Delivering POWER Excellence RELIABILITY REPORT 1/04 Power Semiconductor Devices January 2002 - December 2003 IXYS Corporation 3540 Bassett Street Santa Clara CA 95054 USA IXDN0009 Published February 2004 IXYS Semiconductor GmbH Edisonstrasse 15 D-68623 Lampertheim Germany Humidity Test QUALITY AND RELIABILITY Failure Modes: Degradation of electrical leakage characteristics due to moisture penetration into plastic packages. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, IGSS, IGES, VTH. IXYS is committed to setting a new standard for excellence in Power Semiconductors. Reflecting our dedication to industry leadership in the manufacture of medium to high power devices, reliability has assumed a primary position in raw material selection, design, and process technology. Reliability utilizes information derived from applied research, engineering design, analysis of field applications and accelerated stress testing and integrates this knowledge to optimize device design and manufacturing processes. All areas that impact reliability have received considerable attention in order to achieve our goal to be the # 1 Reliability Supplier of Power Semiconductor products. We believe IXYS products should be the most reliable components in your system. We have committed significant resources to continuously improve and optimize our device design, wafer fab processes, assembly processes and test capabilities. As a result of this investment, IXYS has realized a dramatic improvement in reliability performance on all standardized tests throughout the product line. Excellence in product reliability is "built-in", not testedin. Moreover, it requires a total systems approach, involving all parties: from design to raw materials to manufacturing. In addition to qualifying new products released to the market, life and environmental tests are periodically performed on standard products to maintain feedback on assembly and fabrication performance to assure product reliability. Further information on reliability of power devices is provided on pages www.ixys.com. Power Cycle Failure Modes: Thermal fatigue of silicon-metal and metal-metal interfaces due to heating and cooling can cause thermal and electrical performance degradation. Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS, ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM, VRRM. TERMS IN TABLES SUMMARY TABLES 1 AND 2: AF: acceleration factor AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k } (1) Ea: activation energy; @ HTRB Ea = 1.0 eV @ HTGB Ea = 0.4 eV -5 k: Boltzmann's constant 8.6* 10 eV/K T1: abs. application junction temperature (273+Tj) K T2: abs. test junction temperature (273+Tj) K UCL: upper confidence limit (60%) Total Failures @ 60% UCL: RELIABILITY TESTS N = r + dr (2) High Temperature Reverse Bias (HTRB) r: number of failed devices dr: additional term, depending on both r and UCL Failure Modes: Gradual degradation of break-down characteristics due to presence of foreign materials and polar/ionic contaminants disturbing the electric field termination structure. Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM, IDSS, ICES, IDRM, IRRM, VTH. MTTF: Mean Time To Failures = 1/Failure Rate 9 FIT: 1 FIT = 1 failure / 10 hrs High Temperature Gate Bias (HTGB) Failure Modes: Rupture of the gate oxide due to localized thickness variations, structural anomalies, particulates in the oxide, channel inversion due to presence of mobile ions in the gate oxide. Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES. TABLES 3: T: max Tj - min Tj during Test Temperature Cycle DEFINITION OF FAILURE Failure modes: Thermal fatigue of silicon-metal and metal-metal interfaces due to heating and cooling, causing thermal and electrical performance degradation. Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF. Parametric failure means a parameter specified in data sheet is exceeded as specified in IEC 60747-1 and the functionality of the device is not impaired. 