.2 V
3 V
100 F
LED
VSS
560
200 k
10 F
V
DD
-
1.6 V
OSCCAP
1500 pf
Push-to-test
HUSH
Connect HUSH to
VSS to disable
timer mode
Connect to allow timer (hush) mode operation
ISET
LVSET
Low Batt
Sample
A
A
A resistor connected
between this pin and
VDD or VSS adjusts
the low-battery threshold
SOUT1 Voice IC outputs
10 100 k
SOUT2
TRES
I/O
220
To / from
other units
V
DD
V
DD
V
DD
BLINK
In standby, BLINK = VDD
causes LED to blink,
BLINK = VSS causes
LED not to blink
HORN
Output to optional
boost converter to
drive a piezo horn
Smoke
Chamber
Red LED
B
B
R1
R2
5 k
3 k
3
1 k
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
2
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Selection Guide
Part Number Pb-free and RoHS Package Packing
A5303SLE-T Yes 20-pin TSSOP (JEDEC MO-153AC) 75 pieces / tube
A5303SLETR-T Yes 20-pin TSSOP (JEDEC MO-153AC) 4000 pieces / reel
Absolute Maximum Ratings
Characteristic Symbol Notes Rating Units
Supply Voltage Range VDD Referenced to VSS –2.3 to 6 V
DC Input Voltage Range VIN Referenced to VSS –0.3 to 6 V
Operating Ambient Temperature Range TAAllegro Range S –20 to 85 ºC
Maximum Junction Temperature TJ(max) 150 ºC
Storage Temperature Range Tstg –55 to 150 ºC
Pin-out Diagram
Thermal Characteristics
Characteristic Symbol Test Conditions* Value Units
Package Thermal Resistance RJA Estimated, single-layer PCB, minimal exposed copper area 127 ºC/W
*Additional thermal information available on Allegro website.
Terminal List
Number Name Function
1 SOUT1 Logic push-pull output for controlling an external sound IC
2 SOUT0 Logic push-pull output for controlling an external sound IC
3 I/O Input-output to interconnected detectors
4 BLINK Logic input for enabling/disabling the LED blink during standby
5 HUSH Input for photoamplifier timer mode reference; can also disable timer mode
6 ISET A resistor on this pin connected to VSS sets the IRED output current
7 VDD Positive supply voltage
8 IRED Terminal to drive smoke chamber IR LED
9 STROBE Strobed supply (VDD – 2 V) for photoamplifier low-side reference
10 DETECT Photoamplifier input
11 C2 Sets photoamplifier gain in standby mode
12 C1 Sets photoamplifier gain in supervisory mode
13 LVSET Optionally used with a resistor to adjust the low-battery threshold
14 TRES Connection for resistor to set clock times/frequency
15 VSS Negative supply voltage
16 OSC CAP Connection for capacitor and resistor to set clock times/frequency
17 TEST Enables push-to-test mode; starts timer mode, if enabled
18 HORN Logic output which optionally enables a boost converter to drive a horn
19 LED Output to drive visible LED
20 SOUT2 Logic push-pull output for controlling an external sound IC
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
SOUT1
SOUT0
I/O
BLINK
HUSH
ISET
VDD
IRED
STROBE
DETECT
SOUT2
LED
HORN
TEST
OSC CAP
VSS
TRES
LVSET
C1
C2
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
3
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
DC ELECTRICAL CHARACTERISTICS1 Valid at TA = 25°C, VDD = 2.3 to 5.5 V, configured as in Typical Application Diagram
(unless otherwise noted)
Characteristics Symbol Test Conditions Min. Typ.2Max. Unit
Supply Voltage Range VDD Operating 2.3 3.0 5.5 V
Operating Supply Current IDD
During standby, STROBE off 2.3 5.0 A
During STROBE on, IRED off 210 300 A
During STROBE on, IRED on 220 300 A
Input Current IIN
BLINK, C1, C2, DETECT, OSC CAP, TRES
(pulldown off) –100 0 100 nA
TEST Pulldown Current IIN(TEST) VTEST = VDD = 3 V 3.5 A
