SPEC NO. 05-08-5014 REV. U RH1014M, QUAD PRECISION OPERATIONAL AMPLIFIER
LINEAR TECHNOLOGY CORPORATION Page 6 of 18
3.12.2 For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation,
the manufacturer will provide certified RAD testing and report through an independent test
laboratory when required as a customer purchase order line item.
3.12.3 Total dose bias circuit is specified in Figure 9.
3.13 Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A,
except for the following: Topside glassivation thickness shall be a minimum of 4KÅ.
3.14 Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM
photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when
specified as a customer purchase order line item.
4.0 VERIFICATION (QUALITY ASSURANCE PROVISIONS)
4.1 Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF-38535.
Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified
Class S manufacturing lines.
4.2 Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method
5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and
3.4 of the test method.
4.3 Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML
allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test
method. Electrical testing shall be as specified in Table IV herein.
4.3.1 Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails
the burn-in or re-burn-in PDA requirements.
4.4 Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3
herein and as follows:
4.4.1 Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per
MIL-STD-883, Method 5005, and specified in Table IV herein.
4.4.2 Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a
minimum, Subgroup B2 (Resistance to Solvents / Mark Permanency) and Subgroup B3
(Solderability) are performed prior to the first shipment from any inspection lot and Attributes
provided when a Full Space Data Pack is ordered. Subgroup B5 (Operating Life) is performed on
each wafer lot. This subgroup may or may not be from devices built in the same package style as
the current inspection lot. Attributes and variables data for this subgroup will be provided upon
request at no charge.
4.4.2.1 Group B, Subgroup 2c = 10% Group B, Subgroup 5 = *5%
(*per wafer or inspection lot
Group B, Subgroup 3 = 10% whichever is the larger quantity)
Group B, Subgroup 4 = 5% Group B, Subgroup 6 = 15%
4.4.2.2 All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The quantity
(accept number) of all other subgroups are per MIL-STD-883, Method 5005, Table IIa.