2 Summary of Tables 1A - 1J: HTRB Failure Rate [FIT] 125C, 60% UCL Failure Rate [FIT] 90C, 60% UCL Total Lots Tested Total Devices Tested Total Actual Failures 60% UCL {eq. (2)} Total Equivalent Device Hours @ 125C {AF eq. (1)} MTTF 125C 60% UCL (Years) 90C 60% UCL Table 1A Table 1B Table 1C Table1D Table 1E Table 1F Table 1G Table 1H Table 1J MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode ISOPLUS Breakover discrete device *) Module Module Rec. Bridge*) *) Diode*) discrete device*) 470 28 71 2031 0 0.92 54466 3261 7 70 1 2.00 5257 315 31 320 0 0.92 8154 488 17 163 0 0.92 5316 318 21 350 0 0.92 4508 270 12 210 0 0.92 2593 155 11 190 0 0.92 17 380 0 - 61828 3702 4 80 0 0.92 1959430 243 4060 36720 2 35 174995 22 363 112824 14 234 173046 21 359 204077 25 423 354810 44 735 462726 - 14880 2 31 Summary of Table 2A - 2C: HTGB Failure Rate [FIT] 125C, 60% UCL Failure Rate [FIT] 90C, 60% UCL Total Lots Tested Total Devices Tested Total Actual Failures 60% UCL {eq. (2)} Total Equivalent Device Hours @ 125C {AF eq. (1)} MTTF 125C 60% UCL (Years) 90C 60% UCL Table 2A Table 2B Table 2C MOSFET/IGBT MOSFET/IGBT ISOPLUS discrete device *) Module 722 43 45 1290 0 0.92 26099 1563 5 50 0 0.92 5 140 0 - 1273360 158 2639 35250 4 73 120000 - *) including ISOPLUS 3 Diode Summary of Tables 3A - 3H: Power Cycle Total Total Total Total Lots Tested Devices Tested Failures Device Cycles Table 3A Table 3B Table 3C Table3D Table 3E Table 3F Table 3G Table 3H MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Isoplus discrete device *) Module Module Rec. Bridge*) *) Diode*) discrete device*) 15 347 0 3580000 2 20 0 200000 8 80 0 1040000 8 80 0 390000 15 250 0 1160000 8 150 0 570000 9 170 0 1080000 8 176 0 1460000 Summary of Tables 4A - 4J: Temperature Cycle Total Total Total Total Lots Tested Devices Tested Failures Device Cycles Table 4A Table 4B Table 4C Table4D Table 4E Table 4F Table 4G Table 4H Table 4J MOSFET/IGBT MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Isoplus Breakover discrete device *) Module Module Rec. Bridge*) *) Diode*) discrete device*) 14 340 0 76400 6 60 1 2700 29 401 3 69700 24 245 1 15600 28 509 3 40150 22 450 2 27400 22 360 0 46200 9 180 0 9600 Diode Summary of Tables 5A - 5H: Humidity Test Total Total Total Total Lots Tested Devices Tested Failures Device Hours Table 5A Table 5C Table5D Table 5E Table 5F Table 5G Table 5H Table 5J MOSFET/IGBT Thyr./Diode Controller/ FRED Schottky Thyr./Diode Isoplus Breakover discrete device *) Module Rec. Bridge*) *) Diode*) discrete device*) 13 350 0 54960 6 60 0 10080 3 30 0 5040 10 160 0 14160 3 60 0 5760 10 190 1 15840 *) including ISOPLUS 4 Diode 10 190 1 15840 4 80 0 3840 10 180 0 16400 HTRB (Tables 1A .. 1J) TABLE 1A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 1 IRFP260 SP0243 160 2 IRFP450 SK0224 400 3 IRFP460 SK0229 400 4 IXDA20N120AS 446 960 5 IXDA20N120AS 640 960 6 IXDA20N120AS 757 960 7 IXDA20N120AS 757 960 8 IXEH40N120 539 960 9 IXER60N120 488 960 10 IXFB70N60Q2 SP0335 480 11 IXFB80N50Q2 SP0251 400 12 IXFF24N100 389 800 13 IXFH12N100F SP0130 800 14 IXFH13N50 SP0338 400 15 IXFH15N80 SP 0224 640 16 IXFH16N90Q SP 0242 720 17 IXFH17N80Q SK0322 640 18 IXFH20N60 SK0339 480 19 IXFH21N50 SK0342 400 20 IXFH21N50Q K0246E 400 21 IXFH23N60Q SK0322 480 22 IXFH24N50 K0314K 400 23 IXFH26N50 SP 0228 400 24 IXFH26N50 SP0237 400 25 IXFH26N50Q K0315H 400 26 IXFH26N50Q SK0339 400 27 IXFH26N50Q SP0308 400 28 IXFH26N60Q K0311J 480 29 IXFH28N50F SP 0151 400 30 IXFH28N50Q SP0325 400 31 IXFH32N50 SK 0224 400 32 IXFH32N50Q SK0330 400 33 IXFH32N50Q SP 0147 400 34 IXFH40N50Q SP0326 400 35 IXFH50N20 SK0325 160 36 IXFH60N20F SP 0151 160 37 IXFH66N20Q SK0306 160 38 IXFH6N100F SP 9936 800 39 IXFH6N100Q TP 0143 800 40 IXFH80N10Q SK0313 80 41 IXFH88N20Q SK0302 160 42 IXFH9N80 TK 0229 640 43 IXFK27N80 SP 0234 640 44 IXFK48N50 