Serial ATA Flash Drive
APS1845xxxx-ACMX
8
© 2011 Apacer Technology Inc. Rev. 1.1
3. Flash Management
3.1 Error Correction/Detection
SAFD18S4-M implements a hardware ECC scheme, based on the BCH algorithm. It can detect and correct
up to 16 bits or 24 bits error in 1K bytes.
3.2 Bad Block Management
Although bad blocks on the flash media are already identified by the flash manufacturer, they can also be
accumulated over time during operation. SAFD18S4-M’s controller maintains a table that lists those normal
blocks with disk data, the free blocks for wear leveling, and bad blocks with errors. When a normal block is
detected broken, it is replaced with a free block and listed as a bad block. When a free block is detected
broken, it is then removed from the free block list and marked as a bad blo c k.
During device operation, this ensures that newly accumulated bad blocks are transparent to the host. The
device will stop file write service once there are only two free blocks left such that the read function is still
available for copying the files from the disk into another.
3.3 Wear Leveling
The NAND flash devices are limited by a certain number of write cycles. When using a FAT-based file system,
frequent FAT table updates are required. If some area on the flash wears out faster than others, it would
significantly reduce the lifetime of the whole SSD, even if the erase counts of others are far from the write
cycle limit. Thus, if the write cycles can be distributed evenly across the media, the lifetime of the media can
be prolonged significantly. This scheme is called wear leveling.
Apacer’s wear-leveling scheme is achieved both via buffer management and Apacer-specific static wear
leveling. They both ensure that the lifetime of the flash media can be increased, and the disk access
performance is optimized as well.
3.4 Power Failure Management
The Low Power Detection on the controller initiates crucial data saving before the power supplied to the
device is too low. This feature prevents the device from crash and ensures data integrity during an
unexpected power-off.
3.5 ATA Secure Erase
Accomplished by the Secure Erase (SE) command, which added to the open ANSI standards that control disk
drives, “ATA Secure Erase” is built into the disk drive itself and thus far less susceptible to malicious software
attacks than external software utilities. It is a positive easy-to-use data destroy command, amounting to
electronic data shredding. Executing the command causes a drive to internally completely erase all possible
user data. This command is carried out within disk drives, so no additional software is required. Once
executed, neither data nor the erase counter on the device would be recoverable, which blurs the accuracy of
device lifespan. The process to erase will not be stopped until finished while encountering power failure, and
will be continued when power is back on.