Electrical characteristics RHFLVDS31A
8/15 DocID025370 Rev 4
Cold sparing
The RHFLVDS31A features a cold spare input and output buffer. In high reliability
applications, cold sparing enables a redundant device to be tied to the data bus with its
power supply at 0 V (VCC = GND) without affecting the bus signals or injecting current from
the I/Os to the power supplies. Cold sparing also allows redundant devices to be kept
powered off so that they can be switched on only when required. This has no impact on the
application. Cold sparing is achieved by implementing a high impedance between the I/Os
and VCC. ESD protection is ensured through a non-conventional dedicated structure.
Fail-safe
In many applications, inputs need a fail-safe function to avoid an uncertain output state
when the inputs are not connected properly. In case of TTL floating inputs, the LVDS outputs
remain in a stable logic-high state.
tPHLD
Propagation delay time, high to
low output
Refer to Figure 4
0.5 1.5
ns
tPLHD
Propagation delay time, low to
high output 0.5 1.5
t r
Differential output signal rise
time 0.8
t f
Differential output signal fall
time 0.8
tSK1 Channel-to-channel skew(2)
Load: refer to Figure 4
0.28
ns
tSK2 Chip-to-chip skew(3)(4) 0.7
tSKD
Differential skew(5)
(tPHLD-tPLHD) 0.3
tPHZ
Propagation delay time, high
level to high impedance output 2.8
tPLZ
Propagation delay time, low
level to high impedance output 2.8
tPZH
Propagation delay time, high
impedance to high level output 2.5
tPZL
Propagation delay time, high
impedance to low level output 2.5
1. All pins except pin under test and VCC are floating.
2. tSK1 is the maximum delay time difference between all outputs of the same device (measured with all inputs connected
together).
3. tSK2 is the maximum delay time difference between outputs of all devices when they operate with the same supply voltage,
at the same temperature.
4. Guaranteed by design.
5. tSKD is the maximum delay time difference between tPHLD and tPLHD (see Figure 4).
Table 7. Electrical characteristics (continued)
Symbol Parameter Test conditions Min. Typ. Max. Unit