
U421 – U426
CORPORATION
ABSOLUTE M AXIM UM R A T INGS (TA = 2 5oC unless otherwise noted )
Gate- to- Gate Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . ±40V
Gate- Dr ain or Gate -So urce Voltage . . . . . . . . . . . . . . . . -40 V
Gate Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mA
Device Dissip ation (Ea ch Side), TA = 2 5oC
(Derate 3.2 mW/ oC to 150oC). . . . . . . . . . . . . . 400mW
Total Device Dissipat ion, TA = 2 5 oC
(Derate 6.0 mW/ oC to 150oC ). . . . . . . . . . . . . 7 50 mW
Stor age Temper at ure R a nge. . . . . . . . . . . . . -65oC to +150 oC
ELECTRICA L CHARACTERI STICS (2 5 oC unless oth erw ise noted)
SYMBOL CHARACTERISTIC U421-3 U424-6 UNIT TEST CONDITIONS
MIN TYP MAX MIN TYP MAX
STATIC
BVGSS Gate-Source Breakdown Voltage -40 -60 -40 -60 VIG = -1 µA, VDS = 0
BVG1G2 Gate-Gate Breakdown Voltage ±40 ±40 IG = -1 µA, ID = 0, IS = 0
IGSS Gate Reverse Current
(1) 1.0 3.0 pA T = +25oCVGS = -20V,
VDS = 0
1.0 3.0 nA T = +125oC
IG Gate Operating Current
(1) .25 0.5 pA T = +25oCVDG = 10V,
ID = 30µA
.250 -500 T = +125oC
VGS (off) Gate-Source Cutoff Voltage -0.4 -2.0 -0.4 -2.0 VVDS = 10V, ID = 1nA
VGS Gate-Source Voltage -1.8 -2.9 VDG = 10V, ID = 30µA
IDSS Saturation Drain Current 60 1000 60 1800 µAVDS = 10V, VGS = 0
DYNAMIC
gfs Common-Source Forward Transconductance 300 1500 300 1500
VDS = 10V,
VGS = 0
f = 1 kHz
gos Common-Source Output Conductance 10 10
Ciss Common-Source Input Capacitance 3.0 3.0 pF f = 1MHz
Crss Common-Source Reverse Transfer Capacitance 1.5 1.5
gfs Common-Source Forward Transconductance 120 350 120 350
VDG = 10V,
ID = 30µA
f = 1kHz
gos Common-Source Output Conductance 3.0 3.0
enEquivalent Short Circuit In put 20 70 20 70 nV/ Hz f = 10Hz
10 10 f = 1kHz
NF Noise Figure 1.0 1.0 dB f = 10 Hz
RG = 10 MΩ
SYMBOL CHARACTERISTIC U421,4 U422,5 U423,6 UNIT TEST CONDITIONS
MIN TYP MAX MIN TYP MAX MIN TYP MAX
MATCH
| VGS1-VGS2 | Differe nt ial Gate -Sou r ce Vo lta ge 10 15 25 mV VDG = 10V, ID = 30 µA
| VGS1-VGS2 |
∆T Differential Gate-Source Voltage
Change with Temperature (2) 10 25 40 V/ oCVDG = 10V, ID = 30µA,
TA = -55oC, TB = 25oC,
TC = 125oC
CMRR Common Mode Rejectio n Rati o (3) 90 95 80 90 80 90 dB ID = 30µA, VDG = 10 to 20 V
NOTES:
1. Approximately doubles for every 10oC increase in TA.
2. Measured at endpoints TA, TB and TC.
3. CMRR = 20log10 [ ] V
DD = 10V.
4. Case lead not connected.
VDD
VGS1-VGS2
ELECTRICA L CHARACTERI STIC S (25oC Unless other wise note d)