Logic Voltage Low VI(L) ––
VDD ×
0.3 V
Logic Voltage High VI(H)
VDD ×
0.7 –– V
Strobe Output Voltage VST
Inactive – VDD –V
Active, IO = 100 to 500 A VDD
2.1
VDD
2.0
VDD
1.9 V
Line Regulation VST(VDD) Active, VDD = 2.3 to 5.5 V –60 dB
Strobe Temperature Coefficient ST VSTROBE, VDD = 2.3 to 5.5 V 0.01 % / °C
Maximum IRED Current Setting IIRED(MAX)
Current is set by selection of resistor on ISET
pin 300 mA
IRED Current IIRED RISET = 3 89 100 111 mA
IRED Temperature Coefficient IRED IIRED, VDD = 2.3 to 5.5 V 0.40 % / °C
LED Drive Current ILED VLED = 0.5 V 0.6 1.2 1.8 mA
Low-Battery Warning Threshold VDD(th) LVSET open 2.4 2.5 2.6 V
Low-Battery Warning Minimum VDD(warn) VDD voltage guaranteed to operate SOUTx pins 1.8 V
Common Mode Voltage VIC Photoamplifier input VDD
1.0 VDD
0.3 V
Smoke Comparator Reference Voltage VREF Any alarm condition, except hush mode VDD
1.6 –V
I/O Input Impedance ZI/O(in) No alarm conditions 40 83 k
I/O Output Impedance ZI/O(out) Local or test alarm 3.9 5.7 k
1Limits over the operating temperature range are based on characterization data. Characteristics are production tested at 25°C only.
2Typical values are at 25°C and are given for circuit design information only.
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
4
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Continued on the next page…
AC ELECTRICAL CHARACTERISTICS1 Valid at TA = 25°C, VDD = 2.3 to 5.5 V, configured as in Typical Application Diagram
(unless otherwise noted)
Characteristics Symbol Test Conditions OSC
Count Min. Typ.2Max. Unit
Oscillator Period tosc 1 9.4 10.5 11.5 ms
Smoke Check tsmoke 210 9.6 10.75 11.9 s
Low Battery Test tbattery No low-battery detected 218 41.3 45.9 50.5 min
tbattery2 Low-battery detected 212 39 43 48 s
Degraded Chamber Test tchamber No degraded chamber detected 218 41.3 45.9 50.5 min
tchamber2 Degraded chamber detected 212 39 43 48 s
LED Pulse Period
tled0 No local or remote smoke, BLINK = VSS
No
LED
Pulses
––
tled1 No local or remote smoke, BLINK = VDD 212 39 43 48 s
tled3 Local smoke 48 0.45 0.50 0.55 s
tled4 Remote smoke only
No
LED
Pulses
––
tled6 Pushbutton test, induced alarm 48 0.45 0.50 0.55 s
tled7 Timer mode, no alarm 210 9.67 10.75 11.83 s
LED Pulse Width tw(led) 1 9.5 10.5 11.5 ms
LED Pulse Spacing tsp(led) 3 pulses, degraded chamber 260.60 0.67 0.74 s
STROBE Pulse Period
tst1 No local or remote smoke 210 9.6 10.75 11.9 s
tst2 After 1 of 3 valid samples 192 1.8 2.0 2.2 s
tst3 After 2 of 3 valid samples and during local alarm 96 0.8 1.0 1.1 s
tst4 Remote smoke only 768 7.2 8.0 8.9 s
tst5 Chamber test, no local alarm 218 41.3 45.9 50.5 min
tst6 Pushbutton test, induced alarm 24 225 252 278 ms
STROBE Pulse Width tw(st) 1 9.5 10.5 11.5 ms
IRED Pulse Period
tired1 No local or remote smoke 210 9.6 10.75 11.9 s
tired2 After 1 of 3 valid samples 192 1.8 2.0 2.2 s
tired3 After 2 of 3 valid samples and during local alarm 96 0.8 1.0 1.1 s
tired4 Remote smoke only 768 7.2 8.0 8.9 s
tired5 Chamber test, no local alarm 218 41.3 45.9 50.5 min
tired6 Pushbutton test, induced alarm 24 225 252 278 ms
IRED Pulse Width tw(ired) 0.01 94 105 116 s
I/O to Active Delay td(io) Local alarm 0 s
I/O Charge Dump Duration tdump End of local alarm or test 96 0.9 1.0 1.1 s
Rising Edge on I/O to Alarm tr(io) No local alarm 9 to 13 9 ×
tosc
94.5 –
137
13 ×
tosc ms
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
5
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
