100364 Low Power 16-Input Multiplexer General Description Features The 100364 is a 16-input multiplexer. Data paths are controlled by four Select lines (S0 - S3). Their decoding is shown in the truth table. Output data polarity is the same as the seleted input data. All inputs have 50 kX pulldown resistors. Y Y Y Y Y Y 35% power reduction of the 100164 2000V ESD protection Pin/function compatible with 100164 Voltage compensated operating range e b 4.2V to b 5.7V Available to industrial grade temperature range Available to MIL-STD-883 Logic Symbol Pin Names Description I0 -I15 S0 -S3 Z Data Inputs Select Inputs Data Output TL/F/10265 - 1 Connection Diagrams 24-Pin DIP 28-Pin PCC 24-Pin Quad Cerpak TL/F/10265 - 4 TL/F/10265 - 3 TL/F/10265-2 C1995 National Semiconductor Corporation TL/F/10265 RRD-B30M105/Printed in U. S. A. 100364 Low Power 16-Input Multiplexer July 1992 Logic Diagram TL/F/10265 - 5 Truth Table Select Inputs Output S0 S1 S2 S3 Z L H L H L L H H L L L L L L L L I0 I1 I2 I3 L H L H L L H H H H H H L L L L I4 I5 I6 I7 L H L H L L H H L L L L H H H H I8 I9 I10 I11 L H L H L L H H H H H H H H H H I12 I13 I14 I15 H e HIGH Voltage Level L e LOW Voltage Level 2 Absolute Maximum Ratings Recommended Operating Conditions Above which the useful life may be impaired (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. b 65 C to a 150 C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic Pin Potential to Ground Pin (VEE) Case Temperature (TC) Commercial Industrial Military 0 C to a 85 C b 40 C to a 85 C b 55 C to a 125 C Supply Voltage (VEE) a 175 C a 150 C b 5.7V to b 4.2V b 7.0V to a 0.5V Input Voltage (DC) Output Current (DC Output HIGH) VEE to a 0.5V b 50 mA ESD (Note 2) t 2000V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Commercial Version DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e 0 C to a 85 C (Note 3) Symbol Parameter Min Typ Max VOH Output HIGH Voltage b 1025 b 955 b 870 Units mV VIN e VIH (Max) Conditions VOL Output LOW Voltage b 1830 b 1705 b 1620 mV or VIL (Min) Loading with 50X to b2.0V VOHC Output HIGH Voltage b 1035 VOLC Output LOW Voltage b 1610 mV VIN e VIH (Min) or VIL (Max) Loading with 50X to b2.0V VIH Input HIGH Voltage b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs VIL Input LOW Voltage b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs IIL Input LOW Current IIH Input HIGH Current IEE Power Supply Current mV 0.5 b 89 mA VIN e VIL (Min) 300 mA VIN e VIH (Max) b 45 mA Inputs Open Note 3: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operate under ``worst case'' conditions. DIP AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e 0 C TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay I0 - I15 to Output 0.90 2.00 0.90 2.00 0.90 2.10 ns tPLH tPHL Propagation Delay S0, S1 to Output 1.40 2.80 1.40 2.80 1.50 2.90 ns tPLH tPHL Propagation Delay S2, S3 to Output 1.00 2.20 1.00 2.20 1.10 2.40 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.35 1.20 0.35 1.20 0.35 1.20 ns Conditions Figures 1, 2 3 Commercial Version (Continued) PCC and Cerpak AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol TC e 0 C Parameter TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay I0 - I15 to Output 0.90 1.80 0.90 1.80 0.90 1.90 ns tPLH tPHL Propagation Delay S0, S1 to Output 1.40 2.60 1.40 2.60 1.50 2.70 ns tPLH tPHL Propagation Delay S2, S3 to Output 1.00 2.00 1.00 2.00 1.10 2.20 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.35 1.10 0.35 1.10 0.35 1.10 ns Conditions Figures 1, 2 Industrial Version PCC DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b40 C to a 85 C (Note 3) Symbol Parameter TC e b40 C Min TC e 0 C to a 85 C Max Min Units Conditions Max VOH Output HIGH Voltage b 1085 b 870 b 1025 b 870 mV VOL Output LOW Voltage b 1830 b 1575 b 1830 b 1620 mV VOHC Output HIGH Voltage b 1095 b 1035 b 1565 mV VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V Loading with 50X to b2.0V b 1610 mV VIN e VIH (Min) or VIL (Max) VOLC Output LOW Voltage VIH Input HIGH Voltage b 1170 b 870 b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs VIL Input LOW Voltage b 1830 b 1480 b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs IIL Input LOW Current 0.5 mA VIN e VIL (Min) IIH Input HIGH Current IEE Power Supply Current 0.5 325 b 89 b 45 b 89 325 mA VIN e VIH (Max) b 45 mA Inputs Open Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life imparied. