SCOPE: CMOS, PARALLEL-LOADING, DUAL, MULTIPLYING 12-BIT D/A CONVERTER Device Type 01 02 03 04 05 06 Generic Number MX7537U(x)/883B MX7537T(x)/883B MX7537S(x)/883B MX7547U(x)/883B MX7547T(x)/883B MX7547S(x)/883B Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter MAXIM SMD Q L E 3 Mil-Std-1835 GDIP1-T24 or CDIP2-T24 CQCC1-N28 Case Outline Package Code 24 LEAD CERDIP 28 LEADLESS CHIP J24 L28 Absolute Maximum Ratings: VDD to DGND .................................................................................................. -0.3V, + 17V VRFBA, VRFBB to AGND ................................................................................................. 25V VREFA, VREFB to AGND ................................................................................................. 25V Digital Input Voltage to DGND .............................................................. -0.3V, (VDD+0.3V) IOUTA, IOUTB Voltage to DGND ......................................................... -0.3V, (VDD+0.3V) AGND to DGND ...................................................................................... -0.3V, (VDD+0.3V) Lead Temperature (soldering, 10 seconds) ........................................................................ +300C Storage Temperature ........................................................................................... -65C to +150C Continuous Power Dissipation ................................................................................... TA=+70C 24 pin CERDIP(derate 12.5mW/C above +70C) ....................................................... 1000mW 28 pin LCC(derate 10.2mW/C above +70C) ............................................................... 816mW Junction Temperature TJ ............................................................................................... +150C Thermal Resistance, Junction to Case, JC 24 pin CERDIP.......................................................................................................... 40C/W 28 pin LCC ................................................................................................................ 15C/W Thermal Resistance, Junction to Ambient, JA: 24 pin CERDIP.......................................................................................................... 80C/W 28 pin LCC ............................................................................................................... 98C/W Recommended Operating Conditions Ambient Operating Range (TA) ..................................................................... -55C to +125C Logic Supply Voltage (VLOGIC) ......................................................................... +4.5V to +5.5V Positive Supply Voltage (VDD)....................................................................... +11.4V to +16.5V Negative Supply Voltage (VEE)........................................................................ -11.4V to -16.5V Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ----------------------- Electrical Characteristics of MX7537/47/883B for /883B and SMD 5962-87763 and SMD 5962-89657 19-0057 Page 2 of Rev. C 7 TABLE 1. ELECTRICAL TESTS: TEST Group A Subgroup Device type 1,2,3 All 1,2,3 1,2,4,5 3,6 1,2,3 1,2,3 All 1,4 2,5 3,6 4 All 1,3 2 1,2,3 All RREF VDD=+16.5V, DAC registers loaded with all 0s VDD=+10.8V RREF VDD=+10.8V 1,2,3 1,4 2,3,5,6 VIH VDD=+10.8V and VDD=+16.5V 1,2,3 All VIL VDD=+10.8V and VDD=+16.5V 1,2,3 All 0.8 V IIN VIN=+0V or 16.5V 1,3 2 4 All 1.0 10 10 16.5 2.0 1.5 A pF V mA s 1.5 s Symbol ACCURACY Resolution RES Relative Accuracy RA Differential Nonlinearity Gain Error DNL AE Gain Tempco Gain/Temperature NOTE 2 Output Leakage Current IOUTA, IOUTB VREFA, VREFB Input Leakage VREFA, VREFB Input Resistance Match Digital Input High Voltage Digital Input Low Voltage Digital Input Leakage Current Digital Input Capacitance Supply Voltage Supply Current Current Settling Time TCFS Current Settling Time ILKG CIN VDD IDD tSL tSL VREFA to IOUTA FTE Feedthrough Error VREFB to IOUTB NOTE 2 VREFA to IOUTA FTE Feedthrough Error VREFB to IOUTB NOTE 2 ----------------------- CONDITIONS -55 C <=TA<= +125C 1/ Unless otherwise specified VDD=+10.8V and VDD=+16.5V VDD=10.8V (MX7547 only) Guaranteed monotonic Measured using RFBA, RFBB; DAC registers loaded with all 1's, VDD=10.8V To 0.5 LSB, IOUT load =100, CEXT=13pF, DAC output ___ measured from falling edge of WR To 0.5 LSB, IOUT load =100, CEXT=13pF, DAC output ___ measured from rising edge of WR DAC VREFA=20Vp-p registers 10kHz sine wave, loaded VREFB=0V with all 0s VREFB=20Vp-p 10kHz sine wave, VREFA=0V DAC VREFA=20Vp-p registers 10kHz sine wave, loaded VREFB=0V with all 0s VREFB=20Vp-p 10kHz sine wave, VREFA=0V Electrical Characteristics of MX7537/47/883B for /883B and SMD 5962-87763 and SMD 5962-89657 Limits Max 12.0 9 Units Bits 0.5 1.0 1.0 2.0 3.0 6.0 5.0 LSB 10 250 20 nA 1.0 3.0 % 2.4 LSB LSB ppm/C k V 9,10,11 All All All 4,5,6 4 1,2,3 4,5,6 (SMD) 4,5,6 -70 -65 (SMD) dB 4 (SMD) 1,2,3 -70 -65 (SMD) dB 1,2,3 1,2,3 Operating range, VDD=16.5V All Limits Min 19-0057 Page 3 of Rev. C 7 10.8 TEST Power-Supply Rejection Ratio Symbol CONDITIONS -55 C <=TA<= +125C 1/ Unless otherwise specified PSRR VDD=10.8V, VDD=12V5% 1 2,3 1 2,3 All COUT VDD=10.8V, VDD=VDD MAX VDD MIN DAC A, DAC B loaded with 0s 4 All Group A Subgroup Device type Limits Min Limits Max Units 0.01 0.02 01,02,03 %/% Output Capacitance (IOUTA, IOUTB) Channel-to-Channel Isolation TIMING Address Valid to Write-setup Time Address Valid to Write-hold Time Data-setup Time Data-hold Time Chip Select or Update to Write-setup Time VREFA to IOUTA VREFB to IOUTB DAC A, DAC B loaded with 1s VREFA=20Vp-p, 10kHz sine wave, VREFB=0V VREFB=20Vp-p, 10kHz sine wave, VREFA=0V t1 t2 t3 t4 0.01 0.02 -70 140 dB 4 All -84 9 10,11 9 10,11 9 10,11 9,10,11 9,10,11 01,02,03 20 30 15 25 60 80 25 0 01,02,03 All All 01,02,03 t5 Chip Select orUpdate to Write Hold Time Write Pulse Width t6 Clear Pulse Width t8 dB ns ns ns ns ns 9 10,11 9,10,11 t7 9 10,11 9 10,11 04,05,06 All All 80 100 0 80 100 80 100 All ns ns ns NOTE 1: Conditions unless otherwise specified, 4.5VVDD5.5V. VDD=10.8V to 16.5V, AGND=DGND=0V, use maximum possible reference voltage. NOTE 2: Typical number, for design aid only. MODE SELECTION TABLE: MX7537 ___ CLR 1 1 0 1 1 1 1 1 1 ----------------------- ___ UPD 1 1 X 1 1 1 1 0 ___ CS 1 X X 0 0 0 0 1 0 0 X = Don't care ___ WR X 1 X 0 0 0 0 0 A1 X X X 0 0 1 1 X A0 X X X 0 1 0 1 X 0 X X Function No data transfer No data transfer All registers cleared DAC A LS input register loaded with D7-D0 DAC A MS input register loaded with D3-D0 DAC B LS input register loaded with D7-D0 DAC B MS input register loaded with D3-D0 DAC A, DAC B registers updated simultaneously from input registers. Input registers not changed. DAC A, DAC B registers are transparent. Input registers loaded. Electrical Characteristics of MX7537/47/883B for /883B and SMD 5962-87763 and SMD 5962-89657 19-0057 Page 4 of Rev. C 7 MODE SELECTION TABLE: MX7547 ___ CSA X 1 ___ CSB X 1 ___ WR 1 X Function No data transfer No data transfer ___ ___ 0 A rising edge on CSA or CSB transfer data to the respective DAC. DAC A register loaded from data bus. DAC B register loaded from data bus. DAC A and DAC B registers loaded from data bus. WR input is edge-triggered. 0 1 1 0 0 0 X= don't care ORDERING INFORMATION: Package Pkg. Code 01 24 pin CERDIP J24 02 24 pin CERDIP J24 03 24 pin CERDIP J24 01 28 pin LCC L28 02 28 pin LCC L28 03 28 pin LCC L28 04 24 pin CERDIP J24 05 24 pin CERDIP J24 06 24 pin CERDIP J24 04 28 pin LCC L28 05 28 pin LCC L28 06 28 pin LCC L28 TERMINAL CONNECTIONS: MX7537 MX7537 MX7547 J24 L28 J24 AGNDA NC AGNDA IOUTA AGNDA IOUTA RFBA IOUTA RFBA Device ID MX7537UQ/883B MX7537TQ/883B MX7537SQ/883B MX7537UE/883B MX7537TE/883B MX7537SE/883B MX7547UQ/883B MX7547TQ/883B MX7547SQ/883B MX7547UE/883B MX7547TE/883B MX7547SE/883B 4 VREFA RFBA VREFA RFBA 18 5 VREFA 19 D1 D1 ___ CSA (LSB)D0 20 7 __ CS D0 ___ CSA (LSB)D0 VREFA 6 __ CS D0 MX7537 J24 A0 A1 ____ CLR ___ WR ___ UPD VDD 21 VREFB 8 9 D2 D3 NC D1 D2 D3 NC D1 22 23 RFBB IOUTB 10 D4 D2 D4 D2 24 AGNDB 11 12 13 14 D5 DGND D6 D7 D3 D4 D5 DGND D5 DGND D6 D7 D3 D4 D5 DGND 25 26 27 28 1 2 3 ----------------------- MX7547 L28 NC AGNDA IOUTA 15 16 17 Electrical Characteristics of MX7537/47/883B for /883B and SMD 5962-87763 and SMD 5962-89657 SMD Number 5962-8776303LA 5962-8776302LA 5962-8776301LA 5962-87763033C 5962-87763023C 5962-87763013C 5962-8965703LA 5962-8965702LA 5962-8965701LA 5962-89657033C 5962-89657023C 5962-89657013C MX7537 L28 NC D6 D7 MX7547 J24 D8 D9 D10 MX7547 L28 NC D6 D7 A0 D11 (MSB) ___ WR ____ CSB VDD D8 A1 ____ CLR ___ WR NC ___ UPD VDD VREFB RFBB IOUTB VREFB RFBB IOUTB AGNDB 19-0057 Page 5 of D9 D10 D11 NC ___ WR ____ CSB VDD VREFB RFBB IOUTB Rev. C 7 QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-Std-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883: 1. Test condition A, B, C, D. 2. TA = +125C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Method 5005 Group A Test Requirements Method 5005 Group C and D End-Point Electrical Parameters Method 5005 * ** ----------------------- Subgroups per Method 5005, Table 1 1 1*, 2, 3, 9, 10, 11 1, 2, 3, 4**, 5**, 6**, 9, 10**, 11** 1 PDA applies to Subgroup 1 only. If not tested shall be guaranteed to the limits specified in Table 1. Electrical Characteristics of MX7537/47/883B for /883B and SMD 5962-87763 and SMD 5962-89657 19-0057 Page 6 of Rev. C 7