18325
JANUARY 2014
FMV22N60S1FD FUJI POWER MOSFET
Super J-MOS series N-Channel enhancement mode power MOSFET
Features
Low on-state resistance
Low switching loss
easy to use (more controllabe switching dV/dt by Rg)
Applications
UPS
Server
Telecom
Power conditioner system
Power supply
Outline Drawings [mm]
Equivalent circuit schematic
Gate(G)
Source(S)
Drain(D)
1
2
3
Connection
Gate
Drain
Source DIMENSIONS ARE IN MILLIMETERS.
TO-220F(SLS)
http://www.fujielectric.com/products/semiconductor/
Absolute Maximum Ratings at TC=25°C (unless otherwise specied)
Description Symbol Characteristics Unit Remarks
Drain-Source Voltage VDS 600 V
VDSX 600 V VGS=-30V
Continuous Drain Current ID
±22 A Tc=25°C Note*1
±14 A Tc=100°C Note*1
Pulsed Drain Current IDP ±66 A Note*1
Gate-Source Voltage VGS ±30 V
Repetitive and Non-Repetitive
Maximum Avalanche Current IAR 6.6 A Note *2
Non-Repetitive
Maximum Avalanche Energy EAS 548.9 mJ Note *3
Maximum Drain-Source dV/dt dVDS/dt 50 kV/μs VDS≤ 600V
Peak Diode Recovery dV/dt dV/dt 30 kV/μs Note *4
Peak Diode Recovery -di/dt -di/dt 100 A/μs Note *5
Maximum Power Dissipation PD
2.16 WTa=25°C
70 Tc=25°C
Operating and Storage Temperature range Tch 150 °C
Tstg -55 to +150 °C
Note *1 : Limited by maximum channel temperature.
Note *2 : Tch≤150°C, See Fig.1 and Fig.2
Note *3 : Starting Tch=25°C, IAS=4A, L=62.9mH, VDD=60V, RG=50Ω, See Fig.1 and Fig.2
EAS limited by maximum channel temperature and avalanche current.
Note *4 : IF-ID, -di/dt=100As, VDS peak600V, Tch≤150°C.
Note *5 : IF≤-ID, dV/dt=30kV/μs, VDS peak≤600V, Tch≤150°C.
Electrical Characteristics at TC=25°C (unless otherwise specied)
• Static Ratings
Description Symbol Conditions min. typ. max. Unit
Drain-Source Breakdown Voltage BVDSS
ID=250μA
VGS=0V 600 - - V
Gate Threshold Voltage VGS(th)
ID=500μA
VDS=VGS
3.0 4.0 5.0 V
Zero Gate Voltage Drain Current IDSS
VDS=600V
VGS=0V Tch=25°C - - 25
μA
VDS=480V
VGS=0V Tch=125°C - 120 -
Gate-Source Leakage Current IGSS
VGS= ± 30V
VDS=0V - 10 100 nA
Drain-Source On-State Resistance RDS(on)
ID=11A
VGS=10V - 0.144 0.170 Ω
Gate resistance RGf=1MHz, open drain - 3.5 - Ω
2
FMV22N60S1FD
3
FUJI POWER MOSFET
http://www.fujielectric.com/products/semiconductor/
• Dynamic Ratings
Description Symbol Conditions min. typ. max. Unit
Forward Transconductance gfs
ID=11A
VDS=25V 9.5 19 - S
Input Capacitance Ciss VDS=400V
VGS=0V
f=250kHz
- 1580 -
pF
Output Capacitance Coss - 47 -
Reverse Transfer Capacitance Crss - 3.5 -
Effective output capacitance,
energy related (Note *6) Co(er)
VGS=0V
VDS=0…400V - 125 -
Effective output capacitance,
time related (Note *7) Co(tr)
VGS=0V
VDS=0…400V
ID=constant
- 415 -
Turn-On Time td(on)
VDD=400V, VGS=10V
ID=11A, RG=27Ω
See Fig.3 and Fig.4
- 85 -
ns
tr- 27 -
Turn-Off Time td(off) - 150 -
tf- 18 -
Total Gate Charge QG
VDD=400V, ID=22A
VGS=10V
See Fig.5
- 58 -
nC
Gate-Source Charge QGS - 17.5 -
Gate-Drain Charge QGD - 23.5 -
Drain-Source crossover Charge QSW -9-
• Reverse Diode
Description Symbol Conditions min. typ. max. Unit
Avalanche Capability IAV
L=14mH,Tch=25°C
See Fig.1 and Fig.2 6.6 - - A
Diode Forward On-Voltage VSD
IF=22A,VGS=0V
Tch=25°C - 1 1.35 V
Reverse Recovery Time trr
IF=22A, VDD=400V
-di/dt=100A/μs
RG=150Ω, Tch=25°C
See Fig.6 and Fig.7
- 165 - ns
Reverse Recovery Charge Qrr - 1.1 - μC
Peak Reverse Recovery Current Irp - 13.2 - A
Thermal Resistance
Parameter Symbol min. typ. max. Unit
Channel to Case Rth(ch-c) - - 1.79 °C/W
Channel to Ambient Rth(ch-a) - - 58 °C/W
Note *6 : Co(er) is a xed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 400V.