SOUTx Output Warning Period tsoutx Low supply or degraded chamber 212 38.9 43 47.1 s
SOUTx Output Warning Pulse Width tw(soutx) Low supply or degraded chamber 1 9.5 10.5 11.5 ms
Horn Warning Pulse Period thorn Low battery or degraded chamber 212 38.9 43 47.1 s
Horn Warning Pulse Width tw(horn) Low battery or degraded chamber 1 9.5 10.5 11.5 ms
Horn Warning Pulse Spacing tsp(horn) 3 chirps, degraded chamber 260.60 0.67 0.74 s
Horn On-Time ton(horn) Local, remote, or test alarm 48 450 500 550 ms
Horn Off-Time
toff1(horn)
Local, remote, or test alarm (see Timing
Diagrams section) 48 450 500 550 ms
toff2(horn)
Local, remote, or test alarm (see Timing
Diagrams section) 144 1350 1500 1650 ms
Timer Mode Duration ttimer 57344 9.0 10.0 11.0 min
Failed Push-Test Indication on SOUTx tFAIL After TEST input goes low 211 to
3072
211 ×
tosc
21.5 –
32.3
3072 ×
tosc
s
1Limits over the operating temperature range are based on characterization data. Characteristics are production tested at 25°C only.
2Typical values are at 25°C and are given for circuit design information only.
AC ELECTRICAL CHARACTERISTICS (continued)1 Valid at TA = 25°C, VDD = 2.3 to 5.5 V, configured as in Typical Application
Diagram (unless otherwise noted)
Characteristics Symbol Test Conditions OSC
Count Min. Typ.2Max. Unit
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
6
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Pin and Circuit Description
(In Typical Application)
C1 Pin
A capacitor connected to this pin determines the gain of the
photoamplifier, Ae , during the push-to-test mode and during the
chamber monitor test. A typical capacitor value for this high-
gain (supervisory) mode is 0.047 μF, but it should be selected
based on the photochamber background reflections reaching the
detector and the required level of sensitivity. Ae = 1 + (C1
/ 12),
where C1 is in pF. Ae should not exceed 10,000 and thus C1
should not exceed 0.1 μF. Coupling of other signals to the C1,
C2, and DETECT inputs must be minimized.
C2 Pin
A capacitor connected to this pin determines the gain of the
photoamplifier, Ae, during standby. A typical capacitor value for
this low-gain mode is 4700 pF, but it should be selected based
on a specific photochamber and the desired level of sensitiv-
ity to smoke. Ae = 1 + (C2
/ 12), where C2 is in pF. Ae should not
exceed 10,000 and thus C2 should not exceed 0.1 μF. This gain
increases by a nominal 45% after a local alarm is detected (three
consecutive detections). A resistor must be installed in series
with the C2 capacitor.
DETECT Pin
This is the input to the photoamplifier and is connected to the
cathode of the photodiode. The photodiode is operated at zero
bias and should have low dark leakage current and low capaci-
tance. A shunt resistor must be installed in parallel with the
photodiode.
STROBE Pin
This output provides a strobed, regulated voltage of VDD – 2 V.
The minus side of all internal and external photoamplifier cir-
cuitry is referenced to this pin.
VDD Pin
This pin is connected to the positive supply potential,
typically 3 V.
LVSET Pin
This pin allows the user to externally adjust the low-battery
alarm threshold. To increase the threshold, a resistor can be con-
nected between LVSET and VDD. To decrease the threshold, a
resistor can be connected between LVSET and VSS.
IRED Pin
This output provides a pulsed drive current for the external IR
emitter. To minimize noise impact, the IRED is not active when
the visible LED output is active.
