RADIATION
• Fabricated with RICMOS™ IV Silicon on Insulator (SOI)
0.7 µm Process (Leff = 0.55 µm)
• Total Dose Hardness through 1x106 rad(SiO2)
• Neutron Hardness through 1x1014 cm-2
• Dynamic and Static Transient Upset Hardness
through 1x1011 rad (Si)/s
• Dose Rate Survivability through <1x1012 rad(Si)/s
• Soft Error Rate of <1x10-10 upsets/bit-day in
Geosynchronous Orbit
• No Latchup
128K x 8 STATIC RAM—SOI HX6228
OTHER
• Read/Write Cycle Times
≤ 16 ns (Typical)
≤ 25 ns (-55 to 125°C)
• Typical Operating Power <25 mW/MHz
• Asynchronous Operation
• CMOS or TTL Compatible I/O
• Single 5 V ± 10% Power Supply
• Packaging Options
- 32-Lead Flat Pack (0.820 in. x 0.600 in.)
- 40-Lead Flat Pack (0.775 in. x 0.710 in.)
Military & Space Products
GENERAL DESCRIPTION
The 128K x 8 Radiation Hardened Static RAM is a high
performance 131,072 word x 8-bit static random access
memory with industry-standard functionality. It is fabricated
with Honeywell’s radiation hardened technology, and is
designed for use in systems operating in radiation environ-
ments. The RAM operates over the full military temperature
range and requires only a single 5 V ± 10% power supply. The
RAM is wire bond programmable for either TTL or CMOS
compatible I/O. Power consumption is typically less than 25
mW/MHz in operation, and less than 5 mW in the low power
disabled mode. The RAM read operation is fully asynchro-
nous, with an associated typical access time of 15 ns at 5V.
Honeywell’s enhancedSOI RICMOS™IV (Radiation Insen-
sitive CMOS) technology is radiation hardened through the
use of advanced and proprietary design, layout and process
hardening techniques. The RICMOS™ IV process is an
advanced 5-volt, SIMOX CMOS technology with a 150 Å
gate oxide and a minimum feature size of 0.7 µm (0.55 µm
effective gate length—Leff). Additional features include
Honeywell’s proprietary SHARP planarization process, and
a lightly doped drain (LDD) structure for improved short
channel reliability. A 7 transistor (7T) memory cell is used for
superior single event upset hardening, while three layer
metal power bussing and the low collection volume SIMOX
substrate provide improved dose rate hardening.
FEATURES
HX6228
2
FUNCTIONAL DIAGRAM
CE NCS NWE NOE MODE DQ
H L H L Read Data Out
H L L X Write Data In
X H XX XX Deselected High Z
L X XX XX Disabled High Z
TRUTH TABLE
SIGNAL DEFINITIONS
A: 0-16 Address input pins which select a particular eight-bit word within the memory array.
DQ: 0-7 Bidirectional data pins which serve as data outputs during a read operation and as data inputs during a write
operation.
NCS Not chip select, when at a low level allows normal operation. When at a high level NCS forces the SRAM to
a precharge condition, holds the data output drivers in a high impedance state and disables all the input
buffers except CE. If this signal is not used it must be connected to VSS.
NWE Negative write enable, when at a low level activates a write operation and holds the data output drivers in
a high impedance state. When at a high level NWE allows normal read operation.
NOE Negative output enable, when at a high level holds the data output drivers in a high impedance state. When
at a low level, the data output driver state is defined by NCS, NWE and CE. If this signal is not used it must
be connected to VSS.
CE Chip enable, when at a high level allows normal operation. When at a low level CE forces the SRAM to a
precharge condition, holds the data output drivers in a high impedance state and disables all the input buffers
except the NCS input buffer. If this signal is not used it must be connected to VDD.