SP0309 400 45 IXFK55N50F SP 0216 400 46 IXFK73N30Q SP0311 240 47 IXFK90N30 SP 0244 240 48 IXFN36N100 SP 0229 800 49 IXFX27N80Q SP 0236 640 50 IXFX34N80 SP 0212 640 51 IXFX48N50Q SP0339 400 52 IXFX55N50 SP 0223 400 53 IXFX55N50F SP0305 400 54 IXKN40N60C 838 480 55 IXTH41N25 SP0311 200 56 IXTH48N20 SP0315 160 57 IXTH72N20 SP0320 160 58 IXTH75N15 K0307B 120 59 IXTH75N15 SK0338 120 60 IXTK120N25 SP 0151 200 61 IXTK120N25 SP0305 200 Temp. [C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 105 105 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 5 Sample Size 30 30 30 20 20 20 20 20 20 30 30 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 29 30 30 30 30 30 30 30 30 30 30 30 30 30 30 10 30 30 30 30 30 25 30 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 3360 20000 20000 20000 20000 20000 30000 30000 10000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 29000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 1680 30000 30000 30000 30000 30000 25000 30000 Remark TABLE 1A (cont'd): MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 62 IXTK180N15 SP 0151 120 63 IXTK250N10 SP0318 80 64 IXTK62N25 SP 0150 200 65 IXTK62N25 SP0331 200 66 IXTK62N25 SP0340 200 67 IXTK62N25 SS0332 200 68 IXTK90N15 SP 0150 120 69 IXTP3N120 K0321 800 70 IXTQ52N30P SK0342 240 71 IXTQ69N30P SK0342 240 Temp. [C] 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 25 30 39 30 30 30 33 30 30 30 Failures TABLE 1B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MUBW15-12A7 392 2 MUBW50-12A8 390 3 MWI30-06A7 553 4 MWI75-12A8 677 5 MWI75-12A8 677 6 VMM300-03FP 636 7 VMM90-09F 508 Voltage [V] 1120 960 480 960 960 240 720 Temp. [C] 125 125 125 125 125 125 125 Time [hrs] 168 1000 168 1000 168 168 1000 Sample Size 10 10 10 10 10 10 10 Failures TABLE 1C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC162 874 2 MCC162-18 732 3 MCC21-14 396 4 MCC250-16 652 5 MCC26-16 796 6 MCC310-16 870 7 MCC312-16 449 8 MCC44-16io1 592 9 MCC56 685 10 MCC56-16io1 448 11 MCC56-18 696 12 MCC72-16 727 13 MCC95-16io1 598 14 MCC95-16io1 599 15 MCC95-16io1B 816 16 MCD162-16 564 17 MCD162-16io1 564 18 MCD56-16io1B 809 19 MCO150-12io1 607 20 MCO150-12io1 607 21 MDD172-16 400 22 MDD172-16 400 23 MDD26-16 519 24 MDD56-16 679 25 MDD56-18 423 26 MDD56-18 423 27 MDD56-18 423 28 MDD56-18 423 29 MDD56-18 739 30 MDD95-16 466 31 MDO500-22 815 Voltage [V] 1260 1260 980 1120 1120 1120 1120 1120 1260 1120 1260 1120 1120 1280 1120 1120 1120 1120 960 840 1120 1120 1120 1120 1260 1260 1260 1280 1260 1120 1540 Temp. [C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 150 150 125 125 125 125 125 125 125 125 125 125 Time [hrs] 168 168 168 168 500 168 168 168 1000 168 1000 168 168 168 168 168 1100 500 1000 168 1000 168 168 168 1000 1000 1000 1000 1000 168 168 Sample Size 10 10 10 10 10 10 10 10 10 10 20 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 Failures 6 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 25000 30000 39000 30000 30000 30000 33000 30000 30000 30000 Remark Device Hours [hrs] 1680 10000 1680 10000 1680 1680 10000 Remark Device Hours [hrs] 1680 1680 1680 1680 5000 1680 1680 1680 10000 1680 20000 1680 1680 1680 1680 1680 11000 5000 10000 1680 10000 1680 1680 1680 10000 10000 10000 10000 10000 1680 1680 Remark TABLE 1D: Controller/Rectifier Bridge Date Code # Part Number or Test # 1 MMO75-16 761 2 VBO19-16DT1 794 3 VBO25-16A 523 4 VHF28-16io5 404 5 VHF36-16 463 6 VUB120-12MO1 436 7 VUB120-16NO2 833 8 VUB72-16 835 9 VUM24-05 846 10 VUM24-05 846 11 VUO121-16NO1 709 12 VUO34-18 422 13 VUO34-18 422 14 VUO36-16NO8 740 15 VUO50-16 625 16 VUO86-16NO7 428 17 VVY40-16 700 Voltage [V] 1120 1120 1120 1120 1120 1120 960 960 560 400 1120 1260 1260 1120 1120 1120 1120 Temp. [C] 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 125 Time [hrs] 168 168 168 1000 168 168 1000 500 300 300 1000 168 1000 168 168 168 168 Sample Size 10 10 10 10 10 3 10 10 10 10 10 10 10 10 10 10 