TL/F/9516
54F/74F322 Octal Serial/Parallel Register with Sign Extend
May 1995
54F/74F322
Octal Serial/Parallel Register with Sign Extend
General Description
The ’F322 is an 8-bit shift register with provision for either
serial or parallel loading and with TRI-STATEÉparallel out-
puts plus a bi-state serial output. Parallel data inputs and
parallel outputs are multiplexed to minimize pin count. State
changes are initiated by the rising edge of the clock. Four
synchronous modes of operation are possible: hold (store),
shift right with serial entry, shift right with sign extend and
parallel load. An asynchronous Master Reset (MR) input
overrides clocked operation and clears the register.
Features
YMultiplexed parallel I/O ports
YSeparate serial input and output
YSign extend function
YTRI-STATE outputs for bus applications
Commercial Military Package Package Description
Number
74F322PC N20A 20-Lead (0.300×Wide) Molded Dual-In-Line
54F322DM (Note 2) J20A 20-Lead Ceramic Dual-In-Line
74F322SJ (Note 1) M20D 20-Lead (0.300×Wide) Molded Small Outline, EIAJ
54F322FM (Note 2) W20A 20-Lead Cerpack
54F322LM (Note 2) E20A 20-Lead Ceramic Leadless Chip Carrier, Type C
Note 1: Devices also available in 13×reel. Use suffix eSJX.
Note 2: Military grade device with environmental and burn-in processing. Use suffix eDMQB, FMQB and LMQB.
Logic Symbols
TL/F/95163
IEEE/IEC
TL/F/95165
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.
Connection Diagrams
Pin Assignment
for DIP, SOIC and Flatpak
TL/F/95161
Pin Assignment
for LCC
TL/F/95162
2
Unit Loading/Fan Out
54F/74F
Pin Names Description U.L. Input IIH/IIL
HIGH/LOW Output IOH/IOL
RE Register Enable Input (Active LOW) 1.0/1.0 20 mA/b0.6 mA
S/P Serial (HIGH) or Parallel (LOW) Mode Control Input 1.0/1.0 20 mA/b0.6 mA
SE Sign Extend Input (Active LOW) 1.0/3.0 20 mA/b1.8 mA
S Serial Data Select Input 1.0/2.0 20 mA/b1.2 mA
D0,D
1Serial Data Inputs 1.0/1.0 20 mA/b0.6 mA
CP Clock Pulse Input (Active Rising Edge) 1.0/1.0 20 mA/b0.6 mA
MR Asynchronous Master Reset Input (Active LOW) 1.0/1.0 20 mA/b0.6 mA
OE TRI-STATE Output Enable Input (Active LOW) 1.0/1.0 20 mA/b0.6 mA
Q0Bi-State Serial Output 50/33.3 b1 mA/b20 mA
I/O0I/O7Multiplexed Parallel Data Inputs or 3.5/1.083 70 mA/b0.65 mA
TRI-STATE Parallel Data Outputs 150/40 (33.3) b3 mA/24 mA (20 mA)
Functional Description
The ’F322 contains eight D-type edge triggered flip-flops
and the interstage gating required to perform right shift and
the intrastage gating necessary for hold and synchronous
parallel load operations. A LOW signal on RE enables shift-
ing or parallel loading, while a HIGH signal enables the hold
mode. A HIGH signal on S/P enables shift right, while a
LOW signal disables the TRI-STATE output buffers and en-
ables parallel loading. In the shift right mode a HIGH signal
on SE enables serial entry from either D0or D1, as deter-
mined by the S input. A LOW signal on SE enables shift right
but Q7reloads its contents, thus performing the sign extend
function required for the ’F384 Twos Complement Multiplier.
A HIGH signal on OE disables the TRI-STATE output buff-
ers, regardless of the other control inputs. In this condition
the shifting and loading operations can still be performed.
Mode Select Table
Mode Inputs Outputs Q0
MR RE S/P SE SOE*CP I/O7I/O6I/O5I/O4I/O3I/O2I/O1I/O0
Clear L X X X X L X L L L L L L L L L
LXXXXHXZZZZZZZZL
Parallel HL LXXXLI
7I
6I
5I
4I
3I
2I
1I
0I
0
Load
Shift H L H H L L LD0O7O6O5O4O3O2O1O1
Right H L H H H L LD1O7O6O5O4O3O2O1O1
Sign HLHLXLLO
7O
7O
6O
5O
4O
3O
2O
1O
1
Extend
Hold H H X X X L LNC NC NC NC NC NC NC NC NC
*When the OE input is HIGH all I/Onterminals are at the high impedance state; sequential operation or clearing of the register is not affected.