Notes:X: VI=VIH or VIL
XX: VSS≤VI≤VDD
NOE=H: High Z output state maintained
for NCS=X, CE=X, NWE=X
NCS
A:3-7,12,14-16
CE
NWE
NOE
WE • CS • CE
NWE • CS • CE • OE
Column Decoder
Data Input/Output
Row
Decoder
131,072 x 8
Memory
Array
A:0-2, 8-11, 13
#
Signal
All controls must be
enabled for a signal to
pass. (#: number of
buffers, default = 1)
1 = enabled
Signal
8
DQ:0-7
(0 = high Z)
•
•
•
• • •
8
8
9
HX6228
3
Total Dose ≥1x106rad(SiO2)
Transient Dose Rate Upset (3) ≥1x1011 rad(Si)/s
Transient Dose Rate Survivability ≥1x1012 rad(Si)/s
Soft Error Rate <1x10-10 upsets/bit-day
Neutron Fluence ≥1x1014 N/cm2
Parameter Limits (2) Test Conditions
RADIATION HARDNESS RATINGS (1)
The SRAM will meet any functional or electrical specifica-
tion after exposure to a radiation pulse up to the transient
dose survivability specification,when applied under recom-
mended operating conditions. Note that the current con-
ducted during the pulse by the RAM inputs, outputs, and
power supply may significantly exceed the normal operat-
ing levels. The application design must accommodate
these effects.
Neutron Radiation
The SRAM will meet any functional or timing specification
after exposure to the specified neutron fluence under
recommended operating or storage conditions. This as-
sumes an equivalent neutron energy of 1 MeV.
Soft Error Rate
The SRAM is capable of meeting the specified Soft Error
Rate (SER), under recommended operating conditions.
This hardness level is defined by the Adams 90% worst
case cosmic ray environment for geosynchronous orbits.
Latchup
The SRAM will not latch up due to any of the above radiation
exposure conditions when applied under recommended
operating conditions. Fabrication with the SIMOX sub-
strate material provides oxide isolation between adjacent
PMOS and NMOS transistors and eliminates any potential
SCR latchup structures. Sufficient transistor body tie con-
nections to the p- and n-channel substrates are made to
ensure no source/drain snapback occurs.
Total Ionizing Radiation Dose
The SRAM will meet all stated functional and electrical
specifications over the entire operating temperature range
after the specified total ionizing radiation dose. All electrical
and timing performance parameters will remain within
specifications after rebound at VDD = 5.5 V and T =125°C
extrapolated to ten years of operation. Total dose hardness
is assured by wafer level testing of process monitor transis-
tors and RAM product using 10 KeV X-ray and Co60
radiation sources. Transistor gate threshold shift correla-
tions have been made between 10 KeV X-rays applied at
a dose rate of 1x105 rad(SiO2)/min at T = 25°C and gamma
rays (Cobalt 60 source) to ensure that wafer level X-ray
testing is consistent with standard military radiation test
environments.
Transient Pulse Ionizing Radiation
The SRAM is capable of writing, reading, and retaining
stored data during and after exposure to a transient ionizing
radiation pulse up to the specified transient dost rate upset
specification, when applied under recommended operat-
ing conditions. To ensure validity of all specified perfor-
mance parameters before, during, and after radiation (tim-
ing degradation during transient pulse radiation is ≤20%),
it is suggested that stiffening capacitance be placed on or
near the package VDD and VSS, with a maximum induc-
tance between the package (chip) and stiffening capaci-
tance of 0.7 nH per part. If there are no operate-through or
valid stored data requirements, typical circuit board
mounted de-coupling capacitors are recommended.
Units
(1) Device will not latch up due to any of the specified radiation exposure conditions.
(2) Operating conditions (unless otherwise specified): VDD=4.5 V to 5.5 V, -55°C to 125 °C.
(3) Applies to 40-lead flat pack only. Assume ≥1x1009 rad(Si))/s for 32-lead flat pack. Stiffening capacitance is suggested for optimum expected
dose rate upset performance as stated above.