ISET Pin
This pin allows the user to externally set the IRED current by
connecting a resistor between it and VSS. The IRED current
controls the amount of light generated by the IR LED in the
chamber. The IRED current, in mA, can be approximated using
the following equation:
I
IRED (mA) = 300 / RISET (1)
The chosen resistor should set a maximum of 300 mA (typically
a minimum of 1Ω).
I/O Pin
A connection at this pin allows multiple smoke detectors to be
interconnected. If any single unit detects smoke, its I/O pin is
driven high, and all connected units will sound their associated
alarm indicators. As an input, this pin is sampled every 4 clock
cycles (nominally 43 ms) during standby, and two consecutive
samples and one additional clock with I/O high are required
before signaling an alarm. If the I/O line goes low at all during
the 96.8 ms, the remote alarm is not enabled, providing sig-
nificant immunity to I/O noise and other pulses on the I/O line
which are shorter than 9 clock cycles. The LED is suppressed
when an alarm is signaled from an interconnected unit, and
any local-alarm condition causes this pin to be ignored as an
input. An internal NMOS device acts as a charge dump to aid
in applications involving a large (distributed) capacitance, and
is activated at the end of a local or test alarm. This pin has an
on-chip pull-down device and must be left unconnected if not
used. In the application, there should be a series current-limiting
resistor to other smoke alarms.
SOUT0, SOUT1, SOUT2 Pins
These pins provide push-pull CMOS logic outputs to control an
external sound IC. The outputs indicate the state of the device as
follows:
Condition SOUT2 SOUT1 SOUT0
Standby L L L
Local Alarm L L H
Remote Alarm L H L
Push-Test Passed L H H
Push-Test Failed H L L
Low-Battery H L H
Degraded Chamber H H L
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
7
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
HORN Pin
The HORN pin is a logic output provided to enable an optional,
external boost converter that can drive a piezoelectric (piezo)
horn. Using a boost converter to drive a piezo horn allows alarms
to generate high SPL levels from low supply voltages. HORN will
be driven high to enable the boost converter. The output of the
boost converter will be connected to the piezo horn such that the
horn will sound when the converter is enabled. If a boost con-
verter and horn are not used, this pin should be left open.
BLINK Pin
This logic input determines the LED operation while the device is
in standby. If BLINK is connected to VDD the device will blink
once every approximately 43 s in standby. If BLINK is connected
to VSS the device will not blink in standby. If a low-battery or
degraded-chamber condition exists while the device is in standby,
the LED will blink as described in the Alarm Indications section,
regardless of the state of the BLINK pin. The BLINK pin has no
effect when the device is in local, remote, or test alarm.
LED Pin
This open-drain NMOS output is used to directly drive a visible
LED. The LED indicates detector status as follows (with compo-
nent values as in the typical application, all times nominal):
Condition Pulse Occurrence
Standby, BLINK = VDD Every 43.0 s
Standby, BLINK = VSS No LED pulses
Local Smoke Every 0.5 s
Remote Alarm No pulses
Test Mode Every 0.5 s
Timer (Hush) Mode Every 10.8 s
OSC CAP (Oscillator Capacitor) Pin
A capacitor between this pin and VDD, along with a parallel
resistor, forms part of a two-terminal oscillator and sets the inter-
nal clock low time. With component values shown, this nominal
time is 10.4 ms and essentially the oscillator period, which is also
the STROBE pulse width. The internal clock low time can be
calculated by:
T
low = 0.693 × ROSCCAP × COSCCAP (2)
TRES (Timing Resistor) Pin
A resistor between this pin and OSC CAP is part of the two-termi-
nal oscillator and sets the internal clock high time, which is also
the IRED pulse width. With component values shown, this time is
nominally 105 μs. The internal clock high time can be calculated
by:
T
high = 0.693 × RTRES × COSCCAP (3)
VSS Pin
This pin is connected to the negative supply potential (usually
ground).
HUSH Pin
This input pin serves two purposes in standby mode. It serves to
enable/disable entering the internal 10-minute (nominal) “hush”
timer mode, and also as the reference for the smoke comparator
during timer mode. Timer mode allows the user to temporarily
hush alarms caused by nuisance smoke or steam (such as from
cooking).