Note 1: I7–I0eThe level of the steady-state input at the respective I/O terminal is loaded into the flip-flop while the flip-flop outputs (except Q0) are isolated from
the I/O terminal.
Note 2: D0,D
1eThe level of the steady-state inputs to the serial multiplexer input.
Note 3: O7–O0eThe level of the respective Qnflip-flop prior to the last Clock LOW-to-HIGH transition.
HeHIGH Voltage Level
LeLOW Voltage Level
ZeHigh Impedance Output State
LeLOW-to-HIGH Transition
NC eNo Change
3
Logic Diagram
TL/F/95164
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
4
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Storage Temperature b65§Ctoa
150§C
Ambient Temperature under Bias b55§Ctoa
125§C
Junction Temperature under Bias b55§Ctoa
175§C
Plastic b55§Ctoa
150§C
VCC Pin Potential to
Ground Pin b0.5V to a7.0V
Input Voltage (Note 2) b0.5V to a7.0V
Input Current (Note 2) b30 mA to a5.0 mA
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under
these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
Voltage Applied to Output
in HIGH State (with VCC e0V)
Standard Output b0.5V to VCC
TRI-STATE Output b0.5V to a5.5V
Current Applied to Output
in LOW State (Max) twice the rated IOL (mA)
Recommended Operating
Conditions
Free Air Ambient Temperature
Military b55§Ctoa
125§C
Commercial 0§Ctoa
70§C
Supply Voltage
Military a4.5V to a5.5V
Commercial a4.5V to a5.5V
DC Electrical Characteristics
Symbol Parameter 54F/74F Units VCC Conditions
Min Typ Max
VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal
VCD Input Clamp Diode Voltage b1.2 V Min IIN eb
18 mA
VOH Output HIGH 54F 10% VCC 2.5 IOH eb
1mA(Q
0
, I/On)
Voltage 54F 10% VCC 2.4 IOH eb
3 mA (I/On)
74F 10% VCC 2.5 V Min IOH eb
1mA(Q
0
, I/On)
74F 10% VCC 2.4 IOH eb
3 mA (I/On)
74F 5% VCC 2.7 IOH eb
1mA(Q
0
, I/On)
74F 5% VCC 2.7 IOH eb
3 mA (I/On)
VOL Output LOW 54F 10% VCC 0.5 IOL e20 mA (Q0, I/On)
Voltage 74F 10% VCC 0.5 V Min IOL e20 mA (Q0)
74F 10% VCC 0.5 IOL e24 mA ( I/On)
IIH Input HIGH 54F 20.0 mA Max VIN e2.7V
Current 74F 5.0
IBVI Input HIGH Current 54F 100 mA Max VIN e7.0V (Non-I/O Inputs)
Breakdown Test 74F 7.0
IBVIT Input HIGH Current 54F 1.0 mA Max VIN e5.5V (I/On)
Breakdown Test (I/O) 74F 0.5
ICEX Output HIGH 54F 250 mA Max VOUT eVCC
Leakage Current 74F 50
VID Input Leakage 74F 4.75 V 0.0 IID e1.9 mA
Test All Other Pins Grounded
IOD Output Leakage 74F 3.75 mA 0.0 VIOD e150 mV
Circuit Current All Other Pins Grounded
IIL Input LOW Current b0.6 mA Max VIN e0.5V (RE, S/P,D
n
, CP, MR,OE)
b
1.2 mA Max VINe0.5V (S)
b1.8 mA Max VINe0.5V (SE)
IIH aOutput Leakage Current 70 mA Max VI/O e2.7V (I/On)
IOZH
IIL aOutput Leakage Current b650 mA Max VI/O e0.5V (I/On)
IOZL
IOS Output Short-Circuit Current b60 b150 mA Max VOUT e0V
IZZ Bus Drainage Test 500 mA 0.0V VOUT e5.25V
ICC Power Supply Current 60 90 mA Max
5
AC Electrical Characteristics
74F 54F 74F
TAea
25§CTA,V
CC eMil TA,V
CC eCom
Symbol Parameter VCC ea
5.0V CLe50 pF CLe50 pF Units
CLe50 pF