TA=125°C, Adams 90%
worst case environment
Pulse width ≤50 ns, X-ray,
VDD=6.0 V, TA=25°C
Pulse width ≤1µs
TA=25°C
1 MeV equivalent energy,
Unbiased, TA=25°C
RADIATION CHARACTERISTICS
HX6228
4
VDD Supply Voltage Range (2) -0.5 6.5 V
VPIN Voltage on Any Pin (2) -0.5 VDD+0.5 V
TSTORE Storage Temperature (Zero Bias) -65 150 °C
TSOLDER Soldering Temperature (5 Seconds) 270 °C
PD Maximum Power Power Dissipation (3) 2.5 W
IOUT DC or Average Output Current 25 mA
VPROT ESD Input Protection Voltage (4) 1500 V
ΘJC Thermal Resistance (Jct-to-Case) 2 °C/W
TJ Junction Temperature 175 °C
Parameter
Symbol Units
ABSOLUTE MAXIMUM RATINGS (1)
Max
Min
Rating
(1) Stresses in excess of those listed above may result in permanent damage. These are stress ratings only, and operation at these levels is not
implied. Frequent or extended exposure to absolute maximum conditions may affect device reliability.
(2) Voltage referenced to VSS.
(3) RAM power dissipation (IDDSB + IDDOP) plus RAM output driver power dissipation due to external loading must not exceed this specification.
(4) Class 1 electrostatic discharge (ESD) input protection. Tested per MIL-STD-883, Method 3015 by DESC certified lab.
RECOMMENDED OPERATING CONDITIONS
Symbol
VDD Supply Voltage (referenced to VSS) 4.5 5.0 5.5 V
TA Ambient Temperature -55 25 125 °C
VPIN Voltage on Any Pin (referenced to VSS) -0.3 VDD+0.3 V
MaxTyp Units
Description
Parameter Min
CI Input Capacitance 6 7 pF VI=VDD or VSS, f=1 MHz
CO Output Capacitance 8 9 pF VIO=VDD or VSS, f=1 MHz
Parameter Max
Min
Symbol Test Conditions
Worst Case Units
CAPACITANCE (1)
(1) This parameter is tested during initial design characterization only.
Typical
Symbol Test Conditions
Min
DATA RETENTION CHARACTERISTICS
Max
Parameter Typical
(1) Units
NCS=VDD=VDR
VI=VDR or VSS
VDR Data Retention Voltage (3) 2.5 V
IDR Data Retention Current 200 1.0 mA
NCS=VDR
VI=VDR or VSS
(1) Typical operating conditions: TA= 25°C, pre-radiation.
(2) Worst case operating conditions: TA= -55°C to +125°C, past total dose at 25°C.
(3) To maintain valid data storage during transient radiation, VDD must be held within the recommended operating range.
Worst Case (2)
HX6228
5
DC ELECTRICAL CHARACTERISTICS
IDDSB Static Supply Current 0.4 2.0 mA
IDDSBMF Standby Supply Current - Deselected 0.4 2.0 mA
IDDOPW Dynamic Supply Current, Selected (Write) 4.5 6.0 mA
IDDOPR Dynamic Supply Current, Selected (Read) 2.8 4.5 mA
II Input Leakage Current -5 +5 µA
IOZ Output Leakage Current -10 +10 µA
VIL Low-Level Input Voltage
VIH High-Level Input Voltage
Units Test Conditions
Min Max
Worst Case (2)
Symbol Parameter Typical
(1)
NCS=VDD, IO=0,
f=40 MHz,
VIH=VDD, IO=0,
VIL=VSS, f=0MHz
f=1 MHz, IO=0, CE=VIH=VDD
NCS=VIL=VSS (3)
f=1 MHz, IO=0, CE=VIH=VDD
NCS=VIL=VSS (3)
VSS≤VI≤VDD
VSS≤VIO≤VDD
Output=high Z
CMOS 3.2 0.7xVDD VMarch Pattern
TTL 2.2 V VDD = 5.5V
0.3 0.4 V VDD = 4.5V, IOL = 10 mA
0.005 0.1 V VDD = 4.5V, IOL = 200 µA
4.3 4.2 V VDD = 4.5V, IOH = -5 mA
4.5 VDD-0.1 VVDD = 4.5V, IOH = -200 µA
CMOS 1.7 0.3xVDD VMarch Pattern
TTL 0.8 V VDD = 4.5V
VOL Low-Level Output Voltage
VOH High-Level Output Voltage
(1) Typical operating conditions: VDD= 5.0 V,TA=25°C, pre-radiation.
(2) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55°C to +125°C, post total dose at 25°C.