Note *7 : Co(tr) is a xed capacitance that gives the same charging times as Coss while VDS is rising from 0 to 400V.
2
3
FUJI POWER MOSFET
FMV22N60S1FD
http://www.fujielectric.com/products/semiconductor/
0 5 10 15 20 25
0
10
20
30
40
50
60
70
7.5V
6.5V
8V
20V
10V
7V
ID [A]
VDS [V]
Typical Output Characteristics
ID=f(VDS): 80μs pulse test, Tch=25°C
VGS=6V
0 5 10 15 20 25
0
10
20
30
40
6V
7.5V
7V
8V
20V
10V
6.5V
ID [A]
VDS [V]
Typical Output Characteristics
ID=f(VDS): 80μs pulse test, Tch=150°C
VGS=5.5V
0 10 20 30 40 50 60 70
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
0.45
0.50
0.55
0.60
10V
7.5V
6.5V
6V 7V
RDS(on) [Ω ]
ID [A]
Typical Drain-Source on-state Resistance
RDS(on)=f(ID): 80μs pulse test, Tch=25°C
8V
VGS=20V
0 10 20 30 40
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
5.5V 6.5V
7V
8V
7.5V
6V
RDS(on) [Ω ]
ID [A]
Typical Drain-Source on-state Resistance
RDS(on)=f(ID): 80μs pulse test, Tch=150°C
10V
VGS=20V
0.1 1 10 100 1000
0.01
0.1
1
10
100
t
PD
Power loss waveform :
Square waveform
t
PD
t
PD
Power loss waveform :
Square waveform
ID [A]
VDS [V]
Safe Operating Area
ID=f(VDS): Duty=0(Single pulse), Tc=25°C
t=
1μs
10μs
1ms
100μs
0 25 50 75 100 125 150
0
10
20
30
40
50
60
70
80
Allowable Power Dissipation
PD=f(Tc)
PD [W]
Tc [°C]
4
FMV22N60S1FD
5
FUJI POWER MOSFET
http://www.fujielectric.com/products/semiconductor/
-50 -25 0 25 50 75 100 125 150
0
1
2
3
4
5
6
typ.
Gate Threshold Voltage vs. Tch
VGS(th)=f(Tch): VDS=VGS, ID=500μA
VGS(th) [V]
Tch [°C]
-50 -25 0 25 50 75 100 125 150
0.0
0.1
0.2
0.3
0.4
0.5
0.6
RDS(on) [Ω ]
Tch [°C]
typ.
max.