Min Typ Max Min Max Min Max
fmax Maximum Clock Frequency 70 90 50 70 MHz
tPLH Propagation Delay 3.5 7.0 7.5 3.5 9.5 3.5 8.5
tPHL CP to I/On5.0 8.5 11.0 3.5 10.0 5.0 12.0 ns
tPLH Propagation Delay 3.5 7.0 9.0 3.5 11.0 3.5 10.0
tPHL CP to Q03.5 7.0 8.0 3.5 10.0 3.5 9.0
tPHL Propagation Delay 6.0 10.0 13.0 6.0 15.0 6.0 14.0 ns
MR to I/On
tPHL Propagation Delay 5.5 7.5 12.0 5.5 14.0 5.5 13.0 ns
MR to Q0
tPZH Output Enable Time 3.0 6.5 9.0 3.0 12.5 3.0 10.0
tPZL OE to I/On4.0 8.5 11.0 4.0 14.5 4.0 12.0 ns
tPHZ Output Disable Time 2.0 4.5 6.0 2.0 8.0 2.0 7.0
tPLZ OE to I/On2.0 5.0 7.0 2.0 10.0 2.0 8.0
tPZH Output Enable Time 4.5 8.0 10.5 4.5 13.5 4.5 11.5
tPZL S/P to I/On5.5 10.0 14.0 5.5 17.0 5.5 15.0 ns
tPHZ Output Disable Time 5.0 9.0 11.5 5.0 16.5 5.0 12.5
tPLZ S/P to I/On6.0 12.0 15.5 6.0 19.5 6.0 16.5
AC Operating Requirements
74F 54F 74F
Symbol Parameter TAea
25§CTA,V
CC eMil TA,V
CC eCom Units
VCC ea
5.0V
Min Max Min Max Min Max
ts(H) Setup Time, HIGH or LOW 6.0 14.0 7.0 ns
ts(L) RE to CP 14.0 18.0 16.0
th(H) Hold Time, HIGH or LOW 0 0 0 ns
th(L) RE to CP 0 0 0
ts(H) Setup Time, HIGH or LOW 6.5 8.5 7.5 ns
ts(L) D0,D
1or I/Onto CP 6.5 8.5 7.5
th(H) Hold Time, HIGH or LOW 2.0 3.0 3.0 ns
th(L) D0,D
1or I/Onto CP 2.0 3.0 3.0
ts(H) Setup Time, HIGH or LOW 7.0 9.0 8.0 ns
ts(L) SE to CP 2.5 11.0 3.5
th(H) Hold Time, HIGH or LOW 2.0 2.0 2.0 ns
th(L) SE to CP 0.0 1.0 0.0
ts(H) Setup Time, HIGH or LOW 11.0 13.0 12.0 ns
ts(L) S/P to CP 13.5 21.0 15.5
ts(H) Setup Time, HIGH or LOW 6.5 8.5 7.5 ns
ts(L) S to CP 9.0 11.0 10.0
th(H) Hold Time, HIGH or LOW 0 1.0 0 ns
th(L) S or S/P to CP 0 0 0
tw(H) CP Pulse Width, HIGH or LOW 7.0 8.0 7.0 ns
tw(L)
tw(L) MR Pulse Width, LOW 5.5 7.5 6.5
trec Recovery Time 8.0 12.0 8.0 ns
MR to CP
6
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74F 322 S C X
Temperature Range Family Special Variations
74F eCommercial QB eMilitary grade device with
54F eMilitary environmental and burn-in
processing
Device Type XeDevices shipped in 13×reel
Package Code Temperature Range
PePlastic DIP CeCommercial (0§Ctoa
70§C)
DeCeramic DIP MeMilitary (b55§Ctoa
125§C)
FeFlatpak
SJ eSmall Outline SOIC EIAJ
LeLeadless Chip Carrier (LCC)
Physical Dimensions inches (millimeters)
20-Lead Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
7
Physical Dimensions inches (millimeters) (Continued)
20-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J20A
8
Physical Dimensions inches (millimeters) (Continued)
20-Lead (0.300×Wide) Molded Small Outline Package, EIAJ (SJ)
NS Package Number M20D
20-Lead (0.300×Wide) Molded Dual-In-Line Package (P)
NS Package Number N20A
9
54F/74F322 Octal Serial/Parallel Register with Sign Extend
Physical Dimensions inches (millimeters) (Continued)
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
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failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.
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