(3) All inputs switching. DC average current.
DUT
output Valid low
output
Vref1
CL>50 pF*
249
Tester Equivalent Load Circuit
2.9 V Valid high
output
Vref2
-
+
-
+
*CL = 5 pF for TWLQZ, TSHQZ, TELQZ, and TGHQZ
HX6228
6
TAVAVR Address Read Cycle Time 16 25 ns
TAVQV Address Access Time 15 25 ns
TAXQX Address Change to Output Invalid Time 12 3 ns
TSLQV Chip Select Access Time 16 25 ns
TSLQX Chip Select Output Enable Time 12 5 ns
TSHQZ Chip Select Output Disable Time 5 10 ns
TEHQV Chip Enable Access Time 16 25 ns
TEHQX Chip Enable Output Enable Time 12 5 ns
TELQZ Chip Enable Output Disable Time 6 10 ns
TGLQV Output Enable Access Time 4 9 ns
TGLQX Output Enable Output Enable Time 4 2 ns
TGHQZ Output Enable Output Disable Time 4 9 ns
READ CYCLE AC TIMING CHARACTERISTICS (1)
(1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V (CMOS), VIL/VIH=0V/3V (TTL), input rise and fall times <1 ns/V, input and
output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading CL>50 pF, or equivalent
capacitive output loading CL=5 pF for TSHQZ, TELQZ TGHQZ. For CL >50 pF, derate access times by 0.02 ns/pF (typical).
(2) Typical operating conditions: VDD=5.0 V, TA=25°C, pre-radiation.
(3) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55°C to 125°C, post total dose at 25°C.
Worst Case (3)
HIGH
IMPEDANCE
NCS
NOE
DATA VALID
CE
TAVAVR
TAVQV TAXQX
TSLQV
TSLQX TSHQZ
TEHQX
TEHQV
TGLQX
TGLQV TGHQZ
TELQZ
ADDRESS
(NWE = high)
DATA OUT
Symbol Parameter Typical -55 to 125°C Units
(2) Min Max
HX6228
7
WRITE CYCLE AC TIMING CHARACTERISTICS (1)
Symbol Parameter Typical -55 to 125°C Units
(2) Min Max
Worst Case (3)
TAVAVW Write Cycle Time (4) 13 25 ns
TWLWH Write Enable Write Pulse Width 9 20 ns
TSLWH Chip Select to End of Write Time 12 20 ns
TDVWH Data Valid to End of Write Time 9 15 ns
TAVWH Address Valid to End of Write Time 10 20 ns
TWHDX Data Hold Time after End of Write Time 0 0 ns
TAVWL Address Valid Setup to Start of Write Time 0 0 ns
TWHAX Address Valid Hold after End of Write Time 0 0 ns
TWLQZ Write Enable to Output Disable Time 5 0 9 ns
TWHQX Write Disable to Output Enable Time 12 5 ns
TWHWL Write Recovery Time 4 5 ns
TEHWH Chip Enable to End of Write Time 11 20 ns
(1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V (CMOS), VIL/VIH=0V/3V (TTL), input rise and fall times <1 ns/V, input and
output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading >50 pF, or equivalent capacitive
load of 5 pF for TWLQZ.
(2) Typical operating conditions: VDD=5.0 V, TA=25°C, pre-radiation.
(3) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55 to 125°C, post total dose at 25°C.
(4) TAVAVW = TWLWH + TWHWL.
ADDRESS
HIGH
IMPEDANCE
DATA OUT
NWE
DATA IN
DATA VALID
T
AVAVW
NCS
CE
T
AVWH
T
WLWH
T
AVWL
T
WLQZ
T
DVWH
T
WHQX
T
WHDX
T
SLWH
T
EHWH
T
WHAX
T
WHWL
HX6228
8
Read Cycle
The RAM is asynchronous in operation, allowing the read
cycle to be controlled by address, chip select (NCS), or chip
enable (CE) (refer to Read Cycle timing diagram). To
perform a valid read operation, both chip select and output
enable (NOE) must be low and chip enable and write
enable (NWE) must be high. The output drivers can be
controlled independently by the NOE signal. Consecutive
read cycles can be executed with NCS held continuously
low, and with CE held continuously high, and toggling the
addresses.