10 Failures Date Code or Test # 742 600 560 554 486 483 722 465 381 715 575 525 525 791 552 552 714 487 487 499 403 Voltage [V] 200 240 480 480 960 160 960 160 960 960 960 480 480 480 480 480 600 160 160 480 480 Temp. [C] 125 125 125 125 125 125 125 125 125 125 125 125 150 125 125 125 150 125 125 125 125 Time [hrs] 1000 168 168 1000 168 168 1000 168 168 168 168 168 168 168 1000 1000 168 1000 168 168 168 Sample Size 20 20 20 20 20 10 10 20 20 20 10 20 20 20 20 20 20 10 10 10 10 Failures Date Code or Test # 582 518 789 714 790 430 513 574 501 500 676 676 Voltage [V] 240 144 32 600 32 100 100 150 80 8 50 50 Temp. [C] 125 125 100 150 100 125 150 150 125 100 100 100 Time [hrs] 1000 168 1000 168 1000 168 168 1000 1000 1000 168 168 Sample Size 20 20 20 20 20 10 20 20 20 20 10 10 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 1680 1680 1680 10000 1680 504 10000 5000 3000 3000 10000 1680 10000 1680 1680 1680 1680 Remark Device Hours [hrs] 20000 3360 3360 20000 3360 1680 10000 3360 3360 3360 1680 3360 3360 3360 20000 20000 3360 10000 1680 1680 1680 Remark Device Hours [hrs] 20000 3360 20000 3360 20000 1680 3360 20000 20000 20000 1680 1680 Remark TABLE 1E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 DSEC60-02A DSEC60-03AR DSEC60-06A DSEI120-06A DSEI20-12A DSEI2x121-02A DSEI2x61-12B DSEK60-02 DSEP15-12CR DSEP15-12CR DSEP2x31-12A DSEP30-06CR DSEP30-06CR DSEP60-06A DSEP8-06B DSEP8-06B DSS17-06CR MEK350-02B MEK350-02B MEK90-06F MEK95-06DA"E" 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 TABLE 1F: Schottky Diode # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 DGS3-03AS DGSK20-018A DSS1-40BA DSS17-06CR DSS2-40BB DSS2x160-01A DSSK28-01A DSSK50-015A DSSK70-008A DSSK80-0008D DSSK80-006B DSSK80-006B 7 0 0 0 0 0 0 0 0 0 0 0 0 TABLE 1G: Thyristor/Diode single device Date Code # Part Number or Voltage Test # [V] 1 CS22-12 707 840 2 CS30-16io1 417 1120 3 CS30-16io1 556 1120 4 CS30-16io1 556 1120 5 CS60-14io1 594 980 6 DSA35-18 407 1260 7 DSAI75-16B 668 1120 8 DSI45-16AR 823 1120 9 DSIK45-16AR 608 1120 10 DSP25-16A 877 1120 11 DSP8-12AC 529 840 Temp. [C] 125 125 125 125 125 150 150 150 150 150 150 Time [hrs] 1000 168 1000 1000 1000 168 168 168 1000 168 1000 Sample Size 20 20 10 10 30 10 10 20 20 20 20 Failures Time [hrs] 168 168 168 168 168 168 168 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 Sample Size 20 20 20 20 20 20 20 20 20 20 20 10 30 30 30 30 30 Failures 480 480 1120 1120 840 600 960 800 640 640 400 400 400 Temp. [C] 125 125 125 125 150 125 150 150 150 150 125 125 125 125 125 125 125 Voltage [V] 480 560 720 800 Temp. [C] 125 125 125 125 Time [hrs] 168 240 168 168 Sample Size 20 20 20 20 Failures 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 20000 3360 10000 10000 30000 1680 1680 3360 20000 3360 20000 Remark Device Hours [hrs] 3360 3360 3360 3360 3360 3360 3360 20000 20000 3360 20000 10000 30000 30000 30000 30000 30000 Remark Device Hours [hrs] 3360 4800 3360 3360 Remark TABLE 1H: ISOPLUS # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 DSEC60-03AR DSEK60-02 DSEP15-12CR DSEP15-12CR DSEP30-06CR DSEP30-06CR DSI45-16AR DSIK45-16AR DSP8-12AC DSS17-06CR IXER60N120 IXFF24N100 IXFX27N80Q IXFX34N80 IXFX48N50Q IXFX55N50 IXFX55N50F Date Code or Test # 600 465 381 715 525 525 823 608 529 714 488 389 SP 0236 SP 0212 SP0339 SP 0223 SP0305 TABLE 1J: Breakover Diode Date Code # Part Number or Test # 1 IXBOD1-06 521 2 IXBOD1-07 453 3 IXBOD1-09 743 4 IXBOD1-10 868 Voltage [V] 240 160 960 8 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 HTGB (Tables 2A .. 