1
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
Meets AEC-Q200 Requirements
Suppression of common mode noise without
attenuating the signal
Magnetically shielded versions for lower Rdc
and higher current
Supports CAN-Bus, A2B and other IVN high
speed differential signal lines (LVDS)
Electrical Specifications @ 25°C
Part Number
Common Mode Impedance
(10MHZ) Inductance
(uH)
Standard
Tolerance
RDC
(Ω Max)
IDC
(A) Max
Isolation
Resistance
(MΩ) Min
Rated
Voltage
(V) Max
Min Typ
PE-1210ACCXXXSTS
PE-1210ACC110STS 300 550 11 +50/-30% 0.4 0.3 10 80
PE-1210ACC220STS 500 1100 22 +50/-30% 0.5 0.25 10 80
PE-1210ACC510STS 1000 2600 51 +50/-30% 0.7 0.2 10 80
PE-1210ACC101STS 2200 5100 100 +50/-30% 1.5 0.15 10 80
PE-1812ACCXXXSTS
PE-1812ACC110STS 300 600 11 +50/-30% 0.5 0.36 10 50
PE-1812ACC220STS 600 1200 22 +50/-30% 0.6 0.31 10 50
PE-1812ACC510STS 1500 3500 51 +50/-30% 1 0.23 10 50
PE-1812ACC101STS 3000 7500 100 +50/-30% 2 0.2 10 50
All Units in mm
Mechanical Schematic
1
2
4
3
View from PCB
C
X
T
W S
Series
A B C D e f XTWS
Component Dimensions (mm) SODLER PAD(mm)
A
D
4.5 +/-0.20
3.2 +/-0.202.5 MAX2.5 +/-0.20
B
3.2 +/-0.20 3.0 MAX 3.2 +/-0.20
3.2 +/-0.20 3.2 +/-0.20
0.70+/-0.150.65+/-0.15
2.40 3.00 1.20
4.40
3.20 3.40 1.60
5.90
Operating Temperature Range -55oC to +155°C
Operating Temperature Range -40oC to +125°C
Leakage
Inductance
(nH) Max
50
70
130
180
45
50
150
200
PIN 1
3.2 +/-0.20
1210 ACC
1812 ACC
Bifilar winding
(representation only)
Networking.PulseElectronics.com W717.G (03/19)
2
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
5.9
3.2
3.4
1.6
23
4.5±0.2
3.2±0.2
3.8 ref
0.65 ref
0.7 ref
3.0 max
010100 1000 10000
0.1
1
10
100
1000
10000
1 10 100 1,000 10,000
0.1
1
10
100
1000
10000
110100 1000 10000
1
10
100
110100 1000 10000
1
10
100
Impedance(
Impedanc
Frequency(MHz)Frequency(MHz)
Frequency(MHz)
Frequency(MHz)
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.1 0.2 0.3 0.4 0.5
IDC(A)
22uH
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.1 0.2 0.3 0.4 0.5
IDC(A)
PE-1210ACC110STS
Impedance vs Frequency Temp vs DC Current
Common mode Differential mode
ːT@25oC
PE-1210ACC220STS
Impedance vs Frequency Temp vs DC Current
Common mode Differential mode
ːT@25oC
11uH
11uH
22uH
ːT (oC)ːT (oC)
Impedance (Ω) Impedance (Ω)
Networking.PulseElectronics.com W717.G (03/19)
3
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
PE-1210ACC510STS
010100 1000 10000
0.1
1
10
100
1000
10000
110100 1000 10000
0.1
1
10
100
1000
10000
1 10 100 1,000 10,000
1
10
100
1,000
10,000
,
110 100 1,000 10,000
1
10
100
1,000
10,000
100,000
,
Frequency(MHz)
Frequency(MHz)
PE-1210ACC110STSPE-1210ACC220STS
Common modeNormal ModeCommon modeNormal Mode
PE-1210ACC101STS
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.1 0.2 0.3 0.4 0.5
IDC(A)
100uH
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.1 0.2 0.3 0.4 0.5
IDC(A)
51uH
Impedance vs Frequency
Common mode Differential mode
Temp vs DC Current
ːT@25oC
Impedance vs Frequency
Common mode Differential mode
Temp vs DC Current
ːT@25oC
Impedance (Ω) Impedance (Ω)
51uH
100uH
ːT (oC)ːT (oC)
Networking.PulseElectronics.com W717.G (03/19)
4
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
PE-1812ACC110STS
Temp vs DC Current
10 100 1,000
Frequency(MHz)
Impedance(Ω)
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.2 0.4 0.6 0.8 1.0
IDC(A)
0.1
1.0
10.0
100.0
1,000.0
10,000.0
110100 1,000
Frequency(MHz)
Impedance(Ω)
Common mode Differenal mode
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.00.2 0.40.6 0.8
IDC(A)
ːT(˜)
ːT@25˜
PE-1812ACC220STS
0.1
1
10
100
1,000
10,000
110100 1,000
Frequency(MHz)
Impedance(Ω)
Common mode Differenal mode
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.00.2 0.40.6 0.81.0
IDC(A)
ːT(˜)
ːT@25˜
0.1
1
10
100
1,000
10,000
1
10 100 1,000
Frequency(MHz)
Impedance (Ω)
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0.200.4.600.8
IDC(A)
Impedance vs Frequency
Impedance vs Frequency Temp vs DC Current
Common mode Differential mode
ːT@ 25oC
Common mode Differential mode
0.1
1
10
100
1,000
10,000
Impedance (Ω)
ːT (oC)ːT (oC)
22uH
11uH
22uH
11uH
ːT@25oC
Networking.PulseElectronics.com W717.G (03/19)
5
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
PE-1812ACC101STS
Impedance vs Frequency Temp vs DC Current
0.0
10.0
20.0
30.0
40.0
50.0
60.0
70.0
0.00.1 0.20.3 0.40.5 0.60.7
IDC(A)
ːT(˜)
ːT@25˜
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.0 0.1 0.2 0.3 0.4 0.5
IDC(A)
ːT@25oC
1.0
10.0
100.0
10,000.0
100,000.0
110100 1,000
Impedance(˜)
Frequency(MHz)
Frequency(MHz)
Common mode Di°eren˛al mode
1
10
100
1,000
10,000
100,000
110 1,000
Common mode Differential mode
PE-1812ACC510STS
0.0
10.0
20.0
30.0
40.0
50.0
60.0
70.0
0.0.100.2.300.4.500.6.70
ːT@25oC