For an address activated read cycle, NCS and CE must be
valid prior to or coincident with the activating address edge
transition(s). Any amount of toggling or skew between ad-
dress edge transitions is permissible; however, data outputs
will become valid TAVQV time following the latest occurring
address edge transition. The minimum address activated
read cycle time is TAVAV. When the RAM is operated at the
minimum address activated read cycle time, the data out-
puts will remain valid on the RAM I/O until TAXQX time
following the next sequential address transition.
To control a read cycle with NCS, all addresses and CE
must be valid prior to or coincident with the enabling NCS
edge transition. Address or CE edge transitions can occur
later than the specified setup times to NCS, however, the
valid data access time will be delayed. Any address edge
transition, which occurs during the time when NCS is low,
will initiate a new read access, and data outputs will not
become valid until TAVQV time following the address edge
transition. Data outputs will enter a high impedance state
TSHQZ time following a disabling NCS edge transition.
To control a read cycle with CE, all addresses and NCS
must be valid prior to or coincident with the enabling CE
edge transition. Address or NCS edge transitions can occur
later than the specified setup times to CE; however, the
valid data access time will be delayed. Any address edge
transition which occurs during the time when CE is high will
initiate a new read access, and data outputs will not
become valid until TAVQV time following the address edge
transition. Data outputs will enter a high impedance state
TELQZ time following a disabling CE edge transition.
DYNAMIC ELECTRICAL CHARACTERISTICS
Write Cycle
The write operation is synchronous with respect to the
address bits, and control is governed by write enable
(NWE), chip select (NCS), or chip enable (CE) edge
transitions (refer to Write Cycle timing diagrams). To per-
form a write operation, both NWE and NCS must be low,
and CE must be high. Consecutive write cycles can be
performed with NWE or NCS held continuously low, or CE
held continuously high. At least one of the control signals
must transition to the opposite state between consecutive
write operations.
The write mode can be controlled via three different control
signals: NWE, NCS, and CE. All three modes of control are
similar except the NCS and CE controlled modes actually
disable the RAM during the write recovery pulse. Both CE
and NCS fully disable the RAM decode logic and input
buffers for power savings. Only the NWE controlled mode
is shown in the table and diagram on the previous page for
simplicity; however, each mode of control provides the
same write cycle timing characteristics. Thus, some of the
parameter names referenced below are not shown in the
write cycle table or diagram, but indicate which control pin
is in control as it switches high or low.
To write data into the RAM, NWE and NCS must be held low
and CE must be held high for at least TWLWH/TSLSH/
TEHEL time. Any amount of edge skew between the
signals can be tolerated, and any one of the control signals
can initiate or terminate the write operation. For consecu-
tive write operations, write pulses must be separated by the
minimum specified TWHWL/TSHSL/TELEH time. Address
inputs must be valid at least TAVWL/TAVSL/TAVEH time
before the enabling NWE/NCS/CE edge transition, and
must remain valid during the entire write time. A valid data
overlap of write pulse width time of TDVWH/TDVSH/TDVEL,
and an address valid to end of write time of TAVWH/
TAVSH/TAVEL also must be provided for during the write
operation. Hold times for address inputs and data inputs
with respect to the disabling NWE/NCS/CE edge transition
must be a minimum of TWHAX/TSHAX/TELAX time and
TWHDX/TSHDX/TELDX time, respectively. The minimum
write cycle time is TAVAV.
HX6228
9
TESTER AC TIMING CHARACTERISTICS
QUALITY AND RADIATIONHARDNESS
ASSURANCE
Honeywell maintains a high level of product integrity through
process control, utilizing statistical process control, a com-
plete “Total Quality Assurance System,” a computer data
base process performance tracking system, and a radia-
tion hardness assurance strategy.
The radiation hardness assurance strategy starts with a
technology that is resistant to the effects of radiation.