When the voltage on this pin is greater than approximately
50 mV, entering timer mode is enabled, and a high-to-low transi-
tion on the TEST pin resets and starts timer mode. If use of timer
mode is not desired this pin must be connected to VSS, and timer
mode is disabled.
During timer mode the smoke comparator reference is established
externally by a resistive divider (R1 and R2) between VDD and
STROBE. Also, during timer mode the photoamplifier gain, Ae,
is internally reduced to about 55% that during the normal-gain
mode. Thus, Ae = 1 + (C2 / 22), where C2 is in pF. These two
conditions allow the detector to operate with reduced sensitivity
during timer mode. If the level of smoke increases such that the
temporary alarm threshold is reached, a local alarm will sound. If
the HUSH pin is connected directly to STROBE without using a
resistor divider, then a local alarm will never occur during timer
mode, regardless of the smoke level. When not in timer mode,
the smoke comparator reference is set internally to approximately
VDD – 1.6 V.
The resistor dividers formed by the adjustable photoamp-divider
and the HUSH divider (R1 + R2, if timer mode is used) should
be chosen so that the load on STROBE does not exceed 500 μA.
Thus, the photoamp-divider (8 kΩ in the typical application) in
parallel with the HUSH divider (R1 + R2) shall be no
less than 4 kΩ.
TEST Pin
This pin has an internal pulldown device and is used to manually
invoke push-to-test mode and timer mode. Push-to-test mode is
initiated by a voltage greater than approximately VDD – 0.5 V
on this pin (usually the closure of a normally open push-button
switch to VDD). After one oscillator cycle, the amplifier gain is
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
8
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
increased by internal selection of C1 so that background reflec-
tions in the smoke chamber can be used to simulate a smoke con-
dition, and IRED pulses every 252 ms (nominal). After the third
IRED pulse (three consecutive simulated smoke conditions), the
successful test signals a continuous passing-test-alarm condition
to the sound IC, outputs the temporal pattern to the piezo horn,
and activates the I/O pin. When the pushbutton is released, the
input returns to VSS due to the internal pulldown. After one oscil-
lator cycle, the amplifier gain returns to normal, and after three
additional IRED pulses (less than one second), the device exits
this mode and returns to standby. This high-to-low transition on
TEST also resets and starts the 10-minute (nominal) “hush” timer
mode, if the mode is enabled via the HUSH pin. The high-to-low
transition also resets the latching alarm indicator, if it is latched.
If the chamber malfunctions or is too dirty, the push-test will fail
to simulate a smoke condition, and after three failed STROBE
pulses the device signals a continuous failing-test-alarm condi-
tion on the SOUTx pins. The piezo driver and the I/O pins are not
enabled.
Diagnostic Test/Calibration mode is available to facilitate calibra-
tion and test of the IC and the assembled detector. It is initiated
by pulling TEST below VSS by continuously drawing 200 μA
from the pin for at least one clock cycle on OSC CAP. The cur-
rent should not exceed 500 μA and under these conditions,
TEST pin voltage will clamp at approximately 250 mV below
VSS. One option is to connect TEST to a –5 V supply through a
15 kΩ resistor. In this mode, certain device pins are reconfigured
as described in table 1. The IRED pulse rate is increased to one
pulse every OSC CAP cycle and the STROBE pin is always
active. To exit this mode, the TEST pin should be floated, or
returned to VSS, for at least one OSC CAP cycle.
Latching Alarm Indicator
When multiple smoke detectors are networked through the I/O
line, the latching alarm indicator allows the user to identify which
detector(s) initiated an alarm. When a local alarm condition
occurs, the initiating detector(s) will latch the event in memory.
After the alarm condition has expired (the device stops signaling
the alarm condition to the sound IC) the initiating detector(s) will
output an additional 10 ms LED pulse every 43 seconds. If the
BLINK pin is connected to VDD, the additional pulse will occur
0.67 seconds after the normal standby pulse. The user can clear
the latched alarm condition by pressing and releasing the push-to-
test button. If the user does not press the push-to-test button, the
latched alarm condition will cease after 24 hours to preserve bat-
tery life, and to prevent masking future latched alarm indications.