0.0
10.0
20.0
30.0
40.0
50.0
60.0
0.00 0.10 0.20 0.30 0.40 0.50
IDC(A)
ːT(˜)
ːT@25˜
1 10 100 1,000
Frequency(MHz)
1.0
10.0
100.0
1,000.0
10,000.0
100,000.0
110100 1,000
Impedance(˜)
Common mode Di°eren˛al mode
100
Common mode Differential mode
1
10
100
1,000
10,000
100,000
Impedance (Ω) Impedance (Ω)
IDC(A)
Frequency(MHz)
Impedance vs Frequency Temp vs DC Current
ːT (oC)ːT (oC)
100uH
51uH
100uH
51uH
Networking.PulseElectronics.com W717.G (03/19)
6
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
Item Reference documents Test Condition Test Specification
1. High Temperature Exposure MIL-STD-202 Method 108 1. Temperature: +125/155�C
2. Time: 1000 hours
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
2. Temperature Cycling JESD22 Method JA-104
1. Temperature: -55/40�C~125/155�C
2. Number of cycles: 1000 cycle
3. Dwell time: 30 minutes
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
3. Biased Humidity Test MIL-STD-202 Method 103
1. Temperature: 85±5�C
2. Time: 1000hours
3. Humidity: 85±5% RH
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
4. Operational Life MIL-PRF-27
1. Temperature: 125 / 155�C
2. Time: 1000 hours
3. Apply rated current
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
5. External Visual MIL-STD-883 Method 2009 Inspect product construction, marking and
workmanship
Per product specification standard
6. Physical Dimensions JESD22 Method JB-100 Verify physical dimensions to the applicable product
detail specification
Per product specification standard
7. Resistance to solvents MIL-STD-202 Method 215
Immerse into solvent for 3±0.5 minutes & brush 10
times for their cycles.
1. No body change in appearance
2. No marking blurred.
3. Inductance shall not change more than ±30%
8. Vibration Test MIL-STD-202 Method 204
1. Frequency and Amplified: 10-2000-10 Hz, 1.5mm
2. Direction: X, Y, Z
3. Test duration: 2 hours for each direction, 6 hours
in total
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
9. Resistance to Soldering Heat
Test MIL-STD-202 Method 210
1. Temperature: 250±5�C
2. Time: (temp.≥217�C) 92~109 Second
3. IR reflow times: 3 times
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
10. Rated Current MIL-STD-202 Method 330 Apply rated current for 5 seconds. 1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
11. Temperature Rise MIL-PRF-27 Apply rated current for 10 minutes. 1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
12. Over load MIL-PRF-27 Apply twice as rated current for 5 minutes. 1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
13. Solderability Test J-STD-002
1. Baking in pre-testing: 155±5�C / 16Hours±30min.
2. Peak temperature: 245�C
3. Time: (temp.≥217�C) 112 Second
4. IR reflow times: 1 time
The terminal shall be at least 95% covered with fresh
solder.
14. Electrical Characterization User Spec. 1. Operating temperature:-55/40�C~125/155�C
2. Room Temperature: 25�C
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
15. Withstanding Voltage Test MIL-STD-202 Method 201 1. DV: 500V
2. Time: 1 minute
1. During the test no breakdown.
2. The characteristic is normal after test.
16. Drop JESD22-B111 Package & Drop down from 1m. In 1 angle 1 ridge
& 2 surfaces orientation
1. No case deformation or change in appearance.
2. Inductance shall not change more than ±30%
17. Terminal Strength Test JIS-C-6429 1. Apply push force to samples mounted on PCB.
2. Force of 1.8 kg for 60±1 seconds.
After test, inductors shall be on mechanical damge.
Reliability Test
Networking.PulseElectronics.com W717.G (03/19)
Automotive Chip Choke
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
®
Tape and Reel Specifications
Series Parts per Reel A B C D E W P1 P2 P3 H T
1210 ACC 2000 178 60 13.5 12 9 8 2 4 4 2.5 0.26
1812 ACC 500 178 60 13 17 14 12 2 8 4 4 0.35
Reel Dimensions (mm) Tape Dimensions (mm)
III. Description:
a. Ferrite drum core construction
b. Magnetically shielded
c. Enameled copper wire: H class
d. Product weight: 0.15g (ref.)
e. Moisture sensitivity Level 1
f. Products comply with RoHS’ requirements
g. Halogen Free available
IV. General specification:
a. Storage temp: -40�Cto+125�C
b. Operating temp: -40�Cto+125�C
(Temp. rise included)
c. Resistance to solder heat: 250�C 10 secs.
Recommended Solder Heat Resistance Profile
7Networking.PulseElectronics.com W717.G (03/19)
For More Information:
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Performance warranty of products offered on this data sheet is limited to the parameters specified. Data is subject to change without notice. Other brand and product names mentioned herein may
be trademarks or registered trademarks of their respective owners. © Copyright, 2019. Pulse Electronics, Inc. All rights reserved.