2C) TABLE 2A: MOSFET/IGBT single device Date Code # Part Number or Voltage Test # [V] 1 IRFP260 SP0243 16 2 IRFP450 SK0224 16 3 IRFP460 SK0229 16 4 IXBH9N160G 440 16 5 IXDN55N120D1 596 16 6 IXFB38N100Q2 SP0320 16 7 IXFB80N50Q2 SP0251 16 8 IXFH12N100F SP0130 16 9 IXFH13N50 SP0338 16 10 IXFH15N80 SP 0224 16 11 IXFH16N90Q SP 0242 16 12 IXFH20N60 SK0339 16 13 IXFH21N50 SK0342 16 14 IXFH21N50Q K0246E 16 15 IXFH24N50 K0314K 16 16 IXFH26N50 SP0237 16 17 IXFH26N50Q K0315H 16 18 IXFH26N50Q SK0339 16 19 IXFH26N50Q SP0308 16 20 IXFH26N60Q K0311J 16 21 IXFH32N50 SK 0224 16 22 IXFH32N50Q SK0330 16 23 IXFH32N50Q SP 0147 16 24 IXFH50N20 SK0325 16 25 IXFH80N10Q SK0313 16 26 IXFK27N80 SP 0234 16 27 IXFK48N50 SP0309 16 28 IXFK55N50F SP 0216 16 29 IXFK90N30 SP 0244 16 30 IXFN36N100 SP 0229 16 31 IXFX27N80Q SP 0236 16 32 IXFX34N80 SP 0212 16 33 IXFX48N50Q SP0339 16 34 IXFX4N100Q TP0149 16 35 IXKN40N60C 838 20 36 IXLF19N250 577 30 37 IXTH41N25 SP0311 16 38 IXTH48N20 SP0315 16 39 IXTH72N20 SK0306 16 40 IXTH75N15 K0307B 16 41 IXTH75N15 SK0338 16 42 IXTK120N25 SP0305 16 43 IXTK250N10 SP0318 16 44 IXTQ52N30P SK0342 16 45 IXTQ69N30P SK0342 16 Temp. [C] 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 168 1000 1000 1000 1000 1000 1000 1000 1000 1000 1000 Sample Size 30 30 30 20 10 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 10 20 30 30 30 30 30 30 30 30 30 Failures TABLE 2B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MUBW25-12A7 496 2 MUBW25-12A7 496 3 MUBW30-06A7 391 4 MUBW30-06A7 391 5 VMM300-03FP 636 Temp. [C] 150 125 150 125 125 Time [hrs] 168 1685 168 168 1000 Sample Size 10 10 10 10 10 Failures Voltage [V] 16 16 16 16 16 9 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 30000 30000 30000 20000 1680 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 30000 1680 20000 30000 30000 30000 30000 30000 30000 30000 30000 30000 Remark Device Hours [hrs] 1680 16850 1680 1680 10000 Remark TABLE 2C: ISOPLUS # Part Number 1 2 3 4 5 IXLF19N250 IXFX27N80Q IXFX34N80 IXFX48N50Q IXFX4N100Q Date Code or Test # 577 SP 0236 SP 0212 SP0339 TP0149 Voltage [V] 30 16 16 16 16 Temp. [C] 125 125 125 125 125 Time [hrs] 1000 1000 1000 1000 1000 Sample Size 20 30 30 30 30 Failures TABLE 3A: MOSFET/IGBT single device Date Code # Part Number or Tj(max) Test # [C] 1 IXBH9N160G 440 125 2 IXFB70N60Q2 SP0335 125 3 IXFH12N100F SP0130 125 4 IXFH26N50 SP 0228 125 5 IXFH26N50Q K0315H 125 6 IXFH26N60Q K0311J 125 7 IXFH50N20 SK0325 125 8 IXFK90N30 SP 0244 125 9 IXFN55N50 558 125 10 IXFX27N80Q SP 0236 125 11 IXFX48N50Q SP0339 125 12 IXFX4N100Q TP0149 125 13 IXFX55N50 SP 0223 125 14 IXTQ52N30P SK0342 125 15 IXTQ69N30P SK0342 125 [K] 80 100 100 100 100 100 100 100 80 100 100 100 100 100 100 Number of Cycles 5000 10000 10000 10000 10000 10000 10000 10000 24000 10000 10000 10000 10000 10000 10000 Sample Size 20 24 24 24 24 24 24 24 15 24 24 24 24 24 24 Failures TABLE 3B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MUBW50-12A8 390 2 VWI6-12P1 433 Tj(max) [C] 125 125 [K] 80 80 Number of Cycles 10000 10000 Sample Size 10 10 Failures TABLE 3C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC200 747 2 MCC310-12 507 3 MCC56 685 4 MCC56-16io1 820 5 MCO150-12io1 607 6 MDD56-12 532 7 MDD95-12 452 8 VCO180-16io7 526 Tj(max) [C] 125 125 125 125 125 125 125 125 [K] 80 80 80 80 80 80 80 80 Number of Cycles 20000 10000 35000 10000 4000 10000 10000 5000 Sample Size 10 10 10 10 10 10 10 10 Failures TABLE 3D: Controller, Rectifier Bridge Date Code # Part Number or Tj(max) Test # [C] 1 VBO125-16NO7 741 125 2 VHF28-14 457 125 3 VHF28-16io5 404 125 4 VUE50-12 717 125 5 VUO110-16NO7 565 125 6 VUO110-16NO7 565 125 7 VUO25-16NO8 434 125 8 VUO34-16 516 125 [K] 80 80 80 80 80 80 80 80 Number of Cycles 2000 5000 10000 5000 8000 2000 2000 5000 Sample Size 10 10 10 10 10 10 10 10 Failures 0 0 0 0 0 Device Hours [hrs] 20000 30000 30000 30000 30000 Remark POWER CYCLE (Tables 3A ..3H) 10 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Cycles Remark 100000 240000 240000 240000 240000 240000 240000 240000 360000 240000 240000 240000 240000 240000 240000 Device Cycles Remark 100000 100000 Device Cycles Remark 200000 100000 350000 100000 40000 100000 100000 50000 Device Cycles 20000 50000 100000 50000 80000 20000 20000 50000 Remark TABLE 3E: FRED Date