Alarm Indications
Alarm conditions include: local smoke detection, a remote alarm,
low battery, and degraded chamber sensitivity. These are indi-
cated by a combination of SOUTx output, piezo horn, and LED
signals, which continue until the alarm condition is resolved.
A local alarm always overrides a remote alarm and a push-test.
Remote alarm always overrides a push-test. A local alarm, remote
alarm, or a push-test will inhibit warning signals for low battery
or degraded chamber.
During a local or a remote alarm condition, the device continu-
ously signals an alarm condition on the SOUTx pins that indi-
cates the type of the alarm. The piezo horn output is a continuous
modulated tone (temporal horn pattern), nominally: 0.5 s on, 0.5 s
off, 0.5 s on, 0.5 s off, 0.5 s on, and 1.5 s off. The visible LED
also distinguishes a local alarm from a remote alarm. During a
Table 1. Alternate Pin Configuration During Diagnostic
Test/Calibration Mode
Pin Name Alternate Configuration
I/O Disabled as an output. A logic high on this pin places the
photoamplifier output on the BLINK pin. The amplifier
output appears as pulses.
HUSH If the I/O pin is high, this pin controls the amplifier gain
capacitor. If this pin is low, normal gain is selected. If this
pin is high, supervisory gain is selected.
NOTE: If I/O is low, clocking this pin will cause the
device to exit diagnostic/calibration mode and enter an
Allegro-defined test mode.
BLINK If the I/O pin is high, this pin is reconfigured as the
photoamplifier output.
SOUT0 If the I/O pin is high and the HUSH pin is low (normal
gain), taking this pin to a high logic level increases the
amplifier gain by 45% (hysteresis).
SOUT2 This pin is reconfigured as the smoke integrator output.
Three consecutive smoke detections will cause this pin
to go high and three consecutive no-smoke detections
cause this pin to go low.
LED This pin becomes a low-battery indicator. The open-
drain NMOS output is normally off. If VDD falls below the
low-battery threshold, the output turns on.
OSC CAP This pin may be driven by an external clock source.
Driving this pin low and high drives the internal clock low
and high. The external RC network may remain intact.
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
9
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
local alarm, the LED blinks every 0.5 s (nominally), but during a
remote alarm, the LED is disabled and does not blink.
The degraded-chamber test occurs periodically (nominally every
45.9 min). During this test, the gain of the photoamplifier is
switched to the high (supervisory) level, set by C1. The device
expects that the photodiode will receive enough background
reflections in the chamber to cause an alarm condition. If a faulty,
dirty, or obstructed chamber prevents this during a test, the test
period decreases to 43 s. After two consecutive failed tests, the
device signals a degraded chamber condition to the sound IC.
It also chirps the horn and pulses the LED three times every
43 seconds. The condition is resolved when the chamber is either
cleared or cleaned, and the test period then reverts to (nominally)
45.9 min.
The low-battery test also occurs periodically (also nominally
every 45.9 min, but at a different time than the degraded-chamber
test). During this test a resistive divider off VDD is compared to
an internal band-gap reference. If VDD is below the threshold, the
device signals a low battery condition to the sound IC and the
test period decreases to 43 s. It also chirps the horn and pulses the
LED once every 43 seconds. The condition is resolved when the
battery is replaced and the test period then reverts to (nominally)
45.9 min.