Radiation hardness is assured on every wafer by irradiat-
ing test structures as well as SRAM product, and then
monitoring key parameters which are sensitive to ionizing
radiation. Conventional MIL-STD-883 TM 5005 Group E
testing, which includes total dose exposure with Cobalt 60,
may also be performed as required. This Total Quality
approach ensures our customers of a reliable product by
engineering in reliability, starting with process develop-
ment and continuing through product qualification and
screening.
SCREENING LEVELS
Honeywell offers several levels of device screening to
meet your system needs. “Engineering Devices” are avail-
able with limited performance and screening for bread-
boarding and/or evaluation testing. Hi-Rel Level B and S
devices undergo additional screening per the require-
ments of MIL-STD-883. As a QML supplier, Honeywell
also offers QML Class Q and V devices per MIL-PRF-
38535 and are available per the applicable Standard
Microcircuits Drawing (SMD). QML devices offer ease of
procurement by eliminating the need to create detailed
specifications and offer benefits of improved quality and
cost savings through standardization.
RELIABILITY
Honeywell understands the stringent reliability require-
ments that space and defense systems require and has
extensive experience in reliability testing on programs of
this nature. This experience is derived from comprehen-
sive testing of VLSI processes. Reliability attributes of the
RICMOS™ process were characterized by testing spe-
cially designed irradiated and non-irradiated test struc-
tures from which specific failure mechanisms were evalu-
ated. These specific mechanisms included, but were not
limited to, hot carriers, electromigration and time depend-
ent dielectric breakdown. This data was then used to make
changes to the design models and process to ensure more
reliable products.
In addition, the reliability of the RICMOS™ process and
product in a military environment was monitored by testing
irradiated and non-irradiated circuits in accelerated dy-
namic life test conditions. Packages are qualified for prod-
uct use after undergoing Groups B & D testing as outlined
in MIL-STD-883, TM 5005, Class S. The product is quali-
fied by following a screening and testing flow to meet the
customer’s requirements. Quality conformance testing is
performed as an option on all production lots to ensure the
ongoing reliability of the product.
High Z = 2.9V
3 V
0 V 1.5 V VDD-0.5
V
0.5
V
VDD
/
2
1.5 V
VDD-0.4V
0.4 V High Z
3.4
V
2.4
V
High Z
VDD
/
2
0.4 V High Z
3.4
V
2.4 V
High Z
TTL I/O Configuration
Input
Levels*
Output
Sense
Levels
CMOS I/O Configuration
High Z = 2.9V
* Input rise and fall times <1 ns/V
VDD-0.4V
HX6228
10
PACKAGING
The 128K x 8 SOI SRAM is offered in a custom 32-lead or
40-lead Flat Pack. The package is constructed of multilayer
ceramic (Al2O3) and features internal power and ground
planes.
Ceramic chip capacitors can be mounted to the package by
the user to maximize supply noise decoupling and increase
32-LEAD FLAT PACK PINOUT
32-LEAD FLAT PACK
VDD
A15
CE
NWE
A13
A8
A9
A11
NOE
A10
NCS
DQ7
DQ6
DQ5
DQ4
DQ3
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Top
View
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
[1] BSC - Basic lead spacing between centers
[2] Where lead is brazed to package
[3] Parts delivered with leads unformed
[4] Lid connected to VSS
A
b
C
D
e
E
E2
E3
F
L
Q
S
U
V
W
X
Y
Z
0.135 ± 0.015
0.017 ± 0.002
0.004 to 0.009
0.820 ± 0.008
0.050 ± 0.005 [1]
0.600 ± 0.008
0.500 ± 0.008
0.040 ref
0.750 ± 0.005 [2]
0.295 min [3]
0.026 to 0.045
0.035 ± 0.010
0.080 ref
0.380 ref
0.050 ref
0.075 ref
0.010 ref
0.135 ref
All dimensions in inches
22018533-001
E
1
e
b
D
(width)
(pitch)
F
L
TOP
VIEW
E2
A
Lead
Alloy 42
Ceramic
Body
C
E3
Cutout
Area
Q
Kovar
Lid [4]
V
Optional capacitors
in cutout
1
VSSVDD VDD
S
U
Z
X
W
Y
BOTTOM
VIEW
board packing density. These capacitors effectively attach
to the internal package power and ground planes. This
design minimizes resistance and inductance of the bond
wire and package, both of which are critical in a transient
radiation environment. All NC (no connect) pins should be
connected to VSS to prevent charge build up in the
radiation environment.