Code or Test # 795 664 394 554 483 722 720 715 468 474 552 714 485 485 639 Tj(max) [C] 125 150 125 130 125 125 150 125 150 150 150 150 125 125 125 [K] 80 105 80 85 80 80 105 80 105 105 105 105 80 80 80 Number of Cycles 4000 2000 10000 4000 2000 5000 2000 5000 4000 2000 4000 5000 10000 10000 5000 Sample Size 20 20 20 20 10 10 20 20 20 20 20 20 10 10 10 Failures Date Code or Test # 471 714 409 409 514 513 574 585 Tj(max) [C] 145 150 125 125 125 125 125 113 [K] 100 105 80 80 80 80 80 80 Number of Cycles 4000 5000 5000 5000 5000 2000 6000 2000 Sample Size 20 20 10 10 10 40 20 20 Failures TABLE 3G: Thyristor/Diode single device Date Code # Part Number or Tj(max) [C] Test # 1 CS22-12 707 125 2 CS45-16io1R 464 125 3 CS9444L 602 125 4 CS9444LD 601 125 5 DS1-12D 470 150 6 DSA17-16A 534 125 7 DSA35-18 407 150 8 DSA75-16B 718 150 9 DSI45-12A 613 125 [K] 80 80 80 80 105 80 105 105 80 Number of Cycles 4000 5000 6000 6000 20000 2000 2000 2000 4000 Sample Size 20 20 30 30 20 10 10 10 20 Failures [K] 80 80 80 105 100 100 100 100 Number of Cycles 5000 10000 5000 5000 10000 10000 10000 10000 Sample Size 20 20 20 20 24 24 24 24 Failures # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 DSEC30-02A DSEC60-06A DSEE15-12CC DSEI120-06A DSEI2x121-02A DSEI2x61-12B DSEK60-06A DSEP15-12CR DSEP29-06A DSEP29-06B DSEP8-06B DSS17-06CR MEK350-02 MEK350-02 MEO450-12DA "L" 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Cycles Remark 80000 40000 200000 80000 20000 50000 40000 100000 80000 40000 80000 100000 100000 100000 50000 TABLE 3F: Schottky Diode # Part Number 1 2 3 4 5 6 7 8 DGS4-025A DSS17-06CR DSS2x41-01A DSS2x41-01A DSS2x61-0045A DSSK28-01A DSSK50-015A DSSK70-0015B 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Cycles Remark 80000 100000 50000 50000 50000 80000 120000 40000 Device Cycles Remark 80000 100000 180000 180000 400000 20000 20000 20000 80000 TABLE 3H: ISOPLUS # Part Number 1 2 3 4 5 6 7 8 CS45-16io1R DSEE15-12CC DSEP15-12CR DSS17-06CR IXFX27N80Q IXFX48N50Q IXFX4N100Q IXFX55N50 Date Code or Test # 464 394 715 714 SP 0236 SP0339 TP0149 SP 0223 Tj(max) [C] 125 125 125 150 125 125 125 125 11 0 0 0 0 0 0 0 0 Device Cycles 100000 200000 100000 100000 240000 240000 240000 240000 Remark TEMPERATURE CYCLE (Tables 4A ..4J) TABLE 4A: MOSFET/IGBT single device Date Code Low # Part Number or Temp. Test # [C] 1 FMM150-0075P 566 -55 2 FMM150-0075P 566 -55 3 IXBH9N140G 542 -55 4 IXDH20N120D1 420 -55 5 IXFC26N50Q 648 -45 6 IXFF24N100 389 -55 7 IXFF55N50 623 -45 8 IXFG55N50 622 -45 9 IXFK90N30 IX9X -65 10 IXFL55N50 621 -45 11 IXFN80N50 693 -40 12 IXKN40N60C 838 -40 13 IXTK120N25 IX90 -65 14 IXTK80N25 IX81 -65 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 250 40 50 20 250 50 250 100 500 100 100 20 500 500 Sample Size 20 20 20 20 30 20 30 30 30 30 20 10 30 30 Failures TABLE 4B: MOSFET/IGBT Module Date Code # Part Number or Test # 1 MUBW25-12A7 496 2 MUBW30-06A7 391 3 MWI30-06A7 553 4 VMM90-09F 425 5 VWI6-12P1 433 6 VWM350-0075 590 Low Temp. [C] -40 -40 -40 -40 -40 -40 High Temp. [C] 150 150 150 150 150 150 Number of Cycles 50 50 50 50 20 50 Sample Size 10 10 10 10 10 10 Failures TABLE 4C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC 162 847 2 MCC162 0227 3 MCC21-14 725 4 MCC26 495 5 MCC26-14io8 723 6 MCC44 495 7 MCC44 673 8 MCC44-12 469 9 MCC56 685 10 MCC56 685 11 MCC56-1 697 12 MCC56-1 698 13 MCC56-1 0307 14 MCC56-12 754 15 MCC56-12 784 16 MCC56-14 405 17 MCC56-14 785 18 MCC56-14 786 19 MCC56-16 811 20 MCC56-16 812 21 MCC56-8 699 22 MCC72-16 386 23 MCD162-16 803 24 MCD56-16 783 25 MCO150-12io1 607 26 MDD172 0329 27 MDD26-14 724 28 MDD56 495 29 MDD56 738 30 MDD56 738 31 MDD56-16 517 32 MDD95-08 637 Low Temp. [C] -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 100 50 100 500 100 500 150 50 300 100 200 200 350 100 100 50 100 100 100 100 200 50 100 100 50 50 50 500 300 290 50 50 Sample Size 10 10 10 12 10 20 10 10 20 20 10 10 20 10 10 10 