Drain-Source On-state Resistance
RDS(on)=f(Tch): ID=11A, VGS=10V
0 1 2 3 4 5 6 7 8 9 10
0.1
1
10
100
Tch=25
150
ID[A]
VGS[V]
Typical Transfer Characteristic
ID=f(VGS): 80μs pulse test, VDS=25V
0.1 1 10 100
0.1
1
10
100
150
Tch=25
gfs [S]
ID [A]
Typical Transconductance
gfs=f(ID): 80μs pulse test, VDS=25V
0.0 0.5 1.0 1.5 2.0
0.1
1
10
100
Tch=25
150
IF [A]
VSD [V]
Typical Forward Characteristics of Reverse Diode
IF=f(VSD): 80μs pulse test
0.1 1 10 100
1
10
100
1000
10000
100000
C [pF]
VDS [V]
Typical Capacitance
C=f(VDS): VGS=0V, f=250kHz
Crss
Coss
Ciss
4
5
FUJI POWER MOSFET
FMV22N60S1FD
http://www.fujielectric.com/products/semiconductor/
0 100 200 300 400 500 600
0
5
10
15
Typical Coss stored energy
Eoss [uJ]
VDS [V]
0.1 1 10 100
10
100
1000
10000
Typical Switching Characteristics vs. ID Tch=25°C
t=f(ID): Vdd=400V, VGS=10V/0V, RG=27Ω
td(on)
tr
tf
td(off)
t [ns]
ID [A]
0 10 20 30 40 50 60
0
2
4
6
8
10
400V
120V
Typical Gate Charge Characteristics
VGS=f(Qg): ID=22A, Tch=25°C
Qg [nC]
Vdd=480V
VGS [V]
0 25 50 75 100 125 150
0
500
1000
IAS=6.6A
IAS=4A
IAS=2A
EAV [mJ]
starting Tch [°C]
Maximum Avalanche Energy vs. startingTch
E(AV)=f(starting Tch):Vcc=60V,I(AV)<=6.6A
10-6 10-5 10-4 10-3 10-2 10-1 100
10-3
10-2
10-1
100
101
Transient Thermal Impedance
Zth(ch-c)=f(t):D=0
Zth(ch-c) [/W]
t [sec]
6
FMV22N60S1FD
7
FUJI POWER MOSFET
http://www.fujielectric.com/products/semiconductor/
Fig.1 Avalanche Test circuit Fig.2 Operating waveforms of Avalanche Test
Fig.3 Switching Test circuit Fig.4 Operating waveform of Switching Test
Fig.5 Operating waveform of Gate charge Test
Fig.7 Operating waveform of Reverse recovery Test
VGS
VDS
QG
QGS QGD
VGS,VDS
Qg
QSW
10V
IAV
BVDSS
VDS
ID
VGS
0
+10V
-15V
Rg
L
D.U.T
VDD
Fig.6 Reverse recovery Test circuit
VGS
VDS
VDS ×90%
td(on) tr td(off) tf
VGS ×10%
VGS ×90%
VDS ×10%
VDS ×90%
VDS ×10%
L
VDD
RGD.U.T
Diode
PG
L
VDD
RG
PG
D.U.T
Same as
D.U.T
trr
Qrr=irdt
0
IF
trr
Irp
Irp×10%
VDS peak
VDS
6
7
FUJI POWER MOSFET
FMV22N60S1FD
http://www.fujielectric.com/products/semiconductor/
Trademark
Type name
Date code & Lot No.
Y: Last digit of year
M: Month code 1~9 and O,N,D
NNN: Lot. serial number
Under bar of date code
: means lead-free mark
YMNNN
* The font (font type,size) and the trademark-size
might be actually different.
Country of
origin mark.
" " (Blank): Japan
P : Philippines
22F60S1
1
2
3
Connection
Gate
Drain
Source
DIMENSIONS ARE IN MILLIMETERS.
Outview: TO-220F(SLS) Package
Marking
8
FMV22N60S1FD FUJI POWER MOSFET
http://www.fujielectric.com/products/semiconductor/
WARNING
1. This Catalog contains the product specications, characteristics, data, materials, and structures as of January 2014.
The contents are subject to change without notice for specication changes or other reasons. When using a product listed in this Catalog, be
sur to obtain the latest specications.
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implied, under any patent, copyright, trade secret or other intellectual property right owned by Fuji Electric Co., Ltd. is (or shall be deemed)
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infringement of other's intellectual property rights which may arise from the use of the applications described herein.
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the equipment from causing a physical injury, re, or other problem if any of the products become faulty. It is recommended to make your
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requirements.
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