40-LEAD FLAT PACK PINOUT
A15
VSS
VDD
NWE
CE
A13
A8
A9
A11
NOE
A10
NCS
DQ7
DQ6
DQ5
DQ4
DQ3
VDD
VSS
NC
A16
VSS
VDD
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
NC
VDD
VSS
NC
Top
View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
HX6228
11
40-LEAD FLAT PACK
IC
Capacitor Pads
Kovar Lid [3]
X
A
N
Ceramic Body
(Pedestal)
D(width)
b
e
(pitch)
1
21
40
20
L
E
Top
View
22019370-001
40
21
A
A
b
c
D
E
e
F
G
H
I
L
N
S
T
U
V
W
X
Z
[1] Parts delivered with leads unformed
[2] At tie bar
[3] Lid tied to VSS
0.131 ± .015
0.008 ± 0.002
0.006 ± 0.0015
0.710 ±0.010
0.775 ± 0.007
0.025 ± 0.004
0.475 ± 0.005
0.760 ± 0.008
0.135 ± 0.005
0.030 ± 0.005
0.285 ± 0.015
0.050 ± 0.004
0.1175 ref
0.064 ref
0.006 ref
0.028 ref
0.125 ref
0.500 ± 0.005
0.140 ref
All dimensions are in inches
G
Non-Conductive
Tie-Bar
TU
H
W
F
Bottom
View
V
Z
S
Honeywell reserves the right to make changes to any products or technology herein to improve reliability, function or design. Honeywell does not assume any liability
arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights nor the rights of others.
Helping You Control Your World
900156
2/97
PART NUMBER
CS
6228
X
HR
T
ORDERING INFORMATION (1)
SCREEN LEVEL
V=QML Class V
Q=QML Class Q
S=Level S
B=Level B
E=Engr Device (2)
SOURCE
H=HONEYWELL PACKAGE DESIGNATION
T=32-Lead FP
A=40-Lead FP
K=Known Good Die
- =Bare die (No Package)
TOTAL DOSE
HARDNESS
R=1x105 rad(SiO2)
F=3x105 rad(SiO2)
H=1x106 rad(SiO2)
N=No Level Guaranteed
PROCESS
X=SOI
INPUT
BUFFER TYPE
C=CMOS Level
T=TTL Level
(1) Orders may be faxed to 612-954-2051. For technical assistance, contact our Customer Logistics Department at 612-954-2888.
(2) Engineering Device description: Parameters are tested from -55 to 125°C, 24 hr burn-in, IDDSB = 10mA, no radiation guaranteed.
Contact Factory with other needs.
To learn more about Honeywell Solid State Electronics Center,
visit our web site at http://www.ssec.honeywell.com
DYNAMIC BURN-IN DIAGRAM* STATIC BURN-IN DIAGRAM*
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
VDD
A15
CE
NWE
A13
A8
A9
A11
NOE
A10
NCS
DQ7
DQ6
DQ5
DQ4
DQ3
128K x 8 SRAM
F18
F19
F0
F15
F12
F11
F10
F19
F9
F19
F1
F1
F1
F1
F1
F17
F16
F7
F6
F5
F4
F3
F2
F8
F13
F14
F1
F1
F1
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
VDD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
VDD
A15
CE
NWE
A13
A8
A9
A11
NOE
A10
NCS
DQ7
DQ6
DQ5
DQ4
DQ3
128K x 8 SRAM
VDD
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
R
NC
VDD = 5.6V, R ≤ 10 KΩ, VIH = VDD, VIL = VSS
Ambient Temperature ≥ 125 °C, F0 ≥ 100 KHz Sq Wave
Frequency of F1 = F0/2, F2 = F0/4, F3 = F0/8, etc.
VDD = 5.5V, R ≤ 10 KΩ
Ambient Temperature ≥ 125 °C
*40-Lead Flat Pack burn-in diagrams have similar connections and are available upon request.
HX6228