10 10 30 30 10 10 10 10 10 30 10 20 9 10 10 10 Failures 12 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 0 1 0 0 0 0 0 0 0 0 0 1 1 0 0 1 0 0 0 0 0 0 0 0 0 0 1 1 0 0 Device Cycles Remark 5000 800 1000 400 7500 1000 7500 3000 15000 -65, 150C / 10min 3000 2000 200 15000 -65, 150C / 10min 15000 -65, 150C / 10min Device Cycles Remark 500 500 500 500 200 500 Device Cycles 1000 500 1000 6000 1000 10000 1500 500 6000 2000 2000 2000 7000 1000 1000 500 1000 1000 3000 3000 2000 500 1000 1000 500 1500 500 10000 2700 2900 500 500 Remark TABLE 4E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 DSEC30-06A DSEC60-02A DSEC60-02AQ DSEC60-03A DSEC60-03AR DSEI120-06A DSEI2x121-02A DSEI2x61-12B DSEI60-06A DSEI8-06A DSEK60-02 DSEK60-06A DSEP130-06A DSEP130-06A DSEP15-12CR DSEP15-12CR DSEP29-06A DSEP29-06B DSEP29-06B DSEP2x31-12A DSEP30-06B DSEP30-06CR DSEP60-06A MEK250-12 MEK250-12 MEK350-02B MEK350-02B MEO450-12I Date Code or Test # 484 782 839 681 600 554 483 722 705 778 465 720 616 616 715 381 468 767 474 575 831 525 791 384 384 651 0303 438 Low Temp. [C] -55 -55 -55 -55 -55 -40 -40 -40 -40 -40 -40 -40 -55 -55 -55 -55 -55 -55 -55 -40 -55 -55 -55 -40 -40 -40 -40 -40 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 50 200 100 100 20 350 10 50 50 100 20 50 50 50 100 20 50 100 20 10 150 20 100 50 50 50 100 50 Sample Size 29 20 20 20 20 20 10 10 20 40 20 20 20 20 20 20 20 20 20 10 20 20 20 10 10 10 10 10 Failures Date Code or Test # 583 518 763 763 789 790 430 458 514 744 744 854 513 442 442 442 574 665 585 489 729 729 Low Temp. [C] -55 -55 -55 -55 -55 -55 -40 -40 -40 -40 -40 -55 -55 -40 -55 -55 -55 -55 -55 -55 -55 -55 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 200 20 100 100 100 100 10 100 10 10 10 100 20 20 120 20 50 50 20 50 100 100 Sample Size 20 20 20 20 20 20 10 10 10 40 40 20 20 20 20 20 20 20 20 20 20 20 Failures 0 0 0 0 0 0 0 0 1 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 Device Cycles Remark 1450 4000 2000 2000 400 7000 100 500 1000 4000 400 1000 1000 1000 2000 400 1000 2000 400 100 3000 400 2000 500 500 500 1000 500 TABLE 4F: Schottky Diode # Part Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 DGS19-025AS DGSK20-018A DGSK24-025CS DGSK24-025CS DSS1-40BA DSS2-40BB DSS2x160-01A DSS2x200-0008D DSS2x61-0045A DSS81-0045 DSS81-0045B DSSK20-0045AM DSSK28-01A DSSK28-01AS DSSK28-01AS DSSK28-01AS DSSK50-015A DSSK50-01A DSSK70-0015B DSSK80-0008D DSSK80-006B DSSK80-006B 13 0 0 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 0 Device Cycles 4000 400 2000 2000 2000 2000 100 1000 100 400 400 2000 400 400 2400 400 1000 1000 400 1000 2000 2000 Remark TABLE 4G: Thyristor/Diode single device Date Code Low # Part Number or Temp. Test # [C] 1 CS22-12 707 -40 2 CS23-12io2 504 -40 3 CS30-16io1 556 -40 4 CS30-16io1 556 -40 5 CS30-16io1 382 -55 6 CS35-14io4 825 -40 7 CS45 687 -40 8 CS45 687 -40 9 CS9444L 602 -55 10 CS9444LD 601 -55 11 DSA17-16A 534 -40 12 DSA9-16F 704 -40 13 DSAI35-16A 735 -40 14 DSAI75-18B 439 -40 15 DSI45-16 764 -40 16 DSI45-16 764 -40 17 DSI45-16AR 823 -40 18 DSI75-04D 853 -40 19 DSI75-04D 853 -40 20 DSIK45-16AR 608 -40 21 DSP45-16AR 645 -40 22 DSP8-08S 758 -40 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 150 Number of Cycles 50 20 350 350 50 20 150 50 250 250 20 20 20 20 100 100 50 50 50 100 100 100 Sample Size 20 10 20 20 20 10 20 20 30 30 10 10 10 10 10 10 20 10 10 20 20 20 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Cycles Remark 1000 200 7000 7000 1000 200 3000 1000 7500 7500 200 200 200 200 1000 1000 1000 500 500 2000 2000 2000 TABLE 4H: ISOPLUS Date Code or Test # 600 465 381 715 525 823 608 645 389 Low Temp. [C] -55 -40 -55 -55 -55 -40 -40 -40 -55 High Temp. [C] 150 150 150 150 150 150 150 150 150 Number of Cycles 20 20 20 100 20 50 100 100 50 Sample Size 20 20 20 20 20 20 20 20 20 Failures TABLE 4J: Breakover Diode Date Code # Part Number or Test # 1 IXBOD1-06 521 2 IXBOD1-07 453 