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
10
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Timing Diagrams
(Not to Scale)
OSC CAP
STROBE
IRED
Internal clock
Standby Mode
SOUTx
VDD
Chamber
sensitivity
Photo sample
Chamber test
Low-battery test
Low-battery test
Chamber test
LED
SOUTx
Low Battery Condition
Degraded Chamber Condition
t
osc
t
w(st)
t
w(led)
t
w(horn)
t
horn
t
soutx
t
smoke
, t
st1
, t
ired1
t
chamber
, t
st5
, t
ired5
t
battery
, t
led0
, t
st5
, t
ired5
(Low battery)
(Degraded chamber)
Test event
HORN
HORN
t
horn
SOUT(2:0) = (HHL)
SOUT(2:0) = (HLH)
t
soutx
t
sp(horn)
t
w(horn)
t
w(soutx)
t
chamber2
t
chamber2
t
battery2
t
w(soutx)
LED
t
led1
t
w(horn)
LED,
BLINK = V
DD
t
led1
t
chamber
these two pulses will not exist if BLINK = V
SS
t
sp(led)
t
chamber
t
w(led)
t
battery
t
battery
LED,
BLINK = V
SS
(LED OFF)
t
battery2
t
w(ired)
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
11
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
HORN
Local Smoke Detection Condition
ton(horn) toff1(horn)
toff2(horn)
I/O
tst2,ired2 tst3,ired3
tst3,ired3
tw(led)
3rd strobe without smoke1st strobe with smoke 3rd strobe with smoke
STROBE
IRED
tw(st)
tdump
pmud egrahc O/I)TUPTUO(
Remote Alarm Condition
(INPUT)
HORN
I/O
ton(horn) toff1(horn)
toff2(horn)
tr(io)
tw(st)
STROBE
tst4,ired4
tled3
SOUTx
SOUT(2:0) = (LLH)
SOUTx
SOUT(2:0) = (LHL)
Chamber
(smoke present)
LED
BLINK = V
SS
or V
DD
(LED OFF)
LED
BLINK = V
SS
or V
DD
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
12
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Test Alarm Mode (passing)
LED
BLINK = V
SS
or V
DD
HORN
I/O
STROBE
TEST
t
dump
I/O charge dump
t
on(horn)
t
off1(horn)
t
off2(horn)
t
st6,ired6
(OUTPUT)
t
w(st)
t
w(led)
t
led6
SOUTx
SOUT(2:0) = (LHH)
Test Alarm Mode (failing)
LED
BLINK = V
SS
or V
DD
HORN
I/O
STROBE
TEST
t
w(st)
t
w(led)
SOUTx
SOUT(2:0) = (HLL)
t
FAIL
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
13
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Package LE, 20-Pin TSSOP
A
1.20 MAX
0.15
0.00
0.30
0.19
0.20
0.09
0.60 ±0.15
1.00 REF
C
SEATING
PLANE
C0.10
20X
0.65 BSC
0.25 BSC
21
20
6.50±0.10
4.40±0.10 6.40±0.20
GAUGE PLANE
SEATING PLANE
ATerminal #1 mark area
For Reference Only; not for tooling use (reference MO-153 AC)
Dimensions in millimeters
Dimensions exclusive of mold flash, gate burrs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
0.45
1.70
20
21
Reference land pattern layout (reference IPC7351
SOP65P640X110-21M);
All pads a minimum of 0.20 mm from all adjacent pads; adjust as
necessary to meet application process requirements and PCB layout
tolerances; when mounting on a multilayer PCB, thermal vias at the
exposed thermal pad land can improve thermal dissipation (reference
EIA/JEDEC Standard JESD51-5)
PCB Layout Reference View
B
B
6.10
0.65
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
14
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
For the latest version of this document, visit our website:
www.allegromicro.com
Allegro MicroSystems offers an industry-leading range of ionization
and photoelectric smoke detector ICs. For a current listing, please visit
our website at:
www.allegromicro.com
Copyright ©2001-2010, Allegro MicroSystems, Inc.
The products described herein are manufactured under one or more of the following U.S. patents: 5,045,920; 5,264,783; 5,442,283; 5,389,889;
5,581,179; 5,517,112; 5,619,137; 5,621,319; 5,650,719; 5,686,894; 5,694,038; 5,729,130; 5,917,320; and other patents pending.
Allegro MicroSystems, Inc. reserves the right to make, from time to time, such de par tures from the detail spec i fi ca tions as may be required to per-
mit improvements in the per for mance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the
information being relied upon is current.
Allegro’s products are not to be used in life support devices or systems, if a failure of an Allegro product can reasonably be expected to cause the
failure of that life support device or system, or to affect the safety or effectiveness of that device or system.
The in for ma tion in clud ed herein is believed to be ac cu rate and reliable. How ev er, Allegro MicroSystems, Inc. assumes no re spon si bil i ty for its use;
nor for any in fringe ment of patents or other rights of third parties which may result from its use.