LITE-ON TECHNOLOGY CORPORATION
Property of Lite-on Only
Isolation Characteristics
Part No. : 6N137-L series (Preliminary Version) Page : 12 of 16
BNS-OD-C131/A4
Parameter Test Condition Symbol Min Typ Max Unit
s Note
Input-Output Insulation
Leakage Current
45% RH, t = 5s,
VI-O = 3kV DC, TA = 25oC II-O 1.0 μA 10,11
Withstand Insulation Test
Voltage
RH ≤ 50%, t = 1min,
TA = 25oC VISO 5000 V
10,11,1
2
Input-Output Resistance VI-O = 500V DC RI-O 6.5x1011 Ω 10
Input-Output
Capacitance f = 1MHz, TA = 25oC CI-O 1.0 pF 10
Specified over recommended temperature (TA = -40oC to +85oC) unless otherwise specified. Typical values
applies to TA = 25oC
Notes
1. A 0.1µF or bigger bypass capacitor for VCC is needed as shown in Fig.1
2. Peaking driving circuit may be used to speed up the LED. The peak drive current of LED may go up to 50mA
and maximum pulse width 50ns, as long as average current doesn’t exceed 20mA.
3. tPLH (propagation delay) is measured from the 3.75 mA point on the falling edge of the input pulse to the 1.5 V
point on the rising edge of the output pulse.
4. tPHL (propagation delay) is measured from the 3.75 mA point on the rising edge of the input pulse to the 1.5 V
point on the falling edge of the output pulse.
5. The tELH enable propagation delay is measured from the 1.5 V point on the falling edge of the enable input
pulse to the 1.5 V point on the rising edge of the output pulse.
6. The tEHL enable propagation delay is measured from the 1.5 V point on the rising edge of the enable input
pulse to the 1.5 V point on the falling edge of the output pulse.
7. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in
a high logic state (i.e., VO > 2.0 V).
8. CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in
a low logic state (i.e., VO < 0.8 V).
9. No external pull up is required for a high logic state on the enable input. If the enable pin is not used, tying it to
VCC.
10. Device is considered a two-terminal device: pins 1, 2, 3, and 4 shorted together, and pins 5, 6, 7, and 8
shorted together.
11. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage 3000 V
rms for one second (leakage current less than 5 uA). This test is performed before the 100% production test for
partial discharge
12. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage 6000 V
rms for one second (leakage current less than 5 uA). This test is performed before the 100% production test for
partial discharge