3 IXBOD1-07 453 4 IXBOD1-07 597 5 IXBOD1-08 550 6 IXBOD1-08 550 7 IXBOD1-08 612 8 IXBOD1-09 597 9 IXBOD1-09 743 10 IXBOD1-10 868 Low Temp. [C] -40 -40 -40 -40 -40 -40 -40 -40 -40 -40 High Temp. [C] 150 150 150 150 150 150 150 150 150 150 Number of Cycles 20 30 20 50 200 200 200 50 50 50 Sample Size 20 20 20 10 20 20 20 10 20 20 Failures # Part Number 1 2 3 4 5 6 7 8 9 DSEC60-03AR DSEK60-02 DSEP15-12CR DSEP15-12CR DSEP30-06CR DSI45-16AR DSIK45-16AR DSP45-16AR IXFF24N100 14 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Cycles Remark 400 400 400 2000 400 1000 2000 2000 1000 Device Cycles 400 600 400 500 4000 4000 4000 500 1000 1000 Remark HUMIDITY TEST (Tables 5A ..5H) TABLE 5A: MOSFET/IGBT single device Date Code # Part Number or Temp. Test # [C] 1 FMM150-0075P 566 85 2 FMM150-0075P 566 85 3 IXDN75N120 482 121 4 IXEH40N120 539 121 4 IXFB80N50F 647 121 5 IXFC26N50Q 648 121 6 IXFF55N50 623 121 7 IXFG55N50 622 121 7 IXFL55N50 621 121 8 IXTK110N25 IX90 121 9 IXTK120N25 IX90 121 10 IXTK80N25 IX81 121 11 IXTK90N30 IX9X 121 Rel. H. [%] 85 85 100 100 100 100 100 100 100 100 100 100 100 Time [hrs] 168 168 48 96 168 168 168 168 168 168 168 168 168 Sample Size 20 20 20 20 30 30 30 30 30 30 30 30 30 Failures TABLE 5C: Thyristor/Diode Module Date Code # Part Number or Test # 1 MCC132-14 589 2 MCC250-14 387 3 MCC26-16 796 4 MCC56 631 5 MCC95-16io1 821 6 MCD56-12io1 414 Temp. [C] 85 85 85 85 85 85 Rel. H. [%] 85 85 85 85 85 85 Time [hrs] 168 168 168 168 168 168 Sample Size 10 10 10 10 10 10 Failures TABLE 5D: Controller, Rectifier Bridge Date Code # Part Number or Temp. Test # [C] 1 VUM24-05 846 85 2 VUO36-16NO8 435 85 3 VWO85-14 777 85 Rel. H. [%] 85 85 85 Time [hrs] 168 168 168 Sample Size 10 10 10 Failures Sample Size 20 20 10 20 20 20 20 10 10 10 Failures Sample Size 20 20 20 Failures 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Device Hours [hrs] 3360 3360 960 1920 5040 5040 5040 5040 5040 5040 5040 5040 5040 Remark Device Hours [hrs] 1680 1680 1680 1680 1680 1680 Remark Device Hours [hrs] 1680 1680 1680 Remark Device Hours [hrs] 960 1920 480 1920 1920 960 960 1680 1680 1680 Remark Device Hours [hrs] 1920 1920 1920 Remark TABLE 5E: FRED # Part Number 1 2 3 4 5 6 7 8 9 10 DSEC30-02A DSEC60-02AQ DSEI2x101-06 DSEP130-06A DSEP130-06A DSEP2x91-06A DSEP30-06CR MEK250/12DA MEK300-06D MEK350-02DA Date Code or Test # 795 839 413 616 616 787 525 429 399 793 Temp. [C] 121 121 121 121 121 121 121 85 85 85 Rel. H. [%] 100 100 100 100 100 100 85 85 85 Time [hrs] 48 96 48 96 96 48 48 168 168 168 Date Code or Test # 807 763 763 Temp. [C] 121 121 121 Rel. H. [%] 100 100 100 Time [hrs] 96 96 96 0 0 0 0 0 0 0 0 0 0 TABLE 5F: Schottky Diode # Part Number 1 2 3 DGS11-025C DGSK24-025CS DGSK24-025CS 15 0 0 0 TABLE 5G: Thyristor/Diode single device Date Code # Part Number or Temp. Test # [C] 1 CS30-16io1 417 121 2 CS45 687 121 3 CS45 687 121 4 CS45 687 121 5 DSI45-16 764 121 6 DSI45-16AR 823 121 7 DSP25-16A 388 121 8 DSP8-08S 758 121 9 DSP8-08S 758 121 10 DSP8-08S 758 121 Rel. H. [%] 100 100 100 100 100 100 100 100 100 100 Time [hrs] 48 96 96 96 48 48 96 96 96 96 Sample Size 20 20 20 20 10 20 20 20 20 20 Failures Sample Size 20 20 30 20 20 30 Failures Sample Size 20 20 20 20 Failures 0 0 1 0 0 0 0 0 0 0 Device Hours [hrs] 960 1920 1920 1920 480 960 1920 1920 1920 1920 Remark TABLE 5H: ISOPLUS Date Code or Test # 525 823 648 389 389 623 Temp. [C] 121 121 121 121 121 121 Rel. H. [%] 100 100 100 100 100 Time [hrs] 48 48 168 96 96 168 TABLE 5J: Breakover diode Date Code # Part Number or Test # 1 IXBOD1-06 567 2 IXBOD1-07 481 3 IXBOD1-09 743 4 IXBOD1-10 868 Temp. [C] 121 121 121 121 Rel. H. [%] 100 100 100 100 Time [hrs] 48 48 48 48 # Part Number 1 2 3 4 5 6 DSEP30-06CR DSI45-16AR IXFC26N50Q IXFF24N100 IXFF24N100 IXFF55N50 16 0 0 0 1 1 0 0 0 0 0 Device Hours Remark [hrs] 960 960 5040 1920 I_dss@ 96hr 1920 I_dss@ 96hr 5040 Device Hours [hrs] 960 960 960 960 Remark