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Note 3: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under ``worst case'' conditions. 4 Industrial Version (Continued) PCC AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol TC e b40 C Parameter TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay I0 - I15 to Output 0.90 1.80 0.90 1.80 0.90 1.90 ns tPLH tPHL Propagation Delay S0, S1 to Output 1.20 2.60 1.40 2.60 1.50 2.70 ns tPLH tPHL Propagation Delay S2, S3 to Output 0.80 2.10 1.00 2.00 1.10 2.20 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.20 1.20 0.35 1.10 0.35 1.10 ns Conditions Figures 1, 2 Military Version DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b55 C to a 125 C Symbol VOH VOL VOHC VOLC Parameter Output HIGH Voltage Output LOW Voltage Output HIGH Voltage Min Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current IIH Input HIGH Current Power Supply Current TC b 1025 b 870 mV b 1085 b 870 mV b 55 C b 1830 b 1620 mV b 1830 b 1555 mV b 1035 mV b 1085 mV Conditions Notes VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V 1, 2, 3 VIN e VIH (Min) or VIL (Max) Loading with 50X to b2.0V 1, 2, 3 0 C to a 125 C b 55 C 0 C to a 125 C b 55 C 0 C to b 1610 mV b 1555 mV b 55 C Guaranteed HIGH Signal for All Inputs 1, 2, 3, 4 1, 2, 3, 4 a 125 C b 1165 b 870 mV b 55 C to a 125 C b 1830 b 1475 mV b 55 C to a 125 C Guaranteed LOW Signal for All Inputs mA b 55 C to a 125 C VEE e b4.2V VIN e VIL (Min) 1, 2, 3 0 C to VEE e b5.7V VIN e VIH (Max) 1, 2, 3 Inputs Open 1, 2, 3 0.50 300 450 IEE Units 0 C to a 125 C Output LOW Voltage VIH Max b 95 b 35 mA a 125 C mA b 55 C mA b 55 C to a 125 C Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at b 55 C, a 25 C, and a 125 C, Subgroups, 1, 2, 3, 7 and 8. Note 3: Sampled tested (Method 5005, Table I) on each manufactured lot at b 55 C, a 25 C, and a 125 C, Subgroups A1, 2, 3, 7 and 8. Note 4: Guaranteed by applying specified input condition and testing VOH/VOL. 5 Military Version (Continued) AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e b55 C TC e 25 C TC e a 125 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay I0 - I15 to Output 0.50 2.60 0.60 2.40 0.60 2.80 ns tPLH tPHL Propagation Delay S0, S1 to Output 0.70 3.30 0.90 3.10 1.00 3.50 ns tPLH tPHL Propagation Delay S2, S3 to Output 0.50 2.90 0.70 2.60 0.60 3.00 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.20 1.20 0.20 1.20 0.20 1.20 ns Conditions Notes 1, 2, 3 Figures 1, 2 4 Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at a 25 C, temperature only, Subgroup A9. Note 3: Sample tested (Method 5005, Table I) on each Mfg. lot at a 25 C, Subgroup A9, and at a 125 C, and b 55 C temp., Subgroups A10 and A11. Note 4: Not tested at a 25 C, a 125 C and b 55 C temperature (design characterization data). Test Circuit TL/F/10265 - 6 FIGURE 1. AC Test Circuit 6 Switching Waveforms TL/F/10265 - 7 FIGURE 2. Propagation Delay and Transition Times Notes: VCC, VCCA e a 2V, VEE e b 2.5V L1 and L2 e Equal length 50X impedance lines RT e 50X terminator internal to scope Decoupling 0.1 mF from GND to VCC and VEE All unused outputs are loaded with 50X to GND CL e Fixture and stray capacitance s 3 pF Pin numbers shown are for flatpak; for DIP see logic symbol Ordering Information The device number is used to form part of a simplified purchasing code where a package type and temperature range are defined as follows: 100364 D Device Type (Basic) C QB Special Variation QB e Military grade device with environmental and burn-in processing Package Code D e Ceramic DIP F e Quad Cerpak P e Plastic DIP Q e Plastic Leaded Chip Carrier (PCC) Temperature Range C e Commercial (0 C to a 85 C) I e Industrial (b40 C to a 85 C) (PCC only) M e Military (b55 C to a 125 C) 7 Physical Dimensions inches (millimeters) 24-Lead Ceramic Dual-In-Line Package (0.400x Wide) (D) NS Package Number J24E 8 Physical Dimensions inches (millimeters) (Continued) 24-Lead Plastic Dual-In-Line Package (P) NS Package Number N24E 28-Lead Plastic Chip Carrier (Q) NS Package Number V28A 9 100364 Low Power 16-Input Multiplexer Physical Dimensions inches (millimeters) (Continued) Lit.Y 114925 24-Lead Quad Cerpak (F) NS Package Number W24B LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 1111 West Bardin Road Arlington, TX 76017 Tel: 1(800) 272-9959 Fax: 1(800) 737-7018 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 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